Calibration correction method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses a calibration correction method and device, electronic equipment and a storage medium, and can solve the problem that more time and cost are consumed when power-on self-calibration is carried out again or recalibration is carried out after test failure. The method comprises the steps that an initial parameter matrix is obtained, the initial parameter matrix comprises a plurality of elements, and the elements are obtained after digital pre-distortion calibration; calling a first initial threshold matrix and a second initial threshold matrix from a threshold register, wherein the first initial threshold matrix is greater than the second initial threshold matrix; respectively comparing each element in the initial parameter matrix with a corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result; and according to a comparison result, performing parameter processing on the initial parameter matrix to obtain a target parameter matrix, the target parameter matrix being used for testing a wireless fidelity WiFi chip.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of DPD calibration technology, and in particular to a calibration correction method, device, electronic device and storage medium. Background Art

[0002] The WiFi chip of the Qualcomm platform will complete the DPD calibration at the moment of power-on. The quality of the calibration status will seriously affect related indicators such as EVM and SEM. In the production line test, since a large number of tests will be carried out quickly at the same time, it is impossible to ensure that all motherboards can buckle the RF line properly, which may cause the DPD calibration status to be abnormal, thereby increasing the false detection rate and seriously affecting production capacity. If the power-on self-calibration is re-performed or the test fails and then recalibrated, so that the DPD calibration result becomes appropriate, it will cost more time and cost. Summary of the invention

[0003] In order to solve the above technical problems or at least partially solve the above technical problems, the embodiments of the present application provide a calibration correction method, device, electronic device and storage medium to solve the problem that re-performing power-on self-calibration or re-calibration after test failure will consume more time and cost.

[0004] In order to achieve the above purpose, the technical solutions provided by the embodiments of the present application are as follows:

[0005] In a first aspect, an embodiment of the present application provides a calibration correction method, the calibration correction method comprising: obtaining an initial parameter matrix, the initial parameter matrix comprising a plurality of elements, the plurality of elements being obtained after digital pre-distortion calibration;

[0006] Retrieving a first initial threshold matrix and a second initial threshold matrix from a threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix;

[0007] Compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result;

[0008] According to the comparison result, parameter processing is performed on the initial parameter matrix to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip.

[0009] As an optional implementation manner, in the first aspect of the embodiment of the present application, after performing parameter processing on the initial parameter matrix according to the comparison result to obtain the target parameter matrix, the method further includes:

[0010] According to the target parameter matrix, the WiFi chip is tested to obtain a test result;

[0011] The first initial threshold matrix and the second initial threshold matrix are dynamically adjusted according to the test result.

[0012] As an optional implementation manner, in the first aspect of the embodiment of the present application, performing parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix includes:

[0013] When the comparison result indicates that the target element is less than or equal to the corresponding element in the first initial threshold matrix, and greater than or equal to the corresponding element in the second initial threshold matrix, determining the initial parameter matrix as the target parameter matrix;

[0014] or,

[0015] When the comparison result indicates that the target element is greater than the corresponding element in the first initial threshold matrix, amplifying the first initial threshold matrix according to a first ratio to obtain the target parameter matrix;

[0016] or,

[0017] When the comparison result indicates that the target element is smaller than the corresponding element in the second initial threshold matrix, the second initial threshold matrix is ​​reduced according to the first ratio to obtain the target parameter matrix;

[0018] The target element is any one of the multiple elements included in the initial parameter matrix.

[0019] As an optional implementation, in the first aspect of the embodiment of the present application, after calling the first initial threshold matrix and the second initial threshold matrix from the threshold register, the method further includes:

[0020] According to a first ratio, the first initial threshold matrix is ​​enlarged to obtain a first target threshold matrix, and the second initial threshold matrix is ​​reduced to obtain a second target threshold matrix;

[0021] The step of comparing each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result comprises:

[0022] Each element in the initial parameter matrix is ​​compared with the corresponding element threshold in the first target threshold matrix and the second target threshold matrix to obtain the comparison result.

[0023] As an optional implementation manner, in the first aspect of the embodiment of the present application, performing parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix includes:

[0024] When the comparison result indicates that the target element is less than or equal to the corresponding element in the first target threshold matrix, and greater than or equal to the corresponding element in the second target threshold matrix, determining the initial parameter matrix as the target parameter matrix;

[0025] or,

[0026] When the comparison result indicates that the target element is greater than the corresponding element in the first target threshold matrix, determining the first target threshold matrix as the target parameter matrix;

[0027] or,

[0028] When the comparison result indicates that the target element is smaller than the corresponding element in the second target threshold matrix, determining the second target threshold matrix as the target parameter matrix;

[0029] The target element is any one of the multiple elements included in the initial parameter matrix.

[0030] As an optional implementation, in the first aspect of the embodiment of the present application, dynamically adjusting the first initial threshold matrix and the second initial threshold matrix according to the test result includes:

[0031] When the test result indicates that the test is successful, the first initial threshold matrix is ​​dynamically adjusted to a first target threshold matrix, and the second initial threshold matrix is ​​dynamically adjusted to a second target threshold matrix.

[0032] As an optional implementation, in the first aspect of the embodiment of the present application, before calling the first initial threshold matrix and the second initial threshold matrix from the threshold register, the method further includes:

[0033] Performing multiple sets of digital pre-distortion calibration in advance to obtain multiple digital pre-distortion parameter matrices;

[0034] Comparing the multiple digital predistortion parameter matrices to obtain a maximum parameter matrix and a minimum parameter matrix;

[0035] Determine the parameter maximum value matrix as the first initial threshold matrix, and determine the parameter minimum value matrix as the second initial threshold matrix;

[0036] The first initial threshold matrix and the second initial threshold matrix are stored in the threshold register.

