Chip SDK (Software Development Kit) testing method, system, equipment and medium
Through task-associated modules and execution plans, the online status and environment configuration of hardware devices are automatically tested, and the problems of inefficient and insufficient coverage of traditional chip SDK testing methods are solved, and efficient and accurate automated testing is achieved.
Patent Information
- Application Number
- CN202411130669.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-16
- Publication Date
- 2024-12-17
AI Technical Summary
Traditional chip SDK testing methods rely on manual operations, are inefficient and susceptible to human factors, are difficult to cover all functions and scenarios, and are prone to missing potential problems.
Through task association modules, we store or create test tasks, judge the online status and environment configuration of the hardware device, execute test cases based on the execution plan, generate test reports, and realize automated testing, ensuring that the test covers all functions and scenarios.
The automated testing of chip SDK is realized, which improves testing efficiency and accuracy, ensures coverage of all functions and scenarios, and avoids the omission of potential problems.
Smart Images
Figure CN119149400A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of chip testing technology, and in particular to a chip SDK testing method, system, equipment and medium. Background Art
[0002] With the continuous development of chip technology, the functions of chip SDK (Software Development Kit) are becoming increasingly complex. Traditional chip SDK testing methods often rely on manual operations, which are not only inefficient but also easily affected by human factors, resulting in inaccurate and incomplete test results. In addition, with the continuous expansion of chip SDK scale and the acceleration of update frequency, traditional testing methods are difficult to cover all functions and scenarios, and are prone to missing potential problems. Summary of the invention
[0003] The purpose of the present invention is to provide a chip SDK testing method, system, device and medium to solve the problem that the existing chip SDK testing method is difficult to cover all functions and scenarios and is prone to missing potential problems.
[0004] In order to achieve the above object, the present invention provides the following technical solutions:
[0005] The present invention first provides a chip SDK testing method, comprising:
[0006] According to the task name input by the user, determine a test task corresponding to the task name from the test tasks stored or created by the task management module, wherein the test task corresponds to the test version of the SDK;
[0007] In response to a selection operation for the test task, determining whether the online status and environment configuration of the hardware device associated with the test task meet the test requirements;
[0008] When the online status and environment configuration of the hardware device meet the test requirements, based on the execution plan of the test task, execute each test case in the test task to obtain the execution result of each test case;
[0009] According to the execution results of each of the test cases, the test results of the test task are analyzed and a test report of the test task is generated.
[0010] In an optional implementation manner of the present application, the execution plan includes the execution time of the test task.
[0011] In an optional implementation of the present application, it also includes:
[0012] Obtain the hardware device creation information submitted by the user, which includes: PC name, IP address, user name, hardware location, system type, port number, account password, board name, board type and serial port number information.
[0013] In an optional implementation manner of the present application, performing test result analysis on the test task according to the execution results of each of the test cases and generating a test report for the test task includes:
[0014] In response to the screening conditions of the test report input by the user, determining a list of execution results of the test cases corresponding to the screening conditions;
[0015] The execution results of each test case in the execution result list are counted to obtain a test report for the test task.
[0016] In an optional implementation manner of the present application, the test report includes: the passing status of the test case, the total test time, and the error type.
[0017] In an optional implementation manner of the present application, the counting of execution results of each test case in the execution result list to obtain a test report of the test task includes:
[0018] Determine the total number, number of test successes and number of test failures of each of the test cases, and determine the pass status of the test cases and the error types of the test cases that failed the test based on the total number, number of test successes and number of test failures of each of the test cases;
[0019] The execution start time and the execution end time of the test case are obtained, and the total test time of the test case is determined according to the execution start time and the execution end time.
[0020] In an optional implementation of the present application, it also includes:
[0021] When any of the test cases is in an abnormal state, the state information of the test case is updated, and the hardware device corresponding to the test case is shut down.
