Template test data generation method, device, equipment and storage medium

Abstract

The present application discloses a template test data generation method, device, equipment and storage medium, which relates to the field of electronic measurement technology. The method comprises: obtaining coordinate data and tolerance data of a basic waveform; performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; determining vertex data of a limit test template based on the pixel coordinate data and the tolerance data, and obtaining template data of the limit test template based on the vertex data. Thus, the template data generation function is realized during the oscilloscope limit test process.

Description

Technical Field

[0001] The present application relates to the field of electronic measurement technology, and in particular to a template test data generation method, device, equipment and storage medium. Background Art

[0002] The template test function is usually divided into two types, namely waveform limit template test and standard template test. Among them, the waveform limit template test is mainly used to detect the jitter and burr signal of the signal.

[0003] When performing limit testing, the test template will add certain horizontal and vertical tolerance values ​​to the original waveform, thereby dividing the waveform display area into two parts, upper and lower. Any signal that exceeds these two tolerance ranges will be considered non-compliant. Before testing, the generation, saving, and loading of the limit test template is crucial for subsequent waveform comparison, because it provides a benchmark so that subsequent signal analysis can be performed under a unified standard.

[0004] Currently, there is no method for generating template data for a limit test template in the related technology. Therefore, there is an urgent need for a method for generating template data for a limit test template. Summary of the invention

[0005] The main purpose of the present application is to provide a template test data generation method, device, equipment and storage medium to realize the template data generation function during the oscilloscope limit test process.

[0006] To achieve the above objectives, the present application provides a template test data generation method, comprising:

[0007] Obtaining coordinate data and tolerance data of the basic waveform;

[0008] Performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform;

[0009] Based on the pixel coordinate data and the tolerance data, vertex data of the limit test template are determined, and based on the vertex data, template data of the limit test template are obtained.

[0010] Optionally, the tolerance data includes a first pixel tolerance value and a second pixel tolerance value; determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data includes: creating multiple scan line segments along the width direction of the limit test template image, the scan line segments are created based on the first pixel tolerance value, and each of the scan line segments is distributed on both sides of the height direction of the pixel waveform; for any scan line segment, using the scan line segment and determining sub-vertex data based on the second pixel tolerance value; determining the vertex data of the limit test template based on the sub-vertex data corresponding to each of the scan line segments.

[0011] Optionally, the method of using the scan line segment and determining the sub-vertex data based on the second pixel tolerance value includes: controlling the scan line segment to move toward the pixel waveform along the height direction of the image frame, and detecting whether the scan line segment moves to the corresponding target position; if the scan line segment moves to the corresponding target position, controlling the scan line segment to move in a direction away from the pixel waveform, and moving to a position that is the second pixel tolerance value away from the target position; and determining the sub-vertex data based on the pixel coordinate data of the scan line segment after the movement.

[0012] Optionally, detecting whether the scan line segment has moved to the corresponding target position includes: obtaining a pixel value of a pixel point where the scan line segment is currently located and a pixel value of a pixel point where the scan line segment will be located after the next movement; determining whether the pixel value of a pixel point where the scan line segment is currently located is the same as the pixel value of a pixel point where the scan line segment will be located after the next movement; if the pixel value of a pixel point where the scan line segment is currently located is the same as the pixel value of a pixel point where the scan line segment will be located after the next movement, determining that the scan line segment has moved to the corresponding target position.

[0013] Optionally, the pixel coordinate conversion of the coordinate data of the basic waveform to obtain a pixel waveform and the pixel coordinate data of the pixel waveform includes: determining a first conversion factor based on the horizontal coordinate value range of the basic waveform and the preset image width of the extreme test template; determining a second conversion factor based on the vertical coordinate value range of the basic waveform and the preset image height of the extreme test template; and performing pixel coordinate conversion on the coordinate data of the basic waveform using a preset conversion formula, the first conversion factor and the second conversion factor to obtain a pixel waveform and the pixel coordinate data of the pixel waveform.

[0014] Optionally, the tolerance data includes a first initial tolerance value and a second initial tolerance value. Before determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, the method also includes: converting the first initial tolerance value using the first conversion factor to obtain a first pixel tolerance value; converting the second initial tolerance value using the second conversion factor to obtain a second pixel tolerance value.

[0015] Optionally, obtaining the template data of the limit test template based on the vertex data includes: converting the vertex data into value coordinates to obtain vertex value coordinate data; and normalizing the vertex value coordinate data using a preset normalization algorithm to obtain the template data of the limit test template.

[0016] In addition, to achieve the above-mentioned purpose, the present application also provides a template test data generation device, including: an acquisition module, used to acquire the coordinate data and tolerance data of the basic waveform; a conversion module, used to perform pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and the pixel coordinate data of the pixel waveform; a generation module, used to determine the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, and obtain the template data of the limit test template based on the vertex data.

[0017] The present application also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the template test data generating method as described in any one of the above is implemented.

[0018] The present application also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the template test data generating method as described in any one of the above is implemented.

