A method, system and electronic device for accurately measuring the size of an object

Abstract

The present invention provides a method, system and electronic device for accurately measuring the size of an object, which relates to the field of metrology of irregular contour surfaces, including: periodically deflecting a caliper and / or a part to be measured along a preset axis to obtain a waveform diagram of the size data of the part to be measured; determining all extreme points on the target waveform curve; finding symmetrical extreme points from the extreme points according to the distribution of each extreme point; combining the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points to obtain a target extreme point for characterizing the size of the part to be measured, and using the size data corresponding to the target extreme point as the size of the part to be measured. The present invention solves the problem in the prior art that when the positional relationship between the measuring device and the object to be measured changes, especially when the object to be measured is flipped over a small range, the measurement accuracy becomes relatively poor.

Description

Technical Field

[0001] The present invention relates to the field of measurement of irregular surface profiles, and in particular to a method, system and electronic equipment for accurately measuring the size of an object. Background Art

[0002] The diameter gauge is an instrument that uses light to measure the diameter of a workpiece or material. It is now widely used in industrial production. Diameter gauges are widely used in various industries such as wires and cables, enameled wires, metal wires, PVC pipes, and medical devices. Both online and offline detection are possible, and automatic feedback control and online communication with computers can be achieved.

[0003] Existing calipers generally use bidirectional caliper measurements to collect the width and thickness of the flat wire through light source projection; however, in the above collection method, once the positional relationship between the caliper and the flat wire changes, such as when the flat wire flips slightly under the influence of external force, the projection length of the caliper will also change, thereby causing errors in its measurement results.

[0004] That is, the existing flat line precision measurement technology can only measure accurately when the object being measured is relatively still. When the positional relationship between the two changes, especially when the object being measured flips over a small range, its measurement accuracy will become relatively poor. Summary of the invention

[0005] In view of the deficiencies in the prior art, the present invention provides a method, system and electronic device for accurately measuring the size of an object, which solves the problem that the flat wire precision measurement technology in the prior art can only measure accurately when the object to be measured is relatively still, and when the positional relationship between the two changes, especially when the object to be measured is flipped in a small range, its measurement accuracy will become relatively poor.

[0006] The present invention provides a method for accurately measuring the size of an object, comprising:

[0007] The caliper and / or the part to be measured are periodically deflected along a preset axis to continuously change the relative position of the caliper and the part to be measured, and a waveform diagram of the size data of the part to be measured is obtained by projecting the light source of the caliper;

[0008] Obtain a target waveform curve of a deflection cycle from the waveform diagram, and determine all extreme value points on the target waveform curve;

[0009] According to the distribution of each extreme point, a symmetrical extreme point is found from each extreme point, wherein the symmetrical extreme point is characterized by the dimension data obtained when the caliper and / or the part to be measured is at an inflection point during the deflection process;

[0010] By combining the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points, a target extreme point for characterizing the size of the part to be measured is obtained, and the size data corresponding to the target extreme point is used as the size of the part to be measured.

[0011] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0012] By periodically acquiring data within a larger deflection range, and then processing the data waveform, multiple extreme points are found, and then the target extreme point corresponding to the size of the part to be measured is determined. The data measured by this method is constantly deflecting and fluctuating. Even when the flat line flips slightly, it will only show a slight jitter on the acquired target waveform curve. At the same time, the above-mentioned deflection process will also adaptively collect the surface of the part to be measured where the light source projection is facing the above-mentioned flat line after the jitter, and a new target extreme point will appear. By finding the target extreme point, a more accurate result can be obtained.

[0013] Compared with the prior art, the present invention can find the true measurement value of the flat wire when the flat wire rolls at a certain angle, making the measurement result more accurate.

[0014] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, finding a symmetrical extreme point from the extreme points according to the distribution of the extreme points includes:

[0015] Selecting one extreme point from all the extreme points in turn as the to-be-determined symmetric extreme point, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of all other extreme points in distribution relative to the to-be-determined symmetric extreme point, until the symmetry difference value corresponding to each extreme point is determined;

[0016] The undetermined symmetry extreme value point corresponding to the smallest of the symmetry difference values ​​is used as the symmetry extreme value point.

[0017] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0018] By selecting an extreme point in turn and then calculating the symmetry difference value of other extreme points on the left and right sides of the extreme point, the turning point in the deflection process can be quickly found, which facilitates the subsequent search for the target extreme point.

