An online analysis system for alloy grade of titanium and titanium alloy returned chips

Abstract

The present invention discloses an online analysis system for alloy grades of returned chips of titanium and titanium alloys, belonging to the technical field of recycling returned chips of titanium and titanium alloys. The system controls the feeder through a material input unit to spread the chips on a conveyor belt, so as to facilitate the subsequent detection and analysis of the chips using laser induced breakdown spectroscopy technology; the detection of the chips is realized through a material detection unit, and a start signal is sent when the chips enter the test area of ​​the detection and analysis unit; it is ensured that the detection and analysis unit is started only when it is needed. Since the detection and analysis unit adopts laser induced breakdown spectroscopy technology, such a setting can also avoid damage to the conveyor belt caused by the excitation laser. The detection and analysis unit performs equal-interval sampling analysis on the chips, that is, by selecting a chip from each column of chips for spectral detection, and using the detection result of the chip as the detection result of all chips in the column, so as to improve the speed of chip analysis and further improve the efficiency of the online analysis system of titanium alloy grades.

Description

Technical Field

[0001] The invention belongs to the technical field of titanium and titanium alloy chip recovery and processing, and in particular relates to an online analysis system for alloy grades of titanium and titanium alloy returned chips. Background Art

[0002] At present, my country's titanium industry is in a period of vigorous development. However, due to the processing characteristics of titanium, a large amount of titanium and titanium alloy chips will be produced during the processing of titanium. Many of these chips can be recycled. If they are directly discarded, it will cause waste of resources and environmental pollution. Therefore, it is necessary to recycle and reuse titanium and titanium alloy chips. In order to improve the quality of chips during the recycling process, chips generally need to be sorted.

[0003] The patent document with announcement number CN102899495B discloses a recycling and processing production line for titanium and titanium alloy chip-shaped materials, which includes the following arranged in sequence: a crusher for crushing titanium chips, a screening machine for screening titanium chips, a semi-continuous titanium chip washing machine for cleaning titanium chips, a movable bottom titanium chip drying machine for drying the titanium chips after water washing, a hot air blowing titanium chip continuous drying machine for drying the titanium chips after drying, and a magnetic separator for sorting the titanium chips after drying. Specifically, titanium alloy chip-like chips are subjected to preliminary physical screening by a screening machine to remove larger chips, and then the discharged materials are sorted again by a magnetic separator to select magnetic chips for recycling. However, the magnetic separation process can only adsorb magnetic debris and cannot screen out titanium chips of different alloy types. The chips to be recycled are often mixed with titanium chips of multiple alloy grades. Titanium chips of a single alloy grade are high-quality titanium chips and their recycling value will be relatively high. The existing devices for sorting titanium chips are difficult to sort titanium chips according to alloy grades, resulting in poor economic benefits of recycling.

[0004] In summary, the existing titanium and titanium alloy chip recovery devices only sort the titanium chips through magnetic separators, which is difficult to meet the demand for recycling high-quality titanium chips. Summary of the invention

[0005] The technical problem to be solved by the present invention is to provide an online analysis system for the alloy grade of titanium and titanium alloy returned chips in view of the deficiencies in the above-mentioned prior art. The system has a novel and reasonable design, high analysis efficiency, accurate marked alloy grades, strong practicality, and is easy to promote and use.

[0006] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0007] An online analysis system for alloy grade of returned chips of titanium and titanium alloys, the system comprising a material input unit, a material monitoring unit and a detection and analysis unit; the material input unit is used to control a feeder to spread the chips onto a conveyor belt according to a system start command, so as to achieve a chip thickness on the conveyor belt that is less than or equal to a set thickness; the material monitoring unit is used to obtain an image of the chips on the conveyor belt and identify the chips on the conveyor belt, and send a start signal when it is detected that chips have entered an area to be tested; the detection and analysis unit is used to control the start of a laser detection device when the start signal is received, and to perform equal-interval sampling and classification analysis on the chips in the area to be tested using laser induced breakdown spectroscopy technology.

