Multi-channel automatic test system and method for electromagnetic pin

Abstract

The invention provides a multichannel automatic test system and method for an electromagnetic pin, and the system comprises a test bench, and is characterized in that the test bench is internally provided with a test circuit, the test circuit comprises a voltage-stabilized power supply module, and the voltage-stabilized power supply module provides an unlocking power supply and a feedback power supply; the unlocking power supply is connected with the electromagnetic pin test unit through the switch and the current and voltage sensor. The feedback power supply is connected with the electromagnetic pin test unit through the current sensor and the switch. An AD acquisition card of the industrial personal computer is connected with the current and voltage sensor and the current sensor, and the AD acquisition card also acquires a feedback voltage signal of the electromagnetic pin test unit; and a digital quantity output card of the industrial personal computer is connected with the switch. The system can test a plurality of electromagnetic pins at a time, and is short in time consumption and high in efficiency. The industrial personal computer can automatically collect voltage signals and current signals, a manual recording mode is avoided, the operation is simple, and the operation difficulty is reduced.

Description

Technical Field

[0001] The invention relates to a multi-channel automatic testing system and method for an electromagnetic pin, belonging to the technical field of electromagnetic pin testing. Background Art

[0002] The servo system plays an important role in the flight process of the aircraft. The electromagnetic pin is an important component of the servo system for braking and unlocking. When receiving the locking command, the control board disconnects the unlocking voltage, the electromagnetic pin locks, the pin shaft magnet moves away from the Hall circuit, and outputs a locking low-level signal. When it receives the unlocking command, the control board outputs the unlocking voltage, the electromagnetic pin moves, and after the pin shaft moves in place, the Hall circuit detects the magnetic field of the magnet and outputs a high-level voltage signal of unlocking in place. Therefore, the unlocking voltage, unlocking time, and unlocking force are important technical indicators for testing the electromagnetic pin when it is powered on. These technical indicators are related to whether the electromagnetic pin can work normally. The current method for testing the technical indicators of the electromagnetic pin requires a power supply, a digital multimeter, an oscilloscope and other instruments to manually operate the test in actual application, and only one electromagnetic pin can be tested at a time, and the instrument test data is manually recorded. With this test method, after the test, it is also necessary to manually calculate the unlocking time and other related technical indicators, and finally fill in the report manually. This test method has high requirements for operators, and the entire test time is time-consuming and inefficient. Summary of the invention

[0003] In order to solve the above technical problems, the present invention provides a multi-channel automated testing system and method for electromagnetic pins, which can test multiple electromagnetic pins at a time, is simple to operate, has a high degree of automation, can automatically determine whether the tested product is qualified, and automatically generate a test conclusion in the test report.

[0004] The present invention is achieved through the following technical solutions.

[0005] The present invention provides a multi-channel automatic test system for an electromagnetic pin, comprising a test bench, wherein a test circuit is installed in the test bench, wherein the test circuit comprises a voltage-stabilized power supply module, wherein the voltage-stabilized power supply module respectively provides an unlocking power supply and a feedback power supply, wherein the unlocking power supply is connected to an electromagnetic pin test unit via a switch and a current and voltage sensor, and the feedback power supply is connected to the electromagnetic pin test unit via a current sensor and a switch; an industrial computer is also included, wherein an AD acquisition card of the industrial computer is connected to the current and voltage sensor and the current sensor, and the AD acquisition card also acquires a feedback voltage signal of the electromagnetic pin test unit; and a digital quantity output card of the industrial computer is connected to the switch.

[0006] There are 8 to 12 electromagnetic pin test units, and each electromagnetic pin test unit is correspondingly connected to an unlocking power supply and a feedback power supply.

[0007] The electromagnetic pin test unit is connected to a test power supply separately, and the test power supply is connected to the electromagnetic pin test unit after passing through a switch and a current sensor. The switch is connected to a digital quantity output card, and the current sensor is connected to an AD acquisition card.

[0008] A method adopted by a multi-channel automatic test system for an electromagnetic pin as claimed in the claim, wherein the electromagnetic pin is installed in an electromagnetic pin test unit, an unlocking power supply provides a 28V to 60V unlocking power supply for the electromagnetic pin, a feedback power supply provides a 5V feedback power supply for the electromagnetic pin, a digital output card of an industrial computer controls the on-off of each switch, thereby realizing on-off control of the power supply to the electromagnetic pin unlocking circuit and the feedback circuit, and then the electromagnetic pin is tested, and during the test, an AD acquisition card of the industrial computer acquires current and voltage parameters of the electromagnetic pin.