[0037] In a second aspect, an embodiment of the present application provides a calibration correction device, the calibration correction device comprising: an acquisition module, used to acquire an initial parameter matrix, the initial parameter matrix comprising a plurality of elements, the plurality of elements being obtained after digital pre-distortion calibration;

[0038] The acquisition module is further used to retrieve a first initial threshold matrix and a second initial threshold matrix from the threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix;

[0039] A processing module, used for comparing each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix, respectively, to obtain a comparison result;

[0040] The processing module is further used to perform parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip.

[0041] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is further used to test the WiFi chip according to the target parameter matrix to obtain a test result;

[0042] The processing module is further used to dynamically adjust the first initial threshold matrix and the second initial threshold matrix according to the test result.

[0043] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is specifically used to determine the initial parameter matrix as the target parameter matrix when the comparison result indicates that the target element is less than or equal to the corresponding element in the first initial threshold matrix, and is greater than or equal to the corresponding element in the second initial threshold matrix;

[0044] or,

[0045] The processing module is specifically configured to amplify the first initial threshold matrix according to a first ratio to obtain the target parameter matrix when the comparison result indicates that the target element is greater than the corresponding element in the first initial threshold matrix;

[0046] or,

[0047] The processing module is specifically configured to, when the comparison result indicates that the target element is smaller than the corresponding element in the second initial threshold matrix, reduce the second initial threshold matrix according to the first ratio to obtain the target parameter matrix;

[0048] The target element is any one of the multiple elements included in the initial parameter matrix.

[0049] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is further used to enlarge the first initial threshold matrix according to a first ratio to obtain a first target threshold matrix, and to reduce the second initial threshold matrix to obtain a second target threshold matrix;

[0050] The processing module is further used to compare each element in the initial parameter matrix with the corresponding element threshold in the first target threshold matrix and the second target threshold matrix to obtain the comparison result.

[0051] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is specifically used to determine the initial parameter matrix as the target parameter matrix when the comparison result indicates that the target element is less than or equal to the corresponding element in the first target threshold matrix, and is greater than or equal to the corresponding element in the second target threshold matrix;

[0052] or,

[0053] The processing module is specifically configured to determine the first target threshold matrix as the target parameter matrix when the comparison result indicates that the target element is greater than a corresponding element in the first target threshold matrix;

[0054] or,

[0055] The processing module is specifically configured to determine the second target threshold matrix as the target parameter matrix when the comparison result indicates that the target element is smaller than a corresponding element in the second target threshold matrix;

[0056] The target element is any one of the multiple elements included in the initial parameter matrix.

[0057] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is specifically used to dynamically adjust the first initial threshold matrix to a first target threshold matrix, and dynamically adjust the second initial threshold matrix to a second target threshold matrix when the test result indicates that the test is successful.

[0058] As an optional implementation, in the second aspect of the embodiment of the present application, the processing module is further used to perform multiple sets of digital pre-distortion calibration in advance to obtain multiple digital pre-distortion parameter matrices;

[0059] The processing module is further used to compare the multiple digital predistortion parameter matrices to obtain a maximum parameter matrix and a minimum parameter matrix;

[0060] The processing module is further configured to determine the parameter maximum value matrix as the first initial threshold matrix, and determine the parameter minimum value matrix as the second initial threshold matrix;

[0061] The processing module is further configured to store the first initial threshold matrix and the second initial threshold matrix in the threshold register.

[0062] In a third aspect, an embodiment of the present application provides an electronic device, the electronic device comprising:

[0063] A memory storing executable program code;

[0064] a processor coupled to the memory;

[0065] The processor calls the executable program code stored in the memory to execute the calibration correction method in the first aspect of the embodiment of the present application.

[0066] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program, wherein the computer program enables a computer to execute the calibration correction method in the first aspect of the embodiment of the present application. The computer-readable storage medium includes a ROM / RAM, a magnetic disk or an optical disk, etc.

[0067] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when executed on a computer, enables the computer to execute part or all of the steps of any one of the methods of the first aspect.

[0068] In a sixth aspect, an embodiment of the present application provides an application publishing platform, which is used to publish a computer program product, wherein when the computer program product runs on a computer, the computer executes part or all of the steps of any one method of the first aspect.

[0069] Compared with the prior art, the embodiments of the present application have the following beneficial effects:

[0070] The embodiment of the present application provides a calibration correction method, device, electronic device and storage medium, obtaining an initial parameter matrix, the initial parameter matrix includes multiple elements, and the multiple elements are obtained after digital pre-distortion calibration; calling a first initial threshold matrix and a second initial threshold matrix from a threshold register, the first initial threshold matrix is ​​greater than the second initial threshold matrix; each element in the initial parameter matrix is ​​compared with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix, respectively, to obtain a comparison result; according to the comparison result, the initial parameter matrix is ​​parameter processed to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip. In this scheme, the DPD parameters after the DPD calibration at power-on are not directly written into the corresponding register at the first time, but the self-calibration result is compared once through the threshold value pre-set in the threshold register, and the final corrected calibration result is transmitted according to the comparison result, so that the calibration result is more accurate, thereby reducing the mismeasurement rate of mass production of the production line, so that the production line efficiency can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0071] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0072] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0073] Figure 1 It is a test data schematic diagram of a calibration correction method provided in an embodiment of the present application;

[0074] Figure 2 is a spectrum diagram of a calibration correction method provided in an embodiment of the present application;

[0075] Figure 3 This is a flow chart of a calibration correction method provided in an embodiment of the present application. Figure 1 ;

[0076] Figure 4 This is a flow chart of a calibration correction method provided in an embodiment of the present application. Figure 2 ;

[0077] Figure 5 It is a structural schematic diagram of a calibration correction device provided in an embodiment of the present application;

[0078] Figure 6It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0079] In order to more clearly understand the above-mentioned purposes, features and advantages of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0080] The terms “first”, “second” and the like in the description and claims of the present application are used to distinguish different objects rather than to describe a specific order of the objects.

[0081] The terms "including" and "having" and any variations thereof in the embodiments of the present application are intended to cover non-exclusive inclusions. For example, a process, method, system, product or apparatus comprising a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to these processes, methods, products or apparatuses.

