Dark current automatic test method, device and equipment and storage medium

Abstract

The invention discloses a dark current automatic test method, device and equipment and a storage medium, and relates to the technical field of vehicle detection, and the method comprises the steps: controlling a first relay and a second relay to supply power to a constant electric pin and an ON-gear electric pin of a tested controller according to a received test start instruction, and enabling the tested controller to complete normal power-on; according to a received test dormancy instruction, controlling the second relay to enable the tested controller to enter a dormancy state; receiving a voltage comparison signal generated according to the dark current value in the dormant state, and determining a dark current test result according to the voltage comparison signal; and outputting the dark current test result to an upper computer, and displaying the dark current detection result, thereby realizing automatic test of the dark current of the automobile controller, and improving the dark current test efficiency.

Description

Technical Field

[0001] The present application relates to the field of vehicle detection technology, and in particular to a dark current automatic testing method, device, equipment and storage medium. Background Art

[0002] In the use of electric vehicles, battery life is a very important evaluation indicator, and in daily use, one of the factors that affect battery life is dark current. Dark current is the current generated by electronic products in a completely dormant state. For electric vehicles, if the dark current in the car controller is too large, it will cause the low-voltage battery to lose power when the car is parked for a long time, resulting in a short service life of the low-voltage battery, which brings a bad experience to users.

[0003] Therefore, in order to determine the dark current in the automobile controller, the commonly used detection method is to connect a multimeter in series to the power supply circuit of the controller, wait for a period of time for the controller to enter network sleep, read the dark current of the controller network sleep from the multimeter, wait for another period of time, and read the dark current of the controller sleep from the multimeter after the controller enters sleep. The disadvantage of this method is that it cannot realize batch testing or automated testing. If multiple controllers need to be tested in parallel, multiple multimeters and multiple operators are required, which is relatively inefficient.

[0004] The above contents are only used to assist in understanding the technical solution of the present application and do not constitute an admission that the above contents are prior art. Summary of the invention

[0005] The main purpose of the present application is to provide a dark current automatic testing method, device, equipment and storage medium, aiming to solve the technical problem of low detection efficiency in the dark current detection in the automobile controller in the prior art.

[0006] To achieve the above objectives, the present application proposes a dark current automatic testing method, the dark current automatic testing method comprising:

[0007] According to the received test start instruction, the first relay and the second relay are controlled to supply power to the normal power pin and the ON gear power pin of the controller under test, so that the controller under test is powered on normally;

[0008] According to the received test sleep instruction, controlling the second relay to make the controller under test enter a sleep state;

[0009] receiving a voltage comparison signal generated according to a dark current value in a sleep state, and determining a dark current test result according to the voltage comparison signal;

[0010] The dark current test result is output to a computer host computer, and the dark current detection result is displayed.

[0011] In one embodiment, the step of controlling the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction so that the controller under test completes normal power-on includes:

[0012] According to the received test start instruction, the first relay is controlled to be closed to supply power to the normal power pin of the controller under test;

[0013] After waiting for a preset time, the second relay is controlled to be closed according to the test start instruction to supply power to the ON position power pin of the controller under test;

[0014] A power-on detection is performed on the controller under test, and when the normal power pin and the ON gear power pin of the controller under test are both in power supply state, it is determined that the controller under test has completed power-on.

[0015] In one embodiment, the step of controlling the second relay to put the controller under test into a sleep state according to the received test sleep instruction includes:

[0016] After the controller under test completes normal power-on and waits for a first waiting time, the second relay is controlled according to the received test sleep instruction to put the controller under test into a sleep state.

[0017] In one embodiment, after the controller under test completes normal power-on, after waiting for a first waiting time, the step of controlling the second relay according to the received test sleep instruction to put the controller under test into a sleep state includes:

[0018] After the controller under test completes normal power-on, after waiting for a first waiting time, monitoring a test sleep instruction;

[0019] When the test sleep instruction is monitored, after waiting for a second waiting time, the second relay is controlled according to the received test sleep instruction to make the controller under test enter a network sleep state;

[0020] When the controller under test is in the network sleep state, after waiting for a third waiting time, the controller under test is changed from the network sleep state to the controller sleep state.