[0019] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of all other extreme points relative to the to-be-determined symmetric extreme point in distribution, including:

[0020] Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the size data corresponding to all other extreme value points in distribution relative to the to-be-determined symmetric extreme value point.

[0021] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0022] Since the deflection process is periodic, the present invention searches for symmetric extreme points through the symmetry of the dimension data.

[0023] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of all other extreme points relative to the to-be-determined symmetric extreme point in distribution, including:

[0024] Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the size data corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the observed difference value;

[0025] Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the time corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the time difference value;

[0026] The undetermined symmetric extreme value point corresponding to the smallest of the symmetry difference values ​​is used as the symmetric extreme value point, comprising:

[0027] The undetermined symmetric extreme value point corresponding to the smallest observation difference value and the smallest time difference value is taken as the symmetric extreme value point.

[0028] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0029] Since the deflection process is periodic, the present invention searches for symmetric extreme points through the symmetry between the size data and time.

[0030] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points are combined to obtain a target extreme point for characterizing the size of the part to be measured, and the size data corresponding to the target extreme point is used as the size of the part to be measured, including the following steps:

[0031] S1. If the number of extreme value points is four, and the peaks or troughs corresponding to each extreme value point in the target waveform curve are arranged alternately, then proceed to step S7; otherwise, proceed to step S2;

[0032] S2. If the number of extreme value points is greater than four, proceed to step S3; otherwise, proceed to step S6;

[0033] S3, sorting the extreme value points in chronological order, if the polarities of two consecutive extreme value points are the same, deleting one of the extreme value points, and if the number of the remaining extreme value points is four or five, proceeding to step S7, otherwise proceeding to step S4;

[0034] S4, if the polarity of the symmetrical extreme point is the minimum value, proceed to step S5;

[0035] S5, taking the data corresponding to the extreme point located to the left of the symmetrical extreme point, the closest distance and the minimum polarity as the first initial data, taking the data corresponding to the extreme point located to the right of the symmetrical extreme point, the closest distance and the minimum polarity as the second initial data, and taking the average of the first initial data and the second initial data as the size of the part to be measured;

[0036] S6. If the number of the extreme value points is three, and the peaks or troughs corresponding to each of the extreme value points in the target waveform curve are arranged alternately, proceed to step S7;

[0037] S7. Use the data corresponding to the extreme point located to the left of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the first initial data, use the data corresponding to the extreme point located to the right of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the second initial data, and use the average of the first initial data and the second initial data as the size of the part to be measured.

[0038] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0039] After adopting the above steps, after determining the symmetrical extreme points, the first initial data and the second initial data corresponding to the two extreme points that can correspond to the size of the part to be measured can be quickly found according to the polarity of the symmetrical extreme points, the number and distribution of each extreme point, and the accurate size of the part to be measured can be obtained by calculating the average value of the first initial data and the second initial data.

[0040] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, determining all extreme points on the target waveform curve includes:

[0041] Determine the change trend value of all dimensional data in the target waveform curve, wherein the change trend value is represented by the difference between the current dimensional data and the dimensional data at the next moment, and take the multiple dimensional data corresponding to when the change trend value is zero as the extreme value points in the target waveform curve.

[0042] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0043] By judging the changing trend value, the extreme points of the waveform can be accurately found.

[0044] In one embodiment of a method for accurately measuring the size of an object provided by the present invention, in addition to obtaining a waveform graph of the size data of the part to be measured by projecting the light source of the caliper, the method also includes: performing Kalman filtering on the obtained waveform graph to obtain a target waveform graph.

[0045] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0046] By performing Kalman filtering on the waveform, the burrs and oscillations in the waveform can be removed, thereby increasing the accuracy of subsequent searches for extreme points.

