An explosion-proof test circuit based on IGCT power module

Abstract

The application discloses an explosion-proof test circuit based on an IGCT power module, wherein a first plate of a capacitor module is electrically connected with a first end of a first power test unit, a second plate of the capacitor module is electrically connected with a second end of a second power test unit, and the first power test unit and the second power test unit are connected in series. The first power test unit comprises a conductive pad and an insulating pad, or the second power test unit comprises a conductive pad and an insulating pad. In this way, a straight-through short-circuit fault between the first power test unit and the second power test unit is simulated through the insulating pad and the conductive pad, and the voltage information and the current information of the capacitor module when the straight-through circuit fault occurs are verified, so that the straight-through short-circuit fault test can be realized through the explosion-proof test module, a complete converter valve or valve section is not needed to be formed, the experimental condition is simple, and the test is convenient.

Description

TECHNICAL FIELD

[0001] The embodiment of the present application relates to the field of power electronics, in particular to an explosion-proof test circuit based on an IGCT power module. BACKGROUND

[0002] With the increasingly serious pollution problem caused by fossil energy and the continuous development of new energy power generation, efficient and reliable transmission of new energy power generation becomes a key problem. Since new energy power generation is often far away from the load center, for long-distance and large-capacity power transmission, flexible DC power transmission technology has significant advantages.

[0003] The core equipment of flexible DC power transmission is a converter valve, which undertakes key tasks such as AC-DC conversion, power flow control, and fault ride-through. The traditional flexible DC converter valve adopts a cascaded mode based on a crimped IGBT (Insulated Gate Bipolar Transistor) power module. The crimped IGBT device has advantages such as failure short circuit and double-sided heat dissipation, but due to its internal use of multi-chip parallel connection, the manufacturing cost is increased and the reliability of the device is reduced. Compared with IGBT, IGCT (Integrated Gate Commutated Thyristor) devices are integrated wafer structures, with lower on-state voltage drop, higher reliability, and lower manufacturing cost. Due to the differences in device composition and structure arrangement between IGCT power modules and IGBT power modules, complete explosion-proof performance test verification needs to be performed for IGCT power modules to meet the application requirements of flexible DC converter valves. SUMMARY

[0004] The present application provides an explosion-proof test circuit based on an IGCT power module, which simulates a straight-through short circuit fault between a first power test unit and a second power test unit through an insulating pad and a conductive pad, and verifies the voltage information and current information of the capacitor module during a straight-through circuit fault, so that the straight-through short circuit fault test can be realized through the explosion-proof test module, without the need to form a complete converter valve or valve section, the experimental conditions are simple, and the test is convenient.

[0005] In a first aspect, the embodiment of the present application provides an explosion-proof test circuit based on an IGCT power module, which includes a capacitor module, an explosion-proof test module, a voltage detection module, and a current detection module.

[0006] The explosion-proof test module includes a first power test unit and a second power test unit.

[0007] The first plate of the capacitor module is electrically connected to the first end of the first power test unit, the second plate of the capacitor module is electrically connected to the second end of the second power test unit, and the first power test unit and the second power test unit are connected in series.

[0008] The first power test unit comprises a conductive pad and an insulating pad, or the second power test unit comprises a conductive pad and an insulating pad.

[0009] The voltage detection module is configured to detect voltage information of the capacitor module when a through short circuit fault occurs between the first power test unit and the second power test unit.

[0010] The current detection module is configured to detect current information of the capacitor module when a through short circuit fault occurs between the first power test unit and the second power test unit.

[0011] Optionally, the first power test unit further comprises a first test device and a second test device, and the second power test unit further comprises a third test device and a fourth test device.

[0012] The first end of the first test device is electrically connected to the first pole plate of the capacitor module and the second end of the second test device, respectively; the second end of the first test device is electrically connected to the first end of the second test device and the first end of the third test device, respectively; the second end of the third test device is electrically connected to the second pole plate of the capacitor module and the first end of the fourth test device, respectively; and the second end of the fourth test device is electrically connected to the first end of the third test device.

[0013] Optionally, the through short circuit fault comprises a first through short circuit fault.