[0008] Furthermore, the process of the equally spaced sampling analysis of the detection and analysis unit is as follows: by controlling the laser emitter above the conveyor belt to emit an excitation laser to a certain chip in each column of chips according to set parameters, controlling the spectrometer to detect the spectral data of the chips, controlling the analyzer to analyze the composition of the chips according to the spectral data, and thereby determining the alloy grade of the chips, and marking all the chips in the column where the chip is located with the same alloy grade as the chip.

[0009] Furthermore, the setting parameters include the frequency and wavelength of the laser emitter. The setting process of the setting parameters is as follows: a database is constructed using plasma temperature and density, the frequency and wavelength of the laser emitter, the width of the column, and the transmission speed of the chips, an optimization model is established with the maximum plasma temperature and density as the goal, the optimization model is solved under constraint conditions, and the frequency and wavelength of the laser emitter corresponding to the solution result is used as the setting parameter;

[0010] The constraint condition is that the frequency of the laser transmitter needs to satisfy the following formula:

[0011]

[0012] Among them, f is the frequency of the laser transmitter, f∈[1Hz,20Hz], s is the width of the column, and v is the transmission speed of the chips.

[0013] Further, the laser emitter is located in the central area of ​​the conveyor to emit excitation laser to the chips in the middle of each column of chips.

[0014] Furthermore, the laser emitter reciprocates along the direction perpendicular to the transmission of the chips, and the period of the reciprocating motion is determined according to the frequency of the laser emitter, the spacing distance between adjacent chips in the same column, and the width of the conveyor belt, so as to achieve different positions of chips detected in adjacent columns; the calculation formula of the period of the reciprocating motion is as follows:

[0015]

[0016] Where, f is the frequency of the laser transmitter, m is the distance between adjacent chips in the same row, and l is the width of the conveyor belt.

[0017] Furthermore, it also includes a data output unit, which controls the sorting device to transfer the scraps to the corresponding transfer position according to the marked alloy grade.

[0018] Furthermore, the sorting device determines the start time of the sorting device according to the sampling time, the distance between the chip sampling position and the sorting position, and the transmission speed of the chips.

[0019] Furthermore, the sorting device adopts a lever structure.

[0020] Furthermore, the marked alloy grades include TC4 titanium alloy, TC1 titanium alloy, TA1 titanium alloy, TC11 titanium alloy, TA15 titanium alloy and other chips; the data output unit is used to send the corresponding chips to the first transmission position when the marked alloy grade is TC4 titanium alloy, to send the corresponding chips to the second transmission position when the marked alloy grade is TC1 titanium alloy, to send the corresponding chips to the third transmission position when the marked alloy grade is TA1 titanium alloy, to send the corresponding chips to the fourth transmission position when the marked alloy grade is TC11 titanium alloy, to send the corresponding chips to the fifth transmission position when the marked alloy grade is TA15 titanium alloy, and to send the corresponding chips to the sixth transmission position when the marked alloy grade is other chips.

[0021] Furthermore, the process of determining the column where the scraps are located is as follows: when the proportion of the horizontal projection area of ​​the unloaded material in a certain column is the largest, it is determined that the scraps are located in this column.

[0022] Furthermore, the chips laid on the conveyor belt by the feeder are chips after magnetic impurities are removed by the magnetic separation mechanism.

[0023] Compared with the prior art, the present invention has the following advantages:

[0024] The system controls the feeder through the material input unit to spread the chips on the conveyor belt, so that the chips can be detected and analyzed later using laser induced breakdown spectroscopy technology; the chips are detected through the material detection unit, and a start signal is issued when the chips enter the test area of ​​the detection and analysis unit; the detection and analysis unit is only started when it is needed. Since the detection and analysis unit uses laser induced breakdown spectroscopy technology, this setting can also avoid damage to the conveyor belt caused by the excitation laser. The detection and analysis unit performs equal-interval sampling analysis on the chips, that is, by selecting one chip from each column for spectral detection, and using the detection result of the chip as the detection result of all chips in the column, the speed of chip analysis is improved, and the efficiency of the online analysis system of titanium alloy grades is further improved.

