TFT (Thin Film Transistor) color film color decay testing method and testing device

Abstract

The invention discloses a test method and a test device for color decay of a TFT (thin film transistor) color film, and the test method comprises the following steps: manufacturing a TFT color film color chip sample, placing the TFT color film color chip sample on the test device, and simulating a light source irradiation environment through the test device; coating liquid crystal liquid on the TFT color film color piece sample; obtaining the chromaticity and the brightness of the TFT color film color piece sample before testing; under the conditions of preset temperature and preset humidity, the tested chromaticity and the tested brightness of the TFT color film color piece sample under the set illumination time are obtained; acquiring a chromaticity attenuation value according to the chromaticity before testing and the chromaticity after testing; and obtaining a brightness attenuation value according to the brightness before the test and the brightness after the test. Therefore, the test operation on the color decay of the TFT color film can be realized, and the test mode and the test device are simple and easy to operate, so that the TFT color film with more stable chromaticity can be selected in the earlier stage of research and development, the product quality of a display module is ensured, and the competitiveness of the product is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of display module production, and in particular to a TFT color film color decay testing method and testing device. Background Art

[0002] With the development of science and technology, TFT (thin film transistor) liquid crystal display screens are widely used in smart phones, tablet computers, TVs and various smart terminals. The color film of the display module TFT panel is composed of the three primary colors of R / G / B. Different color films will have different degrees of chromaticity and brightness attenuation under different lighting time. For example, under the lighting of high temperature and high humidity (60℃90%RH) environment, the Gy coordinate of the green color film decreases significantly. When the chromaticity of green Gy in the three primary colors decreases, the color synthesized by R / G / B is not pure white, but pink, which affects the display effect of the display module, that is, it leads to poor display quality of the display module. Therefore, it is necessary to conduct color decay test on the TFT color film in the early stage in order to select a TFT color film with more stable chromaticity. Summary of the invention

[0003] The purpose of the present invention is to overcome the deficiencies in the prior art and provide a TFT color film color decay test method and test device so as to select a TFT color film with more stable chromaticity, thereby ensuring the display quality of the display module.

[0004] The objective of the present invention is achieved through the following technical solutions:

[0005] A method for testing color decay of a TFT color film, comprising:

[0006] Making a TFT color filter chip sample, placing the TFT color filter chip sample on a test device, and simulating a light source irradiation environment through the test device;

[0007] Applying liquid crystal liquid on the TFT color film sample;

[0008] Obtaining the pre-test chromaticity and pre-test brightness of the TFT color filter color chip sample;

[0009] Under the conditions of preset temperature and preset humidity, obtaining the post-test chromaticity and post-test brightness of the TFT color filter color chip sample under the set light exposure time;

[0010] According to the chromaticity before the test and the chromaticity after the test, the chromaticity attenuation value of the TFT color filter color chip sample is obtained; according to the brightness before the test and the brightness after the test, the brightness attenuation value of the TFT color filter color chip sample is obtained.

[0011] In one embodiment, the TFT color filter color chip sample is an R color chip sample, a G color chip sample, or a B color chip sample.

[0012] In one embodiment, the liquid crystal liquid is a mixture of liquid crystal and pure water in a ratio of 1:1.

[0013] In one embodiment, the pre-test chromaticity, the pre-test luminance, the post-test chromaticity and the post-test luminance are all measured by a color analyzer.

[0014] In one embodiment, the illumination time is 24h, 48h or 72h.

[0015] In one embodiment, the preset temperature is 20°C-60°C; the preset humidity is 65%RH-90%RH.

[0016] A testing device comprises: a top cover, a sample placement plate and a light source module which are stacked in sequence from top to bottom, wherein the sample placement plate is provided with a plurality of sample placement holes for placing TFT color film samples, and the light source module is used for simulating a light source irradiation environment.

[0017] In one of the embodiments, the light source module is provided with an LED lamp and a backlight film material, and the light of the LED lamp passes through the backlight film material and irradiates the TFT color filter color chip sample on the sample placement hole.