[0019] The template test data generation method of the present application obtains the coordinate data and tolerance data of the basic waveform; and performs pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; further based on the pixel coordinate data and the tolerance data, the vertex data of the limit test template is determined, and finally the template data of the limit test template can be obtained through the vertex data, thereby realizing the template data generation function. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is one of the flow charts of the template test data generating method of the embodiment of the present application;

[0021] Figure 2 is a schematic diagram of a basic waveform of an embodiment of the present application;

[0022] Figure 3 is a schematic diagram of a pixel waveform of an embodiment of the present application;

[0023] Figure 4 This is the second flowchart of the template test data generating method of the embodiment of the present application;

[0024] Figure 5 This is the third flowchart of the template test data generation method of the embodiment of the present application;

[0025] Figure 6 This is the fourth flowchart of the template test data generating method of the embodiment of the present application;

[0026] Figure 7 This is the fifth flowchart of the template test data generating method of the embodiment of the present application;

[0027] Figure 8 This is the sixth flowchart of the template test data generating method of the embodiment of the present application;

[0028] Fig. 9 is a waveform diagram of normalized vertex value coordinate data of a specific example of the present application;

[0029] Fig.10 is a schematic diagram of a template test data generating device according to an embodiment of the present application;

[0030] Fig.11 An example physical structure diagram of an electronic device is provided.

[0031] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in this application will be clearly and completely described below in conjunction with the drawings in this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0033] With the rapid development of electronic equipment, the stability and reliability of signal transmission have become one of the key indicators of electronic equipment performance. Therefore, signal testing is an indispensable part of the production and manufacturing process of electronic equipment.

[0034] At present, the main way to test signal stability and integrity is template testing, that is, by defining an ideal signal model (called a "template"), and then comparing the actual collected signal with this template to check whether the signal meets the expected standards or specifications. According to different application scenarios and technical requirements, template testing can be divided into two categories: waveform limit template testing and standard template testing. The former is mainly used to detect the jitter of the signal and whether there is a glitch signal, while the latter is mainly used for eye diagram quality testing of signals that meet specific industry standards. When performing a limit template test, the test template will add a certain horizontal tolerance value and vertical tolerance value to the original waveform, thereby dividing the waveform display area into two parts, upper and lower; any signal that exceeds these two tolerance ranges will be considered non-compliant.

[0035] The template test process is mainly divided into two steps: the first step is to generate and load the template data; the second step is to compare and match the template data with the actual collected waveform and display the results. Among them, the generation, saving, and loading of template data are crucial for subsequent waveform comparison, because the template data provides a benchmark, so that subsequent signal analysis can be carried out under a unified standard. At present, there is no method for generating template data for limit test templates in related technologies. Therefore, a method for generating template data for limit test templates is urgently needed.

[0036] To this end, the embodiments of the present application provide a template test data generation method, device, equipment and storage medium, which converts the coordinates of each point on the basic waveform into pixel coordinates, and then creates and moves scanning line segments based on horizontal tolerance values ​​and vertical tolerance values ​​to find the template vertex coordinates that meet the horizontal tolerance value and vertical tolerance value requirements, and finally obtains the template data through the vertex coordinates to realize the template data generation function.

[0037] Figure 1 This is one of the flow charts of the template test data generation method of the embodiment of the present application. The template test data generation method can be executed by a control chip or processor in an electronic device, such as Figure 1 As shown, the template test data generating method may include the following steps:

[0038] Step 110: Obtain coordinate data and tolerance data of the basic waveform.

[0039] Step 120: Perform pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform.

[0040] Step 130: Determine vertex data of the limit test template based on the pixel coordinate data and the tolerance data, and obtain template data of the limit test template based on the vertex data.

[0041] First of all, it should be noted that the template test data generation method provided in the embodiment of the present application can be applied to any scenario where it is necessary to detect whether the performance of electronic components and circuits has reached the limit. For example, when developing a new generation of smartphone motherboards, the stability and reliability of inter-chip communication signals are detected through an oscilloscope limit test template; for another example, in the field of communications, an oscilloscope limit test template is used to implement a scenario of extreme evaluation of the signal transmission quality of communication equipment; for another example, in the field of automotive electronics, an oscilloscope limit test template is used to implement reliability testing of automotive electronic systems. The method provided in the embodiment of the present application can also be applied to scenarios where the signals of electronic components exceed the template limits under extreme temperatures, vibrations, and other conditions; or it can be applied to scenarios in the fields of aerospace, industrial automation, medical equipment, etc., where an oscilloscope limit test template is used to troubleshoot hidden dangers to ensure the normal operation of the equipment.

[0042] In this embodiment, the coordinate data of the basic waveform refers to the value coordinates of the waveform output by the oscilloscope. For example, the horizontal coordinate of a point on the basic waveform can be a specific time, and the vertical coordinate can be a specific voltage value. The specific time and voltage value are the coordinate data of the point. The tolerance data can include the horizontal tolerance value and the vertical tolerance value of the basic waveform. The horizontal tolerance value and the vertical tolerance value can be set by the staff according to actual needs. The units of the horizontal tolerance value and the vertical tolerance value can be a specific time or voltage value, or a proportional value per grid.