[0022] Compared with the prior art, the chip SDK testing method provided by the present invention stores or creates test tasks through a task association module, and determines the online status and environment configuration of the hardware device associated with the test task based on the selection of the test task, and executes each test case in the test task based on the execution plan of the test task when the online status and environment configuration of the hardware device meet the test requirements to complete the functional test of the SDK. This method realizes automatic testing of the chip SDK, stores or creates test tasks through a task association module, and determines and verifies the hardware device and environment configuration associated with the test task based on the user's selection of the test task, so that the test for the SDK can cover all functions and scenario requirements, solving the problem that the existing SDK testing method is difficult to cover all functions and scenarios and is prone to missing potential problems.
[0023] Compared with the prior art, the beneficial effects of the chip SDK testing device provided by the present invention are the same as the beneficial effects of the chip SDK testing method described in the above technical solution, which will not be described in detail here.
[0024] The present invention also provides an electronic device, comprising:
[0025] processor;
[0026] a memory for storing instructions executable by the processor;
[0027] The processor is used to execute the test method of the chip SDK by running the instructions in the memory.
[0028] Compared with the prior art, the beneficial effects of the electronic device provided by the present invention are the same as the beneficial effects of the chip SDK testing method described in the above technical solution, which will not be described in detail here.
[0029] The present invention also provides a computer storage medium, in which instructions are stored. When the instructions are executed, the test method of the chip SDK is implemented.
[0030] Compared with the prior art, the beneficial effects of the computer storage medium provided by the present invention are the same as the beneficial effects of the chip SDK testing method described in the above technical solution, and will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS
[0031] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:
[0032] Figure 1 A flow chart of a chip SDK testing method provided in an embodiment of the present application;
[0033] Figure 2 A structural diagram of a chip SDK test device provided in an embodiment of the present application;
[0034] Figure 3 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0035] In order to clearly describe the technical solutions of the embodiments of the present invention, in the embodiments of the present invention, words such as "first" and "second" are used to distinguish the same items or similar items with basically the same functions and effects. For example, the first threshold and the second threshold are only used to distinguish different thresholds, and their order is not limited. Those skilled in the art can understand that words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not necessarily limit them to be different.
[0036] It should be noted that, in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.
[0037] In the present invention, "at least one" means one or more, and "plurality" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b, c can be single or multiple.
[0038] With the continuous development of chip technology, the functions of chip SDK (Software Development Kit) are becoming increasingly complex. Traditional chip SDK testing methods often rely on manual operations, which are not only inefficient but also easily affected by human factors, resulting in inaccurate and incomplete test results. In addition, with the continuous expansion of chip SDK scale and the acceleration of update frequency, traditional testing methods are difficult to cover all functions and scenarios, and are prone to missing potential problems.
[0039] In order to solve the above technical problems, the embodiments of the present application provide a chip SDK testing method, system, device and medium, which are described in detail one by one in the following embodiments.
[0040] The present application embodiment first provides a chip SDK testing method, please refer to Figure 1 , Figure 1 A flow chart of a chip SDK testing method provided in an embodiment of the present application.
[0041] like Figure 1 As shown, the chip SDK testing method includes the following S101 to S104:
[0042] S101, according to a task name input by a user, determining a test task corresponding to the task name from test tasks stored or created by a task management module, wherein the test task corresponds to a test version of the SDK.
[0043] In the embodiment of the present application, the task association module supports users to create, edit and delete test tasks, and provides search, filter and sort functions for test tasks to facilitate users to quickly find the required test tasks.
[0044] Specifically, the test task includes the name, description and execution plan of the test task, wherein the execution plan includes the execution time of the test task (such as scheduled execution or immediate execution), and the description includes the version number of the SDK corresponding to the test task, the hardware equipment required to execute the test task, and the test cases, etc.
[0045] S102, in response to a selection operation for the test task, determining whether the online status and environment configuration of the hardware device associated with the test task meet the test requirements.
