Sample analyzer and sample analysis system

Abstract

The embodiment of the invention provides a sample analyzer and a sample analysis system, and a sample scheduling device of the sample analyzer comprises a storage channel used for a user to put in and take out a sample rack used for bearing samples; the sample suction channel is used for the analysis device to suck the sample carried by the sample rack in the sample suction channel; the dispatching assembly is at least used for dispatching the sample frames between the storage channel and the sample suction channel, the dispatching assembly comprises a first guide rail and a dispatching part used for bearing the sample frames, and the dispatching part is connected with the first guide rail and can move in the extending direction of the first guide rail relative to the first guide rail; the dispatching component dispatches the sample rack between the storage channel and the sample suction channel; wherein, when the scheduling part moves to the second free end of the first guide rail, the first orthographic projection of the scheduling part on the horizontal reference plane along the axis of the first guide rail can be at least partially located outside the second orthographic projection of the first guide rail on the horizontal reference plane.

Description

Technical Field

[0001] The present application relates to the technical field of medical equipment, and in particular to a sample analyzer and a sample analysis system. Background Art

[0002] In order to improve the test efficiency, existing hospitals or laboratories usually use multiple sample analyzers to test samples. In the related art, the sample analyzer usually cascades multiple sample analyzers through the front track and the independent sample scheduling device. The whole machine occupies a large area and has a complex structure. There are also some related technologies that realize sample scheduling by moving the injection channel between multiple sample analyzers, which is inconvenient for users to place the sample to be tested into the injection channel. Summary of the invention

[0003] The embodiments of the present application provide a sample analyzer and a sample analysis system, which can realize cascading of sample analyzers in a relatively simple manner, thereby realizing a sample analysis system with a relatively small volume and a simple structure.

[0004] In a first aspect, an embodiment of the present application provides a sample analyzer, comprising:

[0005] An analysis device, used to test the sample to obtain a test result;

[0006] A sample scheduling device, used for performing sample scheduling, and the sample scheduling device comprises:

[0007] A storage channel, used for users to put in and take out sample racks, wherein the sample racks are used to carry samples;

[0008] A sample suction channel, used for the analysis device to suck samples carried by the sample rack in the sample suction channel;

[0009] A scheduling component, at least used for scheduling the sample rack between the storage channel and the sample aspiration channel, the scheduling component comprising a first guide rail and a scheduling component for carrying the sample rack, the scheduling component being connected to the first guide rail and being movable relative to the first guide rail in the extension direction of the first guide rail so that the scheduling component schedules the sample rack between the storage channel and the sample aspiration channel;

[0010] Wherein, the first guide rail has a first free end and a second free end opposite to each other, and the second free end of the first guide rail is an end away from the analysis device; when the scheduling component moves to the second free end of the first guide rail, the first orthographic projection of the scheduling component on the horizontal reference plane along the axis of the first guide rail may be at least partially outside the second orthographic projection of the first guide rail on the horizontal reference plane.

[0011] In a second aspect, an embodiment of the present application provides a sample analysis system, including a first sample analyzer and a second sample analyzer connected in cascade;

[0012] The first sample analyzer includes a first analysis device and a first sample scheduling device, wherein the first analysis device is used to detect samples and obtain detection results; the first sample scheduling device includes: a first storage channel for users to put in and take out sample racks; a first sample suction channel for the first analysis device to suck samples carried by the sample rack in the first sample suction channel; a first scheduling component, at least used to schedule the sample rack between the first storage channel and the first sample suction channel;

[0013] The second sample analyzer includes a second analysis device and a second sample scheduling device, wherein the second analysis device is used to detect the sample to obtain the detection result; the second sample scheduling device includes: a second storage channel for a user to put in and take out the sample rack; a second sample suction channel for the second analysis device to suck the sample carried by the sample rack in the second sample suction channel; a second scheduling component, at least used to schedule the sample rack between the second storage channel and the second sample suction channel;

[0014] Wherein, the first scheduling component comprises a first motion support component and a first scheduling component for carrying a sample rack, and the first scheduling component can move between a first scheduling position and a second scheduling position relative to the first motion support component under the support of the first motion support component;

[0015] Furthermore, the first scheduling position is located at the first sample scheduling device, and the second scheduling position is located at the second sample scheduling device. When the first scheduling component is located at the first scheduling position, the first scheduling component is used to schedule the sample rack between the first storage channel and the first sample suction channel;

[0016] When the first scheduling component is located at the second scheduling position, the first scheduling component is also used to schedule the sample rack in the first storage channel and / or the first sample aspiration channel to the second sample scheduling device, so that the second scheduling component can schedule the sample rack to the second storage channel and / or the second sample aspiration channel.

[0017] It can be seen from the technical solution provided in the present application that the sample analyzer provided in the present application arranges a scheduling component, and utilizes the scheduling component to schedule the sample rack between the storage channel and the sample aspiration channel of the sample analyzer, thereby realizing the scheduling of the samples carried on the sample rack in the sample analyzer.

[0018] Furthermore, based on the scheduling component including a first guide rail and a scheduling component, the scheduling component is arranged on the first guide rail and can move relative to the guide rail in the extension direction of the guide rail, and the scheduling component can be used to carry the sample rack, and when the scheduling component moves along the first guide rail to an end of the first guide rail away from the analysis device of the sample analyzer, the first orthographic projection of the scheduling component along the axis of the first guide rail on the horizontal reference plane can be at least partially located outside the second orthographic projection of the first guide rail on the horizontal reference plane, that is, the extension distance of the scheduling component in the extension direction of the first guide rail is greater than the first guide rail, so that the scheduling component can schedule the sample rack carried on the scheduling component to a distance that the first guide rail cannot extend, and there is no need to additionally set up a first scheduling mechanism to schedule the scheduling component or the sample rack carried on the scheduling component outside the first guide rail, and the longitudinal space of the sample analyzer in the vertical direction is fully utilized, so that the sample analyzer has a smaller volume and a simpler structure, and at the same time, the sample analysis system constructed based on the sample analyzer occupies a smaller area.

[0019] It should be understood that the above general description and the following detailed description are merely exemplary and explanatory and cannot limit the disclosure of the embodiments of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 is a schematic block diagram of a sample analysis system provided in an embodiment of the present application;

[0022] Figure 2 and Figure 3 is a schematic diagram of the structure of a sample analysis system provided in different implementation modes;

[0023] Figure 4 is a schematic diagram of a state change in which a scheduling component of a sample analyzer schedules a sample rack to outside the sample analyzer in one implementation;

[0024] Figure 5 is a schematic diagram of a state in which a scheduling component of a sample analyzer schedules a sample rack to outside the sample analyzer in one embodiment;

[0025] Figures 6 to 8 is a schematic diagram of state changes in which a scheduling component schedules a sample rack to outside a sample analyzer in different implementation modes;

[0026] Fig. 9is a three-dimensional structural diagram of a scheduling component provided by an embodiment;

[0027] Fig.10 is a schematic diagram of the structure of a sample analyzer in one embodiment. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0029] The flowcharts shown in the accompanying drawings are only examples and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps may also be decomposed, combined or partially merged, so the actual execution order may change according to actual conditions.

[0030] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0031] See also Figures 1 to 3 , Figure 1 A schematic diagram of the framework structure of a sample analysis system provided in an embodiment of the present application.

[0032] like Figures 1 to 3 As shown, the sample analysis system 1 includes a first sample analyzer 10 and a second sample analyzer 20. Among them, the first sample analyzer 10 and the second sample analyzer 20 can be cascaded to analyze the sample to be tested to obtain the cascade detection result corresponding to the sample. The first sample analyzer 10 and the second sample analyzer 20 can also independently analyze the sample to be tested to obtain the corresponding single-machine detection result. For example, the first sample analyzer 10 can analyze the sample to be tested to obtain a first detection result, and the second sample analyzer 20 can analyze the sample to be tested to obtain a second detection result. In the case of single-machine detection, if the first sample analyzer 10 is used to detect the sample to be tested, the first detection result corresponding to the sample to be tested can be obtained. If the second sample analyzer 20 is used to detect the sample to be tested, the second detection result corresponding to the sample to be tested can be obtained. If the first sample analyzer 10 and the second sample analyzer 20 are used to perform cascade detection on the sample to be tested, the first detection result and the second detection result corresponding to the sample to be tested can be obtained.

[0033] In some embodiments, the first sample analyzer 10 includes but is not limited to at least one of the following: a biochemical analyzer, an immunoassay analyzer, a coagulation analyzer, a urine analyzer, and an electrolyte analyzer.

[0034] The second sample analyzer 20 includes but is not limited to at least one of the following: a biochemical analyzer, an immunoassay analyzer, a coagulation analyzer, a urine analyzer, and an electrolyte analyzer, wherein the electrolyte analyzer is, for example, an ISE (Ion Selective Electrode) analyzer.

