Grade analysis device and grade analysis method

Abstract

The present disclosure relates to pulp grade detection, and specifically to a grade analysis device and a grade analysis method. The grade analysis device provided in the embodiment of the present disclosure includes a plurality of sample preparation devices, and the plurality of sample preparation devices are configured to prepare samples respectively in different time sequences, the sample preparation device includes a feed port and a sample outlet, and the surface to be tested of the sample prepared by the sample preparation device is exposed through the sample outlet; and a detection device, the detection device can be movably arranged to move to a position opposite to the sample outlet to detect the prepared sample. In the present disclosure, a plurality of sample preparation devices prepare samples respectively in different time sequences, so that a plurality of samples can be prepared at different times, and then the detection equipment can detect the prepared samples, while other sample preparation devices continue to prepare samples, so that the detection process can be realized and the detection efficiency is improved.

Description

Technical Field

[0001] The present invention relates to slurry grade detection, and in particular to a grade analysis device and a grade analysis method. Background Art

[0002] In the detection of slurry grade, the detection method is usually adopted to prepare samples first and then test the prepared single samples. However, the preparation of samples takes a certain amount of time, and the detection process cycle of a single sample is long. Such a detection method cannot achieve a fast detection process, resulting in low detection efficiency. Summary of the invention

[0003] To overcome the problems existing in the related art, exemplary embodiments of the present disclosure provide a grade analysis device and a grade analysis method.

[0004] In a first aspect, an embodiment of the present disclosure provides a grade analysis device, a plurality of sample preparation devices, wherein the plurality of sample preparation devices are configured to prepare samples respectively at different time sequences, the sample preparation device comprising a feed port and a sample outlet, the surface to be tested of the sample prepared by the sample preparation device being exposed through the sample outlet; and a detection device, wherein the detection device is movably arranged to be moved to a position opposite to the sample outlet so as to detect the prepared sample.

[0005] In some embodiments, the plurality of sample preparation devices are connected to the same pipeline, or the plurality of sample preparation devices are connected to different pipelines.

[0006] In some embodiments, the sample preparation device includes a sample preparation part and a liquid outlet part, the feed port and the sample outlet are respectively located at two ends of the sample preparation part, the liquid outlet part is arranged opposite to the sample outlet and covers the sample outlet during the sample preparation process, and the liquid outlet part and the sample preparation part are arranged to be separable so as to be away from the sample preparation part after the sample preparation is completed so that the sample outlet is exposed.

[0007] In some embodiments, the sample preparation device includes: a driving member including a pressing surface, the driving member is configured to be movable within the sample preparation portion; and a feed channel, the feed channel runs through the driving member, and the outlet of the feed channel is located at the pressing surface, wherein a first filter element is provided on a side of the liquid outlet portion facing the sample preparation portion, and the slurry is accommodated between the pressing surface and the sample outlet through the feed channel, and the driving member moves toward the sample outlet to squeeze the slurry, so that the liquid in the slurry passes through the first filter element and enters the liquid outlet portion.

[0008] In some embodiments, the liquid outlet is a vacuum tank, and the liquid outlet is provided with an air outlet, through which the air in the liquid outlet is extracted to form a vacuum; the sample preparation part is provided with an air inlet, through which air is input into the sample preparation part to drive the driving member to move;

[0009] In some embodiments, the liquid outlet is communicated with the sample preparation part, and the air extracted from the liquid outlet is input into the sample preparation part.

[0010] In some embodiments, a drain outlet is provided at the bottom of the sample preparation part; and a liquid outlet is provided at the bottom of the liquid outlet part.

[0011] In some embodiments, the size of the pressing surface is adapted to the inner diameter of the sample preparation portion.

[0012] In some embodiments, one or more limiting protrusions are provided inside the sample preparation part, and a receiving part is formed on the side of the sample preparation part facing the liquid outlet part, wherein the slurry enters the receiving part through the feed channel to push the driving member to move toward the feed port until the driving member abuts against the limiting protrusion.

[0013] In some embodiments, the pressing surface is provided with a second sieve hole, and the second sieve hole is provided with a second filter element.

[0014] In some embodiments, the detection device is configured to detect along a preset path, and the preset path is a path extending spirally outward from the center of the sample.

[0015] In some embodiments, a plurality of the sample preparation devices are arranged side by side, and the sample outlets of the plurality of the sample preparation devices are aligned.

[0016] In some embodiments, the driving member is a piston, a cylinder or a motor.

[0017] In some embodiments, the grade analysis device includes a cleaning device, and the cleaning device is configured to inject water into the drain port and the liquid outlet to clean the sample preparation device after sample preparation is completed.

[0018] In some embodiments, the liquid outlet is provided with a pressure sensor, and the pressure sensor is used to sense the pressure in the liquid outlet.

[0019] In some embodiments, the grade analysis device comprises a sample analysis device, and the sample analysis device is used to detect the surface of the prepared sample exposed by the sample outlet.

[0020] In a second aspect, the present disclosure further provides a grade analysis method, which is used for a grade analysis device as described in any one of the aforementioned embodiments, and the method comprises: a plurality of the sample preparation devices prepare samples in a predetermined sequence, wherein the predetermined sequence of the plurality of the sample preparation devices is different; and the detection device detects the prepared samples.

[0021] In some embodiments, a plurality of the sample preparation devices are arranged side by side, and the sample outlets of the plurality of the sample preparation devices are aligned, and the plurality of the sample preparation devices prepare samples in a predetermined sequence, including: the plurality of the sample preparation devices prepare samples in sequence at predetermined intervals.

