Chip display performance test method and device and electronic equipment

Abstract

The embodiment of the invention provides a chip display performance testing method and device and electronic equipment. The method comprises the steps that a test request is obtained, the test request comprises the resolution ratio and the refresh rate corresponding to a chip, and the chip is arranged in electronic equipment; determining a target working mode of at least one processor of the electronic equipment according to the test request; determining at least one test instruction and a virtual display screen corresponding to the chip; and testing the virtual display screen according to the at least one test instruction to obtain a test result of the chip display performance. And the flexibility of testing the display performance of the chip is improved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of chip technology, and in particular to a chip display performance testing method, device and electronic equipment. Background Art

[0002] After the chip is installed in the electronic device, the performance of the chip can be tested. When performing the chip performance test, the display-related performance of the chip can be tested through the display screen.

[0003] Since different display screens have different display specifications (resolution and refresh rate), the chip can only be tested through a display screen that matches the display specifications. In order to make one screen suitable for chips with multiple display specifications, in actual applications, a dedicated FPGA or Serdes chip can be used in addition to the SoC for scaling processing, so that screen performance tests with different display specifications can be adapted on the same or several fixed displays. In the above process, due to the high cost and complexity of the additional matching chip, and the test frame rate depends on the parameters of the physical screen and cannot be configured arbitrarily. As a result, the flexibility of testing the display performance of the chip is low. Summary of the invention

[0004] The embodiments of the present application provide a chip display performance testing method, device and electronic device to solve the problem of low flexibility in testing chip display performance.

[0005] In a first aspect, an embodiment of the present application provides a display screen testing method, comprising:

[0006] Obtaining a test request, the test request including a resolution and a refresh rate corresponding to a chip, the chip being arranged in an electronic device;

[0007] Determining a target operating mode of at least one processor of the electronic device according to the test request;

[0008] Determining at least one test instruction and a virtual display screen corresponding to the chip;

[0009] The virtual display screen is tested according to the at least one test instruction to obtain a test result of the chip display performance.

[0010] In a possible implementation, determining at least one test instruction and a virtual display screen corresponding to the chip includes:

[0011] determining a device type of the electronic device;

[0012] Determining the at least one test instruction according to the device type;

[0013] A display driver framework corresponding to the chip is determined, and the display driver framework is determined as the virtual display screen.

[0014] In a possible implementation, determining the at least one test instruction according to the device type includes:

[0015] Determining an application scenario of the electronic device according to the device type;

[0016] According to the application scenario, obtaining at least one application program to be tested of the electronic device;

[0017] The running instruction of each application program is determined to obtain the at least one test instruction.

[0018] In a possible implementation, obtaining at least one application program to be tested of the electronic device according to the application scenario includes:

[0019] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0020] At least one application program to be tested by the electronic device and sent by the terminal device is received, wherein the at least one application program is generated by the terminal device in response to an input selection operation on a test page in the test control.

[0021] In a possible implementation, testing the virtual display screen according to the at least one test instruction to obtain a test result of the chip display performance includes:

[0022] For any test instruction, control the electronic device to execute the test instruction and obtain the operation result corresponding to the test instruction;

[0023] According to the running result corresponding to each test instruction, the test result of the chip display performance is determined, and the test result at least includes the startup speed of each application, the sliding frame rate, the response speed of switching pages and the display frame rate corresponding to each application.

[0024] In a possible implementation, obtaining a test request includes:

[0025] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0026] A test request sent by the terminal device is received, where the test request is generated by the terminal device in response to an input selection operation on a setting page in the test control.

[0027] In a possible implementation, determining, according to the test request, a target operating mode of at least one processor of the electronic device includes:

[0028] According to the test request, the display parameters of each processor are adjusted to obtain the target display parameters of each processor;

[0029] Determining a target operating mode of at least one processor of the electronic device is that each processor operates under corresponding target display parameters.

[0030] In a possible implementation, the method further includes:

[0031] Get the preset storage path;

[0032] According to the preset storage path, the terminal device is controlled to store the test result.

[0033] In a second aspect, an embodiment of the present application provides a chip display performance testing device, the device comprising:

[0034] An acquisition module, used to acquire a test request, wherein the test request includes a resolution and a refresh rate of a display screen, and the display screen is provided in the electronic device;

[0035] A first determining module, configured to determine a target operating mode of at least one processor of the electronic device according to the test request;

[0036] A second determination module, used to determine at least one test instruction and a virtual display screen corresponding to the display screen;

[0037] The testing module is used to test the virtual display screen according to the at least one testing instruction to obtain a testing result.

[0038] In a possible implementation manner, the second determining module is specifically configured to:

[0039] determining a device type of the electronic device;

[0040] Determining the at least one test instruction according to the device type;

[0041] A display driver framework corresponding to the chip is determined, and the display driver framework is determined as the virtual display screen.