[0035] The first sample analyzer 10 and the second sample analyzer 20 may be analyzers of the same type or different types. For example, the first sample analyzer 10 is a biochemical analyzer for performing biochemical test on the sample to be tested, and the second sample analyzer 20 is an immunoanalyzer for performing immunological test on the sample to be tested. For another example, both the first sample analyzer 10 and the second sample analyzer 20 are biochemical analyzers for performing biochemical test on the sample, or both the first sample analyzer 10 and the second sample analyzer 20 are immunoanalyzers for performing immunological test on the sample.

[0036] like Figures 1 to 3 As shown, in some embodiments, the first sample analyzer 10 includes a first analysis device 100 and a first sample scheduling device 200. The first sample scheduling device 200 is used to perform sample scheduling, so as to at least schedule the sample to be analyzed to the first analysis device 100, and the first analysis device 100 is used to detect the sample to obtain a test result. Among them, the first analysis device 100 includes but is not limited to at least one of the following: a biochemical analysis device, an electrolyte analysis device, an immunoassay device, a coagulation analysis device, and a urine analysis device. Among them, the electrolyte analysis device is, for example, an ISE (Ion Selective Electrode, ionic electrode) analysis device.

[0037] Exemplarily, the first analysis device 100 may include a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, and a detection component. The sample dispensing mechanism sucks the sample to be tested in the sample rack carried by the first sample scheduling device 200, and dispenses the sucked sample to be tested into the reaction container in the reaction component. For example, the sample dispensing mechanism can perform two-dimensional or three-dimensional movement in space. When the sample dispensing mechanism moves to the sample suction position, it can suck the sample to be tested in the sample rack placed in the first sample scheduling device 200, transfer the sucked sample to be tested to the sample dispensing position in the reaction component where sample dispensing is to be performed, and dispense the sample to be tested into the reaction container located at the sample dispensing position.

[0038] The reagent dispensing mechanism adds the reagent in the reagent component to the reaction container so that the sample to be tested and the reagent in the reaction container are mixed to form a reaction liquid, and the reaction component is also used to incubate the reaction liquid, and the light detection mechanism of the detection component detects the incubated reaction liquid to obtain the detection result. For example, the reagent dispensing mechanism can perform two-dimensional or three-dimensional movement in space. When the reagent dispensing mechanism moves to the reagent suction position, the reagent dispensing mechanism can absorb the reagent carried by the reagent component and transfer the absorbed reagent to the corresponding reaction container so that the sample to be tested and the reagent in the reaction container are mixed to form a reaction liquid.

[0039] It can be understood that the order in which the first analysis device 100 dispenses the sample and the reagent into the reaction container is not limited here, that is, the sample dispensing mechanism may first dispense the corresponding sample to be tested into the reaction container, and then the reagent dispensing component may dispense the reagent into the reaction container carrying the sample to be tested, so that the sample and the reagent are mixed to form a reaction solution. Alternatively, the reagent dispensing component may first dispense the reagent into the reaction container, and then the sample dispensing mechanism may dispense the corresponding sample to be tested into the reaction container carrying the reagent, so that the sample and the reagent are mixed to form a reaction solution.

[0040] Exemplarily, the first analysis device 100 may further include other functional components such as a fluid circuit component, a display component, and a processor. The fluid circuit component is used to provide fluid circuit support, such as cleaning fluid, to the first analysis device 100. The display component may be used to display information.

[0041] In some implementations, the first sample analyzer 10 itself may be integrated with a display module. In some embodiments, the first sample analyzer 10 may also be connected to a computer device (eg, a computer) to display information through a display unit (eg, a display screen) of the computer device.

[0042] In some embodiments, the first sample scheduling device 200 is disposed near the first side 10A of the first sample analyzer 10, that is, the first sample scheduling device 200 is disposed on a side of the first sample analyzer 10 away from the second sample analyzer 20. Optionally, the first side 10A may be Figure 2 The left side shown is certainly not limited thereto, and may be, for example, the right side, the front side, or the rear side.

[0043] In some embodiments, the first sample analyzer 10 further includes a second side 10B, which is a side opposite to the first side 10A, that is, the second side 10B is a side of the first sample analyzer 10 close to the second sample analyzer 20. Among them, at least part of the structure of the first analysis device 100 is arranged close to the second side 10B of the first sample analyzer 10, such as the reagent component and the detection component of the first analysis device 100 are arranged close to the second side 10B of the first sample analyzer 10.

[0044] In some embodiments, the first sample scheduling device 200 includes a first storage channel 210, a first sample suction channel 220, and a first scheduling component 230. The first storage channel 210 is used to place a sample rack carrying samples. For example, the first sample scheduling device 200 is provided with a first sample injection mechanism 201, and the first sample injection mechanism 201 is formed with a plurality of first storage channels 210. The first storage channel 210 is used to carry samples placed by users. The samples placed by users are carried in sample containers (such as test tubes), and the sample containers are carried in the sample rack. Each sample rack carries at least one sample container. That is, the first storage channel 210 is used for users to put in and take out sample racks. The sample rack is used to carry samples. For example, the sample rack is provided with a plurality of container placement positions. Samples are stored in sample containers. By placing the sample containers in the container placement positions, the sample rack can carry the samples.

[0045] The first sample aspiration channel 220 is used for the first analysis device 100 to aspirate the sample carried by the sample rack in the first sample aspiration channel 220. For example, the sample dispensing mechanism of the first analysis device 100 aspirates the sample to be tested in the sample rack carried in the first sample aspiration channel 220 of the first sample scheduling device 200, and dispenses the aspirated sample to be tested into the reaction container in the reaction component to prepare a reaction solution with the reagent.

[0046] The first scheduling component 230 is used to schedule the sample rack between the first storage channel 210 and the first sample aspiration channel 220. For example, the sample rack in the first storage channel 210 is scheduled to the first sample aspiration channel 220 for sample aspiration, and the sample rack after sample aspiration can also be scheduled to the first storage channel 210.

[0047] like Figures 1 to 3 As shown, in some embodiments, the second sample analyzer 20 includes a second analysis device 300 and a second sample scheduling device 400. The second sample scheduling device 400 is used to schedule samples, so as to at least schedule samples to be analyzed to the second analysis device 300, and the second analysis device 300 is used to detect samples to obtain detection results.

[0048] The second analysis device 300 includes but is not limited to at least one of the following: a biochemical analysis device, an electrolyte analysis device, an immunoassay analysis device, a coagulation analysis device, and a urine analysis device. The electrolyte analysis device is, for example, an ISE (Ion Selective Electrode) analysis device.

[0049] Exemplarily, the second analysis device 300 may include a sample dispensing mechanism, a reagent component, a reagent dispensing mechanism, a reaction component, and a detection component. The sample dispensing mechanism sucks the sample to be tested in the sample rack carried by the second sample scheduling device 400, and dispenses the sucked sample to be tested into the reaction container in the reaction component. For example, the sample dispensing mechanism can perform two-dimensional or three-dimensional movement in space. When the sample dispensing mechanism moves to the sample suction position, it can suck the sample to be tested in the sample rack placed in the second sample scheduling device 400, transfer the sucked sample to be tested to the sample dispensing position in the reaction component where sample dispensing is to be performed, and dispense the sample to be tested into the reaction container located at the sample dispensing position.

[0050] The reagent dispensing mechanism adds the reagent in the reagent component to the reaction container so that the sample to be tested and the reagent in the reaction container are mixed to form a reaction liquid, and the reaction component is also used to incubate the reaction liquid, and the light detection mechanism of the detection component detects the incubated reaction liquid to obtain the detection result. For example, the reagent dispensing mechanism can perform two-dimensional or three-dimensional movement in space. When the reagent dispensing mechanism moves to the reagent suction position, the reagent dispensing mechanism can absorb the reagent carried by the reagent component and transfer the absorbed reagent to the corresponding reaction container so that the sample to be tested and the reagent in the reaction container are mixed to form a reaction liquid.

[0051] It is understood that the order in which the second analysis device 300 dispenses the sample and the reagent into the reaction container is not limited here, that is, the sample dispensing mechanism may first dispense the corresponding sample to be tested into the reaction container, and then the reagent dispensing component may dispense the reagent into the reaction container carrying the sample to be tested, so that the sample and the reagent are mixed to form a reaction solution. Alternatively, the reagent dispensing component may first dispense the reagent into the reaction container, and then the sample dispensing mechanism may dispense the corresponding sample to be tested into the reaction container carrying the reagent, so that the sample and the reagent are mixed to form a reaction solution.

[0052] Exemplarily, the second analysis device 300 may further include other functional components such as a fluid circuit component, a display component, and a processor. The fluid circuit component is used to provide fluid circuit support, such as cleaning fluid, to the second analysis device 300. The display component may be used to display information.

[0053] In some implementations, the second sample analyzer 20 itself may be integrated with a display module. In some embodiments, the second sample analyzer 20 may also be connected to a computer device (eg, a computer) to display information through a display unit (eg, a display screen) of the computer device.