[0009] The specific steps are as follows: Step 1: The industrial computer sends an unlocking power on-off control command, and the switches of multiple unlocking power supplies are turned on and off at the same time to test the electromagnetic pin. The test includes no-load test, load test, high and low temperature test and vibration test; Step 2: The AD acquisition card collects the unlocking circuit of the electromagnetic pin, the power supply voltage signal and current signal of the feedback circuit, and the output signal of the feedback circuit through the current and voltage sensor, and receives, displays and stores the collected data; Step 3: The industrial computer generates a test report for each product under test based on the test report format and technical indicators given by the user, compares the measured value of each parameter item with the technical indicator of the parameter item, determines whether the product under test is qualified, and automatically generates a test conclusion in the test report.

[0010] During no-load test and load test, individual electromagnetic pins are tested in turn in a polling manner.

[0011] During high and low temperature tests and vibration tests, all electromagnetic pins are tested at the same time.

[0012] The beneficial effects of the present invention are: the system can test multiple electromagnetic pins at one time, and the test data is automatically recorded and reported by the industrial computer, which is time-saving and efficient. The industrial computer can automatically collect and monitor the unlocking circuit of the electromagnetic pin, the power supply voltage signal and current signal of the feedback circuit, and the output signal of the feedback circuit, avoiding the manual recording method, and the operation is simple and reduces the difficulty of operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural schematic diagram of the present invention. DETAILED DESCRIPTION

[0014] The technical solution of the present invention is further described below, but the scope of protection claimed is not limited to the description. Example

[0015] A multi-channel automatic test system for electromagnetic pins includes a test bench, a test circuit is installed in the test bench, and the test circuit includes a voltage-stabilized power supply module, which provides an unlocking power supply and a feedback power supply respectively. The unlocking power supply is connected to an electromagnetic pin test unit through a switch and a current and voltage sensor, and the feedback power supply is connected to the electromagnetic pin test unit through a current sensor and a switch; it also includes an industrial computer, an AD acquisition card of the industrial computer is connected to the current and voltage sensor and the current sensor, and the AD acquisition card also acquires the feedback voltage signal of the electromagnetic pin test unit; and a digital quantity output card of the industrial computer is connected to the switch. The principle of the electromagnetic pin test unit is the same as the existing test method. The industrial computer is also connected to a display, a keyboard, a mouse and a printer. The voltage-stabilized power supply module and the industrial computer are respectively connected to a 220V power supply.

[0016] There are 8 to 12 electromagnetic pin test units, and each electromagnetic pin test unit is correspondingly connected to an unlocking power supply and a feedback power supply.

[0017] The electromagnetic pin test unit is connected to a test power supply separately, and the test power supply is connected to the electromagnetic pin test unit after passing through a switch and a current sensor. The switch is connected to a digital quantity output card, and the current sensor is connected to an AD acquisition card.

[0018] A method adopted by a multi-channel automatic test system for an electromagnetic pin as claimed in the claim, wherein the electromagnetic pin is installed in an electromagnetic pin test unit, an unlocking power supply provides a 28V to 60V unlocking power supply for the electromagnetic pin, a feedback power supply provides a 5V feedback power supply for the electromagnetic pin, a digital output card of an industrial computer controls the on-off of each switch, thereby realizing on-off control of the power supply to the electromagnetic pin unlocking circuit and the feedback circuit, and then the electromagnetic pin is tested, and during the test, an AD acquisition card of the industrial computer acquires current and voltage parameters of the electromagnetic pin.

[0019] The specific steps are as follows: Step 1, the industrial computer sends an unlocking power on-off control instruction, and the switches of multiple unlocking power supplies are turned on and off at the same time to test the electromagnetic pin. The test includes no-load test, load test, high and low temperature test and vibration test; the no-load test, load test, high and low temperature test and vibration test methods are the same as the prior art.

[0020] Step 2: The AD acquisition card collects the unlocking circuit of the electromagnetic pin, the power supply voltage signal and current signal of the feedback circuit, and the output signal of the feedback circuit through the current and voltage sensor, and receives, displays and stores the collected data; Step 3: The industrial computer generates a test report for each product under test based on the test report format and technical indicators given by the user, compares the measured value of each parameter item with the technical indicator of the parameter item, determines whether the product under test is qualified, and automatically generates a test conclusion in the test report.

