Insulator detection system, detection method and detection device

Abstract

The application provides a detection system, a detection method and a detection device for an insulator. The system comprises a laser generator, a first lens located on one side of the laser generator and used for refracting the laser emitted by the laser generator, a rotating reflector located on the side of the first lens away from the laser generator and used for reflecting the laser refracted by the first lens to the insulator to irradiate the whole surface of the insulator, so that the insulator reflects the laser, and a laser detector located on the side of the laser generator away from the first lens and used for receiving the laser reflected by the insulator and analyzing the laser to obtain the structural information of the insulator. The rotating reflector can reflect the laser to the insulator at different angles through rotation to perform omnidirectional detection on the insulator, so that the detection of the insulator is more comprehensive and accurate, and the problem of low detection efficiency of manual detection of the insulator in the prior art is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of non-destructive testing, in particular to a detection system for insulators, a detection method, a detection device, a computer readable storage medium and an electronic device. BACKGROUND

[0002] Insulators are one of the indispensable important devices in power systems. The structure of insulators is simple, but its importance in power systems is no less than any other device and equipment. Because the insulator strings of the transmission line are operated in parallel, if any insulator string has a problem, it may cause a fault of the transmission line, even a long power outage accident. This not only threatens the continuous and reliable operation of the power system, but also brings many inconveniences to people's daily life and causes certain losses to the national economy. If any insulator in operation has a defect or zero value fault, it may cause a serious string falling accident, and the loss may be incalculable.

[0003] The existing insulator detection device is usually used to detect the inside of the insulator by using an ultrasonic flaw detector in actual use. However, this operation mode is usually manual, which is not only cumbersome, but also has low detection efficiency. In addition, this operation mode has certain potential risks. SUMMARY

[0004] The main purpose of the present application is to provide a detection system for insulators, a detection method, a detection device, a computer readable storage medium and an electronic device to at least solve the problem of low manual detection efficiency of insulators in the prior art.

[0005] In order to achieve the above purpose, according to one aspect of the present application, a detection system for insulators is provided, comprising: a laser generator; a first lens located on one side of the laser generator for refracting the laser emitted by the laser generator; a rotating reflector located on the side of the first lens away from the laser generator for reflecting the laser refracted by the first lens to the insulator to irradiate the entire surface of the insulator, so that the insulator reflects the laser; a laser detector located on the side of the laser generator away from the first lens for receiving the laser reflected by the insulator and analyzing the laser to obtain the structural information of the insulator.

[0006] Optionally, the detection system further comprises a second lens located between the insulator and the laser detector for reflecting the laser reflected by the insulator to the laser detector.

[0007] According to another aspect of the present application, a detection method of an insulator is provided, which adopts the detection system, and the detection method comprises: controlling the laser generator of the detection system to emit laser to the first lens of the detection system, and the first lens refracts the laser to the rotating reflector of the detection system; controlling the rotating reflector to rotate at a preset speed, and the rotating reflector reflects the laser to the first lens at different angles, so that the first lens refracts a plurality of the laser to the insulator, and the refracted laser covers all surfaces of the insulator, the insulator reflects a plurality of the refracted laser to the laser detector of the detection system, the laser detector analyzes the reflected laser of the insulator to obtain the structural information of the insulator, and the detection of the insulator is completed.

[0008] Optionally, the first lens refracts a plurality of the laser to the insulator, and the refracted laser covers all surfaces of the insulator, comprising: a first control step: in the case that the laser generator emits laser and the rotating reflector of the detection system rotates at a preset speed, controlling the detection system to move to an Nth preset position (N = 1, 2, …, N), so that the laser covers all surfaces of the insulator, and irradiates the insulator from top to bottom; a first judgment step: controlling the laser detector to analyze a plurality of the laser to obtain a plurality of amplitudes of the laser, and judging whether a plurality of the amplitudes satisfy a first preset condition, the spectral image of the laser has a first peak, a second peak, a first valley and a second valley, the first peak and the first valley are a first period, the second peak and the second valley are a second period, the spectral image is alternately formed by the first period and the second period, the first period is the starting amplitude of the spectral image, the amplitude of the first period, and the first preset condition comprises: the amplitude of the first peak is greater than the amplitude of the second peak; a first cycle step: in the case that the judgment result indicates no, repeatedly executing the first control step and the first judgment step until the judgment result indicates yes.

[0009] Optionally, the laser detector of the detection system analyzes the reflected laser of the insulator, including: obtaining a plurality of peak amplitudes of the reflected laser, and obtaining an average value of the plurality of peak amplitudes according to the plurality of peak amplitudes; obtaining a difference value between the average value and an amplitude of a plurality of first peaks according to the average value and the amplitude of the plurality of first peaks, the laser spectral image having the first peaks and second peaks, the amplitude of the first peak being greater than the amplitude of the second peak; obtaining a feature vector of the plurality of first peaks according to at least the difference value; obtaining a first deviation according to the feature vector and the average value of the feature vector, the first deviation representing the structural information of the insulator.