[0043] Figure 2 It is a schematic diagram of the basic waveform of the embodiment of the present application. Figure 3 Schematic diagram of a pixel waveform according to an embodiment of the present application.

[0044] refer to Figure 2 In step 110, a basic waveform for reference can be generated by an oscilloscope. When the oscilloscope outputs the basic waveform, it will also output the coordinate data of each point on the basic waveform, such as the time and voltage value of each point. In addition, the tolerance data for the basic waveform can be pre-set by the staff, and the tolerance data can be stored in the processor of the electronic device, which can be directly retrieved when needed. The staff can directly set specific horizontal tolerance values ​​and vertical tolerance values. For example, if the horizontal axis of the basic waveform is time and the vertical axis is voltage value, the horizontal tolerance value can be set to 10ps and the vertical tolerance value can be set to 0.5V. Figure 3 As shown, the margin data may also be a horizontal margin value and a vertical margin value after pixel conversion.

[0045] Furthermore, after obtaining the basic waveform coordinate data and tolerance data output by the oscilloscope, the processor can perform pixel coordinate conversion on the coordinate data of the basic waveform to obtain a basic waveform diagram in the form of pixels composed of pixel coordinates (i.e., pixel waveform), as well as pixel coordinate data of each point on the pixel waveform, i.e. Figure 3 After the processor obtains the pixel waveform and pixel coordinate data, it can use the tolerance data to find the vertex data of the limit test template in the pixel waveform. All vertex data can form two closed areas (i.e. Figure 3 The two closed areas are respectively distributed on the upper and lower sides of the pixel waveform. In this embodiment, such a waveform diagram can be directly used as a limit test template; or the pixel waveform diagram with two closed areas can be converted into a value coordinate to obtain a limit test template.

[0046] It should be noted that when using tolerance data to determine vertex data, the tolerance data needs to be converted into tolerance values ​​in pixel form. In addition, the value waveform graph refers to a waveform graph formed based on value coordinate data, such as a waveform graph formed based on time and voltage values.

[0047] Figure 4 This is the second flowchart of the template test data generation method of the embodiment of the present application. Figure 4 As shown, in some embodiments, the tolerance data includes a first pixel tolerance value and a second pixel tolerance value. In step 130, determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data may include the following steps:

[0048] Step 410: creating a plurality of scan line segments along the width direction of the limit test template image, wherein the scan line segments are created based on the first pixel tolerance value, and each scan line segment is distributed on both sides of the pixel waveform height direction.

[0049] Step 420: For any scan line segment, determine sub-vertex data using the scan line segment and based on the second pixel tolerance value.

[0050] Step 430: Determine vertex data of the limit test template based on the sub-vertex data corresponding to each scan line segment.

[0051] It should be noted that the first pixel tolerance value may be a horizontal tolerance value after pixel conversion. For example, if the horizontal tolerance value is set to 3ps (picoseconds), and the conversion ratio is determined to be 2 according to the image width of the limit test template and the range of the horizontal coordinate value of the basic waveform, the horizontal tolerance value 3ps is pixel-converted using this conversion ratio, and the first pixel tolerance value is 6. Similarly, the second pixel tolerance value may be a vertical tolerance value after pixel conversion. For example, if the vertical tolerance value is set to 2V, and the conversion ratio is determined to be 1.5 according to the image height of the limit test template and the range of the vertical coordinate value of the basic waveform, the vertical tolerance value 2V is pixel-converted using this conversion ratio, and the second pixel tolerance value is 3.

[0052] After obtaining the first pixel tolerance value and the second pixel tolerance value, multiple scanning line segments can be further created along the width direction of the limit test template image. The scanning line segments are horizontal line segments, and their width can be the first pixel tolerance value and their height can be 1 pixel. Figure 3 , if the first pixel tolerance value is 3, the width of the scan line segment can be 3 pixels. When creating a scan line segment, you can choose to create multiple continuous scan line segments at the same time; you can also choose to create multiple scan line segments in sequence from left to right and from top to bottom. In addition, the scan line segments are distributed on both sides of the height direction of the pixel waveform, that is, distributed on the upper and lower sides of the pixel waveform. When creating a scan line segment, the scan line segment can be directly created at the top and bottom of the image, for example Figure 3 The creation position shown in ; the scan line segments can also be created at any position that does not overlap with the pixel waveform, as long as the scan line segments are distributed on both sides of the pixel waveform and the scan line segments on the upper and lower sides are continuously distributed across the entire image in the image width direction.

[0053] If the image width of the limit test template is W and the first pixel tolerance value is w1, then N=W / w1 adjacent scan line segments will be generated on the upper side of the pixel waveform. Similarly, N adjacent scan line segments will be generated on the lower side of the pixel waveform. Furthermore, after creating multiple scan line segments, the corresponding sub-vertex data can be found by moving the scan line segments up and down. Finally, the vertex data of the limit test template is obtained based on the sub-vertex data corresponding to all scan line segments. It should be noted here that the sub-vertex data can be the pixel coordinate values ​​of each sub-vertex corresponding to the scan line segment; in addition, the vertex data of the limit test template refers to: the pixel coordinate values ​​of the edge line of the limit test template.

