Conduction test system and control method thereof

Abstract

The invention provides a conduction test system and a control method thereof.The conduction test system comprises a first probe, a second probe, a third probe, a fourth probe, a first switch, a second switch and a control module, and the first end of the first probe and the first end of the second probe are used for making contact with a first metal piece; the first end of the third probe and the first end of the fourth probe are used for making contact with second metal, the second end of the first probe is connected with the first power end of the conduction test system, and the second end of the second probe is connected with the second power end of the conduction test system and a first detection point of the conduction test system. The second end of the third probe is connected with the first power supply end, the second end of the fourth probe is connected with the second power supply end and a second detection point of the conduction test system, and the first switch is connected between the second end of the second probe and the second power supply end and between the second end of the second probe and the first detection point. And the second switch is connected between the second end of the third probe and the first power supply end.

Description

Technical Field

[0001] The embodiments of the present disclosure relate to the technical field of electronic circuits, and more specifically, to a conduction test system and a control method thereof. Background Art

[0002] As electronic products develop towards miniaturization and complexity, the integration of injection molded parts in electronic products is becoming more and more complex, and the number of metal parts containing metal pads in the parts is increasing. According to the functional requirements of the product, electrical conduction is not allowed between different metal parts.

[0003] Therefore, it is necessary to propose a technical solution that can detect whether there is electrical conduction between different metal parts. Summary of the invention

[0004] An object of the embodiments of the present disclosure is to provide a conduction test system and a control method thereof.

[0005] According to a first aspect of an embodiment of the present disclosure, a conduction test system is provided, including a first probe, a second probe, a third probe, a fourth probe, a first switch, a second switch and a control module.

[0006] The first end of the first probe and the first end of the second probe are used to contact the first metal part, the first end of the third probe and the first end of the fourth probe are used to contact the second metal, the second end of the first probe is connected to the first power supply end of the conduction test system, the second end of the second probe is connected to the second power supply end of the conduction test system and the first detection point of the conduction test system, the second end of the third probe is connected to the first power supply end, the second end of the fourth probe is connected to the second power supply end and the second detection point of the conduction test system, the first switch is connected between the second end of the second probe and the second power supply end, and between the second end of the second probe and the first detection point, and the second switch is connected between the second end of the third probe and the first power supply end;

[0007] The control module is configured to control the switching states of the first switch and the second switch, and detect whether the first metal member and the second metal member are conductive according to the voltages of the first detection point and the second detection point.

[0008] Optionally, the control module is configured to control both the first switch and the second switch to be turned on, and detect the reliability of the conduction test system according to the first detection point and the second detection point.

[0009] Optionally, the control module is configured to determine that the conduction test system is reliable when the voltages at the first detection point and the second detection point are both the voltages of the first power supply terminal.

[0010] Optionally, the control module is configured to control both the first switch and the second switch to be disconnected when it is determined that the conduction test system is reliable, and detect whether there is conduction between the first metal part and the second metal part based on the voltage of the first detection point and the second detection point.

[0011] Optionally, the control module is configured to determine that the first metal part and the second metal part are conductive when the voltage at the first detection point is the voltage at the second power supply end and the voltage at the second detection point is the voltage at the first power supply end.

[0012] Optionally, the first switch and the second switch are provided by a relay.

[0013] Optionally, the conduction test system further includes a first indication light and a second indication light, wherein the first indication light is connected between the second end of the first probe and the first power supply end, and the second indication light is connected between the second end of the third probe and the first power supply end.

[0014] Optionally, the conduction test system further includes a cylinder corresponding to each probe one by one, and the control module is further configured to control the cylinder to drive the first end of the corresponding probe to contact the corresponding metal part.

[0015] Optionally, the conduction test system further includes a first resistor and a second resistor, wherein the first resistor is connected between the first detection point and the second power supply terminal, and the second resistor is connected between the second detection point and the second power supply terminal.

