High-efficiency test system and test method for millimeter wave terahertz frequency multiplier

Abstract

The invention belongs to the field of terahertz frequency multiplier performance testing, and particularly relates to an efficient testing system and method for a millimeter wave terahertz frequency multiplier. According to the method, the vector network analyzer adjusts the port output power of external expansion devices such as an S parameter test module, a frequency multiplication source module or an amplifier, and meanwhile, the vector network analyzer completes a spectrum analysis function based on the S parameter test module. According to the method provided by the invention, a vector network analyzer host based on a microwave frequency band is matched with a frequency expansion module, so that efficient testing of various parameters of the frequency multiplier is realized.

Description

Technical Field

[0001] The invention belongs to the field of terahertz frequency multiplier performance testing, and in particular relates to an efficient testing system and a testing method for a millimeter wave terahertz frequency multiplier. Background Art

[0002] At present, terahertz technology has been widely used in biomedicine, security detection, space exploration and communication. As a typical two-port device, terahertz frequency multiplier has the function of frequency multiplication and is an important part of the front end of terahertz transceiver. Its performance characteristics have an important impact on the entire system. As a key core component of the entire system, how to quickly and accurately test the performance of terahertz frequency multiplier is one of the key issues faced by designers during the research and development and production process.

[0003] Millimeter-wave terahertz frequency multiplier testing generally includes chip bare die testing and package testing. Compared with microwave frequency multiplier testing, millimeter-wave terahertz frequency multiplier testing often requires a microwave frequency band test host and an external frequency expansion device to complete. The test is more complicated. In addition to the host, a frequency expansion device is also required. It is necessary to build a suitable test environment according to different frequency bands and test requirements. Taking the output power test of the frequency multiplier as an example, a microwave signal source and a corresponding frequency expansion module are required to provide drive for the frequency multiplier, and a power meter for the frequency multiplier output signal band is also required for power testing. In addition, a spectrum analyzer and a frequency expansion module are required to complete the spectrum analysis of the frequency multiplier output signal. On the one hand, many test instruments are required, and on the other hand, the test efficiency is low, and manual calculation and operation of the instruments are required.

[0004] The main performance indicators of terahertz frequency multipliers include frequency range, frequency doubling loss, saturated output power, input port standing wave, output port standing wave, harmonic suppression and other indicators. The traditional test methods for the above indicators of terahertz frequency multipliers require two main system platforms. The first one is to test frequency doubling loss, output power, spectrum and other indicators: that is, to use a microwave signal generator and a terahertz frequency doubling source module to provide input drive signals for the terahertz frequency multiplier, use a microwave spectrum analyzer to measure the spectrum, and use a power meter to calibrate the input and output powers of the frequency multiplier. Through calculation, the frequency doubling loss, harmonic suppression and other indicators of the terahertz frequency multiplier can be obtained. The block diagram of the test instrument is shown below. Figure 1As shown. The second platform is the port standing wave platform for testing the frequency multiplier, which is mainly divided into input standing wave and output standing wave. The input standing wave test mainly uses a signal generator and a terahertz frequency multiplication source to provide input signals for the frequency multiplier, and then uses a directional coupler and a power meter to test the reflected signal power intensity. The output port of the frequency multiplier is terminated with a load, and the input power and reflected power of the frequency multiplier are used to obtain the input standing wave of the frequency multiplier. Secondly, the output port standing wave test mainly uses a signal generator and a terahertz frequency multiplication source to provide input signals for the frequency multiplier, keeping the frequency multiplier in and out of normal working state. At the same time, the S parameter test module is used at the output end in conjunction with the vector network analyzer host to test the output standing wave of the frequency multiplier. At this time, it is necessary to ensure that the input signal frequency of the frequency multiplier and the S parameter test frequency point conform to the frequency multiplication relationship of the frequency multiplier. The test system brought about by the numerous test parameters of the frequency multiplier is relatively complex, and more equipment and instruments are required. On the one hand, the test efficiency is low, and on the other hand, the test cost is also relatively high. Summary of the invention

[0005] In view of the above technical problems, the present invention provides an efficient testing system and method for millimeter wave terahertz frequency multipliers. A vector network analyzer host based on the microwave frequency band is matched with a frequency extension module to realize efficient testing of multiple parameters of the frequency multiplier.

[0006] The present invention is achieved through the following technical solutions:

[0007] An efficient test system for millimeter wave terahertz frequency multipliers is provided with four test platforms according to the input frequency and power requirements of the frequency multiplier to be tested;

[0008] The first test platform includes a vector network analyzer host and a first terahertz S parameter test module and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the first terahertz S parameter test module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0009] The second test platform includes a vector network analyzer host, a terahertz frequency multiplication source module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the terahertz frequency multiplication source module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0010] The third test platform includes a vector network analyzer host, an amplifier module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the amplifier module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0011] The fourth test platform includes a vector network analyzer host and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the RF output port of the vector network analyzer, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module.