[0010] Optionally, the average value of the feature vector satisfies a first formula: wherein H k is the feature vector, H x is the average value of the feature vector, h k is a modulus of H k .

[0011] Optionally, the first deviation satisfies a second formula: wherein H k is the feature vector, H x is the average value of the feature vector, P k represents the first deviation, h n is a modulus of H k , h xn is a modulus of H x .

[0012] According to another aspect of the present application, a detection device for an insulator is provided, including: a first control module configured to control a laser generator of the detection device to emit laser to a first lens of the detection device, the first lens refracting the laser to a rotating reflector; a second control module configured to control the rotating reflector to rotate at a preset speed, and reflect the laser to the first lens at different angles, so that the first lens refracts a plurality of the laser to the insulator, and the refracted laser covers the entire surface of the insulator, the insulator reflects a plurality of the refracted laser to a laser detector of the detection system, so that the laser detector analyzes the reflected laser of the insulator to obtain the structural information of the insulator, thereby completing the detection of the insulator.

[0013] According to another aspect of the present application, a computer readable storage medium is provided, the computer readable storage medium comprising a stored program, wherein the program controls a device where the computer readable storage medium is located to execute any one of the detection methods for the insulator when the program is running.

[0014] According to another aspect of the present application, an electronic device is provided, comprising: one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs comprise a program for performing any one of the methods for detecting an insulator.

[0015] By applying the technical solution of the present application, the above-mentioned insulator detection system comprises a laser generator, a first lens, a rotating reflector and a laser detector. The laser generator emits laser to the first lens, the first lens refracts the laser to the rotating reflector, and the rotating reflector can reflect the laser to the insulator at different angles by rotating, so as to detect the insulator in all directions, so that the detection of the insulator is more comprehensive and accurate, and the problem of low detection efficiency of the insulator in the prior art is solved. BRIEF DESCRIPTION OF DRAWINGS

[0016] The drawings accompanying the specification of the present application form a part thereof and serve to provide further understanding of the present application, the illustrative embodiments of the present application and its description serve to explain the present application. The present application should not be limited by the inappropriate interpretation of the drawings. In the drawings:

[0017] Figure 1 A structural schematic diagram of an insulator detection system provided in an embodiment of the present application is shown;

[0018] Figure 2 A hardware structural block diagram of a mobile terminal for performing an insulator detection method provided in an embodiment of the present application is shown;

[0019] Figure 3 A flowchart of an insulator detection method provided in an embodiment of the present application is shown;

[0020] Figure 4 A spectral signal diagram of laser detection of an insulator in an insulator detection method provided in an embodiment of the present application is shown;

[0021] Figure 5 A local diagram of a first wave peak in the process of obtaining a feature vector of the first wave peak in an insulator detection method provided in an embodiment of the present application is shown;

[0022] Figure 6 A structural block diagram of an insulator detection device provided in an embodiment of the present application is shown.

[0023] Among them, the above-mentioned drawings include the following reference signs:

[0024] 102, processor; 104, memory; 106, transmission device; 108, input and output device; 10, detection system; 11, laser generator; 12, rotating reflector; 13, first lens; 14, laser detector; 15, second lens; 20, insulator. DETAILED DESCRIPTION

[0025] It should be noted that the embodiments and features of the embodiments in the present application can be combined with each other without conflict. The technical solutions in the embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0026] In order for those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor should be within the scope of protection of the present application.

[0027] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0028] As introduced in the background, the existing insulator detection device in the prior art usually uses an ultrasonic flaw detector to detect the inside of the insulator in actual use. However, this operation mode is usually manual, not only the operation is cumbersome, but also the detection efficiency is low, and this operation mode also has certain potential risk.

[0029] The present application provides an insulator detection system, such as Figure 1As shown, the detection system 10 comprises: a laser generator 11; a first lens 13 located on one side of the laser generator 11, for refracting the laser emitted by the laser generator 11; a rotating reflector 12 located on the side of the first lens 13 away from the laser generator 11, for reflecting the laser refracted by the first lens 13 to the insulator 20 to irradiate the entire surface of the insulator 20, so that the insulator 20 reflects the laser; and a laser detector 14 located on the side of the laser generator 11 away from the first lens 13, for receiving the laser reflected by the insulator 20 and analyzing the laser to obtain the structural information of the insulator 20.

[0030] The laser emitted by the laser emitter of the detection system of the insulator is emitted to the first lens, the first lens refracts the laser to the rotating reflector, the rotating reflector can reflect the laser at different angles to the insulator by rotating, and the insulator is automatically detected in all directions, so that the detection of the insulator is more comprehensive and accurate, and the problem of low detection efficiency of the insulator in the prior art is solved.

