A temperature control method, device, system and test chamber for a test chamber

Abstract

The embodiment of the present application discloses a kind of temperature control method, device, system and test chamber of test chamber.Control system includes controller, compressor, condenser, evaporator, evaporator fan, electronic expansion valve and pulse solenoid valve;Electronic expansion valve and pulse solenoid valve are located in the pipeline that condenser and evaporator are communicated, evaporator fan is located in the side of evaporator, compressor, evaporator fan, electronic expansion valve and pulse solenoid valve are electrically connected with controller, control method is executed by controller, and control method includes: obtaining the real-time temperature, target temperature and target time of test chamber;According to real-time temperature, target temperature and target time, determine the temperature change rate of test chamber;According to real-time temperature, target temperature and temperature change rate, the working state of electronic expansion valve, pulse solenoid valve and evaporator fan is controlled.The technical scheme provided by the embodiment of the present application can solve the problems of poor temperature control stability and small adaptive range of cooling rate.

Description

Technical Field

[0001] The embodiments of the present invention relate to temperature control technology for test chambers, and more particularly to a temperature control method, device, system, and test chamber for a test chamber. Background Technology

[0002] In production and daily life, various equipment products require performance testing under varying ambient temperatures. These products can be placed in test chambers, where temperature adjustments are made to assess their performance at different temperatures. Therefore, temperature control of the test chambers is necessary to meet the temperature requirements of the equipment. Currently, existing temperature control methods for test chambers involve adjusting the temperature, such as cooling, by controlling multiple throttling valves. While controlling these throttling valves is relatively simple—for example, controlling the valve opening to vary at regular intervals—it suffers from poor temperature control stability and a limited range of cooling rate adaptability. Summary of the Invention

[0003] This invention provides a temperature control method, device, system, and test chamber for a test chamber, in order to solve the problems of poor temperature control stability and a small range of cooling rate adaptability.

[0004] In a first aspect, embodiments of the present invention provide a temperature control method for a test chamber. The test chamber includes a control system, which comprises a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The outlet of the compressor is connected to the inlet of the condenser, the outlet of the condenser is connected to the inlet of the evaporator, and the outlet of the evaporator is connected to the inlet of the compressor. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, the evaporator fan, the electronic expansion valve, and the pulse solenoid valve are all electrically connected to the controller. The control method is executed by the controller, and the control method includes:

[0005] Obtain the real-time temperature, target temperature, and target time of the test chamber;

[0006] The temperature change rate of the test chamber is determined based on the real-time temperature, the target temperature, and the target time.

[0007] The operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan are controlled based on the real-time temperature, the target temperature, and the rate of temperature change, in order to control the temperature of the test chamber.

[0008] Optionally, determining the temperature change rate of the test chamber based on the real-time temperature, the target temperature, and the target time includes:

[0009] The initial temperature is determined based on the real-time temperature, and the difference between the target temperature and the initial temperature is calculated to obtain the temperature difference value.

[0010] The temperature change rate is obtained by dividing the temperature difference by the target time.

[0011] Optionally, controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes:

[0012] The control deviation of the pulse solenoid valve is determined based on the real-time temperature and the target temperature.

[0013] The opening degree Z of the pulse solenoid valve is obtained by performing calculus and integration on the control deviation.

[0014] Optionally, controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes:

[0015] Based on the real-time temperature and the rate of temperature change, the first opening degree S1 of the electronic expansion valve is determined by looking up a table.

[0016] The opening S of the electronic expansion valve is determined based on the first opening S1 and the opening Z of the pulse solenoid valve.

[0017] Optionally, the opening degree of the electronic expansion valve

[0018] Optionally, controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes:

[0019] The operating frequency of the evaporator fan is determined by looking up a table based on the opening degree S of the electronic expansion valve and the rate of temperature change.

[0020] Secondly, embodiments of the present invention provide a temperature control device for a test chamber. The test chamber includes a control system, which includes a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The outlet of the compressor is connected to the inlet of the condenser, the outlet of the condenser is connected to the inlet of the evaporator, and the outlet of the evaporator is connected to the inlet of the compressor. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, the evaporator fan, the electronic expansion valve, and the pulse solenoid valve are all electrically connected to the controller.

