Testing device and method for multifunctional pin device
Through the design of multi-jet components and controllable circuit boards, the universality problem of existing pin device testing devices is solved, and flexible power supply and testing of different pin devices is achieved.
Patent Information
- Application Number
- CN202410907512.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-08
- Publication Date
- 2025-08-22
- Estimated Expiration
- 2044-07-08
AI Technical Summary
The test devices for existing pin devices are not universal, and are limited by fixed jacks and circuit board designs, resulting in the test system being unable to adapt to different types of pin devices.
Using multi-jack components and controllable circuit boards, multiple jacks and independent power supply channels are designed, and independent power supply to different pin devices is achieved through control programs, supporting the testing of multiple pin devices.
It realizes general testing of different types of pin devices, improves the flexibility and adaptability of the test device, and supports power-on testing of multiple pin devices.
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Figure CN118884309B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of semiconductor technology, and in particular to a testing device and method for a multifunctional pin device. Background Art
[0002] Existing testing of pin-type components typically involves inserting the component into a pre-designed test board, which is then installed on a test system for testing. The test board consists of a socket assembly and a circuit board. The number and placement of pins on the socket assembly are fixed, and the circuit board's circuit design is designed to accommodate only the specific type of component. This makes the test system incompatible with other systems. Summary of the Invention
[0003] The object of the present invention is to provide a testing device and method for a multifunctional pin device, which can at least solve some of the defects in the prior art.
[0004] To achieve the above-mentioned objectives, an embodiment of the present invention provides the following technical solution: a testing device for a multi-functional pin device, comprising a multi-jack assembly and a controllable circuit board, wherein the multi-jack assembly has a plurality of jacks for inserting the pins of the pin device, and the controllable circuit board is used to independently power each of the jacks.
[0005] Furthermore, the controllable circuit board has a plurality of circuit channels, each of the circuit channels corresponds to each of the sockets one by one, and each of the circuit channels supplies power to the corresponding socket.
[0006] Furthermore, the controllable circuit board has a power supply point that can be electrically connected to the pins. There are multiple power supply points and they correspond one-to-one to each of the pins. Each circuit channel is electrically connected to the corresponding power supply point.
[0007] Furthermore, the multi-jack assembly includes a plurality of fixed contacts corresponding to the jacks one by one, each of the fixed contacts is electrically connected to the corresponding jack, and each of the fixed contacts is electrically connected to the controllable circuit board.
[0008] Furthermore, the multi-jack assembly includes a plurality of spring contacts corresponding to each of the jacks, and the spring contacts are electrically connected to the controllable circuit board when pressed by the pins.
[0009] Furthermore, the jacks are arranged in a matrix.
[0010] Furthermore, the multi-jack assembly and the controllable circuit board are stacked.
[0011] Furthermore, adjacent jacks are isolated by an electrical isolation layer.
[0012] The embodiment of the present invention provides another technical solution: a method for testing a multifunctional pin device, using the above-mentioned testing device, comprising the following steps:
[0013] S1, inserting the pins of the pin device to be tested into the sockets of the multi-hole component,
[0014] S2, using the controllable circuit board to supply power to each of the sockets into which the pins are inserted, according to the sockets into which the pins are inserted;
[0015] S3, performing a power-on test on the pin device.
[0016] Furthermore, the controllable circuit board controls the power supply area through a control program to independently supply power to different sockets.
[0017] Compared with the prior art, the present invention has the beneficial effect of being able to independently power the socket according to the socket into which the pin device is inserted, so that no matter what type of pin device is, the present device can be used to realize power supply. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 A schematic top view of a multi-jack assembly of a testing device for a multi-function pin device provided by an embodiment of the present invention;
[0019] Figure 2 A schematic diagram of a top view of a controllable circuit board of a testing device for a multifunctional pin device provided by an embodiment of the present invention;
[0020] Figure 3 A schematic diagram of a top view of a pin device tested by a testing device for a multifunctional pin device provided by an embodiment of the present invention;
[0021] Figure 4 A schematic vertical cross-sectional view of a testing device for a multifunctional pin device provided by an embodiment of the present invention;
[0022] In the accompanying drawings: 1-multi-jack assembly; 2-controllable circuit board; 3-pin device; 4-jack; 5-circuit channel; 6-power supply point; 7-spring contact; 8-electrical isolation layer; 9-spring; 10-pin. DETAILED DESCRIPTION
[0023] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.