[0047] The present invention also provides a system for accurately measuring the size of an object, comprising: a diameter measuring unit and a data processing unit, wherein:

[0048] The caliper unit includes a caliper, and the caliper unit is configured to periodically deflect the caliper and / or the part to be measured along a preset axis to continuously change the relative position of the caliper and the part to be measured, and to obtain a waveform diagram of the size data of the part to be measured by projecting a light source of the caliper;

[0049] The data processing unit includes a receiving module, an extreme point judgment module, a symmetric extreme point judgment module and an output module, wherein:

[0050] The receiving module is used to receive the waveform in real time;

[0051] The extreme value point judgment module is used to determine all extreme value points on a target waveform curve of a deflection cycle obtained from the waveform diagram;

[0052] The symmetrical extreme value point judgment module is used to find a symmetrical extreme value point from each extreme value point according to the distribution of each extreme value point, wherein the symmetrical extreme value point is characterized by the size data obtained when the deflection process is at an inflection point;

[0053] The output module is used to combine the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points to obtain a target extreme point used to characterize the size of the part to be measured, and use the size data corresponding to the target extreme point as the size of the part to be measured.

[0054] In a system for accurately measuring the size of an object provided by the present invention, the diameter measuring unit further includes a measuring part and a deflection part, wherein:

[0055] The caliper is mounted on the measuring part, and the deflection part is slidably connected to the measuring part;

[0056] The deflection portion is configured to drive the measuring portion to periodically deflect along the preset axis.

[0057] The technical solution disclosed in the present invention has at least the following beneficial effects:

[0058] The deflection part can be used to drive the measuring part to deflect periodically, thereby driving the diameter measuring instrument to deflect together with it, thereby realizing the collection of dimensional data of multiple angles of the object to be measured.

[0059] The present invention also provides an electronic device, comprising a memory, a processor, and a program stored in the memory and running on the processor, wherein the processor implements the steps of the method for accurately measuring the size of an object as described above when executing the program. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] Figure 1 It is a flow chart of a method for accurately measuring the size of an object according to the present invention;

[0061] Figure 2 It is a schematic diagram of the coordination relationship between the deflection part, the measuring part, the caliper and the flat wire of the present invention;

[0062] Figure 3 A schematic diagram of the process for determining the target extreme point;

[0063] Figure 4 A waveform graph for a flat line;

[0064] Figure 5 Another type of squiggle graph with flat lines;

[0065] Figure 6 This is the target waveform curve after the flat line is slightly flipped.

[0066] Figure 7 The figure is a flow chart of a system for accurately measuring the size of an object according to the present invention.

[0067] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0068] 1. Measuring unit, 2. Diameter gauge, 3. Flat wire, 4. Deflection unit. DETAILED DESCRIPTION

[0069] The principles and features of the present invention are described below. The examples given are only used to explain the present invention and are not used to limit the scope of the present invention.

[0070] Furthermore, those skilled in the art may combine and associate different embodiments or examples and features of different embodiments or examples described in this specification without mutual contradiction.

[0071] The present invention provides a method for accurately measuring the size of an object, please refer to Figure 1As shown, including:

[0072] The caliper 2 and / or the part to be measured are periodically deflected along a preset axis to continuously change the relative position of the caliper 2 and the part to be measured, and a waveform diagram of the size data of the part to be measured is obtained by projecting the light source of the caliper 2;

[0073] Obtain a target waveform curve of a deflection cycle from the waveform diagram, and determine all extreme value points on the target waveform curve;

[0074] According to the distribution of each of the extreme points, a symmetrical extreme point is found from each of the extreme points, wherein the symmetrical extreme point is characterized by the dimension data obtained when the caliper 2 and / or the part to be measured is at an inflection point during the deflection process;

[0075] By combining the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points, a target extreme point for characterizing the size of the part to be measured is obtained, and the size data corresponding to the target extreme point is used as the size of the part to be measured.

[0076] It should be understood that the caliper 2 and / or the part to be measured is periodically deflected along the preset axis. Figure 2 The caliper 2 and the part to be measured (the part to be measured is schematically illustrated by taking the width of the flat wire 3 as an example in this embodiment), the preset axis is the extension axis of the flat wire 3, and is also the length direction of the flat wire 3. The amplitude of the periodic deflection is ±10° in this embodiment, and the periodic deflection can be achieved by the caliper 2 being stationary and the flat wire 3 rotating, or the caliper 2 deflecting along the extension axis of the flat wire 3 and the flat wire 3 being stationary, or the caliper 2 and the flat wire 3 deflecting along the extension axis of the flat wire 3 together. This embodiment is not limited. For ease of understanding, the following description will be taken as an example of the caliper 2 deflecting along the extension axis of the flat wire 3 and the flat wire 3 being stationary;

[0077] By periodically acquiring data within a larger deflection range, and then processing the data waveform, multiple extreme points are found, and then the target extreme point corresponding to the size of the part to be measured is determined. Since the data measured by this method is constantly deflecting and fluctuating, even when the flat wire 3 is slightly flipped, it will only be reflected in the collected target waveform curve as a slight jitter. At the same time, the above-mentioned deflection process will also adaptively collect the surface of the size of the part to be measured where the light source projection is facing the above-mentioned flat wire 3 after the jitter, and a new target extreme point will appear. By finding the target extreme point, a more accurate result can be obtained;

[0078] Compared with the prior art, the present invention can find the true measurement value of the flat wire 3 when the flat wire 3 rolls at a certain angle, so that the measurement result is more accurate.