[0021] In one embodiment, the step of receiving a voltage comparison signal generated according to a dark current value in a sleep state and determining a dark current test result according to the voltage comparison signal comprises:

[0022] The sleep state is judged, and when the sleep state is a network sleep state, a voltage comparison signal output by a voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between a positive terminal voltage value corresponding to a dark current and a first negative terminal voltage output by an analog output channel of an MCU;

[0023] When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value;

[0024] When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

[0025] In one embodiment, the step of receiving a voltage comparison signal generated according to a dark current value in a sleep state and determining a dark current test result according to the voltage comparison signal further includes:

[0026] The dormant state is judged, and when the dormant state is the controller dormant state, a voltage comparison signal output by the voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between the positive terminal voltage value corresponding to the dark current and the second negative terminal voltage output by the MCU analog output channel;

[0027] When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value;

[0028] When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

[0029] In one embodiment, the step of outputting the dark current test result to a computer host computer and displaying the dark current detection result includes:

[0030] The dark current test result is transmitted to a computer host computer through a communication interface, so that the computer host computer displays the dark current test result and generates a database file according to the dark current test result.

[0031] In addition, to achieve the above-mentioned purpose, the present application also proposes a dark current automatic testing device, the dark current automatic testing device comprising:

[0032] A power-on control module, used for controlling the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction, so that the controller under test can be powered on normally;

[0033] A sleep control module, used for controlling the second relay according to the received test sleep instruction, so that the controller under test enters a sleep state;

[0034] A current testing module, used for receiving a voltage comparison signal generated according to a dark current value in a dormant state, and determining a dark current test result according to the voltage comparison signal;

[0035] The result output module is used to output the dark current test result to a computer host computer and display the dark current detection result.

[0036] In addition, to achieve the above-mentioned purpose, the present application also proposes a dark current automatic testing device, which includes: a memory, a processor, and a computer program stored in the memory and executable on the processor, and the computer program is configured to implement the steps of the dark current automatic testing method as described above.

[0037] In addition, to achieve the above-mentioned purpose, the present application also proposes a storage medium, which is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the dark current automatic testing method described above are implemented.

[0038] In addition, to achieve the above-mentioned purpose, the present application also provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the steps of the dark current automatic testing method described above are implemented.

[0039] One or more technical solutions proposed in the present application have at least the following technical effects: according to the received test start instruction, the first relay and the second relay are controlled to supply power to the normal power pin and the ON power pin of the controller under test, so that the controller under test can be powered on normally; according to the received test sleep instruction, the second relay is controlled to make the controller under test enter a sleep state; a voltage comparison signal generated according to the dark current value in the sleep state is received, and a dark current test result is determined according to the voltage comparison signal; the dark current test result is output to a computer host computer, and the dark current detection result is displayed, so as to realize automated testing of the dark current of the automobile controller and improve the efficiency of dark current testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0042] Figure 1 A schematic diagram of a process flow provided for the first embodiment of the dark current automatic testing method of the present application;

[0043] Figure 2 A system block diagram of a controller under test provided in accordance with an embodiment of an automatic dark current test method of the present application;

[0044] Figure 3 A system block diagram of a batch processing controller under test provided in an embodiment of the dark current automatic test method of the present application;

[0045] Figure 4 This is a schematic diagram of the module structure of the dark current automatic testing device according to an embodiment of the present application;

[0046] Figure 5 Schematic diagram of the device structure of the hardware operating environment involved in the dark current automatic testing method in the embodiment of the present application.

[0047] The purpose, features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0048] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0049] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0050] The main solution of the embodiment of the present application is: according to the received test start instruction, control the first relay and the second relay to supply power to the normal power pin and the ON power pin of the controller under test, so that the controller under test can be powered on normally; according to the received test sleep instruction, control the second relay to make the controller under test enter a sleep state; receive a voltage comparison signal generated according to the dark current value in the sleep state, and determine the dark current test result according to the voltage comparison signal; output the dark current test result to a computer host computer, and display the dark current detection result.