[0021] The temperature control device includes:

[0022] The parameter acquisition module is used to acquire the real-time temperature, target temperature, and target time of the test chamber;

[0023] A rate determination module is used to determine the rate of temperature change of the test chamber based on the real-time temperature, the target temperature, and the target time.

[0024] The status control module is used to control the operating status of the electronic expansion valve, the pulse solenoid valve and the evaporator fan according to the real-time temperature, the target temperature and the temperature change rate.

[0025] Thirdly, embodiments of the present invention provide a temperature control system for a test chamber, comprising: a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve; the outlet of the compressor is connected to the inlet of the condenser, the outlet of the condenser is connected to the inlet of the evaporator, the outlet of the evaporator is connected to the inlet of the compressor, the electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator, the evaporator fan is located on one side of the evaporator, and the compressor, the evaporator fan, the electronic expansion valve and the pulse solenoid valve are all electrically connected to the controller, and the temperature control device as described in the second aspect is integrated into the controller.

[0026] Fourthly, embodiments of the present invention provide a test chamber, including the temperature control system described in the third aspect.

[0027] Optionally, a temperature sensor is installed inside the test chamber.

[0028] The present invention provides a temperature control method, device, system, and test chamber for a test chamber. The control system includes a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, evaporator fan, electronic expansion valve, and pulse solenoid valve are all electrically connected to the controller. The control method is executed by the controller and includes: acquiring the real-time temperature, target temperature, and target time of the test chamber; determining the temperature change rate of the test chamber based on the real-time temperature, target temperature, and target time; and controlling the working state of the electronic expansion valve, pulse solenoid valve, and evaporator fan based on the real-time temperature, target temperature, and temperature change rate to control the temperature of the test chamber. The temperature control method, device, system, and test chamber provided in this invention control method control of electronic expansion valve, pulse solenoid valve, and evaporator fan based on real-time temperature, target temperature, and temperature change rate. For example, based on real-time temperature and target temperature, the control deviation of pulse solenoid valve is determined, and the opening degree of pulse solenoid valve is obtained by performing calculus on the control deviation. Combined with the operating states of electronic expansion valve, pulse solenoid valve, and evaporator fan, the temperature of test chamber is controlled, such as controlling the cooling of test chamber. The opening degree of pulse solenoid valve can be obtained through calculus. Compared with the prior art of controlling the opening degree of throttle valve by time interval, the opening degree control is more reliable and solves the problems of poor temperature control stability and small cooling rate adaptation range caused by poor control reliability in the prior art. Attached Figure Description

[0029] Figure 1 This is a flowchart of a temperature control method for a test chamber provided in Embodiment 1 of the present invention;

[0030] Figure 2 This is a flowchart of a temperature control method for a test chamber provided in Embodiment 2 of the present invention;

[0031] Figure 3 This is a structural block diagram of a temperature control device for a test chamber line provided in Embodiment 3 of the present invention;

[0032] Figure 4 This is a structural block diagram of a temperature control system for a test chamber line provided in Embodiment 3 of the present invention. Detailed Implementation

[0033] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not all of the structures.

[0034] Example 1

[0035] Figure 1 This is a flowchart of a temperature control method for a test chamber according to Embodiment 1 of the present invention. This embodiment is applicable to temperature control of test chambers such as environmental test chambers. The test chamber includes a control system, which includes a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, evaporator fan, electronic expansion valve, and pulse solenoid valve are all electrically connected to the controller. This method can be executed by a temperature control device of the test chamber, which can be integrated into the controller of the temperature control system of the test chamber. The controller can be implemented in the form of software and / or hardware. The method specifically includes the following steps:

[0036] Step 110: Obtain the real-time temperature, target temperature, and target time of the test chamber.

[0037] The target temperature and target time of the test chamber can be input externally. The target time can be a preset time; for example, if the test chamber needs to be cooled, the target time is the preset target cooling time. The test chamber is equipped with a temperature sensor that monitors the temperature in real time. The controller is electrically connected to the temperature sensor to obtain the real-time temperature inside the test chamber.

