Display module testing system and method

Abstract

The present application relates to a test system and method for a display module. The system includes: a test machine, electrically connected to a test board, including a transmission interface, the transmission interface is used to send test image data to the test board; the test board includes an image data processing module and N test bits, N is a positive integer; wherein the image data processing module is used to receive and copy the test image data to obtain N groups of target image data, the N groups of target image data correspond one-to-one to the N test bits; and the N groups of target image data are respectively sent to the corresponding test bits, so that the display module corresponding to the test bit displays the target image data, and the display module is subjected to a display test. The use of the present application can improve test efficiency and save costs.

Description

Technical Field

[0001] The present application relates to the technical field of module testing, and in particular to a testing system and method for a display module. Background Art

[0002] A display module is a display device unit that integrates display panels, related drive circuits, backlight sources, controllers, interfaces and other components. Its main function is to convert digital signals into visual images or text and present information to users in a graphical manner. In order to ensure the quality and performance of display modules, they need to be tested during the production process.

[0003] In the related art, a test machine is used to test display modules. Generally, one test machine can output 4 to 6 DP signals and drive 4 to 6 display modules for testing. However, when there are many display modules to be tested, the testing efficiency and test capacity are low according to this method. Summary of the invention

[0004] Based on this, it is necessary to provide a display module testing system and method that can improve testing efficiency in response to the above technical problems.

[0005] In a first aspect, the present application provides a testing system for a display module, the system comprising:

[0006] A test machine, electrically connected to the test board, comprising a transmission interface, wherein the transmission interface is used to send the test image data to the test board;

[0007] A test board, comprising an image data processing module and N test bits, where N is a positive integer;

[0008] Among them, the image data processing module is used to receive and copy the test image data to obtain N groups of target image data, and the N groups of target image data correspond one-to-one to the N test positions; and send the N groups of target image data to the corresponding test positions respectively, so that the display module corresponding to the test position displays the target image data, and performs a display test on the display module.

[0009] In one of the embodiments, the transmission interface is further used to send N groups of control data corresponding to the test image data to the test board;

[0010] The test board also includes a control data processing module, which is used to send the N groups of control data to the N test positions respectively, so that the display module corresponding to the test board displays the target image data according to the control data.

[0011] In one embodiment, the test machine is electrically connected to M test boards through a transmission interface, and the test machine further includes M data generation modules, the M data generation modules correspond to the M test boards one by one, and M is a positive integer;

[0012] The data generation module is used to receive image configuration data and initial image data that match the data generation module, and configure the initial image data according to the image configuration data to generate test image data and control data; and send the test image data and control data to a transmission interface that matches the data generation module.

[0013] In one embodiment, the data generation module includes a timing generation module and a transmission processing module; the receiving of image configuration data and initial image data matching the data generation module, and configuring the initial image data according to the image configuration data to generate test image data and control data includes:

[0014] The timing generation module acquires the image configuration data and the initial image data that match the data generation module, and generates an image timing according to the image configuration data; generates timing image data according to the image timing and the initial image data; and sends the timing image data to the transmission processing module;

[0015] The transmission processing module is used to receive the time-series image data and process the time-series image data according to a preset transmission protocol to generate test image data and control data.

[0016] In one of the embodiments, the test machine further includes a configuration module, the configuration module being configured to obtain image configuration data in response to receiving a configuration instruction;

[0017] The configuration module is also used to send the image configuration data to the corresponding data generation modules respectively.

[0018] In one of the embodiments, the configuration module is further used to obtain status data of the test bits on the M test boards, and obtain image configuration data from preset configuration data according to the status data.

[0019] In one embodiment, the configuration module is used to obtain image configuration data from preset configuration data according to the state data, including:

[0020] The configuration module is used to determine a target test mode according to the status data, and obtain image configuration data corresponding to the target test mode from preset configuration data, wherein the preset configuration data includes M groups of image configuration data, and the M groups of image configuration data correspond one-to-one to the M data generation modules.

[0021] In one embodiment, the data generation module is used to receive initial image data matching the data generation module, including:

[0022] The data generation module is used to determine a target storage area that matches the data generation module according to the image configuration data, and obtain corresponding initial image data from the target storage area.

[0023] In one embodiment, the test machine further includes a control module, and the control module is used to obtain M groups of initial image data in response to receiving a test instruction, and store the M groups of initial image data in corresponding storage areas respectively.