[0051] In this embodiment, for the convenience of description, the following description is made by taking the automatic dark current testing equipment as the execution subject.

[0052] Since the detection method commonly used in the prior art is to connect a multimeter in series on the power supply circuit of the controller, wait for a period of time for the controller to enter network sleep, read the dark current of the controller network sleep from the multimeter, wait for another period of time, and read the dark current of the controller sleep from the multimeter after the controller enters sleep. The disadvantage of this method is that batch testing and automated testing cannot be achieved. If multiple controllers need to be tested in parallel, multiple multimeters and multiple operators are required, which is relatively inefficient.

[0053] The present application provides a solution to automate the dark current detection of the automobile controller, conduct batch detection, and improve the processing efficiency of the automated dark current test.

[0054] It can be seen from the above embodiments that the present application controls the first relay and the second relay to supply power to the normal power pin and the ON power pin of the controller under test according to the received test start instruction, so that the controller under test completes normal power-on; controls the second relay according to the received test sleep instruction to make the controller under test enter a sleep state; receives a voltage comparison signal generated according to the dark current value in the sleep state, and determines the dark current test result according to the voltage comparison signal; outputs the dark current test result to a computer host computer, and displays the dark current detection result, so as to realize automated testing of the dark current of the automobile controller and improve the efficiency of dark current testing.

[0055] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication and program running functions, such as a tablet computer, a personal computer, a mobile phone, etc., or an electronic device capable of realizing the above functions, a dark current automatic test device, etc. The following takes the dark current automatic test device as an example to illustrate this embodiment and the following embodiments.

[0056] Based on this, the present application embodiment provides a dark current automatic testing method, referring to Figure 1 , Figure 1 This is a flow chart of the first embodiment of the dark current automatic testing method of the present application.

[0057] In this embodiment, the dark current automatic testing method includes steps S10 to S40:

[0058] Step S10, according to the received test start instruction, control the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test, so that the controller under test can be powered on normally.

[0059] It should be noted that when testing the dark current of the automobile controller, a detection system consisting of four parts can be used, namely, the automobile controller, that is, the power supply battery module of the tested controller, the tested controller, the computer host computer, and the dark current determination module. The power supply module includes a power supply and a relay. Figure 2 Among them, the power supply is used to supply power to the controller under test and the dark current determination module. The host computer and the dark current determination module can communicate. The host computer can pass the parameters required for the test to the microprocessor of the dark current determination module, including the dark current threshold I when the controller network is dormant. thr1 and the dark current threshold I when the controller is in sleep mode thr2 . The functions of the computer host also include sending commands to the MCU (Microcontroller Unit) according to the set program, displaying the test results returned by the MCU, and organizing and classifying the test results to generate a test result database file for easy retrieval and reference. The dark current determination module consists of a dark current determination circuit and an MCU circuit. The dark current determination circuit consists of a mirror current source circuit and a voltage comparator circuit. The MCU has a digital output channel that can control relays K1 and K2, an analog output channel that can output voltage, and a digital acquisition channel that can collect high and low levels. The MCU can also transmit the test results to the computer host from the communication interface and execute the instructions transmitted by the host.

[0060] It should be understood that the test start instruction refers to the command to start the test transmitted by the computer host through the communication line. The first relay and the second relay are two relays of the power supply module, which are used to control the circuit switches of the normal power pin and the ON power pin of the controller under test respectively.

[0061] In the specific implementation, when the MCU receives the test start command sent by the computer host computer, the MCU controls the relays K1 and K2 through the DO1 and DO2 pins to respectively supply power to the normal power pin and the ON power pin of the controller under test, such as the VBD pin and VBK pin of the controller under test, so as to power on the controller under test in a normal timing. Figure 2 The normal power-on sequence of the controller under test is to power on the normal power pin and then power on the ON gear power pin VBK.

