Detection system and detection method for high and low temperature test of sample

Abstract

The invention discloses a detection system and a detection method for a sample high and low temperature test, and particularly relates to the technical field of sample detection.When a vehicle controller assembly is detected, when a time interval is set through a time relay, a direct current power supply and a test time period of the test are switched, so that manual operation is replaced, and the detection efficiency is improved. Meanwhile, the accuracy and the controllability of the detection test are also improved; besides, when the vehicle controller assembly is tested, an external influence index is obtained by obtaining a voltage disqualification coefficient and a test board fault coefficient, the external influence index is compared with a preset threshold value, and whether the turn-off of the signal lamp is really caused by the function failure of the vehicle controller assembly or not is judged according to a comparison result. In this way, the judgment on the function failure of the vehicle controller assembly can be more comprehensive, and the final test result is more accurate.

Description

Technical Field

[0001] The present invention relates to the technical field of sample detection, and in particular to a detection system and a detection method for high and low temperature tests of samples. Background Art

[0002] High and low temperature experimental testing refers to testing experimental samples to observe whether the functions of experimental samples fail at different temperatures, so as to verify the performance and reliability of samples under extreme temperature conditions. In actual testing, experimental samples generally include multiple types, such as the testing of vehicle controller assemblies. The vehicle controller assembly is the core component of the automotive electronic control system, responsible for coordinating and managing the various electronic control units of the vehicle, and realizing comprehensive control of key systems such as power, braking, and steering. It optimizes the performance, safety, and energy efficiency of the vehicle by real-time monitoring and processing data from various sensors. It plays a key role in new energy vehicles and is the core technology for realizing intelligent driving and vehicle electrification. By testing the vehicle controller assembly in different environments, it is determined whether its functions fail, and ultimately meets the safety and performance requirements.

[0003] When testing traditional vehicle controller assemblies, manual switching is required when switching the test environment, which is time-consuming and labor-intensive, and may even cause work delays. In addition, during testing, the judgment of vehicle controller assembly failure is too simplistic, resulting in inaccurate final test results. Summary of the invention

[0004] The purpose of the present invention is to solve the problem and to propose a detection system and a detection method for high and low temperature tests of samples.

[0005] In the first aspect of the implementation of the present invention, a detection method for high and low temperature test of samples is first proposed. The method is applied to a master control module, and the master control module is used to control part of the detection equipment for detecting the sample. The detection equipment controlled by the master control module includes a high and low temperature humidity test chamber, a circuit test board, a DC power supply, and a time relay. The detection equipment also includes a monitoring camera and a power strip. The two ends of the power strip are respectively connected to an external power supply and a time relay. The other end of the time relay is connected to a DC power supply, and the other end of the DC power supply is connected to a circuit test board. The other end of the circuit test board is connected to a sample. A signal light is provided on the circuit test board. The sample is placed in a high and low temperature humidity test chamber, and the high and low temperature humidity test chamber is connected to a monitoring camera, wherein:

[0006] For the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, obtain the voltage of the sample and the voltage at both ends of the circuit test board, and obtain the external influence index based on the voltage of the sample and the voltage at both ends of the circuit test board;

[0007] The external impact index is compared with the preset threshold. When the external impact index is less than the preset threshold, the DC voltage gear is changed and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment;

[0008] When the external impact index is not less than the preset threshold, the functional status of the sample is retested until the external impact index is less than the preset threshold, and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment;

[0009] Switch different test environments through high and low temperature humidity test chambers, and record the functional status of the samples under each test environment.

[0010] Optionally, the corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C;

[0011] The time relay is used to set a time interval so that the DC power supply can power on the sample; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched;

[0012] The monitoring camera is used to monitor the on and off status of the signal light.