[0082] It should be noted that, in the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0083] WiFi: Wireless Fidelity (WiFi), which converts wired network signals into wireless signals, is the most widely used wireless network transmission technology today.

[0084] DPD: Digital predistortion is a baseband signal processing technology used to improve the performance loss caused by the nonlinear amplification of PA, such as EVM, ACLR, SEM and other TX indicators. It is a technology that uses digital signal processing technology to predistort the signal before signal transmission to compensate for the nonlinear distortion of the power amplifier. DPD technology pre-processes the signal in a nonlinear manner opposite to that of the power amplifier, so that the signal after passing through the power amplifier can be close to linear amplification, thereby improving the linearity and efficiency of the system. Specifically, DPD technology uses a predistorter (Predistorter) cascaded with a power amplifier (PA). The nonlinear distortion generated by the predistorter is equal to the nonlinear distortion of the power amplifier in quantity but opposite in phase. The two cancel each other out to achieve linear output.

[0085] EVM: Error vector magnitude, a measure of the difference between the actual signal and the ideal signal.

[0086] SEM: Spectrum emission mask, which characterizes the distribution of the transmitted signal in frequency.

[0087] FTM: Factory Test Mode, non-signaling test.

[0088] It should be noted that WiFi-related TX indicators are strongly correlated with DPD calibration. For example, a large number of common WiFi6 devices currently use 1024QAM modulation in 802.11ax, and the actual maximum rate EVM standard must reach -35db. After the WiFi signal is amplified by the PA, it is difficult to guarantee its EVM-related indicators at high power. Therefore, DPD technology is needed to make up for the shortcomings of PA.

[0089] The WiFi chip of the Qualcomm platform will complete the DPD calibration at the moment of power-on. The calibration status will seriously affect EVM and other related indicators. Under normal conditions, it is necessary to clip the RF line on the WiFi test seat to ensure that there is a 50ohm load end during the WiFi conduction test. In this way, after the DPD calibration is performed after power-on, the EVM is in a normal state at high WiFi speed.

[0090] The main purpose of DPD calibration is to suppress spectral regrowth on broadband signals transmitted through RF power amplifiers (PAs), thereby improving the overall efficiency of the PA. Spectral regrowth can cause nonlinear effects and spectral interference in adjacent frequency bands, affecting communication quality. Through DPD calibration, these nonlinear effects can be significantly reduced and the performance of communication systems can be improved. DPD calibration is based on the nonlinear characteristics of the power amplifier and pre-distorts the input signal so that the actual output after nonlinear compression by the power amplifier still meets the ideal linear characteristics. Specifically, DPD captures the signals before and after the PA, analyzes the nonlinear characteristics of the PA, and performs inversion or pre-distortion processing on the DPD module to eliminate the nonlinear distortion introduced by the PA.

[0091] In production line testing, due to the large-scale and rapid testing, when using a cabinet, the motherboard test socket is about 2m away from the instrument, making it difficult to ensure that every motherboard can be properly fastened with the RF line. This leads to a probabilistic abnormal DPD calibration state, which in turn leads to EVM test failure. Figure 1 It is the percentage of WiFi EVM fail tests in the initial stage of a project. It can be seen that the percentage is 1.56%. When the production line is tested in large quantities, the false detection rate increases, seriously affecting the production capacity. Similarly, when the DPD calibration is too intense, it will cause the baseband side energy to increase, resulting in similar spectrum template failures, such as Figure 2 shown.

[0092] Qualcomm's current recommendation is to ensure the absolute stability of the environment as much as possible, but this cannot be guaranteed during the production process. From a software perspective, Qualcomm's solution is to restart the machine for self-calibration, or when the test fails, add multiple FTM-related recalibrations to make the DPD calibration result appropriate, so as to reduce the number of failures as much as possible. However, this is very time-consuming and costly.

[0093] In order to solve some or all of the above technical problems, the embodiments of the present application provide a calibration correction method, device, electronic device and storage medium, obtain an initial parameter matrix, the initial parameter matrix includes multiple elements, and the multiple elements are obtained after digital pre-distortion calibration; call the first initial threshold matrix and the second initial threshold matrix from the threshold register, and the first initial threshold matrix is ​​greater than the second initial threshold matrix; compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix respectively, and obtain a comparison result; according to the comparison result, perform parameter processing on the initial parameter matrix to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip. In this scheme, the DPD parameters after the DPD calibration at power-on do not need to be directly written into the corresponding register at the first time, but the self-calibration result is compared once through the threshold value pre-set in the threshold register, and the final corrected calibration result is transmitted according to the comparison result, so that the calibration result is more accurate, thereby reducing the mismeasurement rate of mass production of the production line, so that the production line efficiency can be improved.

[0094] like Figure 3 As shown, Figure 3 A flowchart of a calibration correction method provided in an embodiment of the present application, the method may include the following steps:

[0095] 301. Obtain an initial parameter matrix.

[0096] In an embodiment of the present application, the initial parameter matrix may include multiple elements, each of which is obtained after digital pre-distortion calibration, that is, after the single board is powered on and undergoes DPD self-calibration, the current calibration result is recorded as the initial parameter matrix.

[0097] It should be noted that the initial parameter matrix can be understood as a matrix A={A1, A2, A3, . . . , AN}, where N is a positive integer and each element represents a value generated by DPD calibration.

[0098] 302. Retrieve a first initial threshold matrix and a second initial threshold matrix from a threshold register.

[0099] In an embodiment of the present application, a new threshold register may be added, in which multiple thresholds may be stored. Therefore, a first initial threshold matrix and a second initial threshold matrix may be retrieved from the threshold register. The first initial threshold matrix is ​​greater than the second initial threshold matrix. The first initial threshold matrix may be a maximum value matrix MAX, and the second initial threshold matrix may be a minimum value matrix MIN.

[0100] It should be noted that the first initial threshold matrix can be understood as the matrix MAX = {Max1, Max2, ..., MaxN}, N is a positive integer, and each element represents the maximum value of the initial setting of DPD; the second initial threshold matrix can be understood as the matrix MIN = {Max1, Max2, ..., MaxN}, N is a positive integer, and each element represents the minimum value of the initial setting of DPD.

