A method and system for detecting faults in an induction cooker circuit

Abstract

The invention discloses an induction cooker circuit fault detection method, which relates to the field of fault detection and comprises the following steps: collecting information on an induction cooker circuit to be detected, obtaining corresponding circuit information, and constructing an induction cooker simulation circuit based on the circuit information; performing simulation based on the constructed induction cooker simulation circuit, and setting corresponding circuit test points according to the simulation results; collecting signals on the induction cooker circuit to be detected based on the obtained circuit test points, and obtaining corresponding detection signals; performing signal processing on the collected detection signals, and judging whether there is a circuit fault in the corresponding circuit to be detected according to the processing results, and obtaining corresponding judgment results; and performing information feedback based on the obtained judgment results. The invention improves the efficiency and accuracy of induction cooker circuit fault detection.

Description

Technical Field

[0001] The present invention relates to the field of fault detection, and in particular to a method and system for detecting faults in an induction cooker circuit. Background Art

[0002] With the popularity and application of induction cookers, the problem of circuit failure has become increasingly prominent. As a household appliance, induction cookers are widely used in households and commercial occasions due to their advantages such as fast heating speed, high thermal efficiency and convenient use. However, since the working principle of induction cookers involves high-power electromagnetic energy conversion, their circuit system is relatively complex and prone to various failures. These failures not only affect the normal use of users, but may also cause safety hazards, such as circuit short circuit, overheating, and even fire or electric shock accidents.

[0003] Compared with the existing technology, the traditional induction cooker circuit fault detection method mainly relies on manual observation and experience judgment, which is inefficient and not very accurate; and there are many traditional circuit fault diagnosis methods, but they are generally used to diagnose hard faults such as open circuit and short circuit; it is difficult to find soft faults such as component defects or slow failures in various devices in the circuit; these are the problems we need to solve, for this reason we provide an induction cooker circuit fault detection method and system. Summary of the invention

[0004] The object of the present invention is to provide a method and system for detecting circuit faults of an induction cooker.

[0005] The purpose of the present invention can be achieved by the following technical solution: A method for detecting a circuit fault of an induction cooker comprises the following steps:

[0006] Step 1: Collect information on the induction cooker circuit to be tested, obtain corresponding circuit information, and construct an induction cooker simulation circuit based on the circuit information;

[0007] Step 2: Perform simulation based on the constructed induction cooker simulation circuit, and set corresponding circuit test points according to the simulation results;

[0008] Step 3: Based on the obtained circuit test points, signal acquisition is performed on the induction cooker circuit to be tested to obtain a corresponding test signal;

[0009] Step 4: Process the collected detection signal, and determine whether there is a circuit fault in the corresponding circuit to be detected based on the processing result, and obtain a corresponding judgment result;

[0010] Step 5: Provide information feedback based on the obtained judgment results.

[0011] Furthermore, the process of collecting information on the induction cooker circuit to be detected, obtaining corresponding circuit information, and constructing an induction cooker simulation circuit based on the circuit information includes:

[0012] A capture node is set, and information of the circuit of the induction cooker to be detected is captured through the capture node to obtain corresponding circuit information; the captured circuit information is imported into the circuit simulation software to obtain the induction cooker simulation circuit corresponding to the induction cooker circuit to be detected.

[0013] Furthermore, the process of performing simulation based on the constructed induction cooker simulation circuit and setting corresponding circuit test points according to the simulation results includes:

[0014] Based on the captured circuit information, the component type of each circuit component in the corresponding induction cooker to be detected is obtained, and based on the component type, the component threshold of the corresponding circuit component is obtained;

[0015] The electromagnetic oven simulation circuit performs circuit simulation based on the collected circuit element information, and collects signals from the output end of the corresponding electromagnetic oven simulation circuit to obtain a corresponding initial circuit signal;

[0016] Adjusting the circuit element parameters in the corresponding induction cooker simulation circuit based on the element threshold, and after the adjustment is completed, performing circuit simulation again, and collecting the output terminal signal to obtain the corresponding simulation circuit signal;

[0017] Taking a difference between the obtained initial circuit signal and the simulated circuit signal to obtain a corresponding signal deviation;

[0018] Based on the obtained signal deviation value, the sensitivity factor corresponding to the circuit element whose circuit element parameters are modified is obtained; based on the sensitivity factor, it is determined whether the corresponding circuit element satisfies the setting of the circuit test point; if not, no other operations are performed; if satisfied, a circuit test point is set in the circuit node or circuit branch where the corresponding circuit element is located.

