Detection Method, Device, Electronic Device and Storage Medium of Pipeline

Abstract

The present application provides a method, device, electronic device and storage medium for detecting a pipeline. The method includes: detecting a current magnetic field and a current temperature through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; determining the magnetic field sensitivity and the temperature sensitivity of the dual-channel sensor; determining a current magnetic field intensity change amount and a current temperature change amount according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and a transfer matrix; and determining defect information of the pipeline according to the current magnetic field intensity change amount and the current temperature change amount. In the above solution, the magnetic field intensity and the temperature are simultaneously detected through the dual-channel sensor, the decoupling of the two parameters is realized, and the interference between the two parameters is avoided, thereby improving the detection accuracy.

Description

Technical Field

[0001] This application relates to the technical field of pipeline detection, and in particular, to a pipeline detection method, device, electronic device, and storage medium. Background Art

[0002] Pipelines can be used to efficiently transport energy substances such as oil and natural gas. Pipelines are generally made of steel as raw materials. During the steel smelting production process, due to the nature of the steel itself and chemical reactions at high temperatures, there will be some impurities in the produced steel, and these impurities will affect the stability of the pipeline. As the service life of the pipeline increases, the pipeline may develop defects, which will affect transportation or pose safety hazards.

[0003] In practical applications, the pipeline is detected through pipeline detection technology, and when a defect is detected, the pipeline is maintained in a timely manner to ensure the normal use of the pipeline.

[0004] In the related art, the magnetic field signal of the pipeline can be detected by means of magnetic flux leakage detection to obtain the change amount of the pipeline magnetic field intensity, and the corresponding defect is determined according to the change amount of the magnetic field intensity. However, the magnetic field signal will be interfered, resulting in a problem of low accuracy of the detection result, and further resulting in a problem of poor reliability of pipeline maintenance. Summary of the Invention

[0005] This application provides a pipeline detection method, device, electronic device, and storage medium to improve the accuracy of pipeline detection.

[0006] In a first aspect, this application provides a pipeline detection method, including: detecting the current magnetic field and current light wave through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; determining the magnetic field sensitivity and temperature sensitivity of the dual-channel sensor; according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, determining the current magnetic field intensity change amount and the current temperature change amount, where the transfer matrix is used to calculate the magnetic field intensity change amount and the temperature change amount according to the loss peak optical wavelength offset value; and determining the defect information of the pipeline according to the current magnetic field intensity change amount and the current temperature change amount.

[0007] In a possible implementation, the dual-channel sensor includes a first channel and a second channel. Different magnetosensitive materials are filled in the first channel and the second channel respectively, and the surfaces of the first channel and the second channel are covered with a composite sensitive layer. The dual-channel sensor disposed on the pipeline wall detects the current magnetic field and the current temperature to obtain a first loss peak optical wavelength and a second loss peak optical wavelength, including: absorbing the y-polarized light through the first channel and performing spectral detection through a spectrometer to obtain a first spectrogram; analyzing and processing the first spectrogram to obtain the first loss peak optical wavelength; absorbing the x-polarized light through the second channel and performing spectral detection through a spectrometer to obtain a second spectrogram; analyzing and processing the second spectrogram to obtain the second loss peak optical wavelength.

[0008] In a possible implementation, the current magnetic field intensity change and the current temperature change are determined according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, including: determining a first reference peak of the first channel and a second reference peak of the second channel; determining a first offset value according to the first loss peak optical wavelength and the first reference peak; determining a second offset value according to the second loss peak optical wavelength and the second reference peak; determining the current magnetic field intensity change and the current temperature change according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix.

[0009] In a possible implementation, the magnetic field sensitivity includes a first sensitivity of the first channel and a second sensitivity of the second channel, and the temperature sensitivity includes a third sensitivity of the first channel and a fourth sensitivity of the second channel. The current magnetic field intensity change and the current temperature change are determined according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, including: calculating the first offset value, the second offset value, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity through the transfer matrix to obtain the current magnetic field intensity change and the current temperature change.

[0010] In a possible implementation, the defect information of the pipeline is determined according to the current magnetic field intensity change and the current temperature change, including: determining a prediction model, which is obtained by training multiple historical magnetic field intensity changes and multiple historical temperature changes; inputting the current magnetic field intensity change and the current temperature change into the prediction model to obtain the defect information of the pipeline.

[0011] In a possible implementation, the method further includes: determining a plurality of first sample light waves and a plurality of second sample light waves, where the plurality of first sample light waves respectively correspond to a plurality of first magnetic field intensities, and the plurality of second sample light waves respectively correspond to a plurality of first temperatures; for any one of the channels of the dual-channel sensor, detecting the plurality of first sample light waves respectively through the channel to obtain a plurality of first sample loss peaks, and detecting the plurality of second sample light waves respectively through the channel to obtain a plurality of second sample loss peaks; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field intensities to obtain the sensitivity of the loss peak offset value of the channel to the change in magnetic field intensity; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain the sensitivity of the loss peak offset value of the channel to the change in temperature.

[0012] In a second aspect, the present application provides a detection device for a pipeline, including: a detection module for detecting a current magnetic field and a current temperature through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; a determination module for determining the magnetic field sensitivity and the temperature sensitivity of the dual-channel sensor; a calculation module for determining a current magnetic field intensity change amount and a current temperature change amount according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and a transfer matrix, where the transfer matrix is used to calculate the magnetic field intensity change amount and the temperature change amount according to the offset value of the loss peak optical wavelength; and a prediction module for determining defect information of the pipeline according to the current magnetic field intensity change amount and the current temperature change amount.