[0014] Under the first through short circuit fault, the first test device comprises a conductive pad, the second test device comprises an insulating pad, the third test device comprises a second integrated gate-commutated thyristor, and the fourth test device comprises a second diode.

[0015] The voltage detection module is configured to detect current information of the capacitor module when a through short circuit fault occurs between the conductive pad and the second integrated gate-commutated thyristor.

[0016] Optionally, the through short circuit fault comprises a first through short circuit fault.

[0017] Under the first through short circuit fault, the first test device comprises a first integrated gate-commutated thyristor, the second test device comprises a first diode, the third test device comprises a conductive pad, and the fourth test device comprises an insulating pad.

[0018] The voltage detection module is configured to detect current information of the capacitor module when a through short circuit fault occurs between the first integrated gate-commutated thyristor and the conductive pad.

[0019] Optionally, the through short circuit fault includes a second through short circuit fault.

[0020] In the second through short circuit fault, the first test device includes an insulating pad, the second test device includes a conductive pad, the third test device includes a second integrated gate-commutated thyristor, and the fourth test device includes a second diode.

[0021] The voltage detection module is configured to detect the current information of the capacitor module when a through short circuit fault occurs between the conductive pad and the second integrated gate-commutated thyristor.

[0022] Optionally, the through short circuit fault includes a third through short circuit fault.

[0023] In the third through short circuit fault, the first test device includes a first integrated gate-commutated thyristor, the second test device includes a first diode, the third test device includes an insulating pad, and the fourth test device includes a conductive pad. The voltage detection module is configured to detect the current information of the capacitor module when a through short circuit fault occurs between the first integrated gate-commutated thyristor and the conductive pad.

[0024] Optionally, the explosion-proof test circuit further includes a plurality of heat dissipation devices, and intervals are arranged between adjacent heat dissipation devices. The first test device, the second test device, the third test device, and the fourth test device are arranged in different intervals.

[0025] Optionally, the explosion-proof test circuit further includes a clamping circuit, and the clamping circuit is arranged in a circuit between the capacitor module and the explosion-proof test module.

[0026] Optionally, the clamping circuit includes an anode reactor, a clamping capacitor, a clamping resistor, and a clamping diode. A first end of the anode reactor is electrically connected to a first end of the current detection module and a first end of the clamping resistor, respectively. A second end of the anode reactor is electrically connected to a first end of the clamping diode and a first end of the first power test unit, respectively. A second end of the clamping diode is electrically connected to a first plate of the clamping capacitor and a second end of the clamping resistor, respectively. A second plate of the clamping capacitor is electrically connected to a second plate of the capacitor module and a second end of the second power test unit, respectively.

[0027] Optionally, the explosion-proof test circuit further includes a bypass switch, and the bypass switch is connected in parallel with the second power test unit.

[0028] The embodiment of the present application provides a kind of based on IGCT power module's explosion-proof test circuit, the explosion-proof test circuit includes capacitor module, explosion-proof test module, voltage detection module and current detection module.Explosion-proof test module includes first power test unit and second power test unit.Capacitor module's first pole plate is electrically connected with the first end of first power test unit, capacitor module's second pole plate is electrically connected with the second end of second power test unit, and first power test unit and second power test unit are connected in series.First power test unit includes conducting pad and insulating pad, or second power test unit includes conducting pad and insulating pad.Voltage detection module is used to detect the voltage information of capacitor module when through short-circuit fault occurs between first power test unit and second power test unit.Current detection module is used to detect the current information of capacitor module when through short-circuit fault occurs between first power test unit and second power test unit.In this way, through short-circuit fault between first power test unit and second power test unit is simulated by insulating pad and conducting pad, and the current information of capacitor module and the current information of capacitor module when through circuit fault are verified, in this way, through short-circuit fault test can be realized by explosion-proof test module, without forming complete converter valve or valve section, experimental condition is simple, and test is convenient. BRIEF DESCRIPTION OF DRAWINGS

[0029] Figure 1 It is the structural schematic diagram of the explosion-proof test circuit provided by the embodiment of the present application;

[0030] Figure 2 It is the structural schematic diagram of another explosion-proof test circuit provided by the embodiment of the present application;

[0031] Figure 3 It is the structural schematic diagram of another explosion-proof test circuit provided by the embodiment of the present application;