[0022] In some embodiments, the plurality of sample preparation devices prepare samples in a predetermined sequence, including: when some of the plurality of sample preparation devices prepare samples in different sequences, other of the plurality of sample preparation devices are cleaned.

[0023] In some embodiments, the detection device detects the prepared sample, including: obtaining the flatness of the test surface of the sample; based on the flatness of the test surface of the sample being qualified, the detection device detects the sample along a predetermined path, and based on the flatness of the test surface of the sample being partially unqualified, adjusting the detection path of the detection device to avoid the unqualified area.

[0024] In some embodiments, the detection device detects the prepared samples, including: the detection device detects the prepared samples in a predetermined order, wherein the predetermined order corresponds to the predetermined time sequence.

[0025] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure.

[0026] The technical solution provided by the embodiments of the present disclosure may include the following beneficial effects: In the present disclosure, the grade analysis device includes multiple sample preparation devices, which can prepare multiple samples, and realize the detection device to detect multiple samples. In addition, the multiple sample preparation devices prepare samples respectively at different time sequences, so that multiple sample preparation devices can prepare samples asynchronously (i.e., asynchronously). Due to such asynchronous sample preparation, multiple samples can be prepared at different times, and then the detection equipment can detect the prepared samples, while other sample preparation devices continue to prepare samples, which can realize the detection process and improve the detection efficiency. In addition, the detection device can be movably arranged, so that limited detection of prepared samples can be realized, avoiding the waste of effective time. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The present disclosure may be better understood by describing exemplary embodiments of the present disclosure in conjunction with the accompanying drawings, in which:

[0028] Figure 1 is a perspective structural schematic diagram of a grade analysis device according to an exemplary embodiment of the disclosure;

[0029] Figure 2 is a schematic structural diagram of a grade analysis device according to another exemplary embodiment of the present disclosure;

[0030] Figure 3 is a schematic structural diagram of a grade analysis device according to another disclosed exemplary embodiment;

[0031] Figure 4 is a schematic side structural diagram of a grade analysis device according to another exemplary embodiment of the present disclosure;

[0032] Figure 5 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure;

[0033] Figure 6 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure;

[0034] Figure 7 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure;

[0035] Figure 8 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure;

[0036] Fig. 9 is a schematic diagram of a detection path according to another exemplary embodiment of the present disclosure;

[0037] Fig.10 is a schematic structural diagram of a detection device detecting a sample according to another exemplary embodiment of the present disclosure;

[0038] Fig.11 is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure;

[0039] Fig.12 is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure;

[0040] Fig.13 is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure;

[0041] Fig.14is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure;

[0042] Fig.15 It is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure. DETAILED DESCRIPTION

[0043] The specific embodiments of the present invention will be described below. It should be noted that in the specific description of these embodiments, in order to provide a concise description, it is impossible for this specification to provide a detailed description of all the features of the actual embodiments. It should be understood that in the actual implementation of any embodiment, just as in the process of any engineering project or design project, in order to achieve the specific goals of the developer and to meet system-related or business-related restrictions, various specific decisions are often made, and this will also change from one embodiment to another. In addition, it can also be understood that although the efforts made in this development process may be complex and lengthy, for ordinary technicians in the field related to the content disclosed by the present invention, some changes such as design, manufacturing or production based on the technical content disclosed in this disclosure are just conventional technical means, and should not be understood as insufficient content of this disclosure.

[0044] Unless otherwise defined, the technical or scientific terms used in the claims and the specification shall have the usual meaning understood by persons with ordinary skills in the technical field to which the invention belongs. The words "first", "second" and similar words used in the patent application specification and the claims of the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. "One" or "one" and other similar words do not indicate a quantitative limitation, but indicate the existence of at least one. "Include" or "comprises" and other similar words mean that the elements or objects appearing before "include" or "comprises" include the elements or objects listed after "include" or "comprises" and their equivalent elements, and do not exclude other elements or objects. "Connected" or "connected" and other similar words are not limited to physical or mechanical connections, nor are they limited to direct or indirect connections.

[0045] The present application uses specific words to describe the embodiments of the present application. For example, "one embodiment", "an embodiment", and / or "some embodiments" refer to a certain feature, structure or characteristic related to at least one embodiment of the present application. Therefore, it should be emphasized and noted that "one embodiment" or "an embodiment" or "an alternative embodiment" mentioned twice or multiple times in different positions in this specification does not necessarily refer to the same embodiment. In addition, some features, structures or characteristics in one or more embodiments of the present application can be appropriately combined.

[0046] In the detection of slurry grade, the detection method is usually adopted to prepare samples first and then test the prepared single samples. However, the preparation of samples requires certain events, and the detection process of a single sample is long. The detection process cannot be realized by using such a detection method, resulting in low detection efficiency.

[0047] To overcome the problems existing in the related art, exemplary embodiments of the present disclosure provide a grade analysis device and a grade analysis method.

[0048] The embodiment of the present disclosure provides a grade analysis device, a plurality of sample preparation devices, the plurality of sample preparation devices are configured to prepare samples respectively in different time sequences, the sample preparation devices include a feed port and a sample outlet, the surface to be tested of the sample prepared by the sample preparation device is exposed through the sample outlet; and a detection device, the detection device can be movably arranged to be moved to a position opposite to the sample outlet to detect the prepared sample.