[0013] Optionally, obtaining the external influence index according to the voltage of the sample and the voltage across the circuit test board includes:

[0014] Calculate the voltage failure coefficient based on the voltage of the sample;

[0015] The failure coefficient of the test board is obtained according to the voltage at both ends of the circuit test board;

[0016] The external influence index is obtained according to the voltage failure coefficient and the test board failure coefficient;

[0017] Obtain the voltage values ​​of the samples at different times within the current preset time period, and obtain the mean voltage value based on the voltage values ​​at different times, and calculate the voltage standard deviation of the samples based on the mean voltage value; calculate the absolute difference between the voltage value at each time and the voltage value provided by the DC power supply, and calculate the mean of the absolute differences at all times to obtain the voltage deviation value;

[0018] The voltage standard deviation and the voltage deviation value are normalized, and the voltage unqualified coefficient is obtained according to the normalized voltage standard deviation and the voltage deviation value.

[0019] Optionally, obtaining the test board failure coefficient according to the voltage across the circuit test board includes:

[0020] Obtain the voltage at both ends of the signal lamp, calculate the absolute difference between the voltages at both ends, and divide the absolute difference by the preset normal voltage difference to obtain the test board failure coefficient;

[0021] The voltage unqualified coefficient and the test board failure coefficient are normalized, and the external influence index is obtained according to the normalized voltage unqualified coefficient and the test board failure coefficient.

[0022] Optionally, when the external impact index is not less than a preset threshold, retesting the functional status of the sample includes:

[0023] When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the sample is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold;

[0024] When the external impact index is less than the preset threshold, the on and off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the sample under the conditions of DC voltage of 9V, 12V, and 16V respectively;

[0025] Switch between different test environments through high and low temperature humidity test chambers and record the functional status of samples at different temperatures.

[0026] In the second aspect of the implementation of the present invention, a detection system for high and low temperature testing of samples is proposed, the system is applied to a master control module, the master control module is used to control part of the detection equipment for detecting the sample, the detection equipment controlled by the master control module includes a high and low temperature humidity test chamber, a circuit test board, a DC power supply, and a time relay, the detection equipment also includes a monitoring camera and a power strip, the two ends of the power strip are respectively connected to an external power supply and a time relay, the other end of the time relay is connected to a DC power supply, the other end of the DC power supply is connected to a circuit test board, the other end of the circuit test board is connected to a sample, a signal light is provided on the circuit test board, the sample is placed in a high and low temperature humidity test chamber, and the high and low temperature humidity test chamber is connected to a monitoring camera, wherein:

[0027] External influence module: for the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, obtain the voltage of the sample and the voltage at both ends of the circuit test board, and obtain the external influence index based on the voltage of the sample and the voltage at both ends of the circuit test board;

[0028] Recording module: compares the external impact index with the preset threshold. When the external impact index is less than the preset threshold, the DC voltage gear is changed and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment.

[0029] Retest module: When the external impact index is not less than the preset threshold, the functional status of the sample is retested until the external impact index is less than the preset threshold, and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment;

[0030] Switching module: Switch different test environments through high and low temperature humidity test chambers, and record the functional status of samples under each test environment.

[0031] Optionally, the corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C;

[0032] The time relay is used to set a time interval so that the DC power supply can power on the sample; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched;

[0033] The monitoring camera is used to monitor the on and off status of the signal light.

[0034] Optionally, the external influence module includes:

[0035] Standard deviation module: obtains the voltage values ​​of samples at different times within the current preset time period, obtains the mean voltage value based on the voltage values ​​at different times, and calculates the voltage standard deviation of the sample based on the mean voltage value;

[0036] Voltage deviation value module: calculates the absolute difference between the voltage value at each moment and the voltage value provided by the DC power supply, and calculates the average of the absolute differences at all moments to obtain the voltage deviation value;

[0037] Voltage unqualified module: normalizes the voltage standard deviation and voltage deviation value, and obtains the voltage unqualified coefficient according to the normalized voltage standard deviation and voltage deviation value.