[0079] Specifically, according to the distribution of the extreme value points, finding the symmetric extreme value point from the extreme value points includes:

[0080] Selecting one extreme point from all the extreme points in turn as the to-be-determined symmetric extreme point, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of all other extreme points in distribution relative to the to-be-determined symmetric extreme point, until the symmetry difference value corresponding to each extreme point is determined;

[0081] The undetermined symmetry extreme value point corresponding to the smallest of the symmetry difference values ​​is used as the symmetry extreme value point.

[0082] The calculation of the symmetry difference values ​​of the distribution of all other extreme value points relative to the symmetric extreme value point to be determined may be to calculate the symmetry difference values ​​of the distribution of the size data corresponding to all other extreme value points relative to the symmetric extreme value point to be determined, and then find the symmetric extreme value point according to the symmetry difference value on the size data, and the calculation process of the symmetry difference value includes: subtracting the size data corresponding to the first extreme value point on the left side of the symmetric difference value to be determined from the size data corresponding to the first extreme value point on the right side of the symmetric difference value to be determined, subtracting the size data corresponding to the second extreme value point on the left side of the symmetric difference value to be determined from the size data corresponding to the second extreme value point on the right side of the symmetric difference value to be determined, and so on, until the size data corresponding to all extreme value points on the left side are subtracted from the size data corresponding to all extreme value points on the right side, if there is a single extreme value point on the left or right side that cannot be paired, then the extreme value point is discarded and does not participate in the calculation, and the sum of the absolute values ​​of all differences is used as the symmetric difference value;

[0083] Alternatively, the symmetry difference value of the time corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution is calculated, and then the symmetric extreme value point is found according to the symmetry difference value of the time; the calculation process of the symmetry difference value includes: subtracting the time corresponding to the first extreme value point on the left side of the to-be-determined symmetric difference value from the time corresponding to the first extreme value point on the right side of the to-be-determined symmetric difference value, subtracting the time corresponding to the second extreme value point on the left side of the to-be-determined symmetric difference value from the time corresponding to the second extreme value point on the right side of the to-be-determined symmetric difference value, and so on, until the time corresponding to all extreme value points on the left side is subtracted from the time corresponding to all extreme value points on the right side, if there is a single extreme value point on the left or right side that cannot be paired, then the extreme value point is discarded and does not participate in the calculation, and the sum of the absolute values ​​of all differences is used as the symmetric difference value;

[0084] Alternatively, taking the to-be-determined symmetric extreme value point as the center, calculating the symmetry difference values ​​of the size data corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the observed difference value;

[0085] Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the time corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the time difference value;

[0086] The undetermined symmetric extreme value point corresponding to the smallest observation difference value and the smallest time difference value is taken as the symmetric extreme value point.

[0087] Specifically, combining the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points, a target extreme point for characterizing the size of the part to be measured is obtained, and the size data corresponding to the target extreme point is used as the size of the part to be measured, including the following steps:

[0088] S1. If the number of extreme value points is four, and the peaks or troughs corresponding to each extreme value point in the target waveform curve are arranged alternately, then proceed to step S7; otherwise, proceed to step S2;

[0089] S2. If the number of extreme value points is greater than four, proceed to step S3; otherwise, proceed to step S6;

[0090] S3, sorting the extreme value points in chronological order, if the polarities of two consecutive extreme value points are the same, deleting one of the extreme value points, and if the number of the remaining extreme value points is four or five, proceeding to step S7, otherwise proceeding to step S4;

[0091] S4, if the polarity of the symmetrical extreme point is the minimum value, proceed to step S5;

[0092] S5, taking the data corresponding to the extreme point located to the left of the symmetrical extreme point, the closest distance and the minimum polarity as the first initial data, taking the data corresponding to the extreme point located to the right of the symmetrical extreme point, the closest distance and the minimum polarity as the second initial data, and taking the average of the first initial data and the second initial data as the size of the part to be measured;

[0093] S6. If the number of the extreme value points is three, and the peaks or troughs corresponding to each of the extreme value points in the target waveform curve are arranged alternately, proceed to step S7;

[0094] S7. Use the data corresponding to the extreme point located to the left of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the first initial data, use the data corresponding to the extreme point located to the right of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the second initial data, and use the average of the first initial data and the second initial data as the size of the part to be measured.