[0032] Figure 4 It is the structural schematic diagram of another explosion-proof test circuit provided by the embodiment of the present application;

[0033] Figure 5 It is the structural diagram of the explosion-proof test circuit provided by the embodiment of the present application under the third through short-circuit fault. DETAILED DESCRIPTION

[0034] To make the purpose, technical scheme and advantages of the present application more clear, the following will be combined with the drawings in the embodiment of the present application, and the technical scheme of the present application will be described completely by specific implementation ways.It is obvious that the described embodiment is a part of the embodiment of the present application, not all the embodiments, and all other embodiments obtained by the person skilled in the art without doing creative work based on the embodiment of the present application, fall within the protection scope of the present application.

[0035] It is to be understood that the terms "first", "second", and the like, used in the description and the claims of the application, as well as the above-described drawings, are used to distinguish similar objects and are not necessarily used to describe a particular sequential or chronological order. It is to be understood that the use of data so designated is not meant to limit, and will not serve to limit, the described embodiments of the application to only such potentially illustrative embodiments described herein. Further, the terms "include", "comprise", and "have", and variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, product, or apparatus that comprises a list of steps or units are not necessarily limited to those steps or units specifically listed, but can include additional steps or units not expressly listed or inherent to such process, method, product, or apparatus.

[0036] Figure 1 is a structural schematic diagram of an explosion-proof test circuit provided by an embodiment of the application. Referring to Figure 1 , the explosion-proof test circuit comprises a capacitor module 10, an explosion-proof test module 20, a voltage detection module 30, and a current detection module 40. The explosion-proof test module 20 comprises a first power test unit 210 and a second power test unit 220. A first plate of the capacitor module 10 is electrically connected to a first end of the first power test unit 210, and a second plate of the capacitor module 10 is electrically connected to a second end of the second power test unit 220. The first power test unit 210 and the second power test unit 220 are connected in series. The first power test unit 210 comprises a conductive pad AA and an insulating pad BB, or the second power test unit 220 comprises a conductive pad AA and an insulating pad BB. The voltage detection module 30 is configured to detect voltage information of the explosion-proof test module 20 when a straight-through short circuit fault occurs between the first power test unit 210 and the second power test unit 220. The current detection module 40 is configured to detect current information of the capacitor module 10 when the straight-through short circuit fault occurs between the first power test unit 210 and the second power test unit 220.

[0037] Specifically, the explosion-proof test circuit comprises the capacitor module 10 and the explosion-proof test module 20. The capacitor module 10 can comprise a capacitor 110 and a direct current power supply 120. A positive terminal of the direct current power supply 120 is electrically connected to a first plate of the capacitor 110, and a negative terminal of the direct current power supply 120 is electrically connected to a second plate of the capacitor 110, so as to charge the capacitor 110 through the direct current power supply 120. The explosion-proof test module 20 comprises the first power test unit 210 and the second power test unit 220. The first plate of the capacitor 110 is further electrically connected to a first end of the first power test unit 210, and the second plate of the capacitor module 10 is electrically connected to a second end of the second power test unit 220. The first power test unit 210 and the second power test unit 220 are connected in series, i.e., the capacitor 110, the first power test unit 210, and the second power test unit 220 form a loop to meet the test conditions.