[0042] In a possible implementation manner, the second determining module is specifically configured to:

[0043] Determining an application scenario of the electronic device according to the device type;

[0044] According to the application scenario, obtaining at least one application program to be tested of the electronic device;

[0045] The running instruction of each application program is determined to obtain the at least one test instruction.

[0046] In a possible implementation manner, the second determining module is specifically configured to:

[0047] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0048] At least one application program to be tested by the electronic device and sent by the terminal device is received, wherein the at least one application program is generated by the terminal device in response to an input selection operation on a test page in the test control.

[0049] In a possible implementation manner, the test module is specifically used for:

[0050] For any test instruction, control the electronic device to execute the test instruction and obtain the operation result corresponding to the test instruction;

[0051] According to the running result corresponding to each test instruction, the test result of the chip display performance is determined, and the test result at least includes the startup speed of each application, the sliding frame rate, the response speed of switching pages and the display frame rate corresponding to each application.

[0052] In a possible implementation manner, the acquisition module is specifically used to:

[0053] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0054] A test request sent by the terminal device is received, where the test request is generated by the terminal device in response to an input selection operation on a setting page in the test control.

[0055] In a possible implementation manner, the first determining module is specifically configured to:

[0056] According to the test request, the display parameters of each processor are adjusted to obtain the target display parameters of each processor;

[0057] Determining a target operating mode of at least one processor of the electronic device is that each processor operates under corresponding target display parameters.

[0058] In a possible implementation manner, the device further includes a storage module.

[0059] Wherein, the storage module is used for:

[0060] Get the preset storage path;

[0061] According to the preset storage path, the terminal device is controlled to store the test result.

[0062] In a third aspect, the present application provides a chip having a computer program stored thereon, wherein when the computer program is executed by the chip, the method as described in any one of the first aspects is implemented.

[0063] In a fourth aspect, the present application provides a chip module having a computer program stored thereon, and when the computer program is executed by the chip module, the method as described in any one of the first aspects is implemented.

[0064] In a fifth aspect, an embodiment of the present application provides an electronic device, including:

[0065] at least one processor; and

[0066] a memory communicatively connected to the at least one processor; wherein,

[0067] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can perform any method described in the first aspect.

[0068] In a sixth aspect, an embodiment of the present application provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to enable the computer to execute any one of the methods in the first aspect.

[0069] In a seventh aspect, an embodiment of the present application provides a computer program product, including a computer program, which implements any method in the first aspect when executed by a processor.

[0070] The chip display performance testing method, device and electronic device provided in the embodiments of the present application determine the virtual display screen corresponding to the chip, and test the display performance of the chip through a virtual reality screen. The virtual display screen can be applied to chips of various display specifications, avoiding the high cost and complexity of additional matching chips, and the test frame rate depends on the parameters of the physical screen and cannot be arbitrarily configured, thereby improving the flexibility of testing the display performance of the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] Figure 1 A schematic diagram of an application scenario provided by an embodiment of the present application;

[0072] Figure 2 A schematic diagram of a chip display performance testing method provided in an embodiment of the present application;

[0073] Figure 3 A schematic diagram of the process of obtaining a test request provided in an embodiment of the present application;

[0074] Figure 4 A schematic diagram of a flow chart of another chip display performance testing method provided in an embodiment of the present application;

[0075] Figure 5 A schematic diagram of a process for obtaining at least one application to be tested of an electronic device provided in an embodiment of the present application;

[0076] Figure 6 A schematic diagram of the architecture of an electronic device provided in an embodiment of the present application;

[0077] Figure 7 A schematic diagram of the process of chip display performance testing provided in an embodiment of the present application;

[0078] Figure 8 A schematic diagram of the structure of a chip display performance testing device provided in an embodiment of the present application;

[0079] Fig. 9 A schematic diagram of the structure of another chip display performance testing device provided in an embodiment of the present application;

[0080] Fig.10 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0081] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the present application. Instead, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0082] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0083] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant laws, regulations and standards, and provide corresponding operation entrances for users to choose to authorize or refuse.

[0084] For ease of understanding, below, combined Figure 1 , the application scenarios to which the embodiments of the present application are applicable are described.

[0085] Figure 1 This is a schematic diagram of an application scenario provided by an embodiment of the present application. Figure 1 , including an electronic device 101 and a display screen 102. The electronic device 101 may be a mobile phone, a tablet computer, a smart cockpit, etc., and a chip is provided in the electronic device 101. After determining the display specifications corresponding to the chip, if the display specifications of the display screen 102 do not match the display specifications of the chip, a dedicated FPGA or Serdes chip may be used to scale the display specifications of the display screen 102 so that the display specifications of the display screen 102 match the display specifications of the chip. The display performance of the chip in the electronic device 101 is tested through the display screen 102.

