Parameter group determination method, device and related equipment

Abstract

The present invention discloses a parameter group determination method, device and related equipment, which relate to the technical field of air-core inductors, wherein the parameter group determination method comprises the following steps: obtaining multiple grid division parameter groups that meet the rules of an orthogonal test table according to a preset inductor structure parameter group; obtaining multiple first simulated inductances and multiple simulated equivalent resistances; obtaining a first preferred parameter group and a second preferred parameter group; obtaining an optimal grid division parameter group according to the first preferred parameter group and the second preferred parameter group. The parameter group determination method of the present application can solve the problem that it is difficult to quickly determine the grid division parameter group corresponding to the accurate simulation result in the existing air-core inductor electromagnetic simulation process, thereby it is difficult to quickly and accurately determine the preferred inductor structure, and can quickly determine the grid division parameter group corresponding to the accurate simulation result, thereby quickly and accurately determining the preferred inductor structure.

Description

Technical Field

[0001] The invention belongs to the technical field of air-core inductors, and in particular relates to a parameter group determination method, device and related equipment. Background Art

[0002] The existing method for improving the quality factor of radio frequency air-core inductors and saving costs generally involves selecting an inductor structure with a higher quality factor within a certain inductor size range.

[0003] However, due to the simultaneous existence of skin effect and proximity effect in the transmission process of RF signals, the traditional method of directly calculating the inductor quality factor is difficult to accurately calculate the quality factor of the RF hollow inductor, and thus it is difficult to determine whether the selected inductor structure is a better inductor structure within the preset inductor size range. Therefore, the existing method of selecting the inductor structure of the RF hollow inductor is generally to perform electromagnetic simulation of the hollow inductor according to the selected inductor structure based on electromagnetic simulation software to calculate and obtain the quality factor of the simulated inductor as the simulation result, and select the inductor structure corresponding to the simulated inductor with the highest quality factor. Among them, meshing is required in the electromagnetic simulation process of the hollow inductor. Since the accuracy of the electromagnetic simulation result of the hollow inductor is closely related to the meshing accuracy of the electromagnetic simulation, it is necessary to select a suitable meshing parameter group (a combination of parameters that characterize the meshing accuracy) to obtain the quality factor of the simulated inductor with high accuracy. However, since the number of meshing parameter groups is generally large, it is difficult for the existing electromagnetic simulation process of the hollow inductor to quickly determine the meshing parameter group corresponding to the accurate simulation result, and thus it is difficult to quickly and accurately determine the preferred inductor structure.

[0004] Therefore, the existing technology needs to be improved and developed. Summary of the invention

[0005] The purpose of the present application is to provide a parameter group determination method, device and related equipment, aiming to solve the problem that it is difficult to quickly determine the grid division parameter group corresponding to the accurate simulation result in the existing air-core inductor electromagnetic simulation process, and thus it is difficult to quickly and accurately determine the preferred inductor structure.

[0006] In a first aspect, the present application provides a parameter group determination method for determining an optimal mesh partitioning parameter group for electromagnetic simulation of an air-core inductor, comprising the following steps:

[0007] S1. Obtaining multiple grid partitioning parameter groups that meet the orthogonal test table rules according to the preset inductor structure parameter group;

[0008] S2. Perform electromagnetic simulation of the air-core inductor according to a preset inductor structure parameter group and a plurality of mesh partition parameter groups to obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances;

[0009] S3. Screening the levels of all meshing parameters in the meshing parameter group according to the first simulated inductance and the simulated equivalent resistance to obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance;

[0010] S4. Obtain an optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group.

[0011] The parameter group determination method of the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0012] Furthermore, the orthogonal test table is L9[3 4 ]Orthogonal test table.

[0013] Furthermore, in step S3, the levels of all meshing parameters in the meshing parameter group are screened to obtain the first preferred parameter group and the second preferred parameter group, including:

[0014] S31. Calculate and obtain a plurality of first average values ​​and a plurality of second average values, wherein the first average value is an average value of the first simulated inductance corresponding to all meshing parameter groups having the same type and level of meshing parameters, and the second average value is an average value of the simulated equivalent resistance corresponding to all meshing parameter groups having the same type and level of meshing parameters;

[0015] S32. Filter and obtain the first preferred level and the second preferred level corresponding to each type of grid division parameter based on the first average value and the second average value, and respectively combine the first preferred level corresponding to each type of grid division parameter and the second preferred level corresponding to each type of grid division parameter to obtain the first preferred parameter group and the second preferred parameter group, the first preferred level is the preferred level of the corresponding grid division parameter regarding the first simulated inductance, and the second preferred level is the preferred level of the corresponding grid division parameter regarding the simulated equivalent resistance.

[0016] In this embodiment, the parameter group determination method of the present application can quickly and accurately screen and obtain the first preferred level and the second preferred level through the first average value and the second average value, thereby ensuring that the first preferred parameter group and the second preferred parameter group are the preferred parameter groups of the first simulated inductance and the simulated equivalent resistance, respectively.

[0017] Furthermore, between step S31 and step S4, the following steps are also included:

[0018] A1. Calculate the range of all first average values ​​corresponding to each grid partition parameter to obtain the first range, and combine the types of grid partition parameters corresponding to all first range values ​​greater than or equal to the first range threshold to obtain a first significant type group, or calculate the range of all second average values ​​corresponding to each grid partition parameter to obtain the second range, and combine the types of grid partition parameters corresponding to all second range values ​​greater than or equal to the second range threshold to obtain a second significant type group;

[0019] In step S4, the process of obtaining the optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group includes:

[0020] S41. Obtain a second replacement parameter level according to the second preferred level corresponding to the second significant category group in the second preferred parameter group, and replace the corresponding first preferred level in the first preferred parameter group with the second replacement parameter level to obtain an optimal grid partitioning parameter group;

[0021] Or, a first replacement parameter level is obtained according to a first preferred level corresponding to the first significant category group in the first preferred parameter group, and the first replacement parameter level is used to replace the corresponding second preferred level in the second preferred parameter group to obtain an optimal grid partitioning parameter group.

[0022] In this embodiment, the parameter group determination method of the present application can perform analysis based on the more important grid division parameter level to obtain the optimal grid division parameter group, and the present application simultaneously considers the two factors of the first simulated inductance and the simulated equivalent resistance, so that the obtained optimal grid division parameter group can be the preferred parameter group regarding the first simulated inductance and the simulated equivalent resistance.

[0023] In a second aspect, the present application provides a parameter group determination method for determining an optimal inductor structure parameter group for electromagnetic simulation of an air-core inductor, comprising the following steps:

[0024] S5. Acquire multiple inductor structure parameter groups that meet the orthogonal test table rules according to the preset inductor size, take one of the inductor structure parameter groups as the preset inductor structure parameter group, and generate the optimal grid division parameter group based on any of the above parameter group determination methods;

[0025] S6. Perform electromagnetic simulation of the air-core inductor according to the optimal grid partition parameter group and the multiple inductor structure parameter groups to obtain multiple second simulated inductances and multiple simulated quality factors;

[0026] S7. Screen the levels of all inductor structure parameters in the inductor structure parameter group according to the second simulated inductance and the simulated quality factor to obtain an optimal inductor structure parameter group, wherein the optimal inductor structure parameter group includes third preferred levels corresponding to each inductor structure parameter, and the third preferred level is the level of the inductor structure parameter with the highest comprehensive score, and the comprehensive score is calculated based on the corresponding second simulated inductance and the simulated quality factor.