[0054] Figure 5 This is the third flow chart of the template test data generation method of the embodiment of the present application. Figure 5 As shown, in some implementations, step 420 determines the sub-vertex data using the scan line segment and based on the second pixel tolerance value, and may include the following steps:

[0055] Step 510: Control the scan line segment to move toward the pixel waveform along the height direction of the image frame, and detect whether the scan line segment moves to the corresponding target position.

[0056] Step 520: If the scan line segment moves to the corresponding target position, control the scan line segment to move in a direction away from the pixel waveform and move to a position that is a second pixel tolerance value away from the target position.

[0057] Step 530: Determine sub-vertex data based on the pixel coordinate data of the scanned line segment after the movement.

[0058] Take a scan line segment as an example, if the width of the limit test template is set to W, the height is set to H, the first pixel tolerance value is w1, and the second pixel tolerance value is h1. A scan line segment with a length of w1 pixels and a height of 1 pixel can be constructed from the top left side of the image; further, the scan line segment is moved downward (i.e., toward the direction of the pixel waveform), and if the scan line segment reaches the corresponding target position, the scan line segment is moved upward (i.e., away from the direction of the pixel waveform) by the second pixel tolerance value h1 pixel units. After the movement, the pixel coordinates of all the pixel points where the scan line segment is located are the sub-vertex data.

[0059] It should be noted that the target position corresponding to the scan line segment may be a position where the scan line segment touches the pixel waveform but does not overlap with the pixel waveform.

[0060] In this embodiment, after a scan line segment is created and moved to obtain the corresponding sub-vertex data, a second scan line segment is created at a position adjacent to the previous scan line segment and moved to obtain the corresponding sub-vertex data; the above process is repeated until the upper and lower sides of the pixel waveform are fully scanned. Finally, all the scan line segments are connected end to end to form a Figure 3 The two closed areas shown; the sub-vertex data corresponding to all scan line segments and all vertex data used to connect the scan line segments constitute the vertex data of the limit test template. It should be noted here that the vertex data used to connect the scan line segments refers to: the pixel coordinate data corresponding to the line segments used to connect the scan line segments at the end.

[0061] In some embodiments, multiple scan line segments can be created simultaneously, and all scan line segments can be moved toward the pixel waveform at the same time. If the scan line segment touches the pixel waveform, the scan line segment is moved away from the pixel waveform by a second pixel tolerance value h1 pixel units. After the movement, the pixel coordinates of all pixel points where each scan line segment is located are the corresponding sub-vertex data.

[0062] Figure 6This is the fourth flow chart of the template test data generation method of the embodiment of the present application. Figure 6 As shown, in some embodiments, detecting whether the scan line segment moves to the corresponding target position in step 510 may include the following steps:

[0063] Step 610: Obtain the pixel value of the pixel point where the scan line segment is currently located and the pixel value of the pixel point where the scan line segment will be located after the next movement.

[0064] Step 620: Determine whether the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment is located after the next movement.

[0065] Step 630: If the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment will be located after the next movement, it is determined that the scan line segment moves to the corresponding target position.

[0066] Still taking a scan line segment as an example, when the scan line segment moves, the pixel value of the current pixel point where the scan line segment is located can be obtained in real time, as well as the pixel value of the pixel point where the scan line segment will be located after the next movement. By comparing the pixel values ​​of the pixel points where the scan line segment is located before and after the movement, it is determined whether the scan line segment has reached the corresponding target position. Figure 3 It can be understood that, in the pixel waveform diagram, the pixel values ​​of all pixels on the pixel waveform are different from the pixel values ​​of the surrounding pixels that are not on the pixel waveform. Usually, the pixel values ​​of the pixels around the pixel waveform can be set to [0, 0, 0]. Therefore, by comparing the pixel values, it can be known whether the scan line segment touches the pixel waveform. If it touches the pixel waveform, the scan line segment is retreated to the unit length of the second pixel tolerance value, so that the limit test template meets the second pixel tolerance value.

[0067] Specifically, after obtaining the pixel value of the pixel point where the scan line segment is currently located and the pixel value of the pixel point where the scan line segment will be located after the next movement, it is determined whether the pixel value of each pixel point where the scan line segment is currently located is the same as the pixel value of each pixel point after the next movement. It should be noted here that because the scan line segment moves vertically, the pixel values ​​of two pixels at the same horizontal position can be used for comparison.

[0068] If the pixel values ​​of the pixels where the scan line segment is currently located are the same as the pixel values ​​of the pixels at the same horizontal position after the next movement, it means that the scan line segment has not reached the target position, and the scan line segment can continue to move toward the pixel waveform. If the pixel values ​​of the pixels where the scan line segment is currently located are different from the pixel values ​​of the corresponding pixels, it means that the scan line segment has reached the target position, and the scan line segment can be moved in the direction away from the pixel waveform.