[0024] In one embodiment, the test machine further includes M communication modules, and the M communication modules correspond one-to-one to the M test boards;

[0025] The communication module is used to obtain status data of the display module and status data of the test bit on the corresponding test board.

[0026] In a second aspect, the present application further provides a method for testing a display module, the method being applied to an image data processing module of a test board, the test board being electrically connected to a test machine, the test board further comprising N test bits, N being a positive integer, the method comprising:

[0027] Receive and copy the test image data to obtain N groups of target image data, wherein the N groups of target image data correspond to the N test bits one by one, and the test image data is sent by the test machine through a transmission interface;

[0028] The N groups of target image data are respectively sent to corresponding test positions, so that the display module corresponding to the test position displays the target image data, and a display test is performed on the display module.

[0029] In the technical solution provided by the embodiment of the present disclosure, N test positions and an image data processing module capable of copying test image data are set on the test board. When testing the display module, the test machine sends the test image data to the test board, and the image data processing module on the test board receives and copies the test image data to obtain N groups of target image data, and sends the target image data to the corresponding test positions respectively, and performs display test on the display module on the test position. By setting N test positions, it is possible to perform display test on N display modules at the same time, and an image data processing module is set on the test board for data copying, so that one channel of data received from the test machine can be copied into N channels of data. More display modules can be tested without changing the hardware structure of the test machine, which improves the test efficiency and saves the test cost. The test capacity is effectively improved, and large-scale display module testing can be performed, which is suitable for more application scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0031] Figure 1 A schematic diagram of a test system for display modules in one embodiment;

[0032] Figure 2 A schematic diagram of a testing system for display modules in another embodiment;

[0033] Figure 3 A schematic diagram of a testing system for display modules in another embodiment;

[0034] Figure 4 A schematic diagram of a testing system for display modules in another embodiment;

[0035] Figure 5 A schematic diagram of the architecture of a test machine in one embodiment;

[0036] Figure 6 A schematic diagram of a flow chart of a method for testing a display module in one embodiment;

[0037] Figure 7 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0039] In one embodiment, Figure 1 As shown, a display module testing system 100 is provided, the system comprising:

[0040] The test machine 110 is electrically connected to the test board 120 and includes a transmission interface, wherein the transmission interface 111 is used to send the test image data to the test board;

[0041] The test board includes an image data processing module 121 and N test positions 122, where N is a positive integer;

[0042] Among them, the image data processing module is used to receive and copy the test image data to obtain N groups of target image data, and the N groups of target image data correspond one-to-one to the N test positions; and send the N groups of target image data to the corresponding test positions respectively, so that the display module corresponding to the test position displays the target image data, and performs a display test on the display module.

[0043] Exemplarily, the test machine includes an inspection device capable of performing display testing on a display module. The display module may include, but is not limited to, a liquid crystal module (LCD module), an organic light emitting diode module (OLED module), a light emitting diode module (LED module), etc., which may be determined based on actual application scenarios.

[0044] The transmission interface is used to electrically connect with the test board to realize data transmission between the test machine and the test board, and may include but is not limited to a physical display interface. In some possible implementations, the transmission interface of the test machine is electrically connected to the test board through a signal line, and the signal line can be determined according to the actual application scenario. For example, the signal line may include but is not limited to an image signal line (such as a DP line), a control signal line (such as a coaxial line), etc. In one example, a test board may correspond to multiple transmission interfaces, and multiple transmission interfaces are electrically connected to the test board through multiple signal lines. Different signal lines are used to transmit different data. For example, a test board corresponds to two transmission interfaces, and the two transmission interfaces are electrically connected to the test board through a DP line and a coaxial line respectively. The DP line is used to transmit high-frequency signals such as test image data, and the coaxial line is used to transmit low-frequency signals such as control data. Under normal circumstances, the transmission parameters of the DP line are fixed, that is, one DP line can transmit a set of test image data; the transmission parameters of the coaxial line can be configured and adjusted according to actual needs, that is, one coaxial line can transmit multiple sets of control data.

[0045] Optionally, the test image data may include, but is not limited to, DP image data.

[0046] The image data processing module may be a data processing module with an image duplication function, including but not limited to a splitter chip, an image signal converter chip, etc. Optionally, the image data processing module is configured to be able to duplicate data into N groups of data. After receiving the test image data, the image processing module performs duplication processing on the test image data to obtain N groups of target image data.