[0016] According to a second aspect of the present disclosure, a control method for a conduction test system is provided, wherein the conduction test system comprises a first probe, a second probe, a third probe, a fourth probe, a first switch, and a second switch, wherein the first end of the first probe and the first end of the second probe are used to contact a first metal member, the first end of the third probe and the first end of the fourth probe are used to contact a second metal member, the second end of the first probe is connected to a first power supply end of the conduction test system, the second end of the second probe is connected to a second power supply end of the conduction test system and a first detection point of the conduction test system, the second end of the third probe is connected to the first power supply end, the second end of the fourth probe is connected to the second power supply end and a second detection point of the conduction test system, the first switch is connected between the second end of the second probe and the second power supply end, and between the second end of the second probe and the first detection point, and the second switch is connected between the second end of the third probe and the first power supply end;

[0017] The method comprises:

[0018] Controlling the first switch and the second switch to be turned on, and obtaining the voltages of the first detection point and the second detection point when the first switch and the second switch are both turned on;

[0019] Controlling the first switch and the second switch to be disconnected, and obtaining the voltages of the first detection point and the second detection point when the first switch and the second switch are both disconnected;

[0020] Whether conduction between the first metal member and the second metal member is detected according to the voltages at the first detection point and the second detection point.

[0021] Through the embodiments of the present disclosure, it is possible to detect whether there is electrical conduction between the first metal part and the second metal part, thereby improving the accuracy of the detection result, reducing misjudgment, and improving the qualified rate of the product.

[0022] Further features and advantages of the present invention will become apparent from the following detailed description of exemplary embodiments of the present invention with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.

[0024] Figure 1 is a block diagram of a continuity test system according to an embodiment of the present disclosure;

[0025] Figure 2 is a schematic diagram of current flow direction of a conduction test system according to an embodiment of the present disclosure;

[0026] Figure 3 is a schematic diagram of current flow of a conduction test system according to another embodiment of the present disclosure;

[0027] Figure 4 is a flowchart of a control method of a conduction test system according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0028] Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that the relative arrangement of components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless otherwise specifically stated.

[0029] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.

[0030] Technologies, methods and equipment known to persons of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the technologies, methods and equipment should be considered part of the specification.

[0031] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0032] It should be noted that like reference numerals and letters refer to similar items in the following figures, and therefore, once an item is defined in one figure, it need not be further discussed in subsequent figures.

[0033] The present disclosure provides a conduction test system, such as Figure 1 As shown, the conduction test system 1000 may include a first probe 1101 , a second probe 1102 , a third probe 1103 , a fourth probe 1104 , a first switch 1201 , a second switch 1202 and a control module 1300 .

[0034] The first end of the first probe 1101 and the first end of the second probe 1102 are used to contact the first metal part A, the first end of the third probe 1103 and the first end of the fourth probe 1104 are used to contact the second metal B, the second end of the first probe 1101 is connected to the first power supply terminal VCC1 of the conduction test system 1000, the second end of the second probe 1102 is connected to the second power supply terminal VCC2 of the conduction test system 1000 and the first detection point P1 of the conduction test system 1000, the second end of the third probe 1103 is connected to the first power supply terminal VCC1, the second end of the fourth probe 1104 is connected to the second power supply terminal VCC2 and the second detection point P2 of the conduction test system 1000, the first switch 1201 is connected between the second end of the second probe 1102 and the second power supply terminal VCC2, and between the second end of the second probe 1102 and the first detection point P1, and the second switch 1202 is connected between the second end of the third probe 1103 and the first power supply terminal VCC1.

[0035] The control module 1300 is configured to control the switching states of the first switch 1201 and the second switch 1202 , and detect whether the first metal member and the second metal member are conductive according to the voltages at the first detection point P1 and the second detection point P2 .

[0036] In this embodiment, the first metal part and the second metal part are two metal parts in the electronic product obtained by injection molding. The first metal part and the second metal part can be conductive or disconnected. The conductivity test system 1000 of this embodiment can detect whether the first metal part and the second metal part are conductive, and determine whether the corresponding electronic product is qualified based on the detection result.

[0037] In a case where the first metal part and the second metal part need to be conductive, if the conductivity test system 1000 of this embodiment detects that the first metal part and the second metal part are conductive, it can be determined that the corresponding electronic product is qualified; if the conductivity test system 1000 of this embodiment detects that the first metal part and the second metal part are disconnected, it can be determined that the corresponding electronic product is unqualified.

