Automatic closed-loop test reverse method and system for smart internet of things terminal

Abstract

The application provides an automatic closed-loop testing method and system for an intelligent Internet of Things terminal, the method comprising: obtaining device information of the intelligent Internet of Things terminal to be tested, opening testing control software, generating and sending a first testing instruction to a testing bench controller; decomposing the first testing instruction to obtain a first decomposition instruction; collecting first running data of the intelligent Internet of Things terminal during running by the testing control software, and collecting second running data during running after the intelligent Internet of Things terminal runs for a preset time; sending a second testing instruction to the testing bench controller by the testing control software; decomposing the second testing instruction to obtain a second decomposition instruction, and turning off auxiliary equipment and the intelligent Internet of Things terminal according to the second decomposition instruction; and analyzing the first running data and the second running data by the testing control software to obtain a testing result. The application improves the efficiency and accuracy of testing the intelligent Internet of Things terminal.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of Internet of Things device testing, and particularly relates to an automatic closed-loop test method and system for intelligent Internet of Things terminals. BACKGROUND

[0002] Automatic closed-loop testing, also known as "one-key testing", refers to that after the test content is selected and the test case configuration is completed in the early stage, a start test command is issued in the test control system, the entire test process is automatically completed, and the test result can be automatically reported without pausing or human intervention in the middle process.

[0003] The existing intelligent Internet of Things terminal testing needs to be tested manually, which has the disadvantages of low efficiency, high error rate, and low automatic testing level. Therefore, it is necessary to invent an automatic closed-loop test method for intelligent Internet of Things terminals. SUMMARY

[0004] In view of the above-mentioned shortcomings of the prior art, the purpose of the present application is to provide an automatic closed-loop test method and system for intelligent Internet of Things terminals, which is used to solve the problem of low test efficiency of power distribution network intelligent Internet of Things terminals in the prior art.

[0005] To achieve the above-mentioned purposes and other related purposes, the present application provides an automatic closed-loop test method for intelligent Internet of Things terminals, comprising the following steps:

[0006] Obtaining the device information of the intelligent Internet of Things terminal to be tested, opening the test control software, and generating and sending a first test instruction to the test bench controller according to the device information;

[0007] After the test bench controller receives the first test instruction, the first test instruction is decomposed to obtain a first decomposition instruction, the corresponding auxiliary equipment is controlled to run according to the first decomposition instruction, and the intelligent Internet of Things terminal is remotely controlled to run;

[0008] The test control software collects the first running data in the running process of the intelligent Internet of Things terminal, and collects the second running data in the running process after the intelligent Internet of Things terminal runs for a preset time;

[0009] The test control software sends a second test instruction to the test bench controller, and the second test instruction is a test end instruction;

[0010] After the test bench controller receives the second test instruction, the second test instruction is decomposed to obtain a second decomposition instruction, and the auxiliary equipment and the intelligent Internet of Things terminal are turned off according to the second decomposition instruction;

[0011] The first operation data and the second operation data are analyzed by the test control software to obtain a test result.

[0012] In an embodiment of the present application, the sending of the first test instruction to the test bench controller according to the device information comprises:

[0013] determining test contents to be configured according to the device information, selecting a test item, a simulated fault type corresponding to the test item, a state sequence, a time parameter and a switching value parameter according to the test contents;

[0014] generating the first test instruction according to the test item, the state sequence, the time parameter and the switching value parameter and sending the first test instruction to the test bench controller;

[0015] The test item comprises protection setting value verification, protection function test and performance test, the simulated fault type corresponding to the test item comprises single-phase ground short circuit, two-phase short circuit and three-phase short circuit, the state sequence comprises current state sequence, voltage state sequence and fault state sequence, the time parameter comprises pre-fault time, maximum fault time, post-trigger delay and step change time, and the switching value parameter comprises switching value input trigger logic and pre-fault switching value output state.