[0049] In the present disclosure, the grade analysis device includes multiple sample preparation devices, which can prepare multiple samples, and realize the detection device to detect multiple samples. In addition, the multiple sample preparation devices prepare samples respectively at different time sequences, so that multiple sample preparation devices can prepare samples asynchronously (i.e., asynchronously). Due to such asynchronous sample preparation, multiple samples can be prepared at different times, and then the detection equipment can detect the prepared samples, while other sample preparation devices continue to prepare samples, which can realize the detection process and improve the detection efficiency. In addition, the detection device can be movably arranged, so that limited detection of prepared samples can be realized, avoiding the waste of effective time. In the present disclosure, the sample can be a cake-shaped product made by discharging part of the liquid from the slurry. The slurry contains slag and liquid, and the cake-shaped sample is formed after the liquid is discharged by squeezing and extraction.

[0050] Figure 1 is a perspective structural schematic diagram of a grade analysis device according to an exemplary embodiment of the disclosure; Figure 2 is a schematic structural diagram of a grade analysis device according to another exemplary embodiment of the present disclosure; Figure 3 is a schematic structural diagram of a grade analysis device according to another disclosed exemplary embodiment; Figure 4 is a schematic side structural diagram of a grade analysis device according to another exemplary embodiment of the present disclosure.

[0051] like Figures 1 to 4 As shown, the grade analysis device 10 provided by the present disclosure includes a plurality of sample preparation devices 100 and a detection device 200. The sample preparation device 100 may include a feed port 104 and a sample outlet 103, and the slurry 400 enters the sample preparation device 100 through the feed port 104 for preparation, and the surface to be tested of the prepared sample may be exposed through the sample outlet 103 for detection by the detection device 200.

[0052] In the present disclosure, multiple sample preparation devices 100 can prepare samples in different time sequences. Figure 2 and Figure 3 As shown, the grade analysis device 10 may include four sample preparation devices 100, namely a first sample preparation device 111, a second sample preparation device 112, a third sample preparation device 113 and a fourth sample preparation device 114. However, the present disclosure is not limited to only four sample preparation devices, and may also be set to more or less.

[0053] like Figure 2 As shown, the first sample preparation device 111 prepares a sample, and the detection device 200 moves to the first sample preparation device 111 to detect the surface to be detected located at the sample outlet 103. While the detection device 200 detects the sample prepared by the first sample preparation device 111, the other three sample preparation devices 100 prepare samples. After the detection device 200 detects the sample prepared by the first sample preparation device 111, the sample preparation device 100 can be moved to other sample preparation devices that have prepared samples for detection.

[0054] For example, Figure 3 As shown, after the detection device 200 detects the sample prepared by the first sample preparation device 111 , the second sample preparation device 112 completes sample preparation, and the detection device 200 can move to the second sample preparation device 112 to detect the sample prepared by the second sample preparation device 112 .

[0055] In the present disclosure, after the detection device 200 detects the sample prepared by the first sample preparation device 111, the first sample preparation device 111 may perform other operations, such as cleaning, calibration, or continue to prepare the sample.

[0056] Reference Figure 2 and Figure 3 , the detection device 200 can continue to detect the third sample preparation device 113 and the fourth sample preparation device 114.

[0057] According to the above description, it can be seen that the grade analysis device 10 provided by the present disclosure prepares samples respectively in different time sequences through multiple sample preparation devices, so that multiple sample preparation devices 100 can prepare samples asynchronously. Due to such asynchronous sample preparation, multiple samples can be prepared at different times, and then the detection device 200 can detect the prepared samples, while other sample preparation devices 100 continue to prepare samples, so that the detection process can be realized and the detection efficiency is improved.

[0058] It should be pointed out that the asynchronous sample preparation of multiple sample preparation devices described in the present disclosure includes that the multiple sample preparation devices are completely completely synchronized with each other, and also includes that some of the multiple sample preparation devices prepare samples synchronously while the other sample preparation devices prepare samples asynchronously.

[0059] like Figures 1 to 3 As shown, in an exemplary embodiment of the present disclosure, multiple sample preparation devices 100 can be arranged side by side, and the sample outlets 103 of the multiple sample preparation devices 100 can be aligned. Such an arrangement facilitates the detection device 200 to move to the corresponding sample preparation device 100 for detection. It should be pointed out that such an arrangement is only an example, and the present disclosure is not limited to the arrangement of multiple sample preparation devices side by side, as long as asynchronous sample preparation can be achieved and detection efficiency can be improved.

[0060] In the present disclosure, multiple sample preparation devices 100 can prepare samples in sequence according to a set program. For example, multiple sample preparation devices 100 can be set to prepare samples at a certain interval, in which case the detection device 200 can also perform detection at the same time interval.

[0061] However, the present disclosure is not limited to preparing samples in sequence according to the time setting, and other control methods can also be used for detection. For example, the grade analysis device 10 can also include a sample analysis device, and the sample analysis device is used to detect the surface to be detected of the prepared sample. If the sample is qualified, the detection device 200 is controlled to perform the detection. If the sample is qualified, the sample preparation device 100 is controlled to remove the sample and prepare the sample again until the sample is qualified and then the detection device is used for detection.

[0062] In some embodiments, if the sample analysis device detects that the test surface is partially unqualified, for example, there are depressions, protrusions, defects, etc. in some positions, the detection device 200 can be controlled to avoid these unqualified positions to prevent the detection results from being disturbed, thereby improving the accuracy of the detection.

[0063] In an exemplary embodiment of the present disclosure, a plurality of sample preparation devices 100 may be respectively connected to the same pipeline, that is, the grade analysis device 10 detects one slurry pipeline.

