System and method for detection of defects in a machine surface

Abstract

Systems and methods for identifying defects in manufacturing equipment are described. Camera-based image analysis may be used to improve product quality and reliability. Images of a machine surface may be repeatedly captured and analyzed by a processing device. A machine surface may be etched with indicia to help remove distortion of images collected from the surface.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to and the benefit of U.S. Provisional Application No. 63 / 315,354, filed on March 1, 2022, the disclosure of which is hereby incorporated by reference in its entirety. Background Art

[0003] Impurities such as dirt or particles present in the manufacturing equipment or the surrounding production environment can cause defects or otherwise reduce the performance of endless sheets used to form, for example, electrochemical cells and capacitors. These same impurities can also damage equipment rolls such as calender rolls and clamp rolls by causing surface depressions. The surface integrity of equipment rolls is critical because surface depressions on equipment rolls can produce such sheets that are outside of size specifications due to improper handling and deformation of the powder used to form the shaped sheets for electrochemical cells. In addition, impurities themselves may be embedded in the endless sheets. These impurities and roll surface defects in such equipment can reduce electrochemical cell performance and reliability, and increase product failure rates.

[0004] There is a need for improved inspection techniques for identifying and locating defects in manufacturing machine surfaces and / or produced electrodes. Summary of the invention

[0005] In some embodiments, a system may include at least one camera and at least one processing device configured to detect the presence or absence of one or more defects in a surface of a machine using image input from the at least one camera.

[0006] In some embodiments, the at least one camera includes two or more cameras.

[0007] In some embodiments, the at least one camera may be an optical camera.

[0008] In some embodiments, the at least one camera can have a resolution of at least about 0.5 mm.

[0009] In some embodiments, the at least one camera may be configured to periodically capture image output.

[0010] In some embodiments, the at least one camera may be configured to capture image input based on external input, the external input comprising at least one of a sensor input and a user input.

[0011] In some embodiments, the at least one camera may be configured to wirelessly transmit the image input to the at least one processing device.

[0012] In some embodiments, the at least one processing device may be further configured to receive the image input, and analyze the image input to detect the presence of one or more defects in the machine surface.

[0013] In some embodiments, the at least one processing device may be further configured to output a report or signal regarding the presence of a defect in the machine surface.

[0014] In some embodiments, the at least one processing device may be further configured to count defects in the machine surface.

[0015] In some embodiments, the at least one processing device is configured to determine a physical location of a defect in the machine surface.

[0016] In some embodiments, a method for detecting the presence or absence of a defect in a machine surface for producing an electrode may include: providing at least one machine surface for producing an electrode; using at least one camera to obtain at least one image of the machine surface; and using at least one processing device to analyze the image to detect the presence or absence of the defect.

[0017] In some embodiments, the method may further include periodically acquiring the at least one image.

[0018] In some embodiments, the method may further include obtaining the at least one image based on an external input, the external input comprising at least one of a sensor input and a user input.

[0019] In some embodiments, the analysis can be qualitative.

[0020] In some embodiments, the analysis can be quantitative.

[0021] In some embodiments, the method may further include determining whether the presence of a defect is acceptable.

[0022] In some embodiments, the method may further include determining a physical location of a defect in the machine surface.

[0023] In some embodiments, the method may further include applying a fluid to the machine surface prior to obtaining the at least one image. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The present disclosure will be more fully understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0025] Figure 1 Depicting a machine surface having identifying markings according to one embodiment.

[0026] Figure 2 A system including a camera and a machine surface is depicted according to an implementation.

[0027] Figure 3A An illustrative example of a system including multiple cameras and a machine surface is depicted according to an implementation.

[0028] Figure 3B A second illustrative example of a system including multiple cameras and a machine surface is depicted according to an implementation.

[0029] Figure 4 A diagram depicting a process sequence for verifying a machine surface according to an embodiment.

[0030] Figure 5 Depicting a comparison of a template image and a captured image of a machine surface according to an embodiment.

[0031] definition

[0032] As used herein, the term "about" when immediately preceding a numerical value means a range of plus or minus 10% of the numerical value, for example, "about 50" means 45 to 55, "about 25,000" means 22,500 to 27,500, etc., unless the context of the present disclosure indicates otherwise or is inconsistent with such an interpretation.

