Test fixture, test fixture design method and electronic equipment

Abstract

The invention discloses a test fixture, a test fixture design method and electronic equipment. The method comprises the following steps: performing a connection test on an initial test fixture and a network test instrument to obtain first test data; if the first test data is matched with the target simulation data, determining a test fixture model corresponding to the initial test fixture as a target test fixture model, and if the first test data is not matched with the target simulation data, adjusting a first parameter of the test fixture model to obtain an updated test fixture model, and determining the corresponding target simulation data until the first test data is matched with the target simulation data; and determining the updated test fixture model corresponding to the target simulation data as a target test fixture model. And obtaining second test data corresponding to the target test fixture model, performing information extraction processing on the second test data to obtain a processing result, and determining the test fixture model according to the processing result. And the adjustment process of the corresponding parameters of the test clamp model only needs to be carried out in virtual simulation software, so that the design efficiency of the test clamp is improved.

Description

Technical Field

[0001] The present application relates to the technical field of test fixture design, and in particular to a test fixture, a test fixture design method and an electronic device. Background Art

[0002] With the increasing popularity of the Internet, electronic devices need to use the Internet for daily network interconnection, software downloads, interactive communications and other usage scenarios. Taking vehicles as an example, vehicle usage scenarios such as vehicle-mounted network interconnection, over-the-air technology (OTA), and interactive communications all require the use of Ethernet technology. In the process of using the network, since electronic devices have high requirements for the quality of transmitted signals, a series of physical layer tests are usually required to verify the reliability and compliance of network transmission during the construction of the network link, and the cable interface used for network transmission testing needs to be connected during the test.

[0003] Since the interface types of cable interfaces are various, the cable interface and the network test instrument (such as a network analyzer) may not be able to directly match and connect during the network test process, so the cable interface and the test instrument can be connected through a test fixture as a "universal transfer". At present, regarding the production process of the test fixture, in order to ensure a high detection accuracy, it is necessary to first design and produce an initial test fixture, and then conduct a signal transmission test experiment, and compare the test results with the standard results. If the test results do not meet the accuracy requirements, it means that the parameters of the initial test fixture (such as size, connector package type, printed circuit board (Printed Circuit Board, PCB) stacking parameters, etc.) do not meet the requirements, and the parameters corresponding to the initial test fixture need to be adjusted, and the corresponding test fixture is produced again to perform a signal transmission test experiment until the test results meet the accuracy requirements. This design and production method of the test fixture has the problems of high production cost, long cycle, and low efficiency. Summary of the invention

[0004] The present application provides a test fixture, a test fixture design method and an electronic device, which are used to solve the problems of high production cost, long cycle and low efficiency in the design and production method of the test fixture in the prior art.

[0005] To solve the above technical problems, in the first aspect, the implementation method of the present application discloses a test fixture design method, the method comprising: obtaining first test data corresponding to an initial test fixture, the first test data being data obtained by performing a connection test on the initial test fixture and a network test instrument; when the first test data matches target simulation data, determining that a test fixture model corresponding to the initial test fixture is a target test fixture model, the target simulation data being data obtained by simulating the test fixture model in electromagnetic simulation software; when the first test data does not match the target simulation data, adjusting a first parameter of the test fixture model corresponding to the initial test fixture to obtain an updated A test fixture model is obtained, and corresponding target simulation data is determined according to the updated test fixture model until the first test data matches the target simulation data, and the target test fixture model is determined, where the target test fixture model is an updated test fixture model corresponding to the target simulation data that matches the first test data; second test data corresponding to the target test fixture model is obtained, and information extraction processing is performed on the second test data to obtain a processing result, where the second test data is data obtained by connecting the target test fixture model with a network test instrument and a cable for testing; when the processing result meets the target condition, the target test fixture model is determined to be a test fixture model for making a target test fixture.

[0006] Using the above technical solution, in the design process of the test fixture, first connect the initial test fixture and the network test instrument to perform a corresponding connection test to obtain the first test data. Then, by fitting, determine whether the first test data matches the target simulation data obtained by the simulation test of the test fixture model corresponding to the initial test fixture in the electromagnetic simulation software. If the first test data does not match the target simulation data, it means that the test fixture model does not meet the requirements, then adjust the first parameter of the test fixture model to obtain an updated test fixture model, and determine the corresponding target simulation data according to the updated test fixture model, until the first test data matches the target simulation data by fitting; if the first test data matches the target simulation data, then determine that the test fixture model corresponding to the initial test fixture is the target test fixture model. Connect the target test fixture model with the network test instrument and the cable to obtain the second test data, perform information extraction processing on the second test data, and obtain the processing result. If the processing result meets the target condition, determine that the target test fixture model is the test fixture model used to make the target test fixture. Therefore, during the design process of the test fixture, if the test data of the initial test fixture does not meet the requirements (i.e., the accuracy of the test fixture is insufficient), the adjustment process of the corresponding parameters of the test fixture model only needs to be carried out in the virtual simulation software (such as electromagnetic simulation software), and the test fixture model for making the target test fixture that meets the accuracy requirements can be obtained through multiple adjustment tests. During the design process of the test fixture, if the performance of the test fixture does not meet the requirements, it is not necessary to readjust the parameters of the test fixture multiple times and make samples, and then test the performance of the test fixture, which greatly reduces the design cost of the test fixture and improves the design efficiency.

[0007] According to another specific implementation of the present application, the test fixture design method disclosed in the implementation of the present application obtains the first test data corresponding to the initial test fixture, including: determining the initial test fixture, the initial test fixture includes a first connection end and a second connection end, the first connection end is used to connect to a network test instrument; when the first connection end and the network test instrument are connected, performing a connection test on the first connection end and the network test instrument to obtain the first test data.