[0012] Further, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the first test platform is used;

[0013] When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the second test platform is used;

[0014] When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the third test platform is used;

[0015] When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the fourth test platform is used.

[0016] Further, the first terahertz S parameter test module and the second terahertz S parameter test module respectively operate in the input and output frequency ranges of the frequency multiplier;

[0017] A first terahertz S-parameter test module, a frequency multiplication source module or an amplifier module operating within the input frequency range of the frequency multiplier is selected according to the input frequency range of the frequency multiplier and the input pump power requirement.

[0018] Furthermore, the vector network analyzer is used to program-control and adjust the power of the first terahertz S-parameter test module, the frequency multiplication source module or the amplifier module, so as to perform a scanning test on the input port power of the frequency multiplier.

[0019] A millimeter wave terahertz frequency multiplier efficient testing method, the testing method comprising:

[0020] Confirm the input frequency and power input requirements of the frequency multiplier to be tested, and build the first test platform, the second test platform, the third test platform or the fourth test platform;

[0021] Based on the communication between the vector network analyzer host and the second terahertz S parameter test module, the first terahertz S parameter test module / terahertz frequency doubling source module / amplifier module, and the frequency multiplier to be tested, the characteristics of the frequency multiplier to be tested are tested, and the test contents include the output power of the frequency multiplier under different input powers, the frequency doubling loss, the in-band spectrum test, and the input and output standing waves of the frequency multiplier.

[0022] Furthermore, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the first test platform is specifically as follows:

[0023] (1) Set the vector network analyzer host to sweep frequency working mode;

[0024] Set the port output power Pin of the first terahertz S parameter test module so that the frequency multiplier to be tested works normally and is not burned;

[0025] The vector network analyzer host controls the second terahertz S parameter test module to complete the output power Pout test of the frequency multiplier, and obtains the frequency multiplication loss of the frequency multiplier by calculation;

[0026] (2) setting the first terahertz S parameter test module to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the output frequency band of the frequency multiplier by controlling the first terahertz S parameter test module and the second terahertz S parameter test module;

[0027] The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the first terahertz S-parameter test module;

[0028] Within the normal working range of the frequency multiplier to be tested, the reflection parameters tested by the first terahertz S parameter testing module and the second terahertz S parameter testing module are respectively the input and output standing waves of the frequency multiplier to be tested.

[0029] Further, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the second test platform is specifically as follows:

[0030] (1) Set the vector network analyzer host to sweep frequency working mode:

[0031] Set the port output power Pin of the terahertz frequency multiplication source module so that the frequency multiplier to be tested can work normally and is not easily burned;

[0032] The vector network analyzer host completes the frequency multiplier output power Pout test by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation;

[0033] (2) setting the terahertz frequency doubling source module to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the radio frequency band of the frequency multiplier to be tested by controlling the terahertz frequency doubling source module and the second terahertz S parameter test module;

[0034] The vector network analyzer controls the port power scanning range of the terahertz frequency multiplication source module to obtain the output power, frequency multiplication loss and in-band spectrum of the frequency multiplier to be tested under different input powers;

[0035] Within the normal operating range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S-parameter testing module is the output standing wave of the frequency multiplier to be tested.

[0036] Furthermore, when the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the method for testing using the third test platform is specifically as follows:

[0037] (1) Set the vector network analyzer host to sweep frequency working mode;

[0038] Set the output power Pin of the amplifier module so that the frequency multiplier to be tested can work normally and is not easily burned;

[0039] The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier to be tested by calculation;

[0040] (2) Setting the first port of the vector network analyzer to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis of the frequency multiplier to be tested in the frequency band of 110 GHz to 170 GHz by controlling the amplifier module and the second terahertz S parameter test module;

[0041] The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the amplifier module;

[0042] Within the normal operating range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S-parameter testing module is the output standing wave of the frequency multiplier to be tested.

[0043] Furthermore, when the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the method of using the fourth test platform for testing is specifically as follows:

[0044] (1) Setting the vector network analyzer host to the sweep frequency working mode; setting the output power Pin of the first port of the vector network analyzer so that the frequency multiplier to be tested can work normally and is not easily burned;

[0045] The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier by calculation;

[0046] (2) setting the first port of the vector network analyzer host to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode;

[0047] The spectrum analysis within the output frequency band of the frequency multiplier to be tested is completed by controlling the first port of the vector network analyzer host and the second terahertz S-parameter test module, and the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers are obtained by controlling the power scanning range of the first port of the vector network analyzer host;

[0048] Within the normal operating range of the frequency multiplier, the reflection parameter tested by the second terahertz S parameter test module is the output standing wave of the frequency multiplier to be tested.