[0054] In some embodiments, the second sample scheduling device 400 is disposed near the first side 20A of the second sample analyzer 20. Optionally, the first side 20A may be Figure 1The left side shown is certainly not limited thereto, and may be, for example, the right side, the front side, or the rear side.

[0055] In some embodiments, the second sample analyzer 20 further includes a second side 20B, which is opposite to the first side 20A. At least part of the second analysis device 300 , such as the reagent component and the detection component, is disposed near the second side 20B of the second sample analyzer 20 .

[0056] In some embodiments, the second sample scheduling device 400 includes a second storage channel 410, a second sample suction channel 420, and a second scheduling component 430. The second storage channel 410 is used to place a sample rack carrying samples, for example, for carrying samples placed by users, the samples placed by users are carried in sample containers (such as test tubes), the sample containers are carried in the sample rack, and each sample rack carries at least one sample container. That is, the second storage channel 410 is used for users to put in and take out sample racks, the sample racks are used to carry samples, for example, the sample rack is provided with a plurality of container placement positions, the samples are stored in the sample containers, and the sample racks carry the samples by placing the sample containers in the container placement positions.

[0057] The second sample suction channel 420 is used for the second analysis device 300 to suck samples from the sample rack in the second sample suction channel 420. For example, the sample dispensing mechanism of the second analysis device 300 sucks samples from the sample rack in the second sample suction channel 420 of the second sample scheduling device 400, and dispenses the sucked sample into the reaction container in the reaction component to prepare a reaction solution with the reagent.

[0058] The second scheduling component 430 is used to schedule the sample rack between the second storage channel 410 and the second sample aspiration channel 420. For example, the sample rack in the second storage channel 410 is scheduled to the second sample aspiration channel 420 for sample aspiration, and the sample rack after sample aspiration can also be scheduled to the second storage channel 410.

[0059] like Figure 2 As shown, in some embodiments, the cascade connection method of the first sample analyzer 10 and the second sample analyzer 20 can be that the first sample scheduling device 200 of the first sample analyzer 10 and the second sample scheduling device 400 of the second sample analyzer 20 are cascaded, so that the first sample analyzer 10 and the second sample analyzer 20 can schedule sample racks with each other.

[0060] Exemplarily, when the first scheduling component 232 of the first scheduling component 230 moves to a side close to the second sample analyzer 20, the first scheduling component 232 can schedule the sample rack thereon to the second sample scheduling device 400. When the second scheduling component 432 of the second scheduling component 430 moves to a side close to the first sample analyzer 10, the second scheduling component 432 can schedule the sample rack scheduled by the first scheduling component 232 to the second sample scheduling device 400 to the second storage channel 410 or the second sample suction channel 420. Conversely, the second sample analyzer 20 can also schedule the sample rack to the first sample analyzer 10.

[0061] like Figure 3 As shown, in some embodiments, the cascade mode of the first sample analyzer 10 and the second sample analyzer 20 can be that the sample analysis system 1 further includes a transfer channel 30, which is disposed between the first sample scheduling device 200 of the first sample analyzer 10 and the second sample scheduling device 400 of the second sample analyzer 20, and is used to cascade the first sample scheduling device 200 and the second sample scheduling device 400, so as to cascade the first sample analyzer 10 and the second sample analyzer 20. The transfer channel 30 is used to schedule the sample rack scheduled from the first sample analyzer 10 to the second sample analyzer 20, and / or to schedule the sample rack scheduled from the second sample analyzer 20 to the first sample analyzer 10.

[0062] Exemplarily, the first scheduling component 230 of the first sample analyzer 10 and the second scheduling component 430 of the second sample analyzer 20 transfer the sample rack through the transfer channel 30. For example, when the first scheduling component 232 of the first scheduling component 230 moves to a side close to the second sample analyzer 20, the first scheduling component 232 can schedule the sample rack on it to the transfer channel 30. When the second scheduling component 432 of the second scheduling component 430 moves to a side close to the first sample analyzer 10, the second scheduling component 432 can schedule the sample rack on the transfer channel 30 to the second storage channel 410 or the second sample suction channel 420. Conversely, the second sample analyzer 20 can also schedule the sample rack to the first sample analyzer 10. Of course, it is not limited to this. For example, the scheduling mechanism on the transfer channel 30 can schedule the sample rack on the transfer channel 30 to the second sample analyzer 20.

[0063] Optionally, no storage channel is provided on the transport channel 30, or the storage channel on the transport channel 30 can be sealed, and the user can place the sample rack on the first storage channel 210 of the first sample analyzer 10 and / or the second storage channel 410 of the second sample analyzer 20. This can prevent the sample rack from being stored incorrectly. Figures 2 to 4In some embodiments, the first scheduling component 230 includes a first motion support component 231 and a first scheduling component 232. The first motion support component 231 is used to provide support, and the first scheduling component 231 is used to carry the sample rack. In addition, the first scheduling component 231 is movably connected to the first motion support component 231 and can move relative to the first motion support component 231 to drive the sample rack to move relative to the first motion support component 231, thereby realizing the scheduling of the sample rack.

[0064] Exemplarily, the first motion support component 231 is provided with a first scheduling position and a second scheduling position. The first scheduling component 232 can move between the first scheduling position and the second scheduling position relative to the first motion support component 231 under the support of the first motion support component 231, thereby driving the sample rack to move between the first scheduling position and the second scheduling position. When the first scheduling component 232 is located at the first scheduling position, the first scheduling component 232 is used to schedule the sample rack between the first storage channel 210 and the first sample suction channel 220. When the first scheduling component 232 is located at the second scheduling position, the first scheduling component 230 is also used to schedule the sample rack in the first storage channel 210 and / or the first sample suction channel 220 to the second sample scheduling device 400 of the second sample analyzer 20, so that the second sample scheduling device 400 can schedule the sample rack to the second storage channel 410 and / or the second sample suction channel 420.

[0065] Optionally, when the first sample analyzer 10 and the second sample analyzer 20 are cascaded, the first scheduling position is located at the first sample scheduling device 100, and the second scheduling position is located outside the first sample analyzer 10. For example, the second scheduling position is located at the second sample scheduling device 400 of the second sample analyzer 20, or the second scheduling position is located at the transfer channel 30 arranged between the first analyzer 10 and the second analyzer 20.

[0066] For example, there are at least two first scheduling positions, wherein one first scheduling position is set corresponding to the first storage channel 210, and the other first scheduling position is set corresponding to the first sample suction channel 220. When the first scheduling component 232 moves to the first scheduling position corresponding to the first storage channel 210 relative to the first motion support component 231, the sample rack carried by the first storage channel 210 can be transferred to the first scheduling component 232, and dispatched to the first scheduling position corresponding to the first sample suction channel 220 by the first scheduling component 232, so as to facilitate the first analysis device 100 to suck and analyze the sample at the first scheduling position corresponding to the first sample suction channel 220. Alternatively, when the first scheduling component 232 moves to the first scheduling position corresponding to the first storage channel 210 relative to the first motion support component 231, the sample rack carried on the first scheduling component 232 can be transferred to the first storage channel 210.

[0067] When the first scheduling component 232 moves to a second scheduling position relative to the first moving support component 231, and the second scheduling position is located in the second sample scheduling device 400 of the second sample analyzer 20, the second sample scheduling device 400 schedules the sample rack scheduled to the second scheduling position by the first scheduling component 232 to the second storage channel 410 and / or the second sample suction channel 420.

[0068] When the first scheduling component 232 moves to the second scheduling position relative to the first moving support component 231, and the second scheduling position is located in the transfer channel 30, the sample rack scheduled to the second scheduling position by the first scheduling component 232 can be scheduled to the second storage channel 410 and / or the second sample suction channel 420 by the first scheduling mechanism 234 arranged in the transfer channel 30.

[0069] See also Figure 2 , Figure 4 and Figure 5 In some embodiments, the first moving support component 231 includes at least a first guide rail 2311, and the first scheduling component 232 is connected to the first guide rail 2311 and can move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, so that the first scheduling component 232 can schedule the sample rack between the first storage channel 210 and the first sample suction channel 220 at the first scheduling position.

[0070] Among them, the first guide rail 2311 has a first free end 2311a and a second free end 2311b relative to each other, and the second free end 2311b of the first guide rail 2311 is the end of the first guide rail 2311 away from the first analysis device 100. When the first scheduling component 232 moves to the second free end 2311b of the first guide rail 2311, the first orthographic projection of the first scheduling component 232 on the horizontal reference plane along the axis of the first guide rail 2311 may be at least partially located outside the second orthographic projection of the first guide rail 2311 on the horizontal reference plane.

[0071] like Figure 4 and Figure 5As shown, optionally, in the process of the first scheduling component 232 moving from the first free end 2311a of the first guide rail 2311 to the preset position, the area of ​​the overlapping part of the first orthographic projection of the first scheduling component 232 on the horizontal reference plane and the second orthographic projection of the first guide rail 2311 on the horizontal reference plane remains basically unchanged, and in the process of the first scheduling component 232 moving from the preset position to the second free end 2311b of the first guide rail 2311, the area of ​​the overlapping part of the first orthographic projection of the first scheduling component 232 on the horizontal reference plane and the second orthographic projection of the first guide rail 2311 on the horizontal reference plane gradually decreases, and the preset position is located between the first free end 2311a and the second free end 2311b of the first guide rail 2311.