[0031] In the above embodiment, as shown in Figure 1 The first lens 13 of the detection system 10 can be a convex lens, the upper end and the lower end of the insulator 20 are metal materials, the middle part is an insulating material to be detected by the detection system 10, and the insulating material part has two kinds of insulating sheets, the first kind is a larger-diameter insulating sheet, and the second kind is a smaller-diameter insulating sheet, the first kind of insulating sheet and the second kind of insulating sheet are alternately distributed on the insulator 20, and the insulating sheets close to the upper end and the lower end of the insulator 20 are the first kind.

[0032] In some optional embodiments, as shown in Figure 1 The detection system 10 further comprises a second lens 15, the second lens 15 is located between the insulator 20 and the laser detector 14, and is used for reflecting the laser reflected by the insulator 20 to the laser detector 14.

[0033] In the above optional embodiment, as shown in Figure 1 The second lens 15 can be a convex lens, and the second lens 15 refracts and converges the reflected laser reflected by the insulator 20 to the laser detector 14 after refracting, so that the laser detector 14 performs data analysis. The detection system can collect panoramic laser signals for a plurality of suspended insulators by adjusting the angles of the two lenses.

[0034] The technical solutions in the embodiments of the application will be described clearly and completely below with reference to the drawings in the embodiments of the application.

[0035] The methods and embodiments provided in this application can be executed on a mobile terminal, a computer terminal, or a similar computing device. Taking running on a mobile terminal as an example, Figure 2 This is a hardware structure block diagram of a mobile terminal for an insulator detection method according to an embodiment of the present invention. Figure 2 As shown, a mobile terminal may include one or more ( Figure 2 Only one is shown in the diagram. A processor 102 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. The mobile terminal may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 2 The structure shown is for illustrative purposes only and does not limit the structure of the mobile terminal described above. For example, the mobile terminal may also include components that are more... Figure 2 The more or fewer components shown, or having the same Figure 2 The different configurations shown.

[0036] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to the insulator detection method in this embodiment of the invention. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thereby implementing the above-described method. The memory 104 may include high-speed random access memory and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to the mobile terminal via a network. Examples of the aforementioned networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof. The transmission device 106 is used to receive or send data via a network. Specific examples of the aforementioned networks may include wireless networks provided by the mobile terminal's communication provider. In one example, the transmission device 106 includes a network interface controller (NIC), which can be connected to other network devices via a base station to communicate with the Internet. In one example, the transmission device 106 may be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0037] A method for detecting an insulator running on a mobile terminal, a computer terminal or a similar computing device is provided in the present embodiment. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical sequence is shown in the flowchart, in some cases, the steps shown or described herein can be executed in a different order.

[0038] Figure 3 A flowchart of a method for detecting an insulator according to an embodiment of the present application is shown in FIG. 1. As shown in FIGS. 1 and 2, the method comprises the following steps: Figure 1 and Figure 3

[0039] In step S201, the laser generator 11 of the detection system 10 is controlled to emit laser light to the first lens 13 of the detection system 10, and the first lens 13 refracts the laser light to the rotating reflector 12 of the detection system 10.

[0040] Specifically, a control signal is sent to the detection system 10 to control the detection system 10 to control the laser generator 11 to emit laser light to the first lens 13, and the laser light is refracted by the first lens 13 to the rotating reflector 12.

[0041] In step S202, the rotating reflector 12 is controlled to rotate at a preset speed, and the laser light is reflected to the first lens 13 at different angles, so that the first lens 13 refracts a plurality of laser lights to the insulator 20, and the refracted laser light covers the entire surface of the insulator 20, and the insulator 20 reflects a plurality of the refracted laser light to the laser detector 14 of the detection system 10, so that the laser detector 14 analyzes the reflected laser light of the insulator 20 to obtain the structural information of the insulator 20, thereby completing the detection of the insulator 20.

[0042] Specifically, during the detection process, a control signal is sent to the rotating reflector 12 to make the rotating reflector 12 have a preset rotating speed, and the reflecting surface of the rotating reflector 12 is a parabolic surface. When the rotating reflector 12 rotates, the laser light is reflected out, and the reflected laser light is parallel to each other, and can sequentially scan each part of the insulator 20 to be detected from top to bottom. The surface of the insulator 20 will reflect the laser light again, and the reflected laser light is reflected to the second lens 15, and the second lens 15 reflects the laser light to the laser detector 14, and the laser detector 14 analyzes and processes the obtained reflected laser light of the insulator 20 to obtain the structural information of the insulator 20.

[0043] ​The detection method of the insulator controls the laser generator to emit laser light, controls the rotating reflector to have a preset speed, and reflects the laser light to the entire surface of the insulator in a parallel manner. The insulator reflects the laser light, so that the laser detector obtains laser light with insulator structure information, and analyzes the laser light. The detection method uses the periodic characteristics of the spectral image signal to analyze and find out the insulator with a large difference in reflected laser wave from the standard insulator. The detection of the insulator is fast, automatic and accurate, and solves the problem of low detection efficiency of the insulator in the prior art.