[0095] Please refer to here Figure 3 As shown, the above steps are:

[0096] First, determine whether the number of extreme value points is four, and the peaks or troughs corresponding to each extreme value point in the target waveform curve are arranged alternately, then determine the polarity of the symmetrical extreme value point, and then use the extreme value point located to the left of the symmetrical extreme value point, the closest extreme value point and the opposite polarity as one of the target extreme value points, and the data corresponding to it as the first initial data, and use the extreme value point located to the right of the symmetrical extreme value point, the closest extreme value point and the opposite polarity as another target extreme value point, and the data corresponding to it as the second initial data, and use the average value of the first initial data and the second initial data as the size of the part to be measured;

[0097] If the number of extreme value points is not four, or the peaks or troughs corresponding to each extreme value point in the target waveform curve are not arranged alternately, determining whether the number of extreme value points is greater than four;

[0098] If the condition of whether the number of extreme value points is greater than four is met, the extreme value points are sorted in chronological order, and if the polarity of two consecutive extreme value points is the same, one of the extreme value points is deleted, and then it is determined whether the number of remaining extreme value points is four or five;

[0099] If the number of remaining extreme value points is four or five, the polarity of the symmetrical extreme value points is determined, and then the extreme value point located to the left of the symmetrical extreme value point, closest to the extreme value point and with opposite polarity is used as one of the target extreme value points, and the data corresponding to it is used as the first initial data, and the extreme value point located to the right of the symmetrical extreme value point, closest to the extreme value point and with opposite polarity is used as another target extreme value point, and the data corresponding to it is used as the second initial data, and the average value of the first initial data and the second initial data is used as the size of the part to be measured;

[0100] If the number of remaining extreme value points is not four or five, determine whether the polarity of the symmetrical extreme value point is a minimum value. If the polarity of the symmetrical extreme value point is a minimum value, take the extreme value point located to the left of the symmetrical extreme value point, the closest distance and the polarity of the minimum value as one of the target extreme value points, and the data corresponding to it as the first initial data, take the extreme value point located to the right of the symmetrical extreme value point, the closest distance and the polarity of the minimum value as another target extreme value point, and the data corresponding to it as the second initial data, and take the average value of the first initial data and the second initial data as the size of the part to be measured;

[0101] If the polarity of the symmetrical extreme point is not satisfied as the minimum value, the system may report an error indicating that the correct extreme point has not been found, because the number of extreme points that appear is relatively fixed when the deflection amplitude is small.

[0102] If the condition that the number of extreme value points is greater than four is not satisfied, then determine whether the number of extreme value points is three, and the peaks or troughs corresponding to each extreme value point in the target waveform curve are arranged alternately. If it is not satisfied, since the number of extreme value points that appear is relatively fixed when the deflection amplitude is small, the system may report an error and think that the correct extreme value point has not been found; if it is satisfied, then determine the polarity of the symmetrical extreme value point, and then use the extreme value point located to the left of the symmetrical extreme value point, the closest distance and the opposite polarity as one of the target extreme value points, and the corresponding data as the first initial data, and use the extreme value point located to the right of the symmetrical extreme value point, the closest distance and the opposite polarity as another target extreme value point, and the corresponding data as the second initial data, and use the average value of the first initial data and the second initial data as the size of the part to be measured;

[0103] After adopting the above steps, after determining the symmetrical extreme points, the first initial data and the second initial data corresponding to the two extreme points that can correspond to the size of the part to be measured can be quickly found according to the polarity of the symmetrical extreme points, the number and distribution of each extreme point, and the accurate size of the part to be measured can be obtained by calculating the average value of the first initial data and the second initial data.