[0047] After obtaining N groups of target image data, the image data processing module sends the N groups of target image data to N test bits respectively, and one test bit corresponds to one group of target image data.

[0048] In one example, the image data processing module is electrically connected to the display modules on N test positions. One display module can be set on one test position. In one example, the number of display modules can be set according to actual needs. N test positions can perform display tests on N display modules at most at the same time.

[0049] In some possible implementations, after receiving the target image data, the display module at the test position displays the target image data, and the test result of the display module can be generated according to the state data of the display module displaying the target image data. In one example, the state data of the display module may include whether the display is normal, the display resolution, the display refresh rate, the display abnormal area information, etc., which can be determined according to the actual application scenario.

[0050] In the disclosed embodiment, N test positions and an image data processing module capable of copying test image data are set on a test board. When testing the display module, the test machine sends the test image data to the test board, and the image data processing module on the test board receives and copies the test image data to obtain N groups of target image data, and sends the target image data to corresponding test positions respectively, and performs display testing on the display module on the test positions. By setting N test positions, it is possible to perform display testing on N display modules at the same time, and an image data processing module is set on the test board to copy data, so that one channel of data received from the test machine can be copied into N channels of data. More display modules can be tested without changing the hardware structure of the test machine, which improves the test efficiency and saves the test cost. The test capacity is effectively improved, and large-scale display module testing can be performed, which is suitable for more application scenarios.

[0051] In one embodiment, the transmission interface is further used to send N groups of control data corresponding to the test image data to the test board;

[0052] The test board also includes a control data processing module, which is used to send the N groups of control data to the N test positions respectively, so that the display module corresponding to the test board displays the target image data according to the control data.

[0053] Exemplarily, the test board further includes a control data processing module for receiving and sending control data. In one example, one test bit corresponds to a group of control data, and the test machine sends N groups of control data to the control data processing module of the test board through the transmission interface, and the control data processing module sends the N groups of control data to N test bits respectively, and one test bit corresponds to a group of control data.

[0054] The control data can be used to control the display module to display the corresponding target image data according to the control data. In one example, the control data is usually a low-frequency signal. When the test machine generates N groups of control signals, the test machine occupies less resources. The test machine can send the signals to the test board via a coaxial cable. By setting the transmission parameters of the coaxial cable, the transmission of N groups of control data can be achieved.

[0055] Figure 2 is a schematic diagram of a display module testing system according to an exemplary embodiment. Figure 2 As shown, the test machine is electrically connected to the test board through an image signal line and a control signal line, the image signal line corresponds to the image data processing module, and the control signal line corresponds to the control data processing module. The image data processing module sends the target image data to the test bit, and the control data processing module sends the control data to the test bit. In one example, the test board also includes a power control module for controlling the power supply on the test board and the power-on timing of the test bit.

[0056] In the disclosed embodiment, the test board further comprises a control data processing module, through which display control can be performed when the display module displays target image data, thereby realizing a display test on the display module.

[0057] In one embodiment, the test machine is electrically connected to M test boards through a transmission interface, and the test machine further includes M data generation modules, the M data generation modules correspond to the M test boards one by one, and M is a positive integer;

[0058] The data generation module is used to receive image configuration data and initial image data that match the data generation module, and configure the initial image data according to the image configuration data to generate test image data and control data; and send the test image data and control data to a transmission interface that matches the data generation module.

[0059] Figure 3This is a schematic diagram of a display module testing system according to an exemplary embodiment. One testing machine may be electrically connected to M testing boards.

[0060] Exemplarily, a test machine can be electrically connected to M test boards, and correspondingly, the test machine includes M data generation modules, which correspond one to one with the M test boards. In one example, the setting of the M data generation modules can be implemented through FPGA coding without changing the hardware equipment of the test machine.

[0061] In some possible implementations, for each data generation module, the data generation module receives corresponding image configuration data and initial image data. In one example, different data generation modules may correspond to different image configuration data and initial image data. By setting the image configuration data and initial image data, different test boards may perform display tests according to different test modes, and display tests may be performed on display modules of different specifications and different test requirements at the same time.

