High-density server testing method and device, electronic equipment and storage medium

Abstract

The invention provides a high-density server testing method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a target number based on a whole power consumption limit value of a to-be-tested high-density server; determining each target number of server nodes in the to-be-tested high-density server as target server nodes corresponding to each round of test, and determining server nodes except the target server nodes corresponding to each round of test in the to-be-tested high-density server as test server nodes corresponding to each round of test; and in each round of test, the test server node corresponding to each round of test is controlled to be switched between a power-on state and a power-off state at a preset frequency in a first time period of a first preset duration, and test data in the first time period is acquired as a test result of each round of test. The invention provides a high-density server testing method and device, electronic equipment and a storage medium. The comprehensiveness and accuracy of high-density server testing can be improved.

Description

Technical Field

[0001] The present invention relates to the field of computer technology, and in particular to a high-density server testing method, device, electronic equipment and storage medium. Background Art

[0002] As an optimized architecture server launched for cloud computing, data centers, and Internet applications, high-density servers can integrate more processors and I / O expansion capabilities in a smaller physical space, greatly reducing space costs and significantly improving computing performance, and can better meet user needs.

[0003] Compared with ordinary servers, the internal space density of high-density servers is higher, the power consumption is significantly increased, and the power supply for high-density servers is also significantly increased. Therefore, testing the reliability and stability of high-density servers is of great significance to ensure the normal operation of high-density servers.

[0004] However, the traditional high-density server testing methods in the related art are usually static stress tests, which do not take into account the electromagnetic interference between the electronic devices in the high-density server, which leads to poor comprehensiveness and accuracy of the high-density server testing based on the traditional high-density server testing methods. Therefore, how to test the high-density server more comprehensively and accurately is a technical problem that needs to be solved in this field. Summary of the invention

[0005] The present invention provides a high-density server testing method, device, electronic device and storage medium, which are used to solve the defect of poor comprehensiveness of high-density server testing based on traditional high-density server testing methods in the prior art, and realize how to perform more comprehensive testing on high-density servers.

[0006] The present invention provides a high-density server testing method, comprising the following steps.

[0007] Obtaining a whole-machine power consumption limit value of the high-density server to be tested, and obtaining a target quantity based on the whole-machine power consumption limit value; Determine each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and determine the server nodes in the high-density server to be tested other than the target server nodes corresponding to each round of measurement as test server nodes corresponding to each round of testing; In each round of testing, the test server node corresponding to each round of testing is controlled to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration, and test data within the first time period is obtained as a test result of each round of testing, wherein the test data includes log information generated by the high-density server to be tested and / or log information generated by a test tool; Based on the test results of each round of testing, the test results of the high-density server to be tested are obtained.

[0008] According to a high-density server testing method provided by the present invention, in each round of testing, the test server node corresponding to each round of testing is controlled to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration, and test data within the first time period is obtained as a test result of each round of testing, before the method further includes: In each round of testing, a stress test is performed on the target test node corresponding to each round of testing within a second time period of a second preset duration, and test data within the second time period is obtained as the test result of each round of testing. The end time of the second time period is the start time of the first time period.

[0009] According to a high-density server testing method provided by the present invention, the test data includes: the power consumption value of the target server node corresponding to each round of testing and the whole machine power consumption value of the high-density server to be tested; The obtaining the test result of the high-density server to be tested based on the test result of each round of testing includes: Based on the test results of each round of testing, a server node activation recommendation scheme corresponding to the high-density server to be tested is obtained as the test result of the high-density server to be tested, and the server node activation recommendation scheme includes server nodes recommended for activation in the high-density server to be tested.

[0010] According to a high-density server testing method provided by the present invention, the method of obtaining a server node activation recommendation scheme corresponding to the high-density server to be tested based on the test results of each round of testing includes: Based on the whole machine power consumption value of the high-density server to be tested obtained in each round of testing and the power consumption value of the target server node corresponding to each round of testing, obtaining the evaluation index value corresponding to each round of testing; Compare the evaluation index values ​​corresponding to each round of the test, and determine the round of test with the smallest corresponding evaluation index value as the target round of test; The target server node corresponding to the target round test is determined as the server node corresponding to the high-density server to be tested and the server node recommended to be enabled in the recommended solution is enabled.

[0011] According to a high-density server testing method provided by the present invention, the method of determining each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and determining the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement as the test server nodes corresponding to each round of testing, includes: Selecting the target number of server nodes from among the server nodes in the high-density server to be tested as target server nodes corresponding to the first round of testing, and determining the server nodes in the high-density server to be tested other than the target server nodes corresponding to the first round of testing as test servers corresponding to the first round of testing; In the case where the target number is less than the total number of server nodes in the high-density server to be tested, the target number of server nodes is selected again from each server node in the high-density server to be tested, and the server nodes of the target number are determined to be equal to the first server node. i - If the target server nodes corresponding to the first round of testing are different, the target number of server nodes selected again is determined as the first i The target server nodes corresponding to the round of testing are i The server nodes other than the target server nodes corresponding to the round of testing are determined as the first i The test server corresponding to the first test, i increases by 1, and the process returns to the step of selecting the target number of server nodes from each server node in the high-density server to be tested again, until it is determined that there is no server node in the high-density server to be tested that is inconsistent with the first test server. i -1 round of testing corresponds to a target server node with different target number of server nodes.

[0012] According to a high-density server testing method provided by the present invention, obtaining a target quantity based on the power consumption limit value of the entire machine includes: When all server nodes in the high-density server to be tested are in a shutdown state and the rotation speed of each fan in the high-density server to be tested is at a maximum value, obtaining a whole-machine power consumption value of the high-density server to be tested as a first whole-machine power consumption value; When any server node in the high-density server to be tested is in a full-load operation state, all server nodes in the high-density server to be tested except the any server node are in a shutdown state, and the rotation speed of each fan in the high-density server to be tested is a maximum value, obtaining a whole-machine power consumption value of the high-density server to be tested as a second whole-machine power consumption value; The target quantity is acquired based on the first whole-machine power consumption value, the second whole-machine power consumption value, and the whole-machine power consumption limit value.

[0013] According to a high-density server testing method provided by the present invention, obtaining the target quantity based on the first whole machine power consumption value, the second whole machine power consumption value and the whole machine power consumption limit value includes: Calculate the difference between the second whole machine power consumption value and the first whole machine power consumption value as the first power consumption value, calculate the sum of the second whole machine power consumption value and the first power consumption value as the second power consumption value, calculate the sum of the second whole machine power consumption value and twice the first power consumption value as the third power consumption value, calculate the sum of the second whole machine power consumption value and three times the first power consumption value as the fourth power consumption value, and calculate the sum of the second whole machine power consumption value and four times the first power consumption value as the fifth power consumption value; Based on the size relationship between the first whole-machine power consumption value and at least two of the second whole-machine power consumption value, the second power consumption value, the third power consumption value, the fourth power consumption value and the fifth power consumption value, the number of server nodes that can be enabled in the high-density server to be tested is obtained as the target number.

[0014] The present invention also provides a high-density server testing device, comprising the following modules: A data acquisition module is used to obtain the power consumption limit value of the whole machine of the high-density server to be tested, and obtain the target quantity based on the power consumption limit value of the whole machine; A node determination module, used to determine each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and to determine the server nodes in the high-density server to be tested other than the target server nodes corresponding to each round of measurement as test server nodes corresponding to each round of testing; A node testing module, used for controlling the test server node corresponding to each round of testing to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration in each round of testing, and obtaining test data within the first time period as the test result of each round of testing, wherein the test data includes log information generated by the high-density server to be tested and / or log information generated by a testing tool; The result output module is used to obtain the test result of the high-density server to be tested based on the test result of each round of testing.

[0015] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, any of the above-mentioned high-density server testing methods is implemented.

[0016] The present invention also provides a non-transitory computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the high-density server testing method described above is implemented.

[0017] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the high-density server testing method described above is implemented.