[0033] The present disclosure is not limited by the specific embodiments described in this application, which are intended to be illustrative of various aspects. Without departing from the spirit and scope of the present disclosure, many modifications and changes can be made, as will be easily understood by those skilled in the art. In addition to those methods and devices listed herein, those skilled in the art will easily understand the functionally equivalent methods and devices within the scope of the present disclosure from the foregoing description. Such modifications and changes are intended to fall within the scope of the appended claims. The present disclosure is only limited by the terms of the appended claims and the full range of equivalents to which these claims are entitled. It should be understood that the present disclosure is not limited to specific methods, reagents, compounds, compositions or biological systems that can certainly vary. It should also be understood that the terms used herein are only used for the purpose of describing specific embodiments, and are not intended to be restrictive.

[0034] As used in this document, the singular forms "a", "an", and "the" include plural references unless the context clearly dictates otherwise. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. Nothing in this disclosure should be construed as an admission that the embodiments described in the present disclosure are not entitled to antedate such disclosure by virtue of prior invention. As used in this document, the term "including" means "including, but not limited to."

[0035] While various compositions, methods, and apparatus are described in terms of "comprising" various components or steps (interpreted to mean "including but not limited to"), the compositions, methods, and apparatus may also "consist essentially of" or "consist of" the various components and steps, and such terms should be interpreted as defining a substantially closed group of members.

[0036] With respect to the use of substantially any plural and / or singular terms herein, those skilled in the art can translate from the plural to the singular and / or from the singular to the plural as is appropriate to the context and / or application. For clarity, various singular / plural arrangements may be expressly set forth herein.

[0037] It will be understood by those skilled in the art that, in general, the terms used herein and particularly in the appended claims (e.g., the bodies of the appended claims) are generally intended to be "open" terms (e.g., the term "including" should be interpreted as "including but not limited to," the term "having" should be interpreted as "having at least," the term "includes" should be interpreted as "including but not limited to," etc.). It will also be understood by those skilled in the art that if a specific number of an introduced claim recitation is intended, such intent will be explicitly recited in the claim, and in the absence of such a recitation, such intent is absent. For example, as an aid to understanding, the following appended claims may contain the use of the introductory phrases "at least one" and "one or more" to introduce claim recitations. However, the use of such phrases should not be interpreted as implying that the introduction of a claim recitation by the indefinite article "a" or "an" limits any particular claim containing such introduced claim recitation to embodiments containing only one such recitation, even when the same claim includes the introductory phrases "one or more" or "at least one" and an indefinite article such as "a" or "an" (e.g., "a" and / or "an" should be interpreted as meaning "at least one" or "one or more"); the same applies to the use of definite articles used to introduce claim recitations. Furthermore, even if a specific number of introduced claim recitations is explicitly recited, those skilled in the art will recognize that such recitation should be interpreted as meaning at least the recited number (e.g., the straightforward recitation "two recitations" without other modifiers means at least two recitations, or two or more recitations). Furthermore, in those cases where a convention similar to “at least one of A, B, and C, etc.” is used, generally speaking, such construction is intended to be within the meaning that one skilled in the art would understand the convention (e.g., “a system having at least one of A, B, and C” would include but is not limited to systems having A alone, B alone, C alone, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). In those cases where a convention similar to “at least one of A, B, or C, etc.” is used, generally speaking, such construction is intended to be within the meaning that one skilled in the art would understand the convention (e.g., “a system having at least one of A, B, or C” would include but is not limited to systems having A alone, B alone, C alone, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). One skilled in the art would also understand that, in practice, any transitional words and / or phrases presenting two or more alternatives, whether in the specification, claims, or drawings, should be understood to contemplate the possibility of including one, either, or both of the items. For example, the phrase "A or B" will be understood to include the possibilities of "A" or "B" or "A and B."

[0038] In addition, where features or aspects of the disclosure are described in terms of Markush groups, those skilled in the art will recognize that the disclosure is also thereby described in terms of any individual member or subgroup of members of the Markush group.