[0064] In the exemplary embodiment of the present disclosure, a plurality of sample preparation devices 100 can be connected to different pipelines. Figure 2 and Figure 3 As shown, the first sample preparation device 111 and the second sample preparation device 112 may be connected to the first pipeline, and the third sample preparation device 113 and the fourth sample preparation device 114 may be connected to the second pipeline, but the present disclosure is not limited thereto.

[0065] In the exemplary embodiment of the present disclosure, Figures 1 to 3 As shown, the sample preparation device 100 may include a sample preparation part 101 and a liquid outlet part 102, the feed port 104 and the sample outlet 103 are respectively located at two ends of the sample preparation part 101, the liquid outlet part 102 may be arranged opposite to the sample outlet 103 and cover the sample outlet 103 during the sample preparation process, and the liquid outlet part 102 and the sample preparation part 101 are arranged to be separable so as to be away from the sample preparation part 102 after the sample preparation is completed so that the sample outlet 103 is exposed.

[0066] Figure 5 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure; Figure 6 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure; Figure 7 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure; Figure 8 is a schematic cross-sectional structural diagram of a sample preparation device according to another exemplary embodiment of the present disclosure.

[0067] Reference Figures 5 to 8 The sample preparation process of the sample preparation device 100 is described in detail below.

[0068] like Figures 5 to 8 As shown, in an exemplary embodiment of the present disclosure, the sample preparation device 100 may include a driving member 115 and a feeding channel 116. The driving member 115 may include a pressing surface 151, and the driving member 115 may be configured to be movable in the sample preparation part 101. In the present disclosure, the driving member 115 may be a piston, a cylinder, or a motor. Through the movement of the driving member 115, the slurry 400, i.e., the slurry to be tested, entering the sample preparation part 101 can be squeezed to prepare a sample.

[0069] In the present disclosure, the size of the pressing surface 151 can be adapted to the inner diameter of the sample preparation part 101. Such a configuration can achieve effective pressing of the slurry 400 and can also prevent the slurry 400 from entering other areas of the sample preparation part 101.

[0070] like Figures 5 to 8 As shown, the feed channel 116 may be arranged through the driving member 115. For example, the feed channel 116 may be arranged through the driving member 115 in the direction from the feed port 104 to the sample outlet 103, and the outlet of the feed channel 116 may be located at the pressing surface 151. Figure 6 As shown, the slurry 400 can enter the sample preparation part 101 through the feed channel 116 for sample preparation. The slurry 400 entering the sample preparation part 101 through the feed channel 116 can be accommodated between the pressing surface 151 and the sample outlet 103 .

[0071] like Figures 5 to 8 As shown, the first filter element 121 may be provided on one side of the liquid outlet 102 facing the sample preparation part 101. The liquid in the slurry 400 may pass through the first filter element 121 and enter the liquid outlet 102. The substance to be tested in the slurry 400 is generally solid and may be left in the sample preparation part 101 for sample preparation.

[0072] The inlet of the liquid outlet 102 may be provided with a first sieve hole 122, and the first filter element 121 may cover the outside of the first sieve hole 122. The first filter element 121 may be an industrial filter cloth.

[0073] In the exemplary embodiment of the present disclosure, Figures 5 to 8 As shown, a liquid outlet 123 is provided at the bottom of the liquid outlet portion 102 , and the liquid entering the liquid outlet portion 105 can be discharged through the liquid outlet 123 , and the liquid outlet 123 can be closed when it is not necessary to discharge the liquid.

[0074] like Figures 5 to 8 As shown, a drain port 133 is provided at the bottom of the sample preparation part 101, and the driving member 115 may be provided with a second sieve hole 118. When the slurry 400 contained between the pressing surface 151 and the sample outlet 103 is squeezed, a part of the liquid of the slurry 400 may also flow out of the drain port 133 by passing through the second sieve hole 118. In addition, the provision of the second sieve hole 118 is also conducive to maintaining the air pressure balance inside and outside the sample preparation part 101. A second filter may be provided at the second sieve hole 118 to prevent the solid in the slurry 400 from flowing out.

[0075] In some embodiments, Figure 5 As shown, when sample preparation starts or before sample preparation, the liquid outlet 102 is in close contact with the sample preparation part 101 , and the liquid outlet 102 covers the sample outlet 103 .

[0076] like Figure 6 As shown, when the slurry 400 enters the sample preparation part 101 through the feed channel 116 and is contained between the pressing surface 151 and the sample outlet 103, the liquid outlet 102 still remains in close contact with the sample preparation part 101, and the first filter element 121 can cover the sample outlet 103, so the slurry 400 is actually contained between the pressing surface 151, the sample preparation part 101 and the first filter element 121.

[0077] like Figure 6 As shown, the liquid outlet 123 of the liquid outlet part 102 is opened, and the driving member 115 is taken as a piston as an example. When the slurry 400 is contained between the pressing surface 151, the sample preparation part 101 and the first filter element 121, pressure is generated on the driving member 115, so that the driving member 115 moves toward the feed port 104.