[0072] It can be understood that the first guide rail 2311 includes but is not limited to a ridge-shaped guide rail and a groove-shaped guide rail, and due to machining errors, the parallelism and straightness of the first guide rail 2311, and the assembly accuracy of the first scheduling component 232 and the first guide rail 2311 may all affect the area of ​​the overlapping portion of the first orthographic projection and the second orthographic projection in the horizontal direction. Therefore, in the process of the first scheduling component 232 moving from the first free end 2311a of the first guide rail 2311 to the preset position, the area of ​​the overlapping portion of the first orthographic projection of the first scheduling component 232 on the horizontal reference plane and the second orthographic projection of the first guide rail 2311 on the horizontal reference plane remains unchanged, which means that the area of ​​the overlapping portion of the first orthographic projection of the first scheduling component 232 on the horizontal reference plane and the second orthographic projection of the first guide rail 2311 on the horizontal reference plane remains basically unchanged.

[0073] Optionally, when the first scheduling component 232 is located at the second free end 2311b of the first guide rail 2311, the first scheduling component 232 is located at the second scheduling position, that is, when the first scheduling component 232 is located at the second free end 2311b of the first guide rail 2311, the first scheduling component 232 is at least partially located outside the first sample analyzer 10, so that the first scheduling component 232 can schedule the carried sample rack to the outside of the first sample analyzer 10, such as the first scheduling component 232 can schedule the carried sample rack to the second sample scheduling device 400 of the second sample analyzer 20, such as Figure 2 shown.

[0074] Optionally, when the first scheduling component 232 moves to the second free end 2311b of the first guide rail 2311, the first orthographic projection of the first scheduling component 232 on the horizontal reference plane at least partially overlaps with the third orthographic projection of the second sample scheduling device 400 on the horizontal reference plane, that is, when the first scheduling component 232 moves to the second free end 2311b of the first guide rail 2311, the first scheduling component 232 at least partially moves into the second sample scheduling device 400 of the second sample analyzer 20, so that the second sample scheduling device 400 can schedule the sample on the sample rack carried by the first scheduling component 232 to the second analysis device 300 for analysis.

[0075] like Figure 4 and Figure 5 As shown, based on the first scheduling component 232 being located at the second free end 2311b of the first guide rail 2311, when the first scheduling component 232 moves to the second free end 2311b of the first guide rail 2311, the first orthographic projection of the first scheduling component 232 on the horizontal reference plane along the axis of the first guide rail 2311 may be at least partially located outside the second orthographic projection of the first guide rail 2311 on the horizontal reference plane, that is, the extension distance of the first scheduling component 232 in the direction in which the first guide rail 2311 extends is greater than the length of the first guide rail 2311, so that the first scheduling component 232 can schedule the sample rack carried on the first scheduling component 232 to a distance that the first guide rail 2311 cannot extend, and thus, there is no need to additionally set up a scheduling mechanism to schedule the first scheduling component 232 or the sample rack carried by the first scheduling component 232 to outside the first guide rail 2311, and the longitudinal space of the first sample analyzer 10 in the vertical direction is fully utilized, so that the first sample analyzer 10 has a smaller volume and a simpler structure, and at the same time, the sample analysis system constructed based on the sample analyzer 10 occupies a smaller area.

[0076] See also Figures 4 to 9 In some embodiments, the first scheduling component 232 includes a first moving mechanism 233 and a first scheduling mechanism 234 disposed on the first moving mechanism 233 .

[0077] The first dispatching mechanism 234 is at least used to carry the sample rack, and the first moving mechanism 233 is movably connected to the first guide rail 2311, and can drive the first dispatching mechanism 234 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, so that the first dispatching mechanism 234 dispatches the sample rack between the first storage channel 210 and the first sample suction channel 220. In particular, when the first moving mechanism 233 moves to the second free end 2311b of the first guide rail 2311, the third orthographic projection of the first dispatching mechanism 234 on the horizontal reference plane along the axis of the first guide rail 2311 can be at least partially located outside the second orthographic projection, and the second orthographic projection is the orthographic projection of the first guide rail 2311 on the horizontal reference plane.

[0078] like Figure 4 and Figure 5 As shown, optionally, when the first moving mechanism 233 moves to the second free end 2311b of the first guide rail 2311, the third orthographic projection of the first scheduling mechanism 234 on the horizontal reference plane along the axis of the first guide rail 2311 can be entirely located outside the second orthographic projection, so that the sample rack carried by the first scheduling mechanism 234 can be scheduled outside the first sample scheduling device 200 of the first sample analyzer 10, such as, scheduled into the second sample scheduling device 400 of the second sample analyzer 20100, or scheduled into the transfer channel 30.

[0079] like Figure 4 As shown, in some embodiments, the first moving mechanism 233 drives the first dispatching mechanism 234 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, and the first moving mechanism 233 includes a first moving part 2331 slidably connected to the first guide rail 2311 and a first driving part 2332 for driving the first moving part 2331 to move relative to the first guide rail 2311, and the first dispatching mechanism 234 is disposed on the first moving mechanism 233. Driven by the first driving part 2332, the first moving mechanism 233 can move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, thereby driving the first dispatching mechanism 234 disposed on the first moving part 2331 to move relative to the first guide rail 2311, thereby achieving the movement and dispatching of the sample rack carried on the first dispatching mechanism 234 along the extension direction of the first guide rail 2311.

[0080] It can be understood that the first driving component 2332 can be one or more, which is not limited here.

[0081] like Figure 5 and Figure 6As shown, optionally, the first moving component 2331 includes a first sliding member 2333 slidably connected to the first guide rail 2311, and the first dispatching mechanism 234 is fixed to the first sliding member 2333, such as the first dispatching mechanism 234 is installed on the first sliding member 2333 and forms a cantilever structure with an offset. The first driving component 2332 is used to drive the first sliding member 2333 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311. In which, when the first sliding member 2333 drives the first dispatching mechanism 234 to move to the second free end 2311b of the first guide rail 2311, the third orthographic projection of the first dispatching mechanism 234 on the horizontal reference plane along the axis of the first guide rail 2311 is at least partially located outside the second orthographic projection, or can be completely located outside the second orthographic projection, and the second orthographic projection is the orthographic projection of the first guide rail 2311 on the horizontal reference plane.

[0082] In this embodiment, the first scheduling mechanism 234 is fixed to the first sliding member 2333 and forms an offset cantilever structure. The first moving mechanism 233 drives the first sliding member 2333 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, thereby driving the first scheduling mechanism 234 set on the first sliding member 2333 to move in the extension direction of the first guide rail 2311, and when the first sliding member 2333 drives the first scheduling mechanism 234 to move to the second free end 2311b of the first guide rail 2311, the first scheduling mechanism 234 extends outside the first guide rail 2333, so that the sample rack carried by the first scheduling mechanism 234 can be scheduled to the outside of the first sample scheduling device 200 of the first sample analyzer 10, such as, scheduled to the second sample scheduling device 400 of the second sample analyzer 20100, or scheduled to the transfer channel 30.

[0083] like Figure 5 and Figure 7 As shown, optionally, the first moving mechanism 233 also includes a second driving component (not shown), the first moving component 2331 includes a second guide rail 2334 slidably connected to the first guide rail 2311, and the second guide rail 2334 has a first free end 2334a and a second free end 2334b relative to each other, the second free end 2334b of the second guide rail 2334 and the second free end 2311b of the first guide rail 2311 are on the same side, and the first scheduling mechanism 234 is arranged on the second guide rail 2334 and can move relative to the second guide rail 2334 in the extension direction of the second guide rail 2334.

[0084] The first driving component 2332 is used to drive the second guide rail 2334 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311, so as to drive the first dispatching mechanism 234 disposed on the second guide rail 2334 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311. The second driving component is used to drive the first dispatching mechanism 234 to move relative to the second guide rail 2334 in the extension direction of the second guide rail 2334.

[0085] When the second guide rail 2334 moves to the second free end 2311b of the first guide rail 2311, and when the first scheduling mechanism 234 moves to the second free end 2334b of the second guide rail 2334, the third orthographic projection of the first scheduling mechanism 234 on the horizontal reference plane along the axis of the first guide rail 2311 may be at least partially outside the second orthographic projection, or may be completely outside the second orthographic projection, and the second orthographic projection is the orthographic projection of the first guide rail 2311 on the horizontal reference plane, so that the sample rack carried by the first scheduling mechanism 234 can be scheduled outside the first sample scheduling device 200 of the first sample analyzer 10, such as, scheduled into the second sample scheduling device 400 of the second sample analyzer 20100, or scheduled into the transfer channel 30.