[0027] The parameter group determination method of the present application can effectively reduce the number of simulations, improve simulation efficiency, and can quickly determine the optimal grid division parameter group and the optimal inductor structure parameter group, so that the quality factor of the simulated inductor corresponding to the optimal grid division parameter group can be accurate, and the quality factor and inductance of the simulated inductor corresponding to the optimal inductor structure parameter group of the present application are optimal in combination, thereby being able to quickly and accurately determine the preferred inductor structure.

[0028] Furthermore, the calculation formula for the comprehensive score is: S=w1*L / (|L2-L|)+w2*Q, |L2-L|≥1, and S=w1*L+w2*Q, 0≤|L2-L|<1, where S is the comprehensive score, L2 is the second simulated inductance corresponding to S, L is the inductance target value, Q is the simulated quality factor corresponding to S, w1 and w2 are the inductance weight and quality factor weight, respectively.

[0029] Furthermore, the parameter group determination method further includes:

[0030] S8. Compare the optimal inductor structure parameter group with all the inductor structure parameter groups in the orthogonal test table. When all the inductor structure parameter groups in the orthogonal test table are not the optimal inductor structure parameter group, perform electromagnetic simulation of the air-core inductor according to the optimal grid partition parameter group and the optimal inductor structure parameter group to obtain candidate simulation inductance and candidate simulation quality factor, calculate the candidate comprehensive score according to the candidate simulation inductance and the candidate simulation quality factor, and compare the candidate comprehensive score with the comprehensive scores corresponding to all the inductor structure parameter groups to verify the optimal inductor structure parameter group.

[0031] The parameter group determination method of the present application can effectively reduce the number of simulations, improve simulation efficiency, and can quickly determine the optimal grid division parameter group and the optimal inductor structure parameter group, so that the quality factor of the simulated inductor corresponding to the optimal grid division parameter group can be accurate, and the simulated inductor quality factor and inductance corresponding to the optimal inductor structure parameter group of the present application are optimal in combination, thereby being able to quickly and accurately determine the preferred inductor structure.

[0032] In a third aspect, the present application provides a parameter group determination device for determining an optimal mesh partitioning parameter group for electromagnetic simulation of an air-core inductor, comprising:

[0033] A first acquisition module is used to acquire a plurality of grid division parameter groups that meet the orthogonal test table rules according to a preset inductor structure parameter group;

[0034] A first simulation module, used to perform electromagnetic simulation of the air-core inductor according to a preset inductor structure parameter group and a plurality of grid division parameter groups, and obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances;

[0035] A screening module, used to screen the levels of all mesh partitioning parameters in the mesh partitioning parameter group according to the first simulated inductance and the simulated equivalent resistance, and obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance;

[0036] The second acquisition module is used to acquire the optimal grid division parameter group according to the first preferred parameter group and the second preferred parameter group.

[0037] The parameter group determination device of the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0038] In a fourth aspect, the present application provides an electronic device, including a processor and a memory, wherein the memory stores a computer program executable by the processor, and when the processor executes the computer program, it runs the steps in any of the above methods.

[0039] In a fifth aspect, the present application provides a storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps in any of the above methods are performed.

[0040] From the above, it can be seen that the present application provides a parameter group determination method, device and related equipment, wherein the parameter group determination method provided by the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0041] Other features and advantages of the present application will be described in the following description, and partly become apparent from the description, or be understood by practicing the embodiments of the present application. The purpose and other advantages of the present application can be realized and obtained by the structures specifically pointed out in the written description and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] Figure 1 A flowchart of a parameter group determination method for determining an optimal mesh partitioning parameter group for electromagnetic simulation of an air-core inductor provided in an embodiment of the present application.

[0043] Figure 2 A flowchart of a parameter group determination method for determining an optimal inductor structure parameter group for electromagnetic simulation of an air-core inductor provided in an embodiment of the present application.

[0044] Figure 3 A schematic diagram of the structure of a parameter group determination device provided in an embodiment of the present application.

[0045] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0046] Explanation of reference numerals: 1. First acquisition module; 2. First simulation module; 3. Screening module; 4. Second acquisition module; 5. Third acquisition module; 6. Second simulation module; 7. Fourth acquisition module; 301. Processor; 302. Memory; 303. Communication bus. DETAILED DESCRIPTION

[0047] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0048] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0049] First, as Figure 1 As shown, the present application provides a parameter group determination method for determining an optimal mesh partitioning parameter group for electromagnetic simulation of an air-core inductor, comprising the following steps:

[0050] S1. Obtaining multiple grid partitioning parameter groups that meet the orthogonal test table rules according to the preset inductor structure parameter group;

[0051] S2. Perform electromagnetic simulation of the air-core inductor according to a preset inductor structure parameter group and a plurality of mesh partition parameter groups to obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances;

[0052] S3. Screening the levels of all meshing parameters in the meshing parameter group according to the first simulated inductance and the simulated equivalent resistance to obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance;

[0053] S4. Obtain an optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group.

[0054] Specifically, the preset inductor structure parameter group includes a plurality of preset inductor structure parameters of different types, wherein the different types refer to the different properties of the inductance represented by each preset inductor structure parameter; the grid division parameter group includes a plurality of different types of grid division parameters, wherein the different types refer to the different experimental properties of the electromagnetic simulation of the hollow inductor represented by each grid division parameter.

[0055] More specifically, in step S2, the number of air-core inductor electromagnetic simulations is consistent with the number of mesh parameter groups, the first simulated inductance, the simulated equivalent resistance and the mesh parameter groups correspond one to one, and each air-core inductor electromagnetic simulation is performed at the same frequency.

[0056] More specifically, the first simulated inductance and the simulated equivalent resistance are respectively the inductance and the equivalent resistance of the simulated inductor calculated during the electromagnetic simulation of the air-core inductor in step S2.

[0057] More specifically, the method for obtaining multiple grid division parameter groups that conform to the rules of the orthogonal test table includes: setting a plurality of levels of the same number for each grid division parameter in the grid division parameter group according to a preset inductor structure parameter group, and each level of each grid division parameter is a parameter value; combining the grid division parameter levels according to the level combination method of the orthogonal test table to obtain multiple grid division parameter groups, wherein one grid division parameter group consists of one level of each grid division parameter, and there is at least one grid division parameter with different levels between different grid division parameter groups, wherein the level represents the grade of the corresponding grid division parameter.

[0058] More specifically, the multiple meshing parameter groups that meet the orthogonal test table rule have the following characteristics: in all meshing parameter groups, each meshing parameter has a plurality of levels of the same number, and at least two meshing parameter levels are the same in each meshing parameter group.

[0059] More specifically, the process of screening the levels of all mesh partitioning parameters in the mesh partitioning parameter group according to the first simulated inductance and the simulated equivalent resistance may be to select the level of the inductance corresponding to each mesh partitioning parameter that is closest to the inductance target value, and to select the level of the equivalent resistance corresponding to each mesh partitioning parameter that is closest to the equivalent resistance target value; the process of obtaining the first preferred parameter group and the second preferred parameter group may be to combine the level of the inductance corresponding to each mesh partitioning parameter that is closest to the inductance target value to obtain the first preferred parameter group, and to combine the level of the equivalent resistance corresponding to each mesh partitioning parameter that is closest to the equivalent resistance target value to obtain the second preferred parameter group, wherein the inductance target value and the equivalent resistance target value may be preset values, or may be the inductance and equivalent resistance obtained by testing the inductor after the inductor is wound according to the preset inductor structure parameter group.

[0060] More specifically, the method for obtaining the optimal grid division parameter group based on the first preferred parameter group and the second preferred parameter group may be that when the difference between the simulated equivalent resistance corresponding to the first preferred parameter group and the equivalent resistance target value is less than or equal to a preset threshold, the first preferred parameter group is used as the optimal grid division parameter group, otherwise the second preferred parameter group is used as the optimal grid division parameter group, or other methods can be used to obtain the optimal grid division parameter group based on the first preferred parameter group and the second preferred parameter group.