[0038] Optionally, the external influence module further includes:

[0039] Test board fault module: obtains the voltage at both ends of the signal light, calculates the absolute difference between the voltages at both ends, and divides the absolute difference by the preset normal voltage difference to obtain the test board fault coefficient;

[0040] Index calculation module: normalizes the voltage unqualified coefficient and the test board failure coefficient, and obtains the external influence index according to the normalized voltage unqualified coefficient and the test board failure coefficient.

[0041] Optionally, the retest module is used to:

[0042] When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the sample is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold;

[0043] When the external impact index is less than the preset threshold, the on and off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the sample under the conditions of DC voltage of 9V, 12V, and 16V respectively;

[0044] The switching module is used for:

[0045] Switch between different test environments through high and low temperature humidity test chambers and record the functional status of samples at different temperatures.

[0046] Beneficial effects of the present invention:

[0047] 1. The present invention proposes a detection system and a detection method for high and low temperature tests of samples. When the vehicle controller assembly is tested, the time interval is set by the time relay to switch the DC power supply and the test time period. In this way, manual operation is replaced, which saves trouble and labor, and at the same time improves the accuracy and controllability of the detection test.

[0048] 2. The present invention proposes a detection system and a detection method for high and low temperature tests of samples. When testing the vehicle controller assembly, the external influence index is compared with the preset threshold value, and it is determined based on the comparison result whether the signal light is really turned off due to the failure of the vehicle controller assembly. In this way, the judgment on the failure of the vehicle controller assembly can be more comprehensive, making the final test result more accurate. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The present invention will be further described below in conjunction with the accompanying drawings.

[0050] Figure 1 A flow chart of a detection method for high and low temperature test of a sample provided by the present invention;

[0051] Figure 2 A simplified test diagram of a vehicle control assembly provided with a time relay provided by the present invention;

[0052] Figure 3 A simplified test diagram of a vehicle control assembly provided by the present invention with multiple time relays;

[0053] Figure 4 A framework diagram of a detection system for high and low temperature testing of samples provided by the present invention. DETAILED DESCRIPTION

[0054] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0055] Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in the field without making any creative work shall fall within the scope of protection of the present invention.

[0056] The embodiment of the present invention provides a detection method for high and low temperature test of samples. Figure 1 , Figure 1 A flow chart of a detection method for high and low temperature testing of samples provided by an embodiment of the present invention. The method is applied to a master control module, which is used to control part of the detection equipment for detecting samples. The detection equipment controlled by the master control module includes a high and low temperature humidity test chamber, a circuit test board, a DC power supply, and a time relay. The detection equipment also includes a monitoring camera and a power strip, wherein the two ends of the power strip are respectively connected to an external power supply and a time relay, the other end of the time relay is connected to a DC power supply, the other end of the DC power supply is connected to a circuit test board, the other end of the circuit test board is connected to a sample, a signal light is provided on the circuit test board, and the sample is placed in a high and low temperature humidity test chamber, and the high and low temperature humidity test chamber is connected to a monitoring camera, wherein:

[0057] For the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, the voltage of the vehicle controller assembly and the voltage at both ends of the circuit test board are obtained, and the external influence index is obtained according to the voltage of the vehicle controller assembly and the voltage at both ends of the circuit test board;

[0058] The external impact index is compared with a preset threshold value. When the external impact index is less than the preset threshold value, the DC voltage gear is changed, and the on and off state of the signal light is recorded to obtain the functional state of the vehicle controller assembly under the current test environment;

[0059] When the external impact index is not less than the preset threshold, the functional state of the vehicle controller assembly is retested until the external impact index is less than the preset threshold, and the on and off state of the signal light is recorded to obtain the functional state of the vehicle controller assembly under the current test environment;

[0060] Switch between different test environments through high and low temperature humidity test chambers, and record the functional status of the vehicle controller assembly under each test environment.