[0039] As will be understood by those skilled in the art, for any and all purposes, such as in providing a written description, all ranges disclosed herein also encompass any and all possible sub-ranges and combinations of sub-ranges thereof. Any listed range can be easily recognized as fully describing and enabling the same range to be decomposed into at least equal two parts, three parts, four parts, five parts, ten parts, etc. As a non-limiting example, each range discussed herein can be easily decomposed into a lower third, a middle third, and an upper third, etc. As will be understood by those skilled in the art, all languages ​​such as "at most", "at least", etc. include the narrated numbers, and refer to the ranges that can be subsequently decomposed into sub-ranges as discussed above. Finally, as will be understood by those skilled in the art, the range includes each individual member. Therefore, for example, a group with 1 to 3 units refers to a group with 1, 2 or 3 units. Similarly, a group with 1 to 5 units refers to a group with 1, 2, 3, 4 or 5 units, etc.

[0040] Various above-disclosed and other features and functions or their replacements can be combined into many other different systems or applications. Those skilled in the art may subsequently make various currently unforeseeable or unforeseen substitutions, modifications, changes or improvements therein, each of which is also intended to be included in the disclosed embodiments. DETAILED DESCRIPTION

[0041] The present disclosure is not limited to the particular systems, devices and methods described, as these may vary. The terminology used in the description is for the purpose of describing the particular versions or implementations only and is not intended to limit the scope.

[0042] system

[0043] A system may be assembled to aid in detecting defects in the surfaces of machines used to manufacture electrodes.

[0044] refer to Figure 1 , the system may include at least one machine surface 102 for producing an electrode, at least one camera 101, and a processing device (not shown) configured to detect the presence or absence of one or more defects in the machine surface using image input from the at least one camera.

[0045] refer to Figure 2, the machine surface 201 may include one or more marks 202. The one or more marks 202 may be etched into the machine surface 201 via laser or chemical etching. The one or more marks 202 may impart similar physical marks on electrodes created using the machine surface 201. The one or more marks 202 on the machine surface 201 and on the electrodes may be used for optical tracking and identification.

[0046] The number of cameras can generally be any number, such as 1 or 2 or more. For example, 1, 2, 3, 4, 5, 6 or more cameras can be used.

[0047] The at least one camera can generally be of any type. For example, the at least one camera can be an optical camera. The at least one camera can generally have any minimum resolution. For example, the minimum resolution can be at least about 0.5 mm, at least about 0.4 mm, at least about 0.3 mm, at least about 0.2 mm, or at least about 0.1 mm. The minimum resolution is at least sufficient to detect the defect. For example, the width of a dent can be at least about 0.5 mm, so the minimum resolution can be selected to be at least about 0.5 mm to detect the dent.

[0048] When two or more cameras are used in a system, the cameras can generally be configured in any orientation. For example, each camera can be oriented relative to the surface to be imaged. Each camera can generally be oriented at any angle relative to the surface to be imaged, such as about 0 degrees, about 5 degrees, about 10 degrees, about 15 degrees, about 20 degrees, about 25 degrees, about 30 degrees, or a range between any two of these values. In examples where two or more cameras are used, the cameras can be oriented at the same or different angles relative to the surface to be imaged. Brief Reference Figure 3A and Figure 3B , presenting two exemplary camera system orientations. In some embodiments, the two cameras 301 / 302 may be positioned on different surfaces of the roll 303. In some embodiments, the two cameras 304 / 305 may be angled to face the same surface of the roll 306. In some embodiments, a liquid such as water may be present and may flow across the roll or machine surface to simplify the detection of defects. The system may also include a nozzle, a shower, or any other liquid handling system configured to apply a liquid to the electrode or machine surface.

[0049] At least one camera may be configured to obtain at least one image and transmit the at least one image to a processing device for analysis. At least one camera may be configured to obtain images periodically or based on external input. In some embodiments, each image may include a static image. In some embodiments, at least one image may include a video at a predetermined frame rate. Image capture may be prompted based on external input from a sensor (e.g., temperature, humidity, etc.) or a user. For example, a temperature sensor may detect that a machine surface has exceeded a predetermined threshold temperature and periodically capture images to analyze product quality until the temperature drops below the threshold. The camera may be configured to transmit images via wires / cables or wirelessly (such as via a network, Wi-Fi, or Bluetooth connection).

