A material age measurement method and storage medium based on laser equipment

Abstract

The present invention provides a material age measurement method and storage medium based on laser equipment, which relates to the field of data analysis. The method comprises the following steps: obtaining a target object, and performing laser ablation on the target object using a laser equipment corresponding to preset laser parameters, obtaining relevant information of the target object, obtaining a sample mark element list and a sample mark element content list corresponding to a preset sample mark, and obtaining a sample mark element content list based on the relevant information of the target object, the sample mark element list H i And sample standard element content list L i , obtain a similar sample mark of the target object. If the preset laser parameters belong to the target parameter list of similar sample marks, the target age is used as the final age of the target object. If the preset laser parameters do not belong to the target parameter list of similar sample marks, use a laser device with sample mark parameters of similar sample marks to laser ablate the target object to obtain the final age of the target object, so as to obtain the final age of the target ore more accurately.

Description

Technical Field

[0001] The present invention relates to the field of data processing, and in particular to a material age measurement method and storage medium based on laser equipment. Background Art

[0002] Material age measurement, also known as dating, is a series of techniques and methods used to determine the time of formation or last change of materials such as geological, archaeological and environmental samples. At present, laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is widely used in the testing of trace elements in rocks or minerals, the testing of trace elements in single fluid inclusions in minerals, and the testing of U-Pb isotope ratios (ages). The working method of U-Pb dating of laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) is to use a laser ablation system to ablate and mix solid geological samples to form aerosols, which are then transmitted to the inductively coupled plasma mass spectrometer through a carrier gas (usually helium). The aerosols collide and react in the "high temperature" plasma to ionize and form ions. After being captured by the sampling cone and the interceptor cone, the ions are refracted and filtered through a series of prisms and enter the quadrupole analyzer. By applying different voltages, the counts or ratios of these ions to be measured are measured, and then the U-Pb age is calculated according to the law of radioactive isotope decay.

[0003] In the LA-ICP-MS dating process, the parameters that affect the accuracy and precision of the dating results include: laser beam spot diameter, energy density, erosion depth, and laser frequency. The existing technology often calculates the age by finding the most suitable laser parameters. However, how to continue to improve the accuracy of the dating results is still very important. Summary of the invention

[0004] In view of the above technical problems, the technical solution adopted by the present invention is: a material age measurement method based on laser equipment, the method comprising the following steps:

[0005] S001, obtaining a target object, and performing laser ablation on the target object using a laser device corresponding to preset laser parameters to obtain information related to the target object, wherein the information related to the target object includes: target elements contained in the target object, target element content and target age.

[0006] S002, obtain the preset standard sample ID A i The corresponding sample element list H i And sample standard element content list L i , and obtain A i The corresponding target parameter list G i, wherein the sample standard element content list includes several sample standard element contents, the sample standard element content is the content of the sample standard element, the sample standard element list includes several sample standard elements, the target parameter list includes several target parameters, the target parameter is the target laser device parameter used by the sample standard, and the preset standard sample ID list A = {A 1 , A 2 , …, A i , …, A m}, A i is the ID of the i-th sample label, the value range of i is 1 to m, and m is the number of sample labels.

[0007] S003, based on the target item related information, sample element list H i And sample standard element content list L i , obtain similar sample labels of the target object.

[0008] S004, if the preset laser parameter ∈ the target parameter list of similar samples, the target age is taken as the final age of the target object.

[0009] S005, if Use a laser device with sample parameters similar to the sample standard to laser ablate the target object to obtain the final age of the target object.

[0010] According to another aspect of the present invention, a non-transitory computer-readable storage medium is provided, in which at least one instruction or at least one program is stored, and the at least one instruction or the at least one program is loaded and executed by a processor to implement the aforementioned method.