[0062] In a feasible implementation manner, the step of controlling the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction so that the controller under test completes normal power-on includes:

[0063] According to the received test start instruction, the first relay is controlled to be closed to supply power to the normal power pin of the controller under test;

[0064] After waiting for a preset time, the second relay is controlled to be closed according to the test start instruction to supply power to the ON position power pin of the controller under test;

[0065] A power-on detection is performed on the controller under test, and when the normal power pin and the ON gear power pin of the controller under test are both in power supply state, it is determined that the controller under test has completed power-on.

[0066] In the specific implementation, when the test starts, the computer host sends a command to start the test to the MCU through the communication line (such as the commonly used RS232, RS485 and other communication interfaces). The MCU controls DO1 to output a high level, and the relay K1 is energized. At this time, the circuit is turned on, so that the normal power pin VBD of the controller under test is energized, and a delay of a period of time, such as 200ms, is set according to the actual situation and is set to the preset time. The MCU controls DO2 to output a high level, and the relay K2 is energized. At this time, the circuit is turned on, so that the ON gear power pin VBK of the controller under test is energized, and the controller under test completes the power-on according to the normal timing.

[0067] Step S20, according to the received test sleep instruction, controlling the second relay to make the controller under test enter a sleep state.

[0068] It should be noted that the test sleep instruction refers to an instruction transmitted by the computer host computer to make the controller under test enter a sleep state. The sleep state refers to a working state of the controller with lower energy consumption.

[0069] In the specific implementation, when the computer host sends a test sleep command to the MCU, the MCU can control the second controller in the power supply module according to the received test sleep command to disconnect the second controller. At this time, the power supply to the ON power pin of the controller under test can be terminated. When the power supply to the ON power pin of the controller under test is terminated, the controller under test enters a sleep state.

[0070] In a feasible implementation manner, the step of controlling the second relay according to the received test sleep instruction to make the controller under test enter a sleep state includes:

[0071] After the controller under test completes normal power-on and waits for a first waiting time, the second relay is controlled according to the received test sleep instruction to put the controller under test into a sleep state.

[0072] It should be noted that the first waiting time refers to the time for waiting for the tested controller to complete initialization, and can usually be set to a fixed time, such as 3s. The specific setting value is set according to actual conditions.

[0073] In a specific implementation, after the controller under test completes normal power-on, it can wait for a period of time to allow the controller under test to completely complete initialization. After waiting for the initialization to be completed, it can control the second relay according to the received test sleep instruction, so that the second relay disconnects the circuit between the ON power supply and the controller under test, and puts the controller under test into a sleep state.

[0074] In a feasible implementation manner, after the controller under test completes normal power-on and after waiting for a first waiting time, the step of controlling the second relay according to the received test sleep instruction to put the controller under test into a sleep state includes:

[0075] After the controller under test completes normal power-on, after waiting for a first waiting time, monitoring a test sleep instruction;

[0076] When the test sleep instruction is monitored, after waiting for a second waiting time, the second relay is controlled according to the received test sleep instruction to make the controller under test enter a network sleep state;

[0077] When the controller under test is in the network sleep state, after waiting for a third waiting time, the controller under test is changed from the network sleep state to the controller sleep state.

[0078] It should be noted that the network sleep state refers to a sleep state entered when the controller communication interface network is idle to save energy, and the controller sleep state refers to an extremely low-function mode entered if the wake-up conditions are not met for a period of time after entering network sleep.

[0079] It should be understood that the second waiting time refers to the time it takes for the controller under test to enter a network sleep state, and the third waiting time refers to the time it takes for the controller under test to enter a controller sleep state from a network sleep state.

[0080] In the specific implementation, the host computer sends a command to the MCU to enter sleep mode. For example, the MCU controls DO2 to output a low level, the relay K2 is disconnected, and the power pin VBK of the controller under test is powered off. After a delay of t2 (the time for the controller to enter network sleep mode, the host computer program can be set according to the parameters of the controller under test, such as 1 minute), the controller under test enters the network sleep mode. At this time, the pins supplied to the controller are only the normal power pins. When the controller under test is in the network sleep mode, it can wait for a period of time t3 (the time for the controller to enter the controller sleep mode from the network sleep mode, the host computer program can be set according to the parameters of the controller under test, such as 3 minutes) to make the controller under test enter the controller sleep mode.