[0008] By adopting the above technical scheme, because the electrical parameter characteristics of the obtained test fixture itself can better fit the subsequent simulation data, only the first connection end and the network test instrument are connected, so that the second connection end remains in an open circuit state. The fitting and matching results of the first test data and the target simulation data obtained by the test are more accurate, thereby increasing the adjustment accuracy of the first parameter of the test fixture model.

[0009] According to another specific implementation of the present application, the implementation of the present application discloses a test fixture design method, wherein the test fixture model includes a first virtual connection end and a second virtual connection end, the first virtual connection end corresponds to the first connection end, and the second virtual connection end corresponds to the second connection end, and obtaining second test data corresponding to the target test fixture model includes: connecting the first virtual connection end and a network test instrument, connecting the second virtual connection end and a cable, and performing a corresponding connection test to obtain the second test data.

[0010] By adopting the above technical solution, by connecting the first virtual connection end and the network test instrument, connecting the second virtual connection end and the cable, and performing information extraction processing on the second test data obtained from the corresponding connection test, the test fixture model used to make the target test fixture can be determined more accurately based on the obtained processing results.

[0011] According to another specific implementation of the present application, the implementation of the present application discloses a test fixture design method, wherein the first virtual connection end includes a first virtual port and a second virtual port, the second virtual connection end includes a third virtual port and a fourth virtual port, the second test data includes four-port passive parameters obtained by testing the first virtual port, the second virtual port, the third virtual port and the fourth virtual port, and information extraction processing is performed on the second test data to obtain processing results, including: performing hexahedral meshing processing on the four-port passive parameters to obtain energy convergence curves corresponding to the first virtual port, the second virtual port, the third virtual port and the fourth virtual port, as processing results.

[0012] By adopting the above technical scheme and using hexahedral meshing technology to mesh the four-port passive parameters, a more accurate energy convergence curve corresponding to the four-port passive parameters can be obtained as a processing result. According to the obtained processing result, the test fixture model for making the target test fixture can be more accurately determined.

[0013] According to another specific implementation of the present application, in the test fixture design method disclosed in the implementation of the present application, the first connection end includes a first port and a second port, and the first test data includes dual-port passive parameters corresponding to the first port and the second port.

[0014] By adopting the above technical solution, the fitting and matching results of the dual-port passive parameters corresponding to the first port and the second port and the target simulation data are obtained by testing, thereby increasing the adjustment accuracy of the first parameter of the test fixture model.

[0015] According to another specific implementation of the present application, the implementation of the present application discloses a test fixture design method, which also includes obtaining an initial test fixture in the following manner: obtaining the initial test fixture according to a preset second parameter, the second parameter including at least one of the size corresponding to the test fixture, the connector packaging type, and the printed circuit board stacking parameter.

[0016] By adopting the above technical solution, the initial test fixture determined according to at least one of the size corresponding to the preset test fixture, the connector package type and the printed circuit board stacking parameter can better meet the standard.

[0017] According to another specific implementation of the present application, in the test fixture design method disclosed in the implementation of the present application, the first parameter includes at least one of the dielectric thickness, metal surface roughness, and dielectric constant of the insulating material corresponding to the test fixture.

[0018] According to another specific implementation of the present application, the implementation of the present application discloses a test fixture design method, which also includes: when the processing result does not meet the target condition, adjusting the second parameter and redetermining the initial test fixture based on the second parameter.

[0019] By adopting the above technical solution, when the processing result does not meet the target condition, the second parameter is adjusted, and the performance of the initial test fixture re-determined according to the second parameter is better and can further meet the accuracy requirement of the test fixture.

[0020] In a second aspect, an implementation of the present application further discloses a test fixture, which is manufactured based on any one of the test fixture design methods of the first aspect.

[0021] By adopting the above technical solution, the test fixture obtained according to the target test fixture model can better meet the accuracy requirements, and greatly reduce the design cost of the test fixture, thereby improving the design efficiency.

[0022] In a third aspect, the implementation method of the present application also discloses an electronic device, comprising: a processor, and a memory communicatively connected to the processor; the memory stores a computer program; the processor executes the computer program stored in the memory, so that the electronic device implements the test fixture design method provided in any one of the implementation methods of the first aspect above.

[0023] In a fourth aspect, an implementation of the present application provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, it is used to implement the test fixture design method provided in any one of the implementations of the first aspect above.

[0024] In a fifth aspect, an implementation of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements a test fixture design method as provided in any one of the implementations of the first aspect above.

[0025] It can be understood that the beneficial effects of the third to fifth aspects mentioned above can also be found in the relevant description of the first aspect mentioned above, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a flow chart of a test fixture design method provided in an embodiment of the present application;

[0027] Figure 2 It is a schematic diagram of a process for obtaining first test data corresponding to an initial test fixture provided by an embodiment of the present application;

[0028] Figure 3 It is a schematic diagram of a test fixture PCB design drawing provided in an embodiment of the present application;

[0029] Figure 4 is a structural schematic diagram of a test fixture sample provided in an embodiment of the present application;

[0030] Figure 5 This is a schematic diagram of the structure of a test fixture provided by an embodiment of the present application using cable welding;

[0031] Figure 6 It is a structural schematic diagram of an open-circuit data test bench of a test fixture provided in an embodiment of the present application;

[0032] Figure 7 is a schematic diagram comparing open circuit test data and simulation data of a first port of a test fixture provided in an embodiment of the present application;

[0033] Figure 8 is a schematic diagram comparing open circuit test data and simulation data of a second port of a test fixture provided in an embodiment of the present application;

[0034] Fig. 9 is a structural schematic diagram of a test fixture model provided in an embodiment of the present application;

[0035] Fig.10 It is a schematic diagram of mesh partitioning parameters of a hexahedral mesh partitioning technology provided in an embodiment of the present application;