[0038] In the prior art, the IGCT power module includes two series-connected power devices, each of which includes an integrated gate-commutated thyristor and a diode in anti-parallel. On this basis, the explosion-proof test module 20 of the embodiment of the present application replaces part of the integrated gate-commutated thyristor and diode in the IGCT power module with a conductive pad AA or an insulating pad BB, and the remaining integrated gate-commutated thyristor and diode remain unchanged, thereby simulating a shoot-through short circuit fault between the two series-connected power devices. For example, the explosion-proof test module 20 includes a first power test unit 210 and a second power test unit 220, the integrated gate-commutated thyristor and diode in the first power test unit 210 can be replaced with a conductive pad AA and an insulating pad BB, and the integrated gate-commutated thyristor and diode in the second power test unit 220 remain unchanged, or the integrated gate-commutated thyristor and diode in the second power test unit 220 can be replaced with a conductive pad AA and an insulating pad BB, and the integrated gate-commutated thyristor and diode in the first power test unit 210 remain unchanged, thereby simulating different shoot-through short circuit faults between the first power test unit 210 and the second power test unit 220. In addition, the explosion-proof test circuit further includes a voltage detection module 30 and a current detection module 40. For example, the voltage detection module 30 is electrically connected to the first and second plates of the capacitor 110, respectively, and thereby detects the voltage information of the capacitor 110 when a shoot-through short circuit fault occurs between the first power test unit 210 and the second power test unit 220 through the voltage detection module 30. The current detection module 40 can be connected in series between the capacitor module 10 and the explosion-proof test module 20, and thereby detects the current information of the capacitor 110 when a shoot-through short circuit fault occurs between the first power test unit 210 and the second power test unit 220 through the current detection module 40. And the explosion-proof test result is verified by the current information and voltage information of the capacitor 110 when a shoot-through short circuit fault occurs. In this way, the shoot-through short circuit fault between the first power test unit 210 and the second power test unit 220 is simulated by the insulating pad BB and the conductive pad AA, and the voltage information and current information of the capacitor module 10 when a shoot-through circuit fault occurs are verified, which can be realized by the entire explosion-proof test circuit without the need to form a complete commutation valve or valve section, the experimental conditions are simple, and the test is convenient.

[0039] In summary, the embodiment of the present application provides an explosion-proof test circuit based on an IGCT power module, which comprises a capacitor module, an explosion-proof test module, a voltage detection module and a current detection module. The explosion-proof test module comprises a first power test unit and a second power test unit. The first pole plate of the capacitor module is electrically connected with the first end of the first power test unit, and the second pole plate of the capacitor module is electrically connected with the second end of the second power test unit, and the first power test unit and the second power test unit are connected in series. The first power test unit comprises a conductive pad and an insulating pad, or the second power test unit comprises a conductive pad and an insulating pad. The voltage detection module is used for detecting the voltage information of the capacitor module when a straight-through short circuit fault occurs between the first power test unit and the second power test unit. The current detection module is used for detecting the current information of the capacitor module when a straight-through short circuit fault occurs between the first power test unit and the second power test unit. In this way, the straight-through short circuit fault between the first power test unit and the second power test unit is simulated by the insulating pad and the conductive pad, and the current information of the capacitor module and the current information of the capacitor module when a straight-through circuit fault occurs are verified, which can be realized only by the entire explosion-proof test circuit, without the need to form a complete converter valve or valve section, the experimental conditions are simple, and the test is convenient.

[0040] Optionally, on the basis of the above-mentioned embodiment, continuing to refer to Figure 1 The first power test unit 210 further comprises a first test device 2101 and a second test device 2102, and the second power test unit 220 further comprises a third test device 2203 and a fourth test device 2204. The first end of the first test device 2101 is electrically connected with the first pole plate of the capacitor module 10 and the second end of the second test device 2102 respectively, the second end of the first test device 2101 is electrically connected with the first end of the second test device 2102 and the first end of the third test device 2203 respectively, the second end of the third test device 2203 is electrically connected with the second pole plate of the capacitor module 10 and the first end of the fourth test device 2204 respectively, and the second end of the fourth test device 2204 is electrically connected with the first end of the third test device 2203.

[0041] Specifically, the first test device 2101 is located at the position of the first integrated gate-commutated thyristor of the IGCT power module, i.e. the first test device 2101 can be one of the first integrated gate-commutated thyristor, the insulating pad BB or the conductive pad AA. The second test device 2102 is located at the position of the first diode of the IGCT power module. Then the second test device 2102 can be one of the first diode, the insulating pad BB or the conductive pad AA. Similarly, the third test device 2203 is located at the position of the second integrated gate-commutated thyristor of the IGCT power module, and the third test device 2203 includes one of the second integrated gate-commutated thyristor, the insulating pad BB or the conductive pad AA. The fourth test device 2204 is located at the position of the second diode of the IGCT power module, and the fourth test device 2204 can be one of the second diode, the insulating pad BB or the conductive pad AA. It can be understood that when the devices in the IGCT power module include the conductive pad AA and the insulating pad BB, it is the explosion-proof test module 20 in the present application.