[0024] See also Figure 1 、 Figure 2 、 Figure 3 and Figure 4 , an embodiment of the present invention provides a testing device for a multifunctional pin device 3, comprising a multi-jack assembly 1 and a controllable circuit board 2, wherein the multi-jack assembly 1 has a plurality of jacks 4 for inserting the pins 10 of the pin device 3, and the controllable circuit board 2 is used to independently power each of the jacks 4. In this embodiment, the jack 4 can be powered separately according to the jack 4 into which the pin device 3 is inserted, so that no matter what type of pin device 3, the device can be used to power it. Specifically, when testing existing pin devices 3, most of them use a circuit board that is compatible with the device, that is, a type of pin device 3 can only be tested by a specific test device, which results in the test system being incompatible with universal use. This embodiment cleverly redesigns the multi-jack assembly 1 and the controllable circuit board 2, so that the test device is no longer limited to the testing of the same type of pin devices 3. Specifically, the multi-jack assembly 1 is designed with a plurality of jacks 4, for example, the existing pin device 3 is such as Figure 3 When there are four pins 10 as shown, the multi-jack assembly 1 can be designed with more than four jacks 4 and a larger format. In this way, the four pins 10 of the pin device 3 can be inserted into any four jacks 4 for testing as needed. When the number of pin devices 3 is greater or less, the multi-jack assembly 1 can be suitable. After the pin devices 3 are inserted into the multi-jack assembly 1, the required jacks 4 are independently powered by the controllable circuit board 2, thereby achieving testing of the pin devices 3. Preferably, the jacks 4 can be made of a deformable material, so that pin devices 3 of different shapes can also be inserted into the jacks 4 for power-on testing. Preferably, the jacks 4 are adjustable. When the spacing between each pin 10 of the pin device 3 is different, the position of the jacks 4 can be adjusted as needed to facilitate the insertion of the pins 10 into the jacks 4. Preferably, each jack 4 can adopt an independent modular structure, which can be moved a certain distance in the multi-jack assembly 1, thereby achieving adjustable position of the jacks 4. Preferably, when the controllable circuit board 2 independently powers each jack 4 , different currents or voltages can be loaded according to the definition of each pin, thereby realizing power-on testing of different types of pin devices 3 .
[0025] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4The controllable circuit board 2 has a plurality of circuit channels 5, each of which corresponds to each of the jacks 4, and each of which supplies power to the corresponding jack 4. In this embodiment, multiple circuit channels 5 can be designed to supply power to the jacks 4. The circuit channels 5 are strip-shaped, and any position of each circuit channel 5 can supply power to the jacks 4. The power supply method is that after the pin 10 is inserted into the jack 4, it contacts the circuit channel 5, thereby supplying power to the pin 10. In this way, when facing the embodiment in which the jack 4 is movable, the direction in which the circuit channel 5 extends can be consistent with the direction in which the jack 4 moves. Circuit channels 5 with different paths can be designed, so that the jack 4 has more options for moving directions.
[0026] To further optimize the above solution, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 , the controllable circuit board 2 has a power supply point 6 that can be electrically connected to the pin 10. There are multiple power supply points 6 and they correspond one to one to each of the pins 10. Each of the circuit channels 5 is electrically connected to the corresponding power supply point 6. In this embodiment, compared with the above-mentioned method in which the circuit channels 5 as a whole can supply power, the power supply point 6 that supplies power to the pins 10 can also be fixed. This method corresponds to a scenario in which the socket 4 does not need to be moved. When the pin 10 is inserted into the socket 4, it will contact the power supply point 6, and the power supply channel corresponding to the power supply point 6 can supply power to the power supply point 6. Of course, for this embodiment in which the power supply point 6 is fixed, a flexible wire can also be used to connect the socket 4 and the power supply point 6. In this way, the position of the socket 4 can be changed within the length range of the flexible wire.
[0027] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The multi-jack assembly 1 includes a plurality of fixed contacts corresponding to each of the jacks 4. Each fixed contact is electrically connected to the corresponding jack 4, and each fixed contact is electrically connected to the controllable circuit board 2. In this embodiment, the multi-jack assembly 1 is a first method of cooperating with the pins 10. Fixed contacts are used. The fixed contacts are electrically connected to the controllable circuit board 2, for example, to the power supply point 6 mentioned above. The jacks 4 are electrically connected to the fixed contacts. When the pins 10 are inserted into the jacks 4, the pins 10 are electrically connected to the jacks 4, and the controllable circuit board 2 controls the independent power supply, thereby powering the pins 10.
[0028] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The multi-jack assembly 1 includes a plurality of spring contacts 7 corresponding one-to-one with each of the jacks 4. When pressed by the pins 10, the spring contacts 7 are electrically connected to the controllable circuit board 2. In this embodiment, a second method of interfacing with the pins 10 is used in the multi-jack assembly 1. The spring contacts 7 have a spring 9 at their lower portion. When the pins 10 are inserted into the jacks 4, they compress the spring contacts 7. The downward pressure of the spring 9 of the spring contacts 7 pushes the connection block against the power supply point 6 of the controllable circuit board 2, achieving electrical connection.