[0078] like Figure 6 and Figure 7 As shown, in an exemplary embodiment of the present disclosure, one or more limiting protrusions 117 are provided inside the sample preparation part 101. Taking the driving member 115 as a piston as an example, the driving member 115 can abut against the limiting protrusion 117 during the movement. The sample preparation part 101 is formed with a receiving portion on the side facing the liquid outlet 102. The receiving portion is formed between the pressing portion 151 of the driving member 115 and the sample outlet surface 103, and is formed by the driving member 115 away from the liquid outlet 102. For example, the slurry 400 enters the receiving portion (such as Figure 6The medium ore pulp 400 enters the area of ​​the sample preparation part 101 located on the right side of the driving member 115) and pushes the driving member 115 to move toward the feed port 104 until the driving member 115 abuts against the limiting protrusion 117, and the driving member 115 stops moving, which means that the space between the pressing surface 151, the sample preparation part 101 and the first filter element 121 no longer increases. In this case, continuing to feed will increase the pressure of the space between the pressing surface 151, the sample preparation part 101 and the first filter element 121, so that the pressure in the liquid outlet 102 is less than the pressure on the slurry side in the sample preparation part 101, and the liquid of the slurry will flow into the interior of the liquid outlet 102 through the first filter element 121 and the first sieve hole 122. The first filter element 121 can prevent solids from passing through, and realize solid-liquid separation. The filtrate flows to the liquid outlet 102, and the filter residue remains in the sample preparation part 101.

[0079] In some embodiments, after the feeding is completed, the filtrate in the liquid outlet 102 can be discharged. The so-called feeding end judgment can be judged according to the sample amount actually required. Specifically, the feeding time can be set by time, or the feeding can be continued until the pressure of the sample preparation part 101 and the liquid outlet 102 is balanced. In some embodiments, some detection devices can be used to determine whether to stop feeding.

[0080] In some embodiments, the liquid outlet 102 may be a vacuum tank, and the liquid outlet 102 is provided with an air outlet, through which the air in the liquid outlet is extracted to form a vacuum. In some embodiments of the present disclosure, the liquid outlet 123 may be used as an air outlet, that is, vacuum is extracted through the liquid outlet 123, saving components and costs. A separate outlet for exhausting gas may also be provided to separate the extracted gas and liquid.

[0081] like Figure 8 As shown, taking the liquid outlet 102 as a vacuum tank as an example, after the filtrate in the liquid outlet 102 is discharged, the liquid outlet 102 is vacuumed. At the same time, the sample preparation part 101 can be pressurized to push the driving member 115 toward the sample outlet 103.

[0082] like Figure 8 As shown, taking the driving member 115 as a piston as an example, the sample preparation part 101 may be provided with an air inlet 119 , through which air is input into the sample preparation part 110 to push the driving member 115 to move.

[0083] Through the above operation, the pressure of the liquid part 102 can be maintained to be lower than the pressure of the slurry side of the sample preparation part 101, so that the slurry is further compressed to discharge the filtrate until the sample 300 is prepared.

[0084] In some embodiments, Figure 8As shown, when the driving member 115 is in contact with the limiting protrusion 117, the pressing surface 151 is located inside the sample preparation part 101, so that the sample 300 after sample preparation can be accommodated in the sample preparation part 101. Figure 8 , Fig.10 As shown in part A of the figure, after the sample preparation is completed, the liquid outlet 102 leaves the sample preparation part 101. Due to the structure of the sample preparation part 101 and the position design of the driving member 115, as well as the sample preparation by the sample preparation part 101 and the liquid outlet 102 in the vertical direction, the completed sample 300 is in the vertical direction and the sample 300 is kept in the sample preparation part 101 without falling. After the liquid outlet 102 leaves, the surface to be tested of the sample 300 is exposed, which is convenient for the detection device 200. In addition, there is no need to drop the material and move the sample to the detection station before detection, and the detection can be directly performed in the sample preparation part 101, which makes the detection more efficient and saves time.

[0085] In the present disclosure, the determination of whether the sample 300 is completed can be made based on the amount of sample actually required. Specifically, the vacuuming can be stopped by setting a time, or the vacuuming can be stopped by detecting whether the sample 300 is qualified.

[0086] In some embodiments, some detection devices may be used to determine whether to stop vacuuming. For example, in some embodiments, a pressure sensor may be provided in the liquid outlet 102, and the pressure sensor is used to sense the pressure in the liquid outlet 102. When the pressure sensor detects that the pressure in the liquid outlet 102 does not change within a certain period of time, it can be determined that the vacuuming is stopped.

[0087] In some embodiments of the present disclosure, the above-mentioned vacuuming of the liquid outlet 102 and ventilation of the sample preparation part 101 can be performed separately. Negative pressure can be provided to the liquid outlet 102 by a vacuum pump or other device, so that negative pressure is generated inside the vacuum tank in the liquid outlet 102, thereby extracting the liquid in the slurry; on the other hand, positive pressure can be provided to the sample preparation part 101 by a pressure pump or other device, that is, pressure is provided to the driving member 115 (such as a piston) by providing gas, so that the driving member 115 (such as a piston) squeezes the slurry 400. The negative pressure and positive pressure are controlled by the vacuum pump and the pressure pump respectively, so that the pressure on both sides can be adjusted more flexibly.

[0088] In some other exemplary embodiments of the present disclosure, the liquid outlet 102 may also be connected to the sample preparation part 101, and the air extracted from the liquid outlet 102 may be input to the sample preparation part 101. The two may be connected by a vent pipe, and an air pump may be provided on the air path of the vent pipe, and the gas may be extracted from the liquid outlet 102 (e.g., a vacuum tank) by the air pump and a negative pressure may be provided to the liquid outlet 102, and the gas may be introduced into the sample preparation part 101 from the air inlet 119 and a positive pressure may be provided to the sample preparation part 101 so that the driving member 115 (e.g., a piston) squeezes the slurry 400 to obtain the sample 300. A filtering device may be provided on one side of the vent pipe close to the liquid outlet 102 to prevent impurities from entering the vent pipe. On the other hand, in the present embodiment, the liquid outlet 102 may be independently provided with an air outlet, and the air outlet may be located at the top of the liquid outlet 102, and be connected to the vent pipe to prevent liquid from entering the vent pipe. Such a setting is conducive to saving gas source and thus reducing costs. Moreover, by adopting this method, only one pipeline is needed to connect the sample preparation part 101 and the liquid outlet part 102, so that the grade analysis device can be miniaturized and space can be saved. In addition, by adopting this method, when the vacuum pumping is stopped, the air input into the sample preparation part 101 can be stopped at the same time, which reduces the operation steps and makes the operation simpler.