[0101] 303. Compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result.

[0102] In an embodiment of the present application, the initial parameter matrix includes multiple elements, and the corresponding first initial threshold matrix and the second initial threshold matrix also include multiple elements. The elements in the initial parameter matrix and the elements in the first initial threshold matrix are one-to-one corresponding, and correspondingly, the elements in the initial parameter matrix and the elements in the second initial threshold matrix are also one-to-one corresponding. Therefore, when comparing the initial parameter matrix and the threshold matrix, in fact, each element in the initial parameter matrix is ​​compared with the corresponding element in the first initial threshold matrix, and each element in the initial parameter matrix is ​​compared with the corresponding element in the second initial threshold matrix, so as to obtain a comparison result.

[0103] 304. According to the comparison result, parameter processing is performed on the initial parameter matrix to obtain a target parameter matrix.

[0104] In an embodiment of the present application, the comparison result can indicate the size relationship between each element in the initial parameter matrix and the corresponding elements in the first initial threshold matrix and the second initial threshold matrix. According to the size relationship, the initial parameter matrix can be subjected to corresponding parameter processing, and the parameter processing may include maintaining, enlarging or reducing, so as to obtain the corresponding target parameter matrix, which can be used for subsequent testing of the WiFi chip.

[0105] The embodiment of the present application provides a calibration correction method, which obtains an initial parameter matrix, wherein the initial parameter matrix includes multiple elements, and the multiple elements are obtained after digital pre-distortion calibration; retrieves a first initial threshold matrix and a second initial threshold matrix from a threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix; compares each element in the initial parameter matrix with the corresponding element thresholds in the first initial threshold matrix and the second initial threshold matrix, respectively, to obtain a comparison result; and performs parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix, which is used to test the wireless fidelity WiFi chip. In this scheme, the DPD parameters after the DPD calibration at power-on are not directly written into the corresponding register at the first time, but the self-calibration result is compared once through the threshold value pre-set in the threshold register, and the final corrected calibration result is transmitted according to the comparison result, so that the calibration result is more accurate, thereby reducing the mismeasurement rate of mass production of the production line, so that the production line efficiency can be improved.

[0106] like Figure 4 As shown, Figure 4 A flowchart of a calibration correction method provided in an embodiment of the present application, the method may also include the following steps:

[0107] 401. Obtain an initial parameter matrix.

[0108] In the embodiment of the present invention, for the description of step 401, please refer to the detailed description of step 101 in the above embodiment, which will not be repeated in the embodiment of the present invention.

[0109] 402. Perform multiple sets of digital pre-distortion calibration in advance to obtain multiple digital pre-distortion parameter matrices.

[0110] In the embodiment of the present application, the threshold matrix may be obtained based on pre-completed test data. Specifically, multiple groups of digital pre-distortion calibration may be performed first. The multiple groups of digital pre-distortion calibration may be multiple digital pre-distortion calibrations performed on a chip board, or may be digital pre-distortion calibrations performed on multiple chip boards at the same time. In this way, multiple digital pre-distortion parameter matrices may be obtained. The digital pre-distortion parameter matrix may be composed of numerical values ​​after digital pre-distortion calibration, and the digital pre-distortion parameter matrix also includes multiple elements.

[0111] In some embodiments, in order to make the threshold setting more accurate and not affect subsequent tests, it can be set according to more samples. That is, the number of digital pre-distortion parameter matrices can be larger, such as 100 pcs or 200 pcs, etc., which is not specifically limited in the embodiments of the present application.

[0112] 403. Compare multiple digital predistortion parameter matrices to obtain a maximum parameter matrix and a minimum parameter matrix.

[0113] 404. Determine the parameter maximum value matrix as the first initial threshold matrix, and determine the parameter minimum value matrix as the second initial threshold matrix.

[0114] In the embodiment of the present application, a maximum value and a minimum value are selected from a plurality of digital predistortion parameter matrices, and the maximum value matrix is ​​determined as a first initial threshold matrix, and the minimum value matrix is ​​determined as a second initial threshold matrix.

[0115] It should be noted that when external environmental factors cause DPD to be extremely abnormal, the threshold range of a large number of motherboards can be used to prevent it from deviating too much. Therefore, the threshold can be determined based on the DPD data obtained from actual tests, which is more in line with reality.

[0116] 405. Store the first initial threshold matrix and the second initial threshold matrix into a threshold register.

[0117] In the embodiment of the present application, the order between step 401 and steps 402-405 is not fixed. Step 401 may be executed first, and then steps 402-405, or steps 402-405 may be executed first, and then step 401. The embodiment of the present application does not make any specific limitation.

[0118] 406. Retrieve a first initial threshold matrix and a second initial threshold matrix from a threshold register.

[0119] 407. Compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result.

[0120] 408. According to the comparison result, parameter processing is performed on the initial parameter matrix to obtain a target parameter matrix.

[0121] In the embodiment of the present invention, for the description of steps 406 to 408, please refer to the detailed description of steps 102 to 104 in the above embodiment, which will not be described in detail in the embodiment of the present invention.

[0122] In some embodiments, since the first initial threshold matrix and the second initial threshold matrix can be understood as a maximum value matrix and a minimum value matrix, three comparison results can be divided by the first initial threshold matrix and the second initial threshold matrix, respectively including:

[0123] In some embodiments, when the comparison result indicates that the target element is less than or equal to the corresponding element in the first initial threshold matrix and greater than or equal to the corresponding element in the second initial threshold matrix, the initial parameter matrix is ​​determined as the target parameter matrix.

[0124] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is less than or equal to the corresponding element in the first initial threshold matrix, and is greater than or equal to the corresponding element in the second initial threshold matrix, that is, all elements included in the initial parameter matrix are between the corresponding elements of the first initial threshold matrix and the corresponding elements of the second initial threshold matrix, then there is no need to process the initial parameter matrix, and the initial parameter matrix can be directly determined as the target parameter matrix.