[0044] In some optional embodiments, the first lens refracts a plurality of laser lights to the insulator, and the refracted laser light covers the entire surface of the insulator, comprising: a first control step: in the case that the laser generator emits laser light and the rotating reflector of the detection system rotates at a preset speed, the detection system is controlled to move to the Nth preset position (N=1, 2,..., N), so that the laser light covers the entire surface of the insulator and irradiates the insulator from top to bottom; a first judgment step: controlling the laser detector to analyze a plurality of laser lights to obtain a plurality of amplitudes of the laser lights, and judging whether the amplitudes satisfy a first preset condition, the spectral image of the laser light has a first peak, a second peak, a first valley and a second valley, the first peak and the first valley are a first period, the second peak and the second valley are a second period, the spectral image is alternately formed by the first period and the second period, the starting amplitude of the spectral image is the amplitude of the first period, and the first preset condition includes: the amplitude of the first peak is greater than the amplitude of the second peak; a first cycle step: in the case that the judgment result is no, the first control step and the first judgment step are repeatedly executed until the judgment result is yes.

[0045] In the above optional embodiments, during the detection process, the detection angle of the detection system can be adjusted first, so that the laser light with a preset incident angle after refraction can cover the entire surface of the insulator. The upper end and the lower end of the insulator are metal materials, and the middle part is an insulating material to be detected. The reflectivity of the metal material to the laser light is high. When adjusting the detection system, the first control step is performed first: the position of the entire detection system is moved to the first preset position, and the rotating reflector has a preset rotating speed. The insulator is scanned from top to bottom as a whole, as shown in Figure 4 When the upper end of the metal is scanned, the signal has a high value 1, when the middle insulator piece is scanned, the signal has a high value 3, when the two insulator pieces are scanned, the signal has a low value 2 or a low value 4, and finally when the lower end of the metal is scanned, the signal has a high value 1. Figure 4Only part of the signal diagram is shown, if the position is not appropriate, the above phenomenon cannot be observed. The first determination step is performed: determine whether the high value 1 (the amplitude of the first peak) is greater than the high value 3 (the amplitude of the second peak); if the determination result is no, the first loop step is entered, and the first control step is executed again, the detection system is controlled to move to the second preset position, and the first determination step is performed again until the determination result is yes. It is found that the signals at the beginning and end are obviously stronger than the middle in the detection process, and the signal amplitudes at the beginning and end are the largest, and then the position adjustment of the detection system is completed, and the loop step is stopped.

[0046] In some optional embodiments, the analysis of the reflected laser of the insulator by the laser detector of the detection system includes: obtaining a plurality of peak amplitudes of the reflected laser, and obtaining an average value of the plurality of peak amplitudes according to the plurality of peak amplitudes; obtaining a difference value between the average value and the amplitudes of the plurality of first peaks according to the average value and the amplitudes of the plurality of first peaks; obtaining a feature vector of the plurality of first peaks according to at least the difference value, the spectral image of the laser has the first peak and the second peak, and the amplitude of the first peak is greater than the amplitude of the second peak; obtaining an average value of the feature vectors according to the plurality of feature vectors; and obtaining a first deviation according to the feature vectors and the average value of the feature vectors, the first deviation representing the structural information of the insulator.

[0047] In the above optional embodiments, as shown in Figure 5 U max represents the difference value between the high value 1 in the first peak Figure 4 and the average value of all signals, 1%U max , 10%U max represents the corresponding proportion of U max in the waveform, and t represents the corresponding time abscissa in the waveform. These data can be used as features to express the detailed information of the waveform, and the difference of the detailed information can reflect the state of the measured insulator piece. For each first peak, an eight-dimensional feature vector H is constructed, H is composed of three amplitude features and five time features, H = [h1, h2,..., h8] = [10%U max , 50%U max , 90%U max , t total , t 10％ , t 50％ , t4-t2, t7-t5], t total is t8-t1, and h is a feature in H.

[0048] In some optional embodiments, the average value of the feature vector satisfies the first formula: wherein H kis a feature vector, H x is an average value of the feature vector, h k is a feature vector, H k is a modulus of H

[0049] In the optional embodiment, if there are 10 wave crests, the feature vector H k , k = 1, 2,..., 10. Their average value formula is:

[0050] In some optional embodiments, the first deviation satisfies a second formula: wherein H k is a feature vector, H x is an average value of the feature vector, P k represents the first deviation, h n is a modulus of H k is a modulus of H xn is a modulus of H x is a modulus of H

[0051] In the optional embodiment, each feature vector H k is compared with the average value H x of the feature vector to obtain the first deviation, and the first deviation formula is: The first deviation obtained above is compared with a standard deviation of a standard insulator. If the difference between the first deviation and the standard deviation is greater than a first preset deviation, it indicates that the surface of the insulator has accumulated dirt, is damaged, or is loose. The detection method uses the periodic characteristics of the spectral image signal to analyze and find out the insulator with a large difference between the reflected laser wave and the standard insulator, so that the insulator can be quickly, automatically and accurately detected, and the problem of low detection efficiency of the manual detection of the insulator in the prior art is solved.

