UFS-based automatic temperature regulation test method and system, and computer equipment

Abstract

The invention relates to an automatic temperature adjustment test method and system based on UFS, computer equipment and a storage medium. The method comprises the steps that a PC end executes a program, initializes a PCI can card and sets the first temperature of a UFS test incubator; whether the temperature of the current UFS test incubator reaches the first temperature or not is detected, and if the temperature reaches the first temperature, a UFS test instruction is sent to a UFS burn-in board through a PCI can card; the UFS burn-in board obtains a UFS test instruction sent by the PC end and starts to execute the UFS burn-in test of the corresponding stage, and after all UFS complete the UFS burn-in test of the corresponding stage, a test result is returned to the PC end; and after the PC terminal obtains the test result, the temperature of the UFS test incubator is set as the second temperature, and the steps of detecting the temperature and sending the test instruction are repeatedly executed until all the aging test tasks are completed. According to the invention, the batch test efficiency of UFS can be effectively improved, and the test human input is reduced.

Description

Technical Field

[0001] The present invention relates to the field of UFS testing technology, and in particular to an automatic temperature adjustment testing method, system, computer equipment and storage medium based on UFS. Background Art

[0002] UFS (Universal Flash Storage) flash memory is a high-speed storage technology, commonly used for memory storage in mobile devices such as mobile phones and tablets. Its transmission speed can reach hundreds of megabytes per second, greatly improving the read and write performance of storage devices. The characteristic of UFS flash memory is that it can support both sequential read and write and random read and write, making it more efficient when processing large amounts of data.

[0003] At present, there may be one hundred UFSs undergoing aging tests simultaneously on a UFS aging test board, and the temperature of the incubator is set differently in multiple test stages of the aging test. However, in the traditional UFS test process, the temperature of the incubator is usually controlled manually, and it is necessary to check the indicator lights of the test aging board regularly and manually adjust the temperature of the incubator according to the actual test situation. It can be seen that the traditional UFS test has a low degree of automation, is time-consuming, labor-intensive, and has low test efficiency, especially when UFS is tested in batches, its shortcomings are further magnified. Summary of the invention

[0004] Based on this, it is necessary to provide an automatic temperature control test method, system, computer equipment and storage medium based on UFS to address the above technical problems.

[0005] An automatic temperature adjustment test method based on UFS, the method comprising:

[0006] The PC executes the program to initialize the PCI can card and set the first temperature of the UFS test oven;

[0007] Detect whether the temperature of the current UFS test oven reaches the first temperature, and if it has reached the first temperature, send a UFS test instruction to the UFS aging board through the PCI can card;

[0008] The UFS aging board obtains the UFS test instruction sent by the PC and starts to execute the corresponding stage of the UFS aging test. When all UFSs complete the corresponding stage of the UFS aging test, the test results are returned to the PC.

[0009] After the PC obtains the test results, the temperature of the UFS test oven is set to the second temperature and the steps of detecting the temperature and sending the test instructions are repeated until all aging test tasks are completed.

[0010] In one embodiment, the method further comprises:

[0011] The program on the PC is compiled by using VisualStudio to generate an exe program and then executed;

[0012] The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

[0013] In one embodiment, the method further comprises:

[0014] Burn the MCU firmware compiled by using Keil into the UFS aging board and run it;

[0015] The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

[0016] In one embodiment, the step of executing a program on the PC side to initialize the PCI can card and set the first temperature of the UFS test oven further includes:

[0017] Check whether the PC has successfully communicated with the UFS aging board. If not, prompt the user to check the connection.

[0018] An automatic temperature control test system based on UFS, the system comprising:

[0019] An initialization setting module, wherein the initialization setting module is used for executing a program on a PC side to initialize a PCI can card and set a first temperature of a UFS test oven;

[0020] A temperature detection module, the temperature detection module is used to detect whether the temperature of the current UFS test oven has reached the first temperature, and if it has reached the first temperature, send a UFS test instruction to the UFS aging board through the PCI can card;

[0021] A test module, wherein the test module is used for the UFS aging board to obtain the UFS test instruction sent by the PC and start to execute the UFS aging test of the corresponding stage, and return the test result to the PC after all UFSs complete the UFS aging test of the corresponding stage;

[0022] The temperature regulating module is used to set the temperature of the UFS test oven to a second temperature after the PC obtains the test results and repeat the steps of detecting the temperature and sending the test instructions until all aging test tasks are completed.