[0061] It should be noted that the high and low temperature humidity test chamber is used to set different test environments, the DC power supply is used to provide different DC voltages to the vehicle controller assembly, and the circuit test board is provided with a signal light, and the functional status of the vehicle controller assembly is judged according to the on and off of the signal light. The on and off of the signal light respectively represents the validity and failure of the vehicle controller assembly function, among which:

[0062] Based on a detection method for high and low temperature testing of samples provided in an embodiment of the present invention, through the above-mentioned method, when testing the vehicle controller assembly, the judgment of the functional failure of the vehicle controller assembly is more comprehensive, so that the final test result is more accurate.

[0063] It should be noted that the samples tested in the present invention are not limited to vehicle controller assemblies, but can also be applied to other products as long as they can meet the functional requirements.

[0064] In one embodiment, the corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C;

[0065] The time relay uses a set time interval to allow the DC power supply to energize the vehicle controller assembly; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched;

[0066] The surveillance camera is used to monitor the on and off status of the signal light.

[0067] It should be noted that the corresponding DC voltage gear of the DC power supply is not only 9V, 12V, and 16V, but can also be adjusted according to experimental requirements. The specific value of the adjusted DC voltage depends on the actual experimental requirements and is not limited or elaborated here.

[0068] In one implementation method, when the time interval is not set by using a time relay, the power supply is simply switched manually in turns, which is time-consuming and labor-intensive. Sometimes, due to human error, people may forget to switch in time, resulting in inaccuracy in the test. For example, assuming that the total test cycle is once every 240 hours, two people may be required to take turns on duty 24 hours a day. After the time interval is set by using a time relay, manual operation is replaced, which saves time and effort, while improving the accuracy and controllability of the detection test.

[0069] It should be noted that the experimental process of the present invention is controlled by the master control module. Figure 2 , Figure 2The following is a simplified test diagram of a vehicle control assembly with a time relay set up; for example, by placing two vehicle controller assemblies in a high and low temperature heating box, and connecting two circuit test boards to the corresponding vehicle controller assemblies respectively, and connecting a DC power supply, and setting different time intervals through a time relay, and connecting an external 220V power supply through a power strip; and monitoring the signal lights on the circuit test board through a control camera to observe whether the function of the vehicle control assembly fails; in addition, multiple time relays can be set up to test different vehicle controller assemblies, such as Figure 3 As shown, by setting two or more time relays, the time relays are connected in parallel, and each time relay is connected in series with a DC power supply, and the voltage of each DC power supply is different, by setting two or more DC power supplies, the DC power supplies are connected in parallel, and each DC power supply is connected to a vehicle controller assembly, thereby realizing testing of different situations of different vehicle controller assemblies.

[0070] In one embodiment, obtaining the external impact index according to the voltage of the vehicle controller assembly and the voltage across the circuit test board includes:

[0071] Calculate the voltage failure coefficient based on the voltage of the vehicle controller assembly;

[0072] The failure coefficient of the test board is obtained according to the voltage at both ends of the circuit test board;

[0073] The external influence index is obtained according to the voltage failure coefficient and the test board failure coefficient;

[0074] Obtain the voltage value of the vehicle controller assembly at different times within the current preset time period, and obtain the average voltage value according to the voltage values ​​at different times, and calculate the voltage standard deviation of the vehicle controller assembly according to the voltage average value; calculate the absolute difference between the voltage value at each time and the voltage value provided by the DC power supply, and calculate the average of the absolute differences at all times to obtain the voltage deviation value;

[0075] The voltage standard deviation and the voltage deviation value are normalized, and the voltage unqualified coefficient is obtained according to the normalized voltage standard deviation and the voltage deviation value.

[0076] It should be noted that the present invention can use the following formula to calculate the voltage unqualified coefficient, and the calculation expression is: Wtg=c1×QE+c2×HJ; wherein Wtg is the voltage unqualified coefficient, QE and HJ are the voltage standard deviation and voltage deviation value after normalization, respectively, c1 and c2 are the preset proportional coefficients of the voltage standard deviation and voltage deviation value after normalization, respectively, and c1 and c2 are both greater than 0.