[0016] In an embodiment of the present application, the first test instruction corresponds to the test item, the state sequence, the time parameter and the switching value parameter set.

[0017] In an embodiment of the present application, the first decomposition instruction comprises a parameter control command and waveform setting information, and the running of the corresponding auxiliary device is controlled and the smart Internet of Things terminal is remotely controlled to run according to the first decomposition instruction, which comprises:

[0018] The host computer acquires the parameter control command and the waveform setting information according to the first decomposition instruction, and sends the parameter control command and the waveform setting information to the lower computer through serial communication;

[0019] The lower computer calculates a digital waveform after the waveform setting information and the Fourier algorithm, and outputs the digital waveform;

[0020] The digital waveform is converted into an analog signal through a digital-to-analog conversion circuit, and the analog signal is amplified through an amplification circuit to obtain a target current signal and a target voltage signal required for actual testing;

[0021] The target current signal and the target voltage signal are generated by a test bench power source and input to the smart Internet of Things terminal, and the smart Internet of Things terminal is started to run through the test control software.

[0022] In an embodiment of the present application, the collecting, by the test control software, of the first running data during running of the smart Internet of Things terminal comprises:

[0023] continuously collecting the first running data during running of the smart Internet of Things terminal within a preset data waiting time;

[0024] continuously comparing the first running data with preset judgment data during the collecting, wherein the preset judgment data is set by the test control software according to the first test instruction and the device information;

[0025] when the type and quantity of the first running data collected within the data waiting time are both correct in comparison with the preset judgment data, it is determined that the collecting of the first running data is completed;

[0026] otherwise, the first running data is re-collected.

[0027] In an embodiment of the present application, the first running data and the second running data both comprise telemetry data and telesign data, and the analyzing, by the test control software, of the first running data and the second running data to obtain a test result comprises:

[0028] calculating first average data of the telemetry data in the first running data and the telemetry data in the second running data, and calculating second average data of the telesign data in the first running data and the telesign data in the second running data;

[0029] calculating a telemetry result according to the first average data, and calculating a telesign result according to the second average data;

[0030] generating a test report according to the telemetry result and the telesign result.

[0031] In an embodiment of the present application, the calculating of the telemetry result according to the first average data comprises:

[0032] calculating an absolute value of a difference between the first average data and a first set value in the test control software;

[0033] calculating a ratio between the absolute value of the difference and a corresponding telemetry rated value in the smart Internet of Things terminal to obtain an error rate;

[0034] when the error rate is within a preset error range, it is determined that the telemetry result of the smart Internet of Things terminal is qualified, otherwise the telemetry result is unqualified.

[0035] In an embodiment of the present application, the calculating of the telesign result according to the second average data comprises:

[0036] matching the telemetering signal points and telemetering values in each of the second average data with telemetering signal points and telemetering values;

[0037] comparing the telemetering signal points and telemetering values received by each state with corresponding set values, if consistent, the intelligent Internet of Things terminal telemetering test is qualified, otherwise unqualified.

[0038] In an embodiment of the present application, the test report is generated according to the telemetering result and the telemetering result, comprising:

[0039] filling the telemetering result and the telemetering result into a test report template and generating the test report.

[0040] The present application also provides an automatic closed-loop test system for an intelligent Internet of Things terminal, comprising:

[0041] The first sending module is configured to obtain device information of the intelligent Internet of Things terminal to be tested, open a test control software, and generate and send a first test instruction to a test bench controller according to the device information.

[0042] The first test module is configured to decompose the first test instruction to obtain a first decomposition instruction after the test bench controller receives the first test instruction, control corresponding auxiliary equipment to run according to the first decomposition instruction, and remotely control the intelligent Internet of Things terminal to run.

[0043] The data acquisition module is configured to acquire first running data in the running process of the intelligent Internet of Things terminal through the test control software, and acquire second running data in the running process after the intelligent Internet of Things terminal runs for a preset time.