[0052] The embodiment of the present application also provides an insulator detection device. It should be noted that the insulator detection device of the embodiment of the present application can be used to execute the insulator detection method provided by the embodiment of the present application. The device is used to realize the above-mentioned embodiments and preferred embodiments, and will not be described again. As used below, the term "module" can be a combination of software and / or hardware that realizes a predetermined function. Although the device described in the following embodiments is preferably realized in software, hardware or a combination of software and hardware is also possible and is conceived.

[0053] The insulator detection device provided by the embodiment of the present application is described below.

[0054] Figure 6 is a schematic diagram of the insulator detection device according to the embodiment of the present application. As Figure 6As shown, the device comprises: a first control module 100 for controlling the laser generator of the detection device to emit laser to the first lens of the detection device, and the first lens refracts the laser to the rotating reflector; a second control module 200 for controlling the rotating reflector to rotate at a preset speed, and reflecting the laser to the first lens at different angles, so that the first lens refracts multiple lasers to the insulator, and the insulator reflects multiple refracted lasers to the laser detector of the detection system, so that the laser detector analyzes the reflected laser of the insulator to obtain the structural information of the insulator, thereby completing the detection of the insulator.

[0055] The detection device of the insulator of the present application comprises a first control module and a second control module, wherein the first control module is used to control the laser generator to emit laser, and the second control module is used to control the rotating reflector to have a preset speed and reflect the laser to the entire surface of the insulator in parallel, and the insulator reflects the laser to make the laser detector obtain the laser with the structural information of the insulator and analyze the laser. The periodic characteristics of the spectral image signal are used for analysis, and the insulator with large difference in reflected laser wave from the standard insulator is found out, so that the detection of the insulator is fast, automatic and accurate, and the problem of low detection efficiency of the insulator in the prior art is solved.

[0056] In some optional embodiments, the first control module comprises a first control sub-module, a first judgment sub-module and a first cycle sub-module, wherein the first control sub-module is used to control the detection system to move to the Nth preset position (N=1, 2,..., N) when the laser generator emits laser and the rotating reflector of the detection system rotates at a preset speed, so that the laser covers the entire surface of the insulator and irradiates the insulator from top to bottom; the first judgment sub-module is used to control the laser detector to analyze multiple lasers to obtain the amplitudes of multiple lasers, and judge whether the amplitudes satisfy a first preset condition, the spectral image of the laser has a first peak, a second peak, a first valley and a second valley, the first peak and the first valley are a first period, the second peak and the second valley are a second period, the spectral image is alternately formed by the first period and the second period, the starting amplitude of the spectral image is the amplitude of the first period, and the first preset condition comprises: the amplitude of the first peak is greater than the amplitude of the second peak; the first cycle sub-module is used to repeat the first control step and the first judgment step until the judgment result indicates yes when the judgment result indicates no.

[0057] In some optional embodiments, the first control module includes a first sub-acquisition module, a first sub-computation module, a second sub-acquisition module, a second sub-computation module, and a third sub-computation module. The first sub-acquisition module is configured to acquire a plurality of peak amplitudes of the reflected laser light, and obtain an average value of the plurality of peak amplitudes according to the plurality of peak amplitudes. The first sub-computation module is configured to obtain a difference value between the average value and the amplitudes of a plurality of first peaks according to the average value and the amplitudes of the plurality of first peaks. The second sub-acquisition module is configured to obtain a feature vector of the plurality of first peaks according to at least the difference value. The spectrum image of the laser light has the first peaks and second peaks, and the amplitudes of the first peaks are greater than the amplitudes of the second peaks. The second sub-computation module is configured to obtain an average value of the feature vectors according to the plurality of feature vectors. The third sub-computation module is configured to obtain a first deviation according to the feature vectors and the average value of the feature vectors. The first deviation represents the structural information of the insulator.

[0058] In some optional embodiments, the average value of the feature vectors of the second sub-computation module satisfies a first formula: wherein H k is the feature vector, H x is the average value of the feature vector, h k is the modulus of H k .

[0059] In some optional embodiments, the first deviation of the third sub-computation module satisfies a second formula: wherein H k is the feature vector, H x is the average value of the feature vector, P k represents the first deviation, h n is the modulus of H k , h xn is the modulus of H x .

[0060] The processor includes a core, and the core retrieves a corresponding program unit from the memory. The core can be one or more, and the influence of considering the existence of malicious nodes on the security of data transmission of the power internet of things in the prior art is solved by adjusting the core parameters, thereby solving the problem of security risks of multi-source power data.