[0018] The high-density server testing method, device, electronic device and storage medium provided by the present invention obtain the number of server nodes that can be enabled in the high-density server to be tested based on the power consumption limit value of the whole machine of the high-density server to be tested, and after that, each target number of server nodes in the high-density server to be tested is determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server node corresponding to each round of measurement are determined as the test server nodes corresponding to each round of testing, and then in each round of testing, the target test nodes corresponding to each round of testing are stress tested within a second time period of a second preset time length, and the test data within the second time period is obtained as the test result of each round of testing, and the test server nodes corresponding to each round of testing are controlled to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time length, and the first time period is obtained. The test data in the segment is also used as the test result of each round of test. Based on the test result of each round of test, the test result of the high-density server to be tested is obtained. On the basis of avoiding the risk of damage to the high-density server to be tested, by controlling the test server node corresponding to each round of test to switch between the power-on state and the power-off state at a preset frequency in each round of test, the whole machine current of the high-density server to be tested fluctuates frequently, thereby making the electromagnetic interference between each server node and different electronic devices in the high-density server to be tested more serious, so that the reliability and stability of the high-density server to be tested under high-intensity and interactive electromagnetic interference can be better tested, and the operation of the high-density server node to be tested under high-intensity and interactive electromagnetic interference can be tested, which can improve the comprehensiveness and accuracy of the test of the high-density server. The test method is simple and highly automated, and can improve the test efficiency of the high-density server. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 It is a structural diagram of a high-density server in the related art.

[0021] Figure 2 This is one of the flow charts of the high-density server testing method provided by the present invention.

[0022] Figure 3 This is the second flow chart of the high-density server testing method provided by the present invention.

[0023] Figure 4It is a structural schematic diagram of the high-density server testing device provided by the present invention.

[0024] Figure 5 It is a schematic diagram of the connection between the high-density server testing device provided by the present invention and the high-density server to be tested.

[0025] Figure 6 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0027] In the description of the invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0028] In the description of the present application, the terms "first", "second", etc. are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are usually a class, and the number of objects is not limited. For example, the first object can be one or more. In addition, in the description of the present application, "and / or" represents at least one of the connected objects, and the character " / " generally represents that the front and back associated objects are in an "or" relationship.

[0029] It should be noted that a server is a type of computer. Compared with ordinary computers, servers run faster, have higher loads, but are more expensive.

[0030] Servers can generally be divided into four types, including tower servers, rack servers, blade servers and high-density servers. As an optimized architecture server launched for cloud computing, data centers, and Internet applications, high-density servers can integrate more processors and I / O expansion capabilities in a smaller physical space, greatly reducing customers' space costs and significantly improving computing performance. At the same time, they can meet user needs and are flexible and expandable within specific industry requirements.

[0031] Unlike ordinary servers that use independent power supplies and fans, high-density servers share power supplies and fans in the same chassis by multiple server nodes, which greatly improves the efficiency of the power supply and cooling system, and makes the overall weight of high-density servers lighter and the manufacturing cost lower.

[0032] However, with the introduction of a new generation of central processing units (CPUs) and DDR5 memory on the new generation of server platforms, more and more cores are integrated on a CPU, and the power consumption of the CPU is also increasing. For high-density servers, the power supply capacity of high-density servers faces severe challenges due to the significant increase in CPU power consumption.

[0033] Figure 1 Schematic diagram of the structure of a high-density server in the related art. Take a high-density server including four server nodes as an example. Figure 1 As shown, the high-density server further includes components such as a management board, a system backplane, and a fan backplane, and each server node and components such as the management board, the system backplane, and the fan backplane are connected to the system backplane respectively.

[0034] If one server node in the above-mentioned high-density server is installed with two CPUs and 9 DDR5 memories, the power consumption of each CPU is about 350W, and the power consumption of each DDR5 memory is 12W, then the power consumption of one server node in the above-mentioned high-density server reaches 796W (350W×2+12W×8), and the power consumption of four server nodes in the above-mentioned high-density server reaches about 3200W.

[0035] Typically, high-density servers are equipped with high-performance fans on the fan backplane, which consume about 400W of power. The management board and system backplane consume about 100W of power. A high-density server with four server nodes consumes more than 3700W of power.

[0036] High-density servers are usually powered by dual power supplies, so the power of the power supply for the high-density servers needs to be above 2000W.

[0037] In the related art, the output voltage of the power supply is usually 12V, and when the power of the power supply reaches 2000W, the output current of the power supply reaches more than 300A. The large output current of the power supply will increase the electromagnetic interference generated by the power supply line, thereby affecting the normal operation and signal transmission of electronic equipment around the power supply line. In particular, when the output current of the power supply changes frequently, the electromagnetic interference to the electronic equipment will become very serious.

[0038] In addition, the heat density inside a high-density server chassis is higher and the electromagnetic environment is more complex. The increase in temperature inside the chassis will further aggravate the electromagnetic interference of electronic equipment.

[0039] The interaction between different electronic devices in high-density servers will also produce uncertain and unpredictable electromagnetic interference, which will be transmitted to other electronic devices, forming a chain reaction.

[0040] Therefore, it is a huge challenge to ensure the normal operation of high-density servers in the relatively limited chassis space of high-density servers. Testing the reliability and stability of high-density servers is of great significance to ensure the normal operation of high-density servers.

[0041] Traditional high-density server testing methods in related technologies are usually static stress tests. For example, traditional high-density server testing methods can control each server node in the high-density server to be in a full-load state, so that the entire high-density server is in a full-load state, and then obtain various performance data of the high-density server under the full-load state, and based on the above performance data, obtain the test results of the high-density server; for another example, traditional high-density server testing methods can also control the specified server node in the high-density server to run a specified program and then cut off the power, and then obtain the operation status of other server nodes in the high-density server, and then obtain the test results of the high-density server.

[0042] However, the traditional high-density server testing method in the related art does not take into account the electromagnetic interference between the electronic devices in the high-density server, which leads to poor comprehensiveness and accuracy of the high-density server testing based on the traditional high-density server testing method. Therefore, how to test the high-density server more comprehensively and accurately is a technical problem that needs to be solved in this field.

[0043] In this regard, the present invention provides a high-density server testing method. The high-density server testing method provided by the present invention only requires one control machine and one command to complete the installation of the test tool and the deployment of the test script, and then multiple server nodes in the high-density server can be tested based on the above-mentioned test tool and test script. Due to the large power consumption of the high-density server, it is difficult to achieve that each server node in the high-density server is in a full-load state when the output voltage of the power supply is limited. Therefore, the high-density server testing method provided by the present invention can give an optimized distribution selection according to the actual test situation, so as to achieve the effect of energy saving and emission reduction. The high-density server testing method provided by the present invention takes into account the maintenance requirements such as the expansion of the whole machine or the plugging and unplugging of nodes in the actual scene. Therefore, during the test process, the server nodes in the high-density server are subjected to random stress tests, and the other server nodes in the high-density server are subjected to frequent power-on and power-off tests, so that the whole machine current of the high-density server is frequently fluctuated, making the electromagnetic interference between the server nodes more serious, so that the reliability of the high-density server in this interactive stress scenario can be better tested. The high-density server testing method provided by the present invention is simple to operate, has a high degree of automation, reduces the workload of manual operation, and can greatly improve the test efficiency.

[0044] Combine the following Figure 2-Figure 3 The high-density server testing method of the present invention is described.

[0045] Figure 2 It is one of the flow charts of the high-density server testing method provided by the present invention, such as Figure 2 As shown, the method includes the following steps: Step 201, obtaining a whole machine power consumption limit value of a high-density server to be tested, and obtaining a target quantity based on the whole machine power consumption limit value.

[0046] It should be noted that the execution subject of the embodiment of the present invention is a high-density server testing device. The high-density server testing device can be configured in electronic devices such as computers and servers.

[0047] Specifically, the high-density server to be tested is the test object of the high-density server testing method provided by the present invention. Based on the high-density server testing method provided by the present invention, the reliability and stability of the server to be tested can be tested more comprehensively and accurately.