[0042] Optionally, on the basis of the above embodiment, continuing to refer to Figure 1 The through short circuit fault includes a first through short circuit fault. Under the first through short circuit fault, the first test device 2101 includes the conductive pad AA, the second test device 2102 includes the insulating pad BB, the third test device 2203 includes the second integrated gate-commutated thyristor T2, and the fourth test device 2204 includes the second diode D2. The voltage detection module 30 is configured to detect the current information of the capacitor module 10 when the through short circuit fault occurs between the conductive pad AA and the second integrated gate-commutated thyristor T2.

[0043] For example, Figure 1In the shown embodiment, the first power test unit 210 includes the conductive pad AA and the insulating pad BB, and the second power test unit 220 keeps the original IGCT power module devices. That is, the first test device 2101 includes the conductive pad AA, the second test device 2102 includes the insulating pad BB, the third test device 2203 includes the second integrated gate-commutated thyristor T2, and the fourth test device 2204 includes the second diode D2. Thus, after the DC power supply 120 charges the capacitor 110 and charges the capacitor 110 to the rated voltage, the second integrated gate-commutated thyristor T2 is triggered to conduct, and the capacitor 110 is discharged. Since the first test device 2101 is turned on (including the conductive pad AA) and the second test device 2102 is turned off (including the insulating pad BB), a through short circuit fault between the first test device 2101 and the third test device 2203 can be simulated, that is, a through short circuit fault between the conductive pad AA and the second integrated gate-commutated thyristor T2. Then, the voltage detection module 30 and the current detection module 40 detect the voltage information and the current information when the through short circuit fault occurs between the first test device 2101 and the third test device 2203, respectively, to verify the simulation results under the first through circuit fault. It can be understood that the through short circuit fault between the first test device 2101 and the third test device 2203 is the first through short circuit fault. In this way, it is not necessary to form a complete converter valve or valve section, but only to replace the integrated gate-commutated thyristor and diode in the IGCT power module with the insulating pad BB and the conductive pad AA, which is simple in experimental conditions and convenient in testing.

[0044] Optionally, in yet another embodiment, Figure 2 is another structure diagram of the explosion-proof test circuit provided by the embodiment of the present application. Referring to Figure 2 , the through short circuit fault includes the first through short circuit fault. Under the first through short circuit fault, the first test device 2101 includes the first integrated gate-commutated thyristor T1, the second test device 2102 includes the first diode D1, the third test device 2203 includes the conductive pad AA, and the fourth test device 2204 includes the insulating pad BB. The voltage detection module 30 is used to detect the current information of the capacitor module 10 when the through short circuit fault occurs between the first integrated gate-commutated thyristor T1 and the conductive pad AA.

[0045] For example, Figure 2In the shown embodiment, the first shoot-through short circuit fault can also be simulated in other ways, i.e. the second power test unit 220 comprises a conductive pad AA and an insulating pad BB, and the first power test unit 210 holds the devices of the IGCT power module. Specifically, the first test device 2101 comprises a first integrated gate-commutated thyristor T1, the second test device 2102 comprises a first diode D1, the third test device 2203 comprises the conductive pad AA, and the fourth test device 2204 comprises the insulating pad BB. In this way, after the DC power supply 120 charges the capacitor 110, and charges the capacitor 110 to the rated voltage, the first integrated gate-commutated thyristor T1 is triggered to conduct, and the capacitor 110 is discharged, and since the third test device 2203 is turned on (comprising the conductive pad AA) and the fourth test device 2204 is turned off (comprising the insulating pad BB), a shoot-through short circuit fault between the first test device 2101 and the third test device 2203, i.e. a shoot-through short circuit fault between the first integrated gate-commutated thyristor T1 and the conductive pad AA, can be simulated. Then the voltage detection module 30 and the current detection module 40 are used to detect the voltage information and the current information when the shoot-through short circuit fault occurs between the first test device 2101 and the third test device 2203, so as to verify the simulation result under the first shoot-through circuit fault. In this way, without the need to form a complete converter valve or valve section, only by replacing the integrated gate-commutated thyristor and diode of the second power test unit 220 with the conductive pad AA and the insulating pad BB respectively, the shoot-through short circuit fault between the first test device 2101 and the third test device 2203 can be simulated, and the experimental conditions are simple and the test is convenient.