[0049] Beneficial technical effects of the present invention:

[0050] (1) The efficient test system for millimeter-wave terahertz frequency multipliers provided by the present invention is based on a microwave vector network analyzer host and a frequency / power expansion device (S parameter test module, frequency multiplier source module, amplifier module) to form an efficient test platform for millimeter-wave frequency multipliers. At the frequency multiplier input port, the vector network analyzer host controls the frequency and power of the input signal to scan, and at the frequency multiplier output port, the vector network analyzer host controls the S parameter test module to test the power and spectrum of the frequency multiplier output signal, so that multiple parameters such as the output power, frequency multiplier loss, spectrum, standing wave, etc. of the frequency multiplier at different powers and frequencies can be obtained quickly and efficiently.

[0051] (2) The test platform of the efficient test system of the millimeter-wave terahertz frequency multiplier provided by the present invention is simple and has a wide test range: the test platform fully considers the frequency and power test requirements of the input and output ports caused by the change of the frequency multiplication times of the frequency multiplier. The overall system mainly includes a vector network analyzer, two S parameter test modules, a frequency multiplication source module, an amplifier module and test accessories, which can meet the test of 2-N times frequency multipliers in the corresponding frequency band. The system architecture is clear and fully meets the test requirements of various times of frequency multipliers. Relying on the corresponding test platform, the frequency range, frequency multiplication loss, output power, port standing wave, output spectrum and other parameters of the frequency multiplier can be tested.

[0052] (3) The efficient testing method for the millimeter-wave terahertz frequency multiplier provided by the present invention is convenient and efficient. By controlling the port output power tuning of the S-parameter test module, the frequency multiplier source module or the amplifier module, the characteristics of the frequency multiplier under different input powers can be quickly obtained, such as the changes in the output power and spectrum of the frequency multiplier under different input powers. While enriching the test parameters, the test time is greatly saved, and the test of many parameters can be completed with one connection. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] Figure 1 The output power, frequency doubling loss and spectrum test system architecture for traditional terahertz frequency multipliers;

[0054] Figure 2 This is a schematic diagram of the first test platform architecture in an embodiment of the present invention;

[0055] Figure 3 This is a schematic diagram of a second test platform architecture in an embodiment of the present invention;

[0056] Figure 4 This is a schematic diagram of a third test platform architecture in an embodiment of the present invention;

[0057] Figure 5 This is a schematic diagram of a fourth test platform architecture in an embodiment of the present invention;

[0058] Figure 6 This is a schematic diagram of a 110-170 GHz frequency multiplier test example of the first test platform architecture in an embodiment of the present invention;

[0059] Figure 7 This is a schematic diagram of a 110 GHz-170 GHz doubler test example on the second test platform in an embodiment of the present invention;

[0060] Figure 8 This is a schematic diagram of a 110 GHz-170 GHz tripler test example on the third test platform in an embodiment of the present invention;

[0061] Fig. 9This is an example of a 110GHz-170GHz quadruple frequency multiplier test on the fourth test platform in an embodiment of the present invention. DETAILED DESCRIPTION

[0062] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0063] On the contrary, the present invention covers any substitution, modification, equivalent method and scheme made on the essence and scope of the present invention as defined by the claims. Further, in order to make the public have a better understanding of the present invention, some specific details are described in detail in the detailed description of the present invention below. Those skilled in the art can fully understand the present invention without the description of these details.

[0064] The technical problem to be solved by the present invention is how to achieve efficient testing of conventional and frequently used frequency multiplication loss, output power, port standing wave, compression point (by controlling the input power scan of the frequency multiplier, the output power change under different input powers is obtained, and the information of the compression point can be obtained), spectrum and other parameters of the terahertz frequency multiplier, and solve the problems of low efficiency, complex testing and high cost of existing terahertz frequency multiplier testing. The method adopted by the present invention is to use a vector network analyzer host based on the microwave frequency band with a frequency extension module to achieve efficient testing of many parameters of the frequency multiplier. The vector network analyzer host can set and programmatically adjust the port output power of external expansion devices such as the S parameter test module, the frequency multiplication source module or the amplifier, and the vector network analyzer completes the spectrum analysis function based on the S parameter test module. It supports users to set relevant test parameters of the frequency multiplier to be tested, such as the operating frequency range of the input port, the number of frequency multiplications, the input port power scanning range and other parameters. In addition, the vector network analyzer host can simultaneously control two S parameter test modules of different frequency bands to work simultaneously.

[0065] Embodiment 1: A millimeter wave terahertz frequency multiplier efficient testing system, according to the input frequency and power requirements of the frequency multiplier to be tested, four test platforms are set;

[0066] The first test platform includes a vector network analyzer host and a first terahertz S parameter test module and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the first terahertz S parameter test module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0067] The second test platform includes a vector network analyzer host, a terahertz frequency multiplication source module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the terahertz frequency multiplication source module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0068] The third test platform includes a vector network analyzer host, an amplifier module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the amplifier module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module;

[0069] The fourth test platform includes a vector network analyzer host and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the RF output port of the vector network analyzer, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module.

