Storage device test processing method and device

Abstract

The invention provides a storage device test processing method and device. The method comprises the steps that network hardware resources and test case requirements of a test environment corresponding to a to-be-tested storage device are acquired; performing configuration processing on network hardware resources of the test environment based on test case requirements, and constructing a corresponding network topology structure; wherein the network topology structure comprises a corresponding relationship between the storage device and at least one server host in the test environment; obtaining a corresponding test task based on the network topology structure and the test case demand configuration, and executing the test task to perform a pressure read-write test on the storage device to obtain a test result; and determining a corresponding index threshold according to a test case demand, performing evaluation analysis based on the index threshold and the test result, and generating a test analysis result. The storage device test processing method provided by the invention can effectively improve the overall test analysis efficiency of the storage device.

Description

Technical Field

[0001] The present invention relates to the field of computer application technology, and in particular to a storage device testing and processing method and apparatus, and also to an electronic device and a non-transitory computer-readable storage medium. Background Art

[0002] In recent years, with the rapid development of computer technology, various storage devices have been used more and more widely. Storage devices are used for long-term storage of key data in the entire storage network system. Their read and write services are related to the final operation effect of the entire storage network system. Therefore, multi-dimensional load testing of storage devices and understanding the load limit of storage devices are important criteria for measuring storage performance. In the process of IO (Input / Output) service testing of storage devices in storage network systems, the current automated testing technologies are mostly used to control IO stress model testing and device system stability testing at the test application software or device system software level. For example, controlling the IO model and test duration of the test tool script and controlling the operating system fault injection, the entire test process is constantly tested, analyzed, adjusted, and retested. The test process is very cumbersome and time-consuming, resulting in poor efficiency in the actual storage device test processing. Therefore, how to design a more efficient storage device test processing solution has become a technical problem that needs to be solved urgently. Summary of the invention

[0003] The present invention provides a storage device test processing method, which is used to solve the defect that the storage device test processing scheme in the prior art has high limitations, resulting in poor efficiency of actual storage device test processing.

[0004] The present invention provides a storage device test processing method, comprising: Obtain the network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested; Based on the test case requirements, the network hardware resources of the test environment are arranged and processed to construct a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment; Compose corresponding test tasks based on the network topology and the test case requirements, and execute the test tasks to perform stress read and write tests on the storage device to obtain test results; Determine corresponding indicator thresholds according to the test case requirements, perform evaluation and analysis based on the indicator thresholds and the test results, and generate test analysis results.

[0005] According to a storage device test processing method provided by the present invention, the corresponding test task is obtained based on the network topology structure and the test case requirements, and the test task is executed to perform a stress read and write test on the storage device to obtain a test result, including: Performing a test task configuration operation based on the network topology and the test case requirements to determine the correspondence between the volume identifier in the storage device, at least one server host in the test environment, and the input-output model, and selecting a corresponding target test tool, setting test parameters, and a preset test process based on the network topology and the test case requirements; Generate a corresponding test script according to the volume identifier in the storage device, the correspondence between at least one server host and the input-output model in the test environment, the target test tool, the set test parameters and the preset test process, and use the test script as the test task to be executed; The input-output model is a processing strategy used when performing input-output operations on the storage device to implement stress read-write testing; the corresponding relationship includes a volume mapping relationship between a volume identifier in the storage device and at least one server host in the test environment; Execute the test task configured based on the network topology and the test case requirements to perform input and output stress read and write tests on the storage device according to the test case requirements to obtain test results.

[0006] According to a storage device test processing method provided by the present invention, the corresponding indicator threshold is determined according to the test case requirement, and evaluation and analysis are performed based on the indicator threshold and the test result to generate the test analysis result, which specifically includes: According to the test case requirement, determining a target indicator threshold associated with the test case requirement; Compare and analyze the test result with the target indicator threshold to obtain a corresponding comparison result; A corresponding test report is generated according to the comparison result, and the test report is output as a test analysis result.

[0007] According to a storage device test processing method provided by the present invention, after performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the method further includes: Obtaining target test result data to be analyzed; wherein the target test result data includes the test analysis result; The target test result data is input into a preset read-write business bottleneck prediction model corresponding to the storage device, and the read-write business bottleneck information corresponding to the storage device output by the read-write business bottleneck prediction model is obtained; wherein the read-write business bottleneck prediction model is a machine learning model obtained by iterative training based on sample test result data and the read-write business bottleneck label corresponding to the sample test result data.

[0008] According to a storage device test processing method provided by the present invention, after arranging and processing the network hardware resources of the test environment based on the test case requirements and constructing the corresponding network topology structure, the method further includes: Obtaining a management request for the network topology; Based on the management request of the network topology structure, the logical connection relationship between each device in the network topology structure is configured to obtain a new network topology structure; wherein each device in the network topology structure includes at least one storage device and at least one server host device.