[0038] Step 120: Determine the rate of temperature change of the environmental test chamber based on the real-time temperature, target temperature, and target time.

[0039] The rate of temperature change in the environmental test chamber is the value obtained by dividing the difference between the initial temperature (which can be the current temperature) and the target temperature by the target time.

[0040] Step 130: Based on the real-time temperature, target temperature, and rate of temperature change, control the operating status of the electronic expansion valve, pulse solenoid valve, and evaporator fan to control the temperature of the test chamber.

[0041] Specifically, based on the real-time and target temperatures, the control deviation of the pulse solenoid valve is determined. The control deviation is then calculated using calculus to obtain the opening degree of the pulse solenoid valve. Based on the real-time temperature and the rate of temperature change, the first opening degree of the electronic expansion valve is determined. Then, based on this first opening degree and the opening degree of the pulse solenoid valve, the final opening degree of the electronic expansion valve is determined. Finally, based on the real-time temperature and the rate of temperature change, the operating frequency of the evaporator fan is determined by referring to a table. By controlling the opening degrees of the electronic expansion valve, the pulse solenoid valve, and the operating frequency of the evaporator fan, temperature control of the test chamber, such as cooling control, is achieved.

[0042] It should be noted that the specific values ​​of the above target parameters can be determined according to actual control requirements, and are not limited here.

[0043] The temperature control method for the test chamber provided in this embodiment includes: acquiring the real-time temperature, target temperature, and target time of the test chamber; determining the temperature change rate of the test chamber based on the real-time temperature, target temperature, and target time; and controlling the working states of the electronic expansion valve, pulse solenoid valve, and evaporator fan based on the real-time temperature, target temperature, and temperature change rate to control the temperature of the test chamber. The temperature control method for the test chamber provided in this embodiment controls the working states of the electronic expansion valve, pulse solenoid valve, and evaporator fan based on the real-time temperature, target temperature, and temperature change rate. For example, based on the real-time temperature and target temperature, the control deviation of the pulse solenoid valve is determined, and calculus is performed on the control deviation to obtain the opening degree of the pulse solenoid valve. Combined with the working states of the electronic expansion valve, pulse solenoid valve, and evaporator fan, the temperature of the test chamber is controlled, such as controlling the cooling of the test chamber. The opening degree of the pulse solenoid valve can be obtained through calculus. Compared with the prior art of controlling the opening degree of the throttle valve through time intervals, the opening degree control is more reliable, solving the problems of poor temperature control stability and small cooling rate adaptability caused by poor control reliability in the prior art.

[0044] Example 2

[0045] Figure 2This is a flowchart of a temperature control method for a test chamber according to Embodiment 2 of the present invention. This embodiment is applicable to temperature control of test chambers such as environmental test chambers. The test chamber includes a control system, which includes a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, evaporator fan, electronic expansion valve, and pulse solenoid valve are all electrically connected to the controller. This method can be executed by a temperature control device of the test chamber, which can be integrated into the controller of the temperature control system of the test chamber. The controller can be implemented in the form of software and / or hardware. The method specifically includes the following steps:

[0046] Step 210: Obtain the real-time temperature, target temperature, and target time of the test chamber.

[0047] The target temperature and target time of the test chamber can be input externally. The target time can be a preset time; for example, if the test chamber needs to be cooled, the target time is the preset target cooling time. The test chamber is equipped with a temperature sensor that monitors the temperature in real time. The controller is electrically connected to the temperature sensor to obtain the real-time temperature inside the test chamber.

[0048] Step 220: Determine the initial temperature based on the real-time temperature, and calculate the difference between the target temperature and the initial temperature to obtain the temperature difference value.

[0049] The initial temperature can be the current temperature or a pre-set temperature.

[0050] Step 230: Divide the temperature difference by the target time and use the result as the rate of temperature change.

[0051] Specifically, the rate of temperature change V = (T0 - Tsv) / t, where Tsv is the target temperature, T0 is the initial temperature (which can be the current temperature), and t is the target time.

[0052] Step 240: Determine the control deviation e1(τ) of the pulse solenoid valve based on the real-time temperature and the target temperature.

[0053] in,

[0054] Step 250: Perform calculus and integration on the control deviation to obtain the opening degree Z of the pulse solenoid valve.