[0070] In this embodiment, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the first test platform is used;

[0071] When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the second test platform is used;

[0072] When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the third test platform is used;

[0073] When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the fourth test platform is used.

[0074] Specifically, Figure 2As shown, in the first test platform, the first port and the third port of the vector network analyzer host are respectively connected to the RF input ports of the first terahertz S parameter test module and the second terahertz S parameter test module, providing two RF signals for the two terahertz S parameter test modules; the local oscillator output signal of the vector network analyzer host is split into two paths, which are respectively input to the local oscillator input ports of the two terahertz S parameter test modules; the vector network analyzer simultaneously receives the reference intermediate frequency signals R1, R2 and the test intermediate frequency signals A, B of the two terahertz S parameter test modules;

[0075] like Figure 3 As shown, in the second test platform, the first port of the vector network analyzer host is connected to the terahertz frequency doubling source module to provide a radio frequency signal for the terahertz frequency doubling source module; the third port of the vector network analyzer host is connected to the radio frequency input port of the second terahertz S parameter test module, the local oscillator output signal of the vector network analyzer host is input to the local oscillator input port of the second terahertz S parameter test module, and the vector network analyzer host receives the reference intermediate frequency signal and the test intermediate frequency signal of the second terahertz S parameter test module;

[0076] like Figure 4 As shown, in the third test platform, the first port of the vector network analyzer host is connected to the amplifier module to provide a radio frequency signal to the amplifier module; the third port of the vector network analyzer host is connected to the radio frequency input port of the second terahertz S parameter test module, the local oscillator output signal of the vector network analyzer host is input to the local oscillator input port of the second terahertz S parameter test module, and the vector network analyzer host receives the reference intermediate frequency signal and the test intermediate frequency signal of the second terahertz S parameter test module;

[0077] like Figure 5 As shown, in the fourth test platform, the first port of the vector network analyzer host is connected to the frequency multiplier to be tested to provide a radio frequency signal for the frequency multiplier to be tested; the third port of the vector network analyzer host is connected to the radio frequency input port of the second terahertz S parameter test module, the local oscillator output signal of the vector network analyzer host is input to the local oscillator input port of the second terahertz S parameter test module, and the vector network analyzer host receives the reference intermediate frequency signal and the test intermediate frequency signal of the second terahertz S parameter test module.

[0078] Specifically, the S parameter test modules described in the present invention (including the first terahertz S parameter test module and the second terahertz S parameter test module) all adopt the terahertz spectrum expansion module in the patent application number 202310424859.4, which is a conventional test module, and the vector network analyzer host used in the present invention is a conventional device.

[0079] In the present invention, the frequency multiplication source module needs to be combined with the vector network analyzer host to have the function of power programmable control and adjustment. Compared with the solution of the S parameter test module, the frequency multiplication source has greater power and can meet the frequency multiplier test with high power input requirements;

[0080] In the present invention, the amplifier module needs to be combined with the vector network analyzer host to have the function of power programmable control and adjustment. Compared with the solution of directly using the vector network port to input the signal to the multiplier, the amplifier module will have greater power and can meet the test of the multiplier with high power input requirements.

[0081] In this embodiment, the first terahertz S parameter test module and the second terahertz S parameter test module respectively operate in the input and output frequency ranges of the frequency multiplier;

[0082] A first terahertz S-parameter test module, a frequency multiplication source module or an amplifier module operating within the input frequency range of the frequency multiplier is selected according to the input frequency range of the frequency multiplier and the input pump power requirement.

[0083] Considering the test range of the test platform, a vector network analyzer with a wider operating frequency band should be selected as much as possible; specifically, a vector network analyzer operating in a frequency band above 50 GHz can be selected.

[0084] In this embodiment, the vector network analyzer is used to program-control and adjust the power of the first terahertz S-parameter test module, the frequency multiplication source module or the amplifier module, so as to perform a scanning test on the input port power of the frequency multiplier.

[0085] Embodiment 2: A millimeter wave terahertz frequency multiplier high-efficiency testing method, using the testing system described in Embodiment 1, the testing method comprises:

[0086] Confirm the input frequency of the frequency multiplier to be tested and the power input requirement of the frequency multiplier, and build the first test platform, the second test platform, the third test platform or the fourth test platform;

[0087] Based on the communication between the vector network analyzer host and the second terahertz S parameter test module, the first terahertz S parameter test module / terahertz frequency doubling source module / amplifier module, and the frequency multiplier to be tested, the characteristics of the frequency multiplier to be tested are tested, and the test contents include the output power of the frequency multiplier under different input powers, the frequency doubling loss, the in-band spectrum test, and the input and output standing waves of the frequency multiplier.