[0036] Fig.11 It is a schematic diagram of an energy convergence curve corresponding to a four-port passive parameter provided in an embodiment of the present application;

[0037] Fig.12is a schematic diagram of a four-port passive data provided by an embodiment of the present application;

[0038] Fig.13 It is a schematic diagram of a comparative test between a test fixture provided in an embodiment of the present application and an existing test fixture AE6943A on a real product;

[0039] Fig.14 It is a schematic diagram of an overall test bench for a test fixture test provided in an embodiment of the present application;

[0040] Fig.15 It is a schematic diagram comparing key parameter SDD11 data obtained by testing a test fixture provided by an embodiment of the present application and an existing test fixture AE6943A;

[0041] Fig.16 It is a schematic diagram comparing key parameter SDC11 data obtained by testing a test fixture provided by an embodiment of the present application and an existing test fixture AE6943A;

[0042] Fig.17 It is a schematic diagram comparing the de-embedding processing results of the key parameter SDD11 simulation data and the test data provided in an embodiment of the present application;

[0043] Fig.18 It is a schematic diagram comparing the de-embedding processing results of a key parameter SDC11 simulation data and a test data provided in an embodiment of the present application;

[0044] Fig.19 It is a schematic diagram of comparing the results before and after de-embedding the test data of the test fixture provided by an embodiment of the present application;

[0045] Fig. 20 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application.

[0046] Reference numerals:

[0047] 10: first connection end; 11: first port; 12: second port;

[0048] 20: second connection terminal; 21: first solder pad; 22: second solder pad;

[0049] 30: coaxial connector;

[0050] 40: Connector;

[0051] 50: first virtual connection end; 51: first virtual port; 52: second virtual port;

[0052] 60: second virtual connection end; 61: third virtual port; 62: fourth virtual port.

[0053] Specific implementation method

[0054] As mentioned above, the existing design and production methods of test fixtures have the problems of high production cost, long cycle and low efficiency. Furthermore, the existing network transmission test in the automotive industry generally adopts a complete set of test solutions provided by mainstream measuring instrument manufacturers. These packaged technical solutions provide test fixtures. Although these test fixtures have high accuracy, they also have problems such as high price and limited application scenarios. At the same time, the design and production process of these test fixtures also has the problems of high production cost, long cycle and low efficiency.

[0055] Based on this, the implementation method of the present application provides a test fixture design method. During the test fixture design process, when the initial test fixture and the network test instrument are connected and tested, and the first test data obtained does not match the target simulation data, and it is determined that the performance of the initial test fixture does not meet the accuracy requirements, it is only necessary to adjust the parameters of the test fixture model in the simulation software, update the test fixture model and the corresponding target simulation data until the first test data matches the target simulation data, and then obtain the second test data corresponding to the target test fixture model, perform information extraction processing on the second test data, and when the processing result meets the target conditions, a test fixture model that meets the accuracy requirements for making the target test fixture can be obtained, which greatly reduces the design cost of the test fixture and improves the design efficiency.

[0056] Next, the test fixture design method provided by the implementation of the present application is described in detail with reference to the accompanying drawings.

[0057] like Figure 1 As shown, in one implementation of the present application, the test fixture design method provided in the implementation of the present application specifically includes the following steps.

[0058] S100, obtaining first test data corresponding to an initial test fixture.

[0059] The first test data is data obtained by performing a connection test on the initial test fixture and the network test instrument, such as a network analyzer, an oscilloscope, and the like.

[0060] S200, determining whether the first test data matches the target simulation data, if not (that is, the first test data does not match the target simulation data), proceeding to step S300.

[0061] If yes (ie the first test data matches the target simulation data), it means that the first parameter of the test fixture model does not need to be adjusted, and the process directly goes to step S400, wherein the target simulation data is the data obtained by simulating the test fixture model in electromagnetic simulation software.

[0062] S300, adjust the first parameter of the test fixture model corresponding to the initial test fixture to obtain an updated test fixture model, and determine the corresponding target simulation data based on the updated test fixture model, and return to step S200 until the first test data matches the target simulation data, and determine the target test fixture model, which is an updated test fixture model corresponding to the target simulation data that matches the first test data.

[0063] S400, determining a target test fixture model. Specifically, in step S200, if the first test data matches the target simulation data, then the test fixture model corresponding to the initial test fixture is determined to be the target test fixture model, and if the first test data does not match the target simulation data, then the updated test fixture model is determined to be the target test fixture model.

[0064] The test fixture model can be a three-dimensional model corresponding to the test fixture that is simulated by electromagnetic simulation software and has the same performance characteristics as the test fixture. By simulating the performance of the three-dimensional model, the performance characteristics corresponding to the test fixture can be determined, and adjusting the parameters of the test fixture model is equivalent to adjusting the parameters corresponding to the test fixture.

[0065] S500, obtaining second test data corresponding to the target test fixture model, performing information extraction processing on the second test data, and obtaining a processing result. The second test data is data obtained by connecting the target test fixture model with a network test instrument and a cable.

[0066] Before connecting the target test fixture model with the network test instrument and cable for testing, the target test fixture model needs to be connected with the network test instrument and cable. Specifically, the simulation software can automatically control the target test fixture model to connect with the virtual network test instrument and the virtual cable when determining that the first test data matches the target simulation data, and then obtain the second test data corresponding to the target test fixture model. The virtual network test instrument and the virtual cable have the same performance as the physical network test instrument and the physical cable. It can also be that the physical network test instrument and the physical cable have been preliminarily connected with the simulation software equipped with the target test fixture model in advance (through a harness connection or a wireless connection) but have not communicated. When the simulation software determines that the first test data matches the target simulation data, it automatically controls the target test fixture model to communicate with the physical network test instrument and the physical cable, and then obtains the second test data corresponding to the target test fixture model; it can also be that when it is determined that the first test data matches the target simulation data, the target test fixture model is manually connected with the network test instrument and the cable, and the second test data corresponding to the target test fixture model is obtained. The specific method can be set according to needs.