[0038] In a case where the first metal part and the second metal part need to be disconnected, if the conductivity test system 1000 of this embodiment detects that the first metal part and the second metal part are conductive, it can be determined that the corresponding electronic product is unqualified; if the conductivity test system 1000 of this embodiment detects that the first metal part and the second metal part are disconnected, it can be determined that the corresponding electronic product is qualified.

[0039] In one embodiment of the present disclosure, the first detection point P1 and the second detection point P2 may be respectively connected to different ports in the control module 1300 , so that the control module 1300 detects the voltages of the first detection point P1 and the second detection point P2 .

[0040] In one embodiment, the control module 1300 may be a programmable logic controller (PLC), or a microcontroller unit (MCU), an advanced RISC machine (ARM), or other controllers, which are not limited here.

[0041] In one embodiment, the conduction test system may further include a power supply. The first power supply terminal VCC1 may be connected to the positive electrode of the power supply, and the second power supply terminal VCC2 may be connected to the negative electrode of the power supply; or, the first power supply terminal VCC1 may be connected to the negative electrode of the power supply, and the second power supply terminal VCC2 may be connected to the positive electrode of the power supply.

[0042] In this embodiment, the control module 1300 can detect whether the first metal part and the second metal part are conductive based on the voltage of the first metal part and the second metal part when the first switch 1201 and the second switch 1202 are both conductive, and the voltage of the first metal part and the second metal part when the first switch 1201 and the second switch 1202 are both disconnected.

[0043] Through the embodiments of the present disclosure, it is possible to detect whether there is electrical conduction between the first metal part and the second metal part, thereby improving the accuracy of the detection result, reducing misjudgment, and improving the qualified rate of the product.

[0044] In one embodiment of the present disclosure, the conduction test system 1000 further includes a first resistor and a second resistor, wherein the first resistor is connected between the first detection point P1 and the second power supply terminal VCC2, and the second resistor is connected between the second detection point P2 and the second power supply terminal VCC2.

[0045] In one embodiment of the present disclosure, the control module 1300 is configured to control both the first switch 1201 and the second switch 1202 to be turned on, and detect the reliability of the conduction test system 1000 according to the first detection point P1 and the second detection point P2.

[0046] In this embodiment, when the first switch 1201 and the second switch 1202 are both turned on, if the voltage of the first power supply terminal VCC1 is greater than the voltage of the second power supply terminal VCC2, the current loop formed by the conduction test system 1000 and the first metal member and the second metal member can be as follows: Figure 2 If the voltage of the power supply terminal VCC1 is less than the voltage of the second power supply terminal VCC2, the current loop formed by the conduction test system 1000 and the first metal member and the second metal member may be as shown in FIG. Figure 2The arrows shown in are in opposite directions. If the first probe 1101 and the second probe 1102 are in good contact with the first metal part, and the conduction test system 1000 is normal, then the voltage at the first detection point P1 is the voltage of the first power supply terminal VCC1. If the third probe 1103 and the fourth probe 1104 are in good contact with the second metal part, and the conduction test system 1000 is normal, then the voltage at the second detection point P2 is the voltage of the first power supply terminal VCC1.

[0047] Further, the control module 1300 is configured to determine that the conduction test system 1000 is reliable when the voltages at the first detection point P1 and the second detection point P2 are both the voltage of the first power supply terminal VCC1.

[0048] Furthermore, when at least one of the voltage at the first detection point P1 and the voltage at the second detection point P2 is not the voltage of the first power supply terminal VCC1 , the control module 1300 determines that the conduction test system 1000 is unreliable.

[0049] In this embodiment, when the conduction test system is reliable, the detection result of whether the first metal member and the second metal member are conductive is more accurate. When the conduction test system is unreliable, the detection result of whether the first metal member and the second metal member are conductive is also inaccurate.

