Jig for precisely testing photosensitive chip

Abstract

The invention provides a jig for precisely testing a photosensitive chip, the jig comprises a butt joint assembly, a suction head assembly, a discharging trolley and a feeding trolley, the suction head assembly is arranged above the butt joint assembly, the suction head assembly is used for being in butt joint with the butt joint assembly, and the suction head assembly is further in butt joint with the discharging trolley and the feeding trolley; the suction head assembly is used for sucking the chips from the feeding trolley and placing the chips into the discharging trolley, the feeding trolley is responsible for conveying the chips to the testing area, and the discharging trolley is responsible for conveying the tested chips out of the testing area. The beneficial effects of the invention are that the external light source is guided to the surface of the chip by using the reflector; and an annular labyrinth type shading structure is created, the shading sheet is arranged at the bottom in an auxiliary manner, and the material is black, so that external light is effectively prevented from entering the test cavity to influence the test yield, and the test accuracy is improved.

Description

Technical Field

[0001] The invention belongs to the field of integrated circuits, and in particular relates to a jig for precision testing of photosensitive chips. Background Art

[0002] When testing and sorting photosensitive chips, the chips need to be transported and tested for lighting. The solutions for photosensitive chips on the market often separate the transport and lighting test devices. Specifically, multiple suction head assemblies are required. The suction head assemblies only have the function of transporting chips. Two suction head assemblies transport the chips to the chip test socket and then move them away. Then use the other two suction head assemblies to light them and then test them. This increases the cost and usage area, and the efficiency is not ideal. In addition, the electronic control program needs to be rewritten specifically for this logic, which is cumbersome and complicated, greatly increasing the hardware cost. Summary of the invention

[0003] In view of this, the present invention aims to propose a jig for precision testing of photosensitive chips to solve at least one problem existing in the above-mentioned prior art, effectively improve the testing efficiency and significantly save costs.

[0004] To achieve the above object, the technical solution of the present invention is achieved as follows:

[0005] A jig for precision testing of photosensitive chips comprises a docking assembly, a suction head assembly, a discharging trolley and a feeding trolley, wherein a suction head assembly is arranged above the docking assembly and used for docking with the docking assembly, and the suction head assembly is also docked with the discharging trolley and the feeding trolley, and the suction head assembly is used for sucking the chip from the feeding trolley and placing the chip into the discharging trolley, the feeding trolley is responsible for transporting the chip to a testing area, and the discharging trolley is responsible for transporting the tested chip out of the testing area.

[0006] Furthermore, the docking assembly includes a docking plate, a machine positioning pin, a nest positioning pin, a height adjustment block and a gasket. A machine positioning pin is installed on the front and rear sides of the docking plate surface respectively. Two square grooves for accommodating the suction head assembly are provided on the docking plate surface. A nest positioning pin is installed at both ends of the two square grooves respectively. A height adjustment block is provided on one side of the square groove, and a gasket is installed under the height adjustment block. The machine positioning pin is responsible for positioning itself with the chip testing and sorting machine, the nest positioning pin is responsible for positioning itself with the suction head assembly, and the gasket is used to adjust the height of the height adjustment block.

[0007] Furthermore, the docking plate includes an annular light-shielding boss and a bottom light-shielding sheet. The annular light-shielding boss is arranged around the square groove, and the annular light-shielding boss cooperates with the annular light-shielding pit of the suction head to form an annular maze-type light-shielding. The bottom light-shielding sheet is arranged inside the square groove, and the bottom light-shielding sheet is used to block the light in the middle of the chip test seat from entering the test cavity.

[0008] Furthermore, the suction head and the docking plate both have a black appearance.

[0009] Furthermore, the tip assembly includes a tip bracket, a tip, a reflector, a buckle, a sealing ring and a positioning sleeve. The bottom of the tip bracket is installed to the docking plate through the tip. Two reflectors are installed on one side of the inside of the tip bracket. A buckle is provided above the two reflectors. Vacuum air inlets are provided on both sides of the buckle and above the tip bracket. A sealing ring is provided at the vacuum air inlet above the tip bracket. A positioning sleeve is also installed on both sides of the bottom of the tip bracket.

[0010] Furthermore, a first square boss is provided on the left side of the bottom of the suction head, and a central light-transmitting hole and vacuum air holes on both sides are opened on the first square boss, and the vacuum air holes on both sides are connected to the vacuum air inlet.

[0011] Compared with the prior art, the fixture for precision testing of photosensitive chips described in the present invention has the following advantages:

[0012] (1) The fixture for precision testing of photosensitive chips described in the present invention uses a reflector to guide external light sources to the chip surface. It also creates a circular maze-type light-shielding structure, with a light-shielding sheet at the bottom. The material color is black, which effectively prevents external light from entering the test chamber to affect the test yield, thereby improving the test accuracy.