[0018] In one embodiment, the top cover is a transparent top cover; and the sample placement plate is a transparent placement plate.

[0019] In one embodiment, a top cover positioning hole is opened on the top cover, a placement plate positioning hole is opened on the sample placement plate, and a light source module positioning hole is opened on the light source module, and the top cover positioning hole, the placement plate positioning hole and the light source module positioning hole are aligned with each other one by one.

[0020] The present invention has at least the following advantages:

[0021] By means of the TFT color film color decay testing method and testing device of the present invention, the color decay of the TFT color film can be tested, and the testing method and testing device are simple and easy to operate, so that a TFT color film with more stable chromaticity can be selected in the early stage of research and development, thereby ensuring the product quality of the display module, reducing customer complaints, and improving the competitiveness of the product. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below.

[0023] Figure 1 It is a flowchart of the steps of the TFT color film color decay testing method in one embodiment of the present invention;

[0024] Figure 2 is a schematic structural diagram of a testing device in one embodiment of the present invention;

[0025] Figure 3 It is a schematic structural diagram of a liquid crystal liquid and a TFT color film sample of a testing device in an embodiment of the present invention; DETAILED DESCRIPTION

[0026] To facilitate understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings.

[0027] See also Figure 2 and Figure 3 As shown, a testing device 10 includes: a top cover 100, a sample placement plate 200 and a light source module 300 stacked in sequence from top to bottom, a plurality of sample placement holes 210 are opened on the sample placement plate 200, the sample placement holes 210 are used to place TFT color film color chip samples 400, and the light source module 300 is used to simulate the light source irradiation environment.

[0028] It should be noted that when using the test device 10, the TFT color filter chip sample 400 is placed on the sample placement plate 200, and the TFT color filter chip sample 400 is positioned by the sample placement plate 200, and then the top cover 100 is covered on the sample placement plate 200, and the light source module 300 is started, and the TFT color filter chip sample 400 is irradiated and tested by the light source module 300. Among them, the top cover 100 is a transparent top cover 100; and the sample placement plate 200 is a transparent placement plate, for example, the top cover 100 and the sample placement plate 200 are both made of transparent glass to ensure the transmittance of light, and thus the accuracy of the test results can be ensured; for example, the thickness of the top cover 100 is 0.1-0.15mm.

[0029] Furthermore, the cross section of the sample placement hole 210 on the sample placement plate 200 may be a circular structure, a rectangular structure or a triangular structure. In this embodiment, the cross section of the sample placement hole 210 is preferably a circular structure, with a hole diameter of 15-25 mm, the sample placement hole 210 is a through hole, and the height of the sample placement hole 210 is the thickness of the sample placement plate 200, for example, the thickness of the sample placement plate 200 is 0.3 mm, so as to facilitate the subsequent placement of the TFT color film color chip sample 400 and the liquid crystal liquid 500.

[0030] Among them, the light source module 300 is provided with an LED lamp and a backlight film material, and the light of the LED lamp passes through the backlight film material and irradiates the TFT color film sample 400 on the sample placement hole 210. The backlight film material is mainly the backlight film material used in conventional display modules, which is mainly used to ensure the uniformity and brightness of the light source emitted by the LED lamp to simulate the scene of the TFT color film sample 400 being applied in the display module, thereby ensuring the accuracy of the test results; for example, the backlight film material includes a diffusion film, a light-enhancing film and a light guide plate. Further, a power port 310 is provided on the side of the light source module 300 for connecting to the power supply terminal; and a base 320 is provided on the light source module 300, and the base 320 is a transparent glass plate, and the thickness of the base 320 can be 0.1-0.15mm.