[0011] The present invention has at least the following beneficial effects: In summary, a target object is obtained, and a laser device corresponding to a preset laser parameter is used to perform laser ablation on the target object to obtain relevant information of the target object, a sample mark element list and a sample mark element content list corresponding to a preset sample mark are obtained, and based on the relevant information of the target object, the sample mark element list and the sample mark element content list, a similar sample mark of the target object is obtained; if the preset laser parameter belongs to the target parameter list of similar sample marks, the target age is used as the final age of the target object; if the preset laser parameter does not belong to the target parameter list of similar sample marks, a laser device with the sample mark parameter of the similar sample mark is used to perform laser ablation on the target object to obtain the final age of the target object; the present invention finds similar sample marks in the preset sample mark list and the target object through the elements of the target object, and determines whether the preset laser parameters are the most accurate for testing the target object based on the target parameter list of the similar sample marks, thereby more accurately obtaining the final age of the target ore. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0013] Figure 1 A flowchart of a material age measurement method based on a laser device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0014] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0015] The embodiment of the present invention provides a material age measurement method based on a laser device, such as Figure 1 As shown, the method comprises the following steps:

[0016] S001, obtaining a target object, and performing laser ablation on the target object using a laser device corresponding to preset laser parameters to obtain information related to the target object, the target object related information including: target elements contained in the target object, target element content and target age. Specifically, the target object is an object whose age is desired to be known, such as an ore.

[0017] Specifically, the preset laser parameters include at least: laser beam spot diameter, energy density, ablation depth, and laser frequency.

[0018] S002, obtain the preset standard sample ID A i The corresponding sample element list H i And sample standard element content list L i , and obtain A i The corresponding target parameter list G i , wherein the sample standard element content list includes several sample standard element contents, the sample standard element content is the content of the sample standard element, the sample standard element list includes several sample standard elements, the target parameter list includes several target parameters, the target parameter is the target laser device parameter used by the sample standard, and the preset standard sample ID list A = {A 1 , A 2 , …, A i , …, A m}, A iis the ID of the i-th sample label, the value range of i is 1 to m, and m is the number of sample labels.

[0019] Specifically, the sample mark elements at least include: 238 U, 235 U, 206 Pb, 207 Pb, 208 Pb.

[0020] S003, based on the target item related information, sample element list H i And sample standard element content list L i , obtain a similar sample mark of the target object. Specifically, the similar sample mark is a preset sample mark in a preset sample mark list.

[0021] S004, if the preset laser parameter ∈ the target parameter list of similar samples, the target age is taken as the final age of the target object.

[0022] Specifically, if the preset laser parameters belong to the target parameter list of similar samples, it is considered that the preset laser parameters are relatively accurate in measuring the age of the target object. Therefore, the target age is directly used as the final age of the target object without the need to re-detect the age.

[0023] S005, Use a laser device with sample parameters similar to the sample standard to laser ablate the target object to obtain the final age of the target object.

[0024] Specifically, if the preset laser parameters do not belong to the target parameter list of similar sample marks, it is considered that the preset laser parameters may not be applicable for measuring the age of the target object. Therefore, the present invention uses the sample mark parameters of the similar sample mark to re-measure the target object to obtain the final age of the target object.

[0025] In summary, the target object is obtained, and the laser equipment corresponding to the preset laser parameters is used to laser ablate the target object, obtain relevant information of the target object, obtain the sample element list and sample element content list corresponding to the preset sample standard, and based on the relevant information of the target object, the sample element list H i And sample standard element content list L i, obtain similar sample marks of the target object. If the preset laser parameters belong to the target parameter list of similar sample marks, the target age is used as the final age of the target object. If the preset laser parameters do not belong to the target parameter list of similar sample marks, a laser device with sample mark parameters of similar sample marks is used to laser ablate the target object to obtain the final age of the target object. The present invention finds similar sample marks in the preset sample mark list and the target object through the elements of the target object, and determines whether the preset laser parameters are the most accurate for testing the target object based on the target parameter list of similar sample marks, thereby more accurately obtaining the final age of the target ore.