[0062] Each data generation module configures the initial image data according to the received image configuration data, generates test image data and control data, and sends the test image data and control data to the transmission interface that matches the data generation module. In one example, the data generation module corresponds to the test board one by one, the test board is connected to the test machine through the transmission interface, and the transmission interface connecting the test board corresponding to the data generation module and the test machine is determined as the transmission interface that matches the data generation module.

[0063] Figure 4 is a schematic diagram of a display module testing system according to an exemplary embodiment. Figure 4 As shown, the test board A1 is connected to the test machine through the image signal line and the control signal line, the test board A1 corresponds to the data generation module A2, the image signal line is connected to the a1 transmission interface of the test machine, and the control signal line is connected to the a2 transmission interface of the test machine; the data generation module A2 generates test image data and control data according to the image configuration data and initial image data corresponding to A2, and sends the test image data to the a1 transmission interface and the control data to the a2 interface. Similarly, the data transmission process between other test boards (such as the test board B1) and the corresponding data generation modules (such as the data generation module B2) is similar to the above process.

[0064] In the disclosed embodiment, the test machine can be electrically connected to M test boards through a transmission interface, so that M×N display modules can be tested simultaneously, effectively improving the test efficiency; and the test machine also includes M data generation modules, the data generation modules correspond to the test boards one by one, the data generation modules generate corresponding test image data and control data according to the received image configuration data and initial image data, and send them to the corresponding transmission interface. Different data generation modules can be configured in different modes, realizing multi-mode testing, so that display modules with different specifications and different test requirements can be tested during testing, thereby improving the test efficiency and being suitable for more application scenarios.

[0065] In one embodiment, the data generation module includes a timing generation module and a transmission processing module; the receiving of image configuration data and initial image data matching the data generation module, and configuring the initial image data according to the image configuration data to generate test image data and control data includes:

[0066] The timing generation module acquires the image configuration data and the initial image data that match the data generation module, and generates an image timing according to the image configuration data; generates timing image data according to the image timing and the initial image data; and sends the timing image data to the transmission processing module;

[0067] The transmission processing module is used to receive the time-series image data and process the time-series image data according to a preset transmission protocol to generate test image data and control data.

[0068] Exemplarily, the data generation module includes a timing generation module and a transmission processing module, which respectively perform different data processing steps.

[0069] The timing generation module generates an image timing according to the image configuration data, generates timing image data according to the image timing and the initial image data, and sends the timing image data to the transmission processing module. In one example, the image timing may include an image video timing. After the timing generation module generates the image timing, the initial image data is loaded onto the image timing to obtain the timing image data. In one example, the timing generation module may include a Timing GEN module.

[0070] After receiving the time-series image data, the transmission processing module processes the time-series image data according to the preset transmission protocol to generate test image data and control data. In one example, the preset transmission protocol can be determined according to the actual application scenario. For example, the preset transmission protocol can be a DP protocol, and the transmission processing module can include a DP core module. In one example, the transmission processing module can load the image timing data onto the preset transmission protocol according to preset parameters to obtain test image data and control data. In one example, the test image data can include video and audio data streams transmitted by the main data channel, i.e., mainlink stream.

[0071] In the disclosed embodiment, the data generation module includes a timing generation module and a transmission processing module. The timing generation module generates timing image data, and the transmission processing module generates test image data and control data according to the timing image data, so as to obtain test image data and control data whose timing and image parameters meet the requirements, and can be transmitted according to a preset transmission protocol, thereby ensuring the reliability and stability of data transmission.

[0072] In one embodiment, the test machine further comprises a configuration module, the configuration module being configured to obtain image configuration data in response to receiving a configuration instruction;

[0073] The configuration module is also used to send the image configuration data to the corresponding data generation modules respectively.

[0074] Exemplarily, the test machine further includes a configuration module, which obtains image configuration data after receiving the configuration instruction and sends the data to the corresponding image generation modules respectively.

[0075] In one example, the configuration instruction may be sent by the user through interface operation, etc. The configuration module may receive multiple sets of different image configuration data corresponding to multiple data generation modules, and send the image configuration data to the corresponding data generation module according to the correspondence between the data and the module.

[0076] In a possible implementation, the configuration module is further configured to send the image configuration data to a control module of the testing machine.

[0077] Optionally, the image configuration data may include but is not limited to resolution, refresh rate, module configuration information, etc., which may be determined based on actual application scenarios.