[0031] In one embodiment, in order to ensure the position accuracy of the top cover 100, the sample placement plate 200 and the light source module 300 after being combined and to prevent displacement, a top cover positioning hole 110 is opened on the top cover 100, a placement plate positioning hole 220 is opened on the sample placement plate 200, and a light source module positioning hole 330 is opened on the light source module 300. For example, the light source module positioning hole 330 can be opened on the base 320, and the top cover positioning hole 110, the placement plate positioning hole 220 and the light source module positioning hole 330 are respectively aligned with each other. After alignment, they can be locked by screws to prevent displacement during the test and affect the test results. Preferably, four top cover positioning holes 110 are provided, and the four top cover positioning holes 110 are respectively located at the four corners of the top cover 100, and the aperture diameter can be 4 mm; similarly, four placement plate positioning holes 220 are provided, and the four placement plate positioning holes 220 are respectively located at the four corners of the sample placement plate 200, and the aperture diameter can be 4 mm; four light source module positioning holes 330 are also provided, and the four light source module positioning holes 330 are located at the four corners of the light source module 300.

[0032] The following are the test operations for the color decay of TFT color film:

[0033] See also Figure 1 As shown, a TFT color film color decay test method includes:

[0034] S01: Prepare a TFT color film chip sample 400, place the TFT color film chip sample 400 on the test device 10, and simulate the light source illumination environment through the test device 10; wherein, the TFT color film chip sample 400 is an R chip sample or a G chip sample or a B chip sample; the shape structure of the chip sample matches the shape structure of the sample placement hole 210 in the test device 10, for example, if the cross section of the sample placement hole 210 is a circular structure, then the cross section of the chip sample is also a circular structure, and the diameter of the chip sample is consistent with the diameter of the sample placement hole 210, for example, the diameter size is 15-25mm; in addition, the height of the chip sample cannot be higher than the height of the sample placement hole 210, and a certain space must be reserved for the subsequent coating of the liquid crystal liquid 500, for example, if the height of the sample placement hole 210 is 0.3mm, then the height of each chip sample is 0.1mm.

[0035] S02: Apply liquid crystal liquid 500 on the TFT color film chip sample 400; after placing the TFT color film chip sample 400 in the sample placement hole 210, apply liquid crystal liquid 500 on the TFT color film chip sample 400; since the TFT color film is usually used on a liquid crystal display screen, by applying liquid crystal liquid 500 on the TFT color film, the use scenario of the TFT color film is simulated. For example, the liquid crystal liquid 500 is a mixture of liquid crystal and pure water in a ratio of 1:1. After the liquid crystal liquid 500 is applied to the TFT color film chip sample 400, the total height of the liquid crystal liquid 500 and the TFT color film chip sample 400 cannot exceed the height of the sample placement hole 210. For example, if the height of the sample placement hole 210 is 0.3 mm and the height of the TFT color film chip sample 400 is 0.1 mm, the corresponding height of the liquid crystal liquid 500 is 0.2 mm.

[0036] S03: Obtain the pre-test chromaticity and pre-test brightness of the TFT color film chip sample 400; after applying the liquid crystal liquid 500 to the TFT color film chip sample 400, cover the top cover 100, and lock and fix the top cover 100, the sample placement plate 200 and the light source module 300 with screws to prevent displacement; then turn on the power of the light source module 300 so that the light source is irradiated onto the TFT color film chip sample 400. At this time, it is necessary to test the pre-test chromaticity and pre-test brightness of the TFT color film chip sample 400 through corresponding optical equipment. For example, it can be measured by a color analyzer. The color analyzer can be a CS2000 color analyzer, a CA310 color analyzer, a CA410 color analyzer, etc. In this embodiment, the CIE chromaticity diagram coordinates are used to measure the chromaticity value of the TFT color filter sample 400. The CIE chromaticity diagram coordinates use two numerical values, X and Y, to represent the chromaticity of the color. These two numerical values ​​represent the coordinate position of the color on the CIE chromaticity diagram. Thus, the chromaticity before the test is set to (X1, X2); at the same time, the brightness before the test is set to L1.