[0104] Specifically, all extreme value points on the target waveform curve are determined, including:

[0105] Determine the change trend value of all dimensional data in the target waveform curve, where the change trend value is represented by the difference between the current dimensional data and the dimensional data at the next moment. Take multiple dimensional data corresponding to when the change trend value is zero, and satisfy that the data within a preset time range around the dimensional data corresponding to the change trend value of zero presents a change trend from increasing to decreasing, or from decreasing to increasing. If the above conditions are met, the extreme point corresponding to when the change trend value is zero can be used as the extreme point in the target waveform curve.

[0106] By judging the changing trend value, the extreme points of the waveform can be accurately found.

[0107] Specifically, the method further includes: performing Kalman filtering on the acquired waveform graph to obtain a target waveform graph, while obtaining the waveform graph by projecting the light source of the caliper 2 .

[0108] By performing Kalman filtering on the waveform, the burrs and oscillations in the waveform can be removed, and the accuracy of subsequent extreme point search can be increased. The filtered target waveform is referenced Figure 4 and Figure 5 shown.

[0109] In summary, the specific implementation process of the present invention is:

[0110] Input of the original waveform; Kalman filter; calculation of the trend value; record the extreme point information; find all the extreme points in a cycle; calculate the symmetry of the size data corresponding to each extreme point about the pending symmetric extreme point and sort them; calculate the symmetry of the time corresponding to each extreme point about the pending symmetric extreme point and sort them; find the symmetric extreme point based on the sorting result; determine the polarity of the symmetric extreme point in a cycle and the distribution and number of the remaining extreme points; output the result.

[0111] The input of the original waveform graph includes periodically deflecting the caliper 2 and / or the part to be measured along a preset axis to continuously change the relative position of the caliper 2 and the part to be measured, and obtaining a waveform graph of the size data of the part to be measured by projecting the light source of the caliper 2;

[0112] The Kalman filter includes automatically adjusting the Kalman filter parameters according to the waveform, so as to automatically adjust the filter strength and obtain the target waveform;

[0113] The calculation of the change trend value includes obtaining a target waveform curve within a period in the target waveform graph, determining the change trend value of all the dimension data in the target waveform curve, wherein the change trend value is characterized by the difference between the current dimension data and the dimension data at the next moment, recording the number of change trend values ​​greater than 0 or less than 0, judging the increasing and decreasing trends, and finding an extreme point near the change trend value equal to 0;

[0114] The recording of extreme point information includes recording the size data corresponding to the extreme point and the time of the corresponding cycle;

[0115] The finding of all extreme points within a period includes repeatedly using the above method to find all extreme points that meet the conditions within a period;

[0116] Calculating the symmetry of the size data corresponding to each extreme point with respect to the to-be-determined symmetric extreme point and sorting them, including selecting one extreme point from all the extreme points in turn as the to-be-determined symmetric extreme point, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of the size data corresponding to all other extreme points with respect to the to-be-determined symmetric extreme point in distribution, until the symmetry difference value corresponding to each extreme point is determined;

[0117] Calculating the symmetry of the time corresponding to each extreme point with respect to the to-be-determined symmetric extreme point and sorting them, including selecting one extreme point from all the extreme points in turn as the to-be-determined symmetric extreme point, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of the time corresponding to all other extreme points with respect to the to-be-determined symmetric extreme point in distribution, until the symmetry difference value corresponding to each extreme point is determined;

[0118] The finding of the symmetric extreme point according to the sorting result includes taking the undetermined symmetric extreme point corresponding to the smallest observation difference value and the smallest time difference value as the symmetric extreme point.

[0119] Determine the polarity of the symmetrical extreme points within a period and the distribution and number of the remaining extreme points, including according to Figure 3 The flow chart shown can accurately obtain the dimensional data of the part to be measured.

[0120] In the present invention, the calculation of the target waveform curve is performed during real-time acquisition, so there is no need to store the entire cycle waveform before calculation, which can improve real-time performance and calculation efficiency.

[0121] This method can automatically adapt to the conditions of different flat wires 3, and does not require the operator to manually adjust parameters when changing wires.

[0122] This method can also automatically adapt to the situation where the flat wire 3 itself has a certain rotation angle, such as Figure 6 As shown, it is the waveform corresponding to the measured value after the flat wire 3 rotates a certain angle: the present invention can still find the true measured value of the flat wire 3 when the object under test has a small range of flipping, making the measurement result more accurate. And this technology automatically outputs the measurement result, without manually adjusting the angle and selecting the maximum or minimum output value. It is very suitable for the situation where the crimping guide wheel cannot be installed to prevent the flat wire 3 from swinging during the actual production of the flat wire 3.