[0086] In this embodiment, the first moving mechanism 233 drives the first dispatching mechanism 234 to move on the first guide rail 2311 and the second guide rail 2334 through two different driving components.

[0087] like Figure 5 , Figure 8 and Fig. 9 As shown, the first moving component 2331 includes a second guide rail 2334 slidably connected to the first guide rail 2311, and the first dispatching mechanism 234 is disposed on the second guide rail 2334 and can move relative to the second guide rail 2334 in the extension direction of the second guide rail 2334. The first driving component 2332 is used to drive the second guide rail 2334 to move relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 and synchronously drive the first dispatching mechanism 234 to move relative to the second guide rail 2334 in the extension direction of the second guide rail 2334, and the movement direction of the second guide rail 2334 relative to the first guide rail 2311 and the movement direction of the first dispatching mechanism 234 relative to the second guide rail 2334 are the same.

[0088] In which, when the second guide rail 2334 moves to the second free end of the first guide rail 2311, the third orthographic projection of the first scheduling mechanism 234 along the axis of the first guide rail 2311 on the horizontal reference plane may be at least partially outside the second orthographic projection, or may be completely outside the second orthographic projection, so that the sample rack carried by the first scheduling mechanism 234 can be scheduled outside the first sample scheduling device 200 of the first sample analyzer 10, such as, scheduled into the second sample scheduling device 400 of the second sample analyzer 20100, or scheduled into the transfer channel 30.

[0089] In this embodiment, the first moving mechanism 233 drives the first dispatching mechanism 234 to move on the first guide rail 2311 and the second guide rail 2334 through a driving component.

[0090] See also Figure 4 The first free end of the first guide rail 2311 is correspondingly provided with a first position, and the second free end of the first guide rail 2311 is correspondingly provided with a second position.

[0091] The first sample scheduling device 200 also includes a first limiting component 240, which is arranged at the third position of the first guide rail 2311 and is used to limit the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 between the first position and the third position, wherein the third position is located between the first position and the second position.

[0092] Optionally, the first limit assembly 240 is detachably connected to the first guide rail 2311, wherein, when the first limit assembly 240 is connected to the first guide rail 2311, the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the third position; after the first limit assembly 240 is removed from the first guide rail 2311, the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the second position.

[0093] Alternatively, the first limit assembly 240 has a switchable locking state and unlocking state. When the first limit assembly 240 is in the locked state, the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the third position; when the first limit assembly 240 is in the unlocked state, the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the second position.

[0094] That is, when the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the third position, the first scheduling component 232 can perform sample rack scheduling in the first sample analyzer 10 .

[0095] When the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the second position, the first scheduling component 232 can schedule the sample rack in the first sample analyzer 10 to outside the first sample analyzer 10 .

[0096] For example, when the first sample analyzer 10 works alone, the first limit assembly 240 limits the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 to be between the first position and the third position. When the first sample analyzer 10 is cascaded with other sample analyzers, the first limit assembly 240 is unlocked or the first limit assembly 240 is disassembled, so that the movable range of the first scheduling component 232 relative to the first guide rail 2311 in the extension direction of the first guide rail 2311 is between the first position and the second position, so that the first scheduling component 232 can schedule the sample rack in the first sample suction channel 220 or the first storage channel 210 to the second scheduling device 400, or schedule the sample rack of the second scheduling device 400 to the first sample suction channel 220 or the first storage channel 210.

[0097] It is understood that the first limiting assembly 240 includes but is not limited to limiting bolts and limiting pins. The user can realize the conversion between the stand-alone operation and the cascade operation of the first sample analyzer 10 by disassembling or installing the first limiting assembly 240, which is convenient, fast and has good compatibility.

[0098] See also Fig.10 In some embodiments, the first sample analyzer 10 further includes a rack 310 , and the rack 310 is used to carry the first sample scheduling device 200 . Preferably, the rack 310 is used to carry the first sample scheduling device 200 and the first analysis device 100 .

[0099] When the first scheduling component 232 moves to the second free end 2311a of the first guide rail 2311, the first orthographic projection of the first scheduling component 232 on the horizontal reference plane may be at least partially located outside the orthographic projection of the rack 310 on the horizontal reference plane, so that the first scheduling component 232 can schedule the sample rack carried by the first scheduling component 232 to outside the first sample scheduling device 200 of the first sample analyzer 10.

[0100] In some embodiments, the first sample analyzer 10 also includes a first surface shell (not shown), which is installed on the sample rack 310, and the first surface shell forms an internal area around at least the first sample scheduling device 200. Preferably, the first sample scheduling device 200 and the first analysis device 100 are both arranged in the internal area formed by the first surface shell, and the movement of the first scheduling component 230 can make the first scheduling component 232 be located outside the internal area formed by the first surface shell.

[0101] Optionally, the first sample analyzer 10 is configured with an opening (not shown) on the first side 10A of the first shell, and the opening can allow the first scheduling component 232 to pass through. For example, when the opening is opened, the first scheduling component 232 moves through the opening to the outside of the inner area formed by the first shell. When the opening is opened, the first scheduling component 232 moves from the outside of the inner area formed by the first shell to the inner area formed by the first shell through the opening.

[0102] Optionally, a shielding member is provided on the opening, and the shielding member is used to open or close the opening, for example, the shielding member can be detachable. When the first sample analyzer 10 is cascaded with other sample analyzers, such as the second sample analyzer 20, the opening can be opened so that the first scheduling component 232 moves through the opening to the outside of the internal area formed by the first face shell, for example, the first scheduling component 232 schedules the sample rack to the outside of the first sample analyzer 10 or receives the sample rack outside the first sample analyzer 10. When the first sample analyzer 10 works alone, the opening can be closed to prevent external contaminants from contaminating the sample or contaminants inside the sample analyzer from diffusing through the opening.

[0103] For example, the first housing shell encloses a first accommodating space, and at least the first analysis device 100, the first sample suction channel 220, and the first scheduling component 230 are accommodated in the first accommodating space, and the first accommodating space has a first opening and a second opening, and the first opening and the second opening do not overlap. Among them, the first storage channel 210 is at least partially accommodated in the first accommodating space, and the first opening is used for the user to put the sample rack into the first storage channel 210 and take out the sample rack from the first storage channel 210. Alternatively, the first storage channel 210 is located outside the first accommodating space and the first storage channel 210 is connected to the first accommodating space through the first opening, so that the first scheduling component 230 can schedule the sample rack between the first storage channel 210 and the first sample suction channel 220 through the first opening.

[0104] The first scheduling component 230 is also used to schedule the sample rack in the first sample suction channel 220 or the first storage channel 210 from the first accommodating space to the outside of the first accommodating space through the second opening, or schedule the sample rack outside the first accommodating space to the first accommodating space through the second opening. For example, the first scheduling component 230 is also used to schedule the sample rack in the first sample suction channel 220 or the first storage channel 210 to the second sample analyzer 20 or the transport channel 30 through the second opening.

[0105] Optionally, the first surface shell includes at least two sub-surface shells, the at least two sub-surface shells enclose a first accommodating space, and a second opening is formed on the end surfaces of the at least two sub-surface shells, and the second opening is provided with a detachably connected baffle for covering the second opening.

[0106] Optionally, when the first scheduling component 232 is at the first free end 2311a of the first guide rail 2311, the entire first scheduling component 232 is located in the first accommodating space, and when the first scheduling component 232 is at the second free end 2311b of the first guide rail 2311, at least a portion of the first scheduling component 232 can pass through the second opening and be exposed outside the first accommodating space.

[0107] In some embodiments, the second scheduling component 430 and the first scheduling component 230 have the same structure, that is, the second scheduling component 430 includes a second motion support component 431 and a second scheduling component 432. The second motion support component 231 is used to provide support, and the second scheduling component 431 is used to carry the sample rack, and the second scheduling component 431 is movably connected to the second motion support component 431 and can move relative to the second motion support component 431 to drive the sample rack to move relative to the second motion support component 431, thereby at least realizing the scheduling of the sample rack in the second sample analyzer 20.

[0108] In some embodiments, the second sample analyzer 20 also includes a second surface shell (not shown), and the second sample scheduling device 400 is surrounded by the second surface shell to form an internal area. Preferably, the second sample scheduling device 400 and the second analysis device 300 are both installed in the second surface shell to form an internal area; the movement of the second scheduling component 430 can enable the second scheduling component 432 to be located outside the internal area formed by the second surface shell.

[0109] Optionally, the second sample analyzer 20 is configured with an opening (not shown) on the second side shell of the first side 20A, and the opening can allow the second scheduling component 432 to pass through. For example, when the opening is opened, the second scheduling component 432 moves through the opening to the outside of the inner area formed by the second side shell. When the opening is opened, the second scheduling component 432 moves from the outside of the inner area formed by the second side shell to the inner area formed by the second side shell through the opening.