[0061] More specifically, since multiple grid division parameter groups conform to the orthogonal table test rules, the parameter group determination method of the present application only needs to perform a small number of hollow inductor electromagnetic simulations based on a preset inductor structure parameter group and a small number of grid division parameter groups, and the preferred levels of each grid division parameter regarding the first simulated inductance and the simulated equivalent resistance can be determined respectively through the first simulated inductance and the simulated equivalent resistance. Therefore, the parameter group determination method of the present application can effectively reduce the number of simulations and improve simulation efficiency.

[0062] More specifically, since the quality factor of the inductor is proportional to the inductance of the inductor and inversely proportional to the equivalent resistance of the inductor when the frequency remains unchanged, and the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups regarding the first simulated inductance and the simulated equivalent resistance, when the first preferred parameter group and the second preferred parameter group are obtained, what is actually obtained is the preferred parameter group regarding the quality factor of the simulated inductor. Therefore, the present application can quickly determine the optimal grid division parameter group, and can make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby being able to quickly and accurately determine the preferred inductor structure.

[0063] The parameter group determination method of the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0064] In some preferred embodiments, the orthogonal test table is L9[3 4 ]Orthogonal test table.

[0065] Table 1 A L9[3 4 Orthogonal test table

[0066]

[0067] Specifically, L9[3 4 ] The orthogonal test table includes 4 factors, 3 levels and 9 test combinations. In this embodiment, since the grid partition parameter group meets the L9[3 4 ] According to the orthogonal test table rules, there are 9 mesh parameter groups, and all 9 mesh parameter groups include the same 4 mesh parameters, and all 4 mesh parameters have 3 levels. Taking Table 1 as an example, its column header includes 4 mesh parameters as factors, and the 4 mesh parameters are Lin, Lon, SL and RG, namely the wire internal mesh length, wire surface mesh length, number of mesh layers in skin depth and solution domain; its row header includes 9 numbers, namely the serial numbers of the 9 mesh parameter groups, and the numbers "1", "2" and "3" in the data column are the levels of the corresponding mesh parameters.

[0068] More specifically, according to the conventional test method, when the four grid division parameters all have three levels, they need to be 4 In the present invention, 81 mesh partition parameter groups are required to perform electromagnetic simulation of hollow inductors to determine the optimal mesh partition parameter group, that is, 81 simulation tests are required. In the present embodiment, the parameter group determination method of the present application only needs to set 9 mesh partition parameter groups, so as to realize horizontal screening of all mesh partition parameters, obtain the first preferred parameter group and the second preferred parameter group to obtain the optimal mesh partition parameter group, which can greatly reduce the number of simulation tests and improve the simulation efficiency.

[0069] In some preferred embodiments, in step S3, the levels of all meshing parameters in the meshing parameter group are screened to obtain the first preferred parameter group and the second preferred parameter group, including:

[0070] S31. Calculate and obtain a plurality of first average values ​​and a plurality of second average values, wherein the first average value is an average value of the first simulated inductance corresponding to all meshing parameter groups having the same type and level of meshing parameters, and the second average value is an average value of the simulated equivalent resistance corresponding to all meshing parameter groups having the same type and level of meshing parameters;

[0071] S32. Filter and obtain the first preferred level and the second preferred level corresponding to each type of grid division parameter based on the first average value and the second average value, and respectively combine the first preferred level corresponding to each type of grid division parameter and the second preferred level corresponding to each type of grid division parameter to obtain the first preferred parameter group and the second preferred parameter group, the first preferred level is the preferred level of the corresponding grid division parameter regarding the first simulated inductance, and the second preferred level is the preferred level of the corresponding grid division parameter regarding the simulated equivalent resistance.

[0072] Specifically, taking the grid division parameters including the solution domain RG, and RG including three levels of "1", "2", and "3" as an example, the first average value corresponding to the "3" level of RG is the average value of the first simulated inductance corresponding to all grid division parameter groups including the RG with level "3", and the second average value corresponding to the "2" level of RG is the average value of the simulated equivalent resistance corresponding to all grid division parameter groups including the RG with level "2".

[0073] The process of screening and obtaining the first preferred level and the second preferred level corresponding to each type of grid division parameter according to the first average value and the second average value can be to compare all the first average values ​​corresponding to the same type of grid division parameters, and take the grid division parameter level corresponding to the first average value closest to the target inductance value as the first preferred level, and compare all the second average values ​​corresponding to the same type of grid division parameters, and take the grid division parameter level corresponding to the second average value closest to the target equivalent resistance value as the second preferred level.

[0074] More specifically, since the first average value is the average value of the first simulated inductance corresponding to all mesh partitioning parameter groups with the same type and level of mesh partitioning parameters, it is only necessary to compare all the first average values ​​corresponding to the same type of mesh partitioning parameters, and the first preferred level can be determined according to the height between the first average values, thereby obtaining the first preferred parameter group. Taking the mesh partitioning parameter level corresponding to the first average value closest to the target inductance value as an example, it is only necessary to select the first average value closest to the target inductance value from all the first average values ​​corresponding to the same type of mesh partitioning parameters, and take the corresponding mesh partitioning parameter level as the first preferred level, and select and combine the first preferred levels corresponding to all mesh partitioning parameters to obtain the first preferred parameter group, and compared with other mesh partitioning parameter groups, the first simulated inductance corresponding to the first preferred parameter group is the most accurate.

[0075] Similarly, by simply comparing all the second average values ​​corresponding to the same grid partitioning parameters, the second preferred level can be determined according to the height between the second average values, thereby obtaining the second preferred parameter group. Taking the grid partitioning parameter level corresponding to the second average value closest to the equivalent resistance target value as an example, it is only necessary to select the second average value closest to the equivalent resistance target value from all the second average values ​​corresponding to the same grid partitioning parameters, and take its corresponding grid partitioning parameter level as the second preferred level, and select and combine the second preferred levels corresponding to all grid partitioning parameters to obtain the second preferred parameter group, and compared with other grid partitioning parameter groups, the simulation equivalent resistance corresponding to the second preferred parameter group is the most accurate.

[0076] In this embodiment, the parameter group determination method of the present application can quickly and accurately screen and obtain the first preferred level and the second preferred level through the first average value and the second average value, thereby ensuring that the first preferred parameter group and the second preferred parameter group are the preferred parameter groups of the first simulated inductance and the simulated equivalent resistance, respectively.

[0077] Preferably, the orthogonal test table is L9[3 4 ]Orthogonal test table;

[0078] The process of obtaining the first preferred level and the second preferred level corresponding to each grid division parameter according to the first average value and the second average value includes:

[0079] S321. Comparing three first average values ​​corresponding to the same meshing parameters, and comparing three second average values ​​corresponding to the same meshing parameters;

[0080] When the absolute difference between the smallest first average value and the other two first average values ​​is greater than the absolute difference between the other two first average values, the grid division parameter level corresponding to any one of the other two first average values ​​is the first preferred level, otherwise the grid division parameter level corresponding to the first average value closest to the target inductance value is the first preferred level corresponding to the grid division parameter; and when the absolute difference between the smallest second average value and the other two second average values ​​is greater than the absolute difference between the other two second average values, the grid division parameter level corresponding to any one of the other two second average values ​​is the second preferred level, otherwise the grid division parameter level corresponding to the second average value closest to the target equivalent resistance value is the second preferred level corresponding to the grid division parameter.