[0086] In the above process, the cost and complexity of the additional matching chip are high, and the test frame rate depends on the parameters of the physical screen and cannot be arbitrarily configured, resulting in low flexibility in testing the display performance of the chip.

[0087] In the embodiment of the present application, the virtual display screen corresponding to the chip can be determined, and the display performance of the chip can be tested through the virtual reality screen. The virtual display screen can be applied to chips of various display specifications, avoiding the high cost and complexity of additional matching chips, and the test frame rate depends on the parameters of the physical screen and cannot be arbitrarily configured, which improves the flexibility of testing the display performance of the chip.

[0088] The method shown in the present application is described below through specific embodiments. It should be noted that the following embodiments can exist independently or in combination with each other, and the same or similar contents will not be described repeatedly in different embodiments.

[0089] Figure 2 A schematic flow chart of a chip display performance testing method provided in an embodiment of the present application.

[0090] See also Figure 2 , the method may include:

[0091] S201. Obtain a test request.

[0092] The execution subject of the embodiment of the present application may be an electronic device, or a chip, a chip module, or a chip display performance test device set in the electronic device. The chip display performance test device may be implemented by software, or by a combination of software and hardware. The electronic device may be a mobile phone, a tablet computer, a vehicle-mounted terminal, etc.

[0093] The test request includes the resolution and refresh rate corresponding to the chip, and the chip is set in the electronic device. The interface of the display screen of the electronic device can be a display serial interface (DSI), a DisplayPort (DP) interface, a serial peripheral interface (SPI), a high-definition multimedia interface (HDMI), etc.

[0094] The electronic device can be plugged into the terminal device through the interface, so that the terminal device can establish a connection with the electronic device. The electronic device can be controlled by the automated testing tool in the terminal device to perform chip display performance testing. The user can set test requests, application scenarios, etc. through the automated testing tool in the terminal device, and obtain test results through the automated testing tool.

[0095] The terminal device may be a computer, the automated test tool may be an application, and the interface may be a Universal Serial Bus (USB) interface.

[0096] The test request can be obtained in the following manner: in response to the electronic device being plugged into the terminal device, a test control is displayed through the terminal device; and a test request sent by the terminal device is received, where the test request is generated by the terminal device in response to an input selection operation in the test control or setting page.

[0097] After the electronic device is plugged into the terminal device through the interface, the automated testing tool in the terminal device displays the test control, which may include an icon corresponding to the test page and an icon corresponding to the setting page. The user can click the icon corresponding to the test page in the test control, and the terminal device displays the setting page in response to the user's click operation. The user can determine the resolution and refresh rate corresponding to the chip in the setting page, and the terminal device generates a test request in response to the user's input selection operation. And send the test request to the electronic device. The electronic device receives the test request sent by the terminal device.

[0098] Next, combine Figure 3 , describes the process of obtaining a test request. Figure 3A schematic diagram of the process of obtaining a test request provided in an embodiment of the present application. Figure 3 , including interface 301 to interface 302. Interface 301 to interface 302 are pages provided by the terminal device. Please refer to interface 301. After the electronic device is plugged into the terminal device, the automated testing tool in the terminal device displays the test control. The test control may include an icon corresponding to the test page and an icon corresponding to the setting page. The user can click the icon corresponding to the test page in the test control, and the terminal device displays the test page in response to the user's click operation. The test page includes a drop-down selection menu corresponding to the chip, a drop-down selection menu corresponding to the resolution, a drop-down selection menu corresponding to the refresh rate, and a text input box.

[0099] Please refer to interface 302. The user determines that the chip is chip A of the electronic device in the drop-down selection menu corresponding to the chip, determines that the resolution is 2560×1440 pixels in the drop-down selection menu corresponding to the resolution, determines that the refresh rate is 144Hz in the drop-down selection menu corresponding to the refresh rate, and clicks the confirmation icon. The terminal device generates a test request in response to the user's input selection operation. The test request includes a resolution of 2560×1440 pixels and a refresh rate of 144Hz. The terminal device sends a test request to the electronic device.

[0100] S202: Determine a target operating mode of at least one processor of the electronic device according to the test request.

[0101] After receiving the test request, the electronic device determines that at least one processor in the electronic device and a process related to display performance are started, and determines a target operating mode of at least one processor of the electronic device according to the test request.

[0102] At least one processor of the electronic device can operate according to the resolution and refresh rate in the target operating mode.

[0103] The at least one processor may include a central processing unit (CPU), a graphics processing unit (GPU), a graphics signal processor (GSP) and a data processing unit (DPU).