[0048] It is understandable that the high-density server to be tested in the embodiment of the present invention can be determined according to actual needs. The high-density server to be tested in the embodiment of the present invention is not specifically limited.

[0049] The whole machine power consumption limit value of the high-density server to be tested is used to limit the maximum whole machine power consumption of the high-density server to be tested when it is working. If the whole machine power consumption of the high-density server to be tested is higher than the whole machine power consumption limit value of the high-density server to be tested, the high-density server to be tested is at risk of being damaged.

[0050] The whole-machine power consumption limit value of the high-density server to be tested can be determined based on factors such as the factory configuration information, usage scenarios, energy efficiency standards, and actual needs of the high-density server to be tested.

[0051] In an embodiment of the present invention, the whole machine power consumption limit value of the high-density server to be tested can be obtained in a variety of ways. For example, in an embodiment of the present invention, the whole machine power consumption limit value of the high-density server to be tested can be obtained based on user input; or, in an embodiment of the present invention, the whole machine power consumption limit value of the high-density server to be tested sent by other electronic devices can also be received.

[0052] It should be noted that the high-density server to be tested in the embodiment of the present invention includes multiple server nodes.

[0053] It should be noted that although the high-density server to be tested includes multiple server nodes, if all server nodes in the high-density server to be tested are enabled, the overall power consumption of the high-density server to be tested may exceed the overall power consumption limit of the high-density server to be tested, which may cause damage to the high-density server to be tested.

[0054] Therefore, after obtaining the power consumption limit value of the high-density server to be tested, the number of enabled server nodes in the high-density server to be tested can be obtained as the target number M through numerical calculation, mathematical statistics, and deep learning technology, thereby reducing the damage risk of the high-density server to be tested.

[0055] As an optional embodiment, based on the whole machine power consumption limit value, a target quantity is obtained, including: when each server node in the high-density server to be tested is in a shutdown state and the rotation speed of each fan in the high-density server to be tested is at the maximum value, the whole machine power consumption value of the high-density server to be tested is obtained as the first whole machine power consumption value.

[0056] Specifically, in the embodiment of the present invention, control instructions can be used to control each server node in the high-density server to be tested to be in a shutdown state and control the rotation speed of each fan in the high-density server to be tested to be the maximum value.

[0057] When it is determined that all server nodes in the high-density server to be tested are in shutdown state and the rotation speed of each fan in the high-density server to be tested is the maximum value, the whole machine power consumption value of the high-density server to be tested can be obtained by data query as the first whole machine power consumption value.

[0058] When any server node in the high-density server to be tested is in full-load operation, all server nodes except any server node in the high-density server to be tested are in shutdown state, and the rotation speed of each fan in the high-density server to be tested is the maximum value, the whole machine power consumption value of the high-density server to be tested is obtained as the second whole machine power consumption value.

[0059] Specifically, in an embodiment of the present invention, control instructions can be used to control any server node in the high-density server to be tested to be in a full-load operation state, control all server nodes in the high-density server to be tested except the above-mentioned server node to remain in a shutdown state, and control the rotation speed of each fan in the high-density server to be tested to maintain the maximum value.

[0060] When it is determined that any server node in the high-density server to be tested is in full-load operation, all server nodes in the high-density server to be tested except the above-mentioned server node remain in the shutdown state, and the rotation speed of each fan in the high-density server to be tested remains at the maximum value, the whole machine power consumption value of the high-density server to be tested can be obtained through data query as the second whole machine power consumption value.

[0061] It can be understood that the difference between the second whole-machine power consumption value and the first whole-machine power consumption value is the power consumption value of a server in the high-density server to be tested under full-load operation.

[0062] A target quantity is obtained based on the first whole-machine power consumption value, the second whole-machine power consumption value, and the whole-machine power consumption limit value.

[0063] Specifically, after obtaining the first whole-machine power consumption value and the second whole-machine power consumption value, the number of server nodes that can be enabled in the high-density server to be tested can be obtained as the target number based on the first whole-machine power consumption value, the second whole-machine power consumption value and the whole-machine power consumption limit value of the high-density server to be tested through numerical calculation, mathematical statistics and deep learning technology.

[0064] As an optional embodiment, based on the first whole machine power consumption value, the second whole machine power consumption value and the whole machine power consumption limit value, obtaining the target quantity includes: calculating the difference between the second whole machine power consumption value and the first whole machine power consumption value as the first power consumption value, calculating the sum of the second whole machine power consumption value and the first power consumption value as the second power consumption value, calculating the sum of the second whole machine power consumption value and twice the first power consumption value as the third power consumption value, calculating the sum of the second whole machine power consumption value and three times the first power consumption value as the fourth power consumption value, calculating the sum of the second whole machine power consumption value and four times the first power consumption value as the fifth power consumption value.

[0065] Based on the size relationship between the first whole machine power consumption value and at least two of the second whole machine power consumption value, the second power consumption value, the third power consumption value, the fourth power consumption value and the fifth power consumption value, the number of server nodes that can be enabled in the high-density server to be tested is obtained as the target number.

[0066] Specifically, when the whole machine power consumption limit value of the high-density server to be tested is greater than the second whole machine power consumption value and less than the second power consumption value, it can be determined that the number of enabled server nodes in the high-density server to be tested is 1, that is, the target number is 1.

[0067] When the whole power consumption limit value of the high-density server to be tested is greater than the second power consumption value and less than the third power consumption value, it can be determined that the number of enabled server nodes in the high-density server to be tested is 2, that is, the target number is 2.

[0068] When the whole power consumption limit value of the high-density server to be tested is greater than the third power consumption value and less than the fourth power consumption value, it can be determined that the number of enabled server nodes in the high-density server to be tested is 3, that is, the target number is 3.

[0069] When the whole machine power consumption limit value of the high-density server to be tested is greater than the fourth power consumption value and less than the fifth power consumption value, it can be determined that the number of enabled server nodes in the high-density server to be tested is 4, that is, the target number is 4.

[0070] The relationship between the target number and the whole machine power consumption limit value, the first whole machine power consumption value, and the second whole machine power consumption value of the high-density server to be tested can be expressed by the following formula:

[0071] in, Indicates the number of targets. Indicates the power consumption value of the first device. Indicates the second whole machine power consumption value; Indicates the power consumption limit of the high-density server to be tested; represents the first power consumption value, .

[0072] Accordingly, the second power consumption value = ; The third power consumption value = ; The fourth power consumption value = ; Fifth power consumption value = .

[0073] exist In the case of is 1; In the case of is 2; In the case of is 3; In the case of is 1.

[0074] The embodiment of the present invention obtains the whole machine power consumption value of the high-density server to be tested as the first whole machine power consumption value when all server nodes in the high-density server to be tested are in the shutdown state and the rotation speed of each fan in the high-density server to be tested is the maximum value, and obtains the whole machine power consumption value of the high-density server to be tested as the second whole machine power consumption value when any server node in the high-density server to be tested is in the full-load operation state, all server nodes except any server node in the high-density server to be tested are in the shutdown state and the rotation speed of each fan in the high-density server to be tested is the maximum value, and then based on the first whole machine power consumption value, the second whole machine power consumption value and the whole machine power consumption limit value, through numerical calculation and conditional judgment, it is possible to more accurately and efficiently determine the number of server nodes that can be enabled in the high-density server to be tested as the target number, thereby improving the security of testing the high-density server to be tested and providing a more accurate data basis for testing the high-density server to be tested.

[0075] Step 202: determine each target number of server nodes in the high-density server to be tested as the target server node corresponding to each round of testing, and determine the server nodes in the high-density server to be tested other than the target server node corresponding to each round of measurement as the test server node corresponding to each round of testing.

[0076] It should be noted that after obtaining the target number, the number of rounds to be tested on the high-density server to be tested can be calculated by numerical calculation based on the target number and the number of server nodes in the high-density server to be tested.