[0061] The memory can include a non-persistent memory in a computer readable medium, a random access memory (RAM), and / or a non-volatile memory such as a read-only memory (ROM) or a flash memory (flash RAM), and the memory includes at least one memory chip.

[0062] The embodiment of the present application provides a computer readable storage medium, which comprises a stored program, wherein the program controls a device where the computer readable storage medium is located to perform the detection method of the insulator when the program is running.

[0063] Specifically, the detection method of the insulator comprises the following steps.

[0064] In step S201, a laser generator of the detection system is controlled to emit laser to a first lens of the detection system, and the first lens refracts the laser to a rotating reflector of the detection system.

[0065] In step S202, the rotating reflector is controlled to rotate at a preset speed, and the laser is reflected to the first lens at different angles, so that the first lens refracts a plurality of the laser to the insulator, and the refracted laser covers all surfaces of the insulator, the insulator reflects the plurality of the refracted laser to a laser detector of the detection system, the laser detector analyzes the reflected laser of the insulator to obtain structure information of the insulator, and the detection of the insulator is completed.

[0066] According to the detection method of the insulator, the laser generator is controlled to emit laser, the rotating reflector is controlled to have a preset speed, and the laser is reflected to all surfaces of the insulator in parallel, the insulator reflects the laser, the laser detector obtains the laser with the structure information of the insulator, and the laser is analyzed. The detection method adopts the periodic characteristics of the spectral image signal to analyze, finds out the insulator with large difference between the reflected laser wave and the standard insulator, and can quickly, automatically and accurately detect the insulator, and solves the problem of low detection efficiency of the manual detection of the insulator in the prior art.

[0067] In some optional embodiments, the first lens refracts the plurality of lasers to the insulator, and the refracted lasers cover the entire surface of the insulator, comprising: a first control step: controlling the laser generator to emit the lasers and the rotating reflector instrument of the detection system to rotate at a preset speed, and controlling the detection system to move to the Nth preset position (N = 1, 2, …, N) so that the lasers cover the entire surface of the insulator and irradiate the insulator from top to bottom; a first judgment step: controlling the laser detector to analyze the plurality of lasers to obtain the amplitudes of the plurality of lasers, and judging whether the amplitudes satisfy a first preset condition, the spectral image of the lasers has a first wave peak, a second wave peak, a first wave valley, and a second wave valley, the first wave peak and the first wave valley are a first period, the second wave peak and the second wave valley are a second period, the spectral image is alternately formed by the first period and the second period, the starting amplitude of the spectral image is the amplitude of the first period, and the first preset condition comprises: the amplitude of the first wave peak is greater than the amplitude of the second wave peak; a first cycle step: in the case where the judgment result is no, repeatedly executing the first control step and the first judgment step until the judgment result is yes.

[0068] In some optional embodiments, the laser detector of the detection system analyzes the reflected lasers of the insulator, comprising: obtaining the peak amplitudes of the plurality of reflected lasers, and obtaining the average value of the plurality of peak amplitudes according to the plurality of peak amplitudes; obtaining the difference between the plurality of first wave peaks and the average value according to the average value and the amplitudes of the plurality of first wave peaks; obtaining the feature vectors of the plurality of first wave peaks according to at least the difference, the spectral image of the lasers has the first wave peak and the second wave peak, and the amplitude of the first wave peak is greater than the amplitude of the second wave peak; obtaining the average value of the feature vectors according to the plurality of feature vectors; obtaining a first deviation according to the feature vectors and the average value of the feature vectors, and the first deviation represents the structural information of the insulator.

[0069] In some optional embodiments, the average value of the feature vectors satisfies a first formula: wherein, H k is the feature vector, H x is the average value of the feature vector, h k is the module of H k .

[0070] In some optional embodiments, the first deviation satisfies a second formula: wherein, H k is the feature vector, H x is the average value of the feature vector, P krepresents the first deviation, h n is H k modulus of H xn is H x modulus of H

[0071] The embodiment of the present application provides a processor, which is used for running a program, wherein the program performs the detection method of the insulator when running.

[0072] Specifically, the detection method of the insulator comprises:

[0073] In step S201, a laser generator of the detection system is controlled to emit laser to a first lens of the detection system, and the first lens refracts the laser to a rotating reflector of the detection system.

[0074] In step S202, the rotating reflector is controlled to rotate at a preset speed, the laser is reflected to the first lens at different angles, the first lens refracts a plurality of the laser to the insulator, the refracted laser covers all surfaces of the insulator, the insulator reflects a plurality of the refracted laser to a laser detector of the detection system, the laser detector analyzes the reflected laser of the insulator, obtains the structural information of the insulator, and completes the detection of the insulator.

[0075] The embodiment of the present application provides a computer program product, comprising computer instructions, wherein the computer instructions are executed by a processor to at least implement the following steps.