[0046] In yet another embodiment, Figure 3 is another structure diagram of an explosion-proof test circuit provided by an embodiment of the present application. Referring to Figure 3 , the shoot-through short circuit fault comprises a second shoot-through short circuit fault. Under the second shoot-through short circuit fault, the first test device 2101 comprises an insulating pad BB, the second test device 2102 comprises a conductive pad AA, the third test device 2203 comprises a second integrated gate-commutated thyristor T2, and the fourth test device 2204 comprises a second diode D2. The voltage detection module 30 is used to detect the current information of the capacitor module 10 when the shoot-through short circuit fault occurs between the conductive pad AA and the second integrated gate-commutated thyristor T2.

[0047] For example, Figure 3In the shown embodiment, the first power test unit 210 includes the conductive pad AA and the insulating pad BB, and the second power test unit 220 keeps the original IGCT power module devices. That is, the first test device 2101 includes the insulating pad BB, the second test device 2102 includes the conductive pad AA, the third test device 2203 includes the second integrated gate-commutated thyristor T2, and the fourth test device 2204 includes the second diode D2. In this way, when the DC power supply 120 charges the capacitor 110, and the capacitor 110 is charged to the rated voltage, the second integrated gate-commutated thyristor T2 is triggered to conduct, and the capacitor 110 is discharged. Since the second test device 2102 is turned on (including the conductive pad AA), the first test device 2101 is turned off (including the insulating pad BB), and thus the through short circuit fault between the second test device 2102 and the third test device 2203, i.e. the through short circuit fault between the conductive pad AA and the second integrated gate-commutated thyristor T2, can be simulated. Then, the voltage information and the current information when the through short circuit fault occurs between the second test device 2102 and the third test device 2203 are detected by the voltage detection module 30 and the current detection module 40 respectively, so as to verify the simulation result under the second through circuit fault. It can be understood that the through short circuit fault between the second test device 2102 and the third test device 2203 is the second through short circuit fault. In this way, without forming a complete converter valve or valve segment, the through short circuit fault between the second test device 2102 and the third test device 2203 can be simulated by replacing the integrated gate-commutated thyristor and the diode of the first power test unit 210 with the insulating pad BB and the conductive pad AA, and the experimental conditions are simple and the test is convenient.

[0048] It should be noted that the second through short circuit fault between the second test device 2102 and the third test device 2203 is divided into two cases. One fault case is that the second test device 2102 fails and the third test device 2203 is turned on to form a through short circuit. The other fault case is that the third test device 2203 withstands voltage breakdown to form a through short circuit. It can be understood that the same simulation method can be used for the two fault cases, i.e. the first test device 2101 includes the insulating pad BB, the second test device 2102 includes the conductive pad AA, the third test device 2203 includes the second integrated gate-commutated thyristor T2, and the fourth test device 2204 includes the second diode D2.

[0049] Optionally, in another embodiment, Figure 4 is another structure diagram of the explosion-proof test circuit provided by the embodiment of the present application. Referring to Figure 4The third through fault includes a third through short circuit fault. In the third through short circuit fault, the first test device 2101 includes a first integrated gate-commutated thyristor T1, the second test device 2102 includes a first diode D1, the third test device 2203 includes an insulating pad BB, and the fourth test device 2204 includes a conductive pad AA. The voltage detection module 30 is configured to detect the voltage information of the capacitor module 10 when the through short circuit fault occurs between the first integrated gate-commutated thyristor T1 and the conductive pad AA.