[0009] According to a storage device test processing method provided by the present invention, after performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the method further includes: Obtain new test case requirements; The new test case requirement is split and identified to obtain a split identification result; and the test environment is re-arranged for the network topology structure, the volume mapping relationship and the test task according to the split identification result to obtain a new network topology structure, a new volume mapping relationship and a new test task respectively; according to the new network topology structure and the new volume mapping relationship, the test task is executed to perform a stress read and write test on the storage device according to the new test case requirement to obtain a new test result.

[0010] The present invention also provides a storage device test processing device, comprising: An information acquisition unit, used to acquire network hardware resources and test case requirements of a test environment corresponding to the storage device to be tested; A topology management unit, configured to orchestrate the network hardware resources of the test environment based on the test case requirements and construct a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment; A test task configuration unit, configured to obtain corresponding test tasks based on the network topology and the test case requirements, and execute the test tasks to perform stress read and write tests on the storage device to obtain test results; The test result analysis unit is used to determine the corresponding indicator threshold according to the test case requirements, perform evaluation and analysis based on the indicator threshold and the test result, and generate a test analysis result.

[0011] According to a storage device test processing device provided by the present invention, the test task configuration unit is specifically used to: Performing a test task configuration operation based on the network topology and the test case requirements to determine the correspondence between the volume identifier in the storage device, at least one server host in the test environment, and the input-output model, and selecting a corresponding target test tool, setting test parameters, and a preset test process based on the network topology and the test case requirements; Generate a corresponding test script according to the volume identifier in the storage device, the correspondence between at least one server host and the input-output model in the test environment, the target test tool, the set test parameters and the preset test process, and use the test script as the test task to be executed; The input-output model is a processing strategy used when performing input-output operations on the storage device to implement stress read-write testing; the corresponding relationship includes a volume mapping relationship between a volume identifier in the storage device and at least one server host in the test environment; Execute the test task configured based on the network topology and the test case requirements to perform input and output stress read and write tests on the storage device according to the test case requirements to obtain test results.

[0012] According to a storage device test processing device provided by the present invention, the test result analysis unit is specifically used for: According to the test case requirement, determining a target indicator threshold associated with the test case requirement; Compare and analyze the test result with the target indicator threshold to obtain a corresponding comparison result; A corresponding test report is generated according to the comparison result, and the test report is output as a test analysis result.

[0013] According to a storage device test processing device provided by the present invention, after performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the device further includes: The second test result analysis unit is used for: Obtaining target test result data to be analyzed; wherein the target test result data includes the test analysis result; The target test result data is input into a preset read-write business bottleneck prediction model corresponding to the storage device, and the read-write business bottleneck information corresponding to the storage device output by the read-write business bottleneck prediction model is obtained; wherein the read-write business bottleneck prediction model is a machine learning model obtained by iterative training based on sample test result data and the read-write business bottleneck label corresponding to the sample test result data.

[0014] According to a storage device test processing apparatus provided by the present invention, after arranging and processing the network hardware resources of the test environment based on the test case requirements and constructing the corresponding network topology structure, the apparatus further includes: Topology management unit, used to: Obtaining a management request for the network topology; Based on the management request of the network topology structure, the logical connection relationship between each device in the network topology structure is configured to obtain a new network topology structure; wherein each device in the network topology structure includes at least one storage device and at least one server host device.

[0015] According to a storage device test processing device provided by the present invention, after performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the device further includes: Test environment orchestration unit, used to: Obtain new test case requirements; The new test case requirement is split and identified to obtain a split identification result; and the test environment is re-arranged for the network topology structure, the volume mapping relationship and the test task according to the split identification result to obtain a new network topology structure, a new volume mapping relationship and a new test task respectively; according to the new network topology structure and the new volume mapping relationship, the test task is executed to perform a stress read and write test on the storage device according to the new test case requirement to obtain a new test result.

[0016] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the storage device test processing method as described in any one of the above items is implemented.

[0017] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the storage device test processing method as described in any one of the above items is implemented.

[0018] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the storage device test processing method as described in any one of the above items is implemented.

[0019] The storage device test processing method provided by the present invention obtains the network hardware resources of the test environment corresponding to the storage device to be tested and the test case requirements, configures and processes the network hardware resources of the test environment based on the test case requirements, builds a corresponding network topology structure, and obtains corresponding test tasks based on the network topology structure and the test case requirement configuration, executes the test tasks to perform stress reading and writing tests on the storage device, obtains test results, and finally determines corresponding indicator thresholds according to the test case requirements, performs evaluation and analysis based on the indicator thresholds and the test results, and generates test analysis results; it effectively improves the overall test and analysis efficiency of the storage device. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 It is a flow chart of the storage device test processing method provided by the present invention.

[0022] Figure 2 It is a specific flow chart of the storage device test processing method provided by the present invention.

