Test method, system and device

Abstract

The embodiment of the invention provides a test method, system and device, the test system comprises a main server and a plurality of test sites respectively accessed to the main server, and the method comprises the following steps: in response to a test request for to-be-tested equipment, based on an equipment identifier of the to-be-tested equipment, querying historical test sites of the to-be-tested equipment from the main server; querying a test record of the to-be-tested equipment from the historical test site, and determining a to-be-tested target test item based on the test record; the test record comprises test items executed by the to-be-tested device at the historical test site and a test result of each test item, the test results represent whether the test items pass the test, and the target test items are test items which do not pass the test. The test items which do not pass the test can be accurately determined, the test efficiency can be improved, and the problems that manual determination of the test items is prone to errors and complex in operation are solved.

Description

Technical Field

[0001] The present invention relates to the field of communication technology, and in particular to a testing method, system and device. Background Art

[0002] In production testing, the equipment will have many test items. For the selection of test items, production personnel currently need to select different test items based on the specific circumstances of the production test.

[0003] However, the test item selection increases manual operation and requires production personnel to perform complex test item confirmation. It is easy to select the wrong test item during the test process, resulting in erroneous testing. The operation is complicated and the usability is low, which affects production efficiency. Summary of the invention

[0004] The purpose of the embodiments of the present invention is to provide a test method, system and device to accurately determine the target test items to be tested, thereby improving the test efficiency and avoiding the problems of error proneness and complex operation in manually determining the test items. The specific technical solution is as follows:

[0005] In a first aspect, an embodiment of the present invention provides a testing method, which is applied to a testing site in a testing system, wherein the testing system includes a main server and a plurality of testing sites respectively connected to the main server, including:

[0006] In response to a test request for the device under test, querying a historical test site of the device under test from the main server based on a device identification of the device under test;

[0007] The test record of the device under test is queried from the historical test site, and the target test items to be tested are determined based on the test records; the test records include the test items executed by the device under test at the historical test site and the test results of each of the test items, the test results indicate whether the test items have passed the test, and the target test items are the test items that have not passed the test.

[0008] Optionally, before querying the main server for a historical test site of the device under test based on the device identification of the device under test, the method further includes:

[0009] Based on the device identification of the device under test, query the test phase of the device under test and the test status of the test phase from the main service; the test status includes untested, test failed and test completed;

[0010] When the test status is untested, all test items of the current test phase of the device under test are determined as the target test items;

[0011] When the test status is test completion, all test items of the next test phase of the device under test are determined as the target test items;

[0012] When the test status is test failure, the steps of querying the historical test site of the device under test from the main server, querying the test record of the device under test from the historical test site, and determining the target test item to be tested based on the test record are executed.

[0013] Optionally, the step of determining a target test item to be tested based on the test record includes:

[0014] Acquire maintenance status confirmation information pre-recorded for the device under test, wherein the maintenance status confirmation information indicates whether the device under test has been repaired;

[0015] If yes, all test items in the current test phase are determined as the target test items;

[0016] If not, based on the test record, the test items that have not passed the test in the current test phase are determined as the target test items.

[0017] Optionally, the step of obtaining maintenance status confirmation information pre-recorded for the device under test includes:

[0018] querying the historical test site for the test time of the device under test at the historical test site, and determining the maintenance status confirmation information based on the time difference between the test time and the current time;

[0019] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0020] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0021] Optionally, the method further includes:

[0022] After the test of the target test item is executed on the device under test, the test phase, test status and / or test record of the device under test is updated according to the test result, and reported to the main server.

[0023] Optionally, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0024] In a second aspect, an embodiment of the present invention provides a test system, including a main server and a plurality of test sites respectively connected to the main server;

[0025] The main server is used to store the correspondence between the device identification of the device under test and the site identification of the test site used to test the device under test;

[0026] The test site is used to respond to a test request for the device under test, query the main server for a historical test site of the device under test based on the device identification of the device under test, and query the historical test site for a test record of the device under test, and determine a target test item to be tested based on the test record; the test record includes the test items executed by the device under test at the historical test site and the test result of each of the test items, the test result indicates whether the test item is passed, and the target test item is a test item that has not passed the test.