[0077] It should be noted that the preset time period is set by professionals based on actual circumstances, and no specific limitation or elaboration is made. c1 and c2 are also set by professionals based on actual circumstances. Generally, the sum of c1 and c2 is 1. For example, c1 and c2 can be 0.5 and 0.5 respectively, or other numbers, and no specific limitation is made.

[0078] It should be noted that the voltage failure coefficient refers to the degree to which the voltage value of the vehicle controller assembly deviates from the voltage value provided by the DC power supply during the test and the degree of instability of the voltage value; if the voltage value of the vehicle controller assembly deviates from the voltage value provided by the DC power supply during the test, the greater the degree of instability of the voltage value, and at this time when the signal light goes out, it cannot be proved that the vehicle controller assembly has failed, because the extinction of the signal light may be due to the influence of the external environment or voltage instability, and does not directly reflect the functional failure of the vehicle controller assembly. Therefore, in this case, it is necessary to further analyze and eliminate external factors, and confirm the actual functional status of the controller by calculating the external influence index and retesting to avoid misjudgment.

[0079] In one embodiment, obtaining the test board failure coefficient according to the voltage across the circuit test board includes:

[0080] Obtain the voltage at both ends of the signal lamp, calculate the absolute difference between the voltages at both ends, and divide the absolute difference by the preset normal voltage difference to obtain the test board failure coefficient;

[0081] The voltage unqualified coefficient and the test board failure coefficient are normalized, and the external influence index is obtained according to the normalized voltage unqualified coefficient and the test board failure coefficient.

[0082] It should be noted that the present invention can use the following formula to calculate the external influence index, and the calculation expression is: RFG=f1×Wtg+f2×tgh; wherein Wtg is the voltage unqualified coefficient, Wtg and tgh are the normalized voltage unqualified coefficient and the test board failure coefficient, respectively, f1 and f2 are the preset proportional coefficients of the normalized voltage unqualified coefficient and the test board failure coefficient, respectively, and f1 and f2 are both greater than 0.

[0083] It should be noted that the preset normal voltage difference is set by professionals according to actual conditions, and no specific limitation or elaboration is made. f1 and f2 are also set by professionals according to actual conditions. Generally, the sum of f1 and f2 is 1. For example, f1 and f2 can be 0.5 and 0.5 respectively, or other numbers, and no specific limitation is made.

[0084] It should be noted that the test board failure coefficient refers to the extent to which the voltage difference at both ends of the signal light deviates from the preset normal voltage difference when the voltage at both ends of the signal light is in a normal path; if the voltage difference at both ends of the signal light deviates from the preset normal voltage difference, and the signal light goes out at this time, it cannot be proved that the vehicle controller assembly has failed, because the extinction of the signal light may be caused by the failure of the test board itself or poor contact, rather than the failure of the vehicle controller assembly. Therefore, in this case, it is necessary to further check the status and connection of the test board, and after eliminating the test board failure factor and ensuring that the voltage difference at both ends of the signal light is normal, the actual functional status of the vehicle controller assembly can be judged again to avoid misjudgment.

[0085] In one embodiment, when the external impact index is not less than a preset threshold, retesting the functional state of the vehicle controller assembly includes:

[0086] When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the vehicle controller assembly is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold;

[0087] When the external impact index is less than the preset threshold, the on / off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the vehicle controller assembly under the conditions of DC voltage of 9V, 12V, and 16V respectively;

[0088] By switching between different test environments in a high and low temperature humidity test chamber, the functional status of the vehicle controller assembly at different temperatures is recorded.

[0089] It should be noted that when the external influence index is not less than the preset threshold, it means that there may be abnormalities in the current test environment or device connection, which may affect the accuracy of the test results. In order to ensure the reliability of the test results, it is necessary to issue an alarm in time and replace the new circuit test board to avoid misjudgment due to failure of the test board or poor connection. After replacing the circuit test board, reconnect the vehicle controller assembly through a DC power supply, and re-collect and calculate the external influence index. If the external influence index is still not less than the preset threshold, it is necessary to further check possible sources of interference or abnormal factors in the test environment until the external influence index is less than the preset threshold before continuing with subsequent functional status testing and recording work.