[0013] In a possible implementation, the dual-channel sensor includes a first channel and a second channel, the first channel and the second channel are respectively filled with different magnetosensitive materials, and the surfaces of the first channel and the second channel are covered with a composite sensitive layer; the detection module is specifically configured to absorb y-polarized light through the first channel and perform spectral detection through a spectrometer to obtain a first spectrogram; the detection module is specifically further configured to analyze and process the first spectrogram to obtain the first loss peak optical wavelength; the detection module is specifically further configured to absorb x-polarized light through the second channel and perform spectral detection through a spectrometer to obtain a second spectrogram; the detection module is specifically further configured to analyze and process the second spectrogram to obtain the second loss peak optical wavelength.

[0014] In a possible implementation, the device further includes: an execution module, configured to determine a first reference peak of a first channel and a second reference peak of a second channel; the execution module is further configured to determine a first offset value according to the first loss peak optical wavelength and the first reference peak; the execution module is further configured to determine a second offset value according to the second loss peak optical wavelength and the second reference peak; the execution module is further configured to determine the current magnetic field strength change amount and the current temperature change amount according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix.

[0015] In a possible implementation, the magnetic field sensitivity includes a first sensitivity of the first channel and a second sensitivity of the second channel, and the temperature sensitivity includes a third sensitivity of the first channel and a fourth sensitivity of the second channel; specifically, the execution module is configured to calculate the first offset value, the second offset value, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity through the transfer matrix to obtain the current magnetic field strength change amount and the current temperature change amount.

[0016] In a possible implementation, the device further includes: a processing module, configured to determine a prediction model obtained by training a plurality of historical magnetic field strength change amounts and a plurality of historical temperature change amounts; the processing module is further configured to input the current magnetic field strength change amount and the current temperature change amount into the prediction model to obtain the defect information of the pipeline.

[0017] In a possible implementation, the device further includes: a testing module, configured to determine a plurality of first sample light waves and a plurality of second sample light waves, where the plurality of first sample light waves respectively correspond to a plurality of first magnetic field strengths, and the plurality of second sample light waves respectively correspond to a plurality of first temperatures; the testing module is further configured to, for any one of the channels of the dual-channel sensor, detect the plurality of first sample light waves through the channel to obtain a plurality of first sample loss peaks, and detect the plurality of second sample light waves through the channel to obtain a plurality of second sample loss peaks; the testing module is further configured to perform a fitting process on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field strengths to obtain the sensitivity of the loss peak offset value of the channel to the magnetic field strength change amount; the testing module is further configured to perform a fitting process on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain the sensitivity of the loss peak offset value of the channel to the temperature change amount.

[0018] In a third aspect, the present application provides an electronic device, including: a processor, and a memory communicatively connected to the processor; the memory stores computer-executable instructions; the processor executes the computer-executable instructions stored in the memory to implement the method according to any one of the first aspect.

[0019] In a fourth aspect, the present application provides a computer-readable storage medium storing computer-executable instructions, and the computer-executable instructions are executed by a processor to implement the method according to any one of the first aspect.

[0020] In a fifth aspect, the present application provides a computer program product including a computer program, and the computer program is executed by a processor to implement the method according to any one of the first aspect.

[0021] The pipeline detection method, device, electronic device, and storage medium provided by the present application, the method includes: detecting a current magnetic field and a current temperature through a dual-channel sensor disposed on a pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; determining a magnetic field sensitivity and a temperature sensitivity of the dual-channel sensor; determining a change amount of the current magnetic field intensity and a change amount of the current temperature according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and a transfer matrix, where the transfer matrix is used to calculate a change amount of the magnetic field intensity and a change amount of the temperature according to an offset value of the loss peak optical wavelength; determining defect information of the pipeline according to the change amount of the current magnetic field intensity and the change amount of the current temperature. In the above solution, by simultaneously detecting two parameters of the magnetic field intensity and the temperature through a dual-channel sensor, decoupling of the two parameters is achieved, interference between the two parameters is avoided, and thus the detection accuracy is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The drawings here are incorporated into the specification and constitute a part of this specification, showing embodiments consistent with the present application, and are used together with the specification to explain the principles of the present application.

[0023] Figure 1 It is a schematic diagram of an application scenario of a pipeline detection method provided by an embodiment of the present application;

[0024] Figure 2 It is a schematic diagram of magnetic flux leakage detection provided by an embodiment of the present application;

[0025] Figure 3 It is a schematic flowchart of a pipeline detection method provided by an embodiment of the present application;

[0026] Figure 4 It is a schematic flowchart of a pipeline detection method provided by an embodiment of the present application;

[0027] Figure 5 Schematic diagram of the cross-section of the dual-channel sensor provided by an embodiment of the present application;

[0028] Figure 6 Schematic diagram of the dual-channel sensor model provided by an embodiment of the present application;

[0029] Figure 7 Schematic diagram of the predicted defect information provided by an embodiment of the present application;

[0030] Figure 8 Schematic diagram of the structure of a pipeline detection device provided by an embodiment of the present application;

[0031] Figure 9 Schematic diagram of the structure of a pipeline detection device provided by an embodiment of the present application;

[0032] Figure 10 Schematic diagram of the structure of an electronic device provided by an embodiment of the present application.

[0033] Through the above-mentioned drawings, specific embodiments of the present application have been shown, and more detailed descriptions will be given later. These drawings and text descriptions are not intended to limit the scope of the concept of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. Detailed implementation manners

[0034] Here, the exemplary embodiments will be described in detail, and the examples are shown in the drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The implementation manners described in the following exemplary embodiments do not represent all implementation manners consistent with the present application. On the contrary, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0035] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, displayed data, etc.) involved in the present application are all information and data authorized by the user or fully authorized by all parties, and the collection, use, processing, transmission, provision, disclosure, application and other processing of the relevant data all comply with the relevant laws, regulations and standards of the relevant countries and regions, adopt necessary confidentiality measures, do not violate public order and good customs, and provide corresponding operation entrances for users to choose to authorize or refuse.