[0125] For example, assuming that the target element is 41, the corresponding element in the first initial threshold matrix is ​​50, and the corresponding element in the second initial threshold matrix is ​​30, since 41 is greater than 30 and less than 50, that is, the target element is less than or equal to the corresponding element in the first initial threshold matrix, and greater than or equal to the corresponding element in the second initial threshold matrix, 41 can be determined as the corresponding element value in the target parameter matrix.

[0126] or,

[0127] In some embodiments, when the comparison result indicates that the target element is greater than the corresponding element in the first initial threshold matrix, the first initial threshold matrix is ​​amplified according to a first ratio to obtain a target parameter matrix.

[0128] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is larger than the corresponding element in the first initial threshold matrix, that is, as long as there is a target element among the multiple elements included in the initial parameter matrix that is larger than the corresponding element in the first initial threshold matrix, then the initial parameter matrix is ​​considered to exceed the threshold range composed of the first initial threshold matrix and the second initial threshold matrix, which may cause the test failure. Therefore, the assignment of the target element can be adjusted, that is, the first initial threshold matrix is ​​amplified according to the first ratio, and the amplified matrix is ​​determined as the target parameter matrix.

[0129] It should be noted that the threshold matrix can be close to accuracy with the multi-batch trial production of the production line. The first ratio can be 10%, that is, the coverage of the threshold is gradually expanded multiple times at a ratio of 10%, so that it can cover more motherboards, thereby reducing the false detection rate and improving the production efficiency of the production line. In other words, when the threshold is first set, only some test data is taken for setting, which may not be accurate, resulting in some data of the test that can be completed not being within the threshold range, so the threshold range can be continuously adjusted through threshold comparison and testing. Therefore, if there is data that exceeds the maximum threshold, the range of the threshold can be gradually expanded, that is, the maximum value threshold matrix assignment is first expanded according to the first ratio, and the threshold is continuously adjusted according to the results corresponding to the expanded maximum value threshold matrix.

[0130] For example, assuming that the target element is 70, the corresponding element in the first initial threshold matrix is ​​50, the corresponding element in the second initial threshold matrix is ​​30, and the first ratio is 10%. Since 70 is greater than 50, that is, the target element is greater than the corresponding element in the first initial threshold matrix, 50*(1+10%)=55 can be determined as the corresponding element value in the target parameter matrix.

[0131] or,

[0132] In some embodiments, when the comparison result indicates that the target element is smaller than the corresponding element in the second initial threshold matrix, the second initial threshold matrix is ​​reduced according to a first ratio to obtain a target parameter matrix.

[0133] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is smaller than the corresponding element in the second initial threshold matrix, that is, as long as there is a target element among the multiple elements included in the initial parameter matrix that is smaller than the corresponding element in the second initial threshold matrix, then the initial parameter matrix is ​​considered to exceed the threshold range composed of the first initial threshold matrix and the second initial threshold matrix, which may cause the test failure. Therefore, the assignment of the target element can be adjusted, that is, the second initial threshold matrix can be reduced according to the first ratio, and the reduced matrix is ​​determined as the target parameter matrix.

[0134] It should be noted that the threshold matrix can be close to accuracy with the multi-batch trial production of the production line. The first ratio can be 10%, that is, the coverage of the threshold is gradually expanded multiple times at a ratio of 10%, so that it can cover more motherboards, thereby reducing the false detection rate and improving the production efficiency of the production line. In other words, when the threshold is first set, only some test data is taken for setting, which may not be accurate, resulting in some data of the test that can be completed not being within the threshold range, so the threshold range can be continuously adjusted through threshold comparison and testing. Therefore, if there is data below the minimum threshold, the range of the threshold can be gradually expanded, that is, the minimum threshold matrix assignment is first reduced according to the first ratio, and the threshold is continuously adjusted according to the result corresponding to the reduced minimum threshold matrix.

[0135] For example, assuming that the target element is 10, the corresponding element in the first initial threshold matrix is ​​50, the corresponding element in the second initial threshold matrix is ​​30, and the first ratio is 10%. Since 10 is less than 30, that is, the target element is less than the corresponding element in the second initial threshold matrix, 30*(1-10%)=27 can be determined as the corresponding element value in the target parameter matrix.

[0136] In some embodiments, since the first initial threshold matrix and the second initial threshold matrix are both set based on previously tested data, the data may not be perfect, resulting in the first initial threshold matrix and the second initial threshold matrix not being completely accurate and able to cover all ranges. Therefore, the first initial threshold matrix and the second initial threshold matrix may be expanded first. Specifically, the first initial threshold matrix may be enlarged according to a first ratio to obtain a first target threshold matrix, and the second initial threshold matrix may be reduced to obtain a second target threshold matrix.

[0137] It should be noted that the first target threshold matrix can be understood as the matrix (1+x)MAX, which represents the expanded matrix of the matrix MAX, and the value of each element is a new matrix composed of 1+x times its MAX value; the second target threshold matrix can be understood as the matrix (1+x)MIN, which represents the expanded matrix of the matrix MIN, and the value of each element is a new matrix composed of 1-x times its MIN value.

[0138] Among them, x belongs to (0, 1), which represents the degree of expansion of the matrix. It can be customized, but the amplitude should not be too large.

[0139] Exemplarily, assuming that the corresponding element in the first initial threshold matrix is ​​50, the corresponding element in the second initial threshold matrix is ​​30, and the first ratio x is 10%, then the first target threshold matrix is ​​(1+10%)*50=55, and the second target threshold matrix is ​​(1-10%)*30=27.

[0140] In some embodiments, each element in the initial parameter matrix is ​​compared with the corresponding element thresholds in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result, including: each element in the initial parameter matrix is ​​compared with the corresponding element thresholds in the first target threshold matrix and the second target threshold matrix to obtain a comparison result.