[0044] The second sending module is configured to send a second test instruction to the test bench controller through the test control software, wherein the second test instruction is a test end instruction.

[0045] The closing module is configured to decompose the second test instruction to obtain a second decomposition instruction after the test bench controller receives the second test instruction, and close the auxiliary equipment and the intelligent Internet of Things terminal according to the second decomposition instruction.

[0046] The analysis module is configured to analyze the first running data and the second running data through the test control software to obtain a test result.

[0047] As described above, the automatic closed-loop test method and system for the intelligent Internet of Things terminal have the following beneficial effects:

[0048] The application obtains the equipment information of the intelligent Internet of Things terminal, and automatically generates a first test instruction according to the equipment information, so as to facilitate automatic testing of the intelligent Internet of Things terminal through the first test instruction, and to obtain accurate test results through comprehensive analysis of the first running data and the second running data in the running process in the testing process, thereby improving the efficiency and accuracy of the intelligent Internet of Things terminal testing, reducing the detection workload, and effectively solving the problem of low efficiency of manual item-by-item testing. BRIEF DESCRIPTION OF DRAWINGS

[0049] Figure 1 A flowchart of an automatic closed-loop testing method of an intelligent Internet of Things terminal of the application is shown.

[0050] Figure 2 A structural block diagram of an automatic closed-loop testing system of an intelligent Internet of Things terminal of the application is shown. DETAILED DESCRIPTION

[0051] The embodiments of the application are described below through specific specific embodiments, and those skilled in the art can easily understand other advantages and effects of the application from the disclosure of the specification. The application can also be implemented or applied by different specific embodiments, and the details in the specification can be modified or changed based on different views and applications without departing from the spirit of the application. It should be noted that the following examples and features in the examples can be combined with each other without conflict.

[0052] It should be noted that the diagrams provided in the following examples only schematically illustrate the basic concept of the application, and only show the components related to the application in the diagrams, not the number, shape and size of the components when actually implemented. The actual implementation of each component may be a random change in shape, number and proportion, and the layout pattern of the components may be more complex.

[0053] The application obtains the equipment information of the intelligent Internet of Things terminal, and automatically generates a first test instruction according to the equipment information, so as to facilitate automatic testing of the intelligent Internet of Things terminal through the first test instruction, and to obtain accurate test results through comprehensive analysis of the first running data and the second running data in the running process in the testing process, thereby improving the efficiency and accuracy of the intelligent Internet of Things terminal testing, reducing the detection workload, and effectively solving the problem of low efficiency of manual item-by-item testing.

[0054] As shown in Figure 1 In one embodiment, the application discloses an automatic closed-loop testing method of an intelligent Internet of Things terminal, comprising the following steps:

[0055] S101, obtain the device information of the smart Internet of Things terminal to be tested, open the test control software, and generate and send a first test instruction to a test bench controller according to the device information.

[0056] In the embodiment, the device information of the smart Internet of Things terminal to be tested is first obtained to determine the type and parameters of the smart Internet of Things terminal, thereby facilitating the generation of the first test instruction matched therewith and ensuring the accuracy of the test result.

[0057] In some embodiments, the sending of the first test instruction to the test bench controller according to the device information comprises:

[0058] determining the test content to be configured according to the device information, selecting a test item, a simulated fault type corresponding to the test item, a state sequence, a time parameter, and a switching quantity parameter according to the test content;

[0059] generating the first test instruction according to the test item, the state sequence, the time parameter, and the switching quantity parameter and sending the first test instruction to the test bench controller;

[0060] The test item comprises a protection setting value check, a protection function test, and a performance test, the simulated fault type corresponding to the test item comprises a single-phase ground short circuit, a two-phase short circuit, and a three-phase short circuit, the state sequence comprises a current state sequence, a voltage state sequence, and a fault state sequence, the time parameter comprises a pre-fault time, a maximum fault time, a post-trigger delay, and a step change time, and the switching quantity parameter comprises a switching quantity input trigger logic and a pre-fault switching quantity output state.