[0077] Specifically, get the target number After that, each high-density server to be tested can be In a server stage, the target server nodes corresponding to each round of testing are determined, and the server nodes in the high-density server to be tested, except the target server nodes corresponding to each round of measurement, are determined as the test server nodes corresponding to each round of testing.

[0078] For example, in the target quantity =1, each server stage in the high-density server to be tested can be determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement can be determined as the test server nodes corresponding to each round of testing.

[0079] For example, in the target quantity =2, every two server stages in the high-density server to be tested can be determined as the target server nodes corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement can be determined as the test server nodes corresponding to each round of testing.

[0080] For example, in the target quantity =3, every three server stages in the high-density server to be tested can be determined as the target server nodes corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement can be determined as the test server nodes corresponding to each round of testing.

[0081] As an optional embodiment, each target number of server nodes in the high-density server to be tested is determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement are determined as the test server nodes corresponding to each round of testing, including: selecting a target number of server nodes from each server node in the high-density server to be tested as the target server nodes corresponding to the first round of testing, and determining the server nodes in the high-density server to be tested except the target server nodes corresponding to the first round of testing as the test servers corresponding to the first round of testing.

[0082] When the target number is less than the total number of server nodes in the high-density server to be tested, the target number of server nodes is selected again from the server nodes in the high-density server to be tested, and any server node in the target number of server nodes selected again is determined to be equal to the first server node. i - If the target server nodes corresponding to the first round of testing are different, the target number of server nodes selected again will be determined as the first i The target server nodes corresponding to the round of testing are all the high-density servers to be tested except the first i The server nodes other than the target server nodes corresponding to the round of testing are determined as the first i The test server corresponding to this test is i Increase by 1, return to execute the step of selecting the target number of server nodes again from each server node in the high-density server to be tested, until it is determined that there is no server node in the high-density server to be tested that is inconsistent with the first server node. i -1 round of testing corresponds to a different target number of server nodes for the target server nodes.

[0083] To facilitate understanding of the embodiments of the present invention, the specific process of determining the target server node and the test server node corresponding to each round of testing in the embodiments of the present invention is described below through several examples.

[0084] The number of server nodes in the high-density server to be tested is 4, and the target number =1, the first server node in the high-density server to be tested is determined as the target server node corresponding to the first round of testing, and the second, third, and fourth server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the first round of testing; the second server node in the high-density server to be tested is determined as the target server node corresponding to the second round of testing, and the first, third, and fourth server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the second round of testing; the third server node in the high-density server to be tested is determined as the target server node corresponding to the third round of testing, and the first, second, and fourth server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the third round of testing; the fourth server node in the high-density server to be tested is determined as the target server node corresponding to the fourth round of testing, and the first, second, and third server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the fourth round of testing.

[0085] The number of server nodes in the high-density server to be tested is 4, and the target number =2, the 1st and 2nd server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 1st round of testing, and the 3rd and 4th server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the 1st round of testing; the 1st and 3rd server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 2nd round of testing, and the 2nd and 4th server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the 2nd round of testing; the 1st and 4th server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 3rd round of testing, and the 2nd and 3rd server nodes in the high-density server to be tested are determined as the test server nodes corresponding to the 3rd round of testing. server nodes; determine the 2nd and 3rd server nodes in the high-density server to be tested as the target server nodes corresponding to the 4th round of testing, and determine the 1st and 3rd server nodes in the high-density server to be tested as the test server nodes corresponding to the 4th round of testing; determine the 2nd and 4th server nodes in the high-density server to be tested as the target server nodes corresponding to the 5th round of testing, and determine the 1st and 3rd server nodes in the high-density server to be tested as the test server nodes corresponding to the 5th round of testing; determine the 3rd and 4th server nodes in the high-density server to be tested as the target server nodes corresponding to the 6th round of testing, and determine the 1st and 2nd server nodes in the high-density server to be tested as the test server nodes corresponding to the 6th round of testing.

[0086] The number of server nodes in the high-density server to be tested is 4, and the target number =3, the 1st, 2nd, and 3rd server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 1st round of testing, and the 4th server node in the high-density server to be tested is determined as the test server node corresponding to the 1st round of testing; the 1st, 2nd, and 4th server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 2nd round of testing, and the 3rd server node in the high-density server to be tested is determined as the test server node corresponding to the 2nd round of testing; the 1st, 3rd, and 4th server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 3rd round of testing, and the 2nd server node in the high-density server to be tested is determined as the test server node corresponding to the 3rd round of testing; the 2nd, 3rd, and 4th server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the 4th round of testing, and the 1st server node in the high-density server to be tested is determined as the test server node corresponding to the 4th round of testing.

[0087] The number of server nodes in the high-density server to be tested is 4, and the target number =4, the 1st, 2nd, 3rd, and 4th server nodes in the high-density server to be tested are determined as the target server nodes corresponding to the first round of testing. At this time, the test server nodes corresponding to the first round of testing are empty.

[0088] Step 203: In each round of testing, the test server node corresponding to each round of testing is controlled to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset duration, and the test data within the first time period is obtained as the test result of each round of testing. The test data includes log information generated by the high-density server to be tested and / or log information generated by the test tool.

[0089] Specifically, for the i The first round of testing can control the first i The test server node corresponding to the round of testing switches between the power-on state and the power-off state at a preset frequency, and obtains the log information generated by the high-density server to be tested and / or the log information generated by the test tool through data query during the first period, which is also used as the first i The test results of the round test.

[0090] It should be noted that the target number If the number of server nodes is the same as the number of server nodes in the high-density server to be tested, the target number can be Update to 1, and return to execute steps 202 and 203 to obtain the target quantity The test results of each round of testing are 1, and then the target number is Update to 2, and return to execute steps 202 and 203 to obtain the target number The test results for each round of testing when the value is 2, and so on, until the target number is obtained. for The test results corresponding to each round of testing under the condition of .

[0091] It should be noted that the first preset duration and the preset frequency in the embodiment of the present invention may be predefined based on prior knowledge and / or actual conditions. The embodiment of the present invention does not limit the specific values ​​of the first preset duration and the preset frequency.

[0092] Optionally, the value range of the first preset time length may be between 20 minutes and 40 minutes. For example, the value of the second preset time length may be 20 minutes, 30 minutes or 40 minutes.

[0093] Preferably, the value of the first preset duration may be 30 minutes.

[0094] Optionally, the preset frequency may range from once in 40 seconds to once in 80 seconds. For example, the preset frequency may range from once in 40 seconds, once in 60 seconds or once in 80 seconds.

[0095] Preferably, the preset frequency may be once every 60 seconds.

[0096] It should be noted that in each round of testing, the speed of the fans of the high-density servers to be tested is controlled by the automatic speed regulation measurement preconfigured in the system.

[0097] As an optional embodiment, in each round of testing, the test server node corresponding to each round of testing is controlled to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time length, and the test data within the first time period is obtained as the test result of each round of testing. The method also includes: in each round of testing, stress testing is performed on the target test node corresponding to each round of testing within a second time period of a second preset time length, and the test data within the second time period is obtained as the test result of each round of testing, and the end time of the second time period is the start time of the first time period.

[0098] Specifically, for the i In the first round of testing i In the round of testing, the first i While the target server node corresponding to the round of testing is being stress tested, the log information generated by the high-density server to be tested and / or the log information generated by the test tool during the second period of time is obtained by means of data query during the second period of time as the first i The test results of the round test.

[0099] In the i In the round test, the end time of the second period can be determined as the start time of the first period, and the first period can be controlled within the first period of the first preset time. i The test server node corresponding to the round of testing switches between the power-on state and the power-off state at a preset frequency, and obtains the log information generated by the high-density server to be tested and / or the log information generated by the test tool through data query during the first period, which is also used as the first i The test results of the round test.

[0100] It should be noted that the target number When the number of server nodes is the same as that in the high-density server to be tested, in the first round of testing, the target server nodes corresponding to the first round of testing can be stress tested within the second time period of the second preset duration, and the log information generated by the high-density server to be tested within the above-mentioned second time period and / or the log information generated by the testing tool can be obtained through data query within the above-mentioned second time period as the test result of the first round of testing.