[0110] Optionally, a shielding member is provided on the opening, and the shielding member is used to open or close the opening, for example, the shielding member can be detachable, and the shielding member includes but is not limited to a baffle. When the second sample analyzer 20 is cascaded with other sample analyzers, such as the second sample analyzer 20, the opening can be opened so that the second scheduling component 432 moves through the opening to the outside of the internal area formed by the second face shell, for example, the second scheduling component 432 schedules the sample rack to the outside of the second sample analyzer 20 or receives the sample rack outside the second sample analyzer 20. When the second sample analyzer 20 works alone, the opening can be closed to prevent external contaminants from contaminating the sample or contaminants inside the sample analyzer from diffusing through the opening.

[0111] For example, the second housing shell encloses a second accommodating space, and at least the second analysis device 300, the second sample suction channel 420, and the second scheduling component 430 are accommodated in the second accommodating space, and the second accommodating space has a third opening and a fourth opening, and the third opening and the fourth opening do not overlap. Among them, the second storage channel 410 is at least partially accommodated in the second accommodating space, and the third opening is used for the user to put the sample rack into the second storage channel 410 and take out the sample rack from the second storage channel 410. Alternatively, the second storage channel 410 is located outside the second accommodating space and the second storage channel 410 is connected to the second accommodating space through the third opening, so that the second scheduling component 430 can schedule the sample rack between the second storage channel 410 and the second sample suction channel 420 through the third opening.

[0112] The second scheduling component 430 is also used to schedule the sample rack in the second sample suction channel 420 or the second storage channel 410 from the second accommodating space to the outside of the second accommodating space through the fourth opening, or to schedule the sample rack outside the second accommodating space to the second accommodating space through the fourth opening. For example, the second scheduling component 430 is also used to schedule the sample rack in the second sample suction channel 420 or the second storage channel 410 to the second sample analyzer 20 or the transport channel 30 through the fourth opening.

[0113] Optionally, the second surface shell includes at least two sub-surface shells, the at least two sub-surface shells enclose a second accommodating space, and a fourth opening is formed on the end surfaces of the at least two sub-surface shells, and the fourth opening is provided with a detachably connected baffle for covering the fourth opening.

[0114] In some embodiments, the first storage channel 210 is at least partially accommodated in the first accommodation space, and the first opening is used for a user to put a sample rack into the first storage channel 210 and take a sample rack out of the first storage channel 210. Alternatively, the first storage channel 210 is located outside the first accommodation space and the first storage channel 210 is connected to the first accommodation space through the first opening, so that the first scheduling component 230 can schedule the sample rack between the first storage channel 210 and the first sample suction channel through the first opening.

[0115] The second storage channel 410 is at least partially accommodated in the second accommodation space, and the third opening is used for the user to put the sample rack into the second storage channel 410 and take the sample rack out of the second storage channel 410. Alternatively, the second storage channel 410 is located outside the second accommodation space and the second storage channel 410 is connected to the second accommodation space through the third opening, so that the second scheduling component 430 can schedule the sample rack between the second storage channel 410 and the second sample suction channel through the third opening;

[0116] When the first sample analyzer 10 and the second sample analyzer 20 are cascaded, the first scheduling component 230 is also used to schedule the sample rack in the first sample suction channel or the first storage channel 210 from the first accommodating space to the second accommodating space through the second opening and the fourth opening in sequence, or to schedule the sample rack in the second accommodating space to the first accommodating space through the fourth opening and the second opening in sequence.

[0117] In some embodiments, the first sample analyzer 10 further includes a controller (not shown), which is used to control the first scheduling component 230 to schedule the sample rack carrying the sample to the first sample suction channel 220 or to the outside of the first sample analyzer 10 according to the detection item of the sample. Exemplarily, when the first sample analyzer 10 is cascaded with other sample analyzers, the controller controls the first scheduling component 230 to schedule the sample rack carrying the sample to the first sample suction channel 220 or to the outside of the first sample analyzer 10 according to the detection item of the sample.

[0118] For example, the controller can determine whether the first sample analyzer 10 is cascaded with other sample analyzers according to user settings, and can also determine whether the first sample analyzer 10 is cascaded with other sample analyzers according to whether the opening on the face shell is open, and can also determine whether the first sample analyzer 10 is cascaded with other sample analyzers according to the user settings. Figure 4 Whether the first limiting assembly 240 is disassembled determines whether the first sample analyzer 10 is cascaded with other sample analyzers.

[0119] like Figure 4 As shown, in some embodiments, the first sample scheduling device 200 also includes a first in-situ detection device 250, which is used to detect whether the first scheduling component 232 is outside the first sample analyzer 10 or inside the first sample analyzer 10, and outputs prompt information at least when the first scheduling component 232 is outside the first sample analyzer 10.

[0120] Exemplarily, the first in-place detection device 250 includes an optocoupler device, and when the first scheduling component 232 passes through the first in-place detection device 250 during movement, the optocoupler device is triggered to output a specific signal. For example, the controller can determine that the first scheduling component 232 passes through the first in-place detection device 250 based on the specific signal, thereby determining the position of the first scheduling component 232.

[0121] For example, when the first sample analyzer 10 is turned on, the first in-situ detection device 250 can be used to determine whether the first scheduling component 232 is outside the first sample analyzer 10 or inside the first sample analyzer 10; the first moving mechanism 233 can be controlled to drive the first scheduling component 232 to move according to the determination result. For example, when the first scheduling component 232 is outside the first sample analyzer 10, the first moving mechanism 233 is controlled to drive the first scheduling component 232 to move to the inside of the first sample analyzer 10.

[0122] For example, when the first sample analyzer 10 is cascaded with other sample analyzers, the first scheduling component 232 can output prompt information to the cascaded sample analyzers, such as the second sample analyzer 20, when it is outside the first sample analyzer 10, prompting the cascaded sample analyzers to avoid the first scheduling component 232.

[0123] For example, when the first scheduling component 232 extends into the second sample analyzer 20 , the second sample analyzer 20 is prompted to operate its second scheduling component 430 inside the second sample analyzer 20 to prevent the first scheduling component 232 from colliding with the second scheduling component 430 .

[0124] like Figure 2 and Figure 3 As shown, in some embodiments, the first sample scheduling device 200 also includes a first identification channel 260, which is used to identify the information of the sample rack in the first identification channel 260; the first scheduling component 230 is used to schedule the sample rack in the first storage channel 210 to the first identification channel 260 for identification, and schedule the identified sample rack to the first sample suction channel 220 or schedule the identified sample rack to the outside of the first sample analyzer 10.

[0125] For example, the controller may control the first scheduling component 230 to schedule the identified sample rack to the first sample suction channel 220 or to schedule the identified sample rack to the outside of the first sample analyzer 10 according to the information of the identified sample rack.

[0126] Exemplarily, the first scheduling component 230 is used to schedule the identified sample rack to the first sample suction channel 220 when the detection items of the samples on the sample rack in the first identification channel 260 include the detection items of the first sample analyzer 10 .

[0127] Exemplarily, the first scheduling component 230 is used to schedule the identified sample rack to the outside of the first sample analyzer 10 when the detection items of the samples on the sample rack in the first identification channel 260 do not include the detection items of the first sample analyzer 10, but include the detection items of other sample analyzers cascaded with the first sample analyzer 10. For example, the identified sample rack is scheduled to other sample analyzers cascaded with the first sample analyzer 10 so as to perform the detection items of the cascaded sample analyzers. That is, the first scheduling component 230 is also used to schedule the identified sample rack to the second scheduling device 400 or to the transfer channel 30 between the cascaded first sample analyzer 10 and the second sample analyzer 20.

[0128] Exemplarily, the first scheduling component 230 is used to schedule the identified sample rack to the first sample aspiration channel 220 when the detection items of the samples on the sample rack in the first identification channel 260 include the detection items of the first sample analyzer 10 and the detection items of other sample analyzers cascaded with the first sample analyzer 10, and to schedule the sample rack from the first sample aspiration channel 220 to the outside of the first sample analyzer 10 after the sample aspiration is completed, for example, scheduling the sample rack to other sample analyzers cascaded with the first sample analyzer 10, so as to perform the detection items of the cascaded sample analyzers.

[0129] Exemplarily, the first scheduling component 230 is also used to schedule the identified sample rack to the transfer channel 30 , or schedule the sample rack in the transfer channel 30 to the first sample suction channel 220 or the first storage channel 210 .

[0130] See also Figure 2 or Figure 3 In some embodiments, the second sample analyzer 20 cascaded with the first sample analyzer 10 includes a second transfer channel 470. The first scheduling component 230 can schedule the identified sample rack to the second transfer channel 470 of the second sample analyzer 20 during the process of scheduling the sample rack to the outside of the first sample analyzer 10, so that the second sample scheduling device 400 of the second sample analyzer 20 can schedule the sample rack in the second transfer channel 470 to the second analysis device 300 for detection.