[0023] Figure 3 It is a specific structural schematic diagram of the storage device test processing device provided by the present invention.

[0024] Figure 4 It is a structural schematic diagram of the storage device test processing device provided by the present invention.

[0025] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0027] Combine the following Figure 1-Figure 5 The storage device test processing method and apparatus of the present invention are described, and the embodiments thereof are described in detail.

[0028] The following describes in detail the embodiment of the storage device test processing method according to the present invention. Figure 1 As shown, it is a flow chart of the storage device test processing method provided by the present invention, and the specific implementation process includes the following steps: Step 101: Obtain network hardware resources and test case requirements of a test environment corresponding to a storage device to be tested.

[0029] In an embodiment of the present invention, the test environment may be a test system formed by connecting network devices, storage devices, server hosts, etc. for performing read and write performance stress tests on the storage devices. The network hardware resources include test resource information corresponding to the network devices, storage devices, server hosts, etc. connected in the test system. The test resource information includes information such as the device name, the interface name and status of the device, and a list of identified LUNs (Logical Unit Numbers). The device may be a network device, a storage device, or a server device. Among them, the test case requirements may include information on what types of tests are performed on the storage device. The network device may be a fiber optic switch (Fibre Channel, FC), which is mainly used in storage networks and ROCE (RDMA over Converged Ethernet) network devices.

[0030] In addition, during the specific implementation process, the hardware configuration information of the network device in the test environment and the interface information of the device can also be obtained. By extracting and identifying the characteristics of the hardware configuration information of the network device and the interface information of the device, it is determined whether the FC network device or the ROCE network device is used in the test environment, and then the storage device test requirements in different network environments are used according to the different network devices, thereby improving the flexibility and applicability of the test. Therefore, the present invention can support FC networks or ROCE networks, so it is compatible with storage devices of different manufacturers, and can incrementally develop interfaces according to the characteristics of SAN (Storage AeraNetwork) storage devices, while supporting a variety of test tools and generating test scripts on demand, thereby effectively reducing the process of system integration, networking, software adjustment, and system reconfiguration, and improving the overall efficiency of the test.

[0031] Step 102: orchestrate the network hardware resources of the test environment based on the test case requirements to construct a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment.

[0032] In an embodiment of the present invention, the network topology structure may be a storage device network topology structure formed by connecting the first server host and the second server host to the storage device through an FC fiber switch, such as two FC interfaces per storage device controller or four FC interfaces per storage device controller. For example, in an actual implementation process, the name of the test case corresponding to the test case requirement may be: a storage interface quantity performance test; test category: performance category; test scenario: using storage devices to build an FCSAN network to test the performance of storage configurations in 2-port and 4-port scenarios; test purpose: to compare the impact of the number of storage device ports on the performance of the storage network system; pre-conditions include: 1. The hardware status is normal, 2. The scenario environment meets the preset, 3. The tools required for the operation are ready. Correspondingly, the specific test steps include: 1. Configure device topology 1; 2. Create pool0 in the storage GUI first, then create storage raid, with raid type draid6; 3. Create LUNs: 8 for each node, a total of 16; 4. Volume mapping: (1) 4 volumes of node1 + 4 volumes of node2, a total of 8 volumes mapped to host1; (2) 4 volumes of node1 + 4 volumes of node2, a total of 8 volumes mapped to host2; 5. Performance model: (1) 8K, 7:3 random read and write; (2) 4K, 100% random write / 100% random read; (3) 512K 100% sequential write / 100% sequential read; 6. The latency requirement for the above scenarios is about 1ms; 7. Change the topology to topology 2 and repeat tests 2-6. Test results: Pass; PartlyPass; Fail or NT.

[0033] In addition, after the network hardware resources of the test environment are orchestrated based on the test case requirements and the corresponding network topology is constructed, it also includes: obtaining a management request for the network topology; based on the management request for the network topology, configuring the logical connection relationship between each device in the network topology to obtain a new network topology; wherein each device in the network topology includes at least one storage device and at least one server host device.

[0034] Step 103: Obtain corresponding test tasks based on the network topology and the test case requirements, execute the test tasks to perform stress read and write tests on the storage device, and obtain test results.

[0035] In an embodiment of the present invention, a test task configuration operation can be performed based on the network topology and the test case requirements to determine the correspondence between the volume identifier (Logical Unit Number, LUN) in the storage device, at least one server host in the test environment, and the input-output model, and select the corresponding target test tool, set the test parameters, and the preset test process based on the network topology and the test case requirements. According to the volume identifier in the storage device, the correspondence between the at least one server host in the test environment and the input-output model, the target test tool, the set test parameters, and the preset test process, a corresponding test script is generated, and the test script is used as a test task to be executed. Among them, the input-output model is a processing strategy adopted when performing input-output operations on the storage device to implement stress read-write testing; the correspondence includes a volume mapping relationship between the volume identifier in the storage device and at least one server host in the test environment. The test task configured based on the network topology and the test case requirements is executed to perform input-output stress read-write testing on the storage device according to the test case requirements to obtain a test result. The volume identifier is an identifier of a storage volume on the storage device side. That is, in the actual execution process, it is necessary to pre-configure the mapping relationship between the storage volume on the storage device side and the server host, and based on the server host calling the preset test tool, perform different IO model stress read and write tests on the storage volume that has a mapping relationship with the server host in parallel to obtain the test results. The IO model (i.e., IO stress model) is a preset input and output stress test model.