[0050] When the first probe 1101 and / or the second probe 1102 are not in good contact with the first metal part, the voltage at the first detection point P1 will be the voltage of the second power supply terminal VCC2. When the third probe 1103 and the fourth probe 1104 are not in good contact with the second metal part, the voltage at the second detection point P2 will be the voltage of the second power supply terminal VCC2.

[0051] Through this embodiment, the reliability of the conduction test system 1000 can be detected based on the voltage at the first detection point P1 and the voltage at the second detection point P2 when the first switch 1201 and the second switch 1202 are both turned on, thereby making the subsequent detection result of whether the first metal part and the second metal part are conductive more accurate.

[0052] In one embodiment of the present disclosure, the control module 1300 is configured to control the first switch 1201 and the second switch 1202 to be disconnected when it is determined that the conduction test system 1000 is reliable, and detect whether there is conduction between the first metal part and the second metal part based on the voltage of the first detection point P1 and the second detection point P2.

[0053] In this embodiment, when the first switch 1201 and the second switch 1202 are both disconnected, if the voltage of the first power supply terminal VCC1 is greater than the voltage of the second power supply terminal VCC2, the current loop formed by the conduction test system 1000 and the first metal member and the second metal member can be as follows: Figure 3 If the voltage of the power supply terminal VCC1 is less than the voltage of the second power supply terminal VCC2, the current loop formed by the conduction test system 1000 and the first metal member and the second metal member may be as shown in FIG. Figure 3 The arrows shown in the figure are in opposite directions. If the first metal member and the second metal member are conductive, the voltage at the first detection point P1 is the voltage at the second power supply terminal VCC2, and the voltage at the second detection point P2 is the voltage at the first power supply terminal VCC1. If the first metal member and the second metal member are disconnected, the voltage at the first detection point P1 and the voltage at the second detection point P2 are both the voltage at the second power supply terminal VCC2.

[0054] Further, the control module 1300 is configured to determine that the first metal member is conductive with the second metal member when the voltage at the first detection point P1 is the voltage of the second power supply terminal VCC2 and the voltage at the second detection point P2 is the voltage of the first power supply terminal VCC1.

[0055] Furthermore, the control module 1300 is configured to determine that there is no conduction between the first metal member and the second metal member when the voltage at the first detection point P1 and the voltage at the second detection point P2 are both the voltage of the second power supply terminal VCC2.

[0056] Through this embodiment, when it is determined that the conduction test system is reliable, whether the first metal part and the second metal part are conductive can be accurately detected based on the voltage at the first detection point P1 and the voltage at the second detection point P2 when the first switch 1201 and the second switch 1202 are both disconnected.

[0057] In one embodiment of the present disclosure, the first switch 1201 and the second switch 1202 are provided by one relay.

[0058] In one embodiment, the first switch 1201 and the second switch 1202 may be two normally closed contacts of a relay. When the first switch 1201 and the second switch 1202 are both turned on, the relay may not be powered, and when the first switch 1201 and the second switch 1202 are both turned off, the relay may be powered.

[0059] In one embodiment of the present disclosure, the conduction test system 1000 further includes a first indicator light and a second indicator light, wherein the first indicator light is connected between the second end of the first probe and the first power supply end, and the second indicator light is connected between the second end of the third probe and the first power supply end.

[0060] In this embodiment, when the first switch 1201 and the second switch 1202 are both turned on, if the first probe 1101 and the second probe 1102 are both in good contact with the first metal part and the conduction test system 1000 is normal, then the first prompt light is on; if the first probe 1101 and / or the second probe 1102 are not in good contact with the first metal part and / or the conduction test system 1000 is faulty, then the first prompt light is off. If the third probe 1103 and the fourth probe 1104 are both in good contact with the second metal part and the conduction test system 1000 is normal, then the second prompt light is on; if the third probe 1103 and / or the fourth probe 1104 are not in good contact with the second metal part and / or the conduction test system 1000 is faulty, then the second prompt light is off.

[0061] When the first switch 1201 and the second switch 1202 are both disconnected, if the first metal member and the second metal member are connected, the first warning light is illuminated and the second warning light is not illuminated. If the first metal member and the second metal member are disconnected, the first warning light and the second warning light are not illuminated.