[0090] It should be noted that the high and low temperature humidity test chamber can reach -70℃ and the maximum temperature can reach 150℃. In actual measurement, it is generally set at -40℃ to 85℃. In addition, during the test process, its voltage ratio can be continuously changed; in addition, the DC power supply generally uses a rated 12V DC power supply, and can also be changed to 9V, 16V or other specific voltages according to different test conditions, which will not be limited or elaborated here.

[0091] In one implementation, through the above method, when testing the vehicle controller assembly, the judgment on the functional failure of the vehicle controller assembly is more comprehensive, so that the final test result is more accurate.

[0092] Based on the same inventive concept, the present invention also provides a detection system for high and low temperature test of samples. Figure 4 , Figure 4 A structural schematic diagram of a detection system for high and low temperature testing of samples provided by an embodiment of the present invention, the system is applied to a master control module, the master control module is used to control part of the detection equipment for detecting the sample, the detection equipment controlled by the master control module includes a high and low temperature humidity test chamber, a circuit test board, a DC power supply, and a time relay, the detection equipment also includes a monitoring camera and a power strip, the two ends of the power strip are respectively connected to an external power supply and a time relay, the other end of the time relay is connected to a DC power supply, the other end of the DC power supply is connected to a circuit test board, the other end of the circuit test board is connected to the sample, a signal light is provided on the circuit test board, the sample is placed in a high and low temperature humidity test chamber, and the high and low temperature humidity test chamber is connected to a monitoring camera, wherein:

[0093] External influence module: for the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, obtain the voltage of the vehicle controller assembly and the voltage at both ends of the circuit test board, and obtain the external influence index based on the voltage of the vehicle controller assembly and the voltage at both ends of the circuit test board;

[0094] Recording module: compares the external impact index with the preset threshold. When the external impact index is less than the preset threshold, changes the DC voltage gear and records the on and off status of the signal light to obtain the functional status of the vehicle controller assembly under the current test environment.

[0095] Retest module: When the external impact index is not less than the preset threshold, the functional status of the vehicle controller assembly is retested until the external impact index is less than the preset threshold, and the on and off status of the signal light is recorded to obtain the functional status of the vehicle controller assembly under the current test environment;

[0096] Switching module: Switch different test environments through high and low temperature humidity test chambers, and record the functional status of the vehicle controller assembly under each test environment.

[0097] In one embodiment, the corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C;

[0098] The time relay uses a set time interval to allow the DC power supply to energize the vehicle controller assembly; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched;

[0099] The surveillance camera is used to monitor the on and off status of the signal light.

[0100] In one implementation, when the time interval is not set by using a time relay, the power supply is simply switched manually in turn, which is time-consuming and labor-intensive. Sometimes, due to human error, someone may forget to switch in time, resulting in inaccuracy in the test.

[0101] In one embodiment, the external influence module includes:

[0102] Standard deviation module: obtains the voltage value of the vehicle controller assembly at different times within the current preset time period, obtains the mean voltage value according to the voltage values ​​at different times, and calculates the voltage standard deviation of the vehicle controller assembly according to the mean voltage value;

[0103] Voltage deviation value module: calculates the absolute difference between the voltage value at each moment and the voltage value provided by the DC power supply, and calculates the average of the absolute differences at all moments to obtain the voltage deviation value;

[0104] Voltage unqualified module: normalizes the voltage standard deviation and voltage deviation value, and obtains the voltage unqualified coefficient according to the normalized voltage standard deviation and voltage deviation value.

[0105] In one embodiment, the external influence module further includes:

[0106] Test board fault module: obtains the voltage at both ends of the signal light, calculates the absolute difference between the voltages at both ends, and divides the absolute difference by the preset normal voltage difference to obtain the test board fault coefficient;

[0107] Index calculation module: normalizes the voltage unqualified coefficient and the test board failure coefficient, and obtains the external influence index according to the normalized voltage unqualified coefficient and the test board failure coefficient.