[0027] Optionally, the main server is further used to store the test phase of the device under test and the test status of the test phase;

[0028] The test site is further used to query the test phase of the device under test and the test status of the test phase from the main service based on the device identification of the device under test; the test status includes untested, test failed and test completed;

[0029] When the test status is untested, all test items of the current test phase of the device under test are determined as the target test items;

[0030] When the test status is test completion, all test items of the next test phase of the device under test are determined as the target test items;

[0031] When the test status is test failure, query the historical test site of the device under test from the main server, query the test record of the device under test from the historical test site, and determine the target test item to be tested based on the test record.

[0032] Optionally, when the test site executes the step of determining a target test item to be tested based on the test record, it is specifically used to:

[0033] Acquire maintenance status confirmation information pre-recorded for the device under test, wherein the maintenance status confirmation information indicates whether the device under test has been repaired;

[0034] If yes, all test items in the current test phase are determined as the target test items;

[0035] If not, based on the test record, the test items that have not passed the test in the current test phase are determined as the target test items.

[0036] Optionally, the test site is further used to store the test time of the device under test;

[0037] When the test site executes the step of obtaining the maintenance status confirmation information pre-recorded for the device under test, it is specifically used to:

[0038] querying the historical test site for the test time of the device under test at the historical test site, and determining the maintenance status confirmation information based on the time difference between the test time and the current time;

[0039] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0040] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0041] Optionally, the test site is further used to, after executing the test of the target test item on the device under test, update the test phase, test status and / or test record of the device under test according to the test result, and report to the main server.

[0042] Optionally, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0043] In a third aspect, an embodiment of the present invention provides a testing device, which is applied to a testing site in a testing system, wherein the testing system includes a main server and a plurality of testing sites respectively connected to the main server, including:

[0044] A query module, configured to query a historical test site of the device under test from the main server based on a device identifier of the device under test in response to a test request for the device under test;

[0045] A determination module is used to query the test record of the device under test from the historical test site, and determine the target test items to be tested based on the test records; the test records include the test items executed by the device under test at the historical test site and the test results of each of the test items, the test results represent whether the test items are passed, and the target test items are test items that have not passed the test.

[0046] Optionally, the device further comprises:

[0047] A test status query module, used to query the test phase of the device under test and the test status of the test phase from the main service based on the device identification of the device under test; the test status includes untested, test failed and test completed;

[0048] The determination module is also used to, when the test status is untested, determine all test items of the current test phase of the device under test as the target test items; when the test status is test completion, determine all test items of the next test phase of the device under test as the target test items; when the test status is test failure, query the historical test site of the device under test from the main server, query the test records of the device under test from the historical test site, and determine the target test items to be tested based on the test records.

[0049] Optionally, the determination module is specifically used to obtain maintenance status confirmation information pre-recorded for the device under test, wherein the maintenance status confirmation information indicates whether the device under test has been repaired;

[0050] If yes, all test items in the current test phase are determined as the target test items;

[0051] If not, based on the test record, the test items that have not passed the test in the current test phase are determined as the target test items.

[0052] Optionally, the determining module includes:

[0053] A maintenance status confirmation unit, configured to query the historical test site for the test time of the device under test at the historical test site, and determine the maintenance status confirmation information based on the time difference between the test time and the current time;

[0054] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0055] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0056] Optionally, the device further comprises:

[0057] The reporting module is used to update the test phase, test status and / or test record of the device under test according to the test result after executing the test of the target test item on the device under test, and report to the main server.

[0058] Optionally, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0059] In a fourth aspect, an embodiment of the present invention provides an electronic device, including a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;

[0060] Memory, used to store computer programs;

[0061] The processor is used to implement any of the above-mentioned testing methods when executing the program stored in the memory.

[0062] An embodiment of the present invention further provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute any of the above-mentioned testing methods.

[0063] Beneficial effects of the embodiments of the present invention:

[0064] The test method, system and device provided by the embodiments of the present invention, the test system includes a main server and multiple test sites respectively connected to the main server, so that after the test site used to test the device to be tested is changed, there is no need to manually determine the test items that need to be tested. Instead, the current test site can query the main server for the historical test sites of the device to be tested based on the device identification of the device to be tested, and query the historical test site for the test records of the device to be tested, and determine the target test items to be tested based on the test records, so that the test items that have passed the test can be automatically skipped, and the test items that have failed the test can be determined efficiently and accurately, which can improve the test efficiency and avoid the problems of manual determination of test items that are prone to errors and complex operations.