[0062] Through this embodiment, the lighting conditions of the first prompt light and the second prompt light enable the tester to intuitively observe the reliability test result of the conduction test system and the test result of whether the first metal part and the second metal part are conductive.

[0063] In one embodiment of the present disclosure, the conduction test system 1000 further includes a cylinder corresponding to each probe, and the control module 1300 is further configured to control the cylinder to drive the first end of the corresponding probe to contact the corresponding metal part.

[0064] In this embodiment, the conduction test system includes a first cylinder corresponding to the first probe 1101, a second cylinder corresponding to the second probe 1102, a third cylinder corresponding to the third probe 1103, and a fourth cylinder corresponding to the fourth probe 1104. Specifically, the control module controls the first cylinder to drive the first probe 1101 to move toward the first metal part, so that the first end of the first probe 1101 contacts the first metal part; the control module controls the second cylinder to drive the second probe 1102 to move toward the first metal part, so that the first end of the second probe 1102 contacts the first metal part; the control module controls the third cylinder to drive the third probe 1103 to move toward the second metal part, so that the first end of the third probe 1103 contacts the second metal part; the control module controls the fourth cylinder to drive the fourth probe 1104 to move toward the second metal part, so that the first end of the fourth probe 1104 contacts the second metal part.

[0065] Further, when the detection is completed and the detection result of whether the first metal part and the second metal part are conductive is obtained, the control module controls the cylinder to drive the corresponding probe to move in a direction away from the corresponding metal part, so that the first end of the corresponding probe stops contacting with the corresponding metal part, so as to replace the electronic product to be detected. Specifically, the control module controls the first cylinder to drive the first probe 1101 to move in a direction away from the first metal part, so that the first end of the first probe 1101 stops contacting with the first metal part; the control module controls the second cylinder to drive the second probe 1102 to move in a direction away from the first metal part, so that the first end of the second probe 1102 stops contacting with the first metal part; the control module controls the third cylinder to drive the third probe 1103 to move in a direction away from the second metal part, so that the first end of the third probe 1103 stops contacting with the second metal part; the control module controls the fourth cylinder to drive the fourth probe 1104 to move in a direction away from the second metal part, so that the first end of the fourth probe 1104 stops contacting with the second metal part.

[0066] Through this embodiment, the movement control of the probe can be realized to detect whether the first metal part and the second metal part in different electronic products are conductive.

[0067] <Method Example>

[0068] The present disclosure provides a control method for a conduction test system, the conduction test system comprising a first probe, a second probe, a third probe, a fourth probe, a first switch, and a second switch, the first end of the first probe and the first end of the second probe are used to contact the first metal part, the first end of the third probe and the first end of the fourth probe are used to contact the second metal, the second end of the first probe is connected to the first power supply end of the conduction test system, the second end of the second probe is connected to the second power supply end of the conduction test system and the first detection point of the conduction test system, the second end of the third probe is connected to the first power supply end, the second end of the fourth probe is connected to the second power supply end and the second detection point of the conduction test system, the first switch is connected between the second end of the second probe and the second power supply end, and between the second end of the second probe and the first detection point, and the second switch is connected between the second end of the third probe and the first power supply end. In an example, the conduction test system may be the aforementioned conduction test system 1000, and the control method of this embodiment may be implemented by the control module 1300 in the conduction test system 1000.

[0069] Figure 4 Flow chart of a conduction test method according to an embodiment of the present disclosure.

[0070] like Figure 4 As shown, the method includes steps S4100 to S4300 as shown below:

[0071] Step S4100: Control the first switch and the second switch to be turned on, and obtain the voltages of the first detection point and the second detection point when the first switch and the second switch are both turned on.

[0072] Step S4200: Control the first switch and the second switch to be turned off, and obtain the voltages of the first detection point and the second detection point when the first switch and the second switch are turned off.

[0073] Step S4300: Detect whether the first metal member and the second metal member are conductive based on the voltages at the first detection point and the second detection point.