[0089] In the present disclosure, after the preparation of the sample 300 is completed, the detection device 200 can detect the surface to be detected of the sample 300. As mentioned above, the grade analysis device 10 can also include a sample analysis device, which detects the surface to be detected of the prepared sample 300. If the sample 300 is qualified, the detection device 200 is controlled to perform the detection. If the sample 300 is unqualified, the sample preparation device 100 is controlled to remove the sample and prepare the sample again until the sample is qualified and then the detection device is used for detection. The unqualified position on the surface of the sample 300 can also be determined by the sample analysis device, so that the detection device 200 avoids the unqualified position during detection.

[0090] In an exemplary embodiment of the present disclosure, the detection device is configured to detect along a preset path. Fig. 9 9 is a schematic diagram of a detection path according to another exemplary embodiment of the present disclosure, and the preset path may be a path extending spirally outward from the center of the sample 300. By setting the detection path to be spiral from the inside to the outside, it is possible to ensure that the detection position is in the surface area of ​​the sample 300, and avoid the detection position from deviating to the outside of the sample 300, resulting in inaccurate detection results. Compared with a detection path in which a straight line moves back and forth multiple times, the situation in which the detection position of the detection device 200 is outside the sample 300 can be reduced, making the detection result more reliable. As previously mentioned, in some embodiments, if the surface to be tested detected by the sample analysis device is partially unqualified, for example, there are depressions, protrusions, defects, etc. in some positions, the detection device 200 can be controlled to avoid these unqualified positions to avoid interference with the detection results, thereby improving the accuracy of the detection.

[0091] In the present disclosure, the sample analysis device may be a laser rangefinder, which determines the preparation status of the surface to be tested of the sample 300 by laser rangefinder.

[0092] In the present disclosure, the sample analysis device may include a depth of field camera and a three-dimensional radar, through which the preparation condition of the test surface of the sample 300 can be better obtained and determined.

[0093] In the present disclosure, a spiral detection path is adopted, which is conducive to comprehensive and uniform detection of the sample 300, improves detection efficiency, and can also obtain more accurate detection results.

[0094] In the present disclosure, the preset path may not pass through the edge of the sample 300, or may be set so that the sampling at the edge of the sample 300 is not detected, or may be set so that the sampling result at the edge of the sample 300 is not referenced. The edge of the sample 300 generally has problems such as defects and unevenness, or due to deviations in operation or detection devices, the outermost side of the path is not actually effectively sampled. The aforementioned settings can avoid the problem of incorrect detection data being counted in this case, resulting in deviations in the detection results. Through such settings, the accuracy of the detection results can be further improved.

[0095] In this disclosure, Figures 1 to 4 As shown, the grade analysis device 10 may include a moving device, which may include a lifting device 302 and a translation device 301. The lifting device 302 and the translation device 301 may be movably connected, and the lifting device 302 may be connected to the detection device 200. The detection device 200 may move in at least two directions under the action of the lifting device 302 and the translation device 301.

[0096] Fig.10 is a schematic diagram of a detection device detecting a sample 300 according to another exemplary embodiment of the present disclosure, as shown in FIG. Fig.10 As shown in part A, after the preparation of the sample 300 is completed, the liquid outlet part 102 is separated from the sample preparation part 101, the surface of the sample 300 to be tested is exposed through the sample outlet, and the sample 300 is kept in the sample preparation part 101. There is no need to move the position of the sample 300. After the test is completed, the detection device 200 moves to other samples 300 for testing, thereby achieving efficient testing.

[0097] like Fig.10 As shown in parts B and C in the figure, after the detection is completed, air can be input into the sample preparation part 101 to push the driving member 115 to move toward the sample outlet 103, and the sample 300 is pushed out of the sample preparation part 101 to achieve fast and efficient material discharge.

[0098] In an exemplary embodiment of the present disclosure, the grade analysis device 10 may include a cleaning device, which is configured to inject water into the drain port 133 and the liquid outlet 123 after sample preparation is completed to clean the sample preparation device 100. By injecting water into the drain port 133 and the liquid outlet 123, clean water can flow through the first sieve hole 122 and the second sieve hole 118 in reverse, cleaning the first filter element 121 and the second filter element.

[0099] The cleaning step disclosed in the present invention, on the one hand, can prevent the previous sample 300 from interfering with the next sample 300 detection through cleaning, thereby improving the accuracy of the detection result. On the other hand, through cleaning, it is possible to avoid replacing the filter element, saving costs. In addition, the multiple sample preparation devices disclosed in the present invention can prepare samples asynchronously, and the detection device can also detect asynchronously. When not being detected, the sample preparation device can be cleaned, which will not increase the extra cleaning time and will not affect the detection process. In a true sense, process-based detection is realized and detection efficiency is improved.

[0100] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure.

[0101] Based on the same or similar concept, the present disclosure also provides a grade analysis method, which can be applied to the grade analysis device described in the above embodiment, and the device is not described in detail here. The grade analysis device may include a controller or a control module, etc., for controlling the various components of the grade analysis device to implement the analysis method described below.