[0067] S600: Determine whether the processing result meets the target condition.

[0068] If yes (that is, the processing result meets the target condition), go to step S700.

[0069] S700: Determine that the target test fixture model is a test fixture model used to manufacture the target test fixture.

[0070] In one implementation of the present application, if not (that is, the processing result does not meet the target condition), proceed to step S800.

[0071] S800, adjusting the second parameter, re-determining the initial test fixture according to the second parameter, and returning to step S100 to repeatedly execute the design method until a test fixture model that meets the accuracy requirement is obtained.

[0072] The test fixture design method provided by the implementation method of the present application, in the design process of the test fixture, first connect the initial test fixture and the network test instrument to perform a corresponding connection test to obtain the first test data. Then, by fitting, determine whether the first test data matches the target simulation data obtained by the test fixture model corresponding to the initial test fixture in the electromagnetic simulation software. If the first test data does not match the target simulation data, it means that the test fixture model does not meet the requirements, then adjust the first parameter of the test fixture model to obtain an updated test fixture model, and determine the corresponding target simulation data according to the updated test fixture model, until the first test data is determined to match the target simulation data by fitting; if the first test data matches the target simulation data, then determine that the test fixture model corresponding to the initial test fixture is the test fixture model. Connect the target test fixture model with the network test instrument and the cable to obtain the second test data, perform information extraction processing on the second test data, and obtain the processing result. If the processing result meets the target condition, determine that the target test fixture model is the target test fixture model used to make the target test fixture. Therefore, during the design process of the test fixture, if the test data of the initial test fixture does not meet the requirements (i.e., the accuracy of the test fixture is insufficient), the adjustment process of the corresponding parameters of the test fixture model only needs to be carried out in the virtual simulation software (such as electromagnetic simulation software), and the test fixture model for making the target test fixture that meets the accuracy requirements can be obtained through multiple adjustment tests. During the design process of the test fixture, if the performance of the test fixture does not meet the requirements, it is not necessary to readjust the parameters of the test fixture multiple times and make samples, and then test the performance of the test fixture, which greatly reduces the design cost of the test fixture and improves the design efficiency.

[0073] In one implementation of the present application, Figure 2 As shown, obtaining the first test data corresponding to the initial test fixture includes the following steps.

[0074] S110, determining an initial test fixture, the initial test fixture comprising a first connection end and a second connection end, the first connection end being used to connect to a network test instrument.

[0075] The second connection end included in the test fixture is used to connect with the cable during the application process. However, when the first test data is obtained during the design process of the test fixture of the present application, it is not connected with the cable and is in an open circuit state.

[0076] In an implementation of the present application, the method further includes: obtaining an initial test fixture according to a preset second parameter, the second parameter including at least one of a size corresponding to the test fixture, a connector package type, and a printed circuit board stacking parameter.

[0077] For example, in one implementation of the present application, the PCB drawing of the test fixture can be designed according to actual needs, such as Figure 3 As shown, including size, connector package type, PCB stacking parameters, etc., and the circuit board is produced and processed according to the designed drawings.

[0078] like Figure 4 As shown in the figure, a test fixture sample is manufactured according to the PCB design drawings of the test fixture. The two coaxial connectors (i.e., the first connection end 10) in the actual test fixture sample are used to connect the test instrument (i.e., network test instrument, such as network analyzer, oscilloscope, etc.), and the other side of the actual object (i.e., the second connection end 20) is provided with an exposed metal pad for connecting cables. The specific test engineer can freely choose the cable connection type according to the needs and perform manual welding.

[0079] The preset second parameter may also include other parameters, such as the material of which the test fixture is made.

[0080] Compared with existing test fixtures (such as Figure 5 The test fixture shown below) is "special for special use", which is less economical. The test fixture sample provided in this application eliminates the connector in the existing test fixture (such as Figure 5 The connector 40 of the test fixture shown below) is replaced with an exposed pad (such as Figure 4 and Figure 5 The second connection end 20 of the test fixture shown above includes a first solder pad 21 and a second solder pad 22, which can be arbitrarily adapted to different cable interfaces in the form of a soldered cable, thereby enhancing the flexibility of the test fixture application. 30 is a coaxial connector used in an existing test fixture to connect to a network test instrument.

[0081] Furthermore, if Figure 5 As shown, the test fixture and the cable are connected by welding. Compared with the prior art method of connecting the test fixture to the cable through the connector 40, the length of the interconnected cable can be shortened, thereby reducing the impact of the long cable on the network transmission test results and improving the test accuracy. In addition, the elimination of the existing test fixture connector 40 also makes the simulation modeling work simpler, thereby improving the analysis efficiency and further reducing the development cost of the test fixture.

[0082] S120: When the first connection end is connected to the network test instrument, a connection test is performed on the first connection end and the network test instrument to obtain first test data.

[0083] In one implementation of the present application, Figure 4As shown, the first connection end 10 includes a first port 11 and a second port 12 , and the first test data includes dual-port passive parameters corresponding to the first port 11 and the second port 12 .

[0084] For example, Figure 6 As shown, a network analyzer (i.e., a network test instrument) is connected to the first connection terminal 10 of the test fixture, and the network analyzer is used to test and obtain the dual-port passive parameters (i.e., the first test data S11 and S21) of the sample (i.e., the initial test fixture). Because obtaining the intrinsic electrical parameter characteristics of the fixture can better fit the subsequent simulation data, the welding side of the initial test fixture (i.e., the second connection terminal 20) remains in an open circuit state.