[0046] In the actual application process, this step can be implemented through a pre-built environment verification module, where the hardware device package associated with the test task refers to the physical device that needs to interact with the SDK. These devices can be devices of the target platform or auxiliary devices for testing SDK functions, such as single boards, PCs, serial port servers, etc.
[0047] After determining the test task, the hardware devices associated with the test task can be determined according to the description of the test task, and the online status and environment configuration of these hardware devices can be detected to see whether they meet the test requirements. For example, it can be detected whether the hardware device is in a spatial state at the time of executing the test task; whether the hardware device is in an online state, etc.
[0048] In an optional implementation manner of the present application, if the hardware device does not meet the test requirements, a warning may be issued in a timely manner and the reasons for not meeting the test requirements may be recorded to facilitate timely processing by relevant staff.
[0049] In an optional implementation of the present application, the environment verification module can also submit or update hardware device information through the submitDevice function, such as creating hardware devices corresponding to the corresponding test tasks through the hardware device creation information submitted by the user, so that subsequent functions in the test process can access the hardware devices according to the relevant information of the hardware devices. For example, the hardware device creation information includes: PC name, IP address, user name, hardware location, system type, port number, account password, single board name, single board type and serial port number information, etc.
[0050] Furthermore, the environment verification module can also be combined with the listDevice function to cooperate with the corresponding display device to display and update the status of the hardware device in real time. For example, the status of the hardware device can be queried and the status of the hardware device can be updated to abnormal when an abnormality occurs in the hardware device.
[0051] Furthermore, the environment verification module can also be combined with the deleteDevice function to delete unnecessary hardware devices and return the deletion results. In addition, it can also be combined with the remote control platform to receive reset or power on and off instructions sent by the remote control platform, thereby realizing remote control of hardware devices and reducing manual operations.
[0052] S103, when the online status and environment configuration of the hardware device meet the test requirements, based on the execution plan of the test task, execute each test case in the test task to obtain the execution result of each test case.
[0053] In the embodiment of the present application, executing each test case of the test task based on the execution plan of the test task refers to executing each test case of the test task according to the execution time of the test task.
[0054] Furthermore, the execution of the test case may be multi-threaded or distributed, to which the present application does not impose any limitation.
[0055] The execution result of the test case refers to the execution log of the test case, including the execution steps, execution time and execution results, etc.
[0056] S104, analyzing the test results of the test task according to the execution results of each of the test cases, and generating a test report for the test task.
[0057] Specifically, the test includes the passing status of the test cases, the total test time, the error type, etc.
[0058] In the process of actual application, taking into account the situation that multiple test tasks may be carried out in parallel or serially, in order to facilitate users to find the test report, the above S104 includes: in response to the filtering conditions of the test report input by the user, determining the execution result list of the test cases corresponding to the filtering conditions; counting the execution results of each test case in the execution result list to obtain the test report of the test task.
[0059] Specifically, the counting of the execution results of each test case in the execution result list to obtain a test report of the test task includes:
[0060] Determine the total number, number of test successes and number of test failures of each of the test cases, and determine the pass status of the test cases and the error types of the test cases that failed the test based on the total number, number of test successes and number of test failures of each of the test cases;
[0061] The execution start time and the execution end time of the test case are obtained, and the total test time of the test case is determined according to the execution start time and the execution end time.
[0062] In the process of executing each test case in the test task, the execution status of each test case can also be updated in real time through the executeStatusFresh function. Specifically, the detailed information of the test case is obtained by querying the data storage module, including the process ID, execution result, start time and end time, etc. According to the execution result of the test case and the survival status of the process, it is determined whether the execution result needs to be updated. If the execution result of the test case needs to be updated, it is updated. If the execution result is completed or abnormal, the total execution time of the test case is calculated based on the completion time or abnormal time of the test case and the start time of the test case and returned to the user.