[0036] It should be noted that the pipeline detection method, device, electronic device and storage medium of the present application can be used in the field of pipeline detection technology, and can also be used in any field other than pipeline detection. The application fields of the pipeline detection method, device, electronic device and storage medium of the present application are not limited.

[0037] Figure 1 FIG. 1 is a schematic diagram of an application scenario of a pipeline detection method provided by an embodiment of the present application. Taking the illustrated scenario as an example: sensors are installed on the pipeline, the sensors detect specific signals of the pipeline to obtain detection results, and defect information of the pipeline is determined according to the detection results.

[0038] In the related art, magnetic flux leakage testing can be used to perform non-destructive testing on pipelines. Magnetic Flux Leakage Testing (MFL) is a technical means that magnetizes ferromagnetic materials of components. Since the presence of defects in the components to be tested will cause magnetic flux leakage, the detection purpose is achieved based on the intensity, range, and quantity of the detected magnetic flux leakage signals.

[0039] Figure 2 FIG. 2 is a schematic diagram of magnetic flux leakage testing. As Figure 2 shown, the pipeline is magnetized by a magnetization device such as a permanent magnet. During the magnetization process of the pipeline, a complete magnetic path is formed between the magnetization device and the pipeline. If the pipeline material is continuously and uniformly distributed, the provided magnetic flux is bound inside the component due to the magnetic permeability and is parallelly distributed along the magnetic path direction, and hardly penetrates the structure surface and diffuses outward. Therefore, the sensor will not detect an obvious magnetic field change. The occurrence of defects often causes the continuity and uniformity of the pipeline material to be damaged, that is, the magnetic resistance and magnetic permeability at the defect change. Due to the sharp increase in magnetic resistance and the sudden drop in magnetic permeability at the defect, the magnetic flux distribution changes, mainly manifested as the magnetic flux lines in the pipeline bypassing near the defect of the component, and even breaking away from the surface restraint of the structure and leaking into the external space and finally returning to the pipeline interior. Therefore, the sensor can detect an obvious magnetic field change.

[0040] In the related art, the sensor obtains the change amount of the magnetic field intensity by detecting the magnetic field signal of the pipeline. However, the change in temperature will cause the drift of the magnetic field signal. If the magnetic field signal is directly detected, there will be a problem that the detected change amount of the magnetic field intensity is inaccurate.

[0041] The pipeline detection method provided by the present application aims to solve the above technical problems in the prior art.

[0042] The following will specifically describe the technical solution of the present application and how the technical solution of the present application solves the above technical problems with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below with reference to the accompanying drawings.

[0043] Figure 3 FIG. 3 is a schematic flowchart of a pipeline detection method provided by an embodiment of the present application. The method includes the following steps:

[0044] S301. Detect the current magnetic field and current temperature through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength.

[0045] Among them, the loss peak is the place where the energy loss of light wave is the largest when passing through a certain substance. The nature of the current light wave can be determined through the loss peak.

[0046] Exemplarily, the polarization state of the light wave will change under the action of the magnetic field. Specifically, when the light wave passes through the magnetic field region, its polarization direction will rotate. By detecting the light wave to determine whether the light wave is affected by the magnetic field, the magnetic field can be detected indirectly.

[0047] Combined with the scenario example, through real-time detection of the pipeline by the dual-channel sensor, the current light wave is the light wave currently passing through the dual-channel sensor. By performing real-time detection on the current light wave, it can be determined whether there are current defects in the pipeline.

[0048] Optionally, the dual-channel sensor can be disposed on the inner wall or the outer wall of the pipeline.

[0049] S302. Determine the magnetic field sensitivity and temperature sensitivity of the dual-channel sensor.

[0050] Exemplarily, the magnetic field sensitivity is the sensitivity of the offset value of the loss peak detected by the dual-channel sensor to the change in magnetic field strength, and the temperature sensitivity is the sensitivity of the offset value of the loss peak detected by the dual-channel sensor to the change in temperature.

[0051] Optionally, the magnetic field sensitivity and temperature sensitivity are obtained by pre-testing the dual-channel sensor with light waves of known magnetic fields. The magnetic field sensitivity and temperature sensitivity are related to the properties of the magnetic fluid in the channel.

[0052] Optionally, determine the magnetic field sensitivity and temperature sensitivity of the dual-channel sensor through a wavelength modulation mechanism.

[0053] Exemplarily, the specific method using the wavelength modulation mechanism may include: 1. Designing a sensor probe that can respond to changes in magnetic field or temperature. This probe may contain sensitive materials or structures. When the external magnetic field or temperature changes, the optical properties (such as refractive index, absorption coefficient, etc.) of these materials will change, thereby affecting the light wavelength passing through them. 2. Wavelength modulation, designing a mechanism to modulate the light wavelength passing through the sensor probe. This usually involves using a tunable light source or an external modulator to generate a series of lights with known wavelengths. Then, these lights are transmitted through an optical fiber to the sensor probe and are shifted due to the influence of the magnetic field or temperature. 3. Data acquisition, when the light carrying magnetic field or temperature information returns to the detection end, using a spectrometer or other appropriate equipment to collect the wavelength information of the reflected or transmitted light. The key to this step is to ensure that the accuracy of the data acquisition system is high enough to distinguish the tiny wavelength shift caused by the change in magnetic field or temperature. 4. Data processing, calculating the sensitivity of the magnetic field or temperature by analyzing the collected data. This means determining the relationship between the change in the output wavelength and the change in the input magnetic field or temperature. Usually, this requires establishing a mathematical model to describe the physical phenomenon and performing fitting to extract the sensitivity parameters.