[0069] The above is a detailed introduction to the process of determining the vertex data of the limit test template using the scan line segment, the first pixel tolerance value and the second pixel tolerance value. The following is a detailed introduction to the process of how to convert the coordinate data of the basic waveform into pixel coordinates.

[0070] Figure 7 This is the fifth flow chart of the template test data generation method of the embodiment of the present application. Figure 7 As shown, in some embodiments, performing pixel coordinate conversion on the coordinate data of the basic waveform in step 120 to obtain the pixel waveform and the pixel coordinate data of the pixel waveform may include the following steps:

[0071] Step 710: Determine a first conversion factor based on the horizontal coordinate value range of the basic waveform and the preset image width of the limit test template.

[0072] Step 720: Determine a second conversion factor based on the vertical coordinate value range of the basic waveform and the preset image height of the limit test template.

[0073] Step 730: Perform pixel coordinate conversion on the coordinate data of the basic waveform using a preset conversion formula, a first conversion factor, and a second conversion factor to obtain a pixel waveform and pixel coordinate data of the pixel waveform.

[0074] Specifically, the horizontal axis value range and the vertical axis value range of the basic waveform can be obtained first. For example, the horizontal axis value range can be 0ps to 80ps (picoseconds), and the vertical axis value range can be -2V to 2V. The first conversion factor can be obtained by dividing the width of the limit test template by the horizontal axis value range. The first conversion factor can be specifically determined by the following formula:

[0075] factor W =(pixelRange W ÷valueRange W )

[0076] In the formula, factor W is the first conversion factor, pixelRange W is the width of the image, valueRange W The value range of the horizontal axis.

[0077] Similarly, the second conversion factor can be obtained by dividing the image height of the limit test template by the vertical coordinate value range. The second conversion factor can be specifically determined by the following formula:

[0078] factor H =(pixelRange H ÷valueRange H )

[0079] In the formula, factor H is the second conversion factor, pixelRange H is the image height, valueRange H The vertical axis value range.

[0080] As an example, if the horizontal axis value range is 0ps to 80ps (picoseconds) and the image width is 40 pixels, the first conversion factor is 0.5; if the vertical axis value range is -2V to 2V and the image height is 40 pixels, the second conversion factor is 10.

[0081] After obtaining the first conversion factor and the second conversion factor, the coordinates of each point on the basic waveform can be converted into pixel coordinates using a preset conversion formula. Specifically, taking the coordinates of a point on the basic waveform as an example, the horizontal coordinate value of the point is subtracted from the lower limit of the horizontal coordinate value range and then multiplied by the first conversion factor to obtain the pixel horizontal coordinate of the point; similarly, the vertical coordinate value of the point is subtracted from the lower limit of the vertical coordinate value range and then multiplied by the second conversion factor to obtain the pixel vertical coordinate of the point; the pixel horizontal coordinate and the pixel vertical coordinate of the point constitute the pixel coordinate data of the point. The pixel coordinate conversion process of other points on the basic waveform can refer to the above process and will not be repeated here.

[0082] In this embodiment, the preset conversion formula for converting the coordinate data of the basic waveform into the pixel coordinate data may specifically be:

[0083] pixelValue W =(value W - offset W )×factor W

[0084] pixelValue H =(value H - offset H )×factor H

[0085] Where pixelValue W is the converted pixel horizontal coordinate, value W is the horizontal coordinate value of the point on the basic waveform, offset W is the lower limit of the horizontal axis value range, factor W is the first conversion factor; pixelValue H is the converted pixel ordinate, value H is the vertical coordinate value of the point on the basic waveform, offset His the lower limit of the vertical axis value range, factor H is the second conversion factor.

[0086] In some embodiments, the tolerance data includes a first initial tolerance value and a second initial tolerance value. Before determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, the template test data generation method may also include: converting the first initial tolerance value using a first conversion factor to obtain a first pixel tolerance value; converting the second initial tolerance value using a second conversion factor to obtain a second pixel tolerance value.

[0087] It should be noted that the first initial tolerance value may be the aforementioned horizontal tolerance value, the second initial tolerance value may be the aforementioned vertical tolerance value, and both the first initial tolerance value and the second initial tolerance value may be specific values ​​set by the staff. For example, if the abscissa of the basic waveform is time and the ordinate is voltage value, the first initial tolerance value may be set to 10ps and the second initial tolerance value may be set to 0.5V.

[0088] In an embodiment of the present application, the staff can directly set a specific first initial tolerance value and a second initial tolerance value, and then perform pixel conversion on the first initial tolerance value and the second initial tolerance value, and then use the obtained first pixel tolerance value and second pixel tolerance value to perform a subsequent scanning process.

[0089] Specifically, the first initial tolerance value can be multiplied by the first conversion factor to obtain the first pixel tolerance value; similarly, the second initial tolerance value can be multiplied by the second conversion factor to obtain the second pixel tolerance value. For example, if the first initial tolerance value is 10ps and the first conversion factor is 0.5, the first pixel tolerance value is 10×0.5=5; if the second initial tolerance value is 0.5V and the second conversion factor is 20, the first pixel tolerance value is 20×0.5=10. Thus, the specific first initial tolerance value and the second initial tolerance value can be converted into the required first pixel tolerance value and second pixel tolerance value.