[0055] in, K1 is the proportional coefficient, I1 is the integral coefficient, and D1 is the differential coefficient. All of these are known quantities in the system.

[0056] Step 260: Determine the first opening degree S1 of the electronic expansion valve by looking up a table based on the real-time temperature and the rate of temperature change.

[0057] Specifically, the first opening degree of the electronic expansion valve is related to the temperature and temperature change rate inside the test chamber. For example, as the temperature inside the test chamber decreases, the first opening degree of the electronic expansion valve increases; as the temperature change rate increases, the first opening degree of the electronic expansion valve also increases. The first opening degree of the electronic expansion valve is determined based on a pre-established first database table. This first database table contains multiple first opening degrees of the electronic expansion valve corresponding to different temperatures and temperature change rates inside the test chamber, such as the cooling rate. The cooling rate and chamber temperature in Table 1 are all within their respective preset ranges. For example, the difference between two adjacent cooling rates is 0.1℃ / s, and the difference between two adjacent chamber temperatures is 0.5℃. For a real-time temperature of 20.4℃, the table is looked up based on the nearest 20.5℃; for a temperature change rate of 1.21℃ / s, the table is looked up based on the nearest 1.2℃ / s. By looking up these values, the real-time temperature and temperature change rate can be found in Table 1, along with the corresponding first opening degree S1 (S1 is between S11 and Sij).

[0058] Table 1

[0059] Internal temperature 1 The internal temperature of the chamber is 2 … Box internal temperature j Cooling rate 1 S11 S12 … S1j Cooling rate 2 S21 S22 … S2j … … … … … cooling rate i Si1 Si2 … Sij

[0060] Step 270: Determine the opening S of the electronic expansion valve based on the first opening S1 and the opening Z of the pulse solenoid valve.

[0061] Among them, the opening degree of the electronic expansion valve When the opening degree of the pulse solenoid valve increases, the opening degree of the electronic expansion valve also increases, and the opening degree of the electronic expansion valve increases as the opening degree of the pulse solenoid valve increases.

[0062] Step 280: Determine the operating frequency of the evaporator fan by referring to a table based on the opening degree of the electronic expansion valve and the rate of temperature change.

[0063] Specifically, the operating frequency of the evaporator fan is related to the temperature and temperature change rate inside the test chamber. For example, as the temperature inside the test chamber decreases, the operating frequency of the evaporator fan increases; as the temperature change rate increases, the operating frequency of the evaporator fan also increases. The operating frequency of the evaporator fan is determined based on a pre-established second database table, which contains multiple operating frequencies of the evaporator fan corresponding to different temperatures and temperature change rates inside the test chambers. The opening degree of the electronic expansion valve and the temperature inside the chamber in Table 2 are both within their respective preset ranges. For example, the difference in opening degree between two adjacent electronic expansion valves is 0.1 degrees, and the difference in temperature between two adjacent chambers is 0.5℃. For a real-time temperature of 19.8℃, the table is looked up based on the nearest 20℃; for an electronic expansion valve opening of 10.55 degrees, the table is looked up based on the nearest 10.5 or 10.6 degrees. By referring to these tables, the corresponding values ​​for the opening degree of the electronic expansion valve and the temperature change rate, as well as the operating frequency f of the evaporator fan (f is between f11 and f1j), can be found in Table 1.

[0064] Table 2

[0065] Internal temperature 1 The internal temperature of the chamber is 2 … Box internal temperature j Electronic expansion valve opening 1 f11 f12 … f1j Electronic expansion valve opening 2 f21 f22 … f2j … … … … … Electronic expansion valve opening i fi1 fi2 … fij

[0066] It should be noted that the values ​​of the preset ranges and target parameters mentioned above can be determined according to actual control requirements, and are not limited here.

[0067] The temperature control method for the test chamber provided in this embodiment determines the control deviation of the pulse solenoid valve based on the real-time temperature and the target temperature. It then performs calculus on the control deviation to obtain the opening degree of the pulse solenoid valve. Furthermore, it controls the temperature of the test chamber, such as by controlling the chamber's cooling, in conjunction with the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan. The opening degree of the pulse solenoid valve is obtained through calculus, which is more reliable than the existing technology that controls the throttle valve opening via time intervals. This solves the problems of poor temperature control stability and a small cooling rate adaptation range caused by poor control reliability in the existing technology.