[0141] In some embodiments, since the expanded first target threshold matrix and the second target threshold matrix can still be understood as a maximum value matrix and a minimum value matrix, three comparison results can be divided by the first target threshold matrix and the second target threshold matrix, including:

[0142] In some embodiments, when the comparison result indicates that the target element is less than or equal to the corresponding element in the first target threshold matrix and greater than or equal to the corresponding element in the second target threshold matrix, the initial parameter matrix is ​​determined as the target parameter matrix.

[0143] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is less than or equal to the corresponding element in the first initial threshold matrix, and is greater than or equal to the corresponding element in the second initial threshold matrix, that is, all elements included in the initial parameter matrix are between the corresponding elements of the first initial threshold matrix and the corresponding elements of the second initial threshold matrix, then there is no need to process the initial parameter matrix, and the initial parameter matrix can be directly determined as the target parameter matrix.

[0144] For example, assuming that the target element is 41, the corresponding element in the first target threshold matrix is ​​55, and the corresponding element in the second initial threshold matrix is ​​27, since 41 is greater than 27 and less than 55, that is, the target element is less than or equal to the corresponding element in the first target threshold matrix, and greater than or equal to the corresponding element in the second target threshold matrix, 41 can be determined as the corresponding element value in the target parameter matrix.

[0145] or,

[0146] In some embodiments, when the comparison result indicates that the target element is greater than the corresponding element in the first target threshold matrix, the first target threshold matrix is ​​determined as the target parameter matrix;

[0147] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is greater than the corresponding element in the first target threshold matrix, that is, as long as there is a target element among the multiple elements included in the initial parameter matrix that is greater than the corresponding element in the first target threshold matrix, then the initial parameter matrix is ​​considered to exceed the threshold range composed of the first target threshold matrix and the second target threshold matrix, which may cause the test failure. Therefore, the assignment of the target element can be adjusted, that is, the first initial threshold matrix is ​​amplified according to the first ratio, and the first target threshold matrix obtained after amplification is determined as the target parameter matrix.

[0148] For example, assuming that the target element is 70, the corresponding element in the first target threshold matrix is ​​55, the corresponding element in the second target threshold matrix is ​​27, and the first ratio is 10%. Since 70 is greater than 55, that is, the target element is greater than the corresponding element in the first target threshold matrix, 50*(1+10%)=55 can be determined as the corresponding element value in the target parameter matrix.

[0149] or,

[0150] In some embodiments, when the comparison result indicates that the target element is smaller than the corresponding element in the second target threshold matrix, the second target threshold matrix is ​​determined as the target parameter matrix;

[0151] It should be noted that the target element is any one of the multiple elements included in the initial parameter matrix. If the target element is smaller than the corresponding element in the second target threshold matrix, that is, as long as there is a target element among the multiple elements included in the initial parameter matrix that is smaller than the corresponding element in the second target threshold matrix, then the initial parameter matrix is ​​considered to exceed the threshold range composed of the first target threshold matrix and the second target threshold matrix, which may cause the test failure. Therefore, the assignment of the target element can be adjusted, that is, the second initial threshold matrix can be reduced according to the first ratio, and the second target threshold matrix obtained after reduction is determined as the target parameter matrix.

[0152] For example, assuming that the target element is 10, the corresponding element in the first target threshold matrix is ​​55, the corresponding element in the second target threshold matrix is ​​27, and the first ratio is 10%. Since 10 is less than 27, that is, the target element is less than the corresponding element in the second target threshold matrix, 30*(1-10%)=27 can be determined as the corresponding element value in the target parameter matrix.

[0153] In some embodiments, the first initial threshold matrix, the first target threshold matrix, the second initial threshold matrix and the second target threshold matrix can also be used together to compare the target elements, that is, when the target element is less than or equal to the first initial threshold matrix and greater than or equal to the corresponding element of the second initial threshold matrix, the initial parameter matrix is ​​determined as the target parameter matrix; when the target element is greater than the first initial threshold matrix and less than or equal to the first target threshold matrix, the initial parameter matrix is ​​determined as the target parameter matrix; when the target element is greater than the first initial threshold matrix and greater than or equal to the first target threshold matrix, the first target threshold matrix is ​​determined as the target parameter matrix; when the target element is less than the second initial threshold matrix and greater than or equal to the second target threshold matrix, the initial parameter matrix is ​​determined as the target parameter matrix; when the target element is less than the second initial threshold matrix and less than or equal to the second target threshold matrix, the second target threshold matrix is ​​determined as the target parameter matrix.

[0154] 409. Test the WiFi chip according to the target parameter matrix to obtain a test result.

[0155] 410. Dynamically adjust the first initial threshold matrix and the second initial threshold matrix according to the test result.

[0156] In an embodiment of the present application, the test result can indicate whether the current target parameter matrix is ​​qualified. If the target parameter matrix is ​​qualified, then the test result can be a test success, which means that the current expanded threshold matrix range is reasonable, so the first initial threshold matrix and the second initial threshold matrix can be expanded and adjusted; if the target parameter matrix is ​​unqualified, then the test result can be a test failure, which means that the current expanded threshold matrix range is unreasonable, so the first initial threshold matrix and the second initial threshold matrix do not need to be adjusted.

[0157] In some embodiments, when the test result indicates that the test is successful, the first initial threshold matrix may be dynamically adjusted to a first target threshold matrix, and the second initial threshold matrix may be dynamically adjusted to a second target threshold matrix.

[0158] It should be noted that the DPD parameters collected after each trial production should have the following results: (1-x)MIN, MIN, A, MAX, (1+x)MAX. Then, in the next trial production, the new threshold MAX can be (1+x)MAX and MIN can be (1-x)MIN. In this way, the threshold is flexible and can avoid other problems caused by the existence of randomness of the threshold.