[0090] Figure 8 This is the sixth flow chart of the template test data generation method of the embodiment of the present application. Figure 8 As shown, in some implementations, obtaining the template data of the limit test template based on the vertex data in step 130 may include the following steps:

[0091] Step 810: Convert the vertex data into value coordinates to obtain vertex value coordinate data.

[0092] Step 820: Use a preset normalization algorithm to normalize the vertex value coordinate data to obtain template data of the limit test template.

[0093] In this embodiment, when the vertex data of the limit test template (i.e. Figure 3 After the vertex data is converted into the vertex value coordinates, the vertex value coordinate data of the limit test template can be obtained. When the limit test template is used for testing later, the template waveform and the waveform to be tested can be more clearly compared. It should be noted that the vertex value coordinate data may include the horizontal coordinate value and the vertical coordinate value of each vertex. In this embodiment, the vertex coordinates can be converted into the vertex value coordinates by the following formula:

[0094] value W` =(pixelValue W +(offset W ×factor W ))÷factor W

[0095] value H` =(pixelValue H +(offset H ×factor H ))÷factor H

[0096] Where, value W` is the horizontal coordinate of the vertex after value coordinate conversion, value H` It is the vertical coordinate of the vertex after value coordinate conversion.

[0097] Furthermore, after obtaining the vertex value coordinate data after the coordinate transformation, the vertex value coordinate data is normalized using a preset normalization algorithm to obtain the template data of the limit test template.

[0098] It can be understood that for the normalized vertex value coordinate data, no matter what the amplitude of the measured signal is, coordinate normalization can effectively eliminate the impact of amplitude differences. For example, when comparing signals generated by circuits of different batches or different types but with similar functions, coordinate normalization can ensure that the evaluation is based on the shape and characteristics of the signal, rather than the absolute amplitude or time value. This improves the consistency and comparability of the measurement, so that the obtained limit test template can be applied to similar signals with different amplitude characteristics, reducing the need to repeatedly design templates for each specific signal. Secondly, the normalized vertex value coordinate data occupies less storage space because it is not necessary to store the absolute amplitude information of each signal, which can save storage space and improve data transmission efficiency when processing a large amount of test data; in addition, data analysis software can also easily process the normalized vertex value coordinate data, perform statistical analysis, template recognition and other operations to discover potential trends and problems.

[0099] In this embodiment, the preset normalization algorithm may be a maximum and minimum value normalization algorithm, a linear normalization algorithm, or a zero-mean normalization algorithm, and the preset normalization algorithm is not specifically limited here.

[0100] Fig. 9 It is a waveform diagram of the normalized vertex value coordinate data of a specific example of the present application.

[0101] like Fig. 9 As shown, taking the minimum value normalization algorithm as an example, the vertical direction of the oscilloscope is usually ±4 grid voltage values, and the horizontal direction is ±5 grid time values. When performing normalization processing, the vertical or horizontal +2 grids are set as the data normalized to 1. Taking the vertical direction as an example, the vertical coordinate value of the vertex Y1 is set to a -2 grid value; the vertical coordinate value of the vertex Y2 is set to a +2 grid value, that is, the position normalized to 1, and the vertical coordinates of each vertex are normalized by the following minimum value normalization calculation formula:

[0102] normalizedY=(value H` * -Y1)÷(Y2-Y1)

[0103] Where normalizedY is the normalized vertical coordinate of a vertex, value H` * is the ordinate of the vertex after value coordinate conversion and before normalization. The ordinate of each vertex can be normalized by the above formula. The normalization method of the horizontal coordinate of each vertex is the same as that of the ordinate, which will not be repeated here. Thus, the normalized template data can be obtained.

[0104] After the template is created, the template scale or template offset can be adjusted by adjusting the values ​​of Y1 and Y2 without changing the original vertex value coordinate data, so that a template can be adapted to signals of different amplitudes through such simple fine-tuning.

[0105] In some embodiments, after the template data of the limit test template is obtained, the template data of the limit test template needs to be stored. When storing, it can be stored in the form of a data file, and the information that needs to be saved includes (but is not limited to): file header, template type, template data, and setting information. Among them, the file header can be used to identify the product model and type to which the file is applicable; the template type is used to identify whether the template stored in the file is a limit test template or an eye diagram template; the template data includes the normalized vertex data of multiple areas of the template. For example, if the template is a limit test template, the template data includes the normalized vertex data of the upper and lower areas, and the vertex data is in the form of coordinates. The top and bottom of the limit test template can be represented by MAX and MIN, respectively, and recorded in the vertex data; the setting information is used to record the settings required for the template, so that when the template is loaded, the instructions can be directly executed and the corresponding settings can be made. The setting information can be stored in the form of SCPI instructions.