[0050] The processing device can generally be any type of processing device, such as a desktop computer, a laptop computer, a tablet computer, a mobile phone, etc. The processing device can be configured to receive at least one image and analyze the image to detect the presence or absence of one or more defects in the machine surface. The processing device can be configured to correct for any image distortion caused by the positioning of the camera. In some embodiments, the image distortion correction can be based on the known placement of the camera. In some embodiments, the image distortion correction can be performed automatically. Markings (such as those described herein) can help to perform automatic corrections for image distortion. The processing device can be further configured to output a report or signal based on the presence and / or absence of defects in the machine surface.

[0051] The presence or absence of defects can be determined qualitatively (e.g., "no defects" or "defects detected") or quantitatively (e.g., "zero defects," "one defect," "two defects," etc.). In some embodiments, the processing device is configured to count defects in the machine surface. In some embodiments, the processing device can be configured to compare the number of detected defects with a standard value or threshold. Such an embodiment can be used, wherein if the number of detected defects is below the standard value or threshold, the machine surface is deemed acceptable, and if the number of detected defects is above the standard value or threshold, the machine surface is deemed unacceptable. The processing device may additionally or alternatively compare the number of detected defects with an average number of defects over a period of time to detect changes in production quality. The detected defects can be measured in a variety of ways. For example, the number of defects in a given area can be measured. In some examples, an acceptable number of defects may be no more than about 1 defect / m 2 , no more than about 0.5 defects / m 2 , no more than about 0.4 defects / m 2 , no more than about 0.3 defects / m 2 , no more than about 0.2 defects / m 2, no more than 0.1 defect / m 2 In an ideal situation, the number of defects will be less than the detection limit of the system, that is, no defects detected / m 2 .

[0052] In some embodiments, the processing device may be configured to identify the number of defects detected. In some embodiments, the processing device may be configured to provide information about the physical location of the defects on the machine surface.

[0053] The machine surface used to produce the electrode can generally be any machine surface. Exemplary machine surfaces can include calender rolls.

[0054] The system may also include at least one alarm. For example, the alarm may be configured to signal an operator when a machine surface has an unacceptable number of defects. The alarm signal may be audible, visual, or tactile. The alarm signal may be an electrical signal sent to a remote processing device.

[0055] The system may also include at least one database of detected defects. The system may be configured to compare one or more acquired images with a database of previously detected defects. The system may be configured to add newly detected images of defects to the database.

[0056] The system may further include a non-transitory storage device storing a template image of the machine surface.The system may be configured to acquire a new template image of the machine surface during operation.

[0057] method

[0058] Methods may be performed to help detect defects in the surfaces of machines used to manufacture such electrodes.

[0059] In one example, a method for detecting the presence or absence of defects in at least one machine surface for electrode manufacturing is provided. In some embodiments, the method includes: providing at least one machine surface; obtaining at least one image of the machine surface using at least one camera; and analyzing at least one image using at least one processing device to detect the presence and / or absence of defects. The number, type, and orientation of cameras used in such methods can be as described above.

[0060] At least one image may be obtained periodically or based on external input. The at least one image may be a static image or a video. The type of image and the image capture rate may be selected based on factors such as line speed and roll diameter. In some embodiments, the method further comprises applying a fluid to the machine surface prior to obtaining the at least one image.

[0061] At least one image may be analyzed qualitatively (e.g., "no defects" or "defects detected") or quantitatively (e.g., "zero defects," "one defect," "two defects," etc.). Analyzing at least one image may include comparing the number of detected defects to a standard value or threshold. In such an embodiment, if the number of detected defects in each analyzed image is below the standard value or threshold, the machine surface may be deemed acceptable. Conversely, if the number of detected defects in each analyzed image is above the standard value or threshold, the machine surface may be deemed unacceptable. Analyzing each image may additionally or alternatively include comparing the number of detected defects to an average number of defects over a period of time. In such an embodiment, the comparison may enable detection of changes in production quality. In some embodiments, an image of the entire machine surface may be analyzed for defects. In some embodiments, portions of the image of the machine surface may be sampled.