[0085] For example, in one implementation of the present application, Figure 7 and Figure 8 As shown in FIG. , it is a schematic diagram for determining whether the first test data matches the target simulation data. Figure 7 As shown, it is a schematic diagram of fitting and matching the open circuit test data (ie, first test data, passive parameters) and the simulation data (ie, target simulation data) of the first port 11 of the initial test fixture, as shown Figure 8 As shown, it is a schematic diagram of fitting and matching the open circuit test data (ie, first test data, passive parameters) and simulation data (ie, target simulation data) of the second port 12 of the initial test fixture. Figure 7 As shown, the open circuit test data of the first port 11 is curve 1 (i.e., test data S1,1), and the simulation data of the first port 11 is curve 2 (i.e., target simulation data S1,1). By fitting the acquisition frequency (i.e., Frequency / GHz) and S parameter amplitude (in dB) of the data, it is determined whether the test data S1,1 matches the target simulation data S1,1. Figure 8 As shown, the open circuit test data of the second port 12 is curve 3 (i.e., test data S2,1), and the simulation data of the second port 12 is curve 4 (i.e., target simulation data S2,1). By fitting the acquisition frequency (i.e., Frequency / GHz) and S parameter amplitude (unit dB) of the data, it is determined whether the test data S2,1 matches the target simulation data S2,1.

[0086] If the open circuit test data S1,1 does not match the target simulation data S1,1 and / or the open circuit test data S2,1 does not match the target simulation data S2,1, it means that the accuracy of the initial test fixture is insufficient and the parameters of the initial test fixture need to be corrected. For example, by fine-tuning the parameters related to the three-dimensional model of the test fixture, such as dielectric thickness, metal surface roughness, dielectric constant of insulating material, etc., the open circuit test data and simulation data can be matched (that is, the first test data matches the target simulation data). In one implementation of the present application, reference Figure 7 and Figure 8 As shown, within up to 4 GHz, the first test data substantially matches the target simulation data.

[0087] That is, in one implementation of the present application, the first parameter includes at least one of the dielectric thickness, metal surface roughness, and dielectric constant of the insulating material corresponding to the test fixture. The first parameter may also include other parameters corresponding to the test fixture, such as resistance.

[0088] The present application can adjust the test fixture model corresponding to the initial test fixture, that is, the first parameter of the three-dimensional model in the electromagnetic simulation software, and then re-perform the simulation test to obtain the updated target simulation data, and again determine whether the first test data matches the target simulation data, and repeat the above process until the first test data matches the target simulation data.

[0089] Exemplarily, the first parameter of the test fixture model of the initial test fixture is adjusted according to the preset first test data and target simulation data matching result and the adjustment strategy of the first parameter. For example, if the first test data and the target simulation data match result that the amplitude difference between the first test data and the target simulation data at a fixed frequency exceeds the preset value, then the first test data and the target simulation data do not match, and the corresponding adjustment strategy of the first parameter is to increase the dielectric thickness to N1, reduce the metal surface roughness to N2, and increase the dielectric constant of the insulating material to N3; or if the first test data and the target simulation data match result that the mean of the amplitude difference between the first test data and the target simulation data in the set frequency range is greater than the preset value, then the first test data and the target simulation data do not match, and the corresponding adjustment strategy of the first parameter is to reduce the dielectric thickness to N4, increase the metal surface roughness to N5, and increase the dielectric constant of the insulating material to N6, etc. The specific first test data and the target simulation data matching result and the adjustment strategy of the first parameter can be determined according to the bench test. In addition, N1~N6 are just examples, and the specific values ​​are set according to the test. Furthermore, the test engineer may also make adjustments based on the matching result between the first test data and the target simulation data and according to design experience.

[0090] In one implementation of the present application, Fig. 9 As shown, the test fixture model includes a first virtual connection terminal 50 and a second virtual connection terminal 60, the first virtual connection terminal 50 corresponds to the first connection terminal 10 of the test fixture, and the second virtual connection terminal 60 corresponds to the second connection terminal 20 of the test fixture. Obtaining the second test data corresponding to the updated test fixture model includes: connecting the first virtual connection terminal 50 and the network testing instrument, connecting the second virtual connection terminal 60 and the cable, and performing a corresponding connection test to obtain the second test data.

[0091] In one implementation of the present application, Fig. 9 As shown, the first virtual connection end 50 includes a first virtual port 51 and a second virtual port 52, the second virtual connection end 60 includes a third virtual port 61 and a fourth virtual port 62, the second test data includes four-port passive parameters obtained by testing the first virtual port 51, the second virtual port 52, the third virtual port 61 and the fourth virtual port 62, and the second test data is subjected to information extraction processing to obtain processing results, including: performing hexahedral meshing processing on the four-port passive parameters to obtain energy convergence curves corresponding to the first virtual port 51, the second virtual port 52, the third virtual port 61 and the fourth virtual port 62 as processing results.

[0092] Specifically, the first virtual port 51 corresponds to the first port 11 of the initial test fixture, the second virtual port 52 corresponds to the second port 12 of the initial test fixture, the third virtual port 61 corresponds to the first pad 21 of the initial test fixture, and the fourth virtual port 62 corresponds to the second pad 22 of the initial test fixture. The first parameter of the test fixture model corresponding to the initial test fixture is adjusted. Fig. 9 The first parameter of the three-dimensional model shown is adjusted, and an updated test fixture model is obtained after the adjustment.

[0093] Further, after obtaining the matching data (ie, the first test data matches the target simulation data), the open circuit side (eg, Fig. 9 60) as shown in the figure to set up a virtual port (such as Fig. 9 The passive parameters of the four ports are derived and extracted (ie, the second test data are subjected to information extraction processing to obtain processing results), and the passive parameters of the four ports will be used for subsequent test comparison and verification.