[0061] In the embodiment, when the device information of the smart Internet of Things terminal to be tested is obtained, the test content to be configured can be determined according to the device information, and the corresponding test item, the simulated fault type corresponding to the test item, the state sequence, the time parameter, and the switching quantity parameter can be selected according to the test content. The test item comprises a protection setting value check, a protection function test, and a performance test, the simulated fault type corresponding to the test item comprises a single-phase ground short circuit, a two-phase short circuit, and a three-phase short circuit, the state sequence comprises a current state sequence, a voltage state sequence, and a fault state sequence, the time parameter comprises a pre-fault time, a maximum fault time, a post-trigger delay, and a step change time, and the switching quantity parameter comprises a switching quantity input trigger logic and a pre-fault switching quantity output state. After the selection of the test item, the simulated fault type corresponding to the test item, the state sequence, the time parameter, and the switching quantity parameter is completed, the first test instruction can be generated according to the selected content and sent to the test bench controller, thereby facilitating the test of the smart Internet of Things device by the test bench controller according to the first test instruction.

[0062] Further, the first test instruction corresponds to the test item, the state sequence, the time parameter and the switch value parameter set.

[0063] S102, after the test bench controller receives the first test instruction, the first test instruction is decomposed to obtain a first decomposition instruction, and the corresponding auxiliary equipment is controlled to run according to the first decomposition instruction, and the smart Internet of Things terminal is remotely controlled to run.

[0064] In some embodiments, the first decomposition instruction includes parameter control commands and waveform setting information, and the corresponding auxiliary equipment is controlled to run according to the first decomposition instruction, and the smart Internet of Things terminal is remotely controlled to run, including:

[0065] The host computer obtains the parameter control commands and the waveform setting information according to the first decomposition instruction, and sends the parameter control commands and the waveform setting information to the lower computer through serial communication;

[0066] The lower computer calculates a digital waveform according to the waveform setting information and the Fourier algorithm, and outputs the digital waveform;

[0067] The digital waveform is converted into an analog signal through a digital-to-analog conversion circuit, and the analog signal is amplified through an amplification circuit to obtain a target current signal and a target voltage signal required for actual testing;

[0068] The target current signal and the target voltage signal are generated by the test bench power source and input to the smart Internet of Things terminal, and the smart Internet of Things terminal is started to run through the test control software.

[0069] In this embodiment, the first decomposition instruction includes parameter control commands and waveform setting information, and the parameter control commands and the waveform setting information correspond to the test item, the state sequence, the time parameter and the switch value parameter set, and then the host computer sends the parameter control commands and the waveform setting information to the lower computer through serial communication, and the lower computer calculates a digital waveform according to the waveform setting information and the Fourier algorithm, and sends address information to the CPLD device on the signal conversion board to decode and select the corresponding chip, and outputs the digital waveform. The digital waveform signal generated by the lower computer is processed through DA conversion, filtering and isolation by the digital-to-analog conversion circuit of the signal conversion board to obtain an analog signal, and the analog signal is amplified through an amplification circuit to obtain a target current signal and a target voltage signal required for actual testing. Then the test bench power source generates the target current signal and the target voltage signal corresponding to the smart Internet of Things terminal, so as to start the smart Internet of Things terminal to run through the test control software for testing.

[0070] S103, collecting first running data in the process of running of the smart Internet of Things terminal by the test control software, and collecting second running data in the process of running after the smart Internet of Things terminal runs for a preset time.

[0071] In some embodiments, the collecting first running data in the process of running of the smart Internet of Things terminal by the test control software comprises:

[0072] continuously collecting the first running data in the process of running of the smart Internet of Things terminal within a preset data waiting time;

[0073] continuously comparing the first running data with preset judgment data in the process of collecting, wherein the preset judgment data is set by the test control software according to the first test instruction and the equipment information;

[0074] when the type and quantity of the first running data collected within the data waiting time are both correct compared with the preset judgment data, it is determined that the collection of the first running data is completed;

[0075] otherwise, the first running data is collected again.