[0023] In one embodiment, in the system:

[0024] The program on the PC is compiled by using VisualStudio to generate an exe program and then executed;

[0025] The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

[0026] In one embodiment, in the system:

[0027] Burn the MCU firmware compiled by using Keil into the UFS aging board and run it;

[0028] The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

[0029] In one embodiment, the system further comprises:

[0030] The communication check module is used to check whether the PC has successfully communicated with the UFS aging board, and if not, prompt the user to check the connection.

[0031] A computer device comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of any one of the above methods when executing the computer program.

[0032] A computer-readable storage medium stores a computer program, wherein the computer program implements the steps of any one of the above methods when executed by a processor.

[0033] The above-mentioned automatic temperature adjustment test method, system, computer equipment and storage medium based on UFS execute the program through the PC end, initialize the PCI can card and set the first temperature of the UFS test incubator; detect whether the temperature of the current UFS test incubator has reached the first temperature, and if it has reached the first temperature, send the UFS test instruction to the UFS aging board through the PCI can card; the UFS aging board obtains the UFS test instruction sent by the PC end and starts to execute the UFS aging test of the corresponding stage, and returns the test result to the PC end when all UFS complete the UFS aging test of the corresponding stage; after the PC end obtains the test result, the temperature of the UFS test incubator is set to the second temperature and the steps of detecting the temperature and sending the test instruction are repeated until all aging test tasks are completed. In the present invention, by automatically adjusting the temperature on the PC end, the batch test efficiency for UFS can be effectively improved, the test manpower input can be reduced, the automation degree of UFS aging test can be improved, and unnecessary manpower and material costs can be saved. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 1 is a flow chart of an automatic temperature control test method based on UFS in one embodiment;

[0035] Figure 2 A schematic diagram of a test scenario of an automatic temperature adjustment test based on UFS in one embodiment;

[0036] Figure 3 is a flow chart of an automatic temperature control test method based on UFS in another embodiment;

[0037] Figure 4 is a structural block diagram of an automatic temperature control test system based on UFS in one embodiment;

[0038] Figure 5 It is a structural block diagram of an automatic temperature control test system based on UFS in another embodiment;

[0039] Figure 6 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0040] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0041] In one embodiment, Figure 1 As shown, a UFS-based automatic temperature adjustment test method is provided, the method comprising:

[0042] Step 102, the PC executes a program to initialize the PCI can card and set the first temperature of the UFS test oven;

[0043] Step 104, detecting whether the temperature of the current UFS test oven has reached the first temperature, and if it has reached the first temperature, sending a UFS test instruction to the UFS aging board through the PCI can card;

[0044] Step 106, the UFS aging board obtains the UFS test instruction sent by the PC and starts to execute the UFS aging test of the corresponding stage, and returns the test result to the PC after all UFSs complete the UFS aging test of the corresponding stage;

[0045] Step 108, after the PC obtains the test result, the temperature of the UFS test oven is set to the second temperature and the steps of detecting the temperature and sending the test instruction are repeated until all aging test tasks are completed.

[0046] In this embodiment, an automatic temperature adjustment test method based on UFS is provided, in which keil is used to write the power-off board program, and VisualStudio is used to write the PC-side main program: wherein the PC-side control program sends instruction codes through UART to adjust the temperature of the incubator and obtain various information of the incubator; drives the PCI can card to communicate with the UFS aging board; and displays the real-time progress of the test. The aging board single-chip computer program communicates data with the PCI can card through the can bus; provides the UFS power supply voltage adjustment function; and GPIO simulates UART to communicate data with UFS.

[0047] The test scenario of this method is as follows Figure 2 As shown, it is specifically used for automatic aging test of UFS. One hundred UFS are tested simultaneously on the aging test board, and the temperature of the incubator is set differently in multiple test stages of the aging test. Each UFS has a different test speed, and the program is used to uniformly manage and summarize the test progress and transmit it to the PC, which then automatically adjusts the temperature of the incubator according to the specific situation.

[0048] Application method: Use VisualStudio to compile the program and generate an exe, then execute the program. Burn the MCU firmware compiled by Keil into the aging board for operation. The aging board is connected to the can card of the PCI slot on the PC side and placed in a thermostat for aging test. During the aging test, the aging board will collect one hundred UFS test results and feed them back to the PC program. The PC program selects different ambient temperatures according to the test stage and sets them to the thermostat, thereby achieving the purpose of automatically adjusting the thermostat temperature. The UFS automatic temperature control test system uses the microcontroller program and the PC program to automatically adjust the thermostat temperature.