[0063] Furthermore, in the actual application process, the execution result of the test case can also be changed through the changeExecuteResult function. Specifically, the status of the test case can be changed according to the status of the test case input by the user (such as pause, resume, complete, etc.), so that the process of the test case is terminated, the execution is resumed, and the execution result of the test case is updated.
[0064] Furthermore, when executing each test case of the test task, the status of each test case can be confirmed through the confirmExecuteException function. When an exception occurs in a test case, the status of the test case, result message, execution end time and other information are updated, and the hardware device associated with the test case is closed.
[0065] Furthermore, when a test case is executed, the confirmCaseResult function can be combined to receive the test case ID and result value, and update the execution result of the test case. In addition, the timestamp of this execution can be recorded to track the time point of the test; in addition to updating the results of a single case, confirmCaseResult will also update the test status of the entire test task based on the results of all executed test cases. For example, if all test cases pass, the test result of the test task may be "passed"; if any test case fails, the test result of the test task may become "failed".
[0066] Furthermore, after obtaining the test report of the test task, the test report of the test task, hardware device configuration information, environment verification data, execution log of the test case and execution results of the test case can also be stored through the data storage module to ensure the security and reliability of the data.
[0067] In the actual application process, the getExecList function can be used to obtain the execution list of the test task from the data storage module, and the automated execution records of the test task that meet the conditions can be obtained from the data storage module according to the filtering conditions and sorting rules entered by the user. This function constructs a filtering dictionary filterDict, which filters data according to conditions such as task ID, search keywords, and execution results; adds the executor name to the execution record through the annotation annotate; and finally uses the genPageData function for paging processing, and returns the processed results to the user.
[0068] Furthermore, the execution record status of each test case can be determined based on the execution record ID and ID list of the test case input by the user in combination with the deleteExecute function. If the execution record is completed, the related inheritance, log files, etc. of the corresponding test case are deleted.
[0069] Furthermore, the execution log of each test case can also be saved to the specified location of the data storage module through the uploadCaseLog function, that is, receiving the log file ID and the test case ID, and combining the log file ID and the test case ID to store the log file corresponding to the test case to the specified location of the data storage module, so as to facilitate users to conduct in-depth analysis and problem location of the test data of each test task.
[0070] In actual application, after the execution tasks of each test case are stored in the data storage module, the user can input the test case ID into the data storage module so that the data storage module can search for the corresponding log file based on the getExecuteCaseLogFileList function and the test case ID, and display it to the user.
[0071] Furthermore, the data storage module can also provide a download function, that is, the user can enter the log file ID into the database so that the database can obtain the file path and file name of the log file based on the downloadCaseLogFile function in combination with the log file ID, and then return the corresponding log file to the user as an attachment for download.
[0072] To summarize, the chip SDK testing method provided in the embodiment of the present application stores or creates test tasks through a task association module, and determines the online status and environment configuration of the hardware device associated with the test task based on the selection of the test task, and when the online status and environment configuration of the hardware device meet the test requirements, executes each test case in the test task based on the execution plan of the test task to complete the functional test of the SDK. This method realizes automatic testing of the chip SDK, stores or creates test tasks through a task association module, and determines and verifies the hardware device and environment configuration associated with the test task based on the user's selection of the test task, so that the test for the SDK can cover all functions and scenario requirements, solving the problem that the existing SDK testing method is difficult to cover all functions and scenarios, and is prone to missing potential problems.
[0073] The present application also provides a chip SDK testing device, please refer to Figure 2 , Figure 2 This is a structural diagram of the chip SDK test device provided in an embodiment of the present application.
[0074] like Figure 2 As shown, the chip SDK test device includes:
[0075] The task association module 201 is used to determine, according to the task name input by the user, a test task corresponding to the task name from the test tasks stored in the task management module, wherein the test task corresponds to the test version of the SDK;
[0076] The environment verification module 202 is used to determine whether the online status and environment configuration of the hardware device associated with the test task meet the test requirements in response to the selection operation for the test task;
[0077] An execution module 203 is used to execute each test case in the test task based on the execution plan of the test task when the online status and environment configuration of the hardware device meet the test requirements, and obtain the execution result of each test case;
[0078] The result analysis module 204 is used to analyze the test results of the test task according to the execution results of each of the test cases and generate a test report for the test task.