[0104] For example, according to the above example, it is determined that the test request includes a resolution of 2560×1440 pixels and a refresh rate of 144Hz. After the electronic device receives the test request, it determines that the CPU, GPU, GSP, and DPU in the electronic device are turned on, and determines that the process related to display performance is turned on. The electronic device sets the operating mode of the CPU, GPU, GSP, and DPU to the target operating mode. In this way, the CPU, GPU, GSP, and DPU of the electronic device can operate at a resolution of 2560×1440 pixels and a refresh rate of 144Hz.

[0105] S203: Determine at least one test instruction and a virtual display screen corresponding to the chip.

[0106] At least one test instruction and a virtual display screen corresponding to the chip can be determined in the following manner: determine the device type of the electronic device; determine at least one test instruction based on the device type; determine the display driver framework corresponding to the chip, and determine the display driver framework as the virtual display screen.

[0107] The device type of the electronic device may be a general type, a game type, an audio and video type, a camera type, etc. The main application scenario corresponding to the chip in the electronic device may be determined according to the device type of the electronic device. Thus, at least one application program that needs to maintain high performance in the electronic device is determined, and at least one test instruction is determined according to the at least one application program.

[0108] The display driver framework is used to simulate display screens of various resolutions and refresh rates, and supports switching the display path with the IoT display screen.

[0109] The display driving framework may be set in advance and stored in a preset storage space of the electronic device.

[0110] For example, assuming that the device type of the electronic device is a game type, it can be determined that the main application scenario corresponding to the chip in the electronic device is a game scenario. Therefore, it is determined that at least one application program that needs to maintain high performance in the electronic device includes a game application program. According to the game application program, it is determined that at least one test instruction includes instructions A1 to A10.

[0111] S204: Test the virtual display screen according to at least one test instruction to obtain a test result of the chip display performance.

[0112] The test results of the chip display performance include at least the startup speed of each application, the sliding frame rate, the response speed of switching pages, and the display frame rate corresponding to each application.

[0113] The sliding frame rate is used to indicate the frame rate corresponding to the sliding operation of the user on the screen.

[0114] For example, according to the above example, it is determined that the CPU, GPU, GSP and DPU of the electronic device run at a resolution of 2560×1440 pixels and a refresh rate of 144Hz. Determine that at least one test instruction includes instructions A1 to A10. The electronic device can open game applications according to instructions A1 to A10, and enable the CPU, GPU, GSP and DPU of the electronic device to run game applications at a resolution of 2560×1440 pixels and a refresh rate of 144Hz. In this way, the virtual display screen is tested to obtain the test results of the chip display performance. The test results can be specifically shown in Table 1:

[0115] Table 1

[0116]

[0117]

[0118] After the electronic device obtains the test result, it can send the test result to the terminal device. The terminal device stores the test result. The user can obtain the test result in the terminal device and analyze it.

[0119] The chip display performance testing method provided in the embodiment of the present application obtains a test request. According to the test request, the target operating mode of at least one processor of the electronic device is determined. At least one test instruction and a virtual display screen corresponding to the chip are determined. According to at least one test instruction, the virtual display screen is tested to obtain a test result of the chip display performance. In the above process, the virtual display screen corresponding to the chip is determined, and the display performance of the chip is tested through a virtual reality screen. The virtual display screen can be applicable to chips of various display specifications, avoiding the high cost and complexity of additional matching chips, and the test frame rate depends on the parameters of the physical screen and cannot be arbitrarily configured, thereby improving the flexibility of testing the display performance of the chip.

[0120] Based on any of the above embodiments, Figure 4 , the detailed process of chip display performance testing is explained.

[0121] Figure 4 This is a flow chart of another chip display performance testing method provided in an embodiment of the present application. Figure 4 , the method comprising:

[0122] S401: Get a test request.

[0123] It should be noted that the execution process of S401 can refer to S201 and will not be repeated here.

[0124] S402: Determine a target operating mode of at least one processor of the electronic device according to the test request.

[0125] The target operating mode of at least one processor of the electronic device can be determined according to the test request in the following manner: according to the test request, the display parameters of each processor are adjusted to obtain the target display parameters of each processor; the target operating mode of at least one processor of the electronic device is determined so that each processor runs under the corresponding target display parameters.

[0126] For example, assume that the test request includes a resolution of 2560×1440 pixels and a refresh rate of 144Hz. A chip B is provided in the electronic device. After the electronic device receives the test request, it determines that the CPU, GPU, GSP and DPU in the electronic device are turned on, and determines that the process related to display performance is turned on. The electronic device determines the target display parameters of the CPU, GPU, GSP and DPU, and runs the CPU, GPU, GSP and DPU under the corresponding target display parameters, so that the operating mode of at least one processor of the electronic device is the target operating mode.