[0123] The present invention also provides a system for accurately measuring the size of an object, please refer to Figure 7 As shown, it includes: a diameter measuring unit and a data processing unit, wherein:

[0124] The caliper unit comprises a caliper 2, and the caliper unit is configured to periodically deflect the caliper 2 and / or the part to be measured along a preset axis to continuously change the relative position of the caliper 2 and the part to be measured, and to obtain a waveform diagram of the size data of the part to be measured by projecting the light source of the caliper 2;

[0125] The data processing unit includes a receiving module, an extreme point judgment module, a symmetric extreme point judgment module and an output module, wherein:

[0126] The receiving module is used to receive the waveform in real time;

[0127] The extreme value point judgment module is used to determine all extreme value points on a target waveform curve of a deflection cycle obtained from the waveform diagram;

[0128] The symmetrical extreme value point judgment module is used to find a symmetrical extreme value point from each extreme value point according to the distribution of each extreme value point, wherein the symmetrical extreme value point is characterized by the size data obtained when the deflection process is at an inflection point;

[0129] The output module is used to combine the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points to obtain a target extreme point used to characterize the size of the part to be measured, and use the size data corresponding to the target extreme point as the size of the part to be measured.

[0130] Specifically, please refer to Figure 2 As shown, the diameter measuring unit further includes a measuring part 1 and a deflecting part 4, wherein:

[0131] The caliper 2 is mounted on the measuring part 1, and the deflection part 4 is slidably connected to the measuring part 1;

[0132] The deflection unit 4 is configured to drive the measuring unit 1 to periodically deflect along the preset axis.

[0133] The deflection unit 4 can be used to drive the measuring unit 1 to deflect periodically, thereby driving the diameter measuring instrument 2 to deflect together with it, thereby realizing the collection of dimensional data of multiple angles of the object to be measured.

[0134] The present invention also provides an electronic device, comprising a memory, a processor, and a program stored in the memory and running on the processor, wherein the processor implements the steps of the method for accurately measuring the size of an object as described above when executing the program.

[0135] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A method for accurately measuring the size of an object, characterized in that: include: The caliper (2) and / or the part to be measured are periodically deflected along a preset axis to continuously change the relative position of the caliper (2) and the part to be measured, and a waveform diagram of the size data of the part to be measured is obtained by projection of the light source of the caliper (2); Obtain a target waveform curve of a deflection cycle from the waveform diagram, and determine all extreme value points on the target waveform curve; According to the distribution of each of the extreme value points, a symmetrical extreme value point is found from each of the extreme value points, wherein the symmetrical extreme value point is characterized by the dimension data obtained when the caliper (2) and / or the part to be measured is at an inflection point during the deflection process; Combining the polarity of the symmetrical extreme point with the number and distribution of the remaining extreme points, a target extreme point for characterizing the size of the part to be measured is obtained, and the size data corresponding to the target extreme point is used as the size of the part to be measured; According to the distribution of the extreme value points, finding a symmetric extreme value point from the extreme value points includes: Selecting one extreme point from all the extreme points in turn as the to-be-determined symmetric extreme point, taking the to-be-determined symmetric extreme point as the center, calculating the symmetry difference values ​​of all other extreme points in distribution relative to the to-be-determined symmetric extreme point, until the symmetry difference value corresponding to each extreme point is determined; The undetermined symmetric extreme value point corresponding to the smallest of the symmetry difference values ​​is used as the symmetric extreme value point; Combining the polarity of the symmetrical extreme point with the number and distribution of the remaining extreme points, a target extreme point for characterizing the size of the part to be measured is obtained, and the size data corresponding to the target extreme point is used as the size of the part to be measured, including the following steps: S1. If the number of extreme value points is four, and the peaks or troughs corresponding to each extreme value point in the target waveform curve are arranged alternately, then proceed to step S7; otherwise, proceed to step S2; S2. If the number of extreme value points is greater than four, proceed to step S3; otherwise, proceed to step S6; S3, sorting the extreme value points in chronological order, if the polarities of two consecutive extreme value points are the same, deleting one of the extreme value points, and if the number of the remaining extreme value points is four or five, proceeding to step S7, otherwise proceeding to step S4; S4, if the polarity of the symmetrical extreme point is the minimum value, proceed to step S5; S5, taking the data corresponding to the extreme point located to the left of the symmetrical extreme point, the closest distance and the minimum polarity as the first initial data, taking the data corresponding to the extreme point located to the right of the symmetrical extreme point, the closest distance and the minimum polarity as the second initial data, and taking the average of the first initial data and the second initial data as the size of the part to be measured; S6. If the number of the extreme value points is three, and the peaks or troughs corresponding to each of the extreme value points in the target waveform curve are arranged alternately, proceed to step S7; S7. Use the data corresponding to the extreme point located to the left of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the first initial data, use the data corresponding to the extreme point located to the right of the symmetrical extreme point, which is closest to the extreme point with opposite polarity, as the second initial data, and use the average of the first initial data and the second initial data as the size of the part to be measured.