[0065] Of course, it is not necessary to achieve all of the advantages described above at the same time to implement any product or method of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0066] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For ordinary technicians in this field, other embodiments can also be obtained based on these drawings.

[0067] Figure 1 is a structural schematic diagram of a test system provided by an embodiment of the present invention;

[0068] Figure 2It is a flow chart of the testing method provided by the embodiment of the present invention;

[0069] Figure 3 This is a schematic diagram of a first interface of the automated testing software provided by an embodiment of the present invention;

[0070] Figure 4 This is a schematic diagram of a second interface of the automated testing software provided by an embodiment of the present invention;

[0071] Figure 5 This is a schematic diagram of a third interface of the automated testing software provided by an embodiment of the present invention;

[0072] Figure 6 is another structural schematic diagram of a test system provided by an embodiment of the present invention;

[0073] Figure 7 is a schematic diagram of the structure of a testing device provided by an embodiment of the present invention;

[0074] Figure 8 It is a schematic diagram of the structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0075] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field based on this application belong to the scope of protection of the present invention.

[0076] In order to solve the problems of complex operation and easy errors when manually determining test items, an embodiment of the present invention provides a testing method, which is specifically applied to a test site in a test system.

[0077] For ease of understanding, the test system is briefly described below. Figure 1 is a schematic diagram of a structure of a test system provided by an embodiment of the present invention, see Figure 1 The test system specifically includes a main server and a plurality of test sites from test site 1 to test site n respectively connected to the main server.

[0078] Each test site is specifically used to test the device under test and store the test records of the device under test tested at this site. The test record of each device under test includes the test items performed by the device under test at this site and the test results of each test item. The test results of each test item are used to indicate whether the test item has passed or failed.

[0079] The main server can manage the test site information corresponding to each test device. Specifically, the main server can store the device identification of each device under test and the site identification of the test site used to test the device under test.

[0080] In actual applications, after the device under test is tested at a certain test site, the test site may be changed for various reasons, and it is necessary to test it at other test sites later. At this time, it is necessary to select test items according to the actual situation. When the test method provided by the embodiment of the present invention is applied to the above system, the test site currently used to test the device under test can efficiently determine the target test items that need to be tested with the help of the information stored in the main server and other test sites, without the need to manually select the test items.

[0081] Figure 2 is a flow chart of the test method provided by the embodiment of the present invention, see Figure 2 , the method specifically comprises the following steps:

[0082] Step S201: In response to a test request for a device under test, based on a device identification of the device under test, query a main server for a historical test site of the device under test.

[0083] The historical test site specifically refers to a test site used to test the device under test before the test site currently required to test the device under test. As an example, if a device under test is first tested by test site 1, and then a test request for the device under test is received by test site 2, then test site 1 is the historical test site of the device under test.

[0084] As mentioned above, the main server can store the device identification of each device under test and the site identification of the test site used to test the device under test. Therefore, after the current test site receives a test request for the device under test, the main server actually records the historical test sites of the device under test. The current test site can query the main server for the historical test sites of the device under test based on the device identification of the device under test.

[0085] In the embodiment of the present invention, after executing the target test item for the device under test, the test site may report the device identification of the device under test to the main server, so that the main server may update the test site recorded for the device under test.

[0086] The device identification is specifically used by the test site and the main server to uniquely identify each device under test. As an example, the device number of each device under test can be used as the device identification.

[0087] Step S202: query the historical test site for the test record of the device to be tested, and determine the target test item to be tested based on the test record; the test record includes the test items executed by the device to be tested at the historical test site and the test result of each test item, the test result indicates whether the test item has passed the test, and the target test item is the test item that has not passed the test.

[0088] In the aforementioned step S201, the current test site has initiated a query to the main server and queried the historical test site of the device to be tested. In this step, the current test site can query the historical test site for the test records of the device to be tested, and determine the test items recorded as failed in the test records as the target test items to be tested.

[0089] After the target test items are determined, the test site can subsequently test the device under test for the target test items without having to repeat the test items that have already been passed by the device under test at the historical test site.

[0090] The embodiment of the present invention is described below with reference to a specific example. Assuming that the number of the device under test is 1, the device under test 1 is first tested by the test site 1. If the test items A and B pass the test, but the test item C fails the test, the test results of the test items AC are recorded in the test record for the test device 1 in the test site 1, and the main server may record "device under test 1: test site 1". Then, after receiving the test request for the device under test 1, the test site 2 can query the main server based on the device number of the device under test to find that the test site 1 is a historical test site, and then query the test site 1 for the test record of the device under test 1, and the test item C that has not passed the test specifically recorded in the test record can be determined as the target test item. Subsequently, the test site 2 can test the device under test 1 by targeting the test item C.