[0101] After obtaining the test results of the first round of testing, the target quantity can be Update to 1, and return to execute steps 202 and 203 to obtain the target quantity The test results of each round of testing are 1, and then the target number is Update to 2, and return to execute steps 202 and 203 to obtain the target number The test results corresponding to each round of testing when the value is 2, and so on, until the target number is obtained for The test results corresponding to each round of testing under the condition of .

[0102] It should be noted that the second preset duration in the embodiment of the present invention may be predefined based on prior knowledge and / or actual conditions. The specific value of the second preset duration in the embodiment of the present invention is not limited.

[0103] Optionally, the value range of the second preset time length may be between 20 minutes and 40 minutes. For example, the value of the second preset time length may be 20 minutes, 30 minutes or 40 minutes.

[0104] Preferably, the value of the second preset duration may be 30 minutes.

[0105] Step 204: Based on the test results of each round of testing, the test results of the high-density server to be tested are obtained.

[0106] Specifically, after obtaining the test results of each round of testing, the test results of the high-density server to be tested can be obtained based on the test results of each round of testing through mathematical statistics, numerical calculation, conditional judgment, and deep learning technology.

[0107] As an optional embodiment, the log information generated by the high-density server to be tested includes operating system log information and baseboard management controller log information; the testing tool includes a central processing unit stress testing tool.

[0108] Based on the test results of each round of testing, the test results of the high-density server to be tested are obtained, including: based on the test results of each round of testing, the operation status of the high-density server to be tested in each round of testing is evaluated.

[0109] Based on the evaluation results of the operation status of the high-density server to be tested in each round of testing, the test results of the high-density server to be tested are obtained.

[0110] It should be noted that operating system log information is used to record various events, errors, warnings, and system resource usage during system operation. Operating system log information is usually stored in the form of event records, and each event contains a timestamp, event type, event description, and other related attributes.

[0111] Baseboard Management Controller (BMC) log information is a key data that records the operating status and events of the BMC. The BMC log information includes the hardware status information of the server, such as CPU temperature, fan speed, power supply status, hard disk health status, etc. When the hardware is abnormal, the BMC will record the corresponding warning or error information.

[0112] It should be noted that the CPU stress test tool in the embodiment of the present invention includes but is not limited to StressAppTest (SAT for short) and Performance Tuning Utility (PTU).

[0113] PTU is a CPU stress testing tool used to evaluate the performance and stability of the CPU. It tests the response and processing capabilities of the CPU by simulating various load scenarios.

[0114] SAT is a feature-rich multi-threaded, multi-process concurrent testing tool that allows users to simulate a large number of concurrent requests to check the stability and performance limits of the system. The tool is written in C++, is highly scalable, and supports custom scripts and plug-ins, which can perform stress tests on various server and client applications. StressAppTest adopts a flexible concurrency model that can create and control a large number of concurrent threads or processes to simulate real-world high-concurrency scenarios, such as large-scale user access or big data processing tasks. It also supports Python as a scripting language, making the test logic richer and easier to write. In addition, StressAppTest also provides a plug-in interface that allows users to extend new test behaviors and analysis modules.

[0115] Based on each round of testing of the high-density server to be tested, the test server node corresponding to each round of testing switches between the power-on state and the power-off state at a preset frequency within a preset time period. Whether there are alarm events in the log information generated by the high-density server to be tested within the above period and / or the log information generated by the test tool, whether the temperature, power consumption, frequency and other indicators of the CPU and other electronic devices in the high-density server to be tested are in a normal range, etc., the operation status of the high-density server to be tested in each round of testing is evaluated, and the evaluation results of the operation status of the high-density server to be tested in each round of testing are obtained.

[0116] After obtaining the operation evaluation results of the high-density server to be tested in each round of testing, the test results of the high-density server to be tested can be obtained through mathematical statistics, conditional judgment, and deep learning technology.

[0117] It should be noted that the test result of the high-density server to be tested in the embodiment of the present invention may include indication information for indicating whether the high-density server to be tested has passed the test. The test result of the high-density server to be tested in the embodiment of the present invention may also include a score for describing the stability and reliability of the high-density server to be tested.

[0118] The embodiment of the present invention obtains the number of server nodes that can be enabled in the high-density server to be tested based on the power consumption limit value of the whole machine of the high-density server to be tested, and takes it as the target number. Then, each target number of server nodes in the high-density server to be tested is determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server node corresponding to each round of measurement are determined as the test server nodes corresponding to each round of testing. Then, in each round of testing, a stress test is performed on the target test nodes corresponding to each round of testing within a second time period of a second preset time length, and test data within the second time period is obtained as the test result of each round of testing. Then, within a first time period of a first preset time length, the test server nodes corresponding to each round of testing are controlled to switch between the power-on state and the power-off state at a preset frequency, and the test data within the first time period is obtained, also as the test result of each round of testing. The test results of the round tests are obtained based on the test results of each round of tests. On the basis of avoiding the risk of damage to the high-density server to be tested, the test server node corresponding to each round of tests is controlled to switch between the power-on state and the power-off state at a preset frequency in each round of tests, so that the whole machine current of the high-density server to be tested fluctuates frequently, thereby making the electromagnetic interference between the server nodes and different electronic devices in the high-density server to be tested more serious, so that the reliability and stability of the high-density server to be tested under high-intensity and interactive electromagnetic interference can be better tested, and the operation of the high-density server nodes to be tested under high-intensity and interactive electromagnetic interference can be tested, which can improve the comprehensiveness and accuracy of the test of the high-density server. The test method is simple and highly automated, and can improve the test efficiency of the high-density server.

[0119] As an optional embodiment, the test data includes: the power consumption value of the target server node corresponding to each round of testing and the power consumption value of the entire high-density server to be tested; based on the test results of each round of testing, the test results of the high-density server to be tested are obtained, including: based on the test results of each round of testing, a server node activation recommendation plan corresponding to the high-density server to be tested is obtained as the test result of the high-density server to be tested, and the server node activation recommendation plan includes the server nodes recommended to be enabled in the high-density server to be tested.

[0120] Specifically, for the i In the first round of testing i In the round of testing, the first i While performing stress testing on the target server node corresponding to the round of testing, the power consumption value of the whole machine of the high-density server to be tested in the second period and the power consumption value of the first round of testing are obtained by means of data query in the second period of testing. i The power consumption value of the target server node corresponding to the round of testing is used as the i The test results of the round test.

[0121] In the i In the round test, the first time period of the first preset time can also be controlled. i The test server node corresponding to the round of testing switches between the power-on state and the power-off state at a preset frequency, and obtains the power consumption value of the high-density server to be tested in the first period and the power consumption value of the high-density server to be tested in the first period by means of data query in the first period. i The power consumption value of the target server node corresponding to the round of testing is also used as the i The test results of the round test.

[0122] Before obtaining the test results of each round of testing, based on the test results of each round of testing, a recommended solution for enabling the server nodes corresponding to the high-density server to be tested can be obtained through numerical calculation, mathematical statistics, conditional judgment, and deep learning technology as the test result of the high-density server to be tested.

[0123] It should be noted that the recommended scheme for enabling server nodes of the high-density server to be tested in the embodiment of the present invention includes server nodes recommended for enabling in the high-density server to be tested. Enabling the server nodes recommended for enabling in the high-density server to be tested can ensure that the energy efficiency of the high-density server to be tested is the highest while ensuring that the power consumption of the entire machine of the high-density server to be tested during operation does not exceed the power consumption limit of the high-density server to be tested.

[0124] It can be understood that the number of server nodes recommended to be enabled in the high-density server to be tested in the server node enabling recommendation scheme for the high-density server to be tested is the target number.

[0125] As an optional embodiment, based on the test results of each round of testing, a recommended solution for enabling the server node corresponding to the high-density server to be tested is obtained, including: based on the power consumption value of the entire high-density server to be tested obtained in each round of testing and the power consumption value of the target server node corresponding to each round of testing, obtaining the evaluation index value corresponding to each round of testing.