[0088] In this embodiment, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the first test platform is specifically as follows:

[0089] (1) Set the vector network analyzer host to sweep frequency working mode;

[0090] The port output power Pin of the first terahertz S parameter test module is set so that the frequency multiplier to be tested works normally and is not burned; specifically, the setting of the port output power of the first terahertz S parameter test module here is related to the process, operating frequency, and circuit structure of the tested frequency multiplier, and can be determined based on experience and the designer's advice;

[0091] The vector network analyzer host controls the second terahertz S parameter test module to complete the test of the frequency multiplier output power Pout, and obtains the frequency multiplication loss of the frequency multiplier by calculation; the calculation here belongs to conventional technology, and the frequency multiplication loss = input power Pin-output power Pout;

[0092] (2) The first terahertz S parameter test module is set to a point frequency working mode, and the second terahertz S parameter test module is set to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the output frequency band of the frequency multiplier by controlling the first terahertz S parameter test module and the second terahertz S parameter test module; spectrum analysis is a specific function of the vector network analyzer and belongs to conventional technology.

[0093] The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the first terahertz S-parameter test module;

[0094] Within the normal working range of the frequency multiplier to be tested, the reflection parameters tested by the first terahertz S parameter testing module and the second terahertz S parameter testing module are respectively the input and output standing waves of the frequency multiplier to be tested.

[0095] The above method can test and obtain the above parameters of the frequency multiplier through one connection.

[0096] In this embodiment, when the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the second test platform is specifically as follows:

[0097] (1) Set the vector network analyzer host to sweep frequency working mode:

[0098] Set the port output power Pin of the terahertz frequency multiplication source module so that the frequency multiplier to be tested can work normally and is not easily burned;

[0099] The vector network analyzer host completes the frequency multiplier output power Pout test by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation; this is the function of the vector network analyzer host, which is a conventional technology;

[0100] (2) setting the terahertz frequency doubling source module to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the radio frequency band of the frequency multiplier to be tested by controlling the terahertz frequency doubling source module and the second terahertz S parameter test module;

[0101] The vector network analyzer controls the port power scanning range of the terahertz frequency multiplication source module to obtain the output power, frequency multiplication loss and in-band spectrum of the frequency multiplier to be tested under different input powers;

[0102] Within the normal operating range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S-parameter test module is the output standing wave of the frequency multiplier to be tested; the input standing wave cannot be tested at this time.

[0103] In this embodiment, when the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the method of using the third test platform for testing is specifically as follows:

[0104] (1) Set the vector network analyzer host to sweep frequency working mode;

[0105] Set the output power Pin of the amplifier module so that the frequency multiplier to be tested can work normally and is not easily burned;

[0106] The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier to be tested by calculation;

[0107] (2) Setting the first port of the vector network analyzer to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis of the frequency multiplier to be tested in the frequency band of 110 GHz to 170 GHz by controlling the amplifier module and the second terahertz S parameter test module;

[0108] The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the amplifier module;

[0109] In the normal working range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S parameter test module is the output standing wave of the frequency multiplier to be tested. At this time, the input standing wave cannot be tested.

[0110] In this embodiment, when the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the method of using the fourth test platform for testing is specifically as follows:

[0111] (1) Setting the vector network analyzer host to the sweep frequency working mode; setting the output power Pin of the first port of the vector network analyzer so that the frequency multiplier to be tested can work normally and is not easily burned;

[0112] The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier by calculation;

[0113] (2) setting the first port of the vector network analyzer host to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode;

[0114] The spectrum analysis within the output frequency band of the frequency multiplier to be tested is completed by controlling the first port of the vector network analyzer host and the second terahertz S-parameter test module, and the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers are obtained by controlling the power scanning range of the first port of the vector network analyzer host;

[0115] Within the normal operating range of the frequency multiplier, the reflection parameter tested by the second terahertz S-parameter test module is the output standing wave of the frequency multiplier to be tested; the input standing wave cannot be tested at this time.

[0116] The following takes the test of 110-170GHz 2-N times frequency multiplier as an example to explain the test process in detail. 110-170GHz secondary frequency multiplier test case:

[0117] (1) Confirm the test frequency band and build the test platform: First, confirm the operating frequency information of the two ports of the multiplier to be tested, and build the test platform according to the operating frequency band information. The output port operating frequency band is 110GHz-170GHz, and the input port operating frequency band is 55GHz-85GHz. Secondly, confirm the input and output power range of the multiplier, especially the input power requirement. When the maximum output power of the S parameter test module meets the input power requirement of the multiplier, the S parameter test module is preferred. Otherwise, a larger power multiplier source module whose output power can meet the input power requirement of the multiplier is required. When the multiplier source module is selected, the input standing wave of the multiplier cannot be tested.