[0036] Step 104: determine a corresponding indicator threshold according to the test case requirement, perform evaluation and analysis based on the indicator threshold and the test result, and generate a test analysis result.

[0037] In an embodiment of the present invention, a target indicator threshold associated with the test case requirement can be determined according to the test case requirement; the test result is compared and analyzed with the target indicator threshold to obtain a corresponding comparison result; a corresponding detailed test report is generated according to the comparison result, and the test report is output as a test analysis result. It should be noted that in the process of determining the target indicator threshold associated with the test case requirement according to the test case requirement, if the test case requirement is a test delay condition, the target indicator threshold associated with the test case requirement is a preset target delay threshold, and if the test case requirement is a test bandwidth condition, the target indicator threshold associated with the test case requirement is a preset target bandwidth threshold.

[0038] In addition, after the evaluation and analysis is performed based on the indicator threshold and the test result, and the test analysis result is generated, it also includes: obtaining the target test result data to be analyzed; wherein the target test result data includes the test analysis result; inputting the target test result data into the preset read-write business bottleneck prediction model corresponding to the storage device, and obtaining the read-write business bottleneck information corresponding to the storage device output by the read-write business bottleneck prediction model; wherein the read-write business bottleneck prediction model is a machine learning model obtained by iterative training based on the sample test result data and the read-write business bottleneck label corresponding to the sample test result data. In addition, after the evaluation and analysis is performed based on the indicator threshold and the test result, and the test analysis result is generated, it also includes: obtaining new test case requirements; splitting and identifying the new test case requirements to obtain splitting and identifying results; and re-arranging the test environment for the network topology, the volume mapping relationship and the test task according to the splitting and identifying results, respectively obtaining new network topology, new volume mapping relationship and new test task; according to the new network topology and the new volume mapping relationship, executing the test task to perform stress read-write test on the storage device according to the new test case requirements to obtain new test results.

[0039] like Figure 2 As shown, in a specific embodiment corresponding to step 101-step 104, firstly, the access information is obtained through the browser, the business bear A page is accessed to input the hardware login information, and the hardware environment (i.e., the test environment) is imported. According to the network hardware resources of the hardware environment, it is determined whether the physical connection is completed. If so, the hardware topology is identified and the hardware topology is archived; next, the corresponding network configuration script is generated according to the hardware type, and the test volume configuration (i.e., the capacity volume identifier of the storage volume, etc.) is generated according to the test requirements (i.e., the test case requirements), and then the host volume (i.e., the storage volume corresponding to the server host) is detected. If so, the host storage docking is configured (i.e., a mapping relationship between the server host and the volume identifier in the storage device is established), and the volume mapping mount is further executed. If the test task fails, a test script is constructed, and the test tool is run to call the test script for execution to obtain the test results, and the test results are stored in the database, the corresponding IO performance change analysis and host IO change analysis are stored, and finally the test results are presented. In addition, during the import of test case requirements, the test case execution sequence configuration is used to determine whether the case environment arrangement is completed. If so, the test environment is archived. If not, the case arrangement is executed to determine whether the network configuration exists. If so, the network configuration script is called according to the test case sequence and the script is archived. During the test execution process, the network configuration archive is called to modify the topology, and the test tool is run to call the test case script to obtain the test results.

[0040] In the embodiment of the present invention, by importing the basic information of the environment hardware and the test requirements, the hardware management module completes the identification and management of the hardware resources required for the test environment. According to the test requirements, the topology management module is imported, the configuration template preset by the hardware driver module is called, and the network hardware resources are automatically configured through the hardware driver module. Through the storage host docking module, the server host and the storage are docked according to the test data. Through the test pressure configuration module, the performance test tool is configured and managed to generate a stress test script. The storage device is tested for performance. The test results are imported through the result analysis module and compared with the preset standards of the test requirements to give the test conclusion. Supporting the arrangement of test environments in multiple scenarios, meeting the requirements of the test environment of systematic storage devices in multiple scenarios, and ensuring that the test activities are carried out in accordance with a clearly defined automated sequence. In addition, the present invention supports multiple networks and storage devices, which can meet the requirements of different test scenarios. Through the incremental development interface, support for storage devices of different manufacturers is achieved. In addition, the present invention allows the test plan and execution strategy to be customized according to the requirements. Supporting the preprocessing of the scenario arrangement of multiple test cases, the environment configuration script can be generated on demand, and the fast switching of the test environment in multiple scenarios is realized, which improves the test efficiency. Finally, the present invention can generate a detailed test report to ensure the accuracy and reliability of the test results. By introducing machine learning, the results in a certain scenario are analyzed, the possible IO bottlenecks of the test method are given, and optimization suggestions are given.