[0126] Specifically, for the i Round test, the embodiment of the present invention can be used Indicates i In the first round of testing, the power consumption of the high-density server to be tested is obtained. Indicates i The power consumption value of the high-density server to be tested in the second period is obtained in the round of testing; Indicates i In the first round of testing, the i The power consumption value of the target server node corresponding to the round test is Indicates i In the second round of testing, the iThe power consumption value of the target server node corresponding to the round of testing.

[0127] In determining the i The power consumption value of the high-density server to be tested in the second period is obtained in the round test or i The power consumption value of the high-density server to be tested in the first period is obtained in the round of testing. If the power consumption of the high-density server to be tested is greater than the power consumption limit of the whole machine, it is determined that the high-density server to be tested has not passed the test. i Round test.

[0128] In determining the i The power consumption value of the high-density server to be tested in the second period is obtained in the round test or i The power consumption value of the high-density server to be tested in the first period is obtained in the round of testing. If all are not greater than the power consumption limit of the high-density server to be tested, calculate the i The power consumption value of the high-density server to be tested in the first period is obtained in the round of testing. With i In the first round of testing, the i Power consumption value of the target server node corresponding to the round test The difference, as the i The first evaluation index value corresponding to the round test ; Calculate the i The power consumption value of the high-density server to be tested in the second period is obtained in the round test With i In the second round of testing, the i Power consumption value of the target server node corresponding to the round test The difference, as the i The second evaluation index value corresponding to the round test ; Calculate the i The power consumption value of the high-density server to be tested in the first period is obtained in the round of testing. With i The power consumption value of the high-density server to be tested in the second period is obtained in the round test sum, and th i In the first round of testing, the i Power consumption value of the target server node corresponding to the round test With i The power consumption value of the high-density server to be tested in the second period is obtained in the round test The difference between the sum of i The third evaluation index value corresponding to the round test , the specific calculation formula is as follows:

[0129] It should be noted that, in the embodiment of the present invention, i The evaluation index values ​​corresponding to the round of testing can include i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value Any one of .

[0130] It should be noted that, in the embodiment of the present invention, i The evaluation index value corresponding to the round test can also be based on the i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value Calculated, for example, the i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value The sum of i The evaluation index value corresponding to the round of testing; or i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value The weighted average of i The evaluation index value corresponding to the round test; i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value The weight values ​​may be predefined based on prior knowledge and / or actual conditions.

[0131] The evaluation index values ​​corresponding to each round of testing are compared, and the round of testing with the smallest corresponding evaluation index value is determined as the target round of testing.

[0132] It is understandable that i The first evaluation index value corresponding to the round test , for i In the first period of the test round i The power consumption value of the target server node corresponding to the round of testing. i The second evaluation index value corresponding to the round test , for i In the second period of the test round i The power consumption value of the target server node corresponding to the round of testing;i The third evaluation index value corresponding to the round test , for i In the test round i The power consumption value of the target server node corresponding to the round of testing. i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value ,The smaller the above evaluation index value is, the better the energy efficiency of the high-density server to be tested is.

[0133] In the embodiment of the present invention, i The evaluation index values ​​corresponding to the round of testing are based on the i The first evaluation index value corresponding to the round test , the second evaluation index value and the third evaluation index value Obtain, therefore, i The smaller the evaluation index value corresponding to the round test, the better the energy efficiency of the high-density server to be tested.

[0134] After obtaining the evaluation index value corresponding to each round of testing, the round of testing with the smallest corresponding evaluation index value may be determined as the target round of testing.

[0135] The target server node corresponding to the target round test is determined as the server node corresponding to the high-density server to be tested, and the server node recommended to be enabled in the recommended solution is enabled.

[0136] Specifically, after determining the target round test, the target server node corresponding to the target test round can be determined as the server node corresponding to the high-density server to be tested and the server node recommended for activation in the high-density server to be tested in the server node activation recommendation scheme.

[0137] The embodiment of the present invention obtains the power consumption value of the target server node corresponding to each round of testing and the whole power consumption value of the high-density server to be tested as the test result of each round of testing, and then obtains the server node activation recommendation plan corresponding to the high-density server to be tested with the best energy efficiency based on the test result of each round of testing, so that the server node activation plan with the best energy efficiency can be recommended to the user based on the test, which can better meet the needs of energy conservation and emission reduction and has broad market application value.

[0138] It should be noted that Python is a free, open-source, easy-to-learn, and maintainable programming language. Due to the open-source nature of Python, it has been ported to many platforms and has become a programming language for writing scripts and rapidly developing applications on most platforms. This is also the reason why the present invention uses Python for programming, so that our scripts can be run directly without modifying the code, whether running under Linux or Windows, to meet the requirements of different test platforms.

[0139] In the embodiment of the present invention, the test script can be written in Python language, so that by executing the above test script, a test environment is constructed, and the specific steps of the high-density server testing method provided by the present invention are executed under the above test environment.

[0140] In order to facilitate the understanding of the high-density server testing method provided by the present invention, the high-density server testing method provided by the present invention is described below by using an example. In this example, the high-density server to be tested includes four server nodes.

[0141] Figure 3 This is the second flow chart of the high-density server testing method provided by the present invention. Figure 3 As shown, after the test starts, you can install the test tools (PTU and StressAppTest, etc.) by executing the test script.

[0142] When all server nodes in the high-density server to be tested are in a shutdown state and the rotation speeds of all fans in the high-density server to be tested are at maximum values, the whole machine power consumption value of the high-density server to be tested is obtained as the first whole machine power consumption value.

[0143] When any server node in the high-density server to be tested is in full-load operation, all server nodes except any server node in the high-density server to be tested are in shutdown state, and the rotation speed of each fan in the high-density server to be tested is the maximum value, the whole machine power consumption value of the high-density server to be tested is obtained as the second whole machine power consumption value.

[0144] Control each fan in the high-density server to be tested to restore the automatic speed regulation strategy to regulate the speed, and control all server nodes in the high-density server to be tested to shut down.

[0145] The whole machine power consumption limit value of the high-density server to be tested is obtained, and the target quantity is generated based on the whole machine power consumption limit value of the high-density server to be tested, the first whole machine power consumption value, and the second whole machine power consumption value.

[0146] Based on the target number, each target number of server nodes in the high-density server to be tested is determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement are determined as the test server nodes corresponding to each round of testing.

[0147] Conduct the i Round of testing, and through data query, obtain the i After obtaining the test results of the round of testing, determine whether the test is completed.

[0148] If the test is not completed, i Increase by 1 and return to execute the i After the test results of the first round of testing are obtained through data query, the step of determining whether the test is completed is performed until the test is determined to be completed.

[0149] After obtaining the test results of the high-density server to be tested based on the test results of each round of testing, the test ends.

[0150] When the target number M=1, the number of target server nodes corresponding to each round of testing is 1.

[0151] The first round of testing: perform stress testing on the first node in the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the first server node in the above second time period as the test result of the first round of testing, and then control the second, third, and fourth server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the first server node in the above first time period as the test result of the first round of testing.

[0152] The second round of testing: perform stress testing on the second node in the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the second server node in the above second time period as the test result of the second round of testing, and then control the 1st, 3rd, and 4th server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the second server node in the above first time period as the test result of the second round of testing.

[0153] The third round of testing: perform stress testing on the third node in the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the third server node in the above second time period as the test result of the third round of testing; then control the first, second, and fourth server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the third server node in the above first time period as the test result of the third round of testing.

[0154] The fourth round of testing: perform stress testing on the fourth node within the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the fourth server node within the second time period as the test result of the fourth round of testing; then control the first, second, and third server nodes to switch between the power-on state and the power-off state at a preset frequency within the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption value of the fourth server node within the first time period as the test result of the fourth round of testing.

[0155] When the target number M=2, the number of target server nodes corresponding to each round of testing is 2.