[0108] In one embodiment, the retest module is used to:

[0109] When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the vehicle controller assembly is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold;

[0110] When the external impact index is less than the preset threshold, the on / off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the vehicle controller assembly under the conditions of DC voltage of 9V, 12V, and 16V respectively;

[0111] The switch module is used for:

[0112] By switching between different test environments in a high and low temperature humidity test chamber, the functional status of the vehicle controller assembly at different temperatures is recorded.

[0113] Based on a detection system for high and low temperature testing of samples provided in an embodiment of the present invention, through the above method, when testing the vehicle controller assembly, the judgment of the functional failure of the vehicle controller assembly is more comprehensive, so that the final test result is more accurate.

[0114] The above is a detailed description of an embodiment of the present invention, but the content is only a preferred embodiment of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. A detection method for high and low temperature test of samples, characterized in that: The method is applied to a master control module, which is used to control part of the detection equipment for detecting samples. The detection equipment controlled by the master control module includes a high-low temperature and humidity test chamber, a circuit test board, a DC power supply, and a time relay. The detection equipment also includes a monitoring camera and a power strip, wherein two ends of the power strip are respectively connected to an external power supply and a time relay, the other end of the time relay is connected to a DC power supply, the other end of the DC power supply is connected to a circuit test board, the other end of the circuit test board is connected to a sample, a signal light is provided on the circuit test board, the sample is placed in a high-low temperature and humidity test chamber, and the high-low temperature and humidity test chamber is connected to a monitoring camera, wherein: For the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, obtain the voltage of the sample and the voltage at both ends of the circuit test board, and obtain the external influence index based on the voltage of the sample and the voltage at both ends of the circuit test board; The external impact index is compared with the preset threshold. When the external impact index is less than the preset threshold, the DC voltage gear is changed and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment; When the external impact index is not less than the preset threshold, the functional status of the sample is retested until the external impact index is less than the preset threshold, and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment; Switch different test environments through high and low temperature humidity test chambers, and record the functional status of the samples under each test environment.

2. A detection method for high and low temperature test of a sample according to claim 1, characterized in that: The sample is a vehicle controller assembly; The corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C; The time relay is used to set a time interval so that the DC power supply can power on the sample; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched; The monitoring camera is used to monitor the on and off status of the signal light.

3. A detection method for high and low temperature test of a sample according to claim 1, characterized in that: The external influence index obtained based on the voltage of the sample and the voltage across the circuit test board includes: Calculate the voltage failure coefficient based on the voltage of the sample; The failure coefficient of the test board is obtained according to the voltage at both ends of the circuit test board; The external influence index is obtained according to the voltage failure coefficient and the test board failure coefficient; Obtain the voltage values ​​of the samples at different times within the current preset time period, and obtain the mean voltage value based on the voltage values ​​at different times, and calculate the voltage standard deviation of the samples based on the mean voltage value; calculate the absolute difference between the voltage value at each time and the voltage value provided by the DC power supply, and calculate the mean of the absolute differences at all times to obtain the voltage deviation value; The voltage standard deviation and the voltage deviation value are normalized, and the voltage unqualified coefficient is obtained according to the normalized voltage standard deviation and the voltage deviation value.

4. A detection method for high and low temperature test of a sample according to claim 3, characterized in that: The test board failure coefficient obtained according to the voltage at both ends of the circuit test board includes: Obtain the voltage at both ends of the signal lamp, calculate the absolute difference between the voltages at both ends, and divide the absolute difference by the preset normal voltage difference to obtain the test board failure coefficient; The voltage unqualified coefficient and the test board failure coefficient are normalized, and the external influence index is obtained according to the normalized voltage unqualified coefficient and the test board failure coefficient.