[0025] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 This is a schematic structural diagram of Example 1 of an online analysis system for alloy grades of titanium and titanium alloy return chips of the present invention;

[0027] Figure 2 It is a structural schematic diagram of the detection and analysis unit of Example 1 of the online analysis system for alloy grade of titanium and titanium alloy returned chips of the present invention;

[0028] Figure 3 It is a structural schematic diagram of the reciprocating motion of the titanium and titanium alloy return chip alloy grade online analysis system embodiment 1 of the present invention;

[0029] Figure 4 This is a statistical diagram of the recognition accuracy of Example 1 of the online analysis system for alloy grades of titanium and titanium alloy return chips of the present invention;

[0030] Description of reference numerals:

[0031] 1. Laser transmitter; 2. Conveyor belt; 3. Industrial control cabinet; 4. Slide rail; 5. Mounting bracket. DETAILED DESCRIPTION

[0032] Titanium and titanium alloy return scrap alloy grade online analysis system Example 1:

[0033] like Figure 1 As shown, an online analysis system for alloy grades of titanium and titanium alloy returned chips includes a material input unit, a material monitoring unit, a detection and analysis unit and a data output unit.

[0034] Specifically, Figure 2 , Figure 3 As shown, the material input unit is used to control the feeder to spread the scraps onto the conveyor belt 2 according to the system startup command, so that the thickness of the scraps on the conveyor belt 2 is less than or equal to the set thickness; and the extreme difference of the scrap thickness is controlled to be less than 30mm to ensure the uniformity of the scraps. Generally, the size of the scraps is between 3mm and 15mm, and the set thickness is determined according to the size adaptability of the scraps.

[0035] The material monitoring unit is used to obtain the image of the scraps on the conveyor belt 2 and identify the scraps on the conveyor belt 2. When scraps are detected entering the area to be tested, a start signal is issued. By detecting whether there are scraps in the test area, the detection and analysis unit is controlled to start only when it is needed, which can save resources and avoid unnecessary expenses. At the same time, since the detection and analysis unit uses laser induced breakdown spectroscopy technology, if there are no scraps on the conveyor belt 2, the laser will hit the conveyor belt 2 and damage the conveyor belt 2. Therefore, this setting can also avoid damage to the conveyor belt 2 by the excitation laser and reduce the requirements for the material of the conveyor belt 2.

[0036] The detection and analysis unit is used to control the laser detection device to start when receiving the start signal, and use the laser induced breakdown spectroscopy technology to perform equal-interval sampling and classification analysis on the chips in the test area. In the actual equipment, an industrial control cabinet 3 is also included to place other components of the detection and analysis unit except the laser transmitter 1.

[0037] Specifically, the process of the equally spaced sampling analysis of the detection and analysis unit is as follows: by controlling the laser emitter 1 above the conveyor belt 2 to emit an excitation laser to a certain chip in each column of chips according to the set parameters, controlling the spectrometer to detect the spectrum data of the chips, controlling the analyzer to analyze the composition of the chips according to the spectrum data, and thereby determining the alloy grade of the chips, and marking the chips in the column where the chips are located as the same alloy grade as the chips. By detecting by column, the speed and quality of detection are improved, and the adjacent chips collected are basically consistent, so even if sampling detection is adopted, the accuracy of detection and classification will not be reduced.

[0038] In order to ensure the accuracy of spectral data obtained by using the excitation laser, the above-mentioned setting parameters include the frequency and wavelength of the laser emitter 1. The setting process of the setting parameters is as follows: construct a database using the plasma temperature and density, the frequency and wavelength of the laser emitter 1, the spacing of each column of chips, and the transmission speed of the chips, establish an optimization model with the maximum plasma temperature and density as the goal, solve the optimization model under the constraint conditions, and use the frequency and wavelength of the laser emitter 1 corresponding to the solution result as the setting parameters. Because the high temperature and density of the plasma represent good fluorescence effects of laser excitation, the corresponding spectral data is accurate and easy to obtain, and the results of the analysis based on the spectral data are more accurate. The width of the general column ranges from 20mm to 30mm.

[0039] The constraint condition is that the frequency of laser transmitter 1 needs to satisfy the following formula:

[0040]

[0041] Where f is the frequency of laser emitter 1, f∈[1Hz,20Hz], s is the width of the column, and v is the transmission speed of the chips. This constraint ensures that at least one chip in each column is excited by the laser.