[0050] As shown in the embodiment, Figure 4 In the embodiment, the second power test unit 220 includes the conductive pad AA and the insulating pad BB, and the first power test unit 210 retains the original devices of the IGCT power module. That is, the first test device 2101 includes the first integrated gate-commutated thyristor T1, the second test device 2102 includes a second diode D2, the third test device 2203 includes the insulating pad BB, and the fourth test device 2204 includes the conductive pad AA. Thus, when the DC power supply 120 charges the capacitor 110 and charges the capacitor 110 to the rated voltage, the first integrated gate-commutated thyristor T1 is triggered to conduct, the capacitor 110 is discharged, and because the fourth test device 2204 is turned on (including the conductive pad AA) and the third test device 2203 is turned off (including the insulating pad BB), the through short circuit fault between the first test device 2101 and the fourth test device 2204, i.e., the through short circuit fault between the conductive pad AA and the first integrated gate-commutated thyristor T1, can be simulated. Then, the voltage detection module 30 and the current detection module 40 are used to detect the voltage information and the current information when the through short circuit fault occurs between the first test device 2101 and the fourth test device 2204, respectively, to verify the simulation result under the third through circuit fault. It can be understood that the through short circuit fault between the first test device 2101 and the fourth test device 2204 is the third through short circuit fault. Thus, without forming a complete converter valve or valve segment, the through short circuit fault between the first test device 2101 and the fourth test device 2204 can be simulated by replacing the integrated gate-commutated thyristor and the diode of the second power test unit 220 with the insulating pad BB and the conductive pad AA, and the experimental conditions are simple and the test is convenient.

[0051] Optionally, based on the above embodiment, Figure 5 is a structure diagram of an explosion-proof test circuit under a third through short circuit fault according to an embodiment of the present application. Referring to Figure 5 The explosion-proof test circuit further includes a plurality of heat dissipation devices 50. Adjacent heat dissipation devices 50 are provided with a spacing. The first test device 2101, the second test device 2102, the third test device 2203, and the fourth test device 2204 are arranged in different spacings.

[0052] Specifically, the first test device 2101, the second test device 2102, the third test device 2203 and the fourth test device 2204 are arranged between adjacent heat dissipation devices 50, and the heat dissipation devices 50 dissipate heat for the first test device 2101, the second test device 2102, the third test device 2203 and the fourth test device 2204, so as to ensure the heat dissipation of the explosion-proof test circuit in the normal operation process.

[0053] Optionally, based on the above embodiment, continuing to refer to Figure 1 The explosion-proof test circuit further comprises a clamping circuit 60. The clamping circuit 60 is arranged in the circuit between the capacitor module 10 and the explosion-proof test module 20.

[0054] Specifically, when the devices in the IGCT power module include the conductive pad AA and the insulating pad BB, the explosion-proof test module 20 in the present application is formed. Since the IGCT power module itself has the characteristic that the conduction process of the IGCT power module is positive feedback conduction, the clamping circuit 60 needs to be added to ensure the normal work of the IGCT power module.

[0055] Illustratively, the clamping circuit 60 comprises an anode reactor L, a clamping capacitor C, a clamping resistor RS and a clamping diode DL. The first end of the anode reactor L is electrically connected with the first end of the current detection module 40 and the first end of the clamping resistor RS respectively, the second end of the anode reactor L is electrically connected with the first end of the first power test unit 210 and the first end of the clamping diode DL respectively, the second end of the clamping diode DL is electrically connected with the first plate of the clamping capacitor C and the second end of the clamping resistor RS respectively, and the second plate of the clamping capacitor C is electrically connected with the second plate of the capacitor module 10 and the second end of the second power test unit 220 respectively. In this way, the anode reactor L limits the current change rate of the conduction process of the explosion-proof test module 20, and the clamping capacitor C, the clamping resistor RS and the clamping diode DL absorb the voltage spike caused by the anode reactor L, so as to ensure the normal work of the explosion-proof test module 20.

[0056] Optionally, based on the above embodiment, continuing to refer to Figure 1 The explosion-proof test module 20 further comprises a bypass switch S. The bypass switch S is connected in parallel with the second power test unit 220. In this way, the bypass switch S connected in parallel with the second power test unit 220 further ensures the normal work of the explosion-proof test module 20.

[0057] Note that the above merely describes preferred embodiments of the present application and the principles of the technology applied. Those skilled in the art will understand that the present application is not limited to the specific embodiments described herein, and that various obvious changes, modifications and substitutions can be made without departing from the scope of the present application. Therefore, although the present application has been described in detail through the above embodiments, the present application is not limited to the above embodiments, and can include more other equivalent embodiments without departing from the concept of the present application, and the scope of the present application is determined by the scope of the claims.