[0041] The present invention quickly completes the configuration of the test system equipment, the configuration of the network architecture, and the preprocessing of the test task configuration for the development and testing of storage devices, executes the test tasks in a predefined order and plan, collects the test results, and completes the result analysis. The test hardware, software, network topology, and stress tools can be quickly and dynamically configured for multiple types of test cases for storage device functions, reliability, and stability. In addition, by introducing machine learning into the test result analysis module, the key factors of the full IO path of the host, network, and storage device are analyzed to provide optimization guidance for performance tuning. In addition, the present invention sets an orchestration process to solve the requirements for changing the test environment in multiple scenarios such as topology changes, component changes, and adjustment of the execution order of multiple test tasks and the order of operation steps during the storage test process. At the same time, the present invention supports FC and ROCE networks, is compatible with storage devices of different manufacturers, and can incrementally develop interfaces according to the characteristics of SAN storage devices, while supporting multiple test tools and generating test scripts on demand. The process of system integration, networking, soft adjustment, and system reconfiguration can be effectively reduced, and the overall efficiency of the test is improved.

[0042] The storage device test processing method provided by the present invention obtains the network hardware resources of the test environment corresponding to the storage device to be tested and the test case requirements, configures and processes the network hardware resources of the test environment based on the test case requirements, builds a corresponding network topology structure, and obtains corresponding test tasks based on the network topology structure and the test case requirement configuration, executes the test tasks to perform stress reading and writing tests on the storage device, obtains test results, and finally determines corresponding indicator thresholds according to the test case requirements, performs evaluation and analysis based on the indicator thresholds and the test results, and generates test analysis results; it effectively improves the overall test and analysis efficiency of the storage device.

[0043] The storage device test processing apparatus provided by the present invention is described below. The storage device test processing apparatus described below and the storage device test processing method described above can be referred to each other. Figure 4 As shown, it is a schematic diagram of the structure of the storage device test processing device provided by the present invention. The storage device test processing device of the present invention specifically includes the following parts: The information acquisition unit 401 is used to acquire the network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested.

[0044] In the embodiment of the present invention, the information acquisition unit includes: Figure 3 The hardware management module and device driver management module shown. Through this hardware management module, the test resource information (i.e., network hardware resources) of the network devices, storage devices, and server devices (i.e., server hosts) connected to the device is acquired, refreshed, and stored, and the device driver management module is called to complete the distribution of the test environment software configuration task. Network hardware resources include information such as device name, interface name and status, and identified LUN list. Through compatibility with storage devices from different manufacturers, effective management of various storage devices is achieved. Device driver management module: used to establish connections with network devices, storage devices, and server hosts to achieve data transmission and control. By supporting FC network devices (i.e., FC fiber switches) and ROCE network devices, different network device interfaces are called to implement network device function operations, such as logging in to and collecting information on FC fiber switches, obtaining interface wwpn (port number), and implementing zone configuration by calling the API interface of the FC fiber switch. Ensure that the device can adapt to test requirements under different network environments.

[0045] The topology management unit 402 is used to orchestrate the network hardware resources of the test environment based on the test case requirements and build a corresponding network topology structure; wherein the network topology structure includes the corresponding relationship between the storage device and at least one server host in the test environment.

[0046] The test task configuration unit 403 is used to arrange corresponding test tasks based on the network topology and the test case requirements, and execute the test tasks to perform stress reading and writing tests on the storage device to obtain test results.

[0047] The test result analysis unit 404 is used to determine the corresponding indicator threshold according to the test case requirements, perform evaluation and analysis based on the indicator threshold and the test result, and generate a test analysis result.

[0048] According to the present invention, a storage device test processing device further includes: Figure 3 The host storage docking module (i.e., host storage docking unit) shown in the figure is used to realize the automatic docking function between the server host and the storage device. It identifies the docking requirements between the server host and the storage through the topological network structure, exchanges the information of the server host and the storage device, realizes the function of automatically adding the server host on the storage device side, and improves the efficiency of the docking configuration of the test environment.