[0127] S403: Determine the device type of the electronic device.

[0128] The device type of the electronic device may be a general type, a game type, an audio and video type, a camera type, etc.

[0129] S404: Determine at least one test instruction according to the device type.

[0130] At least one test instruction can be determined according to the device type in the following manner: determine the application scenario of the electronic device according to the device type; obtain at least one application to be tested of the electronic device according to the application scenario; determine the running instructions of each application to obtain at least one test instruction.

[0131] At least one application to be tested for the electronic device can be obtained according to the application scenario in the following manner: in response to the electronic device being plugged into a terminal device, a test control is displayed through the terminal device; at least one application to be tested for the electronic device sent by the terminal device is received, and the at least one application is generated by the terminal device in response to an input selection operation in the test control or the test page.

[0132] For example, assuming that the device type of the electronic device is an audio and video type, it can be determined that the application scenarios of the electronic device include music scenarios and video scenarios.

[0133] After the electronic device is plugged into the terminal device, the test control can be displayed through the automated testing tool of the terminal device. The user clicks the icon corresponding to the test page in the test control, and the terminal device displays the test page in response to the user's click operation. The user can determine at least one application in the test page according to the application scenario. The terminal device determines at least one application to be tested by the electronic device in response to the user's input selection operation. And sends at least one application to be tested to the electronic device.

[0134] Next, combine Figure 5 , a process of obtaining at least one application to be tested on an electronic device is described. Figure 5 A schematic diagram of a process for obtaining at least one application to be tested of an electronic device provided in an embodiment of the present application. Figure 5 , including interface 501 to interface 502. Interface 501 to interface 502 may be pages provided by the terminal device. Referring to interface 501, after the electronic device is plugged into the terminal device, the test control can be displayed through the automated testing tool of the terminal device. The user clicks the icon corresponding to the test page in the test control, and the terminal device displays the test page in response to the user's click operation. The test page includes a drop-down selection menu corresponding to at least one application scenario, and a drop-down selection menu of at least one application corresponding to the application scenario.

[0135] Please refer to interface 502. The user determines that the application scenario is a music scene in the drop-down selection menu corresponding to application scenario 1, and determines that the applications corresponding to the music scene include application Y1 and application Y2 in the drop-down selection menu of the application corresponding to application scenario 1. In the drop-down selection menu corresponding to application scenario 2, the application scenario is determined to be a video scene, and in the drop-down selection menu of the application corresponding to application scenario 2, the applications corresponding to the video scene include application S1 and application S2, and clicks the OK icon. In response to the user's input selection operation, the terminal device determines at least one application to be tested by the electronic device, and sends at least one application to be tested to the electronic device. The at least one application to be tested received by the electronic device can be specifically as shown in Table 2:

[0136] Table 2

[0137]

[0138] Determine the running instruction of each application program to obtain at least one test instruction, which may be specifically shown in Table 3:

[0139] Table 3

[0140]

[0141] At least one application corresponding to the application scenario and the corresponding running instructions of the application can be set in advance, and the at least one application corresponding to the application scenario and the corresponding running instructions of the application can be stored in the preset storage space of the terminal device. In this way, after the user determines the application scenario, he can directly obtain the at least one application corresponding to the application scenario and the corresponding running instructions of the application.

[0142] S405 , determining a display driver framework corresponding to the chip, and determining the display driver framework as a virtual display screen.

[0143] Next, combine and Figure 6 , describing the architecture of an electronic device. Figure 6 This is a schematic diagram of the architecture of an electronic device provided in an embodiment of the present application. Figure 6 , including an electronic device 601. The electronic device 601 can be a mobile phone, a tablet computer, a vehicle-mounted terminal, etc. The electronic device 601 includes a memory, an automated test framework, a virtual screen software, a central processing unit, a graphics processor, a graphics signal processor, a data processor, and a multiplexer. Among them, the memory can be a double data rate (Double Data Rate, DDR) memory. The multiplexer is connected to the interfaces of the virtual screen and the physical display screen corresponding to the chip respectively. The virtual screen corresponding to the chip can be a display driver framework set by the user. The interface of the physical display screen can be DSI. In actual application, if the display specifications corresponding to the chip do not match the display specifications corresponding to the physical display screen, the multiplexer can be used to determine that the virtual screen corresponding to the chip is connected to the data processor, so that the electronic device 601 tests the display performance of the chip through the virtual screen corresponding to the chip.

[0144] S406: For any test instruction, control the electronic device to execute the test instruction and obtain the operation result corresponding to the test instruction.