Claims

1. An explosion-proof test circuit based on an IGCT power module, characterized in that, The explosion-proof test circuit comprises a capacitor module, an explosion-proof test module, a voltage detection module and a current detection module. The explosion-proof test module comprises a first power test unit and a second power test unit. A first pole plate of the capacitor module is electrically connected to a first end of the first power test unit, and a second pole plate of the capacitor module is electrically connected to a second end of the second power test unit. The voltage detection module is configured to detect voltage information of the capacitor module when a straight-through short circuit fault occurs between the first power test unit and the second power test unit. The current detection module is configured to detect current information of the capacitor module when the straight-through short circuit fault occurs between the first power test unit and the second power test unit. The first power test unit further comprises a first test device and a second test device, and the second power test unit further comprises a third test device and a fourth test device. The first test device is located at a position of a first integrated gate-commutated thyristor of the IGCT power module, the second test device is located at a position of a first diode of the IGCT power module, the third test device is located at a position of a second integrated gate-commutated thyristor of the IGCT power module, and the fourth test device is located at a position of a second diode of the IGCT power module. The straight-through short circuit fault comprises a first straight-through short circuit fault. In the first straight-through short circuit fault, the first test device is a conductive pad, the second test device is an insulating pad, the third test device is a second integrated gate-commutated thyristor, and the fourth test device is a second diode. The voltage detection module is configured to detect voltage information of the capacitor module when a straight-through short circuit fault occurs between the conductive pad and the second integrated gate-commutated thyristor. Or in the first straight-through short circuit fault, the first test device is a first integrated gate-commutated thyristor, the second test device is a first diode, the third test device is a conductive pad, and the fourth test device is an insulating pad. The voltage detection module is configured to detect voltage information of the capacitor module when a straight-through short circuit fault occurs between the first integrated gate-commutated thyristor and the conductive pad.

2. The explosion-proof test circuit according to claim 1, wherein a first end of the first test device is electrically connected to a first pole plate of the capacitor module and a second end of the second test device, respectively, a second end of the first test device is electrically connected to a first end of the second test device and a first end of the third test device, respectively, a second end of the third test device is electrically connected to a second pole plate of the capacitor module and a first end of the fourth test device, respectively, and a second end of the fourth test device is electrically connected to a first end of the third test device.

3. The explosion-proof test circuit according to claim 2, wherein the straight-through short circuit fault comprises a second straight-through short circuit fault. ​ ​ In the second through fault, the first test device is an insulating pad, the second test device is a conductive pad, the third test device is a second integrated gate-commutated thyristor, and the fourth test device is a second diode. The voltage detection module is configured to detect voltage information of the capacitor module when a through fault occurs between the conductive pad and the second integrated gate-commutated thyristor.

4. The explosion-proof test circuit of claim 2, wherein the through fault includes a third through fault; in the third through fault, the first test device is a first integrated gate-commutated thyristor, the second test device is a first diode, the third test device is an insulating pad, and the fourth test device is a conductive pad; the voltage detection module is configured to detect voltage information of the capacitor module when a through fault occurs between the first integrated gate-commutated thyristor and the conductive pad.

5. The explosion-proof test circuit of claim 2, wherein the explosion-proof test circuit further comprises a plurality of heat dissipation devices; adjacent heat dissipation devices are separated by a space; the first test device, the second test device, the third test device, and the fourth test device are arranged in different spaces.

6. The explosion-proof test circuit of claim 1, wherein the explosion-proof test circuit further comprises a clamping circuit; the clamping circuit is arranged in a circuit between the capacitor module and the explosion-proof test module.

7. The explosion-proof test circuit of claim 6, wherein the clamping circuit comprises an anode reactor, a clamping capacitor, a clamping resistor, and a clamping diode; a first end of the anode reactor is electrically connected to a first end of a current detection module and a first end of the clamping resistor, a second end of the anode reactor is electrically connected to a first end of the clamping diode and a first end of a first power test unit, a second end of the clamping diode is electrically connected to a first plate of the clamping capacitor and a second end of the clamping resistor, a second plate of the clamping capacitor is electrically connected to a second plate of the capacitor module and a second end of the second power test unit.

8. The explosion-proof test circuit of claim 1, wherein the explosion-proof test circuit further comprises a bypass switch; the bypass switch is connected in parallel to the second power test unit.

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