[0037] S04: Under the conditions of preset temperature and preset humidity, obtain the post-test chromaticity and post-test brightness of the TFT color film chip sample 400 under the set lighting time; that is, make the test environment at a certain preset temperature and preset humidity, and then complete the test after a certain lighting time, and then measure the post-test chromaticity and post-test brightness of the TFT color film chip sample 400 through a color analyzer, set the post-test chromaticity (X2, Y2), and the post-test brightness L2; ​​wherein, the lighting time is 24h or 48h or 72h, which can be selected accordingly according to actual needs; further, wherein the preset temperature and preset humidity can be under normal temperature and humidity conditions, or under high temperature and high humidity conditions, for example, the preset temperature is 20℃-60℃; the preset humidity is 65%RH-90%RH, normal temperature is 20℃, normal humidity is 65%RH, high temperature is 60℃, and high humidity is 90%RH.

[0038] S05: Obtain the chromaticity attenuation value of the TFT color film sample 400 according to the chromaticity (X1, Y1) before the test and the chromaticity (X2, Y2) after the test; for example, calculate the chromaticity attenuation value according to the formula (X1-X2) / X1*100% and the formula (Y1-Y2) / Y1*100%; obtain the brightness attenuation value of the TFT color film sample 400 according to the brightness L1 before the test and the brightness L2 after the test, for example, calculate the brightness attenuation value according to the formula (L1-L2) / L1*100%; evaluate whether the color attenuation of the TFT color film meets the research and development expectations according to the chromaticity attenuation value and the brightness attenuation value, if not, the TFT color film needs to be re-adjusted. In this way, the color attenuation test of the TFT color film can be realized by the test method of the present invention, and the test method of the present invention is simple and fast, can improve the test efficiency and test accuracy, and thus can save costs.

[0039] The above-mentioned embodiments only express several implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the invention patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be based on the attached claims.

Claims

1. A TFT color film color decay test method, characterized in that: include: Making a TFT color filter chip sample, placing the TFT color filter chip sample on a test device, and simulating a light source irradiation environment through the test device; Applying liquid crystal liquid on the TFT color film sample; Obtaining the pre-test chromaticity and pre-test brightness of the TFT color filter color chip sample; Under the conditions of preset temperature and preset humidity, obtaining the post-test chromaticity and post-test brightness of the TFT color filter color chip sample under the set light exposure time; According to the chromaticity before the test and the chromaticity after the test, the chromaticity attenuation value of the TFT color filter color chip sample is obtained; according to the brightness before the test and the brightness after the test, the brightness attenuation value of the TFT color filter color chip sample is obtained.

2. The TFT color film color decay test method according to claim 1, characterized in that: The TFT color filter color chip sample is an R color chip sample, a G color chip sample, or a B color chip sample.

3. The TFT color film color decay test method according to claim 1, characterized in that: The liquid crystal liquid is a mixture of liquid crystal and pure water in a ratio of 1:

1.

4. The TFT color film color decay test method according to claim 1, characterized in that: The pre-test chromaticity, the pre-test luminance, the post-test chromaticity and the post-test luminance are all measured by a color analyzer.

5. The TFT color film color decay test method according to any one of claims 1 to 4, characterized in that: The illumination time is 24h, 48h or 72h.

6. The TFT color film color decay test method according to any one of claims 1 to 4, characterized in that: The preset temperature is 20° C.-60° C.; the preset humidity is 65% RH-90% RH.

7. A testing device, characterized in that: include: A top cover, a sample placement plate and a light source module are stacked in sequence from top to bottom. The sample placement plate is provided with a plurality of sample placement holes for placing TFT color film samples. The light source module is used to simulate a light source irradiation environment.

8. The testing device according to claim 7, characterized in that: The light source module is provided with an LED lamp and a backlight film material, and the light of the LED lamp passes through the backlight film material and irradiates the TFT color filter color chip sample on the sample placement hole.

9. The testing device according to claim 7, characterized in that: The top cover is a transparent top cover; and the sample placement plate is a transparent placement plate.

10. The testing device according to any one of claims 7 to 9, characterized in that: The top cover is provided with a top cover positioning hole, the sample placement plate is provided with a placement plate positioning hole, and the light source module is provided with a light source module positioning hole. The top cover positioning holes, the placement plate positioning holes and the light source module positioning holes are aligned with each other.

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