[0094] The process of deriving and extracting the passive parameters of the four ports may specifically include:

[0095] On the open circuit side of the original model (i.e. the updated test fixture model) Fig. 9 60), set two virtual 50 ohm ports referenced to the circuit board plane (such as Fig. 9 Ports 61 and 62 shown).

[0096] For example, the algorithm derivation of the above four-port passive data is performed using the time domain solver of the electromagnetic simulation software. Since the solver uses the "hexahedral mesh" partitioning technology, the detailed division of the model is required to be high during the solution. After multiple rounds of solution iterations, the following can be finally used: Fig.10The meshing parameters shown are used for data extraction (wherein the maximum cell of the model body (Maximum cell) is 35, the maximum cell of the model boundary (Far from model) is 15, the maximum cell of the longest edge of the model body (Cells per max model box edge) is 35, and the minimum cell size allowed is 1 / 50 of the maximum cell of the model body (Minimum cell Fraction of maximum cell near to model)).

[0097] Fig.10 Other related mesh parameters in the "hexahedral mesh" partitioning technique are also displayed, such as Cells per wavelength, Smallest cell is 0.03556, Largest cell is 1.48934, Number of cells is 229,548, Nx is 95, Ny is 75, Nz is 34, and some spaces OK, Cancel, Apply, Update, Specials, Simplify Model, Help, etc.

[0098] After running the algorithm to solve, we get Fig.11 The horizontal axis of the test data of each port (i.e., the four-port passive parameters corresponding to the first virtual port 51, the second virtual port 52, the third virtual port 61, and the fourth virtual port 62) is the energy convergence curve (i.e., the processing result) over time. Fig.11 As shown in the figure, each energy convergence curve shows that the final energy converges to -50dB, that is, the processing result meets the target condition (converges to -50dB), reaches the accuracy requirement set by the test fixture model, and indicates that the algorithm has converged. At this time, the test fixture model is a target test fixture model for making a target test fixture. Of course, the target condition can also be set according to the specific needs of the test, and it is not limited to converge to -50dB.

[0099] like Fig.12 As shown, there are multiple groups of four-port passive data obtained during the experiment (for example, S1,1, S2,1, S3,1, S4,1, S1,2, S2,2, S3,2, S4,2, S1,3, S2,3, S3,3, S4,3, S1,4, S2,4, S3,4, S4,4). The export function of CST is used to package the results into .s4p files for subsequent tests.

[0100] If the energy convergence curves show that the final energy does not converge, that is, the processing result does not meet the target conditions, it means that only adjusting the first parameter of the test fixture model cannot make the accuracy of the test fixture meet the requirements, and other parameters of the test fixture (such as the second parameter, size, connector package type, PCB stacking parameters) need to be adjusted, and the aforementioned design process is performed again to obtain the target test fixture model for making the target test fixture.

[0101] Exemplarily, the second parameter of the test fixture model of the initial test fixture is adjusted, which can be adjusted according to the preset processing result and the adjustment strategy of the second parameter. For example, if the processing result is that the final energy of each energy convergence curve does not converge, then the processing result does not meet the target condition, and the adjustment strategy of the second parameter can be to reduce the test fixture size to the first value, change the connector package type, and reduce the PCB stacking parameter to the second value; or if the processing result is that the final energy convergence of each energy convergence curve is -10dB, which does not meet the convergence requirement, then the processing result does not meet the target condition, and the adjustment strategy of the second parameter is to increase the test fixture size to the third value, not change the connector package type, and increase the PCB stacking parameter to the fourth value, etc., or if the processing result is that the final energy convergence of each energy convergence curve is -5dB, which does not meet the convergence requirement, then the processing result does not meet the target condition, and the adjustment strategy of the second parameter is to increase the test fixture size to the fifth value, not change the connector package type, and increase the PCB stacking parameter to the sixth value, etc. The specific processing result and the adjustment strategy of the second parameter can be determined according to the bench test. Furthermore, the first to sixth values ​​are only examples, and specific values ​​are set according to experiments. Furthermore, the test engineer may also adjust the second parameter according to the processing results and design experience.

[0102] In an implementation of the present application, a test fixture is further provided. The test fixture is manufactured based on the target test fixture model obtained in the aforementioned test fixture design method.

[0103] Specific as Figure 4 As shown, the test fixture includes a first connection end 10 and a second connection end 20, the first connection end 10 includes a first port 11 and a second port 12, the second connection end 20 includes a first soldering pad 21 and a second soldering pad 22, the first connection end 10 is used to connect to a network test instrument, and the second connection end 20 is used to connect to a cable, and the cable can be connected to the first soldering pad 21 and the second soldering pad 22 by welding to achieve the connection between the second connection end 20 and the cable.

[0104] Next, the accuracy of the test fixture manufactured by the present application based on the aforementioned target test fixture model is described in combination with specific experimental data.

[0105] like Fig.13 and Fig.14 As shown in the figure, in the actual product test, by using the test fixture of Keysight Technologies (model AE6943A, specifically Fig.13 The test fixture shown on the right in the figure) and the test fixture provided by the present application (specifically Fig.13 The test fixture shown on the left in the figure, i.e., the fixture sample, is used to connect the test link to achieve test data comparison of the product's Gigabit Ethernet interface.

[0106] like Fig.15 As shown in FIG. 1 , the data comparison result of the key parameter SDD11 in the test data is shown. Below the limit curve RL Limit, the test data curve S(1,1) of the test fixture provided by the present application and the test data curve S(5,5) of AE6943A are almost completely consistent. Fig.16 As shown, the data comparison result of the key parameter SDC11 in the test data, at the extremely low energy sensitivity level (below -60dB), below the limit curve CL Limit, there is no significant difference between the test data curve S(1,2) of the test fixture provided by the present application and the test data curve S(5,6) of AE6943A, which indicates that the test fixture provided by the present application is basically consistent in performance with the existing manufacturer's higher precision test fixture.