[0156] The first round of testing: perform stress testing on the 1st and 2nd nodes in the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 1st and 2nd server nodes in the above second time period as the test result of the first round of testing; then control the 3rd and 4th server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 1st and 2nd server nodes in the above first time period as the test result of the first round of testing.

[0157] The second round of testing: perform stress testing on the 1st and 3rd nodes in the second time period of the second preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 1st and 3rd server nodes in the above second time period as the test result of the second round of testing; then control the 2nd and 4th server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 1st and 3rd server nodes in the above first time period as the test result of the first round of testing.

[0158] The third round of testing: perform stress testing on the 1st and 4th nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption value of the 1st and 4th server nodes in the above second time period as the test result of the third round of testing; then control the 2nd and 3rd server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption value of the 1st and 4th server nodes in the above first time period as the test result of the third round of testing.

[0159] The fourth round of testing: perform stress testing on the 2nd and 3rd nodes in the second time period of the second preset time length, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 2nd and 3rd server nodes in the above second time period as the test result of the fourth round of testing; then control the 1st and 4th server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time length, and obtain the power consumption value of the entire high-density server to be tested and the power consumption values ​​of the 2nd and 3rd server nodes in the above first time period as the test result of the fourth round of testing.

[0160] The fifth round of testing: perform stress testing on the 2nd and 4th nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption value of the 2nd and 4th server nodes in the above second time period as the test result of the fifth round of testing; then control the 1st and 3rd server nodes to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption value of the 2nd and 4th server nodes in the above first time period as the test result of the fifth round of testing.

[0161] The sixth round of testing: In the second time period of the second preset time length, the 3rd and 4th nodes are stress tested, and the power consumption value of the whole high-density server to be tested and the power consumption value of the 3rd and 4th server nodes in the above second time period are obtained as the test result of the sixth round of testing. Then, in the first time period of the first preset time length, the 1st and 2nd server nodes are controlled to switch between the power-on state and the power-off state at a preset frequency, and the power consumption value of the whole high-density server to be tested and the power consumption value of the 3rd and 4th server nodes in the above first time period are obtained, which are also the test result of the sixth round of testing.

[0162] When the target number M=3, the number of target server nodes corresponding to each round of testing is 3.

[0163] The first round of testing: perform stress testing on the 1st, 2nd and 3rd nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 2nd and 3rd server nodes in the above second time period as the test result of the first round of testing, and then control the 4th server node to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 2nd and 3rd server nodes in the above first time period as the test result of the first round of testing.

[0164] The second round of testing: perform stress testing on the 1st, 2nd and 4th nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 2nd and 4th server nodes in the above second time period as the test result of the second round of testing, and then control the 3rd server node to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 2nd and 4th server nodes in the above first time period as the test result of the second round of testing.

[0165] The third round of testing: perform stress testing on the 1st, 3rd and 4th nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 3rd and 4th server nodes in the above second time period as the test result of the third round of testing, and then control the 2nd server node to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 1st, 3rd and 4th server nodes in the above first time period as the test result of the third round of testing.

[0166] The fourth round of testing: perform stress testing on the 2nd, 3rd and 4th nodes in the second time period of the second preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 2nd, 3rd and 4th server nodes in the above second time period as the test result of the fourth round of testing, and then control the 1st server node to switch between the power-on state and the power-off state at a preset frequency in the first time period of the first preset time, and obtain the power consumption value of the whole high-density server to be tested and the power consumption values ​​of the 2nd, 3rd and 4th server nodes in the above first time period as the test result of the fourth round of testing.

[0167] When the target number M=4, the number of target server nodes corresponding to each round of testing is 4.

[0168] The first round of testing: stress test the 1st, 2nd, 3rd and 4th nodes in the second period of the second preset time, and obtain the power consumption value of the whole machine of the high-density server to be tested and the power consumption value of the 1st, 2nd, 3rd and 4th server nodes in the second period as the test result of the first round of testing, and then the target number can be Update to 1, and return to execute steps 202 and 203 to obtain the target quantity The test results of each round of testing are 1, and then the target number is Update to 2, and return to execute steps 202 and 203 to obtain the target number The test results corresponding to each round of testing when the value is 2, and so on, until the target number is obtained for The test results corresponding to each round of testing under the condition of .

[0169] The high-density server testing method provided by the present invention can test a high-density server including multiple server nodes through a Python testing environment with only one control machine. The operation is simple and the degree of automation is high. The requirements for manpower and material resources can be reduced, and the testing efficiency can be greatly improved. In addition, an energy-efficient server node activation plan can be recommended to users, thereby meeting the needs of energy conservation and emission reduction.

[0170] Figure 4 This is a schematic diagram of the structure of the high-density server testing device provided by the present invention. Figure 4 The high-density server testing device provided by the present invention is described. The high-density server testing device described below and the high-density server testing method provided by the present invention described above can be referred to each other. Figure 4 As shown, the device includes: a data acquisition module 401, a node determination module 402, a node testing module 403 and a result output module 404.

[0171] The data acquisition module 401 is used to acquire the whole machine power consumption limit value of the high-density server to be tested, and acquire the target quantity based on the whole machine power consumption limit value.

[0172] The node determination module 402 is used to determine each target number of server nodes in the high-density server to be tested as the target server node corresponding to each round of testing, and determine the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement as the test server nodes corresponding to each round of testing.

[0173] The node testing module 403 is used to control the test server node corresponding to each round of testing to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset duration in each round of testing, and obtain the test data within the first time period as the test result of each round of testing. The test data includes log information generated by the high-density server to be tested and / or log information generated by the testing tool.

[0174] The result output module 404 is used to obtain the test result of the high-density server to be tested based on the test result of each round of testing.

[0175] Specifically, the data acquisition module 401, the node determination module 402, the node testing module 403 and the result output module 404 are electrically connected.

[0176] Figure 5 Schematic diagram of the connection between the high-density server testing device provided by the present invention and the high-density server to be tested. Figure 5 shown.

[0177] The high-density server testing device in the embodiment of the present invention obtains the number of server nodes that can be enabled in the high-density server to be tested based on the power consumption limit value of the whole machine of the high-density server to be tested, and after that takes it as the target number, each target number of server nodes in the high-density server to be tested is determined as the target server node corresponding to each round of testing, and the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement are determined as the test server nodes corresponding to each round of testing, and then in each round of testing, the target test nodes corresponding to each round of testing are stress tested within a second time period of a second preset time length, and the test data within the second time period is obtained as the test result of each round of testing, and then the test server nodes corresponding to each round of testing are controlled to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time length, and the test data within the first time period is obtained. According to the test results of each round of tests, the test results of the high-density server to be tested are obtained based on the test results of each round of tests. On the basis of avoiding the risk of damage to the high-density server to be tested, by controlling the test server node corresponding to each round of tests in each round of tests to switch between the power-on state and the power-off state at a preset frequency, the whole machine current of the high-density server to be tested fluctuates frequently, thereby making the electromagnetic interference between the server nodes and different electronic devices in the high-density server to be tested more serious, so that the reliability and stability of the high-density server to be tested under high-intensity and interactive electromagnetic interference can be better tested, and the operation of the high-density server nodes to be tested under high-intensity and interactive electromagnetic interference can be tested, which can improve the comprehensiveness and accuracy of the test of the high-density server, the testing method is simple, and the degree of automation is high, which can improve the testing efficiency of the high-density server.

[0178] Figure 6 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 6 As shown, the electronic device may include: a processor (processor) 610 , a communication interface (Communications Interface) 620 , a memory (memory) 630 and a communication bus 640 , wherein the processor 610 , the communication interface 620 , and the memory 630 communicate with each other through the communication bus 640 . The processor 610 can call the logic instructions in the memory 630 to execute the high-density server testing method, which includes: obtaining the whole-machine power consumption limit value of the high-density server to be tested, and obtaining the target number based on the whole-machine power consumption limit value; determining each target number of server nodes in the high-density server to be tested as the target server node corresponding to each round of testing, and determining the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement as the test server nodes corresponding to each round of testing; in each round of testing, controlling the test server nodes corresponding to each round of testing to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time, and obtaining test data within the first time period as the test result of each round of testing, the test data including the log information generated by the high-density server to be tested and / or the log information generated by the testing tool; based on the test result of each round of testing, obtaining the test result of the high-density server to be tested.