[0026] Furthermore, S003 also includes:

[0027] S010, if the content ratio of the preset main element in the target element of the target object meets the preset ratio requirement, a similar sample standard is obtained based on the preset main element in the target element.

[0028] Specifically, the preset proportion requirement is: greater than a preset proportion threshold; specifically, the preset proportion threshold can be determined according to actual needs.

[0029] S020: If the content ratio of the preset main element in the target element of the target object does not meet the preset ratio requirement, a similar sample standard is obtained based on the preset main element and the preset associated element in the target element.

[0030] In summary, if the content ratio of the preset main elements in the target elements of the target object meets the preset ratio requirements, similar sample standards are obtained based on the preset main elements in the target elements; if the content ratio of the preset main elements in the target elements of the target object does not meet the preset ratio requirements, similar sample standards are obtained based on the preset main elements and preset associated elements in the target elements. It can be understood that the present invention determines similar sample standards based on the content ratio of elements, and only when the content of elements meets the preset ratio requirements, similar sample standards are obtained according to the elements, thereby obtaining similar sample standards more accurately.

[0031] Specifically, S010 also includes:

[0032] S011, obtain the preset main element list AP = {AP 1 , A.P. 2 , …, AP x , …, AP q}, AP x is the xth preset main element, the value range of x is 1 to q, and q is the number of preset main elements. Specifically, the preset main element can be determined according to actual needs; in one embodiment of the present invention, the preset main element is a radioactive element.

[0033] S012, obtaining the first similarity AS i=∑ q x＝1 (WP x ×|CP x -LA ix | / CP x ), thereby obtaining the first similarity list AS = {AS 1 , A.S. 2 ,…,AS i ,…,AS m}, where WP x It is AP x The corresponding preset weight, CP x Is the AP of the target item x The content of LA ix is the AP of the i-th sample x The content.

[0034] Specifically, the first similarity describes the degree of similarity between the target object and the preset sample standard. The present invention uses the content of the preset main element to determine the first similarity.

[0035] S013, Get AS 0 =max{AS 1 , A.S. 2 , …, AS i , …, AS m} and AS 0 The corresponding preset sample standards are used as similar sample standards.

[0036] In summary, a preset main element list is obtained, a first similarity is obtained, and thus a first similarity list is obtained, the maximum first similarity is obtained, and the preset sample mark corresponding to the maximum first similarity is used as a similar sample mark, and a similar sample mark is obtained based on the content of the preset main elements.

[0037] Specifically, S020 also includes:

[0038] S021, obtain the preset associated element list BP = {BP 1 , BP 2 ,…,BP y ,…,BP p}, BP y is the yth preset associated element, the value range of y is 1 to p, p is the number of preset associated elements, wherein the preset associated element is different from the preset main element. Specifically, the preset associated element can be determined according to actual needs; in one embodiment of the present invention, the preset associated element is an element generated by the preset main element during the laser ablation process; in another embodiment of the present invention, the preset associated element is a non-radioactive element.

[0039] S022, obtaining a second similarity BSi =∑ q x＝1 (WP x ×|CP x -LA ix | / CP x )+∑ p y＝1 (EW y ×|EP y -LB ix | / DP y ), thereby obtaining the second similarity list BS = {BS 1 , B.S. 2 , …, B.S. i , …, B.S. m}, E.W. y It's BP y The corresponding preset weight, DP y Is the BP of the target item y Content, LB ix is the BP of the i-th sample x The content.

[0040] Among them, WP x >EW y It can be understood that when the content of the preset main element does not meet the preset proportion requirement, the present invention uses the content of the preset main element and the preset associated element to obtain the second similarity. When performing laser ablation to calculate the age, the preset main element still occupies the main position. Therefore, the weight of the preset main element is greater than the weight of the preset associated element.

[0041] Specifically, the second similarity also describes the degree of similarity between the target object and the preset sample mark. The present invention uses the preset main elements and the preset associated elements to determine the second similarity.