[0019] Furthermore, based on the obtained circuit test points, the process of collecting signals from the induction cooker circuit to be tested and obtaining corresponding test signals includes:

[0020] Based on the induction cooker simulation circuit, a circuit simulation operation is performed to obtain a number of circuit signals under normal working conditions, and the circuit signals are marked as standard circuit signals; the standard circuit signals include input and output circuit signals and test circuit signals corresponding to circuit test points;

[0021] Randomly select the obtained standard circuit signal, and inject the input circuit signal in the corresponding standard circuit signal into the induction cooker circuit to be detected through the interface;

[0022] A collection node is set, and after the injection is completed, the circuit signal in the corresponding induction cooker circuit to be detected is collected based on the data collection node to obtain a corresponding detection signal.

[0023] Furthermore, the process of processing the collected detection signal and judging whether there is a circuit fault in the corresponding circuit to be detected according to the processing result includes:

[0024] Reading the collected detection signal, and performing multi-level decomposition on the detection signal to obtain decomposed signals of several levels;

[0025] After the decomposition is completed, the obtained decomposition signal is discretely transformed based on the wavelet transform algorithm to obtain the corresponding wavelet coefficients;

[0026] Then, the corresponding decomposed signal is further decomposed based on the wavelet coefficients to obtain corresponding low-frequency signals and high-frequency signals; and feature extraction is performed on the decomposed signal to obtain corresponding low-frequency coefficients and high-frequency coefficients;

[0027] Obtaining low-frequency coefficients and high-frequency coefficients corresponding to the decomposed signals at all levels corresponding to the detection signal; and constructing corresponding detection subgroups based thereon;

[0028] Counting the detection subgroups corresponding to all detection signals to obtain corresponding detection samples;

[0029] The detection sample is input into the constructed fault detection model to obtain a corresponding output result, and based on the obtained output result, it is determined whether there is a fault in the corresponding induction cooker circuit to be detected. If a fault exists, a corresponding fault warning is generated.

[0030] Furthermore, the process of constructing the fault detection model includes:

[0031] Read the sensitivity factors corresponding to all circuit elements in the corresponding induction cooker simulation circuit;

[0032] Setting a classification threshold, comparing the obtained sensitivity factor with the classification threshold, and weighting the corresponding circuit components according to the comparison result to obtain the corresponding component level;

[0033] respectively obtaining component thresholds corresponding to corresponding circuit components, and setting tolerance ranges based on the component thresholds;

[0034] Based on the tolerance range, parameters of circuit elements in the corresponding electromagnetic oven simulation circuit are adjusted, and simulation is performed to obtain simulation signals of the corresponding electromagnetic oven simulation circuit in a normal tolerance range and an abnormal tolerance range, respectively;

[0035] At the same time, based on big data technology, the corresponding fault data of the same type of induction cooker under fault state is obtained;

[0036] Based on the fault data and the tolerance range, the fault state of the corresponding induction cooker simulation circuit is divided to obtain a corresponding fault mode;

[0037] The obtained simulation signal is read, and based on the above signal processing process, the corresponding simulation signal is processed to obtain corresponding sample data; and a corresponding fault detection model is constructed based on the sample data.

[0038] Furthermore, the process of providing information feedback based on the obtained determination result includes:

[0039] When a fault warning is received, an output result of the fault detection model is read, wherein the output result includes a sample report corresponding to each sample subgroup in the corresponding detection sample;

[0040] Based on the sample report, it is determined whether there is a fault at a circuit test point in the corresponding induction cooker circuit to be tested, and if there is no fault, no other operation is performed;

[0041] If there is a fault, based on the sample, the location information of the corresponding circuit test point is obtained, and the location information is the circuit node or circuit branch where the corresponding circuit test point is located; and the corresponding location information is fed back to the staff;

[0042] At the same time, based on the sample report, the proportion of circuit test points with faults in the corresponding circuit to be detected in the total circuit test points is obtained, and corresponding warning information is generated based on the component level and failure mode of the circuit components corresponding to the corresponding circuit test points.