[0131] Exemplarily, the first scheduling component 230 includes a carrying channel for carrying the sample rack and a transfer member for transferring the sample rack. When the first scheduling component 230 moves to the second free end 2311b of the first guide rail 2311, the carrying channel is connected to the second transfer channel 470 to allow the transfer member to transfer the sample rack between the carrying channel and the second transfer channel 470; the second scheduling component 430 is at least also used to schedule the sample rack between the second storage channel 410 and the second transfer channel 470.

[0132] The transfer member is used to transfer the sample rack carried by the second transfer channel 470 to the carrying channel of the first scheduling component 230, or to transfer the sample rack carried by the carrying channel of the first scheduling component 230 to the second transfer channel 470. The transfer member includes but is not limited to a hook structure that can hook and push the sample rack to transfer.

[0133] See also Figure 2 or Figure 3 In some embodiments, the first sample scheduling device 200 further includes a first transfer channel 270. When the first scheduling component 230 schedules the identified sample rack to the outside of the first sample analyzer 10, the identified sample rack is scheduled to the first transfer channel 270 of the first sample scheduling device 200. The second sample scheduling device 400 of the second sample analyzer 20 can also schedule the sample rack outside the second sample analyzer 20, such as the sample rack in the first transfer channel 270, to its second sample suction channel 420 or second storage channel 410. The structure of the second sample scheduling device 400 can be the same as that of the first sample scheduling device 200.

[0134] The specific principles and implementation methods of the sample analysis system provided in the embodiment of the present application are similar to those of the first sample analyzer 10 in the aforementioned embodiment, and will not be described in detail here.

[0135] It should be understood that the terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0136] It will also be understood that the term "and / or" as used in this application and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0137] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A sample analyzer, characterized in that: include: An analysis device, used to test the sample to obtain a test result; A sample scheduling device, used for performing sample scheduling, and the sample scheduling device comprises: A storage channel, used for users to put in and take out sample racks, wherein the sample racks are used to carry samples; A sample suction channel, used for the analysis device to suck samples carried by the sample rack in the sample suction channel; A scheduling component, at least used for scheduling the sample rack between the storage channel and the sample aspiration channel, the scheduling component comprising a first guide rail and a scheduling component for carrying the sample rack, the scheduling component being connected to the first guide rail and being movable relative to the first guide rail in the extension direction of the first guide rail so that the scheduling component schedules the sample rack between the storage channel and the sample aspiration channel; Wherein, the first guide rail has a first free end and a second free end opposite to each other, and the second free end of the first guide rail is an end away from the analysis device; when the scheduling component moves to the second free end of the first guide rail, the first orthographic projection of the scheduling component on the horizontal reference plane along the axis of the first guide rail may be at least partially outside the second orthographic projection of the first guide rail on the horizontal reference plane.

2. The sample analyzer according to claim 1, characterized in that: In the process of moving the scheduling component from the first free end of the first guide rail to the preset position, the area of ​​the overlapping part of the first orthographic projection of the scheduling component on the horizontal reference plane and the second orthographic projection of the first guide rail on the horizontal reference plane remains basically unchanged, and in the process of moving the scheduling component from the preset position to the second free end of the first guide rail, the area of ​​the overlapping part of the first orthographic projection of the scheduling component on the horizontal reference plane and the second orthographic projection of the first guide rail on the horizontal reference plane gradually decreases.

3. The sample analyzer according to claim 1, characterized in that: The dispatching component includes a first moving mechanism and a first dispatching mechanism arranged on the first moving mechanism; The first dispatching mechanism is at least used for carrying the sample rack, and the first moving mechanism is movably connected to the first guide rail and can drive the first dispatching mechanism to move relative to the first guide rail in the extension direction of the first guide rail, so that the first dispatching mechanism dispatches the sample rack between the storage channel and the sample aspiration channel; Wherein, when the first moving mechanism moves to the second free end of the first guide rail, the third orthographic projection of the first dispatching mechanism on the horizontal reference plane along the axis of the first guide rail may be entirely located outside the second orthographic projection.

4. The sample analyzer according to claim 3, characterized in that: The first moving mechanism includes a moving component slidably connected to the first guide rail and a first driving component for driving the moving component to move relative to the first guide rail.

5. The sample analyzer according to claim 4, characterized in that: The moving component includes a sliding member slidably connected to the first guide rail, the first dispatching mechanism is fixed to the sliding member, and the first driving component is used to drive the sliding member to move relative to the first guide rail in the extension direction of the first guide rail; Wherein, when the sliding member drives the first dispatching mechanism to move to the second free end of the first guide rail, the third orthographic projections of the first dispatching mechanism on the horizontal reference plane along the axis of the first guide rail are all located outside the second orthographic projection.

6. The sample analyzer according to claim 4, characterized in that: The first moving mechanism further includes a second driving component, the moving component includes a second guide rail slidably connected to the first guide rail, and the second guide rail has a first free end and a second free end opposite to each other, the second free end of the second guide rail and the second free end of the first guide rail are on the same side, the first dispatching mechanism is arranged on the second guide rail, and can move relative to the second guide rail in the extension direction of the second guide rail; The first driving component is used to drive the second guide rail to move relative to the first guide rail in the extension direction of the first guide rail, so as to drive the first dispatching mechanism disposed on the second guide rail to move relative to the first guide rail in the extension direction of the first guide rail; the second driving component is used to drive the first dispatching mechanism to move relative to the second guide rail in the extension direction of the second guide rail; When the second guide rail moves to the second free end of the first guide rail and when the first dispatching mechanism moves to the second free end of the second guide rail, the third orthographic projection of the first dispatching mechanism on the horizontal reference plane along the axis of the first guide rail may be entirely outside the second orthographic projection.

7. The sample analyzer according to claim 4, characterized in that: The moving component includes a second guide rail slidably connected to the first guide rail, and the first dispatching mechanism is arranged on the second guide rail and can move relative to the second guide rail in the extension direction of the second guide rail; The first driving component is used to drive the second guide rail to move relative to the first guide rail in the extension direction of the first guide rail and synchronously drive the first dispatching mechanism to move relative to the second guide rail in the extension direction of the second guide rail, and the movement direction of the second guide rail relative to the first guide rail is the same as the movement direction of the first dispatching mechanism relative to the second guide rail; Wherein, when the second guide rail moves to the second free end of the first guide rail, the third orthographic projection of the first dispatching mechanism on the horizontal reference plane along the axis of the first guide rail may be entirely located outside the second orthographic projection.

8. The sample analyzer according to claim 1, characterized in that: The first free end of the first guide rail is correspondingly provided with a first position, and the second free end of the first guide rail is correspondingly provided with a second position; The sample scheduling device also includes a limit assembly, which is arranged at a third position of the first guide rail and is used to limit the movable range of the scheduling component relative to the first guide rail in the extension direction of the first guide rail between the first position and the third position, wherein the third position is located between the first position and the second position.

9. The sample analyzer according to claim 8, characterized in that: The limit assembly is detachably connected to the first guide rail, wherein, when the limit assembly is connected to the first guide rail, the movable range of the scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the third position; after the limit assembly is detached from the first guide rail, the movable range of the scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the second position; Alternatively, the limit assembly has a switchable locking state and an unlocking state, and when the limit assembly is in the locking state, the movable range of the scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the third position; when the limit assembly is in the unlocking state, the movable range of the scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the second position.

10. The sample analyzer according to claim 1, characterized in that: The sample analyzer also includes a frame for carrying the sample scheduling device. When the scheduling component moves to the second free end of the first guide rail, the first orthographic projection of the scheduling component on the horizontal reference plane may be at least partially located outside the orthographic projection of the frame on the horizontal reference plane.

11. The sample analyzer according to any one of claims 1 to 10, characterized in that: The sample scheduling device further comprises an in-position detection device, which is used at least for outputting prompt information when the scheduling component moves to the second free end of the first guide rail.

12. The sample analyzer according to any one of claims 1 to 10, characterized in that: The sample analyzer further comprises a controller, which is used to control the scheduling component to schedule the sample rack carrying the sample to the sample suction channel or to the second free end of the first guide rail according to the detection item of the sample.

13. The sample analyzer according to any one of claims 1 to 10, characterized in that: The sample scheduling device also includes an identification channel and an identification mechanism, wherein the identification mechanism is used to identify information of the sample rack in the identification channel; The scheduling component is used to schedule the sample rack in the storage channel to the identification channel for identification, and schedule the identified sample rack to the sample suction channel or to the second free end of the first guide rail.

14. The sample analyzer according to claim 13, characterized in that: When the detection items of the samples on the sample rack in the identification channel include the detection items of the sample analyzer, the scheduling component is used to schedule the identified sample rack to the sample aspiration channel; and / or When the detection items of the samples on the sample rack in the identification channel do not include the detection items of the sample analyzer, but include the detection items of other sample analyzers cascaded with the sample analyzer, the scheduling component is used to schedule the identified sample rack to the second free end of the first guide rail; and / or When the detection items of the samples on the sample rack in the identification channel include the detection items of the sample analyzer and the detection items of other sample analyzers cascaded with the sample analyzer, the scheduling component is used to schedule the identified sample rack to the sample aspiration channel, and schedule the sample rack from the sample aspiration channel to the second free end of the first guide rail after the sample aspiration channel completes sample aspiration.