[0078] In the disclosed embodiment, the test machine also includes a configuration module. After receiving the configuration instruction, the configuration module sends the image configuration data to the corresponding data generation modules respectively, thereby realizing grouped sending of the image configuration data, so that the data generation module can process the corresponding image configuration data, thereby realizing multi-mode testing, and can test display modules with different specifications and different display test requirements.

[0079] In one embodiment, the configuration module is further used to obtain status data of the test bits on the M test boards, and obtain image configuration data from preset configuration data according to the status data.

[0080] Exemplarily, when receiving the configuration instruction, the configuration module can obtain the required image configuration data from the preset configuration data according to the state data of the test bit. The state data of the test bit may include but is not limited to whether a display module is provided.

[0081] The preset configuration data may include image configuration data corresponding to M test boards respectively, the M test boards may correspond to the same or different image configuration data, and the M test boards may correspond to at most M groups of image configuration data. The test requirements may be determined according to the state data of the test bit, and the image configuration data corresponding to the test requirements may be determined from the preset configuration data based on the correspondence between the test bit, the test board, and the image configuration data.

[0082] In the disclosed embodiment, the configuration module can also obtain image configuration data from preset configuration data according to the test bit data, so that in a multi-mode test scenario, the actual test requirements can be determined according to the status data of the test bit, and the corresponding image configuration data can be obtained from the preset configuration data, thereby further improving the test capacity, avoiding the waste of resources caused by multi-mode configuration under test bit control, reducing the data processing volume, improving test efficiency and test flexibility, and being suitable for more application scenarios.

[0083] In one embodiment, the configuration module is used to obtain image configuration data from preset configuration data according to the state data, including:

[0084] The configuration module is used to determine a target test mode according to the status data, and obtain image configuration data corresponding to the target test mode from preset configuration data, wherein the preset configuration data includes M groups of image configuration data, and the M groups of image configuration data correspond one-to-one to the M data generation modules.

[0085] Exemplarily, the configuration module determines the target test mode according to the state data of the test bit. In one example, the configuration module can determine the test board corresponding to the test bit that needs to be tested according to the state information of the test bit, and determine the target test mode according to the test mode corresponding to the test board. For example, the configuration module can determine whether a test is required according to whether a display module is set on the test bit.

[0086] In one example, the preset configuration data may include M groups of image configuration data, corresponding one-to-one to the M data generation modules. In one example, one data generation module corresponds to one test board, one test board corresponds to one test mode, and the M groups of image configuration data correspond one-to-one to the M test modes.

[0087] In the disclosed embodiment, the configuration module determines the target test mode according to the status data, and obtains the image configuration data corresponding to the target test mode from the preset configuration data. It can determine the target test mode corresponding to the test bit that needs to be tested according to the status data of the test bit, and only obtains the image configuration data of the corresponding target test mode, so that the image configuration data can be accurately obtained according to the actual test requirements, avoiding waste of resources, effectively improving data processing efficiency, and further improving the display module testing efficiency.

[0088] In one embodiment, the data generation module is used to receive initial image data matching the data generation module, including:

[0089] The data generation module is used to determine a target storage area that matches the data generation module according to the image configuration data, and obtain corresponding initial image data from the target storage area.

[0090] Exemplarily, when acquiring the initial image data, the data generation module determines a target storage area that matches the data generation module according to the image configuration data, and acquires the corresponding initial image data from the target storage area.

[0091] In an example, different data generation modules may correspond to the same or different initial image data, which may be determined according to a test mode corresponding to the data generation module, and different test modes correspond to different initial image data.

[0092] Optionally, the image configuration data corresponds to the test mode, and the target storage area of ​​the initial image data corresponding to the data generation module can be determined according to the image configuration data. In one example, the target storage area can be mounted on the "Double Data Rate" memory interface of the FPGA.

[0093] In the disclosed embodiment, the data generation module determines the target storage area according to the image configuration data, and obtains the initial image data from the target storage area, so that the corresponding initial image data can be obtained according to the requirements of different test modes, thereby realizing multi-test mode testing, which is suitable for testing display modules with different specifications and different test requirements.

[0094] In one embodiment, the test machine further includes a control module, and the control module is used to obtain M groups of initial image data in response to receiving a test instruction, and store the M groups of initial image data in corresponding storage areas respectively.