[0043] An induction cooker circuit detection system comprises a detection center, wherein the detection center is communicatively connected with a simulation module, a data acquisition module, a data analysis module and an information feedback module;

[0044] The simulation module is used to construct an induction cooker simulation circuit and obtain corresponding circuit test points based on the simulation circuit;

[0045] The data acquisition module is used to collect signals from the circuit test points in the induction cooker circuit to be tested, and obtain corresponding test signals;

[0046] The data analysis module is used to perform fault processing on the collected detection signal, and determine whether there is a fault based on the signal processing result to obtain a corresponding judgment result;

[0047] The information feedback module is used to provide information feedback based on the obtained judgment result.

[0048] Compared with the prior art, the beneficial effects of the present invention are: by using simulation circuits and precise signal processing technology, the fault points in the induction cooker circuit can be effectively identified and located, thereby improving the accuracy of fault detection; at the same time, this method can quickly perform a large amount of data analysis and simulation tests, thereby improving the efficiency of detection; reducing human resources; and precise fault location can reduce unnecessary maintenance work and replacement costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 is a flow chart of the method of the present invention;

[0050] Figure 2 A schematic diagram of the system of the present invention. DETAILED DESCRIPTION

[0051] like Figure 1 As shown, a method for detecting an induction cooker circuit fault comprises the following steps:

[0052] Step 1: Collect information on the induction cooker circuit to be tested, obtain corresponding circuit information, and construct an induction cooker simulation circuit based on the circuit information;

[0053] Step 2: Perform simulation based on the constructed induction cooker simulation circuit, and set corresponding circuit test points according to the simulation results;

[0054] Step 3: Based on the obtained circuit test points, signal acquisition is performed on the induction cooker circuit to be tested to obtain a corresponding test signal;

[0055] Step 4: Process the collected detection signal, and determine whether there is a circuit fault in the corresponding circuit to be detected based on the processing result, and obtain a corresponding judgment result;

[0056] Step 5: Provide information feedback based on the obtained determination results;

[0057] It should be further explained that, in the specific implementation process, the process of collecting information on the induction cooker circuit to be detected, obtaining corresponding circuit information, and constructing an induction cooker simulation circuit based on the circuit information includes:

[0058] Setting a capture node, through which information of the circuit of the induction cooker to be detected is captured to obtain corresponding circuit information, wherein the circuit information includes but is not limited to circuit element parameters and circuit topology structure in the circuit of the induction cooker to be detected; the circuit element parameters include element type, element value (such as resistance value) and other related parameters;

[0059] Importing the captured circuit information into circuit simulation software to obtain an electromagnetic cooker simulation circuit corresponding to the electromagnetic cooker circuit to be detected, wherein the electromagnetic cooker simulation circuit can be used to simulate the actual operation process of the electromagnetic cooker to be detected, and the electromagnetic cooker simulation circuit supports the modification of the circuit information;

[0060] It should be further explained that, in the specific implementation process, the process of performing simulation based on the constructed induction cooker simulation circuit and setting corresponding circuit test points according to the simulation results includes:

[0061] Based on the captured circuit information, the component type of each circuit component in the corresponding induction cooker to be detected is obtained, and based on the component type, the component threshold of the corresponding circuit component is obtained, wherein the component threshold refers to the allowable variation range of the corresponding component parameter of the corresponding circuit component in the circuit of the induction cooker to be detected;

[0062] The electromagnetic oven simulation circuit performs circuit simulation based on the collected circuit element information, and collects signals from the output end of the corresponding electromagnetic oven simulation circuit to obtain a corresponding initial circuit signal;

[0063] Adjusting the circuit element parameters in the corresponding induction cooker simulation circuit based on the element threshold, and after the adjustment is completed, performing circuit simulation again, and collecting the output terminal signal to obtain the corresponding simulation circuit signal, wherein the simulation circuit signal and the initial circuit signal both include a voltage signal, a current signal and a temperature signal;