[0076] Specifically, the detection method of the insulator comprises:

[0077] In step S201, a laser generator of the detection system is controlled to emit laser to a first lens of the detection system, and the first lens refracts the laser to a rotating reflector of the detection system.

[0078] In step S202, the rotating reflector is controlled to rotate at a preset speed, the laser is reflected to the first lens at different angles, the first lens refracts a plurality of the laser to the insulator, the refracted laser covers all surfaces of the insulator, the insulator reflects a plurality of the refracted laser to a laser detector of the detection system, the laser detector analyzes the reflected laser of the insulator, obtains the structural information of the insulator, and completes the detection of the insulator.

[0079] The embodiment of the present application provides an electronic device, which comprises a processor, a memory and a program stored in the memory and capable of running on the processor, and the processor implements at least the following steps when executing the program.

[0080] Specifically, the insulator detection method comprises the following steps:

[0081] In step S201, the laser generator of the detection system is controlled to emit laser to the first lens of the detection system, and the first lens refracts the laser to the rotating reflector of the detection system.

[0082] In step S202, the rotating reflector is controlled to rotate at a preset speed, and the laser is reflected to the first lens at different angles, so that the first lens refracts a plurality of the laser to the insulator, and the insulator reflects a plurality of the refracted laser to the laser detector of the detection system, so that the laser detector analyzes the reflected laser of the insulator to obtain the structure information of the insulator, thereby completing the detection of the insulator.

[0083] The device herein can be a server, a PC, a PAD, a mobile phone, etc.

[0084] Obviously, those skilled in the art should understand that each module or each step of the application can be realized by a general computing device, which can be concentrated on a single computing device or distributed on a network composed of multiple computing devices, and can be realized by program codes executable by the computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in different order, or they can be manufactured into each integrated circuit module respectively, or multiple modules or steps can be manufactured into a single integrated circuit module. Therefore, the application is not limited to any specific hardware and software combination.

[0085] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can be in the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can be in the form of a computer program product implemented on one or more computer usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer usable program codes.

[0086] The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks.

[0087] The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks.

[0088] The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. Figure 1 The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks. The computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart block or blocks.

[0089] In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0090] The memory can include non-persistent memory and / or volatile memory, such as random access memory (RAM) and / or cache memory, non-volatile memory, etc. in the form of read only memory (ROM) or flash memory, for example. The memory is an example of computer readable media.

[0091] Computer-readable media includes permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology for information storage. Information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible to a computing device. According to the definition herein, computer-readable media does not include transitory media such as modulated data signals and carriers.

[0092] It should also be noted that the terms "comprising", "including" or any other variant thereof are intended to cover non-exclusive inclusion, so that processes, methods, articles or devices including a series of elements not only include those elements, but also include other elements not explicitly listed or inherent to such processes, methods, articles or devices. Without more limitations, the element defined by the statement "including a" does not exclude the presence of additional identical elements in the process, method, article or device including the element.

[0093] From the above description, it can be seen that the above-mentioned embodiments of the present application achieve the following technical effects:

[0094] 1) The laser emitter of the detection system emits laser to the first lens, the first lens refracts the laser to the rotating reflector, the rotating reflector can reflect the laser to the insulator at different angles by rotating, and the insulator is automatically detected in all directions, so that the detection of the insulator is more comprehensive and accurate, and the problem of low detection efficiency of manual detection of the insulator in the prior art is solved.

[0095] 2) The detection method of the insulator, first controls the laser generator to emit laser, controls the rotating reflector to have a preset speed, and reflects the laser to the entire surface of the insulator in a parallel manner, the insulator reflects the laser, so that the laser detector obtains laser with insulator structure information, and analyzes the laser. The detection method uses the periodic characteristics of the spectral image signal to analyze, finds out the insulator with large difference between the reflected laser wave and the standard insulator, and can quickly, automatically and accurately detect the insulator, solving the problem of low detection efficiency of manual detection of the insulator in the prior art.