[0042] In order to further improve the accuracy and ensure that the sample is representative, the laser emitter 1 reciprocates along the vertical direction of the chip transmission. The period of the reciprocating motion is determined according to the frequency of the laser emitter 1, the spacing distance between adjacent chips in the same column and the width of the conveyor belt 2, so as to achieve different positions of the chips detected in adjacent columns. The calculation formula of the reciprocating motion period is as follows:

[0043]

[0044] Among them, f is the frequency of the laser emitter 1, m is the spacing between adjacent chips in the same row, and l is the width of the conveyor belt 2. The period of the reciprocating motion calculated here is the optimal period to ensure the uniformity of the interval sampling. Specifically, the reciprocating motion is achieved by setting a slide rail 4 under the laser emitter 1, and also includes a mounting frame 5 for placing the laser emitter 1. The slide rail 4 is cooperatively provided on the laser emitter 1 and the mounting frame 5, so that the laser emitter 1 can slide relative to the mounting frame 5.

[0045] The process of determining the column where the scraps are located is as follows: when the proportion of the horizontal projection area of ​​the unloaded material in a certain column is the largest, it is determined that the scraps are located in this column.

[0046] The data output unit controls the sorting device to transfer the chips to the corresponding transfer position according to the marked alloy grade, so as to realize the sorting of the chips. The sorting device determines the start time of the sorting device according to the sampling time, the distance between the sampling position of the chips and the sorting position, and the transmission speed of the chips. That is, the sampling time + the distance between the sampling position of the chips and the sorting position / the transmission speed of the chips is equal to the start time of the sorting device. Preferably, the sorting device adopts a lever structure. The sorting device can also adopt a manipulator to place the chips in the corresponding position.

[0047] Among them, the marked alloy grades include TC4 titanium alloy, TC1 titanium alloy, TA1 titanium alloy, TC11 titanium alloy, TA15 titanium alloy and other chips; the data output unit is used to send the corresponding chips to the first transmission position when the marked alloy grade is TC4 titanium alloy, and to send the corresponding chips to the second transmission position when the marked alloy grade is TC1 titanium alloy, and to send the corresponding chips to the third transmission position when the marked alloy grade is TA1 titanium alloy, and to send the corresponding chips to the fourth transmission position when the marked alloy grade is TC11 titanium alloy, and to send the corresponding chips to the fifth transmission position when the marked alloy grade is TA15 titanium alloy, and to send the corresponding chips to the sixth transmission position when the marked alloy grade is other chips.

[0048] In order to reduce the difficulty of identification and reduce the impurities in the chips, the chips laid on the conveyor belt 2 by the feeder are the chips after the magnetic debris is removed by the magnetic separation mechanism. Removing the magnetic chips in advance reduces the volume of system identification and ensures the efficiency of titanium alloy classification.

[0049] like Figure 4 As shown, after actual testing, it was found that the online analysis system of this titanium alloy grade can identify TC4 titanium alloy, TC1 titanium alloy, TA1 titanium alloy, TC11 titanium alloy, and TA15 titanium alloy with an accuracy of 93.85%, 92.89%, 99.82%, 99.96%, and 92.33%, respectively.

[0050] Titanium and titanium alloy return chip alloy grade online analysis system embodiment 2:

[0051] The difference between this embodiment and the embodiment 1 of the online analysis system for alloy grades of titanium and titanium alloy returned chips is that the laser emitter 1 is located in the central area of ​​the transmission to emit an excitation laser to the chips in the middle of each column of chips. During the detection process, the laser emitter 1 is stationary, and only excites the chips in the middle of each column, and obtains the corresponding spectral data, and analyzes the alloy grade corresponding to the chips based on the spectral data. Compared with the method in embodiment 1 in which the laser emitter 1 reciprocates along the transmission direction perpendicular to the chips, the sampling in this embodiment is equivalent to an equidistant sampling, which can also ensure the sampling effect.

[0052] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any way. Any simple modification, change and equivalent structural change made to the above embodiment based on the technical essence of the present invention still falls within the protection scope of the technical solution of the present invention.