[0064] The difference between the obtained initial circuit signal and the simulated circuit signal is obtained to obtain the corresponding signal deviation, which is recorded as ; Where i=1,2,3; 1 represents voltage deviation, 2 represents current deviation, and 3 represents temperature deviation;

[0065] Obtaining a sensitivity factor corresponding to the circuit element whose circuit element parameters are modified based on the obtained signal deviation value; and recording the sensitivity factor as Lj;

[0066] in, ;

[0067] Wherein, Lj represents the sensitivity factor corresponding to the jth circuit element, that is, the circuit element modified corresponding to the analog circuit signal;

[0068] Indicates the parameter deviation value of the corresponding circuit element before and after the circuit element parameter adjustment;

[0069] Setting a first threshold, and comparing the obtained first threshold with the sensitivity factor;

[0070] If the sensitivity factor is less than the first threshold, no other operations are performed;

[0071] If the sensitivity factor is not less than the first threshold, setting a circuit test point in the circuit node or circuit branch where the corresponding circuit element is located;

[0072] It should be further explained that, in the specific implementation process, the process of collecting signals from the induction cooker circuit to be tested based on the obtained circuit test points and obtaining corresponding test signals includes:

[0073] Based on the induction cooker simulation circuit, a circuit simulation operation is performed to obtain a number of circuit signals under normal working conditions, and the circuit signals are marked as standard circuit signals; the standard circuit signals include input and output circuit signals and test circuit signals corresponding to circuit test points;

[0074] The obtained standard circuit signal is arbitrarily selected, and the input circuit signal in the corresponding standard circuit signal is injected into the induction cooker circuit to be detected through an interface; wherein the interface may be an input end of a circuit board in the induction cooker or a power input end connected to the induction cooker through an adapter;

[0075] A collection node is set, and after the injection is completed, a circuit signal in the corresponding induction cooker circuit to be detected is collected based on the data collection node to obtain a corresponding detection signal; the detection signal includes a circuit detection signal corresponding to a circuit test point and a circuit output signal corresponding to an output end;

[0076] It should be further explained that, in the specific implementation process, the process of processing the collected detection signal and judging whether there is a circuit fault in the corresponding circuit to be detected according to the processing result includes:

[0077] Read the collected detection signal, encode the circuit detection signal and the circuit output signal in the detection signal, and record it as k, where k=0, 1, 2..., m, m≥0 and m is an integer; it should be further explained that when k=0, the corresponding detection signal k specifically refers to the circuit output signal, and when k>0, it indicates the circuit test signal corresponding to the circuit test point;

[0078] Read the collected detection signal k, and perform multi-level decomposition on the detection signal k to obtain c-level decomposition signals, wherein c>0 and c is an integer. The value of c in the present invention is 3-5, and the specific value depends on the actual situation of the detection signal k and the actual needs of the staff;

[0079] After the decomposition is completed, the obtained decomposition signal is discretely transformed based on the wavelet transform algorithm to obtain the corresponding wavelet coefficients, and the wavelet coefficients are the approximation degree of the offset of the decomposition signal to the input circuit signal; it should be further explained that the discrete transformation process is a prior art and will not be elaborated in detail in the present invention;

[0080] Then, the corresponding decomposed signal is further decomposed based on the wavelet coefficients to obtain corresponding low-frequency signals and high-frequency signals; and feature extraction is performed to obtain corresponding low-frequency coefficients and high-frequency coefficients, wherein the low-frequency coefficients represent the low-frequency components of the signal, that is, the overall trend and basic shape of the signal; and the high-frequency coefficients are used to represent the high-frequency components in the corresponding decomposed signal, including detailed information and local changes of the signal;

[0081] Obtain low-frequency coefficients and high-frequency coefficients corresponding to the decomposed signals at all levels corresponding to the detection signal k; and construct corresponding detection subgroups based thereon;

[0082] Counting the detection subgroups corresponding to all detection signals to obtain corresponding detection samples;

[0083] Input the detection sample into the constructed fault detection model and obtain a corresponding output result, and determine whether there is a fault in the corresponding induction cooker circuit to be detected based on the obtained output result, and if there is a fault, generate a corresponding fault warning;