[0081] Specifically, when the absolute difference between the smallest first average value and the other two first average values ​​is greater than the absolute difference between the other two first average values, the smallest first average value is significantly smaller than the other two first average values, and its corresponding first simulated inductance is not saturated and cannot be adopted, and the difference between the other two first average values ​​is not large. Therefore, it is only necessary to take the grid division parameter level corresponding to any one of the other two first average values ​​as the first preferred level, so as to easily obtain the first preferred level that is sufficiently accurate for the corresponding first simulated inductance, without the need to preset or obtain the inductance target value.

[0082] Similarly, when the absolute difference between the smallest second average value and the other two second average values ​​is greater than the absolute difference between the other two second average values, the smallest second average value is significantly smaller than the other two second average values, and its corresponding simulation equivalent resistance is not saturated and cannot be adopted, and the difference between the other two second average values ​​is not large. Therefore, it is only necessary to take the grid division parameter level corresponding to any one of the other two second average values ​​as the second preferred level, so as to easily obtain a sufficiently accurate second preferred level of the corresponding simulation equivalent resistance, without the need to preset or obtain the equivalent resistance target value.

[0083] In this embodiment, the parameter group determination method of the present application can easily exclude the first average value or the second average value that is significantly smaller than the remaining average values, and can obtain the first preferred level that is sufficiently accurate corresponding to the first simulated inductance or the second preferred level that is sufficiently accurate corresponding to the simulated equivalent resistance without presetting or obtaining the inductance target value or the equivalent resistance target value.

[0084] In some preferred embodiments, the method further includes between step S31 and step S4:

[0085] A1. Calculate the range of all first average values ​​corresponding to each grid partition parameter to obtain the first range, and combine the types of grid partition parameters corresponding to all first range values ​​greater than or equal to the first range threshold to obtain a first significant type group, or calculate the range of all second average values ​​corresponding to each grid partition parameter to obtain the second range, and combine the types of grid partition parameters corresponding to all second range values ​​greater than or equal to the second range threshold to obtain a second significant type group;

[0086] In step S4, the process of obtaining the optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group includes:

[0087] S41. Obtain a second replacement parameter level according to a second preferred level corresponding to a second significant category group in the second preferred parameter group, and replace the corresponding first preferred level in the first preferred parameter group with the second replacement parameter level to obtain an optimal grid partitioning parameter group;

[0088] Or, a first replacement parameter level is obtained according to a first preferred level corresponding to the first significant category group in the first preferred parameter group, and the first replacement parameter level is used to replace the corresponding second preferred level in the second preferred parameter group to obtain an optimal grid partitioning parameter group.

[0089] Specifically, the first extreme difference threshold and the second extreme difference threshold may be preset values, or may be set according to preset percentages of the inductance target value and preset percentages of the equivalent resistance target value, respectively.

[0090] Specifically, the second replacement parameter level corresponds to the same meshing parameter as the corresponding first preferred level in the first preferred parameter group it replaces, and the first replacement parameter level corresponds to the same meshing parameter as the corresponding second preferred level in the second preferred parameter group it replaces.

[0091] More specifically, when the first range is small, the corresponding first average values ​​are not much different from each other. No matter which grid division parameter level corresponding to the first average value is used as the first preferred level corresponding to the grid division parameter, the first simulated inductance corresponding to the first preferred level is accurate enough. Therefore, in this embodiment, the present application only combines the types corresponding to the larger first range to obtain the first significant type group, and pays more attention to the grid division parameters that have a greater impact on the first simulated inductance when the level changes, so that the optimal grid division parameter group can be obtained based on the more important grid division parameter level. Similarly, the present application only combines the types corresponding to the larger second range to obtain the second significant type group, and pays more attention to the grid division parameters that have a greater impact on the simulated equivalent resistance when the level changes, so that the optimal grid division parameter group can be obtained based on the more important grid division parameter level.

[0092] More specifically, in step S41, when more attention is paid to the accuracy of the first simulated inductance, the first replacement parameter level is used to replace the corresponding second preferred level in the second preferred parameter group to obtain the optimal grid division parameter group; when more attention is paid to the accuracy of the simulated equivalent resistance, the second replacement parameter level is used to replace the corresponding first preferred level in the first preferred parameter group to obtain the optimal grid division parameter group.

[0093] More specifically, the process of obtaining the second replacement parameter level according to the second preferred level corresponding to the second significant category group in the second preferred parameter group can be to directly use the second preferred level corresponding to the second significant category group in the second preferred parameter group as the second replacement parameter level, or to use the second approximate level as the second replacement parameter level, the second approximate level is a level corresponding to the second significant category group, and the absolute difference between the corresponding second average value and the corresponding second average value of the second preferred level corresponding to the second significant category group is less than a second threshold, and the second threshold is a preset value; similarly, the process of obtaining the first replacement parameter level according to the first preferred level corresponding to the first significant category group in the first preferred parameter group can be to directly use the first preferred level corresponding to the first significant category group in the first preferred parameter group as the first replacement parameter level, or to use the first approximate level as the first replacement parameter level, the first approximate level is a level corresponding to the first significant category group, and the absolute difference between its corresponding first average value and the corresponding first average value of the first preferred level corresponding to the first significant category group is less than a first threshold, and the first threshold is a preset value.

[0094] More specifically, the method of using the second approximate level as the second replacement parameter level is particularly suitable for scenarios where the first average value corresponding to the second preferred level corresponding to the second significant category group is significantly different from the first average value corresponding to the first preferred level corresponding to the second significant category group. In this case, the first simulated inductance corresponding to the preferred level of the first simulated inductance corresponding to the second significant category group is significantly different from the first simulated inductance corresponding to the preferred level of the simulated equivalent resistance corresponding to the second significant category group. If the corresponding second preferred level is directly used as the second replacement parameter level for replacement, the accuracy of the first simulated inductance corresponding to the optimal grid division parameter group may be reduced. However, using the second approximate level or the first approximate level as a compromise solution can simultaneously consider the two factors of the first simulated inductance and the simulated equivalent resistance, so that the obtained optimal grid division parameter group can be the preferred parameter group for the first simulated inductance and the simulated equivalent resistance.

[0095] Similarly, the method of using the first approximate level as the first replacement parameter level is particularly suitable for scenarios where the second average value corresponding to the first preferred level corresponding to the first significant category group is significantly different from the second average value corresponding to the second preferred level corresponding to the first significant category group.

[0096] More specifically, the second replacement parameter group level replaces the corresponding first preferred level in the first preferred parameter group, which means that on the basis of the preferred parameter group regarding the first simulated inductance, the level of the grid division parameter that has a greater impact on the simulated equivalent resistance when the level changes is changed to the preferred level regarding the simulated equivalent resistance; similarly, the first replacement parameter group level replaces the corresponding second preferred level in the second preferred parameter group, which means that on the basis of the preferred parameter group regarding the simulated equivalent resistance, the level of the grid division parameter that has a greater impact on the first simulated inductance when the level changes is changed to the preferred level regarding the first simulated inductance. Therefore, the optimal grid division parameter group obtained in this embodiment is the preferred parameter group regarding the first simulated inductance and the simulated equivalent resistance.

[0097] In this embodiment, the parameter group determination method of the present application can perform analysis based on the more important grid division parameter level to obtain the optimal grid division parameter group, and the present application simultaneously considers the two factors of the first simulated inductance and the simulated equivalent resistance, so that the obtained optimal grid division parameter group can be the preferred parameter group regarding the first simulated inductance and the simulated equivalent resistance.