[0081] Step S30, receiving a voltage comparison signal generated according to the dark current value in the sleep state, and determining a dark current test result according to the voltage comparison signal.

[0082] It should be noted that dark current refers to the current flowing through the regular current pin. The dark current test results are divided into test pass and test fail. When the test passes, it means that the current value of the dark current is less than the current value in the preset product design specification. Correspondingly, when the test fails, it means that the current value of the dark current is greater than the current value in the preset product design specification.

[0083] In the specific implementation, during the test, the current I of the constant power pin of the control under test can be DUT After the mirror current circuit, the current I flowing through the resistor R1 R Very close to the current of the controller under test, the degree of closeness is related to the amplification factor of the transistor. Analysis of the mirror current circuit shows that I R =I DUT *β / (β+2), where β is the magnification of the transistor. When selecting a transistor, try to select a transistor with a larger magnification. For example, for a transistor with a magnification of 300, I R =0.9934*I DUT , the error is within 1%, so the voltage input to the positive terminal of the voltage comparator is U IN+ =VBat-I DUT *R1, for example, according to the design specification of the controller under test, the dark current of the network sleep is less than I thr1 Taking the test controller 1 as an example, the MCU outputs the voltage VBat-I through the analog output channel AO1 thr1 *R1 to V IN- and compares V IN+ and V IN- , a voltage comparison signal is obtained. The voltage comparison signal can reflect the level, so the dark current test result can be determined by the voltage comparison signal.

[0084] In a feasible implementation manner, the step of receiving a voltage comparison signal generated according to a dark current value in a sleep state and determining a dark current test result according to the voltage comparison signal comprises:

[0085] The sleep state is judged, and when the sleep state is a network sleep state, a voltage comparison signal output by a voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between a positive terminal voltage value corresponding to a dark current and a first negative terminal voltage output by an analog output channel of an MCU;

[0086] When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value;

[0087] When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

[0088] In a specific implementation, the sleep state is judged. When the sleep state is a network sleep state, a voltage comparison signal output by a voltage comparator is obtained. As can be seen from the circuit schematic diagram, if I DUT >I thr1 , then V IN+ <V IN- , the voltage comparator outputs a low level, and if the MCU's digital input channel DI1 collects a low level, it indicates that I DUT >I thr1 , the network sleep dark current exceeds the design specification Ithr1 of the controller under test, and the test result fails. If DI1 collects a high level, it indicates that I DUT thr1 , the network sleep dark current is lower than the design specification of the controller under test I thr1 , the test result passed.

[0089] In a feasible implementation manner, the step of receiving a voltage comparison signal generated according to a dark current value in a sleep state and determining a dark current test result according to the voltage comparison signal further includes:

[0090] The dormant state is judged, and when the dormant state is the controller dormant state, a voltage comparison signal output by the voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between the positive terminal voltage value corresponding to the dark current and the second negative terminal voltage output by the MCU analog output channel;

[0091] When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value;

[0092] When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

[0093] In a specific implementation, the sleep state is judged. When the sleep state is the controller sleep state, a voltage comparison signal output by the voltage comparator is obtained. According to the design specification of the controller product under test, the dark current of the controller in sleep state is less than I thr2 ,MCU outputs voltage VBat-I through analog output channel AO1 thr2 *R11 to V IN- If DI1 of MCU collects a low level, it indicates that I DUT >I​thr2 , the controller sleep dark current exceeds the design specification of the tested controller product I thr2 , the test result fails. If DI1 collects a high level, it means that I DUT thr2 , the controller sleep dark current is lower than the design specification of the tested controller product I thr2 , the test result passed.

[0094] Based on this, the dark current test of the controller under test can be processed in batches, and batch dark current detection can be achieved by analogy in the same way, as shown in the following figure: Figure 3 The system block diagram shown is described by taking the parallel testing of 5 controllers as an example. The number of controllers to be tested in parallel can be increased or decreased as needed, and this embodiment does not impose any limitation on this.