[0179] In addition, the logic instructions in the above-mentioned memory 630 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0180] On the other hand, the present invention also provides a computer program product, which includes a computer program. The computer program can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the high-density server testing method provided by the above methods, which method includes: obtaining the whole-machine power consumption limit value of the high-density server to be tested, and obtaining a target number based on the whole-machine power consumption limit value; determining each target number of server nodes in the high-density server to be tested as the target server node corresponding to each round of testing, and determining the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement as the test server nodes corresponding to each round of testing; in each round of testing, controlling the test server nodes corresponding to each round of testing to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time length, and obtaining test data within the first time period as the test result of each round of testing, the test data including log information generated by the high-density server to be tested and / or log information generated by the testing tool; based on the test result of each round of testing, obtaining the test result of the high-density server to be tested.

[0181] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the high-density server testing method provided by the above-mentioned methods, the method comprising: obtaining the whole-machine power consumption limit value of the high-density server to be tested, and obtaining a target number based on the whole-machine power consumption limit value; determining each target number of server nodes in the high-density server to be tested as the target server node corresponding to each round of testing, and determining the server nodes in the high-density server to be tested except the target server nodes corresponding to each round of measurement as the test server nodes corresponding to each round of testing; in each round of testing, controlling the test server nodes corresponding to each round of testing to switch between the power-on state and the power-off state at a preset frequency within a first time period of a first preset time length, and obtaining test data within the first time period as the test result of each round of testing, the test data including log information generated by the high-density server to be tested and / or log information generated by the testing tool; based on the test result of each round of testing, obtaining the test result of the high-density server to be tested.

[0182] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0183] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0184] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A high-density server testing method, characterized in that: include: Obtaining a whole-machine power consumption limit value of the high-density server to be tested, and obtaining a target quantity based on the whole-machine power consumption limit value; Determine each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and determine the server nodes in the high-density server to be tested other than the target server nodes corresponding to each round of measurement as test server nodes corresponding to each round of testing; In each round of testing, the test server node corresponding to each round of testing is controlled to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration, and test data within the first time period is obtained as a test result of each round of testing, wherein the test data includes log information generated by the high-density server to be tested and / or log information generated by a test tool; Based on the test results of each round of testing, the test results of the high-density server to be tested are obtained.

2. The high-density server testing method according to claim 1, characterized in that: In each round of testing, before controlling the test server node corresponding to each round of testing to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration, and obtaining test data within the first time period as a test result of each round of testing, the method further includes: In each round of testing, a stress test is performed on the target test node corresponding to each round of testing within a second time period of a second preset duration, and test data within the second time period is obtained as the test result of each round of testing. The end time of the second time period is the start time of the first time period.

3. The high-density server testing method according to claim 2, characterized in that: The test data includes: the power consumption value of the target server node corresponding to each round of testing and the whole machine power consumption value of the high-density server to be tested; The obtaining the test result of the high-density server to be tested based on the test result of each round of testing includes: Based on the test results of each round of testing, a server node activation recommendation scheme corresponding to the high-density server to be tested is obtained as the test result of the high-density server to be tested, and the server node activation recommendation scheme includes server nodes recommended for activation in the high-density server to be tested.

4. The high-density server testing method according to claim 3, characterized in that: The obtaining, based on the test results of each round of testing, a recommended solution for enabling a server node corresponding to the high-density server to be tested, comprises: Based on the whole machine power consumption value of the high-density server to be tested obtained in each round of testing and the power consumption value of the target server node corresponding to each round of testing, obtaining the evaluation index value corresponding to each round of testing; Compare the evaluation index values ​​corresponding to each round of the test, and determine the round of test with the smallest corresponding evaluation index value as the target round of test; The target server node corresponding to the target round test is determined as the server node corresponding to the high-density server to be tested and the server node recommended to be enabled in the recommended solution.

5. The high-density server testing method according to claim 1, characterized in that: The step of determining each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and determining server nodes in the high-density server to be tested other than the target server nodes corresponding to each round of measurement as test server nodes corresponding to each round of testing, comprises: Selecting the target number of server nodes from among the server nodes in the high-density server to be tested as target server nodes corresponding to the first round of testing, and determining the server nodes in the high-density server to be tested other than the target server nodes corresponding to the first round of testing as test servers corresponding to the first round of testing; In the case where the target number is less than the total number of server nodes in the high-density server to be tested, the target number of server nodes is selected again from each server node in the high-density server to be tested, and the server nodes of the target number are determined to be equal to the first server node. i - If the target server nodes corresponding to the first round of testing are different, the target number of server nodes selected again is determined as the first i The target server nodes corresponding to the round of testing are i The server nodes other than the target server nodes corresponding to the round of testing are determined as the first i The test server corresponding to the first test, i increases by 1, and the process returns to the step of selecting the target number of server nodes from each server node in the high-density server to be tested again, until it is determined that there is no server node in the high-density server to be tested that is inconsistent with the first test server. i -1 round of testing corresponds to a target server node with different target number of server nodes.

6. The high-density server testing method according to any one of claims 1 to 5, characterized in that: The obtaining a target quantity based on the whole machine power consumption limit value includes: When all server nodes in the high-density server to be tested are in a shutdown state and the rotation speed of each fan in the high-density server to be tested is at a maximum value, obtaining a whole-machine power consumption value of the high-density server to be tested as a first whole-machine power consumption value; When any server node in the high-density server to be tested is in a full-load operation state, all server nodes in the high-density server to be tested except the any server node are in a shutdown state, and the rotation speed of each fan in the high-density server to be tested is a maximum value, obtaining a whole-machine power consumption value of the high-density server to be tested as a second whole-machine power consumption value; The target quantity is acquired based on the first whole-machine power consumption value, the second whole-machine power consumption value, and the whole-machine power consumption limit value.

7. The high-density server testing method according to claim 6, characterized in that: The acquiring the target quantity based on the first whole machine power consumption value, the second whole machine power consumption value, and the whole machine power consumption limit value includes: Calculate the difference between the second whole machine power consumption value and the first whole machine power consumption value as the first power consumption value, calculate the sum of the second whole machine power consumption value and the first power consumption value as the second power consumption value, calculate the sum of the second whole machine power consumption value and twice the first power consumption value as the third power consumption value, calculate the sum of the second whole machine power consumption value and three times the first power consumption value as the fourth power consumption value, and calculate the sum of the second whole machine power consumption value and four times the first power consumption value as the fifth power consumption value; Based on the size relationship between the first whole-machine power consumption value and at least two of the second whole-machine power consumption value, the second power consumption value, the third power consumption value, the fourth power consumption value and the fifth power consumption value, the number of server nodes that can be enabled in the high-density server to be tested is obtained as the target number.

8. A high-density server testing device, characterized in that: include: A data acquisition module is used to obtain the power consumption limit value of the whole machine of the high-density server to be tested, and obtain the target quantity based on the power consumption limit value of the whole machine; A node determination module, used to determine each of the target number of server nodes in the high-density server to be tested as a target server node corresponding to each round of testing, and to determine the server nodes in the high-density server to be tested other than the target server nodes corresponding to each round of measurement as test server nodes corresponding to each round of testing; A node testing module, used for controlling the test server node corresponding to each round of testing to switch between a power-on state and a power-off state at a preset frequency within a first time period of a first preset duration in each round of testing, and obtaining test data within the first time period as the test result of each round of testing, wherein the test data includes log information generated by the high-density server to be tested and / or log information generated by a testing tool; The result output module is used to obtain the test result of the high-density server to be tested based on the test result of each round of testing.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the high-density server testing method as described in any one of claims 1 to 7 is implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the high-density server testing method as described in any one of claims 1 to 7 is implemented.

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