[0084] It should be further explained that, in the specific implementation process, the process of constructing the fault detection model includes:

[0085] Read the sensitivity factors corresponding to all circuit elements in the corresponding induction cooker simulation circuit;

[0086] Setting a classification threshold, comparing the obtained sensitivity factor with the classification threshold, and weighting the corresponding circuit elements according to the comparison result to obtain corresponding element levels, wherein the element levels include primary elements, secondary elements, and tertiary elements, wherein the importance of circuit elements at different element levels is primary elements>secondary elements>tertiary elements;

[0087] respectively obtaining component thresholds corresponding to corresponding circuit components, and setting tolerance ranges based on the component thresholds; the tolerance ranges include normal tolerance ranges and abnormal tolerance ranges;

[0088] Based on the tolerance range, parameters of circuit elements in the corresponding electromagnetic oven simulation circuit are adjusted, and simulation is performed to obtain simulation signals of the corresponding electromagnetic oven simulation circuit within a normal tolerance range and an abnormal tolerance range, respectively, wherein the simulation signals include a normal operation signal and an abnormal operation signal;

[0089] At the same time, based on big data technology, the fault data corresponding to the same type of induction cooker in the fault state is obtained, and the fault data includes the fault type and the specific values ​​of the circuit component parameters under the corresponding fault type;

[0090] Based on the fault data and the tolerance range, the fault state of the corresponding induction cooker simulation circuit is divided to obtain a corresponding fault mode; the fault mode includes a large fault, a small fault and a serious fault;

[0091] Read the obtained simulation signal, and based on the above signal processing process, perform signal processing on the corresponding simulation signal to obtain corresponding sample data, and the sample data is used as a characteristic vector of the circuit state after wavelet transformation and normalization processing;

[0092] Then, a test set and a training set are formed based on the sample data of the normal operation signal and the abnormal operation signal corresponding to each fault mode;

[0093] Constructing an initial BP network model, and then, training the corresponding BP network model based on the obtained training set, saving the model parameters when the loss function is stable, and verifying the corresponding BP network model based on the test set. If the verification fails, continue to train the model until it meets the requirements. If the verification passes, output the corresponding BP network model to obtain a corresponding fault detection model.

[0094] It should be further explained that, in the specific implementation process, in the process of forming the corresponding sample data, the higher the component level of the circuit element, the higher the proportion of the simulation signal corresponding to the corresponding circuit element in the corresponding sample data;

[0095] It should be further explained that, in the specific implementation process, if the induction cooker simulation circuit has p fault modes, and the characteristic vector of each state is N-dimensional; then the input layer requires N neurons, and the output layer requires at least N neurons;

[0096] In one embodiment of the present invention, the classification process of the corresponding fault status is as follows:

[0097] Taking a capacitor in the corresponding induction cooker simulation circuit as an example, the component threshold of the corresponding capacitor is recorded as (C1, C2); then the tolerance range corresponding to the corresponding capacitor is: the corresponding normal tolerance range is (C1, C2); the corresponding abnormal tolerance range is (C0, C1) and (C2, C3);

[0098] If, during the simulation process of the corresponding electromagnetic oven simulation circuit, the capacitance value C of the corresponding capacitor is within the normal tolerance range, the corresponding electromagnetic oven circuit is operating normally, that is, the corresponding simulation signal is a normal operating signal;

[0099] If the corresponding capacitance value is within the abnormal tolerance range (C0, C1), it is a small fault. If the corresponding capacitance value is within the abnormal tolerance range (C2, C3), it is a large fault, and the corresponding simulation signal is an abnormal simulation operation signal.