[0118] (2) When the first terahertz S parameter test module is selected as the input frequency band, it is assumed that both S parameter test modules have completed power calibration and single-port S parameter calibration. Figure 6 As shown, the vector network analyzer host is set to the sweep frequency working mode. The port output power Pin of the first terahertz S parameter test module is reasonably set so that the frequency multiplier works normally and is not easy to burn; the vector network analyzer host completes the output power Pout of the frequency multiplier by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation; then the spectrum analysis of the frequency multiplier in the 110GHz-170GHz frequency band is completed by controlling the first terahertz S parameter test module and the second terahertz S parameter test module. At this time, the first terahertz S parameter test module needs to be set to the point frequency working mode, and the second terahertz S parameter test module needs to be set to the spectrum analysis mode. By controlling the port power scanning range of the first terahertz S parameter test module, the parameter characteristics of the frequency multiplier such as the output power, frequency multiplication loss, and in-band spectrum under different input powers can be obtained. Within the normal working range of the frequency multiplier, the reflection parameters tested by the first terahertz S parameter test module and the second terahertz S parameter test module are the input and output standing waves of the frequency multiplier, respectively. One connection can be used to test and obtain the above parameters of the frequency multiplier.

[0119] (3) When the input frequency band selects the frequency multiplication source module with larger output power, it is assumed that the frequency multiplication source module and the S parameter test module have completed power calibration, and the S parameter test module should also complete the S parameter single-port calibration. Figure 7 As shown, the vector network analyzer host is set to the sweeping working mode. The port output power Pin of the frequency multiplier module is reasonably set so that the frequency multiplier works normally and is not easy to burn; the vector network analyzer host completes the frequency multiplier output power Pout test by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation; then the frequency multiplication source module and the second terahertz S parameter test module are controlled to complete the spectrum analysis in the 110GHz-170GHz frequency band of the frequency multiplier. At this time, the frequency multiplication source module needs to be set to the point frequency working mode, and the second terahertz S parameter test module needs to be set to the spectrum analysis mode. By controlling the port power scanning range of the terahertz frequency multiplication source module, the output power, frequency multiplication loss, in-band spectrum and other parameter characteristics of the frequency multiplier under different input powers can be obtained. Within the normal working range of the frequency multiplier, the reflection parameters tested by the second terahertz S parameter test module are the output standing waves of the frequency multiplier, and the input standing waves cannot be tested at this time. Once connected, the above parameters of the frequency multiplier can be tested.

[0120] 110-170GHz third and higher frequency multiplier test cases:

[0121] (1) Confirm the test frequency band and build the test platform: First, confirm the operating frequency information of the two ports of the frequency multiplier to be tested, and build the test platform according to the operating frequency band information. The output port operating frequency band is 110GHz-170GHz, and the input port operating frequency band is 36.6GHz-56.7GHz. At this time, the vector network analyzer host with an operating frequency exceeding 56.7GHz is preferred. Additional frequency extension modules such as frequency multiplication source modules or S parameter test modules are no longer required to provide input signals for the frequency multiplier. The frequency range of the output signal of the vector network analyzer port can meet the requirements. Secondly, confirm the input and output power range of the frequency multiplier, especially the input power requirement. In general, the port output signal power value of the vector network analyzer cannot meet the input power requirement of the frequency multiplier, and a power amplifier needs to be connected and power calibration needs to be completed. For example Figure 8 shown.

[0122] (2) When the input frequency band selects the vector network analyzer port directly connected to the amplifier module, it is assumed that the amplifier module and the S parameter test module have completed the power calibration, and the S parameter test module should also complete the S parameter single port calibration. Figure 8 As shown, the vector network analyzer host is set to the sweep frequency working mode. The port output power Pin of the amplifier module is reasonably set so that the frequency multiplier works normally and is not easy to burn; the vector network analyzer host completes the frequency multiplier output power Pout test by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation; then the spectrum analysis of the frequency multiplier in the 110GHz-170GHz frequency band is completed by controlling the amplifier module and the second terahertz S parameter test module. At this time, the vector network analyzer port 1 needs to be set to the point frequency working mode, and the second terahertz S parameter test module needs to be set to the spectrum analysis mode. By controlling the port power scanning range of the amplifier module, the output power, frequency multiplication loss, in-band spectrum and other parameter characteristics of the frequency multiplier under different input powers can be obtained. Within the normal working range of the frequency multiplier, the reflection parameters tested by the second terahertz S parameter test module are the output standing waves of the frequency multiplier, and the input standing waves cannot be tested at this time. Once connected, the above parameters of the frequency multiplier can be tested.