[0098] Second, as Figure 2 As shown, the present application provides a parameter group determination method for determining an optimal inductor structure parameter group for electromagnetic simulation of an air-core inductor, comprising the following steps:

[0099] S5. Acquire multiple inductor structure parameter groups that meet the orthogonal test table rules according to the preset inductor size, take one of the inductor structure parameter groups as the preset inductor structure parameter group, and generate the optimal grid division parameter group based on any of the above parameter group determination methods;

[0100] S6. Perform electromagnetic simulation of the air-core inductor according to the optimal grid partition parameter group and the multiple inductor structure parameter groups to obtain multiple second simulated inductances and multiple simulated quality factors;

[0101] S7. Screen the levels of all inductor structure parameters in the inductor structure parameter group according to the second simulated inductance and the simulated quality factor to obtain an optimal inductor structure parameter group, wherein the optimal inductor structure parameter group includes third preferred levels corresponding to each inductor structure parameter, and the third preferred level is the level of the inductor structure parameter with the highest comprehensive score, and the comprehensive score is calculated based on the corresponding second simulated inductance and the simulated quality factor.

[0102] Specifically, the inductor structure parameter group includes a plurality of different types of inductor structure parameters, the preset inductor size includes a plurality of different types of preset inductor structure parameters, and the inductor structure parameters included in the inductor structure parameter group and the preset inductor structure parameters included in the preset inductor size are of the same type.

[0103] More specifically, in step S6, the number of air-core inductor electromagnetic simulations is consistent with the number of inductor structure parameter groups, the second simulated inductance, the simulated quality factor and the inductor structure parameter groups correspond one-to-one, and each air-core inductor electromagnetic simulation is performed at the same frequency.

[0104] More specifically, the second simulated inductance and the simulated quality factor are respectively the inductance and the quality factor of the simulated inductor calculated during the electromagnetic simulation of the air-core inductor in step S6.

[0105] More specifically, the method for obtaining multiple inductance structure parameter groups that comply with the rules of the orthogonal test table includes: setting a plurality of levels of the same number for each inductance structure parameter in the inductance structure parameter group according to a preset inductance size, each level of each inductance structure parameter is a parameter value, and each inductance structure parameter has a level that is the same as the corresponding preset inductance structure parameter value in the preset inductance size; combining the inductance structure parameter levels according to the level combination method of the orthogonal test table to obtain multiple inductance structure parameter groups, wherein one inductance structure parameter group is composed of one level of each inductance structure parameter, and there is at least one inductance structure parameter with different levels between different inductance structure parameter groups.

[0106] More specifically, the electromagnetic simulation of the air-core inductor based on the preset inductor structure parameter group and the optimal grid division parameter group can calculate accurate simulation results, namely the first simulated inductance and the simulated equivalent resistance, and for the electromagnetic simulation of the air-core inductor based on multiple inductor structure parameter groups, when each simulation model is an inductor model based on round wire winding, it can be considered that no matter which inductor structure parameter group the electromagnetic simulation of the air-core inductor is based on, as long as the electromagnetic simulation of the air-core inductor is based on the optimal grid division parameter group, accurate simulation results, namely the second simulated inductance and the simulated quality factor, can be obtained.

[0107] More specifically, since multiple inductor structure parameter groups conform to the orthogonal test table rules, the parameter group determination method of the present application only needs to perform a small number of air-core inductor electromagnetic simulations based on the optimal grid division parameter group and a small number of inductor structure parameter groups, and the third preferred level can be obtained through the second simulated inductance and the simulated quality factor, thereby obtaining the optimal inductor structure parameter group. Therefore, the parameter group determination method of the present application can effectively reduce the number of simulations and improve simulation efficiency.

[0108] More specifically, since the comprehensive score is calculated based on the corresponding second simulated inductance and simulated quality factor, the third preferred level is the corresponding preferred level regarding the second simulated inductance and simulated quality factor, and the optimal inductor structure parameter group is the preferred parameter group regarding the second simulated inductance and simulated quality factor. Therefore, the present application can quickly determine the optimal inductor structure parameter group, thereby quickly and accurately determining the preferred inductor structure.

[0109] The parameter group determination method of the present application can effectively reduce the number of simulations, improve simulation efficiency, and can quickly determine the optimal grid division parameter group and the optimal inductor structure parameter group, so that the quality factor of the simulated inductor corresponding to the optimal grid division parameter group can be accurate, and the quality factor and inductance of the simulated inductor corresponding to the optimal inductor structure parameter group of the present application are optimal in combination, thereby being able to quickly and accurately determine the preferred inductor structure.

[0110] In some preferred embodiments, the calculation formula of the comprehensive score is: S=w1*L / (|L2-L|)+w2*Q, |L2-L|≥1, and S=w1*L+w2*Q, 0≤|L2-L|<1, where S is the comprehensive score, L2 is the second simulated inductance corresponding to S, L is the inductance target value, Q is the simulated quality factor corresponding to S, w1 and w2 are the inductance weight and quality factor weight, respectively.

[0111] Specifically, it can be seen from the calculation formula of the comprehensive score that when the gap between the second simulated inductance and the target inductance value is large, the comprehensive score is negatively correlated with the absolute value of the difference between the corresponding second simulated inductance and the target inductance value, and the comprehensive score is positively correlated with the corresponding simulated quality factor. Therefore, among all levels of the inductor structure parameters corresponding to the third preferred level, the simulated quality factor corresponding to the third preferred level is the highest and the second simulated inductance is closest to the target inductance value. The second simulated inductance closest to the target inductance value is the optimal second simulated inductance, and the highest simulated quality factor is the optimal simulated quality factor. In this implementation, the inductance and quality factor of the simulated inductor corresponding to the optimal inductor structure parameter group of the present application are optimal in combination, thereby enabling the preferred inductor structure to be determined quickly and accurately.

[0112] More specifically, the calculation formula of the comprehensive score also includes the inductance weight and the quality factor weight. Therefore, the present application can set the values ​​of the inductance weight and the quality factor weight as needed to set the degree of importance of the inductance and the quality factor of the inductance structure corresponding to the inductance structure parameter group as needed.

[0113] In this embodiment, the inductance and quality factor of the simulated inductor corresponding to the optimal inductor structure parameter group of the parameter group determination method of the present application are optimal in combination, so that the preferred inductor structure can be determined quickly and accurately, and the values ​​of the inductance weight and the quality factor weight can be set as needed to set the degree of importance of the inductance and quality factor of the inductor structure corresponding to the inductor structure parameter group as needed.

[0114] In some preferred embodiments, the parameter group determination method further includes:

[0115] S8. Compare the optimal inductor structure parameter group with all the inductor structure parameter groups in the orthogonal test table. When all the inductor structure parameter groups in the orthogonal test table are not the optimal inductor structure parameter group, perform electromagnetic simulation of the air-core inductor according to the optimal grid partition parameter group and the optimal inductor structure parameter group to obtain candidate simulation inductance and candidate simulation quality factor, calculate the candidate comprehensive score according to the candidate simulation inductance and the candidate simulation quality factor, and compare the candidate comprehensive score with the comprehensive scores corresponding to all the inductor structure parameter groups to verify the optimal inductor structure parameter group.

[0116] Specifically, since the optimal inductor structure parameter group is composed of the preferred levels of various inductor structure parameters, it may happen that all inductor structure parameter groups in the orthogonal test table are not the optimal inductor structure parameter groups. In this case, it is necessary to verify whether the optimal inductor structure parameter group is indeed better than the inductor structure parameter group in the orthogonal test table.

[0117] More specifically, the comprehensive score corresponding to the inductor structure parameter group is calculated and obtained based on the second simulated inductance and the simulated quality factor corresponding to the inductor structure parameter group.