[0049] According to a storage device test processing device provided by the present invention, the test task configuration unit is specifically used to: perform test task configuration operations based on the network topology and the test case requirements to determine the correspondence between the volume identifier in the storage device, at least one server host in the test environment, and the input-output model, and select the corresponding target test tool, set test parameters, and preset test process based on the network topology and the test case requirements; generate a corresponding test script according to the volume identifier in the storage device, the correspondence between the at least one server host in the test environment and the input-output model, the target test tool, the set test parameters, and the preset test process, and use the test script as a test task to be executed; wherein the input-output model is a processing strategy adopted when performing input and output operations on the storage device to implement stress read and write testing; the correspondence includes the volume mapping relationship between the volume identifier in the storage device and at least one server host in the test environment; execute the test task configured based on the network topology and the test case requirements to perform input and output stress read and write testing on the storage device according to the test case requirements to obtain test results. The test task configuration unit is such as Figure 3 The test task configuration module shown: This test task configuration module allows users to configure test tasks according to test requirements through the user interface, including: the correspondence between LUN, server host, and IO pressure model (IO model), so that users can select test tools, set test parameters, customize test processes, etc., to achieve automatic creation of test tasks and automatically generate test scripts based on test tools and IO models.

[0050] According to a storage device test processing device provided by the present invention, the test result analysis unit is specifically used to: determine the target indicator threshold associated with the test case requirement according to the test case requirement; compare and analyze the test result with the target indicator threshold to obtain a corresponding comparison result; generate a corresponding test report according to the comparison result, and output the test report as a test analysis result. According to a storage device test processing device provided by the present invention, after performing an evaluation and analysis based on the indicator threshold and the test result to generate a test analysis result, it also includes: a second test result analysis unit, which is used to: obtain target test result data to be analyzed; wherein the target test result data includes the test analysis result; input the target test result data into a preset read-write business bottleneck prediction model corresponding to the storage device, and obtain the read-write business bottleneck information corresponding to the storage device output by the read-write business bottleneck prediction model; wherein the read-write business bottleneck prediction model is a machine learning model obtained by iterative training based on sample test result data and the read-write business bottleneck label corresponding to the sample test result data. In addition, the present invention also includes the following Figure 3 The volume mapping management module shown: This volume mapping management module transmits LUN mapping requirement information (i.e., mapping table relationship information) according to the test task configuration module, and is used to manage the volume mapping relationship maintenance of the storage device, and automatically configure the mapping relationship between the LUN (volume identifier) ​​on the storage device side and the server host. Ensure that data is correctly mapped between the server host and the storage device, and ensure the accuracy and reliability of the test analysis. The test result analysis unit is as follows Figure 3 The test result analysis module shown: This test result analysis module can set the corresponding indicator threshold according to the test requirements (i.e. test case requirements) delivered by the test task configuration module, conduct in-depth analysis and evaluation of the test results according to the indicator threshold, and generate a detailed test report. By analyzing the test results, it helps users understand the performance of storage devices and provides a basis for optimization and improvement.

[0051] According to a storage device test processing device provided by the present invention, after the network hardware resources of the test environment are arranged and processed based on the test case requirements and the corresponding network topology is constructed, it also includes: a topology management unit, which is used to: obtain a management request for the network topology; based on the management request of the network topology, configure the logical connection relationship between each device in the network topology to obtain a new network topology; wherein each device in the network topology includes at least one storage device and at least one server host device. The topology management unit is such as Figure 3The topology management module shown: constructs the storage device network topology structure according to the test requirements to achieve interconnection between devices. The topology management module maintains the logical connection relationship between devices, such as FC network port zone information. By flexibly configuring the network topology, the requirements of different test scenarios can be met.

[0052] According to a storage device test processing device provided by the present invention, after evaluating and analyzing the index threshold and the test result and generating the test analysis result, it also includes: a test environment arrangement unit, which is used to: obtain new test case requirements; split and identify the new test case requirements to obtain split identification results; and re-arrange the test environment for the network topology, the volume mapping relationship and the test task according to the split identification results, respectively obtain a new network topology, a new volume mapping relationship and a new test task; according to the new network topology and the new volume mapping relationship, execute the test task to perform stress read and write tests on the storage device according to the new test case requirements to obtain new test results. The test environment arrangement unit is a test environment arrangement module: according to the test case requirements, the different environment requirements of the test case are split and identified, and the network topology, volume mapping management and test task modules are called. Ensure that the test activities are carried out in accordance with a clearly defined automation sequence, and formulate different topology configurations, volume mapping configurations and test task configurations for each test case. To be applicable to the adjustment requirements of the business test environment in multiple complex scenarios.