[0095] Step S40, outputting the dark current test result to a computer host computer and displaying the dark current detection result.

[0096] In a specific implementation, the dark current test results can be transmitted to a computer host computer through a communication interface, so that the computer host computer displays the dark current test results, and generates corresponding EXCEL database and other files based on the dark current test results for easy retrieval and reference.

[0097] The present embodiment provides a dark current automatic testing method, which controls the first relay and the second relay to supply power to the normal power pin and the ON power pin of the controller under test according to the received test start instruction, so that the controller under test can be powered on normally; controls the second relay according to the received test sleep instruction to put the controller under test into a sleep state; receives a voltage comparison signal generated according to the dark current value in the sleep state, and determines the dark current test result according to the voltage comparison signal; outputs the dark current test result to a computer host computer, and displays the dark current detection result, so as to realize automatic testing of the dark current of the automobile controller and improve the efficiency of dark current testing.

[0098] It should be noted that the above examples are only used to understand the present application and do not constitute a limitation on the dark current automatic testing method of the present application. More simple transformations based on this technical concept are all within the protection scope of the present application.

[0099] This application also provides a dark current automatic testing device, please refer to Figure 4 , the dark current automatic testing device comprises:

[0100] The power-on control module 10 is used to control the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction, so that the controller under test can be powered on normally.​

[0101] The sleep control module 20 is used to control the second relay according to the received test sleep instruction to make the controller under test enter a sleep state.

[0102] The current testing module 30 is used to receive a voltage comparison signal generated according to a dark current value in a sleep state, and determine a dark current test result according to the voltage comparison signal.

[0103] The result output module 40 is used to output the dark current test result to a computer host computer and display the dark current detection result.

[0104] The dark current automatic test device provided by the present application adopts the dark current automatic test method in the above embodiment, which can solve the technical problem of low detection efficiency in the dark current detection in the automobile controller in the prior art. Compared with the prior art, the beneficial effects of the dark current automatic test device provided by the present application are the same as the beneficial effects of the dark current automatic test method provided by the above embodiment, and the other technical features of the dark current automatic test device are the same as the features disclosed in the above embodiment method, which will not be repeated here.

[0105] The present application provides an automatic dark current testing device, which includes: at least one processor; and a memory connected to the at least one processor in communication; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the automatic dark current testing method in the above-mentioned embodiment one.

[0106] Reference below Figure 5 , which shows a schematic diagram of the structure of the dark current automatic test device suitable for implementing the embodiment of the present application. The dark current automatic test device in the embodiment of the present application may include but is not limited to mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (Personal Digital Assistants), PADs (Portable Application Descriptions), PMPs (Portable Media Players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), etc., and fixed terminals such as digital TVs, desktop computers, etc. Figure 5 The dark current automatic test equipment shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0107] like Figure 5As shown, the dark current automatic test equipment may include a processing device 1001 (such as a central processing unit, a graphics processor, etc.), which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM: Read Only Memory) 1002 or a program loaded from a storage device 1003 to a random access memory (RAM: Random Access Memory) 1004. In RAM1004, various programs and data required for the operation of the dark current automatic test equipment are also stored. The processing device 1001, ROM1002 and RAM1004 are connected to each other through a bus 1005. An input / output (I / O) interface 1006 is also connected to the bus. Generally, the following systems can be connected to the I / O interface 1006: an input device 1007 including, for example, a touch screen, a touch pad, a keyboard, a mouse, an image sensor, a microphone, an accelerometer, a gyroscope, etc.; an output device 1008 including, for example, a liquid crystal display (LCD: Liquid Crystal Display), a speaker, a vibrator, etc.; a storage device 1003 including, for example, a magnetic tape, a hard disk, etc.; and a communication device 1009. The communication device 1009 can allow the dark current automatic test device to communicate with other devices wirelessly or by wire to exchange data. Although the figure shows a dark current automatic test device with various systems, it should be understood that it is not required to implement or have all the systems shown. More or fewer systems can be implemented or provided instead.