[0079] In an optional implementation manner of the present application, the test device of the chip SDK further includes:
[0080] The data storage module is used to store the test report of the test task, hardware equipment configuration information, environment verification data, execution log of the test case and the execution result of the test case.
[0081] In an optional implementation manner of the present application, the execution plan includes the execution time of the test task.
[0082] In an optional embodiment of the present application, the device is also used for:
[0083] Obtain the hardware device creation information submitted by the user, which includes: PC name, IP address, user name, hardware location, system type, port number, account password, board name, board type and serial port number information.
[0084] In an optional implementation manner of the present application, performing test result analysis on the test task according to the execution results of each of the test cases and generating a test report for the test task includes:
[0085] In response to the screening conditions of the test report input by the user, determining a list of execution results of the test cases corresponding to the screening conditions;
[0086] The execution results of each test case in the execution result list are counted to obtain a test report for the test task.
[0087] In an optional implementation manner of the present application, the test report includes: the passing status of the test case, the total test time, and the error type.
[0088] In an optional implementation manner of the present application, the counting of execution results of each test case in the execution result list to obtain a test report of the test task includes:
[0089] Determine the total number, number of test successes and number of test failures of each of the test cases, and determine the pass status of the test cases and the error types of the test cases that failed the test based on the total number, number of test successes and number of test failures of each of the test cases;
[0090] The execution start time and the execution end time of the test case are obtained, and the total test time of the test case is determined according to the execution start time and the execution end time.
[0091] The above-mentioned device embodiment provided in this embodiment belongs to the same application concept as the method embodiment of this application, and can execute the chip SDK test method provided in any of the above-mentioned embodiments of this application, and has the corresponding functional modules and beneficial effects of executing the chip SDK test method. For technical details not fully described in this embodiment, please refer to the specific processing content of the chip SDK test method provided in the above-mentioned embodiments of this application, and will not be repeated here.
[0092] It should be understood that the units in the above devices can be implemented in the form of a processor calling software. For example, the device includes a processor, the processor is connected to a memory, and instructions are stored in the memory. The processor calls the instructions stored in the memory to implement any of the above methods or realize the functions of each unit of the device, wherein the processor can be a general-purpose processor, such as a CPU or a microprocessor, etc., and the memory can be a memory in the device or a memory outside the device. Alternatively, the units in the device can be implemented in the form of hardware circuits, and the functions of some or all units can be realized by designing the hardware circuits. The hardware circuit can be understood as one or more processors; for example, in one implementation, the hardware circuit is an ASIC, and the functions of some or all of the above units are realized by designing the logical relationship of the components in the circuit; for another example, in another implementation, the hardware circuit can be implemented by PLD, taking FPGA as an example, which can include a large number of logic gate circuits, and the connection relationship between the logic gate circuits is configured by the configuration file, so as to realize the functions of some or all of the above units. All units of the above devices can be implemented in the form of a processor calling software, or in the form of hardware circuits, or in part by a processor calling software, and the remaining part is implemented in the form of hardware circuits.
[0093] In an embodiment of the present application, a processor is a circuit with the ability to process signals. In one implementation, the processor may be a circuit with the ability to read and run instructions, such as a CPU, a microprocessor, a GPU, or a DSP; in another implementation, the processor may implement certain functions through the logical relationship of a hardware circuit, and the logical relationship of the hardware circuit is fixed or reconfigurable, such as a hardware circuit implemented by an ASIC or PLD, such as an FPGA. In a reconfigurable hardware circuit, the process of the processor loading a configuration document to implement the hardware circuit configuration can be understood as the process of the processor loading instructions to implement the functions of some or all of the above units. In addition, it can also be a hardware circuit designed for artificial intelligence, which can be understood as an ASIC, such as an NPU, TPU, DPU, etc.