[0042] S023, Get BS 0 =max{BS 1 , B.S. 2 , …, B.S. i , …, B.S. m} and BS 0 The corresponding preset sample standards are used as similar sample standards.

[0043] In summary, a preset associated element list is obtained, and a second similarity is obtained based on the preset main elements and the preset associated elements, thereby obtaining a second similarity list, and the preset sample mark corresponding to the largest second similarity is used as a similar sample mark. When the content ratio of the preset main elements does not meet the preset ratio requirement, the content ratio of the preset main elements and the preset associated elements is used to obtain similar sample marks, so as to obtain similar sample marks more accurately.

[0044] Specifically, the present invention further includes obtaining the preset laser parameters through the following steps:

[0045] S100, obtain the preset standard sample ID list A={A 1 , A 2 , …, A i , …, A m} and the real age list set E = {E 1 , E 2 , …, E i , …, E m}, A i is the ID of the i-th preset sample, the i-th real age list E i Including A i The true age of several elements to be tested, the value range of i is 1 to m, and m is the number of preset sample standards.

[0046] The preset standard sample ID is the unique identifier of the preset standard sample. i ={E i1 , E i2 , …, E it , …, E ik}, E it Yes A i The true age of the tth element to be tested in the corresponding sample. The value range of t is 1 to k, and k is the number of elements to be tested.

[0047] Specifically, the elements to be tested include: 238 U, 235 U. Further, the element to be detected also includes: 206 Pb, 207 Pb, 208 Further, those skilled in the art know that the element to be detected can be set according to actual needs.

[0048] S200, A i The corresponding preset sample uses test parameter B j Perform laser ablation and obtain the test age list C ij , thus obtaining the test age list set C = {C 1 , C 2 ,…,C i ,…,C m}, C i ={C i1 , C i2 , …, C ij , …, C in}, where C ij Including A i The test age of several elements to be tested, the test parameter list B = {B1 , B 2 , …, B j , …, B n}, j ranges from 1 to n, where n is the number of test parameters.

[0049] Specifically, those skilled in the art know that any laser ablation method in the prior art falls within the protection scope of the present invention and will not be described in detail herein. Specifically, the types of test parameters include: laser beam spot diameter, energy density, ablation depth, and laser frequency.

[0050] Specifically, C. ij ={C ij1 , C ij2 , …, C ijt , …, C ijk}, C ijt Yes A i The corresponding sample standard uses B j Get the test age of the tth element to be tested.

[0051] S300, based on the real age list E and the test age list set C, obtain an initial score list set D = {D 1 , D 2 , …, D i ,…,D m},D i ={D i1 , D i2 , …, D ij , …, D in}, where D ij It is C ij It can be understood that the initial score is the score of the test parameters based on the preset sample standard.

[0052] S400, D i1 To D in Sort from large to small, and get the first s initial scores after sorting as the target score list M i ={M i1 , M i2 , …, M ir , …, M is}, thereby obtaining the target score list set M = {M 1 , M 2 , …, M i ,…,M m}, where M ir is the rth target score, and the value range of r is 1 to s, s≤n.

[0053] Optionally, 2≤s≤5; preferably, s = 3. It can be understood that the initial scores in each initial score list are sorted from large to small, and the top s scores after sorting are obtained as the target scores.

[0054] S500, based on the target score list set M, obtaining a preset laser parameter in the dating process, wherein the preset laser parameter is a test parameter in the test parameter list.