[0100] If the corresponding capacitance value does not fall within the tolerance range, the corresponding fault mode is marked as a severe fault mode;

[0101] It should be further explained that, in the specific implementation process, the process of providing information feedback based on the obtained determination results includes:

[0102] When a fault warning is received, an output result of the fault detection model is read, wherein the output result includes a sample report corresponding to each sample subgroup in the corresponding detection sample;

[0103] Based on the sample report, it is determined whether there is a fault at a circuit test point in the corresponding induction cooker circuit to be tested, and if there is no fault, no other operation is performed;

[0104] If there is a fault, based on the sample, the location information of the corresponding circuit test point is obtained, and the location information is the circuit node or circuit branch where the corresponding circuit test point is located; and the corresponding location information is fed back to the staff to facilitate the staff to perform maintenance;

[0105] At the same time, based on the sample report, the proportion of circuit test points with faults in the corresponding circuit to be tested in the total circuit test points is obtained, and corresponding warning information is generated based on the component level and failure mode of the circuit elements corresponding to the corresponding circuit test points. The warning information includes first-level warning, second-level warning, and third-level warning. The higher the warning level, the more serious the fault problem of the corresponding induction cooker to be tested.

[0106] like Figure 2 As shown, an induction cooker circuit fault detection system includes a detection center, and the detection center is communicatively connected with a simulation module, a data acquisition module, a data analysis module and an information feedback module;

[0107] The simulation module is used to construct an induction cooker simulation circuit and obtain corresponding circuit test points based on the simulation circuit;

[0108] The data acquisition module is used to collect signals from the circuit test points in the induction cooker circuit to be tested, and obtain corresponding test signals;

[0109] The data analysis module is used to perform fault processing on the collected detection signal, and determine whether there is a fault based on the signal processing result to obtain a corresponding judgment result;

[0110] The information feedback module is used to provide information feedback based on the obtained judgment result.

[0111] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A method for detecting faults in an induction cooker circuit, characterized in that: The following steps are involved: Step 1: Collect information about the induction cooker circuit to be tested, obtain corresponding circuit information, and build an induction cooker simulation circuit based on the circuit information: Setting a capture node, capturing information of the circuit of the induction cooker to be detected through the capture node, and obtaining corresponding circuit information; importing the captured circuit information into the circuit simulation software, and obtaining an induction cooker simulation circuit corresponding to the induction cooker circuit to be detected; Step 2: Perform simulation based on the constructed induction cooker simulation circuit, and set corresponding circuit test points according to the simulation results: Based on the captured circuit information, the component type of each circuit component in the corresponding induction cooker to be detected is obtained, and based on the component type, the component threshold of the corresponding circuit component is obtained; The electromagnetic oven simulation circuit performs circuit simulation based on the collected circuit element information, and collects signals from the output end of the corresponding electromagnetic oven simulation circuit to obtain a corresponding initial circuit signal; Adjusting the circuit element parameters in the corresponding induction cooker simulation circuit based on the element threshold, and after the adjustment is completed, performing circuit simulation again, and collecting the output terminal signal to obtain the corresponding simulation circuit signal; The difference between the obtained initial circuit signal and the simulated circuit signal is obtained to obtain the corresponding signal deviation, which is recorded as ; Where i=1,2,3; 1 represents voltage deviation, 2 represents current deviation, and 3 represents temperature deviation; Obtaining a sensitivity factor corresponding to the circuit element whose circuit element parameter is modified based on the obtained signal deviation value, wherein the sensitivity factor is recorded as Lj; in, ; Wherein, Lj represents the sensitivity factor corresponding to the jth circuit element, that is, the circuit element modified corresponding to the analog circuit signal; Indicates the parameter deviation value corresponding to the corresponding circuit element before and after the circuit element parameter adjustment; judges whether the corresponding circuit element satisfies the setting of the circuit test point based on the sensitivity factor; if not, no other operation is performed; if satisfied; sets the circuit test point in the circuit node or circuit branch where the corresponding circuit element is located; Read the sensitivity factors corresponding to all circuit elements in the corresponding induction cooker simulation circuit; Setting a classification threshold, comparing the obtained sensitivity factor with the classification threshold, and weighting the corresponding circuit components according to the comparison result to obtain the corresponding component level; respectively obtaining component thresholds corresponding to corresponding circuit components, and setting tolerance ranges based on the component thresholds; Based on the tolerance range, parameters of circuit elements in the corresponding electromagnetic oven simulation circuit are adjusted, and simulation is performed to obtain simulation signals of the corresponding electromagnetic oven simulation circuit in a normal tolerance range and an abnormal tolerance range, respectively; At the same time, based on big data technology, the corresponding fault data of the same type of induction cooker under fault state is obtained; Based on the fault data and the tolerance range, the fault state of the corresponding induction cooker simulation circuit is divided to obtain a corresponding fault mode; Read the obtained simulation signal, and based on the above signal processing process, perform signal processing on the corresponding simulation signal to obtain corresponding sample data; and build a corresponding fault detection model based on the sample data; Step 3: Based on the obtained circuit test points, signal acquisition is performed on the induction cooker circuit to be tested to obtain a corresponding test signal; Step 4: Process the collected detection signal, and determine whether there is a circuit fault in the corresponding circuit to be detected based on the processing result, and obtain the corresponding judgment result: Reading the collected detection signal, and performing multi-level decomposition on the detection signal to obtain decomposed signals of several levels; After the decomposition is completed, the obtained decomposition signal is discretely transformed based on the wavelet transform algorithm to obtain the corresponding wavelet coefficients; Then, the corresponding decomposed signal is further decomposed based on the wavelet coefficients to obtain corresponding low-frequency signals and high-frequency signals; and feature extraction is performed on the decomposed signal to obtain corresponding low-frequency coefficients and high-frequency coefficients; Obtaining low-frequency coefficients and high-frequency coefficients corresponding to the decomposed signals at all levels corresponding to the detection signal; and constructing corresponding detection subgroups based thereon; Counting the detection subgroups corresponding to all detection signals to obtain corresponding detection samples; Input the detection sample into the constructed fault detection model and obtain a corresponding output result, and determine whether there is a fault in the corresponding induction cooker circuit to be detected based on the obtained output result, and if there is a fault, generate a corresponding fault warning; Step 5: Provide information feedback based on the obtained judgment results.