[0094] It can be seen that each unit in the above device can be one or more processors (or processing circuits) configured to implement the above method, such as: CPU, GPU, NPU, TPU, DPU, microprocessor, DSP, ASIC, FPGA, or a combination of at least two of these processor forms.
[0095] In addition, all or part of the units in the above device can be integrated together, or can be implemented independently. In one implementation, these units are integrated together and implemented in the form of a SOC. The SOC may include at least one processor for implementing any of the above methods or implementing the functions of each unit of the device. The type of the at least one processor may be different, for example, including a CPU and an FPGA, a CPU and an artificial intelligence processor, a CPU and a GPU, etc.
[0096] The present application also provides an electronic device, such as Figure 3 As shown, Figure 3 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application.
[0097] like Figure 3 As shown, the electronic device comprises:
[0098] Processor 210;
[0099] A memory 200 for storing instructions executable by the processor 210;
[0100] The processor 210 is used to execute the chip SDK testing method disclosed in any of the above embodiments by running the instructions in the memory 200.
[0101] The processor 210, the memory 200, the communication interface 220, the input device 230 and the output device 240 are connected to each other via a bus.
[0102] A bus may include a pathway that transfers information between components of a computer system.
[0103] The processor 210 may be a general-purpose processor, such as a general-purpose central processing unit (CPU), a microprocessor, etc., or an application-specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of the program of the scheme of the present invention. It may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.
[0104] The processor 210 may include a main processor, and may also include a baseband chip, a modem, and the like.
[0105] The memory 200 stores a program for executing the technical solution of the present invention, and may also store an operating system and other key services. Specifically, the program may include a program code, and the program code includes computer operation instructions. More specifically, the memory 200 may include a read-only memory (ROM), other types of static storage devices that can store static information and instructions, a random access memory (RAM), other types of dynamic storage devices that can store information and instructions, a disk storage, a flash, and the like.
[0106] The input device 230 may include a device for receiving data and information input by a user, such as a keyboard, a mouse, a camera, a scanner, a touch screen, etc.
[0107] Output device 240 may include devices that allow information to be output to a user, such as a display screen, printer, speaker, etc.
[0108] The communication interface 220 may include any transceiver or the like to communicate with other devices or communication networks, such as Ethernet, Radio Access Network (RAN), Wireless Local Area Network (WLAN), etc.
[0109] The processor 210 executes the program stored in the memory 200 and calls other devices, and can be used to implement each step of the testing method of any chip SDK provided in the above embodiments of the present application.
[0110] In addition to the above-mentioned methods and devices, an embodiment of the present application may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps in the chip SDK testing method of various embodiments of the present application.
[0111] The computer program product may be written in any combination of one or more programming languages to write program codes for performing the operations of the embodiments of the present application, including object-oriented programming languages, such as Java, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as an independent software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.
[0112] In addition, an embodiment of the present application may also be a storage medium on which a computer program is stored, and the computer program is executed by a processor to execute the steps in the chip SDK testing method of various embodiments of the present application.
[0113] For the aforementioned method embodiments, for the sake of simplicity, they are all described as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the order of the actions described, because according to the present application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application.
[0114] It should be noted that each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the embodiments can be referred to each other. For the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.
[0115] The steps in the methods of each embodiment of the present application can be adjusted in order, combined and deleted according to actual needs, and the technical features recorded in each embodiment can be replaced or combined.
[0116] The modules and sub-modules in the devices and terminals in the various embodiments of the present application can be combined, divided and deleted according to actual needs.