[0068] Example 3

[0069] Figure 3 This is a structural block diagram of a temperature control device for a test chamber according to Embodiment 3 of the present invention. The test chamber includes a control system, which includes a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, evaporator fan, electronic expansion valve, and pulse solenoid valve are all electrically connected to the controller. (Reference) Figure 3The control device includes a parameter acquisition module 310, a rate determination module 320, and a state control module 330. The parameter acquisition module 310 acquires the real-time temperature, target temperature, and target time of the test chamber; the rate determination module 320 determines the temperature change rate of the test chamber based on the real-time temperature, target temperature, and target time; and the state control module 330 controls the operating status of the electronic expansion valve, pulse solenoid valve, and evaporator fan based on the real-time temperature, target temperature, and temperature change rate.

[0070] Based on the above implementation, the rate determination module 320 includes: a difference determination unit and a rate determination unit; wherein, the difference determination unit is used to determine the initial temperature according to the real-time temperature, and to obtain a temperature difference value by subtracting the target temperature from the initial temperature; the rate determination unit is used to divide the temperature difference value by the target time as the temperature change rate.

[0071] In one embodiment, the state control module 330 includes a deviation determination unit and an opening degree determination unit; wherein, the deviation determination unit is used to determine the control deviation of the pulse solenoid valve based on the real-time temperature and the target temperature; the opening degree determination unit is used to perform calculus and integration on the control deviation to obtain the opening degree Z of the pulse solenoid valve.

[0072] Optionally, the state control module 330 includes a first control unit and a second control unit; wherein, the first control unit is used to determine the first opening degree S1 of the electronic expansion valve by looking up a table based on the real-time temperature and the rate of temperature change; the second control unit is used to determine the opening degree S of the electronic expansion valve based on the first opening degree S1 and the opening degree Z of the pulse solenoid valve. The opening degree of the electronic expansion valve...

[0073] Optionally, the status control module 330 includes a fan frequency determination unit, which is used to determine the operating frequency of the evaporator fan by looking up a table based on the real-time temperature and the rate of temperature change.

[0074] Figure 4 This is a structural block diagram of a temperature control system for a test chamber provided in Embodiment 3 of the present invention. (Reference) Figure 4The temperature control system of the test chamber includes: a controller 10, a compressor 20, a condenser 30, an evaporator 40, an evaporator fan 50, an electronic expansion valve 60, and a pulse solenoid valve 70. The outlet of the compressor 20 is connected to the inlet of the condenser 30, the outlet of the condenser 30 is connected to the inlet of the evaporator 40, and the outlet of the evaporator 40 is connected to the inlet of the compressor 20. The electronic expansion valve 60 and the pulse solenoid valve 70 are both located in the pipeline connecting the condenser 30 and the evaporator 40. The evaporator fan 50 is located on one side of the evaporator 40. The compressor 20, the evaporator fan 50, the electronic expansion valve 60, and the pulse solenoid valve 70 are all electrically connected to the controller 10. The temperature control device as described in any embodiment of the present invention is integrated into the controller 10. The controller 10 is used to control the working status of the compressor 20, the evaporator fan 50, the electronic expansion valve 60, and the pulse solenoid valve 70. The specific control process can be referred to the above embodiments and will not be repeated here.

[0075] This invention provides a test chamber, including a temperature control system as described in any embodiment of the invention. Specifically, the temperature control system of the test chamber is used to adjust the temperature inside the test chamber, such as raising or lowering the temperature, to meet the actual temperature requirements of the test chamber.

[0076] refer to Figure 4 Optionally, a temperature sensor T is installed inside the test chamber. The temperature sensor T is electrically connected to the controller 10 in the temperature control system of the test chamber, so that the controller 10 can acquire the temperature collected by the temperature sensor T.

[0077] The temperature control device, system, and test chamber provided in this embodiment belong to the same inventive concept as the temperature control method of the test chamber provided in any embodiment of the present invention, and have corresponding beneficial effects. For technical details not covered in this embodiment, please refer to the temperature control method of the test chamber provided in any embodiment of the present invention.