15. The sample analyzer according to claim 13, characterized in that: The sample scheduling device also includes a transfer channel, and the scheduling component is further used to schedule the identified sample rack to the transfer channel, or schedule the sample rack in the transfer channel to the sample suction channel or the storage channel.

16. The sample analyzer according to any one of claims 1 to 10, characterized in that: The sample analyzer also includes: A face shell, wherein the face shell encloses a housing space, and at least the analysis device, the sample suction channel, and the scheduling component are accommodated in the housing space, and the housing space has a first opening and a second opening, and the first opening and the second opening do not overlap; The storage channel is at least partially accommodated in the accommodating space, and the first opening is used by a user to put the sample rack into the storage channel and take the sample rack out of the storage channel; or, the storage channel is located outside the accommodating space and the storage channel is connected to the accommodating space through the first opening, so that the scheduling component can schedule the sample rack between the storage channel and the sample aspiration channel through the first opening; The scheduling component is also used to schedule the sample rack in the sample suction channel or the storage channel from inside the accommodating space to outside the accommodating space through the second opening, or to schedule the sample rack outside the accommodating space to inside the accommodating space through the second opening.

17. The sample analyzer according to claim 16, characterized in that: The surface shell includes at least two sub-surface shells, and the at least two sub-surface shells are enclosed to form the accommodating space. The second opening is formed on the end surfaces of the at least two sub-surface shells, and the second opening is provided with a baffle that is detachably connected and used to cover the second opening.

18. The sample analyzer according to claim 16, characterized in that: When the scheduling component is at the first free end of the first guide rail, the entire scheduling component is located in the accommodating space, and when the scheduling component is at the second free end of the first guide rail, at least part of the scheduling component can pass through the second opening and be exposed outside the accommodating space.

19. A sample analysis system, characterized in that: comprising a first sample analyzer and a second sample analyzer connected in cascade; The first sample analyzer includes a first analysis device and a first sample scheduling device, wherein the first analysis device is used to detect the sample to obtain the detection result; The first sample scheduling device comprises: a first storage channel for a user to put in and take out a sample rack; a first sample suction channel for the first analysis device to suck a sample carried by the sample rack in the first sample suction channel; a first scheduling component, at least for scheduling the sample rack between the first storage channel and the first sample suction channel; The second sample analyzer includes a second analysis device and a second sample scheduling device, wherein the second analysis device is used to detect the sample to obtain the detection result; the second sample scheduling device includes: a second storage channel for a user to put in and take out the sample rack; a second sample suction channel for the second analysis device to suck the sample carried by the sample rack in the second sample suction channel; a second scheduling component, at least used to schedule the sample rack between the second storage channel and the second sample suction channel; Wherein, the first scheduling component comprises a first motion support component and a first scheduling component for carrying a sample rack, and the first scheduling component can move between a first scheduling position and a second scheduling position relative to the first motion support component under the support of the first motion support component; Furthermore, the first scheduling position is located at the first sample scheduling device, and the second scheduling position is located at the second sample scheduling device. When the first scheduling component is located at the first scheduling position, the first scheduling component is used to schedule the sample rack between the first storage channel and the first sample suction channel; When the first scheduling component is located at the second scheduling position, the first scheduling component is also used to schedule the sample rack in the first storage channel and / or the first sample aspiration channel to the second sample scheduling device, so that the second sample scheduling device can schedule the sample rack to the second storage channel and / or the second sample aspiration channel.

20. The sample analysis system according to claim 19, wherein: The first motion support component includes a first guide rail, and the first scheduling component is connected to the first guide rail and can move relative to the first guide rail in the extension direction of the first guide rail, so that the first scheduling component schedules the sample rack between the first storage channel and the first sample suction channel at the first scheduling position; Wherein, the first guide rail has a first free end and a second free end relative to each other, the second free end of the first guide rail is an end away from the first analysis device, and when the first scheduling component is located at the second free end of the first guide rail, the first scheduling component is located at the second scheduling position; when the first scheduling component moves to the second free end of the first guide rail, a first orthographic projection of the first scheduling component on the horizontal reference plane along the axis of the first guide rail may be at least partially located outside the second orthographic projection of the first guide rail on the horizontal reference plane, and the first orthographic projection of the first scheduling component on the horizontal reference plane at least partially overlaps with a third orthographic projection of the second sample scheduling device on the horizontal reference plane.

21. The sample analysis system according to claim 20, characterized in that: The second sample scheduling device further includes a second transfer channel, the first scheduling component includes a carrying channel for carrying the sample rack and a transfer member for transferring the sample rack, and when the first scheduling component moves to the second free end of the first guide rail, the carrying channel is communicated with the second transfer channel, so that the transfer member transfers the sample rack between the carrying channel and the second transfer channel; The second scheduling component is at least further used for scheduling sample racks between the second storage channel and the second transfer channel.

22. The sample analysis system according to claim 20, characterized in that: The first free end of the first guide rail is correspondingly provided with a first position, and the second free end of the first guide rail is correspondingly provided with a second position; The first sample scheduling device also includes a limit assembly, which is arranged at a third position of the first guide rail and is used to limit the movement range of the first scheduling component relative to the first guide rail in the extension direction of the first guide rail between the first position and the third position, wherein the third position is located between the first position and the second position.

23. The sample analysis system according to claim 22, characterized in that: The limiting assembly is detachably connected to the first guide rail, wherein, when the limiting assembly is connected to the first guide rail, the movable range of the first scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the third position; after the limiting assembly is detached from the first guide rail, the movable range of the first scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the second position, so as to schedule the sample rack in the first sample suction channel or the first storage channel to the second scheduling device, or schedule the sample rack of the second scheduling device to the first sample suction channel or the first storage channel; Alternatively, the limit assembly has a switchable locking state and an unlocking state, and when the limit assembly is in the locking state, the movable range of the first scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the third position; when the limit assembly is in the unlocking state, the movable range of the first scheduling component relative to the first guide rail in the extension direction of the first guide rail is between the first position and the second position, so as to schedule the sample rack in the first sample suction channel or the first storage channel to the second scheduling device, or to schedule the sample rack of the second scheduling device to the first sample suction channel or the first storage channel.

24. The sample analysis system according to any one of claims 19 to 23, characterized in that: The first sample scheduling device further includes a first identification channel, the first identification channel is used to identify information of the sample rack in the first identification channel, and the first scheduling component is used to schedule the sample rack in the first storage channel to the first identification channel for identification; When the detection items of the samples on the sample rack in the first identification channel include the detection items of the first sample analyzer, the first scheduling component is further used to schedule the identified sample rack to the first sample suction channel; and / or When the detection items of the samples on the sample rack in the first identification channel do not include the detection items of the first sample analyzer but include the detection items of the second sample analyzer, the first scheduling component is further used to schedule the identified sample rack to the second scheduling device; and / or When the detection items of the samples on the sample rack in the first identification channel include the detection items of the first sample analyzer and the detection items of the second sample analyzer, the first scheduling component is also used to schedule the identified sample rack to the first sample aspiration channel for sample aspiration, and schedule the sample rack to the second scheduling device after the sample aspiration is completed.

25. The sample analysis system according to any one of claims 19 to 23, characterized in that: The first sample analyzer further comprises a first surface shell, and the second sample analyzer further comprises a second surface shell, the first surface shell encloses a first accommodating space, and the second surface shell encloses a second accommodating space, at least the first analysis device, the first sample suction channel, and the first scheduling component are accommodated in the first accommodating space, at least the second analysis device, the second sample suction channel, and the second scheduling component are accommodated in the second accommodating space, the first accommodating space has a first opening and a second opening, and the first opening and the second opening do not overlap; The second accommodating space has a third opening and a fourth opening, and the third opening and the fourth opening do not overlap; The first storage channel is at least partially accommodated in the first accommodation space, and the first opening is used for a user to put a sample rack into the first storage channel and take out a sample rack from the first storage channel; or, the first storage channel is located outside the first accommodation space and the first storage channel is connected to the first accommodation space through the first opening, so that the first scheduling component can schedule the sample rack between the first storage channel and the first sample suction channel through the first opening; The second storage channel is at least partially accommodated in the second accommodating space, and the third opening is used for a user to put a sample rack into the second storage channel and take out a sample rack from the second storage channel; or, the second storage channel is located outside the second accommodating space and the second storage channel is connected to the second accommodating space through the third opening, so that the second scheduling component can schedule the sample rack between the second storage channel and the second sample suction channel through the third opening; The first scheduling component is also used to schedule the sample rack in the first sample suction channel or the first storage channel from the first accommodating space to the second accommodating space through the second opening and the fourth opening in sequence, or to schedule the sample rack in the second accommodating space to the first accommodating space through the fourth opening and the second opening in sequence.

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