[0055] In summary, a preset standard sample ID list and a real age list set are obtained, the preset sample mark is laser ablated using the test parameters, the test age of the element to be tested in the sample mark is obtained, thereby obtaining the test age list set, and an initial score parameter list set is obtained based on the real age list set and the test age list set, and the initial scores in the initial score list are sorted to obtain a target score list, and based on the target score list set, the preset laser parameters in the dating process are obtained. When an ore is obtained and it is desired to use LA-ICP-MS to detect the ore to obtain the age of the ore, it is not clear how to set the parameters of LA-ICP-MS, and it is also unknown whether the ore age obtained by arbitrarily setting the parameters is accurate. Therefore, the present invention uses several sample marks and several test parameters to find the most suitable parameters for the preset sample marks as the preset laser parameters, so as to more accurately and quickly detect the age of the target ore.

[0056] Specifically, S500 includes:

[0057] S510, obtain M ir The corresponding test parameter is recorded as the target parameter N ir , thereby obtaining the target parameter list set N = {N 1 , N 2 ,…,N i ,…,N m}, the i-th target parameter list N i = {N i1 , N i2 ,…,N ir ,…,N is}.

[0058] S520, for N ir Count and get N ir Number of SN ir , SN 0 The corresponding target parameters are used as preset laser parameters, SN 0 =max{N 11 ...N 1s , N 21 ...N 2s ,…,N i1 ...N is ,…,N m1 ...Nms}.

[0059] Specifically, the test parameter corresponding to the target score is used as the target parameter. If the same target parameter appears the most times, the target parameter is used as the preset laser parameter.

[0060] In an exemplary embodiment of the present invention, m=2, M={M 1 , M 2},M 1 ={M 11 , M 12},M 2 ={M 21 , M 22},M 11 The corresponding test parameters are test parameter 1, M 12 The corresponding test parameters are test parameter 2, M 21 The corresponding test parameters are test parameter 2, M 22 The corresponding test parameter is test parameter 3, test parameter 1 is recorded as target parameter 1, test parameter 2 is recorded as target parameter 2, test parameter 3 is recorded as target parameter 3, the target parameters are counted, and target parameter 2 is used as the preset laser parameter.

[0061] Specifically, S300 includes:

[0062] S310, obtaining a weight list W of the elements to be tested = {W 1 , W 2 , …, W g , …, W z},W g is the weight of the gth element to be tested, the value range of g is 1 to z, and z is the number of elements to be tested.

[0063] Specifically, the weight of the element to be detected can be determined according to actual needs; in one embodiment of the present invention, the weight of the radioactive element in the element to be detected is greater than the weight of the non-radioactive element in the element to be detected.

[0064] S320, get D ij =∑ z g＝1 (W g ×|E ig -C ijg | / E ig ), where E ig is the true age of the gth element to be measured in the i-th sample, C ijg It is the test age of the gth element when the i-th sample uses the j-th test parameter.

[0065] Specifically, the initial score is used to reflect the difference between the test age and the real age. Therefore, the present invention uses |E ig -C ijg |It is used to reflect the difference between the test age and the real age, and use different weights for different elements to be tested, so that the more important elements to be tested in age measurement are given greater weights, making the initial score more accurate.

[0066] An embodiment of the present invention also provides a non-transitory computer-readable storage medium, which can be set in an electronic device to store at least one instruction or at least one program related to implementing a method in a method embodiment. The at least one instruction or the at least one program is loaded and executed by the processor to implement the method provided in the above embodiment.

[0067] An embodiment of the present invention further provides an electronic device, comprising a processor and the aforementioned non-transitory computer-readable storage medium.

[0068] Although some specific embodiments of the present invention have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the present invention. It will also be appreciated by those skilled in the art that various modifications may be made to the embodiments without departing from the scope and spirit of the present invention. The scope of the present invention is defined by the appended claims.