[0049] In one embodiment, the step of executing a program on the PC to initialize the PCI can card and set the first temperature of the UFS test oven also includes: checking whether the PC has successfully communicated with the UFS aging board, and if not, prompting the user to check the connection.

[0050] Specifically, please refer to Figure 3 The flowchart of the automatic temperature control test method based on UFS is shown. After initializing the PCI can card, first check whether the PC end successfully communicates with the UFS aging board. If not, prompt the user to check the connection.

[0051] After successful communication, the PC program sets the temperature of the incubator to temperature 1. When the incubator reaches temperature 1, it sends instructions to the aging board through the PCI can card. The aging board starts the aging test of UFS stage 1. When all UFS stage 1 aging tests are completed, the aging board feeds back the test results to the PC program. The PC sets the temperature to temperature 2. When the incubator reaches temperature 2, it sends instructions to the aging board again. The aging board starts the aging test of UFS stage 2. When all UFS stage 2 aging tests are completed, the aging board feeds back the test results to the PC, and the cycle continues until all aging tests are completed.

[0052] In the above embodiment, the program is executed on the PC side to initialize the PCI can card and set the first temperature of the UFS test oven; it is detected whether the temperature of the current UFS test oven has reached the first temperature, and if it has reached the first temperature, the UFS test instruction is sent to the UFS aging board through the PCI can card; the UFS aging board obtains the UFS test instruction sent by the PC side and starts to execute the corresponding stage of the UFS aging test, and returns the test result to the PC side after all UFS complete the corresponding stage of the UFS aging test; after the PC side obtains the test result, the temperature of the UFS test oven is set to the second temperature and the steps of detecting the temperature and sending the test instruction are repeated until all aging test tasks are completed. In the present invention, by automatically adjusting the temperature on the PC side, the batch test efficiency for UFS can be effectively improved, the test manpower input can be reduced, the automation degree of UFS aging test can be improved, and unnecessary manpower and material costs can be saved.

[0053] In one embodiment, the method further comprises:

[0054] The program on the PC is compiled by using VisualStudio to generate an exe program and then executed;

[0055] The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

[0056] In one embodiment, the method further comprises:

[0057] Burn the MCU firmware compiled by using Keil into the UFS aging board and run it;

[0058] The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

[0059] In this embodiment, a UFS-based automatic temperature adjustment test method is provided, and the specific implementation steps are as follows:

[0060] 1. Prepare the Windows development tool VisualStudio and the MCU development tool KEIL.

[0061] 2. Write a Windows layout interface program to display basic information such as the test phase, the current ambient temperature of the incubator, the current set temperature, etc.

[0062] 3. Write PCI can card interface program for Windows, such as initialization, handshake program with aging board, etc.

[0063] 4. Write a program for Windows to communicate with the thermostat, such as setting the thermostat temperature, obtaining the thermostat ambient temperature, etc.

[0064] 5. Write the MCU program, power the UFS, and simulate the UART communication interface program with the UFS through GPIO.

[0065] 6. Write the MCU program and the communication program with the PCI can card.

[0066] Write the logic program of the automatic temperature control system. The PC sets the temperature of the incubator according to the temperature corresponding to the test stage. When the ambient temperature reaches the requirement, the aging board is notified to pass the test operation stage to the UFS. The aging board continuously collects the UFS aging results. When the results meet the requirements, the results are sent to the PC program for the next stage of testing until the test is completed.

[0067] In this embodiment, batch UFS aging tests can be performed through the cooperation between automated programs. The entire test does not require manual monitoring and temperature adjustment, which ensures test reliability and greatly improves batch test efficiency.

[0068] It should be understood that although Figure 1-Figure 3 The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 1-Figure 3 At least part of the steps may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily executed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be executed in turn or alternately with other steps or at least part of the sub-steps or stages of other steps.

[0069] In one embodiment, Figure 4 As shown, a UFS-based automatic temperature control test system 400 is provided, the system comprising:

[0070] An initialization setting module 401, wherein the initialization setting module is used for executing a program on a PC side to initialize a PCI can card and set a first temperature of a UFS test oven;

[0071] A temperature detection module 402, the temperature detection module is used to detect whether the temperature of the current UFS test oven has reached the first temperature, and if it has reached the first temperature, send a UFS test instruction to the UFS aging board through the PCI can card;

[0072] Testing module 403, the testing module is used for the UFS aging board to obtain the UFS test instruction sent by the PC and start to execute the UFS aging test of the corresponding stage, and return the test result to the PC after all UFSs complete the UFS aging test of the corresponding stage;

[0073] The temperature adjustment module 404 is used to set the temperature of the UFS test oven to a second temperature after the PC obtains the test results and repeat the steps of detecting the temperature and sending the test instructions until all aging test tasks are completed.