[0054] S303. Determine the current magnetic field strength change amount and the current temperature change amount according to the first loss peak light wavelength, the second loss peak light wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, where the transfer matrix is used to calculate the magnetic field strength change amount and the temperature change amount according to the offset value of the loss peak light wavelength.

[0055] Among them, the current magnetic field strength change amount is the change amount of the magnetic field strength corresponding to the current light wave relative to the reference magnetic field strength. The current temperature change amount is the change amount of the temperature corresponding to the current light wave relative to the reference temperature.

[0056] Among them, the transfer matrix is the corresponding relationship between the modeled loss peak and the magnetic field strength change amount and the temperature change amount. The transfer matrix includes sensitivity parameters, and the magnetic field strength change amount and the temperature change amount can be calculated according to the loss peak and the sensitivity parameters.

[0057] S304. Determine the defect information of the pipeline according to the current magnetic field strength change amount and the current temperature change amount.

[0058] Among them, the defect information includes but is not limited to at least one of the following: defect location, defect size, defect depth, or defect shape, etc.

[0059] Exemplarily, there is a corresponding relationship between each type of defect and the magnetic field strength and temperature. The defect information at the location of the dual-channel sensor is determined through the corresponding relationship.

[0060] Optionally, determine multiple detection results corresponding to multiple dual-channel sensors at adjacent positions, and analyze the multiple detection results to obtain defect information.

[0061] The pipeline detection method provided by the embodiments of the present application detects the current magnetic field and the current temperature through dual-channel sensors arranged on the pipeline wall to obtain the first loss peak optical wavelength and the second loss peak optical wavelength; determine the magnetic field sensitivity and the temperature sensitivity of the dual-channel sensors; according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, determine the current magnetic field intensity change and the current temperature change, and the transfer matrix is used to calculate the magnetic field intensity change and the temperature change according to the offset value of the loss peak optical wavelength; according to the current magnetic field intensity change and the current temperature change, determine the defect information of the pipeline. In the above solution, the magnetic field intensity and the temperature are detected simultaneously by the dual-channel sensors, the decoupling of the two parameters is realized, and the interference between the two parameters is avoided, thereby improving the detection accuracy.

[0062] Based on any of the above embodiments, below, in combination with Figure 4 , the detailed process of pipeline detection will be described.

[0063] Figure 4 It is a schematic flow chart of a pipeline detection method provided by an embodiment of the present application. As Figure 4 shown, the method includes:

[0064] S401. Absorb the y-polarized light through the first channel and perform spectral detection through a spectrometer to obtain a first spectrogram.

[0065] Among them, the dual-channel sensor includes a first channel and a second channel. Different magnetosensitive materials are filled in the first channel and the second channel respectively, and a composite sensitive layer covers the surfaces of the first channel and the second channel.

[0066] Among them, the composite sensitive layer is used to promote and modulate the phase matching between the fundamental mode and the surface plasmon polariton (SPP) mode.

[0067] Exemplarily, the structure of the dual-channel sensor is a photonic crystal fiber (Photonic Crystal Fiber, abbreviated as PCF). The PCF has a periodic hole structure and can control the propagation path and mode of light. The channels of the dual-channel sensor are designed based on the principle of surface plasmon resonance (Surface Plasmon Resonance, abbreviated as SPR). SPR is an optical effect that occurs near the metal-dielectric interface and can enhance the light absorption and scattering effects.

[0068] Below, in combination with Figure 5 the cross-section of the dual-channel sensor will be described.

[0069] Figure 5 This is a schematic cross - section of the dual - channel sensor provided by the embodiment of the present application. As Figure 5 shown, the sensor includes two layers of air holes. The first layer of air holes is arranged in a square lattice, and its main function is to control the mode field area of the fundamental mode and the transfer of energy from the fundamental mode to the SPP mode, including air holes of two sizes. The main function of the second layer of air holes is to mediate the refractive index difference between the cladding and the core, limit the leakage of energy from the fundamental mode to the cladding, and ensure the quality of optical wave transmission. The two channels are arranged vertically, and the channels include a sensitive layer.

[0070] Optionally, the magnetic fluid filled in the first channel can be a water - based magnetic fluid with a ferromagnetic particle concentration of 1.8%, and the magnetic fluid filled in the second channel can be ethanol. The sensitive layer can be an Ag - Si3N4 composite thin film.

[0071] Combined with the scenario example, the first channel absorbs the y - polarized light of the current optical wave, and the second channel absorbs the x - polarized light of the current optical wave. The refractive indices corresponding to different magnetic fluids vary differently with the magnetic field strength or temperature, thus decoupling the two parameters of the magnetic field strength and temperature.

[0072] Optionally, a Perfectly Matched Layer (PML for short) is set on the outer layer of the dual - channel sensor, and the PML is used to reduce the influence of reflections at the edges of the simulation domain.

[0073] Next, Figure 6 the dual - channel sensor model will be described.

[0074] Figure 6 This is a schematic diagram of the dual - channel sensor model provided by the embodiment of the present application. As Figure 6 shown, the finite - element method is used to perform finite - element meshing on the dual - channel sensor model, obtaining a plurality of triangular meshes. Through the dual - channel sensor model, the transfer matrix based on the magnetic field strength and temperature can be calculated, so as to determine the change amount of the magnetic field strength and the current change amount of the temperature according to the detection result of the optical wave.