[0096] The above descriptions are only the preferred embodiment of the present application, but not for limiting the present application. For those skilled in the art, the present application can have various modifications and changes. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A detection method for detecting an insulator using an insulator detection system, characterized by, The detection system of the insulator comprises: a laser generator; a first lens located on one side of the laser generator and used for refracting the laser emitted by the laser generator; a rotating reflector located on the side of the first lens away from the laser generator and used for reflecting the laser refracted by the first lens to the insulator to irradiate the whole surface of the insulator, so that the insulator reflects the laser; and a laser detector located on the side of the laser generator away from the first lens and used for receiving the laser reflected by the insulator and analyzing the laser to obtain the structural information of the insulator. The detection method comprises: controlling the laser generator of the detection system to emit laser to the first lens of the detection system, and the first lens refracts the laser to the rotating reflector of the detection system; controlling the rotating reflector to rotate at a preset speed, and reflecting the laser at different angles to the first lens, so that the first lens refracts a plurality of the laser to the insulator, and the refracted laser covers the whole surface of the insulator, and the insulator reflects a plurality of the refracted laser to the laser detector of the detection system, so that the laser detector analyzes the reflected laser of the insulator to obtain the structural information of the insulator, thereby completing the detection of the insulator; the first lens refracting a plurality of the laser to the insulator and the refracted laser covering the whole surface of the insulator comprises: a first control step: under the condition that the laser generator emits laser and the rotating reflector of the detection system rotates at a preset speed, controlling the detection system to move to the Nth preset position, N=1, 2,..., n, so that the laser covers the whole surface of the insulator and irradiates the insulator from top to bottom; a first judgment step: controlling the laser detector to analyze a plurality of the laser to obtain a plurality of amplitudes of the laser, and judging whether a plurality of the amplitudes satisfy a first preset condition, the spectral image of the laser has a first wave peak, a second wave peak, a first wave valley and a second wave valley, the first wave peak is a wave peak obtained by scanning the metal on the insulator, the second wave peak is a wave peak obtained by scanning the insulator sheet in the middle of the insulator, and the first preset condition comprises that the amplitude of the first wave peak is greater than the amplitude of the second wave peak; a first cycle step: in the case where the judgment result indicates no, repeatedly executing the first control step and the first judgment step until the judgment result indicates yes; the laser detector of the detection system analyzing the reflected laser of the insulator comprises: obtaining the average value of all signals of the reflected laser of the insulator; obtaining the difference between a plurality of the second wave peaks and the average value according to the average value and the amplitudes of a plurality of the second wave peaks; For each second peak, an eight-dimensional feature vector H is constructed k , H k is composed of 3 amplitude features and 5 time features, k = [10%U max , 50%U max , 90%U max , t total , t 10％ , t 50％ , t4-t2, t7-t5], where U max represents the difference between the second peak and the average value of all signals, 10%U max , 50%U max , 90%U max represent the corresponding proportion of U max in the waveform, which refers to the waveform of the spectral image of any one of the insulator pieces in the insulator, t represents the corresponding time abscissa in the waveform, t 10% represents t7-t2, t 50% represents t6-t3, t total represents t8-t1, t1 is the corresponding abscissa when the ordinate height is 1%U max before the highest peak of the waveform, t2 is the corresponding abscissa when the ordinate height is 10%U max before the highest peak of the waveform, t3 is the corresponding abscissa when the ordinate height is 50%U max before the highest peak of the waveform, t4 is the corresponding abscissa when the ordinate height is 90%U max before the highest peak of the waveform, t5 is the corresponding abscissa when the ordinate height is 90%U max after the highest peak of the waveform, t6 is the corresponding abscissa when the ordinate height is 50%U max after the highest peak of the waveform, t7 is the corresponding abscissa when the ordinate height is 10%U max after the highest peak of the waveform, t8 is the corresponding abscissa when the ordinate height is 1%Umax after the highest peak of the waveform. obtaining the average value of the feature vectors according to a plurality of the feature vectors; and According to the feature vector and the average value of the feature vector, a first deviation is obtained, the first deviation is compared with a standard deviation of a standard insulator, and if the first deviation is greater than a first preset deviation from the standard deviation, it is indicated that the surface of the insulator has defects.

2. The detection method according to claim 1, characterized in that, The detection system further comprises a second lens between the insulator and the laser detector, configured to transmit the laser reflected by the insulator to the laser detector.

3. The method of claim 1, wherein, The first deviation satisfies a second formula: ； where H k is the feature vector, H x is the mean of the feature vector, P k denotes the first deviation, h n is the norm of H k , h xn is the norm of H x .

4. An insulator inspection apparatus for inspecting an insulator by using the inspection method according to any one of claims 1 to 3, characterized by Comprise: A first control module configured to control a laser generator of the detection system to emit laser to a first lens of the detection system, and the first lens refracts the laser to a rotating reflector; A second control module configured to control the rotating reflector to rotate at a preset speed, and reflect the laser to the first lens at different angles, so that the first lens refracts a plurality of the laser to an insulator, and the refracted laser covers the entire surface of the insulator, the insulator reflects a plurality of the refracted laser to a laser detector of the detection system, so that the laser detector analyzes the reflected laser of the insulator to obtain structural information of the insulator, thereby completing the detection of the insulator.

5. A computer readable storage medium, characterized in that, The computer readable storage medium comprises a stored program, wherein the program controls the device where the computer readable storage medium is located to execute the insulator detection method of any one of claims 1-3 when the program is running.

6. An electronic device, comprising: Comprise: One or more processors, memories, and one or more programs, wherein the one or more programs are stored in the memories and configured to be executed by the one or more processors, and the one or more programs comprise a program for executing the insulator detection method of any one of claims 1-3.

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