[0074] In one embodiment, in the system:

[0075] The program on the PC is compiled by using VisualStudio to generate an exe program and then executed;

[0076] The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

[0077] In one embodiment, in the system:

[0078] Burn the MCU firmware compiled by using Keil into the UFS aging board and run it;

[0079] The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

[0080] In one embodiment, Figure 5 As shown, a UFS-based automatic temperature control test system 400 is provided, the system also includes:

[0081] The communication checking module 405 is used to check whether the PC has successfully communicated with the UFS aging board, and if not, prompt the user to check the connection.

[0082] For the specific limitations of the automatic temperature control test system based on UFS, please refer to the limitations of the automatic temperature control test method based on UFS above, which will not be repeated here.

[0083] In one embodiment, a computer device is provided, whose internal structure diagram can be as follows: Figure 6 As shown. The computer device includes a processor, a memory and a network interface connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, an automatic temperature control test method based on UFS is implemented.

[0084] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0085] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps in the above method embodiments when executing the computer program.

[0086] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0087] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in the present application can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0088] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0089] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. An automatic temperature adjustment test method based on UFS, the method comprising: The PC executes the program to initialize the PCI can card and set the first temperature of the UFS test oven; Detect whether the temperature of the current UFS test oven reaches the first temperature, and if it has reached the first temperature, send a UFS test instruction to the UFS aging board through the PCIcan card; The UFS aging board obtains the UFS test instruction sent by the PC and starts to execute the corresponding stage of the UFS aging test. When all UFSs complete the corresponding stage of the UFS aging test, the test results are returned to the PC. After the PC obtains the test results, the temperature of the UFS test oven is set to the second temperature and the steps of detecting the temperature and sending the test instructions are repeated until all aging test tasks are completed.

2. The automatic temperature control test method based on UFS according to claim 1, characterized in that: The method further comprises: The program on the PC is compiled by using VisualStudio to generate an exe program and then executed; The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

3. The automatic temperature control test method based on UFS according to claim 2, characterized in that: The method further comprises: Burn the MCU firmware compiled by using Keil into the UFS aging board and run it; The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

4. The automatic temperature control test method based on UFS according to any one of claims 1 to 3, characterized in that: The step of executing a program on the PC end to initialize the PCI can card and set the first temperature of the UFS test oven also includes: Check whether the PC has successfully communicated with the UFS aging board. If not, prompt the user to check the connection.

5. An automatic temperature control test system based on UFS, characterized in that: The system comprises: An initialization setting module, wherein the initialization setting module is used for executing a program on a PC side to initialize a PCI can card and set a first temperature of a UFS test oven; A temperature detection module, the temperature detection module is used to detect whether the temperature of the current UFS test oven has reached the first temperature, and if it has reached the first temperature, send a UFS test instruction to the UFS aging board through the PCI can card; A test module, wherein the test module is used for the UFS aging board to obtain the UFS test instruction sent by the PC and start to execute the UFS aging test of the corresponding stage, and return the test result to the PC after all UFSs complete the UFS aging test of the corresponding stage; The temperature regulating module is used to set the temperature of the UFS test oven to a second temperature after the PC obtains the test results and repeat the steps of detecting the temperature and sending the test instructions until all aging test tasks are completed.

6. The automatic temperature control test system based on UFS according to claim 5, characterized in that: In the system described: The program on the PC is compiled by using VisualStudio to generate an exe program and then executed; The PC sends command codes through UART to adjust the temperature of the incubator and obtain information about the incubator, drives the PCI can card to communicate with the UFS aging board and displays the real-time progress of the test.

7. The automatic temperature control test system based on UFS according to claim 6, characterized in that: In the system described: Burn the MCU firmware compiled by using Keil into the UFS aging board and run it; The UFS aging board communicates data with the PCI CAN card through the CAN bus, provides UFS power supply voltage regulation function, and GPIO simulates UART to communicate data with UFS.

8. The automatic temperature control test system based on UFS according to any one of claims 5 to 7, characterized in that: The system further comprises: The communication check module is used to check whether the PC has successfully communicated with the UFS aging board, and if not, prompt the user to check the connection.

9. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

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