A spectral phase analysis device and a method for performing phase analysis using spectroscopy

Through the combined design of the main light source, secondary light source and reflector, combined with the adjustable gas storage box structure, the gas sample detection of the spectral analyzer under multiple optical paths is achieved, solving the problem of insufficient detection sensitivity and accuracy in the prior art, and improving the accuracy and sensitivity of gas component analysis.

CN119246444BActive Publication Date: 2025-07-22SUZHOU SAIBAO CALIBRATION TECH SERVICE CO LTD
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Patent Information

Application Number
CN202411278065.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-09-12
Publication Date
2025-07-22
Estimated Expiration
2044-09-12

AI Technical Summary

Technical Problem

Existing spectrometers are difficult to detect components of multiple gas mixtures in complex phase analysis, especially due to insufficient detection sensitivity and accuracy due to fixed optical path design.

Method used

The main light source and secondary light source are combined with the design of dichroic mirrors and reflectors to realize the detection of dual-path or multi-path gas samples, and the beam adjustment mechanism and adjustable gas storage box structure are used to enhance the optical path adjustment capability.

Benefits of technology

It improves the accuracy and sensitivity of gas sample detection, can obtain more comprehensive spectral data under different optical paths, and supports accurate analysis of different components in gas sample.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application relates to a spectral phase analysis device and a method for phase analysis using spectra, and pertains to the technical field of spectral analysis equipment. The spectral phase analysis device includes a gas storage tank; a main light source and a secondary light source, which are arranged inside the gas storage tank; a dichroic mirror, which is arranged inside the gas storage tank, and the light beams emitted by the main light source and the secondary light source are respectively irradiated on opposite sides of the dichroic mirror. The dichroic mirror is used to reflect the light beam emitted by the main light source, and the light beam emitted by the secondary light source penetrates the dichroic mirror, and the optical axes of the light beams emitted by the main light source and the secondary light source coincide after passing through the dichroic mirror; a plurality of reflecting mirrors, all of which are used to reflect the light beams emitted by the main light source and the secondary light source; a receiver, which is arranged on the gas storage tank and is used to receive the light beams emitted by the main light source and the secondary light source; and a data acquisition unit, which is electrically connected to the receiver. The present application can improve the detection accuracy of gas samples.
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Citation Information

Patent Citations

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