[0074] In this embodiment, when the voltages at the first detection point and the second detection point are both the voltages at the first power supply terminal when the first switch and the second switch are both turned on, it can be determined that the conduction test system is reliable, and step S4200 is continued. If at least one of the voltages at the first detection point and the second detection point is not the voltage at the first power supply terminal when the first switch and the second switch are both turned on, it can be determined that the conduction test system is unreliable, and there is no need to use the conduction test system to detect whether the first metal member and the second metal member are conductive.

[0075] Further, when the first switch and the second switch are both turned on, the voltages at the first detection point and the second detection point are both the voltage of the second power supply end, and when the first switch and the second switch are both turned off, the voltage at the first detection point is the voltage of the second power supply end and the voltage at the second detection point is the voltage of the first power supply end, it can be determined that the first metal part and the second metal part are conductive; when the first switch and the second switch are both turned on, the voltages at the first detection point and the second detection point are both the voltage of the second power supply end, and when the first switch and the second switch are both turned off, the voltages at the first detection point and the second detection point are both the voltage of the second power supply end, it can be determined that there is no conductivity between the first metal part and the second metal part.

[0076] Through this embodiment, it is possible to detect whether there is electrical conduction between the first metal part and the second metal part, thereby improving the accuracy of the detection result, reducing misjudgment, and improving the qualified rate of products.

[0077] <Readable Storage Medium Embodiment>

[0078] This embodiment provides a computer-readable storage medium, in which a computer program is stored. When the computer program is executed by a processor, the method described in any method embodiment of the present disclosure is executed.

[0079] The present invention may be a system, a method and / or a computer program product. The computer program product may include a computer-readable storage medium carrying computer-readable program instructions for causing a processor to implement various aspects of the present invention.

[0080] A computer-readable storage medium may be a tangible device that can hold and store instructions used by an instruction execution device. A computer-readable storage medium may be, for example, but not limited to, an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples of computer-readable storage media (a non-exhaustive list) include: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a raised structure in a groove on which instructions are stored, and any suitable combination of the foregoing. As used herein, a computer-readable storage medium is not to be interpreted as a transient signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., a light pulse through a fiber optic cable), or an electrical signal transmitted through a wire.

[0081] The computer-readable program instructions described herein can be downloaded from a computer-readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device via a network, such as the Internet, a local area network, a wide area network, and / or a wireless network. The network can include copper transmission cables, optical fiber transmissions, wireless transmissions, routers, firewalls, switches, gateway computers, and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in the computer-readable storage medium in each computing / processing device.

[0082] The computer program instructions for performing the operation of the present invention may be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages, such as Smalltalk, C++, etc., and conventional procedural programming languages, such as "C" language or similar programming languages. Computer-readable program instructions may be executed entirely on a user's computer, partially on a user's computer, as an independent software package, partially on a user's computer, partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider to connect via the Internet). In some embodiments, an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), may be personalized by utilizing the state information of the computer-readable program instructions, and the electronic circuit may execute the computer-readable program instructions, thereby realizing various aspects of the present invention.

[0083] Various aspects of the present invention are described herein with reference to the flow charts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present invention. It should be understood that each box of the flow chart and / or block diagram and the combination of each box in the flow chart and / or block diagram can be implemented by computer-readable program instructions.

[0084] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, thereby producing a machine, so that when these instructions are executed by the processor of the computer or other programmable data processing device, a device that implements the functions / actions specified in one or more boxes in the flowchart and / or block diagram is generated. These computer-readable program instructions can also be stored in a computer-readable storage medium, and these instructions cause the computer, programmable data processing device, and / or other equipment to work in a specific manner, so that the computer-readable medium storing the instructions includes a manufactured product, which includes instructions for implementing various aspects of the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0085] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operating steps are performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0086] The flow charts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the systems, methods and computer program products according to multiple embodiments of the present invention. In this regard, each box in the flow chart or block diagram can represent a part of a module, a program segment or an instruction, and a part of the module, a program segment or an instruction contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flow chart, and the combination of the boxes in the block diagram and / or flow chart can be implemented by a dedicated hardware-based system that performs the specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions. It is well known to those skilled in the art that it is equivalent to implement it by hardware, implement it by software, and implement it by combining software and hardware.