[0145] For example, for instruction B1 shown in Table 3 above, instruction B1 can be to open application Y1. The electronic device is controlled to run instruction B1, and the running result corresponding to the test instruction is that application Y1 is successfully opened, and the startup speed of application Y1 is speed B1. According to this method, the electronic device is controlled to run each instruction shown in Table 3 above, and the running result corresponding to each test instruction is obtained.

[0146] S407: Determine the test result of the chip display performance according to the running result corresponding to each test instruction.

[0147] For example, the electronic device is controlled to run each test instruction shown in Table 3 above to obtain the operation result corresponding to each test instruction. According to the operation results of instructions B1 to B30, the test results of the chip display performance can be specifically shown in Table 4:

[0148] Table 4

[0149] Application Y1 startup speed Vb1 Application Y2 startup speed Vb2 Application S1 launch speed Vb3 Application S2 launch speed Vb4 Response speed of switching pages Vb Slide frame rate Frame rate 2 Display frame rate of application Y1 Frame rate 3 Display frame rate of application Y2 Frame rate 4 Display frame rate of application S1 Frame rate 8 Display frame rate of application S2 Frame rate 9

[0150] S408: Obtain a preset storage path.

[0151] A preset storage path may be set in advance, and the preset storage path may be stored in a preset storage space of the terminal device and / or the electronic device.

[0152] S409: Control the terminal device to store the test results according to the preset storage path.

[0153] For example, assuming that the preset storage path is storage path 1, after the electronic device obtains the test results shown in Table 4, it sends the test results shown in Table 4 to the terminal device. The terminal device stores the test results shown in Table 4 according to storage path 1.

[0154] The chip display performance testing method provided in the embodiment of the present application obtains a test request. According to the test request, the target operating mode of at least one processor of the electronic device is determined. According to the device type, at least one test instruction is determined. The display driver framework corresponding to the chip is determined, and the display driver framework is determined as a virtual display screen. For any test instruction, the electronic device is controlled to run the test instruction to obtain the running result corresponding to the test instruction. According to the running result corresponding to each test instruction, the test result of the chip display performance is determined. In the above process, the virtual display screen corresponding to the chip is determined, and the display performance of the chip is tested through a virtual reality screen. The virtual display screen can be applicable to chips of various display specifications, avoiding the high cost and complexity of additional matching chips, and the situation where the test frame rate cannot be arbitrarily configured, thereby improving the flexibility of testing the display performance of the chip.

[0155] Based on any of the above embodiments, Figure 7 , the process of chip display performance testing is illustrated by examples.

[0156] Figure 7 This is a schematic diagram of the process of chip display performance testing provided in the embodiment of the present application. Figure 7 , including an electronic device 701 and a terminal device 702. The electronic device 701 may be a mobile phone, a tablet computer, a vehicle-mounted terminal, etc. A chip is provided in the electronic device 701. The terminal device 702 may be a computer, and an automated testing tool is provided in the terminal device 702. The display performance of the chip of the electronic device 701 may be tested by the automated testing tool of the terminal device 702.

[0157] After the electronic device 701 is plugged into the terminal device 702 through the interface, the automated testing tool in the terminal device 702 displays the test control, which may include an icon corresponding to the test page and an icon corresponding to the setting page. The user can click the icon corresponding to the test page in the test control, and the terminal device 702 displays the setting page in response to the user's click operation. The user can determine the resolution and refresh rate corresponding to the chip in the setting page, and the terminal device 702 generates a test request in response to the user's input selection operation. And send the test request to the electronic device 701. The electronic device 701 receives the test request sent by the terminal device. The test request includes a resolution of 2560×1440 pixels and a refresh rate of 144Hz.

[0158] The electronic device 701 determines that at least one processor in the electronic device 701 and a process related to display performance are turned on. After receiving the test request, the electronic device 701 sets the working mode of the CPU, GPU, GSP and DPU to the target working mode. In this way, the CPU, GPU, GSP and DPU of the electronic device 701 can operate at a resolution of 2560×1440 pixels and a refresh rate of 144Hz. The electronic device 701 obtains the virtual display screen corresponding to the chip in the preset storage space. And it is determined that the device type of the electronic device 701 is a game type, then it can be determined that the application scenario of the electronic device 701 includes a game scenario.