[0075] Exemplarily, for a plasma planar waveguide structure, one of the most important conditions for SPR excitation is that the incident optical wave vector is in the TM polarization (or P polarization) mode. Therefore, the influence of the incident P - polarized light on the sensitive layer is considered.

[0076] Based on the above embodiments, by absorbing the y - polarized light and the x - polarized light through the first channel and the second channel respectively, the cross - interference between the loss peaks can be avoided, and the simultaneous detection of the two parameters of the magnetic field strength and temperature can be realized, thereby improving the detection accuracy.

[0077] S402. Analyze and process the first spectrogram to obtain the optical wavelength of the first loss peak.

[0078] Exemplarily, the first spectrogram is obtained by absorbing the current light wave through the first channel. By analyzing and processing the first spectrogram, the optical wavelength of the first loss peak corresponding to the degree of light intensity decrease caused by the absorption of the current light wave through the first channel is obtained.

[0079] Combined with the scenario example, when the magnetic field or temperature changes, the refractive index of the magnetic fluid will change, which will in turn cause a change in the propagation mode of the light wave in the channel, thereby affecting the loss degree of the light wave. This change will be reflected as a shift in the position of the loss peak on the spectrogram. By monitoring the change in the position of the loss peak, the changes in the magnetic field strength and temperature can be indirectly measured.

[0080] S403. Absorb the x-polarized light through the second channel and perform spectral detection through a spectrometer to obtain a second spectrogram.

[0081] It should be noted that for the execution process of S403, refer to S401, which will not be elaborated here.

[0082] S404. Analyze and process the second spectrogram to obtain the optical wavelength of the second loss peak.

[0083] It should be noted that for the execution process of S404, refer to S402, which will not be elaborated here.

[0084] S405. Determine the magnetic field sensitivity and temperature sensitivity of the dual-channel sensor.

[0085] It should be noted that for the execution process of S405, refer to S402, which will not be elaborated here.

[0086] S406. Determine the first reference peak of the first channel and the second reference peak of the second channel.

[0087] Among them, the first reference peak is the loss peak obtained by detecting the reference light wave through the first channel, the second reference peak is the loss peak obtained by detecting the reference light wave through the second channel, the magnetic field strength of the optical wavelength of the reference peak is the reference magnetic field strength, and the temperature of the optical wavelength of the reference peak is the reference temperature.

[0088] Combined with the scenario example, before the dual-channel sensor detects the pipeline, the dual-channel sensor is tested with the reference light wave to obtain the reference peak of the dual-channel sensor under the conditions corresponding to the reference light wave. The reference peak is used to evaluate the offset value of the loss peak when detecting the pipeline. The change in the magnetic field or temperature will cause the offset of the loss peak. Therefore, the change amount of the magnetic field strength and the change amount of the temperature can be calculated through the offset value.

[0089] S407. Determine the first offset value according to the optical wavelength of the first loss peak and the first reference peak.

[0090] Exemplarily, determine the wavelength corresponding to the peak of the first loss peak, determine the wavelength corresponding to the peak of the first reference peak, calculate the difference between the two wavelengths, and obtain the first offset value.

[0091] In combination with the scenario example, the peak of the first loss peak is the highest point of the first loss peak, and the peak of the first reference peak is the highest point of the first reference peak.

[0092] Optionally, pre-determine the wavelength corresponding to the peak of the first reference peak and directly use this wavelength when detecting the pipeline, avoiding calculating the wavelength corresponding to the peak of the first reference peak every time detection is performed, thereby improving the detection efficiency.

[0093] S408. Determine the second offset value according to the optical wavelength of the second loss peak and the second reference peak.

[0094] It should be noted that for the execution process of S408, refer to S407, which will not be elaborated here.

[0095] S409. Through the transfer matrix, calculate the first offset value, the second offset value, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity to obtain the current magnetic field strength change and the current temperature change.

[0096] Among them, the magnetic field sensitivity includes the first sensitivity of the loss peak offset value of the first channel to the magnetic field strength change and the second sensitivity of the loss peak offset value of the second channel to the magnetic field strength change, and the temperature sensitivity includes the third sensitivity of the loss peak offset value of the first channel to the temperature change and the fourth sensitivity of the loss peak offset value of the second channel to the magnetic field strength change.

[0097] Exemplarily, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity are obtained by pre-testing the dual-channel sensor and are fixed parameters in the transfer matrix. Establish a model of the loss peak offset value and the magnetic field strength change and the temperature change as shown in formula (1):

[0098]

[0099] Among them, Δλ1 is the first offset value of the first channel, Δλ2 is the second offset value of the second channel, T is the temperature, ΔT is the temperature change, H0 is the magnetic field strength, ΔH is the magnetic field strength change, Δλ ij , i = 1, 2, j = T, H0 represents the loss peak offset value corresponding to the first channel or the second channel caused by the temperature change and the magnetic field strength change, is the first sensitivity of the loss peak offset value of the first channel to the magnetic field strength change, is the second sensitivity of the loss peak offset value of the second channel to the magnetic field strength change, S1T The third sensitivity S of the loss peak offset value of the first channel to the temperature change 2T is the fourth sensitivity of the loss peak offset value of the second channel to the temperature change.

[0100] Combined with the scenario example, the relationship between the total loss peak offset value and the magnetic field strength change ΔH and the temperature change ΔT is

[0101] Exemplarily, taking the inverse of formula (1) gives the transfer matrix (2):

[0102]

[0103] Combined with the scenario example, substituting the above parameters into the transfer matrix (2) gives the current magnetic field strength change and the current temperature change.