[0118] More specifically, if the candidate comprehensive score is greater than or equal to the comprehensive scores corresponding to all inductor structure parameter groups, it can be known that the inductance and quality factor of the simulated inductor corresponding to the optimal inductor structure parameter group are comprehensively optimal, and the optimal inductor structure parameter group is better than the remaining inductor structure parameter groups; conversely, if there is an inductor structure parameter group whose corresponding comprehensive score is greater than the candidate comprehensive score, it can be known that the inductance and quality factor of the simulated inductor corresponding to the optimal inductor structure parameter group are not comprehensively optimal, and the optimal inductor structure parameter group needs to be re-determined.

[0119] In this implementation, the parameter group determination method of the present application can verify the obtained optimal inductor structure parameter group, thereby ensuring that the optimal inductor structure parameter group is superior to the remaining inductor structure parameter groups in the orthogonal test table.

[0120] Example 1

[0121] With a length of 34 mm, a width of 20 mm, and a height of 25 mm as the preset inductor package size, it is necessary to determine an inductor structure that can make the inductance of the RF air-core inductor 400 nH and the quality factor greater than 450 at a frequency of 27.12 MHz. To ensure that the inductor can be installed in the inductor package, the preset inductor size needs to be set to be smaller than the preset inductor package size. In this embodiment, the preset inductor size is set to a coil outer diameter of 18 mm, a coil wire diameter of 1.5 mm, a turn spacing of 1 mm, and a number of turns of 6. Multiple levels are set for the inductor structure parameters according to the preset inductor size.

[0122] Table 2 Parameter values ​​corresponding to each level of each inductor structure parameter

[0123] D (mm) d (mm) G (mm) T (circle) 1 18 1.5 1 6 2 19 2 1.5 7 3 20 2.5 2 8

[0124] As shown in Table 2, the column header includes four inductance structure parameters as factors, and the four inductance structure parameters are D, d, G and T, namely the coil outer diameter, coil wire diameter, turn spacing and number of turns. The brackets after the inductance structure parameter include the unit of the parameter value corresponding to the inductance structure parameter; the row header includes three levels, and the numbers in the data column are the parameter values ​​corresponding to each level of each inductance structure parameter.

[0125] A parameter group consisting of inductor structure parameters with a level of 1 is a preset inductor structure parameter group, and a plurality of levels with the same number are set for each mesh partition parameter in the mesh partition parameter group according to the preset inductor structure parameter group;

[0126] Table 3 Parameter values ​​corresponding to each level of each grid division parameter

[0127] Lin (mm) Lon (mm) SL (layer) RG (%) 1 2 2 3 100 2 1 1 4 200 3 0.5 0.5 5 300

[0128] As shown in Table 3, the column header includes four grid division parameters as factors, and the four grid division parameters are Lin, Lon, SL and RG, namely the grid length inside the wire, the grid length on the surface of the wire, the number of grid layers in the skin depth and the solution domain. The brackets after the grid division parameters include the units of the parameter values ​​corresponding to the grid division parameters; the row header includes three levels, and the numbers in the data column are the parameter values ​​corresponding to each level of each grid division parameter.

[0129] The four groups of mesh parameter levels corresponding to Lin, Lon, SL and RG in Table 3 are combined according to the horizontal combination method of the orthogonal test table to obtain the nine mesh parameter groups in Table 1. The electromagnetic simulation of the air-core inductor is performed nine times at a frequency of 27.12 MHz according to the preset inductor structure parameter group and the nine mesh parameter groups.

[0130] Table 4 Simulation results corresponding to each grid partition parameter group

[0131]

[0132] As shown in Table 4, its column headers include 4 kinds of grid division parameters as factors, and the first simulated inductance L1 and the simulated equivalent resistance Re as the simulation results, and the brackets after L1 and Re respectively include the units of the parameter values ​​corresponding to L1 and Re; its row headers include 9 numbers, i.e., the serial numbers of 9 grid division parameter groups; in the data column, the numbers "1", "2" and "3" under the grid division parameter column header are the levels of the corresponding grid division parameters, and the numbers under the simulation result column header are the values ​​of the first simulated inductance and the simulated equivalent resistance corresponding to each grid division parameter group.

[0133] Table 5 The first and second preferred levels of each grid partitioning parameter

[0134]

[0135] As shown in Table 5, its column header includes 4 grid division parameters as factors; its row header includes three first average values ​​k1, k2 and k3 corresponding to levels "1", "2" and "3", respectively, the first range, the first preferred level, three second average values ​​k4, k5 and k6 corresponding to levels "1", "2" and "3", respectively, the second range, the second preferred level and the optimal grid division parameter group.

[0136] The first extreme difference thresholds corresponding to Lin, Lon, SL and RG are all set to 2.2. It can be seen that RG is the grid division parameter that constitutes the first significant category group, and Lin, Lon and SL have little effect on L1 when the levels change. Therefore, the levels of Lin, Lon and SL corresponding to the largest L1, namely "2", "1" and "2", are respectively used as the first preferred levels corresponding to Lin, Lon and SL; for RG, the corresponding k1, k2 and k3 are 447.2, 455.8 and 457.1, respectively. The difference between k1 and k2 and the difference between k1 and k3 are both greater than the difference between k2 and k3. It can be seen that k1 is significantly smaller than k2 and k3, and its corresponding first simulated inductance is not saturated. Therefore, k1 can be excluded and the level of RG corresponding to one of k2 and k3 can be selected as the first preferred level corresponding to RG. Here, the level of RG corresponding to k3, namely "3", is selected as the first preferred level corresponding to RG. The first preferred parameter group can be obtained by combining all the first preferred levels, namely "2", "1", "2" and "3".

[0137] According to the preset inductor structure parameter group, an inductor with a coil outer diameter of 18 mm, a coil wire diameter of 1.5 mm, a turn spacing of 1 mm and 6 turns is wound. The inductor is tested for equivalent resistance, and the test shows that the equivalent resistance of the inductor is 0.196 Ω. The equivalent resistance of the inductor is taken as the equivalent resistance target value, and the grid division parameter level corresponding to the second average value closest to the equivalent resistance target value is taken as the second preferred level corresponding to the grid division parameter, that is, "1", "2", "2" and "1" are respectively used as the second preferred levels corresponding to Lin, Lon, SL and RG, and the second preferred parameter group can be obtained by combining each second preferred level.

[0138] The first threshold is set to 2. In the first preferred parameter group, the first preferred level corresponding to the first significant category group, that is, the first preferred level corresponding to RG is "3", and its corresponding first average value, that is, k3 corresponding to RG is 457.1, and k2 corresponding to RG is 455.8, and the difference between k2 and k3 is 1.3. Therefore, the level "2" corresponding to RG is the first approximate level, and it is used as the first replacement parameter level to replace the corresponding second preferred level in the second preferred parameter group, that is, the level "1" corresponding to RG, to obtain four levels of "1", "2", "2" and "2". The optimal grid division parameter group can be obtained by combining these four levels.

[0139] The four groups of inductor structure parameter levels corresponding to D, d, G and T in Table 2 are used as four inductor structure parameter groups; one inductor structure parameter level is selected from each inductor structure parameter group and combined to obtain nine inductor structure parameter groups;

[0140] Table 6 Nine inductor structure parameter groups that meet the orthogonal test table rules

[0141] D (mm) d (mm) G (mm) T (circle) 1 1 1 1 1 2 1 2 2 2 3 1 3 3 3 4 2 1 2 3 5 2 2 3 1 6 2 3 1 2 7 3 1 3 2 8 3 2 1 3 9 3 3 2 1

[0142] As shown in Table 6, its column header includes 4 inductor structure parameters as factors, its row header includes 9 numbers, i.e., the serial numbers of 9 inductor structure parameter groups, and the numbers "1", "2" and "3" in the data column are the levels of the corresponding inductor structure parameters. According to the optimal grid division parameter group and the 9 inductor structure parameter groups, 9 air-core inductor electromagnetic simulations were performed at a frequency of 27.12MHz;

[0143] Table 7 Simulation results corresponding to each inductor structure parameter group

[0144]

[0145] As shown in Table 7, its column header includes 4 kinds of inductor structure parameters as factors, and the second simulated inductance L2, simulated quality factor Q and comprehensive score as simulation results, and the brackets after L2 include the unit of the parameter value corresponding to L2; its row header includes 9 numbers, i.e., the serial numbers of 9 inductor structure parameter groups; in the data column, the numbers "1", "2" and "3" under the inductor structure parameter column header are the levels of the corresponding inductor structure parameters, and the numbers under the simulation result column header are the values ​​of the second simulated inductance, simulated quality factor and comprehensive score corresponding to each inductor structure parameter group; L, w1 and w2 are set to 400nH, 5 and 4 respectively, and the comprehensive scores in Table 7 can be obtained by performing corresponding calculations according to S=w1*L / (|L2-L|)+w2*Q.