[0095] Exemplarily, after receiving the test instruction, the control module of the test machine acquires the initial image data and stores it in the corresponding storage area. In one example, the test instruction can be sent by the user through interface operation or the like.

[0096] In one example, the test machine further includes an image source module, and the control module obtains initial image data from the image source after receiving the test instruction. Optionally, one group of initial image data corresponds to one image source module, and M groups of initial image data may correspond to M image source modules.

[0097] In the disclosed embodiment, the test machine also includes a control module. After receiving the test instruction, the control module stores M groups of initial image data in corresponding storage areas, so that the initial image data corresponding to different test modes can be stored separately. When performing image configuration, the image configuration data can be quickly and accurately obtained from the corresponding storage area for image configuration, thereby achieving multi-test mode testing while taking into account test efficiency, and being suitable for more application scenarios.

[0098] In one embodiment, the test machine further includes M communication modules, and the M communication modules correspond one-to-one to the M test boards;

[0099] The communication module is used to obtain status data of the display module and status data of the test bit on the corresponding test board.

[0100] Exemplarily, the test machine further includes M communication modules, which correspond to the M test boards one by one, and the communication modules can obtain the status data of the display module on the corresponding test board and the status data of the test bit. In one example, the communication module can obtain the status data of the test bit before the test starts and send it to the configuration module, so that the configuration module obtains the image configuration data according to the status data of the test bit.

[0101] Optionally, the communication module may obtain status data of the display module during the test and send the data to the control module, so that the control module generates a test result according to the status data of the display module.

[0102] In the disclosed embodiment, the test machine further includes M communication modules to realize communication with M test boards. The status data of the display module and the test bit can be obtained through the communication modules, thereby realizing the judgment of the status of the display module and the test bit.

[0103] Figure 5 is a schematic diagram of the architecture of a test machine according to an exemplary embodiment, referring to Figure 5 As shown, the test machine includes a configuration module, an image source module, a control module, a data storage module, a timing generation module, a transmission processing module, a communication module, and a transmission interface. Among them, the configuration module is used to issue image configuration data according to user operations, and configure the control module, the timing generation module, and the transmission processing module; the control module is used to move the initial image data of the image source module to the storage area of ​​the data storage module after receiving the test instruction. In one example, the storage area can be mounted on the DDR interface on the FPGA, and each image source module can store different image data; after the initial image data is stored in the data storage module by the image source module, it will be stored in different areas of the DDR according to different test modes, and then when the module display is started, the timing generation module will read the image at different addresses according to the different image configuration data. ; The timing generation module is responsible for generating the image Video timing required for the display module to display, and loading the image data read from the DDR into the timing, generating timing image data, namely Video data, and sending the Video data to the corresponding transmission processing module at the subsequent stage; after receiving the Video data sent by the previous stage, the transmission processing module will load the data into the preset transmission protocol according to the image configuration data, obtain the test image data and control data, and pass them into the transmission interface, which is connected to the test board through the image signal line and the control signal line; the communication module is responsible for communicating with the test board, issuing configuration information and reading the status information of the module.

[0104] Based on the same inventive concept, the embodiment of the present application also provides a method for testing a display module. The implementation scheme for solving the problem provided by the method is similar to the implementation scheme recorded in the above system, so the specific limitations of the one or more display module testing method embodiments provided below can refer to the limitations of the display module testing system above, and will not be repeated here.

[0105] In an exemplary embodiment, Figure 6 As shown, a method for testing a display module is provided, the method is applied to an image data processing module of a test board, the test board is electrically connected to a test machine, the test board further includes N test bits, N is a positive integer, the method includes:

[0106] Step S510, receiving and copying the test image data to obtain N groups of target image data, wherein the N groups of target image data correspond one-to-one to the N test bits, and the test image data is sent by the test machine through the transmission interface;

[0107] Step S520: sending the N groups of target image data to corresponding test positions respectively, so that the display module corresponding to the test position displays the target image data, and performing a display test on the display module.

[0108] In one of the embodiments, the transmission interface is further used to send N groups of control data corresponding to the test image data to the test board;

[0109] The test board also includes a control data processing module, which is used to send the N groups of control data to the N test positions respectively, so that the display module corresponding to the test board displays the target image data according to the control data.