[0102] Fig.11 is a schematic diagram of a grade analysis method according to another exemplary embodiment of the present disclosure, such as Fig.11 As shown, the grade analysis method disclosed in the present invention may include the following steps:

[0103] S11: A plurality of sample preparation devices prepare samples in a predetermined sequence, wherein the predetermined sequence of the plurality of sample preparation devices may be different sequences.

[0104] It should be pointed out that the different timings include that the multiple sample preparation devices are completely out of sync with each other, and also include that some of the multiple sample preparation devices prepare samples synchronously while the other sample preparation devices prepare samples asynchronously.

[0105] S12: The detection device detects the prepared sample. Based on the asynchronous sample preparation in the previous step, the detection device can detect the prepared sample, while other sample preparation devices continue to prepare samples, which can realize the detection process and improve the detection efficiency.

[0106] In the present disclosure, a plurality of sample preparation devices are arranged side by side, and the sample outlets of the plurality of sample preparation devices are aligned. Fig.12is a schematic diagram of a grade analysis method according to another exemplary embodiment of the present disclosure, such as Fig.12 As shown, the present disclosure also provides a grade analysis method, which may include the following steps:

[0107] S21: Multiple sample preparation devices prepare samples in sequence at predetermined intervals. Among them, multiple sample preparation devices can be arranged side by side, and the sample outlets of multiple sample preparation devices can be flush. Such an arrangement facilitates the detection device to move to the corresponding sample preparation device for detection. For example, when four sample preparation devices are arranged side by side, it can be set that multiple sample preparation devices enter the sample preparation step at certain intervals along one direction. Such an arrangement can make the time for the preparation of multiple samples also be spaced by a corresponding time. For example, in some embodiments, it can be set that multiple sample preparation devices prepare samples at intervals of the time required for detection, that is, after the detection of one sample is completed, the preparation of the next sample is just completed and can enter the detection.

[0108] S22: The detection device detects the prepared sample.

[0109] Fig.13 is a schematic diagram of a grade analysis method according to another exemplary embodiment of the present disclosure, such as Fig.13 As shown, the present disclosure also provides a grade analysis method, which may include the following steps:

[0110] S31: When some of the multiple sample preparation devices prepare samples at different time sequences, other sample preparation devices in the multiple sample preparation devices are cleaned. Such a setting, on the one hand, can prevent the previous sample from interfering with the next sample detection through cleaning, thereby improving the accuracy of the detection result. On the other hand, through cleaning, it is possible to avoid replacing the filter element, saving costs. In addition, the multiple sample preparation devices disclosed in the present invention prepare samples asynchronously, and the detection device can also detect asynchronously. When not being detected, the sample preparation device can be cleaned, which does not increase the extra cleaning time and does not affect the detection process. It truly realizes process-based detection and improves detection efficiency.

[0111] S32: The detection device detects the prepared sample.

[0112] Fig.14 is a schematic diagram of a grade analysis method according to another exemplary embodiment of the present disclosure, such as Fig.14 As shown, the present disclosure also provides a grade analysis method, which may include the following steps:

[0113] S41: multiple sample preparation devices prepare samples in a predetermined time sequence, wherein the predetermined time sequences of the multiple sample preparation devices may be different time sequences;

[0114] S42: Obtaining the flatness of the surface to be tested of the sample;

[0115] S43: According to the flatness of the surface to be tested of the sample being qualified, the detection device detects the sample along a predetermined path, and according to the flatness of the surface to be tested of the sample being partially unqualified, the detection path of the detection device is adjusted to avoid the unqualified area. In some embodiments, if the detected surface to be tested is partially unqualified, for example, there are depressions, protrusions, defects, etc. in some positions, the detection device can be controlled to avoid these unqualified positions to avoid interference with the detection results, thereby improving the accuracy of the detection.

[0116] Fig.15 It is a schematic flow chart of a grade analysis method according to another exemplary embodiment of the present disclosure.

[0117] The present disclosure also provides a grade analysis method, which may include the following steps:

[0118] S51: multiple sample preparation devices prepare samples in a predetermined time sequence, wherein the predetermined time sequences of the multiple sample preparation devices may be different time sequences;

[0119] S52: The detection device detects the prepared samples in a predetermined order, wherein the predetermined order corresponds to a predetermined timing. The so-called predetermined order corresponds to a predetermined timing. Specifically, for example, according to the timing of multiple sample preparation devices, the first sample preparation device completes sample preparation, the second sample preparation device completes sample preparation in the second place, the third sample preparation device completes sample preparation in the third place, and the fourth sample preparation device completes sample preparation in the fourth place. Then, the detection predetermined order of the detection device is to detect the sample prepared by the first sample preparation device, the sample prepared by the second sample preparation device, the sample prepared by the third sample preparation device, and the sample prepared by the fourth sample preparation device in sequence. Such a setting enables multiple sample preparation devices to prepare samples in different timings, and the detection device detects the prepared samples in sequence, while other sample preparation devices can perform other operations, thus realizing the detection process to the greatest extent.

[0120] It should be pointed out that in the present disclosure, there are various hardware and software for implementing the corresponding functions in the aforementioned embodiments. These hardware and software may be common hardware and software in the technical field and will not be described in detail here.

[0121] It should be noted that in order to simplify the description disclosed in this application and thus help understand one or more application embodiments, in the foregoing description of the embodiments of this application, multiple features are sometimes merged into one embodiment, drawing or description thereof. However, this disclosure method does not mean that the features required by the object of this application are more than the features mentioned in the claims. In fact, the features of the embodiment are less than all the features of the single embodiment disclosed above. The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is only an example and does not constitute a limitation of this application. Although it is not explicitly stated here, those skilled in the art may make various modifications, improvements and corrections to this application. Such modifications, improvements and corrections are suggested in this application, so such modifications, improvements and corrections still belong to the spirit and scope of the embodiments of this application.