[0146] Table 8 The third preferred level corresponding to each inductor structure parameter group

[0147] D d G T <![CDATA[k7]]> 1715.5 1710.0 2034.1 1945.6 <![CDATA[k8]]> 1976.2 2025.2 2028.4 1941.2 <![CDATA[k9]]> 2131.6 2088.2 1760.9 1936.7 Third preferred level 3 3 1 1

[0148] As shown in Table 8, its column header includes 4 inductor structure parameters as factors; its row header includes three third average values ​​k7, k8 and k9 corresponding to levels "1", "2" and "3" respectively, and the third preferred level, and the third average value is the average value of the comprehensive scores of all grid division parameter groups corresponding to the inductor structure parameters of the same type and level. It can be seen from Table 8 that the third preferred levels corresponding to D, d, G and T are "3", "3", "1" and "1" respectively, and the optimal inductor structure parameter group can be obtained by combining each third preferred level.

[0149] By looking up the orthogonal test table, it can be seen that none of the 9 inductor structure parameter groups is the optimal inductor structure parameter group. Therefore, the electromagnetic simulation of the air-core inductor is performed at a frequency of 27.12MHz according to the optimal grid division parameter group and the optimal inductor structure parameter group to obtain the candidate simulated inductance and candidate simulated quality factor, which are 402nH and 463 respectively. The calculated candidate comprehensive score is 2526. Since the candidate comprehensive score is higher than the corresponding comprehensive scores of all inductor structure parameter groups, the optimal inductor structure parameter group is confirmed to be the preferred parameter group for simulated inductance and simulated quality factor.

[0150] Finally, an inductor was wound according to the optimal inductor structure parameter group and tested. It was found that the inductance of the inductor was 404nH, the equivalent resistance was 0.145Ω, and the quality factor was 474. Compared with the candidate simulated inductance and the candidate simulated quality factor, the inductance deviation was 0.5%, and the quality factor deviation was 2.3%; compared with the inductance target value, the inductance deviation was 1%, and the Q value was greater than 450, which met the requirements. Therefore, the present application can effectively reduce the number of simulations, improve simulation efficiency, and quickly determine the optimal grid division parameter group and the optimal inductor structure parameter group, so that the quality factor of the simulated inductor corresponding to the optimal grid division parameter group can be accurate, and the quality factor and inductance of the simulated inductor corresponding to the optimal inductor structure parameter group of the present application are optimal, so that the preferred inductor structure can be determined quickly and accurately.

[0151] Thirdly, Figure 3 As shown, the present application provides a parameter group determination device for determining an optimal grid partitioning parameter group for electromagnetic simulation of an air-core inductor, comprising:

[0152] A first acquisition module 1 is used to acquire a plurality of grid division parameter groups that meet the orthogonal test table rules according to a preset inductor structure parameter group;

[0153] A first simulation module 2, used to perform electromagnetic simulation of the air-core inductor according to a preset inductor structure parameter group and a plurality of grid division parameter groups, and obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances;

[0154] A screening module 3 is used to screen the levels of all mesh partitioning parameters in the mesh partitioning parameter group according to the first simulated inductance and the simulated equivalent resistance, and obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance;

[0155] The second acquisition module 4 is used to acquire the optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group.

[0156] The parameter group determination device of the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0157] Preferably, the present application provides a parameter group determination device for determining an optimal inductor structure parameter group for electromagnetic simulation of an air-core inductor, comprising:

[0158] A third acquisition module 5 is used to acquire multiple inductor structure parameter groups that meet the orthogonal test table rules according to the preset inductor size, take one of the inductor structure parameter groups as the preset inductor structure parameter group, and generate an optimal grid division parameter group based on any of the above parameter group determination methods;

[0159] A second simulation module 6, used to perform electromagnetic simulation of the air-core inductor according to the optimal grid division parameter group and the plurality of inductor structure parameter groups, and obtain a plurality of second simulated inductances and a plurality of simulated quality factors;

[0160] The fourth acquisition module 7 is used to screen the levels of all inductor structure parameters in the inductor structure parameter group according to the second simulated inductance and the simulated quality factor to obtain the optimal inductor structure parameter group, wherein the optimal inductor structure parameter group includes the third preferred levels corresponding to each inductor structure parameter, the third preferred level is the level of the inductor structure parameter with the highest comprehensive score, and the comprehensive score is calculated based on the corresponding second simulated inductance and the simulated quality factor.

[0161] Fourthly, Figure 4As shown, the present application provides an electronic device, including a processor 301 and a memory 302, the processor 301 and the memory 302 are interconnected and communicate with each other through a communication bus 303 and / or other forms of connection mechanisms (not marked), the memory 302 stores a computer program executable by the processor 301, when the electronic device is running, the processor 301 executes the computer program to execute the method in any optional implementation of the above embodiment to achieve the following functions: according to a preset inductor structure parameter group, multiple grid division parameter groups that meet the rules of the orthogonal test table are obtained; according to the preset inductor structure parameter group and the multiple grid division parameter groups, a hollow inductor electromagnetic simulation is performed to obtain multiple first simulated inductances and multiple simulated equivalent resistances; according to the first simulated inductance and the simulated equivalent resistance, the levels of all grid division parameters in the grid division parameter group are screened to obtain a first preferred parameter group and a second preferred parameter group, the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance; according to the first preferred parameter group and the second preferred parameter group, an optimal grid division parameter group is obtained.

[0162] In a fifth aspect, an embodiment of the present application provides a storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method in any optional implementation of the above embodiment is executed to achieve the following functions: obtaining multiple grid division parameter groups that comply with the rules of the orthogonal test table according to a preset inductor structure parameter group; performing electromagnetic simulation of a hollow inductor according to the preset inductor structure parameter group and the multiple grid division parameter groups to obtain multiple first simulated inductances and multiple simulated equivalent resistances; screening the levels of all grid division parameters in the grid division parameter group according to the first simulated inductances and the simulated equivalent resistances to obtain a first preferred parameter group and a second preferred parameter group, the first preferred parameter group and the second preferred parameter group being preferred parameter groups regarding the first simulated inductances and the simulated equivalent resistances, respectively; obtaining an optimal grid division parameter group according to the first preferred parameter group and the second preferred parameter group. Among them, the computer-readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (Static Random Access Memory, referred to as SRAM), electrically erasable programmable read-only memory (Electrically Erasable Programmable Read-Only Memory, referred to as EEPROM), erasable programmable read-only memory (Erasable Programmable Read-Only Memory, referred to as EPROM), programmable read-only memory (Programmable Red-Only Memory, referred to as PROM), read-only memory (Read-Only Memory, referred to as ROM), magnetic storage, flash memory, magnetic disk or optical disk.