[0053] The device described in the present invention arranges the test environment in advance according to the storage device test case requirements and test sequence, and realizes the rapid and accurate deployment of the environment. It can solve the problem that the existing automated testing technology can only solve the automatic configuration of a single scenario, and cannot complete the adjustment of the hardware and software systems such as device hardware, network topology configuration, and test software required by complex test scenarios, and cannot support the arrangement and adjustment configuration of all types of test environments in terms of function, performance, reliability, and stability. The device includes a hardware interface module (i.e., an abstract device interface module), a hardware management module, a topology management module, and a host storage docking module (i.e., Figure 3 host storage docking management module as shown), test task scheduling module (i.e. Figure 3 Test task scheduling module as shown), volume mapping management module (i.e. Figure 3 The test volume mapping management module shown in the figure) and the test result analysis module (i.e. Figure 3The test result recording and analysis module shown in the figure). The present invention has a test environment arrangement module, which can realize different environment configuration preprocessing of multiple types of test cases and multiple test scenarios, define the automated sequence of test activities, and complete the rapid adjustment and switching of the environment. Support FC, ROCE network automated configuration: The system supports Fibre Channel (FC) and RDMA over ConvergedEthernet (ROCE) networks, and can adapt to the storage device testing requirements under different network environments, improving the flexibility and applicability of the test. Abstract device interface module, compatible with storage devices of different manufacturers: The system is compatible with storage devices of different manufacturers, including but not limited to various SAN (Storage Area Network) storage devices. By incrementally developing interfaces according to the characteristics of SAN storage devices, the system can support different types of storage devices and meet diverse testing requirements. Through load simulation, it supports multiple test tools and generates test scripts on demand: The system can refer to the actual user business model to perform sampling simulation on the business, and the sampling granularity can be as small as seconds. Generate test tasks based on sampled data, and automatically generate corresponding test scripts based on the test tool selected by the user. This greatly improves the test efficiency and reduces the complexity and error rate of manually written test scripts.

[0054] The storage device test processing device provided by the present invention can quickly complete the test system equipment configuration, network architecture configuration, and test task arrangement for storage device research and development and testing, and ensure that the test environment completes the environment configuration according to the established order and plan. The present invention can quickly and dynamically configure test hardware, software, network topology, and stress tools for multiple types of test cases for storage product functions, reliability, and stability. The present invention introduces machine learning to the test result analysis module to analyze the key factors of the host, network, and storage device full IO path, and provide optimization guidance for performance tuning. The present invention is provided with an orchestration system to solve the requirements of multiple scenario test environment changes such as topology changes, component changes, and adjustment of the execution order of multiple test tasks and the order of operation steps during storage testing. The present invention supports FC network devices and ROCE network devices, is compatible with storage devices of different manufacturers, and can incrementally develop interfaces according to the characteristics of storage devices, while supporting multiple test tools and generating test scripts on demand. It can effectively reduce the processes of system integration, networking, software adjustment, and system reconfiguration, and improve the overall efficiency of testing.

[0055] The storage device test processing device provided by the present invention obtains the network hardware resources of the test environment corresponding to the storage device to be tested and the test case requirements, configures and processes the network hardware resources of the test environment based on the test case requirements, builds a corresponding network topology structure, and obtains corresponding test tasks based on the network topology structure and the test case requirement configuration, executes the test tasks to perform stress reading and writing tests on the storage device, obtains test results, and finally determines the corresponding indicator thresholds according to the test case requirements, performs evaluation and analysis based on the indicator thresholds and the test results, and generates test analysis results; it effectively improves the overall test and analysis efficiency of the storage device.

[0056] Figure 5 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 5 As shown, the electronic device (i.e., electronic device) may include: a processor 501, a communication interface 504, a memory 502, and a communication bus 503, wherein the processor 501, the communication interface 504, and the memory 502 communicate with each other through the communication bus 503. The processor 501 may call the logic instructions in the memory 502 to execute the storage device test processing method, which includes: obtaining the network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested; arranging and processing the network hardware resources of the test environment based on the test case requirements to construct a corresponding network topology structure; wherein the network topology structure includes the corresponding relationship between the storage device and at least one server host in the test environment; arranging and obtaining corresponding test tasks based on the network topology structure and the test case requirements, and executing the test tasks to perform stress read and write tests on the storage device to obtain test results; determining corresponding indicator thresholds according to the test case requirements, and performing evaluation and analysis based on the indicator thresholds and the test results to generate test analysis results.

[0057] In addition, the logic instructions in the above-mentioned memory 502 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0058] On the other hand, the present application also provides a computer program product, which includes a computer program, and the computer program can be stored on a computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the storage device test processing method provided by the above-mentioned methods, and the method includes: obtaining network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested; orchestrating the network hardware resources of the test environment based on the test case requirements, and constructing a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment; orchestrating corresponding test tasks based on the network topology structure and the test case requirements, and executing the test tasks to perform stress read and write tests on the storage device to obtain test results; determining corresponding indicator thresholds according to the test case requirements, performing evaluation and analysis based on the indicator thresholds and the test results, and generating test analysis results.