[0029] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 , the jacks 4 are arranged in a matrix. In this embodiment, the multi-jack assembly 1 can be a square structure, and the jacks 4 can be designed in a matrix, so that a larger number of jacks 4 can be obtained. Of course, in addition to this, it is also feasible to design the multi-jack assembly 1 into a circular, triangular, or other shape. As long as a large number of jacks 4 can be designed, power-on testing suitable for different pin devices 3 can be achieved.
[0030] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The multi-jack assembly 1 and the controllable circuit board 2 are stacked. In this embodiment, the multi-jack assembly 1 and the controllable circuit board 2 are stacked, which can reduce the volume of the device on the one hand and facilitate the electrical connection between the multi-jack assembly 1 and the controllable circuit board 2 on the other hand.
[0031] As an optimization solution of the embodiment of the present invention, please refer to Figure 1 、 Figure 2 、 Figure 3 and Figure 4 Adjacent jacks 4 are isolated by an electrical isolation layer 8. In this embodiment, by designing the electrical isolation layer 8, each jack 4 can be separated independently and loaded with different test conditions.
[0032] See also Figure 1 、 Figure 2 、 Figure 3 and Figure 4 The embodiment of the present invention provides a method for testing a multifunctional pin device 3, using the above-mentioned testing device, including the following steps:
[0033] S1, insert the pin 10 of the pin device 3 to be tested into the jack 4 of the multi-jack assembly 1; S2, according to the jack 4 into which the pin 10 is inserted, use the controllable circuit board 2 to supply power to each of the jacks 4 into which the pin 10 is inserted; S3, perform a power-on test on the pin device 3. In this embodiment, the above-mentioned test device is used in the test of the pin device 3, and the test of different types of pin devices 3 can be achieved. This embodiment cleverly redesigns the multi-jack assembly 1 and the controllable circuit board 2, so that the test device is no longer limited to the test of the same type of pin devices 3. Specifically, the multi-jack assembly 1 is designed with multiple jacks 4, for example, the existing pin device 3 such as Figure 3 While there are four pins 10 shown, the multi-jack assembly 1 can be designed with more than four jacks 4 and a larger format. This allows the four pins 10 of the pin device 3 to be inserted into any four jacks 4 for testing as needed. This multi-jack assembly 1 is suitable for both larger and smaller pin devices 3. After the pin devices 3 are inserted into the multi-jack assembly 1, the controllable circuit board 2 independently powers the desired jacks 4, enabling testing of the pin devices 3.
[0034] As an optimization solution of the embodiment of the present invention, the controllable circuit board 2 controls the power supply area through the control program to independently power different sockets 4. In this embodiment, the control program can control which areas are powered and under what conditions, thereby achieving independent power supply for each socket 4.
[0035] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.
Claims
1. A test device for a multifunctional pin device, characterized in that: It includes a multi-jack component and a controllable circuit board. The multi-jack component has multiple jacks for inserting pins of a pin device. The controllable circuit board is used to independently power each of the jacks. The controllable circuit board has several circuit channels, each of the circuit channels corresponds to each of the jacks one-to-one, and each of the circuit channels supplies power to the corresponding jack. The controllable circuit board has power supply points that can be electrically connected to the pins. There are multiple power supply points and they correspond to each of the pins one-to-one. Each of the circuit channels is electrically connected to the corresponding power supply point. The jacks are jacks with adjustable positions. When the spacing between each pin of the pin device is different, the position of the jack is adjusted as needed so that the pins can be inserted into the jacks.
2. The testing device for a multifunctional pin device according to claim 1, wherein: The multi-jack assembly includes a plurality of fixed contacts corresponding to the jacks one by one, each fixed contact is electrically connected to the corresponding jack, and each fixed contact is electrically connected to the controllable circuit board.
3. The testing device for a multifunctional pin device according to claim 1, wherein: The multi-jack assembly includes a plurality of spring contacts corresponding to the jacks one by one, and the spring contacts are electrically connected to the controllable circuit board when pressed by the pins.
4. The testing device for a multifunctional pin device according to claim 1, wherein: The jacks are arranged in a matrix.
5. The testing device for a multifunctional pin device according to claim 1, wherein: The multi-jack assembly and the controllable circuit board are stacked.
6. The testing device for a multifunctional pin device according to claim 1, wherein: Adjacent jacks are isolated by an electrical isolation layer.
7. A method for testing a multifunctional pin device, characterized in that: The test device according to any one of claims 1 to 6 comprises the following steps: S1, inserting the pins of the pin device to be tested into the sockets of the multi-hole component, S2, using the controllable circuit board to supply power to each of the sockets into which the pins are inserted, according to the sockets into which the pins are inserted; S3, performing a power-on test on the pin device.
8. The method for testing a multifunctional pin device according to claim 7, wherein: The controllable circuit board controls the power supply area through a control program to independently supply power to different sockets.
Citation Information
Patent Citations
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