[0110] In one embodiment, the test machine is electrically connected to M test boards through a transmission interface, and the test machine further includes M data generation modules, the M data generation modules correspond to the M test boards one by one, and M is a positive integer;

[0111] The data generation module is used to receive image configuration data and initial image data that match the data generation module, and configure the initial image data according to the image configuration data to generate test image data and control data; and send the test image data and control data to a transmission interface that matches the data generation module.

[0112] In one embodiment, the data generation module includes a timing generation module and a transmission processing module; the receiving of image configuration data and initial image data matching the data generation module, and configuring the initial image data according to the image configuration data to generate test image data and control data includes:

[0113] The timing generation module acquires the image configuration data and the initial image data that match the data generation module, and generates an image timing according to the image configuration data; generates timing image data according to the image timing and the initial image data; and sends the timing image data to the transmission processing module;

[0114] The transmission processing module is used to receive the time-series image data and process the time-series image data according to a preset transmission protocol to generate test image data and control data.

[0115] In one of the embodiments, the test machine further includes a configuration module, the configuration module being configured to obtain image configuration data in response to receiving a configuration instruction;

[0116] The configuration module is also used to send the image configuration data to the corresponding data generation modules respectively.

[0117] In one of the embodiments, the configuration module is further used to obtain status data of the test bits on the M test boards, and obtain image configuration data from preset configuration data according to the status data.

[0118] In one embodiment, the configuration module is used to obtain image configuration data from preset configuration data according to the state data, including:

[0119] The configuration module is used to determine a target test mode according to the status data, and obtain image configuration data corresponding to the target test mode from preset configuration data, wherein the preset configuration data includes M groups of image configuration data, and the M groups of image configuration data correspond one-to-one to the M data generation modules.

[0120] In one embodiment, the data generation module is used to receive initial image data matching the data generation module, including:

[0121] The data generation module is used to determine a target storage area that matches the data generation module according to the image configuration data, and obtain corresponding initial image data from the target storage area.

[0122] In one embodiment, the test machine further includes a control module, and the control module is used to obtain M groups of initial image data in response to receiving a test instruction, and store the M groups of initial image data in corresponding storage areas respectively.

[0123] In one embodiment, the test machine further includes M communication modules, and the M communication modules correspond one-to-one to the M test boards;

[0124] The communication module is used to obtain status data of the display module and status data of the test bit on the corresponding test board.

[0125] In one embodiment, the configuration module in the test machine is connected to the host computer or other MCU controller, and the device is connected with an AXI bus. The host computer sends configuration information, i.e., image configuration data, to the control module, image source module, timing generation module, and transmission processing module through the configuration module. M image sources, timing generation module, and transmission processing module need to send M configuration information, and M groups of configuration information can be the same or different, thereby realizing the test of multiple test modes. At the same time, the configuration module can directly communicate with the display module through the communication module, and the communication is one-to-one with the display module, that is, there are as many communication modules as there are display modules on the back-end test board, and they can be carried out simultaneously or separately, which ensures the status detection of each display module during the operation of the test machine.

[0126] After sending the configuration information, the configuration module will start the display test program according to the instructions of the host computer or other MCU controller, and in the multi-test mode, the configuration module will decide how many test modes to start according to the connection status of the display module. If the display module is not connected to the test board corresponding to a test mode, the test mode will not be started. After sending the start command, the control module will move the initial image data of the image source module to the DDR according to the start status of the test mode; the control module is connected to the external DDR through the data storage module, and performs address management according to the start status of the test mode. If M test modes are all started, M addresses are managed, and if only one test mode is started, only one address is managed. After the data transfer of the image source is completed, the configuration module will start the timing generation module and the transmission processing module at the same time, and then the timing generation module can actively request the corresponding data from the control module according to the configuration information, and then load the obtained initial image data to the Video Timing (i.e. image timing) generated by the module to obtain the timing image data, and then pass it to the transmission processing module. The transmission processing module generates a framing of the preset transmission protocol, and the framing is the image data. The timing image data is re-encoded through a preset signal protocol to obtain test image data and control data, and then arrives at the transmission interface. In one example, the transmission interface is an interface that converts data information into a physical signal, which can be directly connected to the image signal line and then connected to the test board behind.

[0127] The image signal line on the test board directly connects to the test image data, namely, the data lane signal. The data lane signal is copied through an image data processing module, such as a physical Splitter chip, and then input into the display module, so that the display modules on the entire test board can display the same data. At the same time, the control data processing module distributes the control data transmitted over the control signal line. Each display module is grouped into a group of control data, ensuring that all display modules can be independently controlled.