[0078] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, combinations, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.

Claims

1. A temperature control method for a test chamber, characterized in that, The test chamber includes a control system, which comprises a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, the evaporator fan, the electronic expansion valve, and the pulse solenoid valve are all electrically connected to the controller. The control method is executed by the controller and includes: Obtain the real-time temperature, target temperature, and target time of the test chamber; The temperature change rate of the test chamber is determined based on the real-time temperature, the target temperature, and the target time. The operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan are controlled based on the real-time temperature, the target temperature, and the rate of temperature change, so as to control the temperature of the test chamber. The step of controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes: The control deviation of the pulse solenoid valve is determined based on the real-time temperature and the target temperature. The opening degree Z of the pulse solenoid valve is obtained by performing calculus and integration on the control deviation. The step of controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes: Based on the real-time temperature and the rate of temperature change, the first opening degree S1 of the electronic expansion valve is determined by looking up a table. The opening S of the electronic expansion valve is determined based on the first opening S1 and the opening Z of the pulse solenoid valve. The opening degree of the electronic expansion valve .

2. The temperature control method according to claim 1, characterized in that, Determining the temperature change rate of the test chamber based on the real-time temperature, the target temperature, and the target time includes: The initial temperature is determined based on the real-time temperature, and the difference between the target temperature and the initial temperature is calculated to obtain the temperature difference value. The temperature change rate is obtained by dividing the temperature difference by the target time.

3. The temperature control method according to claim 1, characterized in that, The step of controlling the operating states of the electronic expansion valve, the pulse solenoid valve, and the evaporator fan based on the real-time temperature, the target temperature, and the rate of temperature change includes: The operating frequency of the evaporator fan is determined by looking up a table based on the opening degree S of the electronic expansion valve and the rate of temperature change.

4. A temperature control device for a test chamber, characterized in that, The test chamber includes a control system, which comprises a controller, a compressor, a condenser, an evaporator, an evaporator fan, an electronic expansion valve, and a pulse solenoid valve. The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, and the evaporator outlet is connected to the compressor inlet. The electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator. The evaporator fan is located on one side of the evaporator. The compressor, the evaporator fan, the electronic expansion valve, and the pulse solenoid valve are all electrically connected to the controller. The temperature control device includes: The parameter acquisition module is used to acquire the real-time temperature, target temperature, and target time of the test chamber; A rate determination module is used to determine the rate of temperature change of the test chamber based on the real-time temperature, the target temperature, and the target time. The status control module is used to control the operating status of the electronic expansion valve, the pulse solenoid valve and the evaporator fan according to the real-time temperature, the target temperature and the temperature change rate; The status control module includes: A deviation determination unit is used to determine the control deviation of the pulse solenoid valve based on the real-time temperature and the target temperature. An opening determination unit is used to perform calculus and integration on the control deviation to obtain the opening Z of the pulse solenoid valve; The status control module includes: The first control unit is used to determine the first opening degree S1 of the electronic expansion valve by looking up a table based on the real-time temperature and the rate of temperature change. The second control unit is used to determine the opening degree S of the electronic expansion valve based on the first opening degree S1 and the opening degree Z of the pulse solenoid valve. The opening degree of the electronic expansion valve .

5. A temperature control system for a test chamber, characterized in that, include: Controller, compressor, condenser, evaporator, evaporator fan, electronic expansion valve and pulse solenoid valve; The compressor outlet is connected to the condenser inlet, the condenser outlet is connected to the evaporator inlet, the evaporator outlet is connected to the compressor inlet, the electronic expansion valve and the pulse solenoid valve are both located in the pipeline connecting the condenser and the evaporator, the evaporator fan is located on one side of the evaporator, and the compressor, the evaporator fan, the electronic expansion valve and the pulse solenoid valve are all electrically connected to the controller. The temperature control device as described in claim 4 is integrated into the controller.

6. A test chamber, characterized in that, Including the temperature control system as described in claim 5.

7. The test chamber according to claim 6, characterized in that, The test chamber is equipped with a temperature sensor.

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