[0159] The user can determine at least one application according to the application scenario in the test page of the terminal device 702. The terminal device 702 determines at least one application to be tested by the electronic device in response to the user's input selection operation. And sends at least one application to be tested to the electronic device 701, including application X1 and application X2. The electronic device 702 determines the running instructions of each application to obtain at least one test instruction, which can be specifically shown in Table 5:

[0160] Table 5

[0161]

[0162] The electronic device 701 is controlled to run at least one test instruction shown in Table 5 to obtain the operation results corresponding to instructions C1 to C5. According to the operation results corresponding to each test instruction, the test results of the chip display performance can be specifically shown in Table 6:

[0163] Table 6

[0164] Application X1 launch speed Vc1 App X2 launch speed Vc2 Response speed of switching pages Vc3 Slide frame rate Frame rate C Display frame rate of application X1 Frame rate C2 Display frame rate of application X2 Frame rate C1

[0165] The electronic device 701 sends the test results shown in Table 6 to the terminal device 702. After receiving the test results shown in Table 6, the terminal device 702 obtains a preset storage path and stores the test results shown in Table 6 according to the preset storage path.

[0166] The chip display performance test process provided in the embodiment of the present application obtains a test request. According to the test request, the target operating mode of at least one processor of the electronic device is determined. According to the device type, at least one test instruction is determined. The display driver framework corresponding to the chip is determined, and the display driver framework is determined as a virtual display screen. For any test instruction, the electronic device is controlled to run the test instruction to obtain the running result corresponding to the test instruction. According to the running result corresponding to each test instruction, the test result of the chip display performance is determined. In the above process, the virtual display screen corresponding to the chip is determined, and the display performance of the chip is tested through a virtual reality screen. The virtual display screen can be applicable to chips of various display specifications, avoiding the high cost and complexity of additional matching chips, and the situation where the test frame rate cannot be arbitrarily configured, thereby improving the flexibility of testing the display performance of the chip.

[0167] Figure 8 This is a schematic diagram of the structure of a chip display performance test device provided in an embodiment of the present application. The chip display performance test device can be a chip or a chip module. Figure 8 , the chip display performance testing device 10 may include:

[0168] An acquisition module 11 is used to acquire a test request, wherein the test request includes a resolution and a refresh rate of a display screen, and the display screen is provided in the electronic device;

[0169] A first determination module 12, configured to determine a target operating mode of at least one processor of the electronic device according to the test request;

[0170] A second determining module 13, used to determine at least one test instruction and a virtual display screen corresponding to the display screen;

[0171] The testing module 14 is used to test the virtual display screen according to the at least one testing instruction to obtain a testing result.

[0172] In a possible implementation manner, the second determining module 13 is specifically configured to:

[0173] determining a device type of the electronic device;

[0174] Determining the at least one test instruction according to the device type;

[0175] A display driver framework corresponding to the chip is determined, and the display driver framework is determined as the virtual display screen.

[0176] In a possible implementation manner, the second determining module 13 is specifically configured to:

[0177] Determining an application scenario of the electronic device according to the device type;

[0178] According to the application scenario, obtaining at least one application program to be tested of the electronic device;

[0179] The running instruction of each application program is determined to obtain the at least one test instruction.

[0180] In a possible implementation manner, the second determining module 13 is specifically configured to:

[0181] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0182] At least one application program to be tested by the electronic device and sent by the terminal device is received, wherein the at least one application program is generated by the terminal device in response to an input selection operation on a test page in the test control.

[0183] In a possible implementation manner, the testing module 14 is specifically used for:

[0184] For any test instruction, control the electronic device to execute the test instruction and obtain the operation result corresponding to the test instruction;

[0185] According to the running result corresponding to each test instruction, the test result of the chip display performance is determined, and the test result at least includes the startup speed of each application, the sliding frame rate, the response speed of switching pages and the display frame rate corresponding to each application.

[0186] In a possible implementation manner, the acquisition module 11 is specifically used for:

[0187] In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device;

[0188] A test request sent by the terminal device is received, where the test request is generated by the terminal device in response to an input selection operation on a setting page in the test control.

[0189] In a possible implementation manner, the first determining module 12 is specifically configured to:

[0190] According to the test request, the display parameters of each processor are adjusted to obtain the target display parameters of each processor;

[0191] Determining a target operating mode of at least one processor of the electronic device is that each processor operates under corresponding target display parameters.

[0192] The chip display performance testing device provided in the embodiment of the present application can execute the technical solution shown in the above method embodiment, and its implementation principle and beneficial effects are similar, which will not be repeated here.

[0193] Fig. 9 A schematic diagram of the structure of another chip display performance testing device provided in an embodiment of the present application. Figure 8 Based on the examples shown, see Fig. 9 The chip display performance testing device 10 also includes a storage module 15 .

[0194] Wherein, the storage module 15 is used for:

[0195] Get the preset storage path;

[0196] According to the preset storage path, the terminal device is controlled to store the test result.

[0197] The chip display performance testing device provided in the embodiment of the present application can execute the technical solution shown in the above method embodiment, and its implementation principle and beneficial effects are similar, which will not be repeated here.