[0106] In some embodiments, when a template is needed, the template test file can be loaded in the following manner: first, open the template test file and read the file header identifier to verify whether the template stored in the template test file supports the current model of the product; if the template supports the current model of the product, read the vertex data of the template from the template test file and pre-store it; further, the normalized vertex data can be converted into value coordinate data, and the value coordinate data can be converted into pixel coordinate data for display on the display of the electronic device; finally, read the setting information and execute the setting instructions to complete the process of loading the template test file.

[0107] It is worth noting that the reading methods of the eye diagram template and the limit test template are the same. The eye diagram template may have multiple test areas and only needs to be read cyclically; secondly, the eye diagram template drawing method needs to be based on the eye diagram coordinates.

[0108] Therefore, by converting the basic wave into a pixel waveform diagram, and then using the first pixel tolerance value and the second pixel tolerance value to create and move the scan line segment, we can find the vertex data that meets the horizontal tolerance value and vertical tolerance value set by the staff, and finally obtain the template data of the final required limit test template by performing value coordinate conversion and normalization on the vertex data.

[0109] Fig.10 It is a schematic diagram of a template test data generating device according to an embodiment of the present application.

[0110] like Fig.10As shown, the template test data generating device 1000 may include an acquisition module 1010, a conversion module 1020 and a generation module 1030 connected in sequence. The acquisition module 1010 is used to acquire the coordinate data and tolerance data of the basic waveform; the conversion module 1020 is used to perform pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; the generation module 1030 is used to determine the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, and obtain the template data of the limit test template based on the vertex data.

[0111] Therefore, the coordinate data and tolerance data of the basic waveform are acquired through the acquisition module 1010; the conversion module 1020 performs pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; the generation module 1030 determines the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, and finally the template data of the limit test template can be obtained through the vertex data, thereby realizing the template data generation function.

[0112] In some embodiments, the limit data includes a first pixel tolerance value and a second pixel tolerance value; the generation module 1030 is specifically used to: create multiple scan line segments along the width direction of the limit test template image, the scan line segments are created based on the first pixel tolerance value, and each scan line segment is distributed on both sides of the pixel waveform height direction; for any scan line segment, use the scan line segment and determine the sub-vertex data based on the second pixel tolerance value; determine the vertex data of the limit test template based on the sub-vertex data corresponding to each scan line segment.

[0113] In some embodiments, the generation module 1030 is also specifically used to: control the scan line segment to move toward the pixel waveform along the height direction of the image, and detect whether the scan line segment moves to the corresponding target position; if the scan line segment moves to the corresponding target position, control the scan line segment to move in a direction away from the pixel waveform, and move to a position that is a second pixel tolerance value away from the target position; determine the sub-vertex data based on the pixel coordinate data of the scan line segment after movement.

[0114] In some embodiments, the generation module 1030 is also specifically used to: obtain the pixel value of the pixel point where the scan line segment is currently located and the pixel value of the pixel point where the scan line segment will be located after the next movement; determine whether the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment will be located after the next movement; if the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment will be located after the next movement, determine that the scan line segment has moved to the corresponding target position.

[0115] In some embodiments, the conversion module 1020 is specifically used to: determine a first conversion factor based on the horizontal coordinate value range of the basic waveform and the preset image width of the extreme test template; determine a second conversion factor based on the vertical coordinate value range of the basic waveform and the preset image height of the extreme test template; use a preset conversion formula, the first conversion factor and the second conversion factor to perform pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform.

[0116] In some embodiments, the tolerance data includes a first initial tolerance value and a second initial tolerance value; the conversion module 1020 is also specifically used to: convert the first initial tolerance value using a first conversion factor to obtain a first pixel tolerance value; and convert the second initial tolerance value using a second conversion factor to obtain a second pixel tolerance value.

[0117] In some implementations, the generation module 1030 is further specifically used to: perform value coordinate conversion on the vertex data to obtain vertex value coordinate data; and perform normalization processing on the vertex value coordinate data using a preset normalization algorithm to obtain template data of the limit test template.

[0118] It should be noted that for details not disclosed in the template test data generating device of this embodiment, please refer to the details disclosed in the embodiment of the template test data generating method in the embodiment of this specification, and no further details will be given here.

[0119] Fig.11 An example of a physical structure diagram of an electronic device is shown in FIG. Fig.11 As shown, the electronic device may include: a processor 1110, a communication interface 1120, a memory 1130 and a communication bus 1140, wherein the processor 1110, the communication interface 1120 and the memory 1130 communicate with each other through the communication bus 1140. The processor 1110 may call the logic instructions in the memory 1130 to execute the template test data generation method, which includes: obtaining the coordinate data and tolerance data of the basic waveform; performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, and obtaining the template data of the limit test template based on the vertex data.

[0120] In addition, the logic instructions in the above-mentioned memory 1130 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0121] On the other hand, the present invention also provides a computer program product, which includes a computer program. The computer program can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the above-mentioned template test data generation method, which includes: obtaining coordinate data and tolerance data of a basic waveform; performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; determining vertex data of a limit test template based on the pixel coordinate data and the tolerance data, and obtaining template data of the limit test template based on the vertex data.