2. A method for accurately measuring the size of an object according to claim 1, characterized in that: Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution, including: Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the size data corresponding to all other extreme value points in distribution relative to the to-be-determined symmetric extreme value point.

3. A method for accurately measuring the size of an object according to claim 1, characterized in that: Taking the undetermined symmetric extreme value point as the center, calculate the symmetry difference values ​​of all other extreme value points relative to the undetermined symmetric extreme value point in distribution, including: Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the size data corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the observed difference value; Taking the to-be-determined symmetric extreme value point as the center, calculate the symmetry difference values ​​of the time corresponding to all other extreme value points relative to the to-be-determined symmetric extreme value point in distribution as the time difference value; The undetermined symmetric extreme value point corresponding to the smallest of the symmetry difference values ​​is used as the symmetric extreme value point, comprising: The undetermined symmetric extreme value point corresponding to the smallest observation difference value and the smallest time difference value is taken as the symmetric extreme value point.

4. The method for accurately measuring the size of an object according to claim 1, characterized in that: Determine all extreme points on the target waveform curve, including: Determine the change trend value of all dimensional data in the target waveform curve, wherein the change trend value is represented by the difference between the current dimensional data and the dimensional data at the next moment, and take the multiple dimensional data corresponding to when the change trend value is zero as the extreme value points in the target waveform curve.

5. The method for accurately measuring the size of an object according to claim 1, characterized in that: The method further comprises: performing Kalman filtering on the acquired waveform graph to obtain a target waveform graph by using the light source projection of the caliper (2) to obtain the dimensional data of the part to be measured.

6. A system for accurately measuring the size of an object, characterized in that: A method for accurately measuring the size of an object as claimed in any one of claims 1 to 5, comprising: a diameter measuring unit and a data processing unit, wherein: The caliper unit comprises a caliper (2), and the caliper unit is configured to periodically deflect the caliper (2) and / or the part to be measured along a preset axis to continuously change the relative position of the caliper (2) and the part to be measured, and to obtain a waveform diagram of the size data of the part to be measured by projecting a light source of the caliper (2); The data processing unit includes a receiving module, an extreme point judgment module, a symmetric extreme point judgment module and an output module, wherein: The receiving module is used to receive the waveform in real time; The extreme value point judgment module is used to determine all extreme value points on a target waveform curve of a deflection cycle obtained from the waveform diagram; The symmetrical extreme value point judgment module is used to find a symmetrical extreme value point from each extreme value point according to the distribution of each extreme value point, wherein the symmetrical extreme value point is characterized by the size data obtained when the deflection process is at an inflection point; The output module is used to combine the polarity of the symmetrical extreme point and the number and distribution of the remaining extreme points to obtain a target extreme point used to characterize the size of the part to be measured, and use the size data corresponding to the target extreme point as the size of the part to be measured.

7. A system for accurately measuring the size of an object according to claim 6, characterized in that: The diameter measuring unit further comprises a measuring part (1) and a deflecting part (4), wherein: The caliper (2) is mounted on the measuring part (1), and the deflection part (4) is slidably connected to the measuring part (1); The deflection part (4) is configured to drive the measuring part (1) to periodically deflect along the preset axis.

8. An electronic device comprising a memory, a processor, and a program stored in the memory and running on the processor, characterized in that: When the processor executes the program, the method for accurately measuring the size of an object as described in any one of claims 1 to 5 is implemented.

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