[0013] (2) The jig for precision testing of photosensitive chips described in the present invention integrates the handling and lighting tests into one, which reduces the complexity of the mechanism, improves space utilization, and improves testing efficiency. It is twice as efficient as the existing technical solutions, and the electronic control does not need to write an additional set of separate programs for material suction and light source testing, which greatly saves costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the accompanying drawings:

[0015] Figure 1 A schematic diagram of the overall structural distribution of the fixture according to an embodiment of the present invention;

[0016] Figure 2 This is a schematic diagram of a docking assembly according to an embodiment of the present invention;

[0017] Figure 3 This is a schematic diagram of a suction head assembly according to an embodiment of the present invention;

[0018] Figure 4 This is an enlarged schematic diagram of the bottom of the suction head assembly according to an embodiment of the present invention;

[0019] Figure 5It is a cross-sectional schematic diagram of a suction head assembly according to an embodiment of the present invention;

[0020] Figure 6 It is a schematic diagram of the installation and cross-section of the suction head assembly and the feeding trolley according to an embodiment of the present invention;

[0021] Figure 7 The figure is a schematic diagram of the installation and cross-section of the docking assembly and suction head assembly according to the embodiment of the present invention.

[0022] Description of reference numerals:

[0023] 100, docking assembly; 101, docking plate; 102, machine positioning pin; 103, nest positioning pin; 104, height adjustment block; 105, gasket; 200, suction head assembly; 201, suction head bracket; 202, suction head; 203, reflector; 204, buckle; 205, sealing ring; 206, positioning sleeve; 300, discharge trolley; 400, feed trolley. DETAILED DESCRIPTION

[0024] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other.

[0025] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first", "second", and the like are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", and the like may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0026] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.

[0027] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments.

[0028] like Figures 1 to 6 As shown, a jig for precision testing of photosensitive chips includes a docking assembly 100, a suction head assembly 200, a discharging trolley 300 and a loading trolley 400. The suction head assembly 200 is arranged above the docking assembly 100, and the suction head assembly 200 is used to dock with the docking assembly 100. The suction head assembly 200 is also docked with the discharging trolley 300 and the loading trolley 400. The suction head assembly 200 is used to suck the chip from the loading trolley 400 and put the chip into the discharging trolley 300. The loading trolley 400 is responsible for transporting the chip to the test area, and the discharging trolley 300 is responsible for transporting the tested chip out of the test area.

[0029] In a preferred embodiment of the present invention, when a chip test handler tests different chips (IC), it is necessary to replace different test fixtures (KIT) accordingly, such as Figure 1 As shown in the figure, four components are shown, corresponding to the KIT required to test a chip.

[0030] like Figure 1 As shown, 100 is a docking assembly (docking) of a chip test sorting machine and a chip test socket (socket), 400 and 300 are a material infeed trolley and a material outfeed trolley respectively, which are responsible for transporting the chips to the test area and transporting the tested chips out of the test area. The suction head assembly (nest) 200 is responsible for sucking the chips from the trolley, docking with the docking assembly (docking) 100, and sending the chips into the socket for testing.

[0031] like Figure 2 As shown, the docking plate 101 is the main body of the docking assembly 100, the machine positioning pin 102 is responsible for positioning between it and the chip test sorting machine (handler), and the nest positioning pin 103 is responsible for positioning between it and the suction head assembly 200. The gasket 105 is placed under the height adjustment block 104 and is used to adjust the height of the height adjustment block 104 to ensure the downward pressing height of the suction head assembly 200.

[0032] The docking plate 101 includes an annular light shielding boss and a bottom light shielding sheet. The annular light shielding boss structure cooperates with the annular light shielding pit of the suction head 202 to form an annular maze-type light shielding. The light shielding sheet at the bottom of the docking plate 101 is used to block the light in the middle of the chip test seat from entering the test cavity. The suction head 202 and the docking plate 101 are both black in appearance, which effectively prevents light from entering the test cavity due to reflection.

[0033] like Figure 3As shown, the suction head assembly 200 includes a suction head bracket 201, a suction head 202, a reflector 203, a buckle 204, a sealing ring 205 and a positioning sleeve 206. The bottom of the suction head bracket 201 is installed to the docking plate 101 through the suction head 202. Two reflectors 203 are installed on one side of the interior of the suction head bracket 201. A buckle 204 is provided above the two reflectors 203. Vacuum air inlets are provided on both sides of the buckle 204 and above the suction head bracket 201. A sealing ring 205 is provided at the vacuum air inlet above the suction head bracket 201. A positioning sleeve 206 is also installed on both sides of the bottom of the suction head bracket 201. The positioning sleeve 206 is used to position the suction head assembly 200 to the docking assembly 100.