[0076] In this embodiment, in the process of collecting the first running data, in order to ensure the integrity of the first running data, the first running data is continuously compared with the preset judgment data in the process of collecting, so that the first running data is continuously compared with the type and quantity of the preset judgment data within the data waiting time, and when the comparison is correct, it is determined that the collection of the first running data is completed, otherwise the first running data is collected again, thereby effectively ensuring the integrity of the collected first running data.

[0077] Similarly, the collection process of the second running data is the same as that of the first running data, which will not be described here. The first running data and the second running data are collected respectively to ensure the accuracy of the subsequent collection results.

[0078] S104, sending a second test instruction to the test bench controller by the test control software, the second test instruction being a test end instruction.

[0079] After sending the first test instruction, the same second test instruction is sent to the test bench controller to end the test after the test is completed.

[0080] S105, after the test bench controller receives the second test instruction, decomposing the second test instruction to obtain a second decomposition instruction, and closing the auxiliary equipment and the smart Internet of Things terminal according to the second decomposition instruction.

[0081] The test bench controller decomposes the second test instruction into second decomposition instructions after receiving the second test instruction, so as to turn off the auxiliary equipment and the smart Internet of Things terminal, that is, the test bench power supply and the smart Internet of Things terminal according to the second decomposition instructions,

[0082] S106, analyzing the first operation data and the second operation data by the test control software to obtain a test result.

[0083] In some other embodiments, the first operation data and the second operation data both include telemetry data and telesign data, and the analyzing the first operation data and the second operation data by the test control software to obtain a test result includes:

[0084] calculating a first average data of the telemetry data in the first operation data and the telemetry data in the second operation data, and calculating a second average data of the telesign data in the first operation data and the telesign data in the second operation data;

[0085] calculating a telemetry result according to the first average data, and calculating a telesign result according to the second average data;

[0086] generating a test report according to the telemetry result and the telesign result.

[0087] In the embodiment, since the first operation data and the second operation data both include telemetry data and telesign data, a first average data of the telemetry data in the first operation data and the second operation data is calculated, and a second average data of the telesign data in the first operation data and the second operation data is calculated, so as to respectively obtain a telemetry result and a telesign result, and generate a test report according to the telemetry result and the telesign result.

[0088] In some embodiments, the calculating a telemetry result according to the first average data includes:

[0089] calculating an absolute value of a difference between the first average data and a first set value in the test control software;

[0090] calculating a ratio between the absolute value of the difference and a corresponding telemetry rated value in the smart Internet of Things terminal to obtain an error rate;

[0091] when the error rate is within a preset error range, determining that the telemetry result of the smart Internet of Things terminal is qualified, otherwise the telemetry result is unqualified.

[0092] By calculating an absolute value of a difference between the first average data and a first set value, an error rate is obtained according to a ratio between the absolute value of the difference and a telemetry rated value, when the error rate is within a preset error range, it is determined that the telemetry result of the smart Internet of Things terminal is qualified, otherwise the telemetry result is unqualified, so that the analysis process of the telemetry result is quickly completed.

[0093] In yet some embodiments, the calculating the telesign result according to the second average data comprises:

[0094] matching the telesign signal in each of the second average data with a telesign point and a telesign value;

[0095] comparing whether the telesign point and the telesign value received by each state are consistent with corresponding set values, if yes, the intelligent Internet of Things terminal telesign test is qualified, otherwise, it is unqualified.

[0096] Specifically, each state sequence is matched with a telesign point and a telesign value, and whether the telesign point and the telesign value received by each state are consistent with corresponding set values is compared. If yes, it is determined to be qualified, otherwise, it is determined to be unqualified and needs to be retested.