[0159] The embodiment of the present application provides a calibration correction method. After the DPD calibration is done at power-on, the DPD parameters are not written directly into the corresponding registers at the first time. Instead, the self-calibration result is compared with the threshold value pre-set in the threshold register. The final corrected calibration result is transmitted according to the comparison result, so that the calibration result is more accurate, thereby reducing the misdetection rate of mass production of the production line, so that the production line efficiency can be improved. In addition, according to a certain ratio, the coverage range of the threshold is gradually expanded multiple times so that it can cover more motherboards. The threshold is flexible and changeable, which can avoid the existence of the threshold accidental causing other problems, thereby reducing the misdetection rate and improving the production efficiency of the production line.

[0160] like Figure 5 As shown, an embodiment of the present application provides a calibration correction device, which may include:

[0161] An acquisition module 501 is used to acquire an initial parameter matrix, where the initial parameter matrix includes a plurality of elements, and the plurality of elements are obtained after digital pre-distortion calibration;

[0162] The acquisition module 501 is further used to retrieve a first initial threshold matrix and a second initial threshold matrix from the threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix;

[0163] A processing module 502 is used to compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result;

[0164] The processing module 502 is further used to perform parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip.

[0165] In some embodiments, the processing module 502 is further used to test the WiFi chip according to the target parameter matrix to obtain a test result;

[0166] The processing module 502 is further configured to dynamically adjust the first initial threshold matrix and the second initial threshold matrix according to the test result.

[0167] In some embodiments, the processing module 502 is specifically configured to determine the initial parameter matrix as the target parameter matrix when the comparison result indicates that the target element is less than or equal to the corresponding element in the first initial threshold matrix and greater than or equal to the corresponding element in the second initial threshold matrix;

[0168] or,

[0169] The processing module 502 is specifically configured to amplify the first initial threshold matrix according to a first ratio to obtain a target parameter matrix when the comparison result indicates that the target element is greater than the corresponding element in the first initial threshold matrix;

[0170] or,

[0171] The processing module 502 is specifically configured to reduce the second initial threshold matrix according to a first ratio to obtain a target parameter matrix when the comparison result indicates that the target element is smaller than the corresponding element in the second initial threshold matrix;

[0172] The target element is any one of the multiple elements included in the initial parameter matrix.

[0173] In some embodiments, the processing module 502 is further configured to enlarge the first initial threshold matrix according to a first ratio to obtain a first target threshold matrix, and to reduce the second initial threshold matrix to obtain a second target threshold matrix;

[0174] The processing module 502 is further configured to compare each element in the initial parameter matrix with the corresponding element threshold in the first target threshold matrix and the second target threshold matrix to obtain a comparison result.

[0175] In some embodiments, the processing module 502 is specifically configured to determine the initial parameter matrix as the target parameter matrix when the comparison result indicates that the target element is less than or equal to the corresponding element in the first target threshold matrix and greater than or equal to the corresponding element in the second target threshold matrix;

[0176] or,

[0177] The processing module 502 is specifically configured to determine the first target threshold matrix as the target parameter matrix when the comparison result indicates that the target element is greater than the corresponding element in the first target threshold matrix;

[0178] or,

[0179] The processing module 502 is specifically configured to determine the second target threshold matrix as the target parameter matrix when the comparison result indicates that the target element is smaller than the corresponding element in the second target threshold matrix;

[0180] The target element is any one of the multiple elements included in the initial parameter matrix.

[0181] In some embodiments, the processing module 502 is specifically configured to dynamically adjust the first initial threshold matrix to the first target threshold matrix, and dynamically adjust the second initial threshold matrix to the second target threshold matrix when the test result indicates that the test is successful.

[0182] In some embodiments, the processing module 502 is further used to perform multiple sets of digital pre-distortion calibration in advance to obtain multiple digital pre-distortion parameter matrices;

[0183] The processing module 502 is further used to compare the multiple digital predistortion parameter matrices to obtain a maximum parameter matrix and a minimum parameter matrix;

[0184] The processing module 502 is further configured to determine the parameter maximum value matrix as a first initial threshold matrix, and determine the parameter minimum value matrix as a second initial threshold matrix;

[0185] The processing module 502 is further configured to store the first initial threshold matrix and the second initial threshold matrix into a threshold register.

[0186] In the embodiment of the present application, each module can implement the calibration correction method provided in the above method embodiment and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0187] like Figure 6 As shown, an embodiment of the present application further provides an electronic device, which may include:

[0188] A memory 601 storing executable program codes;

[0189] a processor 602 coupled to the memory 601;

[0190] The processor 602 calls the executable program code stored in the memory 601 to execute the calibration correction method performed by the electronic device in the above-mentioned method embodiments.

[0191] An embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the various processes of the calibration correction method in the above method embodiment are implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0192] An embodiment of the present application also provides a computer program product, which stores a computer program. When the computer program is executed by a processor, the various processes of the calibration correction method in the above method embodiment are implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0193] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media that include computer-usable program code.

[0194] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can also be implemented in other ways. The device embodiments described above are merely schematic. For example, the flowcharts and block diagrams in the accompanying drawings show the possible architecture, functions and operations of the devices, methods and computer program products according to multiple embodiments of the present application. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of the code, and a part of the module, program segment or code contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram and / or flowchart, and the combination of boxes in the block diagram and / or flowchart can be implemented with a dedicated hardware-based system that performs a specified function or action, or can be implemented with a combination of dedicated hardware and computer instructions.

[0195] In the present application, the processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0196] In this application, memory may include non-permanent memory in a computer-readable medium, random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of a computer-readable medium.

[0197] In this application, a person skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing the relevant hardware through a program, and the program can be stored in a computer-readable storage medium, and the computer-readable medium includes permanent and non-permanent, removable and non-removable storage media. The storage medium can implement information storage by any method or technology, and the information can be a computer-readable instruction, a data structure, a module of a program, or other data. Examples of computer storage media include, but are not limited to, Parallel Random Access Memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Programmable Read-only Memory (PROM), Erasable Programmable Read Only Memory (EPROM), other types of Random Access Memory (RAM), Read-Only Memory (ROM), One-time Programmable Read-Only Memory (OTPROM), Electrically-Erasable Programmable Read-Only Memory (EEPROM), flash memory or other memory technology, Compact Disc Read-Only Memory (CD-ROM), Digital Versatile Disc (DVD) or other optical storage, magnetic cassettes, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. According to the definition in this article, computer-readable media does not include temporary computer-readable media (transitory media), such as modulated data signals and carrier waves.