[0123] (3) When testing frequency multipliers in the 110-170 GHz and higher frequency bands, both can be used by selecting a vector network analyzer with a higher operating frequency. Fig. 9A similar scheme completes the rapid test of the frequency multiplier. When the frequency multiplication number of the frequency multiplier is high, the required input frequency range gradually decreases, and the direct output power of the port of the vector network analyzer gradually increases. When the input power requirement of the frequency multiplier is met, no additional amplifier module is required, and the test system is more concise. The test system provided by the present invention can complete the test of the frequency range, frequency multiplication loss, output power, port standing wave, output spectrum and other parameters of the frequency multiplier.

[0124] The test system has the following features:

[0125] (1) The test platform is concise and has a wide test range: The test platform provided by the present invention fully considers the frequency and power test requirements of the input and output ports caused by the change of the frequency multiplication times of the frequency multiplier. The overall system mainly includes a vector network analyzer, an S parameter test module, a frequency multiplication source module, an amplifier module and test accessories (power divider, cable, load, etc.). By using the frequency sweep and power sweep modes of the vector network analyzer, the S parameter test module, the frequency multiplication source module or the amplifier module based on the external spread spectrum can be used to simply and efficiently implement the test of many conventional parameters, requiring fewer instruments, simple interconnection, and less testing time. It can meet the test of 2-N times frequency multipliers in the corresponding frequency band, and the system architecture is clear, which fully meets the test requirements of various times of frequency multipliers.

[0126] (2) Convenient and efficient testing: By controlling the port output power tuning of the S-parameter test module, the frequency multiplier source module, or the amplifier module, the characteristics of the frequency multiplier under different input powers can be quickly obtained, such as the changes in the output power and spectrum of the frequency multiplier under different input powers. This enriches the test parameters and greatly saves the test time. One connection can complete the test of many parameters.

[0127] (3) The power-tunable S-parameter test module, frequency multiplier module or amplifier module used is a key part of the system. Based on the communication between the vector network analyzer host software and the module, the output power of the input test module is controlled to meet the frequency multiplier's requirements for different output powers at different frequencies of the input port.

[0128] (4) Supporting spectrum analysis based on S-parameter test module: The spectrum analyzer for this frequency band based on the S-parameter test module is also a key part of the system. It can quickly realize the spectrum analysis of the corresponding frequency band and meet the output signal spectrum analysis of the frequency multiplier.

[0129] Compared with the traditional frequency multiplier testing method, the testing method provided by the present invention can measure more complete parameters, requires less testing equipment and has higher measurement efficiency.

[0130] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A millimeter wave terahertz frequency multiplier efficient testing system, characterized in that: Four test platforms are set up according to the input frequency and power requirements of the frequency multiplier to be tested; The first test platform includes a vector network analyzer host and a first terahertz S parameter test module and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the first terahertz S parameter test module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module; The second test platform includes a vector network analyzer host, a terahertz frequency multiplication source module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the terahertz frequency multiplication source module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module; The third test platform includes a vector network analyzer host, an amplifier module connected to the vector network analyzer, and a second terahertz S parameter test module; the input port of the frequency multiplier to be tested is connected to the amplifier module, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module; The fourth test platform includes a vector network analyzer host and a second terahertz S parameter test module connected to the vector network analyzer; the input port of the frequency multiplier to be tested is connected to the RF output port of the vector network analyzer, and the output port of the frequency multiplier to be tested is connected to the second terahertz S parameter test module.

2. According to claim 1, a millimeter wave terahertz frequency multiplier efficient testing system is characterized in that: When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the first test platform is used; When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the second test platform is used; When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the third test platform is used; When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the fourth test platform is used.

3. According to claim 1, a millimeter wave terahertz frequency multiplier efficient testing system is characterized in that: The first terahertz S parameter test module and the second terahertz S parameter test module respectively operate in the input and output frequency ranges of the frequency multiplier; A first terahertz S-parameter test module, a frequency multiplication source module or an amplifier module operating within the input frequency range of the frequency multiplier is selected according to the input frequency range of the frequency multiplier and the input pump power requirement.

4. The millimeter wave terahertz frequency multiplier high efficiency testing system according to claim 1, characterized in that: The vector network analyzer is used for program-controlled adjustment of the power of the first terahertz S parameter test module, the frequency multiplication source module or the amplifier module, so as to facilitate scanning test of the input port power of the frequency multiplier.

5. A millimeter wave terahertz frequency multiplier efficient testing method, using the testing system according to any one of claims 1 to 4, characterized in that: The test method includes: Confirm the input frequency and power input requirements of the frequency multiplier to be tested, and build the first test platform, the second test platform, the third test platform or the fourth test platform; Based on the communication between the vector network analyzer host and the second terahertz S parameter test module, the first terahertz S parameter test module / terahertz frequency doubling source module / amplifier module, and the frequency multiplier to be tested, the characteristics of the frequency multiplier to be tested are tested, and the test contents include the output power of the frequency multiplier under different input powers, the frequency doubling loss, the in-band spectrum test, and the input and output standing waves of the frequency multiplier.