[0104] S410. Determine the prediction model, which is obtained by training multiple historical magnetic field strength changes and multiple historical temperature changes.

[0105] Among them, the prediction model is used to predict defect information. The historical magnetic field strength change and the historical temperature change are the training samples of the prediction model.

[0106] Exemplarily, there is a corresponding relationship between the defect information and the magnetic field strength change and the temperature change. By training, the prediction model learns this corresponding relationship, so as to predict the defect information according to the corresponding relationship.

[0107] S411. Input the current magnetic field strength change and the current temperature change into the prediction model to obtain the defect information of the pipeline.

[0108] Next, combined with Figure 7 the prediction of defect information will be described.

[0109] Figure 7 is a schematic diagram of predicting defect information provided by an embodiment of the present application. As Figure 7 shown, detecting the pipeline obtains the first loss peak and the second loss peak. The current temperature change and the current magnetic field strength change corresponding to the first loss peak and the second loss peak are calculated through the transfer matrix. Input the current temperature change and the current magnetic field strength change into the prediction model to obtain the defect information output by the model based on the current temperature change and the current magnetic field strength change.

[0110] Based on the above embodiments, predicting defect information through the prediction model reduces manual operations and avoids errors introduced by manual operations, thereby improving the accuracy of prediction.

[0111] A feasible implementation manner, the pipeline detection method further includes: determining a plurality of first sample light waves and a plurality of second sample light waves, the plurality of first sample light waves respectively corresponding to a plurality of first magnetic field intensities, and the plurality of second sample light waves respectively corresponding to a plurality of first temperatures; for any one of the channels of the dual-channel sensor, detecting the plurality of first sample light waves respectively through the channel to obtain a plurality of first sample loss peaks, and detecting the plurality of second sample light waves respectively through the channel to obtain a plurality of second sample loss peaks; performing fitting processing on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field intensities to obtain the sensitivity of the loss peak offset value of the channel to the change amount of the magnetic field intensity; performing fitting processing on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain the sensitivity of the loss peak offset value of the channel to the change amount of the temperature.

[0112] Optionally, perform fitting processing on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field intensities to obtain a first correspondence between the loss peak offset value of the channel and the change amount of the magnetic field intensity; determine the coefficient of the first correspondence as the sensitivity of the loss peak offset value of the channel to the change amount of the magnetic field intensity; perform fitting processing on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain a second correspondence between the loss peak offset value of the channel and the change amount of the temperature; determine the coefficient of the second correspondence as the sensitivity of the loss peak offset value of the channel to the change amount of the temperature.

[0113] Exemplarily, the loss peak offset value is affected by two parameters, and is tested by the method of controlling variables. When determining the correspondence between the loss peak offset value and the change amount of the magnetic field intensity, the temperature parameter is controlled to be unchanged, and when determining the correspondence between the loss peak offset value and the change amount of the temperature, the magnetic field intensity parameter is controlled to be unchanged.

[0114] Combined with a scenario example for illustration, for example, the temperatures of the plurality of first sample light waves are all 20 °C, and the magnetic field intensities applied to the plurality of first sample light waves are 0 Oe, 100 Oe, 200 Oe, 300 Oe, 400 Oe, 500 Oe, and 600 Oe respectively.

[0115] In this feasible implementation manner, the dual-channel sensor is tested by the method of controlling variables, which can avoid the interference between different parameters, thereby improving the detection accuracy.

[0116] Figure 8 This is a schematic structural diagram of a pipeline detection device provided by an embodiment of the present application. As Figure 8 shown, the pipeline detection device 80 may include: a detection module 81, a determination module 82, a calculation module 83, and a prediction module 84, wherein,

[0117] The detection module 81 is configured to detect the current magnetic field and the current temperature through a dual-channel sensor disposed on the pipeline wall, and obtain the first loss peak optical wavelength and the second loss peak optical wavelength.

[0118] The determination module 82 is configured to determine the magnetic field sensitivity and the temperature sensitivity of the dual-channel sensor.

[0119] The calculation module 83 is configured to determine the current magnetic field intensity change and the current temperature change according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, where the transfer matrix is used to calculate the magnetic field intensity change and the temperature change according to the offset value of the loss peak optical wavelength.

[0120] The prediction module 84 is configured to determine the defect information of the pipeline according to the current magnetic field intensity change and the current temperature change.

[0121] Optionally, the detection module 81 may execute Figure 3 S301 in the embodiment.

[0122] Optionally, the determination module 82 may execute Figure 3 S302 in the embodiment.

[0123] Optionally, the calculation module 83 may execute Figure 3 S303 in the embodiment.

[0124] Optionally, the prediction module 84 may execute Figure 3 S304 in the embodiment.

[0125] It should be noted that the pipeline detection device shown in the embodiments of the present application may execute the technical solutions shown in the above method embodiments, and the implementation principles and beneficial effects are similar, which will not be elaborated here.

[0126] In a possible implementation manner, the dual-channel sensor includes a first channel and a second channel. The first channel and the second channel are respectively filled with different magnetosensitive materials, and the surfaces of the first channel and the second channel are covered with a composite sensitive layer. The detection module 81 is specifically configured to:

[0127] Absorb the y-polarized light through the first channel and perform spectral detection through a spectrometer to obtain a first spectrogram;

[0128] Analyze and process the first spectrogram to obtain the first loss peak optical wavelength;

[0129] Absorb the x-polarized light through the second channel and perform spectral detection through a spectrometer to obtain a second spectrogram;

[0130] Analyze and process the second spectrogram to obtain the second loss peak optical wavelength.