[0107] Furthermore, the four-port passive parameters (.s4p file) obtained from the above simulation test are imported into the network analyzer, and the data de-embedding function is enabled during the product measurement process (this function can remove the influence of the test fixture on the signal in the test link according to the passive parameters of the test fixture provided by the designer. This function can be applied to application scenarios with extremely high measurement accuracy requirements, such as SDC11). At the same time, the four-port passive parameters are imported into the simulation environment for algorithm de-embedding processing, and the de-embedding effects of the two are compared. Fig.17 and Fig.18 As shown, the four-port passive parameters obtained by the test fixture provided in the present application through the de-embedding processing of the simulation tool and the curves obtained through the de-embedding processing of the network analyzer basically maintain the same development trend, thereby verifying the reliability of the derived four-port simulation data in the de-embedding processing effect.

[0108] Specific as Fig.17 As shown in the figure, the comparison results of the curve obtained by de-embedding the data of the key parameter SDD11 in the test data through the simulation tool (i.e. simulation de-embedding) and the curve obtained by de-embedding the data of the network analyzer (i.e. test de-embedding) are shown. Below the limit curve RL, the two curves basically maintain the same development trend. Fig.18As shown in the figure, the comparison results are as follows: the curve obtained by de-embedding the data of the key parameter SDC11 in the test data through the simulation tool (i.e., simulation de-embedding) and the curve obtained by de-embedding the data of the network analyzer (i.e., test de-embedding). Below the limit curve CL, the two curves basically maintain the same development trend.

[0109] After the above data comparison and verification, the test fixture sample and its data can be effectively applied to product design.

[0110] First, during the product development stage, the four-port passive parameters of the fixture can be cascaded into the simulation link for design evaluation, thereby further improving the design margin of the PCB and reducing the probability of test failure.

[0111] Then, during the product verification phase, the test fixture can be used to test more types of interfaces (such as Figure 5 As shown in the figure, unlike the fixed connector of AE6943A, this fixture adopts the form of cable welding, so it is easy to disassemble and can adapt to different connector ports), and can also more effectively support the data post-processing function of de-embedding, thereby improving the accuracy of test data. Fig.19 As shown in the figure, the effect comparison of product test data before and after de-embedding processing is performed using the four-port passive parameters of the test fixture extracted by simulation. Below the limit curve CL, the de-embedded test curve S(3,4) and the homemade fixture test curve S(5,6) can achieve performance optimization of some frequency bands, thereby providing more design references for product optimization.

[0112] The test fixture design method provided in this application constructs a set of test fixture solutions with stronger compatibility and higher cost performance (such as Ethernet test fixture, which can be applicable to 1000 / 100Base-T1 Ethernet interface design). While ensuring the unchanged performance, it can be more flexibly applied to the development, design, test and verification of different network (such as Ethernet) interfaces.

[0113] The test fixture design method is used to set up the test fixture, which reduces the material cost, makes the whole process from test fixture development to performance verification controllable, and has stronger application flexibility and compatibility, which helps to build a better design and development process and truly realize the closed loop from signal simulation to testing. In addition, it can be used as a good replacement for existing test fixtures, and the test connection method is flexible, which can adapt to different interface types without changing the original design parameters of the fixture, realizing the closed loop of simulation and testing. The design parameters can be flexibly used between simulation and testing, and the price is low, the sample production is convenient, and it supports mass production and use.

[0114] In another implementation of the present application, the test fixture design method of the present application can be applied to electronic equipment.

[0115] Among them, the test fixture design method can be applied to electronic equipment such as computers. Fig. 20 , Fig. 20 The figure shows a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Fig. 20 As shown, the electronic device may include: a transceiver 121 , a processor 122 , and a memory 123 .

[0116] The processor 122 executes the computer execution instructions stored in the memory, so that the processor 122 executes part of the technical solutions of the test fixture design method in the above embodiment. The processor 122 can be a general-purpose processor, including a central processing unit CPU, a network processor (NP), etc.; it can also be a digital data processor DSP, an application-specific integrated circuit ASIC, a field programmable gate array FPGA or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components.

[0117] The memory 123 is connected to the processor 122 via a system bus and completes communication between them. The memory 123 is used to store computer program instructions.

[0118] By way of example and not limitation, the memory 123 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a tape, or a universal serial bus (USB) drive, or a combination of two or more of these. Where appropriate, the memory 123 may include a removable or non-removable (or fixed) medium. Where appropriate, the memory 123 may be inside or outside the integrated gateway device. In a particular embodiment, the memory 123 is a non-volatile solid-state memory. In a particular embodiment, the memory 123 includes a read-only memory (ROM). Where appropriate, the ROM may be a mask-programmed ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (EEPROM), an electrically rewritable ROM (EAROM), or a flash memory, or a combination of two or more of these.

[0119] The transceiver 121 may be used to obtain tasks to be executed and configuration information of the tasks to be executed.

[0120] The system bus can be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The system bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus. The transceiver is used to realize the communication between the database access device and other computers (such as clients, read-write libraries, and read-only libraries). The memory may include random access memory (RAM) and may also include non-volatile memory.

[0121] An embodiment of the present application also provides a chip for running instructions, which is used to execute the technical solution of the test fixture design method in the above embodiment.

[0122] An embodiment of the present application also provides a computer-readable storage medium, in which computer instructions are stored. When the computer instructions are executed on a processor of an electronic device, the processor of the electronic device executes the technical solution of the test fixture design method of the above embodiment.