[0122] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the above-mentioned template test data generation method, the method comprising: obtaining coordinate data and tolerance data of a basic waveform; performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; determining vertex data of a limit test template based on the pixel coordinate data and the tolerance data, and obtaining template data of the limit test template based on the vertex data.

[0123] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0124] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0125] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for generating template test data, characterized in that: include: Obtaining coordinate data and tolerance data of the basic waveform; Performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; Determine vertex data of a limit test template based on the pixel coordinate data and the tolerance data, and obtain template data of the limit test template based on the vertex data; The tolerance data includes a first pixel tolerance value and a second pixel tolerance value; and the step of determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data includes: Creating a plurality of scanning line segments along the width direction of the limit test template image, wherein the scanning line segments are created based on the first pixel tolerance value, and each of the scanning line segments is distributed on both sides of the pixel waveform in the height direction; For any scan line segment, determine sub-vertex data using the scan line segment and based on the second pixel tolerance value; Determine the vertex data of the limit test template based on the sub-vertex data corresponding to each of the scan line segments; The determining sub-vertex data using the scan line segment and based on the second pixel tolerance value comprises: Controlling the scanning line segment to move toward the pixel waveform along the height direction of the image frame, and detecting whether the scanning line segment moves to the corresponding target position; If the scan line segment moves to the corresponding target position, control the scan line segment to move in a direction away from the pixel waveform and move to a position that is the second pixel tolerance value away from the target position; Determine the sub-vertex data based on the pixel coordinate data of the scan line segment after the movement; The detecting whether the scanning line segment moves to the corresponding target position includes: Obtaining a pixel value of a pixel point where the scan line segment is currently located and a pixel value of a pixel point where the scan line segment will be located after the next movement; Determine whether a pixel value of a pixel point where the scan line segment is currently located is the same as a pixel value of a pixel point where the scan line segment is located after the next movement; If the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment is located after the next movement, it is determined that the scan line segment moves to the corresponding target position.

2. The template test data generating method according to claim 1, characterized in that: The step of performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and the pixel coordinate data of the pixel waveform includes: Determine a first conversion factor based on the horizontal coordinate value range of the basic waveform and the preset image width of the limit test template; Determine a second conversion factor based on the vertical coordinate value range of the basic waveform and the preset image height of the limit test template; The coordinate data of the basic waveform is converted into pixel coordinates using a preset conversion formula, the first conversion factor, and the second conversion factor to obtain a pixel waveform and pixel coordinate data of the pixel waveform.

3. The template test data generating method according to claim 2, characterized in that: The tolerance data includes a first initial tolerance value and a second initial tolerance value. Before determining the vertex data of the limit test template based on the pixel coordinate data and the tolerance data, the method further includes: Converting the first initial tolerance value using the first conversion factor to obtain a first pixel tolerance value; The second initial tolerance value is converted using the second conversion factor to obtain a second pixel tolerance value.

4. The template test data generating method according to any one of claims 1 to 3, characterized in that: The step of obtaining the template data of the limit test template based on the vertex data includes: Convert the vertex data into value coordinates to obtain vertex value coordinate data; The vertex value coordinate data is normalized using a preset normalization algorithm to obtain template data of the limit test template.

5. A template test data generating device, characterized in that: include: An acquisition module, used for acquiring coordinate data and tolerance data of a basic waveform; A conversion module, used for performing pixel coordinate conversion on the coordinate data of the basic waveform to obtain a pixel waveform and pixel coordinate data of the pixel waveform; A generating module, used for determining vertex data of a limit test template based on the pixel coordinate data and the tolerance data, and obtaining template data of the limit test template based on the vertex data; Wherein, the tolerance data includes a first pixel tolerance value and a second pixel tolerance value; the generation module is specifically used to: create a plurality of scan line segments along the width direction of the limit test template image, the scan line segments are created based on the first pixel tolerance value, and each of the scan line segments is distributed on both sides of the height direction of the pixel waveform; for any scan line segment, use the scan line segment and determine sub-vertex data based on the second pixel tolerance value; determine the vertex data of the limit test template based on the sub-vertex data corresponding to each of the scan line segments; The generation module is also specifically used to: control the scan line segment to move toward the pixel waveform along the height direction of the image frame, and detect whether the scan line segment moves to the corresponding target position; if the scan line segment moves to the corresponding target position, control the scan line segment to move in a direction away from the pixel waveform, and move to a position at a distance from the target position by the second pixel tolerance value; determine the sub-vertex data based on the pixel coordinate data of the scan line segment after the movement; The generation module is also specifically used to: obtain the pixel value of the pixel point where the scan line segment is currently located and the pixel value of the pixel point where the scan line segment will be located after the next movement; determine whether the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment will be located after the next movement; if the pixel value of the pixel point where the scan line segment is currently located is the same as the pixel value of the pixel point where the scan line segment will be located after the next movement, determine that the scan line segment has moved to the corresponding target position.

6. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the template test data generating method according to any one of claims 1 to 4 is implemented.

7. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the template test data generating method according to any one of claims 1 to 4 is implemented.

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