[0097] In some embodiments, the generating a test report according to the telemetering result and the telesign result comprises:

[0098] filling the telemetering result and the telesign result into a test report template and generating the test report.

[0099] Since the test report template is generally a preset template, only the telemetering result and the telesign result are filled in to complete the final test process.

[0100] It should be noted that the protection scope of the automatic closed-loop test method of the intelligent Internet of Things terminal is not limited to the execution order of the steps listed in the embodiments, and any scheme realized by adding, replacing or replacing steps of the prior art according to the principle of the present application is included in the protection scope of the present application.

[0101] As shown in FIG. 1, Figure 2 In an embodiment, the present application further provides an automatic closed-loop test system of an intelligent Internet of Things terminal, which comprises:

[0102] a first sending module 201 for acquiring device information of an intelligent Internet of Things terminal to be tested, opening a test control software, and generating and sending a first test instruction to a test bench controller according to the device information;

[0103] a first test module 202 for decomposing the first test instruction to obtain a first decomposition instruction after the test bench controller receives the first test instruction, respectively controlling corresponding auxiliary devices to run according to the first decomposition instruction, and remotely controlling the intelligent Internet of Things terminal to run;

[0104] The data collection module 203 is configured to collect first running data of the smart Internet of Things terminal during running by the test control software, and collect second running data during running after the smart Internet of Things terminal runs for a preset time.

[0105] The second sending module 204 is configured to send a second test instruction to the test bench controller by the test control software, the second test instruction being a test end instruction.

[0106] The closing module 205 is configured to decompose the second test instruction to obtain a second decomposition instruction after the test bench controller receives the second test instruction, and close the auxiliary equipment and the smart Internet of Things terminal according to the second decomposition instruction.

[0107] The analysis module 206 is configured to analyze the first running data and the second running data by the test control software to obtain a test result.

[0108] It should be noted that the structure and principle of the automatic closed-loop test system of the smart Internet of Things terminal correspond to the steps of the above-described automatic closed-loop test method of the smart Internet of Things terminal one by one, and therefore will not be described here.

[0109] It should be noted that the division of each module of the above system is only a logical functional division, and all or part of the modules can be integrated into one physical entity, or can be physically separated. Moreover, the modules can all be implemented in the form of software called by a processing element; or all be implemented in the form of hardware; or part of the modules are implemented in the form of software called by a processing element, and part of the modules are implemented in the form of hardware. For example, the x module can be a separately established processing element, or can be integrated in a chip of the above system, in addition, the x module can also be stored in the form of program code in the memory of the above system, and the function of the x module is called and executed by a processing element of the above system. The implementation of other modules is similar. Moreover, all or part of the modules can be integrated together, or can be independently implemented. The processing element described herein can be an integrated circuit having a signal processing capability. In the implementation process, each step of the above method or each module can be completed by an integrated logic circuit of hardware or an instruction in the form of software in the processing element.

[0110] For example, the above modules can be one or more integrated circuits configured to implement the above methods, such as one or more Application Specific Integrated Circuits (ASICs), or one or more Digital Signal Processors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs), etc. For another example, when a certain module above is implemented in the form of a processing element scheduling code, the processing element can be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor that can invoke program code. For another example, the modules can be integrated together to implement in the form of a System-On-a-Chip (SOC).

[0111] It should be noted that the automatic closed-loop test system of the intelligent Internet of Things terminal of the present application can implement the automatic closed-loop test method of the intelligent Internet of Things terminal of the present application, but the implementation device of the automatic closed-loop test method of the intelligent Internet of Things terminal of the present application includes but is not limited to the structure of the automatic closed-loop test system of the intelligent Internet of Things terminal listed in the present embodiment, and any modification and replacement of the structure of the prior art according to the principle of the present application is included in the protection scope of the present application.