[0198] Fig.10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Fig.10 The electronic device 20 may include: a memory 21 and a processor 22. Exemplarily, the memory 21 and the processor 22 are interconnected via a bus 23.

[0199] The memory 21 is used to store program instructions;

[0200] The processor 22 is used to execute the program instructions stored in the memory, so as to enable the electronic device 20 to execute the method shown in the above method embodiment.

[0201] The electronic device provided in the embodiment of the present application can execute the technical solution shown in the above method embodiment, and its implementation principle and beneficial effects are similar, which will not be repeated here.

[0202] An embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the above method.

[0203] The embodiment of the present application may also provide a computer program product, including a computer program, which can implement the above method when executed by a processor.

[0204] All or part of the steps of the above-mentioned method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a readable memory. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned memory (storage medium) includes: read-only memory (ROM), random access memory (RAM), flash memory, hard disk, solid state drive, magnetic tape, floppy disk, optical disc and any combination thereof.

[0205] The embodiments of the present application are described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processing unit of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processing unit of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0206] These computer program instructions may also be stored in a computer readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0207] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0208] Obviously, those skilled in the art can make various changes and modifications to the embodiments of the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the embodiments of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

[0209] In the present application, the term "include" and its variations may refer to non-restrictive inclusion; the term "or" and its variations may refer to "and / or". The terms "first", "second", etc. in the present application are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. In the present application, "plurality" refers to two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B may mean: A exists alone, A and B exist at the same time, and B exists alone. The character " / " generally indicates that the previously associated objects are in an "or" relationship.

Claims

1. A chip display performance testing method, characterized in that: include: Obtaining a test request, the test request including a resolution and a refresh rate corresponding to a chip, the chip being arranged in an electronic device; Determining a target operating mode of at least one processor of the electronic device according to the test request; Determining at least one test instruction and a virtual display screen corresponding to the chip; The virtual display screen is tested according to the at least one test instruction to obtain a test result of the chip display performance.

2. The method according to claim 1, characterized in that Determining at least one test instruction and a virtual display screen corresponding to the chip includes: determining a device type of the electronic device; Determining the at least one test instruction according to the device type; A display driver framework corresponding to the chip is determined, and the display driver framework is determined as the virtual display screen.

3. The method according to claim 2, characterized in that Determining the at least one test instruction according to the device type includes: Determining an application scenario of the electronic device according to the device type; According to the application scenario, obtaining at least one application program to be tested of the electronic device; The running instruction of each application program is determined to obtain the at least one test instruction.

4. The method according to claim 3, characterized in that According to the application scenario, obtaining at least one application program to be tested of the electronic device includes: In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device; At least one application program to be tested by the electronic device and sent by the terminal device is received, wherein the at least one application program is generated by the terminal device in response to an input selection operation on a test page in the test control.

5. The method according to any one of claims 1 to 4, characterized in that: Testing the virtual display screen according to the at least one test instruction to obtain a test result of the chip display performance includes: For any test instruction, control the electronic device to execute the test instruction and obtain the operation result corresponding to the test instruction; According to the running result corresponding to each test instruction, the test result of the chip display performance is determined, and the test result at least includes the startup speed of each application, the sliding frame rate, the response speed of switching pages and the display frame rate corresponding to each application.

6. The method according to any one of claims 1 to 5, characterized in that: Get a test request, including: In response to the electronic device being plugged into a terminal device, displaying a test control via the terminal device; A test request sent by the terminal device is received, where the test request is generated by the terminal device in response to an input selection operation on a setting page in the test control.

7. The method according to any one of claims 1 to 6, characterized in that: Determining, according to the test request, a target operating mode of at least one processor of the electronic device, comprising: According to the test request, the display parameters of each processor are adjusted to obtain the target display parameters of each processor; Determining a target operating mode of at least one processor of the electronic device is that each processor operates under corresponding target display parameters.

8. The method according to any one of claims 1 to 7, characterized in that: The method further comprises: Get the preset storage path; According to the preset storage path, the terminal device is controlled to store the test result.

9. A chip display performance testing device, characterized in that: The device comprises: An acquisition module, used to acquire a test request, wherein the test request includes a resolution and a refresh rate of a display screen, and the display screen is provided in the electronic device; A first determining module, configured to determine a target operating mode of at least one processor of the electronic device according to the test request; A second determination module, used to determine at least one test instruction and a virtual display screen corresponding to the display screen; The testing module is used to test the virtual display screen according to the at least one testing instruction to obtain a testing result.

10. An electronic device, characterized in that: include: at least one processor; as well as a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 1 to 8.

11. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: in, The computer instructions are used to make a computer execute the method according to any one of claims 1 to 8.

12. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the method according to any one of claims 1 to 8 is implemented.

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