[0034] like Figure 4 As shown, the partial enlarged view on the left shows the end structure of the suction head 202, which is divided into a central light-transmitting hole and two side vacuum air holes. Figure 3 The upper vacuum inlet is connected. The partial enlarged picture II on the right shows the state of sucking the chip.

[0035] like Figure 5 As shown, the light is emitted by an external cable, which is connected to the reflector 203, and is reflected 90° by the intermediate lens to the central light-transmitting hole in the middle of the suction head 202 to irradiate the chip surface.

[0036] like Figure 6 As shown, the state when the suction head assembly 200 cooperates with the feeding trolley 400 is shown. The chip is placed in the chip slot of the feeding trolley 400, and the suction head assembly 200 cooperates with it. The vacuum is turned on to adsorb the chip on the suction head surface and take it out.

[0037] After the test is completed, the suction head assembly 200 places the chip in the discharge trolley 300, which is similar to the above and will not be repeated.

[0038] The present invention proposes a fixture for testing photosensitive chips, which uses a reflector to guide the external light source to the chip surface. It also creates a circular maze-type light-shielding structure, with a light-shielding sheet at the bottom. The material color is black, which effectively prevents external light from entering the test cavity and affecting the test yield, thereby improving the test accuracy.

[0039] Integrating the handling and lighting tests into one reduces the complexity of the mechanism, improves space utilization, and improves test efficiency. The electronic control no longer needs to write an additional program for separate material absorption and light source testing, which greatly saves costs.

[0040] Example 1

[0041] like Figure 7The state shown is when the suction head assembly 200 cooperates with the docking assembly 100, that is, the testing state. The suction head assembly 200 places the chip taken out from the feed trolley 400 into the socket and applies pressure, and at the same time, the top light irradiates the photosensitive area of ​​the chip for testing.

[0042] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A fixture for precision testing of photosensitive chips, characterized by: The invention comprises a docking assembly (100), a suction head assembly (200), a discharge trolley (300) and a loading trolley (400), wherein the suction head assembly (200) is arranged above the docking assembly (100), the suction head assembly (200) is used for docking with the docking assembly (100), the suction head assembly (200) is also used for docking with the discharge trolley (300) and the loading trolley (400), the suction head assembly (200) is used for sucking chips from the loading trolley (400) and placing the chips into the discharge trolley (300), the loading trolley (400) is responsible for transporting the chips to the testing area, and the discharge trolley (300) is responsible for transporting the tested chips out of the testing area.

2. According to claim 1, a fixture for precision testing of photosensitive chips is characterized by: The docking assembly (100) comprises a docking plate (101), a machine positioning pin (102), a nest positioning pin (103), a height adjustment block (104) and a gasket (105); a machine positioning pin (102) is respectively installed on the front and rear sides of the surface of the docking plate (101); two square grooves for accommodating a suction head assembly (200) are provided on the surface of the docking plate (101); a nest positioning pin (103) is respectively installed at both ends of the two square grooves; a height adjustment block (104) is provided on one side of the square groove; a gasket (105) is installed below the height adjustment block (104); the machine positioning pin (102) is responsible for positioning itself with a chip testing and sorting machine; the nest positioning pin (103) is responsible for positioning itself with the suction head assembly (200); and the gasket (105) is used to adjust the height of the height adjustment block (104).

3. The fixture for precision testing of photosensitive chips according to claim 2, characterized in that: The docking plate (101) comprises an annular light-shielding boss and a bottom light-shielding sheet. The annular light-shielding boss is arranged around the square groove. The annular light-shielding boss cooperates with the annular light-shielding pit of the suction head (202) to form an annular maze-type light-shielding. The bottom light-shielding sheet is arranged inside the square groove. The bottom light-shielding sheet is used to block the light in the middle of the chip test seat from entering the test cavity.

4. The fixture for precision testing of photosensitive chips according to claim 2, characterized in that: The suction head (202) and the docking plate (101) are both black in appearance.

5. The fixture for precision testing of photosensitive chips according to claim 2, characterized in that: The suction head assembly (200) comprises a suction head bracket (201), a suction head (202), a reflector (203), a buckle (204), a sealing ring (205) and a positioning sleeve (206); the bottom of the suction head bracket (201) is mounted to the docking plate (101) through the suction head (202); two reflectors (203) are mounted on one side of the interior of the suction head bracket (201); a buckle (204) is arranged above the two reflectors (203); vacuum air inlets are arranged on both sides of the buckle (204) and above the suction head bracket (201); a sealing ring (205) is arranged at the vacuum air inlet above the suction head bracket (201); and a positioning sleeve (206) is respectively mounted on both sides of the bottom of the suction head bracket (201).

6. The fixture for precision testing of photosensitive chips according to claim 5, characterized in that: A first square boss is provided on the left side of the bottom of the suction head (202), and a central light-transmitting hole and vacuum air holes on both sides are opened on the first square boss, and the vacuum air holes on both sides are connected to the vacuum air inlet.

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