[0117] In the several embodiments provided in the present application, it should be understood that the disclosed terminals, devices and methods can be implemented in other ways. For example, the terminal embodiments described above are only schematic, for example, the division of modules or submodules is only a logical function division, and there may be other division methods in actual implementation, for example, multiple submodules or modules can be combined or integrated into another module, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or modules, which can be electrical, mechanical or other forms.
[0118] The modules or submodules described as separate components may or may not be physically separated, and the components of the modules or submodules may or may not be physical modules or submodules, that is, they may be located in one place, or they may be distributed on multiple network modules or submodules. Some or all of the modules or submodules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0119] In addition, each functional module or submodule in each embodiment of the present application may be integrated into one processing module, or each module or submodule may exist physically separately, or two or more modules or submodules may be integrated into one module. The above-mentioned integrated modules or submodules may be implemented in the form of hardware or in the form of software functional modules or submodules.
[0120] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.
[0121] The steps of the method or algorithm described in conjunction with the embodiments disclosed herein may be implemented directly by hardware, software units executed by a processor, or a combination of the two. The software units may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
[0122] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the presence of other identical elements in the process, method, article or device including the elements.
[0123] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A chip SDK testing method, characterized in that: include: According to the task name input by the user, determine a test task corresponding to the task name from the test tasks stored or created by the task management module, wherein the test task corresponds to the test version of the SDK; In response to a selection operation for the test task, determining whether the online status and environment configuration of the hardware device associated with the test task meet the test requirements; When the online status and environment configuration of the hardware device meet the test requirements, based on the execution plan of the test task, execute each test case in the test task to obtain the execution result of each test case; According to the execution results of each of the test cases, the test results of the test task are analyzed and a test report of the test task is generated.
2. The method according to claim 1, characterized in that The execution plan includes the execution time of the test task.
3. The method according to claim 1, characterized in that Also includes: Obtain the hardware device creation information submitted by the user, which includes: PC name, IP address, user name, hardware location, system type, port number, account password, board name, board type and serial port number information.
4. The method according to claim 1, characterized in that: The step of analyzing the test results of the test task according to the execution results of each of the test cases and generating a test report for the test task includes: In response to the screening conditions of the test report input by the user, determining a list of execution results of the test cases corresponding to the screening conditions; The execution results of each test case in the execution result list are counted to obtain a test report for the test task.
5. The method according to claim 4, characterized in that The test report includes: the passing status of the test cases, the total test time, and the error types.
6. The method according to claim 4 or 5, characterized in that: The counting of the execution results of each test case in the execution result list to obtain a test report of the test task includes: Determine the total number, number of test successes and number of test failures of each of the test cases, and determine the pass status of the test cases and the error types of the test cases that failed the test according to the total number, number of test successes and number of test failures of each of the test cases; The execution start time and the execution end time of the test case are obtained, and the total test time of the test case is determined according to the execution start time and the execution end time.
7. The method according to claim 1, characterized in that Also includes: When any of the test cases is in an abnormal state, the state information of the test case is updated, and the hardware device corresponding to the test case is shut down.
8. A chip SDK testing system, characterized in that: include: A task association module, used to determine, according to a task name input by a user, a test task corresponding to the task name from the test tasks stored in the task management module, wherein the test task corresponds to a test version of the SDK; An environment verification module, for responding to a selection operation for the test task, determining whether the online status and environment configuration of the hardware device associated with the test task meet the test requirements; An execution module, configured to execute each test case in the test task based on the execution plan of the test task, and obtain the execution result of each test case, when the online status and environment configuration of the hardware device meet the test requirements; The result analysis module is used to analyze the test results of the test task according to the execution results of each of the test cases and generate a test report for the test task.
9. An electronic device, characterized in that: include: processor; a memory for storing instructions executable by the processor; The processor is used to execute the chip SDK testing method described in any one of claims 1 to 7 by running the instructions in the memory.
10. A computer storage medium, characterized in that: The computer storage medium stores instructions, and when the instructions are executed, the chip SDK testing method according to any one of claims 1 to 7 is implemented.