[0112] In summary, the automatic closed-loop test method and system of the intelligent Internet of Things terminal of the present application, by acquiring the device information of the intelligent Internet of Things terminal, and automatically generating the first test instruction according to the device information, so as to automatically test the intelligent Internet of Things terminal through the first test instruction, and comprehensively analyze the first running data and the second running data in the running process to obtain accurate test results, improve the efficiency and accuracy of the intelligent Internet of Things terminal test, reduce the detection workload, effectively solve the problem of low efficiency of manual test one by one; Therefore, the present application effectively overcomes the various shortcomings in the prior art and has high industrial utilization value.

[0113] The above embodiments only exemplarily illustrate the principles and effects of the present application, and are not used to limit the present application. Any person skilled in the art can modify or change the above embodiments without departing from the spirit and scope of the present application. Therefore, all equivalent modifications or changes completed by those skilled in the art without departing from the spirit and technical thought disclosed by the present application should be covered by the claims of the present application.

Claims

1. An automatic closed-loop testing method for a smart Internet of Things (IoT) terminal, characterized in that, Includes the following steps: Obtain the device information of the smart IoT terminal to be tested, open the test control software, generate and send the first test command to the test bench controller based on the device information; After receiving the first test instruction, the test bench controller decomposes the first test instruction to obtain a first decomposition instruction. Based on the first decomposition instruction, it controls the operation of corresponding auxiliary devices and remotely controls the operation of the smart IoT terminal. The test control software collects first operating data during the operation of the smart IoT terminal and collects second operating data after a preset operating time. The test control software sends a second test instruction to the test bench controller, which is a test termination instruction. After receiving the second test instruction, the test bench controller decomposes the second test instruction to obtain a second decomposition instruction and shuts down the auxiliary devices and the smart IoT terminal based on the second decomposition instruction. The test control software analyzes the first and second running data to obtain test results. The step of sending a first test command to the test bench controller based on the device information includes: determining the test content to be configured based on the device information; selecting test items, the simulated fault types, state sequences, time parameters, and switching parameters corresponding to the test items based on the test content; generating the first test command based on the test items, the state sequences, the time parameters, and the switching parameters and sending it to the test bench controller; wherein, the test items include protection setting verification, protection function test, and performance test; the simulated fault types corresponding to the test items include single-phase ground fault, two-phase short circuit, and three-phase short circuit; the state sequences include current state sequences, voltage state sequences, and fault state sequences; and the time parameters include time before the fault and maximum time. The fault time, trigger delay, and step change time are included. The switching parameters include the switching input trigger logic and the switching output state before the fault. Both the first and second operating data include telemetry data and remote signaling data. The analysis of the first and second operating data by the test control software to obtain test results includes: calculating a first average of the telemetry data in the first and second operating data, and calculating a second average of the remote signaling data in the first and second operating data; calculating the telemetry result based on the first average data, and calculating the remote signaling result based on the second average data; and generating a test report based on the telemetry result and the remote signaling result.

2. The automatic closed-loop testing method for intelligent IoT terminals according to claim 1, characterized in that, The first test instruction corresponds to the set test item, the state sequence, the time parameter, and the switch quantity parameter.

3. The automatic closed-loop testing method for intelligent IoT terminals according to claim 1, characterized in that, The first decomposition instruction includes parameter control commands and waveform setting information. The step of controlling the operation of corresponding auxiliary devices and remotely controlling the operation of the intelligent IoT terminal according to the first decomposition instruction includes: the host computer obtaining the parameter control commands and waveform setting information according to the first decomposition instruction, and sending the parameter control commands and waveform setting information to the slave computer via serial communication; the slave computer calculating a digital waveform based on the waveform setting information and a Fourier algorithm, and then outputting the digital waveform; converting the digital waveform into an analog signal through a digital-to-analog converter circuit, and amplifying the analog signal through an amplifier circuit to obtain the target current signal and target voltage signal required for actual testing; generating the target current signal and target voltage signal through a test bench power source and inputting them to the intelligent IoT terminal; and starting the operation of the intelligent IoT terminal through the test control software.