Claims

1. A material age measurement method based on laser equipment, characterized in that: The method comprises the following steps: S001, obtaining a target object, and performing laser ablation on the target object using a laser device corresponding to preset laser parameters to obtain relevant information of the target object, wherein the relevant information of the target object includes: target elements contained in the target object, target element content, and target age; S002, obtain the preset standard sample ID A i The corresponding sample element list H i And sample standard element content list L i , and obtain A i The corresponding target parameter list G i , wherein the sample standard element content list includes several sample standard element contents, the sample standard element content is the content of the sample standard element, the sample standard element list includes several sample standard elements, the target parameter list includes several target parameters, the target parameter is the target parameter of the laser device used by the sample standard, and the preset standard sample ID list A = {A1, A2, ..., A i , …, A m }, A i is the ID of the i-th sample label, the value range of i is 1 to m, and m is the number of sample labels; S003, based on the target item related information, sample element list H i And sample standard element content list L i , obtain similar sample labels of the target object; S004, if the preset laser parameter ∈ the target parameter list of similar samples, the target age is taken as the final age of the target object; S005, if the laser parameters are preset A list of target parameters of similar samples is provided, and laser equipment with sample parameters of similar samples is used to laser ablate the target object to obtain the final age of the target object.

2. The material age measurement method based on laser equipment according to claim 1 is characterized in that: S003 also includes: S010, if the content ratio of the preset main element in the target element of the target object meets the preset ratio requirement, obtain a similar sample standard based on the preset main element in the target element; S020: If the content ratio of the preset main element in the target element of the target object does not meet the preset ratio requirement, a similar sample standard is obtained based on the preset main element and the preset associated element in the target element.

3. The material age measurement method based on laser equipment according to claim 2 is characterized in that: S010 also includes: S011, obtain a preset main element list AP = {AP1, AP2, ..., AP x , …, AP q }, AP x is the xth preset main element, where x ranges from 1 to q, and q is the number of preset main elements; S012, obtaining the first similarity AS i =∑ q x＝1 (WP x ×|CP x -LA ix | / CP x ), thereby obtaining the first similarity list AS = {AS1, AS2, ..., AS i ,…,AS m }, where WP x It is AP x The corresponding preset weight, CP x Is the AP of the target item x The content of LA ix is the AP of the i-th sample x Content; S013, obtain AS0=max{AS1, AS2, ..., AS i ,…,AS m } and use the preset sample mark corresponding to AS0 as the similar sample mark.

4. The material age measurement method based on laser equipment according to claim 2 is characterized in that: S020 also includes: S021, obtain a preset associated element list BP = {BP1, BP2, ..., BP y ,…,BP p }, BP y is the yth preset association element, where y ranges from 1 to p, and p is the number of preset association elements, where the preset association element is different from the preset main element; S022, obtaining a second similarity BS i =∑ q x＝1 (WP x ×|CP x -LA ix | / CP x )+∑ p y＝1 (EW y ×|EP y -LB ix | / DP y ), thereby obtaining the second similarity list BS = {BS1, BS2, ..., BS i , …, B.S. m }, E.W. y It's BP y The corresponding preset weight, DP y Is the BP of the target item y Content, LB ix is the BP of the i-th sample x Content; S023, obtain BS0=max{BS1, BS2, ..., BS i , …, B.S. m } and use the preset sample mark corresponding to BS0 as the similar sample mark.

5. The material age measurement method based on laser equipment according to claim 1, characterized in that: The preset standard sample ID is the unique identifier of the preset standard sample.

6. The laser-based material age measurement method according to claim 3, characterized in that: The main elements are assumed to be radioactive elements.

7. The material age measurement method based on laser equipment according to claim 4 is characterized in that: WP x >HE y 。 8. The material age measurement method based on laser equipment according to claim 1, characterized in that: The preset laser parameters include at least: laser beam spot diameter, energy density, ablation depth, and laser frequency.

9. The material age measurement method based on laser equipment according to claim 1, characterized in that: The sample standard elements at least include: 238 U, 235 U, 206 Pb, 207 Pb, 208 Pb.

10. A non-transitory computer-readable storage medium, wherein at least one instruction or at least one program is stored in the storage medium, characterized in that: The at least one instruction or the at least one program is loaded and executed by the processor to implement the material age measurement method based on a laser device as described in any one of claims 1-9.

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