6. The millimeter wave terahertz frequency multiplier efficient testing method according to claim 5, characterized in that: When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, and the output power of the first terahertz S-parameter test module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the first test platform is specifically as follows: (1) Set the vector network analyzer host to sweep frequency working mode; Set the port output power Pin of the first terahertz S parameter test module so that the frequency multiplier to be tested works normally and is not burned; The vector network analyzer host controls the second terahertz S parameter test module to complete the output power Pout test of the frequency multiplier, and obtains the frequency multiplication loss of the frequency multiplier by calculation; (2) setting the first terahertz S parameter test module to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the output frequency band of the frequency multiplier by controlling the first terahertz S parameter test module and the second terahertz S parameter test module; The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the first terahertz S-parameter test module; Within the normal working range of the frequency multiplier to be tested, the reflection parameters tested by the first terahertz S parameter testing module and the second terahertz S parameter testing module are respectively the input and output standing waves of the frequency multiplier to be tested.

7. The millimeter wave terahertz frequency multiplier efficient testing method according to claim 5, characterized in that: When the input frequency of the frequency multiplier to be tested is higher than the operating frequency of the vector network analyzer host, the output power of the first terahertz S parameter is less than the power input requirement of the frequency multiplier to be tested, and the power input requirement of the terahertz frequency multiplication source module is greater than the power input requirement of the frequency multiplier to be tested, the method for testing using the second test platform is specifically as follows: (1) Set the vector network analyzer host to sweep frequency working mode: Set the port output power Pin of the terahertz frequency multiplication source module so that the frequency multiplier to be tested can work normally and is not easily burned; The vector network analyzer host completes the frequency multiplier output power Pout test by controlling the second terahertz S parameter test module, and the frequency multiplication loss of the frequency multiplier can be obtained by calculation; (2) setting the terahertz frequency doubling source module to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis within the radio frequency band of the frequency multiplier to be tested by controlling the terahertz frequency doubling source module and the second terahertz S parameter test module; The vector network analyzer controls the port power scanning range of the terahertz frequency multiplication source module to obtain the output power, frequency multiplication loss and in-band spectrum of the frequency multiplier to be tested under different input powers; Within the normal operating range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S-parameter testing module is the output standing wave of the frequency multiplier to be tested.

8. The millimeter wave terahertz frequency multiplier efficient testing method according to claim 5, characterized in that: When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, the output power of the vector network analyzer host is less than the input power requirement of the frequency multiplier to be tested, and the output power of the amplifier module is greater than the input power requirement of the frequency multiplier to be tested, the method for testing using the third test platform is specifically as follows: (1) Set the vector network analyzer host to sweep frequency working mode; Set the output power Pin of the amplifier module so that the frequency multiplier to be tested can work normally and is not easily burned; The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier to be tested by calculation; (2) Setting the first port of the vector network analyzer to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; the vector network analyzer host completes the spectrum analysis of the frequency multiplier to be tested in the frequency band of 110 GHz to 170 GHz by controlling the amplifier module and the second terahertz S parameter test module; The vector network analyzer host obtains the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers by controlling the port power scanning range of the amplifier module; Within the normal operating range of the frequency multiplier to be tested, the reflection parameter tested by the second terahertz S-parameter testing module is the output standing wave of the frequency multiplier to be tested.

9. The millimeter wave terahertz frequency multiplier efficient testing method according to claim 5, characterized in that: When the input frequency of the frequency multiplier to be tested is lower than the operating frequency of the vector network analyzer host, and the output power of the vector network analyzer host is greater than the input power requirement of the frequency multiplier to be tested, the method of using the fourth test platform for testing is specifically as follows: (1) Setting the vector network analyzer host to the sweep frequency working mode; setting the output power Pin of the first port of the vector network analyzer so that the frequency multiplier to be tested can work normally and is not easily burned; The vector network analyzer host completes the output power Pout test of the frequency multiplier to be tested by controlling the second terahertz S parameter test module, and obtains the frequency multiplication loss of the frequency multiplier by calculation; (2) setting the first port of the vector network analyzer host to a point frequency working mode, and setting the second terahertz S parameter test module to a spectrum analysis mode; The spectrum analysis within the output frequency band of the frequency multiplier to be tested is completed by controlling the first port of the vector network analyzer host and the second terahertz S-parameter test module, and the output power, frequency multiplication loss, and in-band spectrum of the frequency multiplier to be tested under different input powers are obtained by controlling the power scanning range of the first port of the vector network analyzer host; Within the normal operating range of the frequency multiplier, the reflection parameter tested by the second terahertz S parameter test module is the output standing wave of the frequency multiplier to be tested.

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