4. The automatic closed-loop testing method for intelligent IoT terminals according to claim 1, characterized in that, The step of collecting the first operating data during the operation of the smart IoT terminal through the test control software includes: continuously collecting the first operating data during the operation of the smart IoT terminal within a preset data waiting time; continuously comparing the first operating data with preset judgment data during the collection process, wherein the preset judgment data is set by the test control software according to the first test instruction and the device information; when the type and quantity of the first operating data collected within the data waiting time are both correct compared with the preset judgment data, it is determined that the first operating data collection is completed; otherwise, the first operating data is collected again.

5. The automatic closed-loop testing method for intelligent IoT terminals according to claim 4, characterized in that, The step of calculating the telemetry result based on the first average data includes: calculating the absolute value of the difference between the first average data and the first set value in the test control software; calculating the ratio between the absolute value of the difference and the corresponding telemetry rated value in the smart IoT terminal to obtain the error rate; when the error rate is within a preset error range, determining that the telemetry result of the smart IoT terminal is qualified, otherwise the telemetry result is unqualified.

6. The automatic closed-loop testing method for intelligent IoT terminals according to claim 4, characterized in that, The step of calculating the remote signaling result based on the second average data includes: matching remote signal points and remote signaling values ​​for each remote signaling signal in the second average data; comparing whether the remote signal points and remote signaling values ​​received in each state are consistent with the corresponding set values; if they are consistent, the remote signaling test of the smart IoT terminal is qualified; otherwise, it is unqualified.

7. The automatic closed-loop testing method for intelligent IoT terminals according to claim 4, characterized in that, The step of generating a test report based on the telemetry results and the remote signaling results includes: filling the telemetry results and the remote signaling results into a test report template and generating the test report.

8. An automatic closed-loop testing system for intelligent Internet of Things (IoT) terminals, characterized in that, include: The first sending module is used to acquire device information of the smart IoT terminal under test, open the test control software, generate and send a first test command to the test bench controller based on the device information; The first test module is used to decompose the first test instruction into a first decomposition instruction after the test bench controller receives the first test instruction, control the operation of the corresponding auxiliary equipment according to the first decomposition instruction, and remotely control the operation of the smart IoT terminal. The data acquisition module is used to acquire first operating data during the operation of the smart IoT terminal through the test control software, and to acquire second operating data during the operation of the smart IoT terminal after a preset time. The second sending module is used to send a second test instruction to the test bench controller through the test control software, wherein the second test instruction is a test end instruction; the shut-down module is used to decompose the second test instruction after the test bench controller receives the second test instruction to obtain a second decomposition instruction, and shut down the auxiliary equipment and the smart IoT terminal according to the second decomposition instruction. The analysis module is used to analyze the first running data and the second running data through the test control software to obtain test results; The step of sending a first test command to the test bench controller based on the device information includes: determining the test content to be configured based on the device information; selecting test items, the simulated fault types, state sequences, time parameters, and switching parameters corresponding to the test items based on the test content; generating the first test command based on the test items, the state sequences, the time parameters, and the switching parameters and sending it to the test bench controller; wherein, the test items include protection setting verification, protection function test, and performance test; the simulated fault types corresponding to the test items include single-phase ground fault, two-phase short circuit, and three-phase short circuit; the state sequences include current state sequences, voltage state sequences, and fault state sequences; and the time parameters include time before the fault and maximum time. The fault time, trigger delay, and step change time are included. The switching parameters include the switching input trigger logic and the switching output state before the fault. Both the first and second operating data include telemetry data and remote signaling data. The analysis of the first and second operating data by the test control software to obtain test results includes: calculating a first average of the telemetry data in the first and second operating data, and calculating a second average of the remote signaling data in the first and second operating data; calculating the telemetry result based on the first average data, and calculating the remote signaling result based on the second average data; and generating a test report based on the telemetry result and the remote signaling result.

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