[0108] In particular, according to the embodiments disclosed in the present application, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present application include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication device, or installed from a storage device 1003, or installed from a ROM 1002. When the computer program is executed by the processing device 1001, the above-mentioned functions defined in the method of the embodiment disclosed in the present application are executed.

[0109] The dark current automatic test device provided by the present application adopts the dark current automatic test method in the above embodiment, which can solve the technical problem of low detection efficiency in the dark current detection in the automobile controller in the prior art. Compared with the prior art, the beneficial effects of the dark current automatic test device provided by the present application are the same as the beneficial effects of the dark current automatic test method provided by the above embodiment, and the other technical features of the dark current automatic test device are the same as the features disclosed in the method of the previous embodiment, which will not be repeated here.

[0110] It should be understood that the various parts disclosed in this application can be implemented by hardware, software, firmware or a combination thereof. In the description of the above embodiments, specific features, structures, materials or characteristics can be combined in any one or more embodiments or examples in a suitable manner.

[0111] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

[0112] The present application provides a computer-readable storage medium having computer-readable program instructions (ie, computer programs) stored thereon, and the computer-readable program instructions are used to execute the dark current automatic testing method in the above-mentioned embodiment.

[0113] The computer-readable storage medium provided in the present application may be, for example, a USB flash drive, but is not limited to electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, systems or devices, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In this embodiment, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, system or device. The program code contained on the computer-readable storage medium may be transmitted using any appropriate medium, including but not limited to: wires, optical cables, RF (Radio Frequency), etc., or any suitable combination of the above.

[0114] The computer-readable storage medium may be included in the dark current automatic test equipment; or may exist independently without being assembled into the dark current automatic test equipment.

[0115] The computer-readable storage medium carries one or more programs. When the one or more programs are executed by the dark current automatic test device, the dark current automatic test device:

[0116] According to the received test start instruction, the first relay and the second relay are controlled to supply power to the normal power pin and the ON gear power pin of the controller under test, so that the controller under test is powered on normally;

[0117] According to the received test sleep instruction, controlling the second relay to make the controller under test enter a sleep state;

[0118] receiving a voltage comparison signal generated according to a dark current value in a sleep state, and determining a dark current test result according to the voltage comparison signal;

[0119] The dark current test result is output to a computer host computer, and the dark current detection result is displayed.

[0120] Computer program code for performing the operations of the present application may be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, C++, and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user's computer, partially on the user's computer, as a separate software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0121] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present application. In this regard, each box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a sequence different from that marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented with a dedicated hardware-based system that performs the specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0122] The modules involved in the embodiments of the present application may be implemented by software or hardware, wherein the name of the module does not limit the unit itself in some cases.

[0123] The readable storage medium provided by the present application is a computer-readable storage medium, which stores computer-readable program instructions (i.e., computer programs) for executing the above-mentioned dark current automatic test method, and can solve the technical problem of low detection efficiency in the dark current detection in the automobile controller in the prior art. Compared with the prior art, the beneficial effects of the computer-readable storage medium provided by the present application are the same as the beneficial effects of the dark current automatic test method provided by the above-mentioned embodiment, and will not be repeated here.

[0124] The present application also provides a computer program product, including a computer program, which implements the steps of the above-mentioned dark current automatic testing method when executed by a processor.

[0125] The computer program product provided by the present application can solve the technical problem of low detection efficiency in the dark current detection in the automobile controller in the prior art. Compared with the prior art, the beneficial effects of the computer program product provided by the present application are the same as the beneficial effects of the dark current automatic testing method provided by the above embodiment, which will not be repeated here.

[0126] The above descriptions are only some embodiments of the present application, and are not intended to limit the patent scope of the present application. All equivalent structural changes made using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect applications in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A dark current automatic testing method, It is characterized in that The dark current automatic testing method comprises: According to the received test start instruction, the first relay and the second relay are controlled to supply power to the normal power pin and the ON gear power pin of the controller under test, so that the controller under test is powered on normally; According to the received test sleep instruction, controlling the second relay to make the controller under test enter a sleep state; receiving a voltage comparison signal generated according to a dark current value in a sleep state, and determining a dark current test result according to the voltage comparison signal; The dark current test result is output to a computer host computer, and the dark current detection result is displayed.