[0123] In some possible implementations, various aspects of the method provided in the present application may also be implemented in the form of a program product, which includes program code. When the program product runs on a processor of an electronic device, the program code is used to enable the processor of the electronic device to execute the steps of the method described above in this specification according to various exemplary implementations of the present application. For example, the electronic device may execute the test fixture design method described in the embodiments of the present application.

[0124] The program product may employ any combination of one or more readable media. The readable medium may be a readable data medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0125] The implementation method of the present application also provides a computer program product, which includes a computer program stored in a computer-readable storage medium. At least one processor can read the computer program from the computer-readable storage medium. When at least one processor executes the computer program, it can implement the technical solution of the automobile safety risk analysis method in the above-mentioned embodiment.

[0126] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices and computer program products according to the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable information processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable information processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0127] These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable information processing device to work in a specific manner, so that the instructions stored in the computer-readable memory produce a manufactured product including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0128] These computer program instructions can also be loaded onto a computer or other programmable information processing device so that a series of operation steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0129] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the invention disclosed herein. The present application is intended to cover any modification, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary technical means in the art that are not disclosed in the present application.

[0130] It should be noted that, in addition to the implementation of the present application described in the above-mentioned specific embodiments, those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. Although the description of the present application is introduced in conjunction with the preferred embodiment, this does not mean that the features of this invention are limited to the implementation. On the contrary, the purpose of introducing the invention in conjunction with the implementation is to cover other options or modifications that may extend based on the claims of the present application. In order to provide an in-depth understanding of the present application, the above description contains many specific details, and the present application may also be implemented without using these details. In addition, in order to avoid confusion or blurring the focus of the present application, some specific details will be omitted in the description. It should be noted that, in the absence of conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

[0131] It should be noted that in this specification, similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings.

[0132] Although the present application has been illustrated and described by referring to certain preferred implementations of the present application, it should be understood by those skilled in the art that the above contents are further detailed descriptions of the present application in combination with specific implementations, and it cannot be determined that the specific implementation of the present application is limited to these descriptions. Those skilled in the art may make various changes in form and details, including making several simple deductions or substitutions, without departing from the spirit and scope of the present application.

Claims

1. A test fixture design method, characterized in that: The method comprises: Acquire first test data corresponding to the initial test fixture, where the first test data is data obtained by performing a connection test on the initial test fixture and a network test instrument; In the case where the first test data matches the target simulation data, determining that the test fixture model corresponding to the initial test fixture is the target test fixture model, and the target simulation data is data obtained by simulating the test fixture model in electromagnetic simulation software; In the case where the first test data does not match the target simulation data, adjusting a first parameter of a test fixture model corresponding to the initial test fixture to obtain an updated test fixture model, and determining the corresponding target simulation data according to the updated test fixture model until the first test data matches the target simulation data, and determining a target test fixture model, wherein the target test fixture model is an updated test fixture model corresponding to the target simulation data that matches the first test data; Acquire second test data corresponding to the target test fixture model, perform information extraction processing on the second test data, and obtain a processing result, wherein the second test data is data obtained by connecting the target test fixture model with the network test instrument and the cable; In a case where the processing result satisfies a target condition, the target test fixture model is determined to be a test fixture model for manufacturing a target test fixture.

2. The test fixture design method according to claim 1, characterized in that: Acquiring first test data corresponding to the initial test fixture includes: Determine the initial test fixture, the initial test fixture includes a first connection end and a second connection end, the first connection end is used to connect to the network test instrument; When the first connection end is connected to the network test instrument, a connection test is performed on the first connection end and the network test instrument to obtain the first test data.

3. The test fixture design method according to claim 1 or 2, characterized in that: The test fixture model includes a first virtual connection end and a second virtual connection end, the first virtual connection end corresponds to the first connection end, and the second virtual connection end corresponds to the second connection end. Acquiring second test data corresponding to the target test fixture model includes: The first virtual connection end is connected to the network testing instrument, the second virtual connection end is connected to the cable, and a corresponding connection test is performed to obtain the second test data.

4. The test fixture design method according to claim 3, characterized in that: The first virtual connection end includes a first virtual port and a second virtual port, the second virtual connection end includes a third virtual port and a fourth virtual port, the second test data includes four-port passive parameters obtained by testing the first virtual port, the second virtual port, the third virtual port and the fourth virtual port, and information extraction processing is performed on the second test data to obtain a processing result, including: Hexahedral meshing is performed on the four-port passive parameters to obtain energy convergence curves corresponding to the first virtual port, the second virtual port, the third virtual port and the fourth virtual port, respectively, as the processing result.

5. The test fixture design method according to claim 4, characterized in that: The first connection end includes a first port and a second port, and the first test data includes dual-port passive parameters corresponding to the first port and the second port.

6. The test fixture design method according to any one of claims 2 to 5, characterized in that: The method further comprises obtaining the initial test fixture by: The initial test fixture is obtained according to a preset second parameter, where the second parameter includes at least one of a size corresponding to the test fixture, a connector packaging type, and a printed circuit board stacking parameter.

7. The test fixture design method according to claim 6, characterized in that: The method further comprises: When the processing result does not meet the target condition, the second parameter is adjusted, and the initial test fixture is re-determined according to the second parameter.

8. The test fixture design method according to any one of claims 1 to 7, characterized in that: The first parameter includes at least one of a dielectric thickness, a metal surface roughness, and a dielectric constant of an insulating material corresponding to the test fixture.

9. A test fixture, characterized in that: The test fixture is manufactured based on the test fixture design method according to any one of claims 1 to 8.

10. An electronic device, characterized in that: include: A processor, and a memory communicatively connected to the processor; The memory stores a computer program; The processor executes the computer program stored in the memory so that the electronic device implements the test fixture design method according to any one of claims 1 to 8.

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