[0059] On the other hand, the present application also provides a computer-readable storage medium, which includes a stored program, wherein the program, when running, executes the storage device test processing method provided by the above-mentioned methods, the method including: obtaining network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested; orchestrating the network hardware resources of the test environment based on the test case requirements, and constructing a corresponding network topology structure; wherein the network topology structure includes a correspondence between the storage device and at least one server host in the test environment; orchestrating corresponding test tasks based on the network topology structure and the test case requirements, and executing the test tasks to perform stress read and write tests on the storage device to obtain test results; determining corresponding indicator thresholds according to the test case requirements, performing evaluation and analysis based on the indicator thresholds and the test results, and generating test analysis results.

[0060] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0061] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A storage device test processing method, characterized in that: include: Obtain the network hardware resources and test case requirements of the test environment corresponding to the storage device to be tested; Based on the test case requirements, the network hardware resources of the test environment are arranged and processed to construct a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment; Compose corresponding test tasks based on the network topology and the test case requirements, and execute the test tasks to perform stress read and write tests on the storage device to obtain test results; Determine corresponding indicator thresholds according to the test case requirements, perform evaluation and analysis based on the indicator thresholds and the test results, and generate test analysis results.

2. The storage device test processing method according to claim 1, characterized in that: The method of arranging corresponding test tasks based on the network topology and the test case requirements, and executing the test tasks to perform stress read and write tests on the storage device to obtain test results includes: Performing a test task configuration operation based on the network topology and the test case requirements to determine the correspondence between the volume identifier in the storage device, at least one server host in the test environment, and the input-output model, and selecting a corresponding target test tool, setting test parameters, and a preset test process based on the network topology and the test case requirements; According to the volume identifier in the storage device, the correspondence between the at least one server host in the test environment and the input-output model, the target test tool, the set test parameters and the preset test process, a corresponding test script is generated, and the test script is used as a test task to be executed; wherein the input-output model is a processing strategy adopted when performing input-output operations on the storage device to implement stress read-write testing; the correspondence includes a volume mapping relationship between the volume identifier in the storage device and the at least one server host in the test environment; Execute the test task configured based on the network topology and the test case requirements to perform input and output stress read and write tests on the storage device according to the test case requirements to obtain test results.

3. The storage device test processing method according to claim 1, characterized in that: The determining of the corresponding indicator threshold according to the test case requirement, performing evaluation and analysis based on the indicator threshold and the test result, and generating the test analysis result specifically includes: According to the test case requirement, determining a target indicator threshold associated with the test case requirement; Compare and analyze the test result with the target indicator threshold to obtain a corresponding comparison result; A corresponding test report is generated according to the comparison result, and the test report is output as a test analysis result.

4. The storage device test processing method according to claim 1, characterized in that: After performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the method further includes: Obtaining target test result data to be analyzed; wherein the target test result data includes the test analysis result; The target test result data is input into a preset read-write business bottleneck prediction model corresponding to the storage device, and the read-write business bottleneck information corresponding to the storage device output by the read-write business bottleneck prediction model is obtained; wherein the read-write business bottleneck prediction model is a machine learning model obtained by iterative training based on sample test result data and the read-write business bottleneck label corresponding to the sample test result data.

5. The storage device test processing method according to claim 1, characterized in that: After orchestrating the network hardware resources of the test environment based on the test case requirements and building a corresponding network topology structure, the method further includes: Obtaining a management request for the network topology; Based on the management request of the network topology structure, the logical connection relationship between each device in the network topology structure is configured to obtain a new network topology structure; wherein each device in the network topology structure includes at least one storage device and at least one server host device.

6. The storage device test processing method according to claim 2, characterized in that: After performing evaluation and analysis based on the indicator threshold and the test result to generate the test analysis result, the method further includes: Obtain new test case requirements; The new test case requirement is split and identified to obtain a split identification result; and the test environment is re-arranged for the network topology structure, the volume mapping relationship and the test task according to the split identification result to obtain a new network topology structure, a new volume mapping relationship and a new test task respectively; according to the new network topology structure and the new volume mapping relationship, the test task is executed to perform a stress read and write test on the storage device according to the new test case requirement to obtain a new test result.

7. A storage device test processing device, characterized in that: include: An information acquisition unit, used to acquire network hardware resources and test case requirements of a test environment corresponding to the storage device to be tested; A topology management unit, configured to orchestrate the network hardware resources of the test environment based on the test case requirements and construct a corresponding network topology structure; wherein the network topology structure includes a corresponding relationship between the storage device and at least one server host in the test environment; A test task configuration unit, configured to obtain corresponding test tasks based on the network topology and the test case requirements, and execute the test tasks to perform stress read and write tests on the storage device to obtain test results; The test result analysis unit is used to determine the corresponding indicator threshold according to the test case requirements, perform evaluation and analysis based on the indicator threshold and the test result, and generate a test analysis result.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the storage device test processing method according to any one of claims 1 to 6 is implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the storage device test processing method according to any one of claims 1 to 6 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the storage device test processing method according to any one of claims 1 to 6 is implemented.

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