5. A detection method for high and low temperature test of a sample according to claim 2, characterized in that: When the external impact index is not less than the preset threshold, the functional status of the sample is retested including: When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the sample is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold; When the external impact index is less than the preset threshold, the on and off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the sample under the conditions of DC voltage of 9V, 12V, and 16V respectively; Switch between different test environments through high and low temperature humidity test chambers and record the functional status of samples at different temperatures.

6. A detection system for high and low temperature test of samples, characterized in that: The system is applied to a master control module, which is used to control part of the detection equipment for detecting samples. The detection equipment controlled by the master control module includes a high and low temperature humidity test chamber, a circuit test board, a DC power supply, and a time relay. The detection equipment also includes a monitoring camera and a power strip, wherein the two ends of the power strip are respectively connected to an external power supply and a time relay, the other end of the time relay is connected to a DC power supply, the other end of the DC power supply is connected to a circuit test board, the other end of the circuit test board is connected to a sample, a signal light is provided on the circuit test board, the sample is placed in a high and low temperature humidity test chamber, and the high and low temperature humidity test chamber is connected to a monitoring camera, wherein: External influence module: for the test environment currently set in the high and low temperature humidity test chamber and the current DC voltage, when the signal light is off, obtain the voltage of the sample and the voltage at both ends of the circuit test board, and obtain the external influence index based on the voltage of the sample and the voltage at both ends of the circuit test board; Recording module: compares the external impact index with the preset threshold. When the external impact index is less than the preset threshold, the DC voltage gear is changed and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment. Retest module: When the external impact index is not less than the preset threshold, the functional status of the sample is retested until the external impact index is less than the preset threshold, and the on and off status of the signal light is recorded to obtain the functional status of the sample under the current test environment; Switching module: Switch different test environments through high and low temperature humidity test chambers, and record the functional status of samples under each test environment.

7. A detection system for high and low temperature test of samples according to claim 6, characterized in that: The corresponding DC voltage gears of the DC power supply include 9V, 12V, and 16V; the different test environments set in the high and low temperature and humidity test chamber range from -70°C to 150°C; The time relay uses a set time interval to allow the DC power supply to energize the sample; the time interval is 5 minutes of power on, 1 hour of power off, and 2.5 hours of power on again; when powering on again, the DC voltage of the DC power supply is switched; The monitoring camera is used to monitor the on and off status of the signal light.

8. A detection system for high and low temperature test of samples according to claim 6, characterized in that: The external impact module includes: Standard deviation module: obtains the voltage values ​​of samples at different times within the current preset time period, obtains the mean voltage value based on the voltage values ​​at different times, and calculates the voltage standard deviation of the sample based on the mean voltage value; Voltage deviation value module: calculates the absolute difference between the voltage value at each moment and the voltage value provided by the DC power supply, and calculates the average of the absolute differences at all moments to obtain the voltage deviation value; Voltage unqualified module: normalizes the voltage standard deviation and voltage deviation value, and obtains the voltage unqualified coefficient according to the normalized voltage standard deviation and voltage deviation value.

9. A detection system for high and low temperature test of samples according to claim 8, characterized in that: The external impact module also includes: Test board fault module: obtains the voltage at both ends of the signal light, calculates the absolute difference between the voltages at both ends, and divides the absolute difference by the preset normal voltage difference to obtain the test board fault coefficient; Index calculation module: normalizes the voltage unqualified coefficient and the test board failure coefficient, and obtains the external influence index according to the normalized voltage unqualified coefficient and the test board failure coefficient.

10. A detection system for high and low temperature test of samples according to claim 6, characterized in that: The retest module is used to: When the external impact index is not less than the preset threshold, an alarm is sounded, a new circuit test board is replaced, the sample is reconnected through a DC power supply, and the corresponding external impact index is recollected until the external impact index is less than the preset threshold; When the external impact index is less than the preset threshold, the on and off status of the signal light is recorded, and the DC voltage of the DC power supply is switched to record the functional status of the sample under the conditions of DC voltage of 9V, 12V, and 16V respectively; The switching module is used for: Switch between different test environments through high and low temperature humidity test chambers and record the functional status of samples at different temperatures.

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