[0021] During no-load test and load test, individual electromagnetic pins are tested in turn in a polling manner.

[0022] During high and low temperature tests and vibration tests, all electromagnetic pins are tested at the same time. Example

[0023] A multi-channel automatic test system for an electromagnetic pin comprises a test bench, wherein a test circuit is installed in the test bench, wherein the test circuit comprises a voltage-stabilized power supply module, wherein the voltage-stabilized power supply module provides an unlocking power supply and a feedback power supply respectively, wherein the unlocking power supply is connected to an electromagnetic pin test unit via a switch and a current and voltage sensor, and the feedback power supply is connected to the electromagnetic pin test unit via a current sensor and a switch; an industrial computer is also included, wherein an AD acquisition card of the industrial computer is connected to the current and voltage sensor and the current sensor, and the AD acquisition card also acquires a feedback voltage signal of the electromagnetic pin test unit; and a digital quantity output card of the industrial computer is connected to the switch.

[0024] There are 10 electromagnetic pin test units, and each electromagnetic pin test unit is correspondingly connected to an unlocking power supply and a feedback power supply.

[0025] The electromagnetic pin test unit is connected to a test power supply separately, and the test power supply is connected to the electromagnetic pin test unit after passing through a switch and a current sensor. The switch is connected to a digital quantity output card, and the current sensor is connected to an AD acquisition card.

[0026] The test process is the same as in Example 1.

Claims

1. A multi-channel automatic test system for electromagnetic pins, comprising a test bench, characterized in that: The test bench is equipped with a test circuit, which includes a voltage-stabilized power supply module, which provides an unlocking power supply and a feedback power supply respectively. The unlocking power supply is connected to the electromagnetic pin test unit through a switch and a current and voltage sensor, and the feedback power supply is connected to the electromagnetic pin test unit through a current sensor and a switch; it also includes an industrial computer, and the AD acquisition card of the industrial computer is connected to the current and voltage sensors and the current sensor. The AD acquisition card also acquires the feedback voltage signal of the electromagnetic pin test unit; the digital output card of the industrial computer is connected to the switch.

2. The multi-channel automatic testing system for electromagnetic pins according to claim 1, characterized in that: There are 8 to 12 electromagnetic pin test units, and each electromagnetic pin test unit is correspondingly connected to an unlocking power supply and a feedback power supply.

3. The multi-channel automatic testing system for electromagnetic pins according to claim 1, characterized in that: The electromagnetic pin test unit is connected to a test power supply separately, and the test power supply is connected to the electromagnetic pin test unit after passing through a switch and a current sensor. The switch is connected to a digital quantity output card, and the current sensor is connected to an AD acquisition card.

4. A method used in a multi-channel automated testing system for electromagnetic pins as claimed in claims 1 to 3, characterized in that: The electromagnetic pin is installed in the electromagnetic pin test unit. The unlocking power supply provides 28V~60V unlocking power for the electromagnetic pin, and the feedback power supply provides 5V feedback power for the electromagnetic pin. The digital output card of the industrial computer controls the on-off of each switch, thereby realizing the on-off control of the power supply to the electromagnetic pin unlocking circuit and the feedback circuit. Then the electromagnetic pin is tested. During the test, the AD acquisition card of the industrial computer collects the current and voltage parameters of the electromagnetic pin.

5. The multi-channel automated testing method for electromagnetic pins according to claim 4, characterized in that: The specific steps are as follows: Step 1: The industrial computer sends an unlocking power on-off control command, and the switches of multiple unlocking power supplies are turned on and off at the same time to test the electromagnetic pin. The test includes no-load test, load test, high and low temperature test and vibration test; Step 2: The AD acquisition card collects the unlocking circuit of the electromagnetic pin, the power supply voltage signal and current signal of the feedback circuit, and the output signal of the feedback circuit through the current and voltage sensor, and receives, displays and stores the collected data; Step 3: The industrial computer generates a test report for each product under test based on the test report format and technical indicators given by the user, compares the measured value of each parameter item with the technical indicator of the parameter item, determines whether the product under test is qualified, and automatically generates a test conclusion in the test report.

6. The method used in the multi-channel automatic testing system for electromagnetic pins as claimed in claim 5, characterized in that: During no-load test and load test, individual electromagnetic pins are tested in turn in a polling manner.

7. The method used in the multi-channel automatic testing system for electromagnetic pins according to claim 5, characterized in that: During high and low temperature tests and vibration tests, all electromagnetic pins are tested at the same time.

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