[0163] In summary, the present application provides a parameter group determination method, device and related equipment, wherein the parameter group determination method provided in the present application can effectively reduce the number of simulations, improve simulation efficiency, quickly determine the optimal grid division parameter group, and make the quality factor of the simulated inductor corresponding to the optimal grid division parameter group accurate, thereby quickly and accurately determining the preferred inductor structure.

[0164] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0165] In addition, the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place or distributed on multiple grid units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0166] Furthermore, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0167] In this document, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0168] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A parameter group determination method for determining an optimal meshing parameter group for electromagnetic simulation of an air-core inductor, characterized in that: The following steps are involved: S1. Obtaining multiple grid partitioning parameter groups that meet the orthogonal test table rules according to the preset inductor structure parameter group; S2. Perform electromagnetic simulation of the air-core inductor according to the preset inductor structure parameter group and the plurality of mesh partition parameter groups to obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances; S3. Screening the levels of all meshing parameters in the meshing parameter group according to the first simulated inductance and the simulated equivalent resistance to obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are preferred parameter groups for the first simulated inductance and the simulated equivalent resistance, respectively; The process of screening the levels of all mesh partitioning parameters in the mesh partitioning parameter group to obtain the first preferred parameter group and the second preferred parameter group includes: S31. Calculate and obtain a plurality of first average values ​​and a plurality of second average values, wherein the first average value is an average value of first simulated inductance corresponding to all mesh partitioning parameter groups having the same type and level of mesh partitioning parameters, and the second average value is an average value of simulated equivalent resistance corresponding to all mesh partitioning parameter groups having the same type and level of mesh partitioning parameters; S32. Filter and obtain first preferred levels and second preferred levels corresponding to various types of grid division parameters according to the first average value and the second average value, and respectively combine the first preferred levels corresponding to various types of grid division parameters and the second preferred levels corresponding to various types of grid division parameters to obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred level is a preferred level of the grid division parameters corresponding to the first simulated inductance, and the second preferred level is a preferred level of the grid division parameters corresponding to the simulated equivalent resistance; S4. Obtain an optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group.

2. The parameter group determination method according to claim 1, characterized in that: The orthogonal test table is L9[3 4 ]Orthogonal test table.

3. The parameter group determination method according to claim 1, characterized in that: Also included between step S31 and step S4: A1. Calculate the range of all first average values ​​corresponding to each grid partition parameter to obtain the first range, and combine the types of grid partition parameters corresponding to all first range values ​​greater than or equal to the first range threshold to obtain a first significant type group, or calculate the range of all second average values ​​corresponding to each grid partition parameter to obtain the second range, and combine the types of grid partition parameters corresponding to all second range values ​​greater than or equal to the second range threshold to obtain a second significant type group; In step S4, the process of obtaining the optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group includes: S41. Obtain a second replacement parameter level according to a second preferred level corresponding to a second significant category group in the second preferred parameter group, and replace the corresponding first preferred level in the first preferred parameter group with the second replacement parameter level to obtain an optimal grid partitioning parameter group; Or, a first replacement parameter level is obtained according to a first preferred level corresponding to the first significant category group in the first preferred parameter group, and the first replacement parameter level is used to replace the corresponding second preferred level in the second preferred parameter group to obtain an optimal grid partitioning parameter group.

4. A parameter group determination method for determining an optimal inductor structure parameter group for electromagnetic simulation of an air-core inductor, characterized in that: The following steps are involved: S5. Acquire multiple inductor structure parameter groups that meet the orthogonal test table rules according to the preset inductor size, take one of the inductor structure parameter groups as the preset inductor structure parameter group, and generate the optimal grid partitioning parameter group based on the parameter group determination method according to any one of claims 1 to 3; S6. Perform electromagnetic simulation of the air-core inductor according to the optimal grid partition parameter group and the plurality of inductor structure parameter groups to obtain a plurality of second simulated inductances and a plurality of simulated quality factors; S7. Screen the levels of all inductor structure parameters in the inductor structure parameter group according to the second simulated inductance and the simulated quality factor to obtain an optimal inductor structure parameter group, wherein the optimal inductor structure parameter group includes third preferred levels corresponding to each inductor structure parameter, and the third preferred level is the level of the inductor structure parameter with the highest comprehensive score, and the comprehensive score is calculated based on the corresponding second simulated inductance and the simulated quality factor.

5. The parameter group determination method according to claim 4, characterized in that: The calculation formula of the comprehensive score is: S=w1*L / (|L2-L|)+w2*Q, |L2-L|≥1, and S=w1*L+w2*Q, 0≤|L2-L|<1, where S is the comprehensive score, L2 is the second simulated inductance corresponding to S, L is the inductance target value, Q is the simulated quality factor corresponding to S, w1 and w2 are the inductance weight and quality factor weight, respectively.

6. The parameter group determination method according to claim 4, characterized in that: The parameter group determination method further includes: S8. Compare the optimal inductor structure parameter group with all the inductor structure parameter groups in the orthogonal test table. When all the inductor structure parameter groups in the orthogonal test table are not the optimal inductor structure parameter group, perform electromagnetic simulation of air-core inductors according to the optimal grid partition parameter group and the optimal inductor structure parameter group to obtain candidate simulated inductance and candidate simulated quality factor, calculate and obtain candidate comprehensive scores according to the candidate simulated inductance and the candidate simulated quality factor, and compare the candidate comprehensive scores with the comprehensive scores corresponding to all the inductor structure parameter groups to verify the optimal inductor structure parameter group.

7. A parameter group determination device for determining an optimal meshing parameter group for electromagnetic simulation of an air-core inductor, characterized in that: include: A first acquisition module (1) is used to acquire a plurality of grid division parameter groups that conform to the orthogonal test table rules according to a preset inductor structure parameter group; A first simulation module (2) is used to perform electromagnetic simulation of the air-core inductor according to a preset inductor structure parameter group and a plurality of the mesh division parameter groups, and obtain a plurality of first simulated inductances and a plurality of simulated equivalent resistances; A screening module (3) is used to screen the levels of all mesh partitioning parameters in the mesh partitioning parameter group according to the first simulated inductance and the simulated equivalent resistance, and obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred parameter group and the second preferred parameter group are respectively preferred parameter groups for the first simulated inductance and the simulated equivalent resistance; The process of screening the levels of all mesh partitioning parameters in the mesh partitioning parameter group to obtain the first preferred parameter group and the second preferred parameter group includes: Calculate and obtain a plurality of first average values ​​and a plurality of second average values, wherein the first average value is an average value of first simulated inductance corresponding to all mesh partitioning parameter groups having the same type and level of mesh partitioning parameters, and the second average value is an average value of simulated equivalent resistance corresponding to all mesh partitioning parameter groups having the same type and level of mesh partitioning parameters; According to the first average value and the second average value, a first preferred level and a second preferred level corresponding to each type of grid division parameter are screened and obtained, and the first preferred level corresponding to each type of grid division parameter and the second preferred level corresponding to each type of grid division parameter are respectively combined to obtain a first preferred parameter group and a second preferred parameter group, wherein the first preferred level is a preferred level of a grid division parameter corresponding to a first simulated inductance, and the second preferred level is a preferred level of a grid division parameter corresponding to a simulated equivalent resistance; A second acquisition module (4) is used to acquire an optimal grid partitioning parameter group according to the first preferred parameter group and the second preferred parameter group.

8. An electronic device, characterized in that: The invention comprises a processor (301) and a memory (302), wherein the memory (302) stores a computer program executable by the processor (301), and when the processor (301) executes the computer program, the steps in any one of the methods according to claims 1 to 6 are performed.

9. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor (301), the steps of the method according to any one of claims 1 to 6 are performed.

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