[0087] Embodiments of the present invention have been described above, and the above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The selection of terms used herein is intended to best explain the principles of the embodiments, practical applications, or technical improvements in the marketplace, or to enable other persons of ordinary skill in the art to understand the embodiments disclosed herein. The scope of the present invention is defined by the appended claims.

Claims

1. A continuity test system, characterized in that: It includes a first probe, a second probe, a third probe, a fourth probe, a first switch, a second switch and a control module, The first end of the first probe and the first end of the second probe are used to contact the first metal part, the first end of the third probe and the first end of the fourth probe are used to contact the second metal, the second end of the first probe is connected to the first power supply end of the conduction test system, the second end of the second probe is connected to the second power supply end of the conduction test system and the first detection point of the conduction test system, the second end of the third probe is connected to the first power supply end, the second end of the fourth probe is connected to the second power supply end and the second detection point of the conduction test system, the first switch is connected between the second end of the second probe and the second power supply end, and between the second end of the second probe and the first detection point, and the second switch is connected between the second end of the third probe and the first power supply end; The control module is configured to control the switching states of the first switch and the second switch, and detect whether the first metal member and the second metal member are conductive according to the voltages of the first detection point and the second detection point.

2. The continuity test system according to claim 1, characterized in that: The control module is configured to control both the first switch and the second switch to be turned on, and detect the reliability of the conduction test system according to the first detection point and the second detection point.

3. The continuity test system according to claim 2, characterized in that: The control module is configured to determine that the conduction test system is reliable when the voltages at the first detection point and the second detection point are both the voltages at the first power supply end.

4. The continuity test system according to claim 3, characterized in that: The control module is configured to control the first switch and the second switch to be disconnected when it is determined that the conduction test system is reliable, and detect whether the first metal part and the second metal part are conductive based on the voltages of the first detection point and the second detection point.

5. The continuity test system according to claim 4, characterized in that: The control module is configured to determine that the first metal member and the second metal member are conductive when the voltage at the first detection point is the voltage at the second power supply end and the voltage at the second detection point is the voltage at the first power supply end.

6. The continuity test system according to claim 1, characterized in that: The first switch and the second switch are provided by a relay.

7. The continuity test system according to claim 1, characterized in that: The conduction test system further includes a first indication light and a second indication light, wherein the first indication light is connected between the second end of the first probe and the first power supply end, and the second indication light is connected between the second end of the third probe and the first power supply end.

8. The continuity test system according to claim 1, characterized in that: The conduction test system further includes a cylinder corresponding to each probe one by one, and the control module is further configured to control the cylinder to drive the first end of the corresponding probe to contact the corresponding metal part.

9. The continuity test system according to claim 1, characterized in that: The conduction test system further includes a first resistor and a second resistor, wherein the first resistor is connected between the first detection point and the second power supply terminal, and the second resistor is connected between the second detection point and the second power supply terminal.

10. A control method for a conduction test system, characterized in that: The conduction test system comprises a first probe, a second probe, a third probe, a fourth probe, a first switch and a second switch, wherein the first end of the first probe and the first end of the second probe are used to contact the first metal member, the first end of the third probe and the first end of the fourth probe are used to contact the second metal member, the second end of the first probe is connected to the first power supply end of the conduction test system, the second end of the second probe is connected to the second power supply end of the conduction test system and the first detection point of the conduction test system, the second end of the third probe is connected to the first power supply end, the second end of the fourth probe is connected to the second power supply end and the second detection point of the conduction test system, the first switch is connected between the second end of the second probe and the second power supply end, and between the second end of the second probe and the first detection point, and the second switch is connected between the second end of the third probe and the first power supply end; The method comprises: Controlling the first switch and the second switch to be turned on, and obtaining the voltages of the first detection point and the second detection point when the first switch and the second switch are both turned on; Controlling the first switch and the second switch to be disconnected, and obtaining the voltages of the first detection point and the second detection point when the first switch and the second switch are both disconnected; Whether conduction between the first metal member and the second metal member is detected according to the voltages at the first detection point and the second detection point.

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