Claims

1. A grade analysis device, wherein: include: A plurality of sample preparation devices, wherein the plurality of sample preparation devices are configured to prepare samples respectively in different time sequences, the sample preparation devices comprising a feed port and a sample outlet, and the surface to be tested of the sample prepared by the sample preparation device is exposed through the sample outlet; as well as A detection device, wherein the detection device is movably arranged to be moved to a position opposite to the sample outlet to detect the prepared sample; Wherein, the sample preparation device comprises a sample preparation part and a liquid outlet part, the feed port and the sample outlet are respectively located at two ends of the sample preparation part, the liquid outlet part is arranged opposite to the sample outlet and covers the sample outlet during the sample preparation process, and the liquid outlet part and the sample preparation part are arranged to be separable so as to be away from the sample preparation part after the sample preparation is completed so that the sample outlet is exposed.

2. The grade analysis device according to claim 1, wherein: A plurality of the sample preparation devices are connected to the same pipeline.

3. The grade analysis device according to claim 1, wherein: A plurality of the sample preparation devices are connected to different pipelines.

4. The grade analysis device according to claim 1, wherein: The sample preparation device comprises: A driving member, comprising a pressing surface, wherein the driving member is configured to be movable within the sample preparation portion; and A feed channel, wherein the feed channel runs through the driving member, and an outlet of the feed channel is located on the pressing surface. A first filter is provided on one side of the liquid outlet portion facing the sample preparation portion, the slurry is accommodated between the pressing surface and the sample outlet through the feed channel, and the driving member moves toward the sample outlet to squeeze the slurry, so that the liquid in the slurry passes through the first filter and enters the liquid outlet portion.

5. The grade analysis device according to claim 4, wherein: The liquid outlet is a vacuum tank, and the liquid outlet is provided with an air outlet, through which the air in the liquid outlet is extracted to form a vacuum; The sample preparation part is provided with an air inlet, through which air is input into the sample preparation part to drive the driving member to move.

6. The grade analysis device according to claim 5, wherein: The liquid outlet is communicated with the sample preparation part, and the air extracted from the liquid outlet is input into the sample preparation part.

7. The grade analysis device according to claim 4, wherein: A drain port is provided at the bottom of the sample preparation part; The bottom of the liquid outlet is provided with a liquid outlet.

8. The grade analysis device according to claim 4, wherein: The size of the pressing surface is matched with the inner diameter of the sample preparation part.

9. The grade analysis device according to claim 4, wherein: One or more limiting protrusions are arranged inside the sample preparation part, and a receiving part is formed on the side of the sample preparation part facing the liquid outlet part, wherein the slurry enters the receiving part through the feed channel and pushes the driving member to move toward the feed port until the driving member abuts against the limiting protrusion.

10. The grade analysis device according to claim 4, wherein: The pressing surface is provided with a second sieve hole, and the second sieve hole is provided with a second filter element.

11. The grade analysis device according to claim 1, wherein: The detection device is configured to detect along a preset path, wherein the preset path is a path extending spirally outward from the center of the sample.

12. The grade analysis device according to claim 1, wherein: The plurality of sample preparation devices are arranged side by side, and the sample outlets of the plurality of sample preparation devices are aligned.

13. The grade analysis device according to claim 4, wherein: The driving member is a piston, a cylinder or a motor.

14. The grade analysis device according to claim 7, wherein: The grade analysis device comprises a cleaning device, and the cleaning device is configured to inject water into the drain port and the liquid outlet to clean the sample preparation device after sample preparation is completed.

15. The grade analysis device according to claim 5, wherein: The liquid outlet is provided with a pressure sensor, and the pressure sensor is used to sense the pressure in the liquid outlet.

16. The grade analysis device according to claim 5, wherein: The grade analysis device comprises a sample analysis device, and the sample analysis device is used to detect the surface of the prepared sample exposed by the sample outlet.

17. A method for grade analysis, wherein: The grade analysis method is used for the grade analysis device according to any one of claims 1 to 16, and the method comprises: The plurality of sample preparation devices prepare samples in a predetermined time sequence, wherein the predetermined time sequences of the plurality of sample preparation devices are different; The detection device detects the prepared sample.

18. The grade analysis method according to claim 17, wherein: A plurality of the sample preparation devices are arranged side by side, and the sample outlets of the plurality of the sample preparation devices are aligned, and the plurality of the sample preparation devices prepare samples in a predetermined time sequence, including: The plurality of sample preparation devices prepare samples in sequence at predetermined intervals.

19. The grade analysis method according to claim 17, wherein: The plurality of sample preparation devices prepare samples in a predetermined time sequence, including: When some of the plurality of sample preparation devices prepare samples at different timings, other of the plurality of sample preparation devices are cleaned.

20. The grade analysis method according to claim 17, wherein: The detection device detects the prepared sample, including: Obtaining the flatness of the surface to be tested of the sample; According to the flatness of the surface to be tested of the sample being qualified, the detection device detects the sample along a predetermined path; According to the flatness of the surface to be tested of the sample being partially unqualified, the detection path of the detection device is adjusted to avoid the unqualified area.

21. The grade analysis method according to claim 17, wherein: The detection device detects the prepared sample, including: The detection device detects the prepared samples in a predetermined sequence, wherein the predetermined sequence corresponds to the predetermined time sequence.

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