[0131] Figure 9 The structural schematic diagram of a pipeline detection device provided by an embodiment of the present application. In Figure 8 Based on the illustrated embodiment, as Figure 9 shown, the pipeline detection device 90 further includes: an execution module 85, a processing module 86, and a testing module 87, where:

[0132] The execution module 85 is configured to:

[0133] Determine the first reference peak of the first channel and the second reference peak of the second channel;

[0134] Determine the first offset value according to the first loss peak optical wavelength and the first reference peak;

[0135] Determine the second offset value according to the second loss peak optical wavelength and the second reference peak;

[0136] Determine the current magnetic field strength change amount and the current temperature change amount according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix.

[0137] In a possible implementation manner, the magnetic field sensitivity includes the first sensitivity of the first channel and the second sensitivity of the second channel, and the temperature sensitivity includes the third sensitivity of the first channel and the fourth sensitivity of the second channel; the execution module 85 is specifically configured to:

[0138] Calculate the first offset value, the second offset value, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity through the transfer matrix to obtain the current magnetic field strength change amount and the current temperature change amount.

[0139] The processing module 86 is configured to:

[0140] Determine a prediction model, which is obtained by training multiple historical magnetic field strength change amounts and multiple historical temperature change amounts;

[0141] Input the current magnetic field strength change amount and the current temperature change amount into the prediction model to obtain the defect information of the pipeline.

[0142] The testing module 87 is configured to:

[0143] Determine a plurality of first sample light waves and a plurality of second sample light waves, where the plurality of first sample light waves respectively correspond to a plurality of first magnetic field strengths, and the plurality of second sample light waves respectively correspond to a plurality of first temperatures;

[0144] For any one of the two channels of the dual-channel sensor, detect multiple first sample light waves through the channel to obtain multiple first sample loss peaks, and detect multiple second sample light waves through the channel to obtain multiple second sample loss peaks;

[0145] Perform fitting processing on the multiple loss peak offset values corresponding to the multiple first sample loss peaks and the multiple first magnetic field strengths to obtain the sensitivity of the loss peak offset value of the channel to the change in magnetic field strength;

[0146] Perform fitting processing on the multiple loss peak offset values corresponding to the multiple second sample loss peaks and the multiple first temperatures to obtain the sensitivity of the loss peak offset value of the channel to the change in temperature.

[0147] Figure 10 FIG. is a schematic structural diagram of an electronic device provided in an embodiment of the present application, as Figure 10 shown, the electronic device includes:

[0148] A processor 291, and the electronic device further includes a memory 292; it may also include a communication interface 293 and a bus 294. Among them, the processor 291, the memory 292, and the communication interface 293 can communicate with each other through the bus 294. The communication interface 293 can be used for information transmission. The processor 291 can call the logical instructions in the memory 292 to execute the method of the above embodiment.

[0149] In addition, when the logical instructions in the above-mentioned memory 292 are implemented in the form of a software functional unit and sold or used as an independent product, they can be stored in a computer-readable storage medium.

[0150] The memory 292, as a computer-readable storage medium, can be used to store software programs and computer-executable programs, such as the program instructions / modules corresponding to the method in the embodiment of the present application. The processor 291 executes functional applications and data processing by running the software programs, instructions, and modules stored in the memory 292, that is, implements the method in the above method embodiment.

[0151] The memory 292 may include a program storage area and a data storage area. Among them, the program storage area can store an operating system and application programs required for at least one function; the data storage area can store data created according to the use of the terminal device, etc. In addition, the memory 292 may include a high-speed random access memory and may also include a non-volatile memory.

[0152] An embodiment of the present application provides a non-transitory computer-readable storage medium storing computer-executable instructions that, when executed by a processor, are used to implement the method of the foregoing embodiment.

[0153] An embodiment of the present application provides a computer program product including a computer program that, when executed by a processor, implements the method of the foregoing embodiment.

[0154] It should be noted that, for the foregoing method embodiments, for the sake of simple description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to the present application.

[0155] Furthermore, it should be noted that although the steps in the flowchart are sequentially shown according to the indication of the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless there is a clear description in this article, the execution of these steps has no strict order limit, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or sub-steps or stages of other steps.

[0156] It should be understood that the above device embodiments are illustrative, and the devices of the present application can also be implemented in other ways. For example, the division of units / modules in the above embodiments is only a logical function division, and there can be other division methods in actual implementation. For example, multiple units, modules or components can be combined, or can be integrated into another system, or some features can be ignored or not executed.

[0157] In addition, without special description, in each embodiment of the present application, each functional unit / module can be integrated in one unit / module, or each unit / module can exist physically alone, or two or more units / modules can be integrated together. The above integrated unit / module can be implemented in the form of hardware or in the form of a software program module.

[0158] When the integrated unit / module is implemented in the form of hardware, the hardware can be a digital circuit, an analog circuit, etc. The physical implementation of the hardware structure includes but is not limited to transistors, memristors, etc. The processor can be any suitable hardware processor, such as a CPU, GPU, FPGA, DSP, and ASIC, etc. The storage unit can be any suitable magnetic storage medium or magneto-optical storage medium, such as a resistive random access memory (RRAM), a dynamic random access memory (DRAM), a static random access memory (SRAM), an enhanced dynamic random access memory (EDRAM), a high-bandwidth memory (HBM), a hybrid memory cube (HMC), etc.

[0159] When the integrated unit / module is implemented in the form of a software program module and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. And the aforementioned memory includes: USB flash drives, read-only memories (ROMs), random access memories (RAMs), external hard drives, magnetic disks, or optical discs, etc., all kinds of media that can store program codes.

[0160] In the above embodiments, the descriptions of the various embodiments each have their own focuses. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combinations of these technical features do not conflict, they should all be considered as within the scope described in this specification.