[0128] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0129] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Figure 7 As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. Among them, the processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store test image data and other data involved in the method described in this embodiment. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a test method for a display module is implemented.

[0130] Those skilled in the art will understand that Figure 7The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0131] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0132] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0133] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0134] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0135] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0136] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0137] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A display module testing system, characterized in that: The system comprises: A test machine, electrically connected to the test board, comprising a transmission interface, the transmission interface is used to send test image data to the test board through an image signal line; the transmission interface is also used to send N groups of control data corresponding to the test image data to the test board through a control signal line; wherein the test image data is a high-frequency signal, and the control data is a low-frequency signal; the image signal line includes a DP line, and the test image data includes DP image data; A test board, comprising an image data processing module and N test bits, where N is a positive integer; The image data processing module is used to receive and copy the test image data to obtain N groups of target image data, and the N groups of target image data correspond to the N test positions one by one; and send the N groups of target image data to the corresponding test positions respectively, so that the display module corresponding to the test position displays the target image data, and performs a display test on the display module; The test board also includes a control data processing module, which is used to send the N groups of control data to the N test positions respectively, so that the display module corresponding to the test board displays the target image data according to the control data.

2. The system according to claim 1, characterized in that The test machine is electrically connected to the M test boards through a transmission interface, and the test machine further includes M data generation modules, the M data generation modules correspond to the M test boards one by one, and M is a positive integer; The data generation module is used to receive image configuration data and initial image data that match the data generation module, and configure the initial image data according to the image configuration data to generate test image data and control data; and send the test image data and control data to a transmission interface that matches the data generation module.

3. The system according to claim 2, characterized in that The data generation module includes a timing generation module and a transmission processing module; the receiving of image configuration data and initial image data matching the data generation module, and configuring the initial image data according to the image configuration data to generate test image data and control data includes: The timing generation module acquires the image configuration data and the initial image data that match the data generation module, and generates an image timing according to the image configuration data; generates timing image data according to the image timing and the initial image data; and sends the timing image data to the transmission processing module; The transmission processing module is used to receive the time-series image data and process the time-series image data according to a preset transmission protocol to generate test image data and control data.

4. The system according to claim 2, characterized in that The test machine further comprises a configuration module, the configuration module being used to obtain image configuration data in response to receiving a configuration instruction; The configuration module is also used to send the image configuration data to the corresponding data generation modules respectively.

5. The system according to claim 4, characterized in that The configuration module is further used to obtain status data of the test bits on the M test boards, and obtain image configuration data from preset configuration data according to the status data.

6. The system according to claim 5, characterized in that The configuration module is used to obtain image configuration data from preset configuration data according to the state data, including: The configuration module is used to determine a target test mode according to the status data, and obtain image configuration data corresponding to the target test mode from preset configuration data, wherein the preset configuration data includes M groups of image configuration data, and the M groups of image configuration data correspond one-to-one to the M data generation modules.

7. The system according to claim 2, characterized in that The data generation module is used to receive initial image data matching the data generation module, including: The data generation module is used to determine a target storage area that matches the data generation module according to the image configuration data, and obtain corresponding initial image data from the target storage area.

8. The system according to claim 5, characterized in that The test machine further includes a control module, which is used for acquiring M groups of initial image data in response to receiving a test instruction, and storing the M groups of initial image data in corresponding storage areas respectively.

9. The system according to claim 2, characterized in that The test machine further includes M communication modules, and the M communication modules correspond one-to-one to the M test boards; The communication module is used to obtain status data of the display module and status data of the test bit on the corresponding test board.

10. A method for testing a display module, characterized in that: The method is applied to an image data processing module in a test system of a display module according to claim 1, and the method comprises: Receiving test image data through an image signal line and copying the test image data to obtain N groups of target image data, wherein the N groups of target image data correspond to the N test bits one by one, and the test image data is sent by the test machine through a transmission interface; wherein the test image data is a high-frequency signal, and the control data is a low-frequency signal; the image signal line includes a DP line, and the test image data includes DP image data; The N groups of target image data are respectively sent to corresponding test positions, so that the display module corresponding to the test position displays the target image data, and a display test is performed on the display module.

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