[0062] Analyzing the machine surface may also include comparing the collected image to a template image. Figure 4 , the method may include: receiving a template of a machine surface 401; capturing at least two images of the machine surface 402; comparing the at least two images of the machine surface to the template 403; and determining whether one or more of the at least two images deviate from the template 404. If the number of images depicting a particular deviation is below a predetermined threshold, the method may include indicating that an error does not exist 406. If the number of images depicting a particular deviation is above a predetermined threshold, the method may include indicating that an error exists 405. The template 404 may be a single image showing the deviation. Alternatively, in an embodiment with multiple cameras, images from alternative sources may be used similarly to the template. By relying on images from multiple cameras, deviations caused by a single camera (e.g., due to calibration errors or interference on the lens) may be ignored.

[0063] refer to Figure 5 , depicts an exemplary comparison between a template 501 and a collected image 502. The template 501 and the collected image 502 may each include a marker 503. By comparing the two images 501 / 502, a deviation 504 may be detected.

[0064] Image comparison may include preprocessing the image by a processing unit. Preprocessing may also include corrections for alignment and distortion. In an embodiment with a logo, the processing unit may distort and align the logo to match the template image. Preprocessing may also include other image corrections, including but not limited to saturation, contrast, and color selection.

[0065] Image comparison may utilize machine learning, neural networks, and / or artificial intelligence. Machine learning for image comparison may include forming a training set. The training set may include images with known defects or images generated using template images to mimic defects.

[0066] Image comparison may include comparing the collected image to the template on a pixel-by-pixel basis. Alternatively, pixels may be clustered and averaged for comparison.

[0067] The method may also include flowing a liquid, such as water, across the machine surface to improve detection of defects. The flowing liquid may change the reflective properties of the surface to improve image contrast.

[0068] The method may further comprise comparing the one or more obtained images to at least one database of previously detected defects.The method may further comprise adding any newly detected images of the defect to the database.

Claims

1. A system for detecting defects in the surface of a machine for producing electrodes, the system comprising: At least one camera; as well as At least one processing device is configured to detect the presence or absence of one or more defects in the machine surface using image input from the at least one camera.

2. The system of claim 1, wherein the at least one camera comprises two or more cameras.

3. The system of any one of claims 1 to 2, wherein the at least one camera is an optical camera.

4. The system of any one of claims 1 to 3, wherein the at least one camera has a resolution of at least about 0.5 mm.

5. The system of any one of claims 1 to 4, wherein the at least one camera is configured to periodically capture image input.

6. The system of any one of claims 1 to 4, wherein the at least one camera is configured to capture image input based on external input, the external input comprising at least one of a sensor input and a user input.

7. The system of any one of claims 1 to 6, wherein the at least one camera is configured to wirelessly transmit the image input to the at least one processing device.

8. The system of any one of claims 1 to 7, wherein the at least one processing device is further configured to receive the image input and analyze the image input to detect the presence or absence of one or more defects in the machine surface.

9. The system of any one of claims 1 to 8, wherein the at least one processing device is further configured to output a report or signal based on the presence of a defect in the machine surface.

10. The system of any one of claims 1 to 9, wherein the at least one processing device is further configured to count defects in the machine surface.

11. The system of any one of claims 1 to 10, wherein the at least one processing device is further configured to determine a physical location of a defect in the machine surface.

12. A method of detecting the presence of defects in the surface of a machine for producing electrodes, the method comprising: providing at least one machine surface for producing an electrode; obtaining at least one image of a surface of the machine using at least one camera; as well as The image is analyzed using at least one processing device to detect the presence of the defect.

13. The method of claim 12, further comprising: The at least one image is acquired periodically.

14. The method of claim 12, further comprising: The at least one image is obtained based on an external input, the external input comprising at least one of a sensor input and a user input.

15. The method of any one of claims 13 to 14, wherein the analysis is qualitative.

16. The method of any one of claims 13 to 14, wherein the analysis is quantitative.

17. The method of any one of claims 13 to 16, further comprising: A determination is made as to whether the presence of the defect is acceptable.

18. The method of any one of claims 13 to 17, further comprising: The physical location of the defect in the machine surface is determined.

19. The method of any one of claims 13 to 18, further comprising: A fluid is applied to the machine surface prior to obtaining the at least one image.

Images