[0161] Other embodiments of the present application will be readily apparent to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. The present application is intended to cover any variations, uses, or adaptations of the present application, which follow the general principles of the present application and include known common knowledge or conventional technical means in the technical field not disclosed in the present application. The specification and examples are only to be considered as exemplary, and the true scope and spirit of the present application are pointed out by the following claims.

[0162] It should be understood that the present application is not limited to the exact structures described above and shown in the drawings, and various modifications and changes can be made without departing from its scope. The scope of the present application is only limited by the appended claims.

Claims

1. A detection method for a pipeline, characterized in that, Including: Detecting the current magnetic field and the current temperature through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; Determining a plurality of first sample light waves and a plurality of second sample light waves, wherein the plurality of first sample light waves respectively correspond to a plurality of first magnetic field intensities, and the plurality of second sample light waves respectively correspond to a plurality of first temperatures; For any one of the channels of the dual-channel sensor, detecting the plurality of first sample light waves respectively through the channel to obtain a plurality of first sample loss peaks, and detecting the plurality of second sample light waves respectively through the channel to obtain a plurality of second sample loss peaks; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field intensities to obtain the magnetic field sensitivity of the dual-channel sensor; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain the temperature sensitivity of the dual-channel sensor; Determining a current magnetic field intensity change amount and a current temperature change amount according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and a transfer matrix, where the transfer matrix is used to calculate the magnetic field intensity change amount and the temperature change amount according to the offset value of the loss peak optical wavelength; Determining a prediction model, where the prediction model is obtained by training a plurality of historical magnetic field intensity change amounts and a plurality of historical temperature change amounts; Inputting the current magnetic field intensity change amount and the current temperature change amount into the prediction model to obtain defect information of the pipeline.

2. The method according to claim 1, wherein The dual-channel sensor includes a first channel and a second channel, the first channel and the second channel are respectively filled with different magnetosensitive materials, and the surfaces of the first channel and the second channel are covered with a composite sensitive layer; Detecting the current magnetic field and the current temperature through a dual-channel sensor disposed on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength, including: Absorbing y-polarized light through the first channel and performing spectral detection through a spectrometer to obtain a first spectrogram; Analyzing and processing the first spectrogram to obtain the first loss peak optical wavelength; Absorbing x-polarized light through the second channel and performing spectral detection through a spectrometer to obtain a second spectrogram; Analyzing and processing the second spectrogram to obtain the second loss peak optical wavelength.

3. The method according to claim 2, wherein Determining a current magnetic field intensity change amount and a current temperature change amount according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and a transfer matrix, including: Determining a first reference peak of the first channel and a second reference peak of the second channel; Determining a first offset value according to the first loss peak optical wavelength and the first reference peak; Determining a second offset value according to the second loss peak optical wavelength and the second reference peak; Determining the current magnetic field intensity change amount and the current temperature change amount according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix.

4. The method according to claim 3, characterized in that, The magnetic field sensitivity includes a first sensitivity of the first channel and a second sensitivity of the second channel, and the temperature sensitivity includes a third sensitivity of the first channel and a fourth sensitivity of the second channel; Determining the current magnetic field strength change amount and the current temperature change amount according to the first offset value, the second offset value, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix includes: Calculating the first offset value, the second offset value, the first sensitivity, the second sensitivity, the third sensitivity, and the fourth sensitivity through the transfer matrix to obtain the current magnetic field strength change amount and the current temperature change amount.

5. A detection device for a pipeline, characterized in that, Includes: A detection module for detecting the current magnetic field and the current temperature through a dual-channel sensor arranged on the pipeline wall to obtain a first loss peak optical wavelength and a second loss peak optical wavelength; A determination module for determining a plurality of first sample light waves and a plurality of second sample light waves, where the plurality of first sample light waves respectively correspond to a plurality of first magnetic field strengths, and the plurality of second sample light waves respectively correspond to a plurality of first temperatures; For any one of the channels of the dual-channel sensor, detecting the plurality of first sample light waves respectively through the channel to obtain a plurality of first sample loss peaks, and detecting the plurality of second sample light waves respectively through the channel to obtain a plurality of second sample loss peaks; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of first sample loss peaks and the plurality of first magnetic field strengths to obtain the magnetic field sensitivity of the dual-channel sensor; performing a fitting process on the plurality of loss peak offset values corresponding to the plurality of second sample loss peaks and the plurality of first temperatures to obtain the temperature sensitivity of the dual-channel sensor; A calculation module for determining the current magnetic field strength change amount and the current temperature change amount according to the first loss peak optical wavelength, the second loss peak optical wavelength, the magnetic field sensitivity, the temperature sensitivity, and the transfer matrix, where the transfer matrix is used to calculate the magnetic field strength change amount and the temperature change amount according to the offset value of the loss peak optical wavelength; A prediction module for determining a prediction model, where the prediction model is obtained by training a plurality of historical magnetic field strength change amounts and a plurality of historical temperature change amounts; Inputting the current magnetic field strength change amount and the current temperature change amount into the prediction model to obtain defect information of the pipeline.

6. An electronic device, characterized in that, Includes: A processor and a memory communicatively connected to the processor; The memory stores computer execution instructions; The processor executes the computer execution instructions stored in the memory to implement the method according to any one of claims 1-4.

7. A computer-readable storage medium, characterized in that, Computer execution instructions are stored in the computer-readable storage medium, and when the computer execution instructions are executed by a processor, they are used to implement the method according to any one of claims 1-4.

8. A computer program product, characterized in that, Includes a computer program, and when the computer program is executed by a processor, it implements the method according to any one of claims 1-4.

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