Claims

1. An online analysis system for alloy grade of titanium and titanium alloy return chips, characterized by: The system includes a material input unit, a material monitoring unit and a detection and analysis unit; The material input unit is used to control the feeder to spread the scraps onto the conveyor belt (2) according to the system start command, so as to achieve that the thickness of the scraps on the conveyor belt (2) is less than or equal to a set thickness; The material monitoring unit is used to obtain an image of the scraps on the conveyor belt (2), and to detect the scraps on the conveyor belt (2), and to send a start signal when it is detected that the scraps have entered the area to be tested; The detection and analysis unit is used to control the laser detection device to start when receiving the start signal, and use the laser induced breakdown spectroscopy technology to perform equal-interval sampling and classification analysis on the chips in the test area; The process of the equal-interval sampling analysis of the detection and analysis unit is as follows: by controlling the laser emitter (1) above the conveyor belt (2) to emit an excitation laser to a certain chip in each column of chips according to set parameters, controlling the spectrometer to detect the spectrum data of the chip, controlling the analyzer to analyze the composition of the chip according to the spectrum data, and thereby determining the alloy grade of the chip, and marking all the chips in the column where the chip is located with the same alloy grade as the chip; The setting parameters include the frequency and wavelength of the laser emitter (1), and the setting process of the setting parameters is as follows: constructing a database using plasma temperature and density, the frequency and wavelength of the laser emitter (1), the width of the column, and the transmission speed of the scraps, establishing an optimization model with the maximum plasma temperature and density as the goal, solving the optimization model under constraint conditions, and using the frequency and wavelength of the laser emitter (1) corresponding to the solution result as the setting parameters; The constraint condition is that the frequency of the laser transmitter (1) needs to satisfy the following formula: Where, f is the frequency of the laser transmitter (1), f∈[1Hz,20Hz], s is the width of the column, and v is the transmission speed of the chips; The laser emitter (1) performs reciprocating motion along a direction perpendicular to the transmission direction of the chips, and the period of the reciprocating motion is determined according to the frequency of the laser emitter (1), the spacing distance between adjacent chips in the same column, and the width of the conveyor belt (2), so as to achieve different positions of chips detected in adjacent columns; the calculation formula of the period of the reciprocating motion is as follows: Wherein, f is the frequency of the laser transmitter (1), m is the spacing between adjacent chips in the same row, and l is the width of the conveyor belt (2).

2. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 1 is characterized by: The laser emitter (1) is located in the central area of ​​the conveyor to emit excitation laser to the chips in the middle of each column of chips.

3. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 1 is characterized by: The invention also comprises a data output unit, which controls the sorting device to transfer the scraps to the corresponding transfer position according to the marked alloy grade.

4. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 3 is characterized by: The sorting device determines the start time of the sorting device according to the sampling time, the distance between the chip sampling position and the sorting position, and the transmission speed of the chip.

5. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 3 is characterized by: The sorting device adopts a lever structure.

6. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 3 is characterized by: The marked alloy grades include TC4 titanium alloy, TC1 titanium alloy, TA1 titanium alloy, TC11 titanium alloy, TA15 titanium alloy and other chips; the data output unit is used to send the corresponding chips to the first transmission position when the marked alloy grade is TC4 titanium alloy, to send the corresponding chips to the second transmission position when the marked alloy grade is TC1 titanium alloy, to send the corresponding chips to the third transmission position when the marked alloy grade is TA1 titanium alloy, to send the corresponding chips to the fourth transmission position when the marked alloy grade is TC11 titanium alloy, to send the corresponding chips to the fifth transmission position when the marked alloy grade is TA15 titanium alloy, and to send the corresponding chips to the sixth transmission position when the marked alloy grade is other chips.

7. The on-line analysis system for alloy grade of titanium and titanium alloy returned chips according to claim 1, characterized in that: The process of determining the column where the scraps are located is as follows: when the proportion of the horizontal projection area of ​​the unloaded material in a certain column area is the largest, it is determined that the scraps are located in this column.

8. The titanium and titanium alloy return chip alloy grade online analysis system according to claim 1, characterized in that: The scraps laid flat on the conveyor belt (2) by the feeder are scraps after magnetic impurities have been removed by a magnetic separation mechanism.

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