2. The method for detecting an induction cooker circuit fault according to claim 1, characterized in that: Based on the obtained circuit test points, the process of collecting signals from the induction cooker circuit to be tested and obtaining corresponding test signals includes: Based on the induction cooker simulation circuit, a circuit simulation operation is performed to obtain a number of circuit signals under normal working conditions, and the circuit signals are marked as standard circuit signals; the standard circuit signals include input and output circuit signals and test circuit signals corresponding to circuit test points; Randomly select the obtained standard circuit signal, and inject the input circuit signal in the corresponding standard circuit signal into the induction cooker circuit to be detected through the interface; A collection node is set, and after the injection is completed, the circuit signal in the corresponding induction cooker circuit to be detected is collected based on the collection node to obtain a corresponding detection signal.

3. The method for detecting circuit faults of an induction cooker according to claim 2, characterized in that: The process of providing information feedback based on the obtained determination results includes: When a fault warning is received, an output result of the fault detection model is read, wherein the output result includes a sample report corresponding to each sample subgroup in the corresponding detection sample; Based on the sample report, it is determined whether there is a fault at a circuit test point in the corresponding induction cooker circuit to be tested, and if there is no fault, no other operation is performed; If there is a fault, based on the sample, the location information of the corresponding circuit test point is obtained, and the location information is the circuit node or circuit branch where the corresponding circuit test point is located; and the corresponding location information is fed back to the staff; At the same time, based on the sample report, the proportion of circuit test points with faults in the corresponding circuit to be detected in the total circuit test points is obtained, and corresponding warning information is generated based on the component level and failure mode of the circuit components corresponding to the corresponding circuit test points.

4. An induction cooker circuit detection system, characterized in that: A method for detecting a circuit fault of an induction cooker according to claim 3, comprising a detection center, wherein the detection center is communicatively connected to a simulation module, a data acquisition module, a data analysis module and an information feedback module; The simulation module is used to construct an induction cooker simulation circuit and obtain corresponding circuit test points based on the simulation circuit; The data acquisition module is used to collect signals from the circuit test points in the induction cooker circuit to be tested, and obtain corresponding test signals; The data analysis module is used to perform fault processing on the collected detection signals, and determine whether there is a fault based on the signal processing results to obtain a corresponding judgment result; The information feedback module is used to provide information feedback based on the obtained judgment result.

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