[0198] It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the term "comprises" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0199] It should be understood that "one embodiment" or "an embodiment" mentioned throughout the specification means that specific features, structures or characteristics related to the embodiment are included in at least one embodiment of the present application. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. In addition, these specific features, structures or characteristics can be combined in one or more embodiments in any suitable manner. Those skilled in the art should also be aware that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily required by the present application. The above-mentioned multiple embodiments are not necessarily multiple independent embodiments. Dividing into multiple embodiments is only used to highlight the different technical features in different embodiments. Those skilled in the art should be aware that the above-mentioned multiple embodiments can also be combined in any way.

[0200] In the various embodiments of the present application, it should be understood that the size of the serial numbers of the above-mentioned processes does not necessarily mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0201] The units described above as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0202] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0203] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-accessible memory. Based on this understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product, which is stored in a memory and includes several requests for a computer device (which can be a personal computer, a server or a network device, etc., specifically a processor in a computer device) to perform some or all of the steps of the above-mentioned methods of various embodiments of the present application.

[0204] The above is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to these embodiments herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A calibration correction method, characterized in that: The method comprises: Acquire an initial parameter matrix, wherein the initial parameter matrix includes a plurality of elements, and the plurality of elements are obtained after digital pre-distortion calibration; Retrieving a first initial threshold matrix and a second initial threshold matrix from a threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix; Compare each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result; According to the comparison result, parameter processing is performed on the initial parameter matrix to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip.

2. The method according to claim 1, characterized in that After performing parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix, the method further includes: According to the target parameter matrix, the WiFi chip is tested to obtain a test result; The first initial threshold matrix and the second initial threshold matrix are dynamically adjusted according to the test result.

3. The method according to claim 1, characterized in that The step of performing parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix comprises: When the comparison result indicates that the target element is less than or equal to the corresponding element in the first initial threshold matrix, and greater than or equal to the corresponding element in the second initial threshold matrix, determining the initial parameter matrix as the target parameter matrix; or, When the comparison result indicates that the target element is greater than the corresponding element in the first initial threshold matrix, amplifying the first initial threshold matrix according to a first ratio to obtain the target parameter matrix; or, When the comparison result indicates that the target element is smaller than the corresponding element in the second initial threshold matrix, the second initial threshold matrix is ​​reduced according to the first ratio to obtain the target parameter matrix; The target element is any one of the multiple elements included in the initial parameter matrix.

4. The method according to claim 1, characterized in that After calling the first initial threshold matrix and the second initial threshold matrix from the threshold register, the method further includes: According to a first ratio, the first initial threshold matrix is ​​enlarged to obtain a first target threshold matrix, and the second initial threshold matrix is ​​reduced to obtain a second target threshold matrix; The step of comparing each element in the initial parameter matrix with the corresponding element thresholds in the first initial threshold matrix and the second initial threshold matrix to obtain a comparison result comprises: Each element in the initial parameter matrix is ​​compared with the corresponding element threshold in the first target threshold matrix and the second target threshold matrix to obtain the comparison result.

5. The method according to claim 4, characterized in that The step of performing parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix comprises: When the comparison result indicates that the target element is less than or equal to the corresponding element in the first target threshold matrix, and greater than or equal to the corresponding element in the second target threshold matrix, determining the initial parameter matrix as the target parameter matrix; or, When the comparison result indicates that the target element is greater than the corresponding element in the first target threshold matrix, determining the first target threshold matrix as the target parameter matrix; or, When the comparison result indicates that the target element is smaller than the corresponding element in the second target threshold matrix, determining the second target threshold matrix as the target parameter matrix; The target element is any one of the multiple elements included in the initial parameter matrix.

6. The method according to any one of claims 2 to 5, characterized in that: The dynamically adjusting the first initial threshold matrix and the second initial threshold matrix according to the test result includes: When the test result indicates that the test is successful, the first initial threshold matrix is ​​dynamically adjusted to a first target threshold matrix, and the second initial threshold matrix is ​​dynamically adjusted to a second target threshold matrix.

7. The method according to claim 1, characterized in that Before calling the first initial threshold matrix and the second initial threshold matrix from the threshold register, the method further includes: Performing multiple sets of digital pre-distortion calibration in advance to obtain multiple digital pre-distortion parameter matrices; Comparing the multiple digital predistortion parameter matrices to obtain a maximum parameter matrix and a minimum parameter matrix; Determine the parameter maximum value matrix as the first initial threshold matrix, and determine the parameter minimum value matrix as the second initial threshold matrix; The first initial threshold matrix and the second initial threshold matrix are stored in the threshold register.

8. A calibration correction device, characterized in that: include: An acquisition module, used for acquiring an initial parameter matrix, wherein the initial parameter matrix includes a plurality of elements, and the plurality of elements are obtained after digital pre-distortion calibration; The acquisition module is further used to retrieve a first initial threshold matrix and a second initial threshold matrix from the threshold register, wherein the first initial threshold matrix is ​​greater than the second initial threshold matrix; A processing module, used for comparing each element in the initial parameter matrix with the corresponding element threshold in the first initial threshold matrix and the second initial threshold matrix, respectively, to obtain a comparison result; The processing module is further used to perform parameter processing on the initial parameter matrix according to the comparison result to obtain a target parameter matrix, and the target parameter matrix is ​​used to test the wireless fidelity WiFi chip.

9. An electronic device, characterized in that: include: A memory storing executable program code; and a processor coupled to the memory; The processor calls the executable program code stored in the memory to execute the calibration correction method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: include: The computer-readable storage medium stores computer instructions, and when the computer instructions are executed by a processor, the calibration correction method according to any one of claims 1 to 7 is implemented.

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