2. The method according to claim 1, It is characterized in that The step of controlling the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction so that the controller under test completes normal power-on includes: According to the received test start instruction, the first relay is controlled to be closed to supply power to the normal power pin of the controller under test; After waiting for a preset time, the second relay is controlled to be closed according to the test start instruction to supply power to the ON position power pin of the controller under test; A power-on detection is performed on the controller under test, and when the normal power pin and the ON gear power pin of the controller under test are both in power supply state, it is determined that the controller under test has completed power-on.

3. The method according to claim 1, It is characterized in that The step of controlling the second relay according to the received test sleep instruction to make the controller under test enter a sleep state comprises: After the controller under test completes normal power-on and waits for a first waiting time, the second relay is controlled according to the received test sleep instruction to put the controller under test into a sleep state.

4. The method according to claim 3, It is characterized in that After the controller under test completes normal power-on and waits for a first waiting time, the step of controlling the second relay according to the received test sleep instruction to put the controller under test into a sleep state comprises: After the controller under test completes normal power-on, after waiting for a first waiting time, monitoring a test sleep instruction; When the test sleep instruction is monitored, after waiting for a second waiting time, the second relay is controlled according to the received test sleep instruction to make the controller under test enter a network sleep state; When the controller under test is in the network sleep state, after waiting for a third waiting time, the controller under test is changed from the network sleep state to the controller sleep state.

5. The method according to claim 1, It is characterized in that The step of receiving a voltage comparison signal generated according to a dark current value in a sleep state and determining a dark current test result according to the voltage comparison signal comprises: The sleep state is judged, and when the sleep state is a network sleep state, a voltage comparison signal output by a voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between a positive terminal voltage value corresponding to a dark current and a first negative terminal voltage output by an analog output channel of an MCU; When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value; When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

6. The method according to claim 1, It is characterized in that The step of receiving a voltage comparison signal generated according to the dark current value in the sleep state and determining the dark current test result according to the voltage comparison signal also includes: The dormant state is judged, and when the dormant state is the controller dormant state, a voltage comparison signal output by the voltage comparator is obtained, wherein the voltage comparison signal is a comparison result between the positive terminal voltage value corresponding to the dark current and the second negative terminal voltage output by the MCU analog output channel; When the voltage comparison signal is at a high level, a dark current test result of passing the test is output, wherein the dark current test result of passing the test is a test result in which the network sleep dark current is less than a preset current value; When the voltage comparison signal is at a low level, a dark current test result indicating that the test fails is output, and a dark current test result indicating that the test passes is a test result indicating that the network sleep dark current is greater than a preset current value.

7. The method according to any one of claims 1 to 6, It is characterized in that The step of outputting the dark current test result to a computer host computer and displaying the dark current detection result includes: The dark current test result is transmitted to a computer host computer through a communication interface, so that the computer host computer displays the dark current test result and generates a database file according to the dark current test result.

8. A dark current automatic test device, It is characterized in that The device comprises: A power-on control module, used for controlling the first relay and the second relay to supply power to the normal power pin and the ON gear power pin of the controller under test according to the received test start instruction, so that the controller under test can be powered on normally; A sleep control module, used for controlling the second relay according to the received test sleep instruction, so that the controller under test enters a sleep state; A current testing module, used for receiving a voltage comparison signal generated according to a dark current value in a dormant state, and determining a dark current test result according to the voltage comparison signal; The result output module is used to output the dark current test result to a computer host computer and display the dark current detection result.

9. A dark current automatic test device, It is characterized in that The device comprises: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program is configured to implement the steps of the dark current automatic testing method according to any one of claims 1 to 7.

10. A storage medium, It is characterized in that The storage medium is a computer-readable storage medium, and a computer program is stored on the storage medium. When the computer program is executed by a processor, the steps of the dark current automatic testing method according to any one of claims 1 to 7 are implemented.

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