[0091] The testing method provided by the embodiment of the present invention is specifically applied to a test site in a testing system, wherein the testing system includes a main server and multiple test sites respectively connected to the main server. Therefore, after a test site used to test a device to be tested is changed, there is no need to manually determine the test items that need to be tested. Instead, the current test site can query the main server for the historical test sites of the device to be tested based on the device identification of the device to be tested, and query the historical test site for the test records of the device to be tested, and determine the target test items to be tested based on the test records, so that the test items that have passed the test can be automatically skipped, and the test items that have failed the test can be accurately determined, which can improve the testing efficiency and avoid the problems of manual determination of test items that are prone to errors and complex operations.

[0092] In one embodiment of the present invention, before querying the historical test sites of the device under test from the main server based on the device identification of the device under test, the method further includes:

[0093] Based on the device ID of the device under test, query the test phase of the device under test and the test status of the test phase from the main service; the test status includes untested, test failed and test completed;

[0094] When the test status is untested, all test items of the current test phase of the device under test are determined as target test items;

[0095] When the test status is test completion, the test items of the next test phase of the device under test are determined as target test items;

[0096] When the test status is test failure, the steps of querying the historical test site of the device under test from the main server, querying the test record of the device under test from the historical test site, and determining the target test item to be tested based on the test record are executed.

[0097] In actual applications, it may be necessary to perform multiple test phases on the device under test, each test phase includes a certain number of test items. And usually, after all the test items in a test phase have passed the test, the device under test will be tested in the next test phase.

[0098] In the embodiment of the present invention, in order to further improve the efficiency of determining the target test items, the main server may also store the test phase of each device under test and the test status of the current test phase.

[0099] Specifically, after receiving the test request for the device under test, the test node may first query the main server about the test phase of the device under test and the test status of the test phase based on the device identification of the device under test.

[0100] When the test status is "not tested", it means that none of the test items in the current test phase have started testing. Therefore, there is no need to query the main server for the historical test site, and all the test items in the current test phase can be directly determined as target test items. When the test status is "test successful", it means that all the test items in the current test phase have been successfully tested and the next test phase can be performed. Therefore, there is no need to query the main server for the historical test site, and all the test items in the next test phase can be directly determined as target test items. When the test status is "test failed", it means that some test items in the current test phase have not passed the test, and it is necessary to determine the test items that need to be tested in the current test phase. Therefore, it is necessary to query the main server for the historical test site of the device under test, and then query the historical test site for the test records of the device under test, and determine the test items that have not passed the test in the current test phase as target test items based on the test records.

[0101] In an embodiment of the present invention, the test site can first query the main server about the test phase and test status of the device to be tested, so that when the test status is untested, all test items in the current test phase are determined as target test items; when the test status is successful, all test items in the next test phase are determined as target test items. The target test items can be determined without querying the test records from the test site, which can improve the efficiency of determining the target test items.

[0102] In one embodiment of the present invention, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0103] Specifically, the test method provided by the embodiment of the present invention can be applied to the production test of the mixer board, and the single-board test for the mixer board specifically includes two test stages: the insertion loss test stage and the index test stage. The mixer board supports the mixing and pass-through of multiple frequency band signals. Therefore, in each test stage of the mixer board, it is specifically necessary to test the mixer board in multiple working frequency bands, and each working frequency band includes test items for multiple channels. Therefore, in one test stage, the entire mixer board will include dozens of test items.

[0104] Since there are many test items for the production test of the mixing board, the process of determining the test items is very complicated and prone to errors after the test site is changed. By applying the test method provided in the embodiment of the present invention, the test site can query the test stage and test status of the mixing board from the main server, and combine the test records stored for the mixing board in the historical test node to efficiently and accurately determine the target test items that need to be tested on the mixing board, thereby avoiding the problems of complex operation and prone to errors when manually determining the test items.

[0105] In one embodiment of the present invention, the step of determining a target test item to be tested based on the test record includes:

[0106] Obtaining maintenance status confirmation information pre-recorded for the device under test, the maintenance status confirmation information indicating whether the device under test has been repaired;

[0107] If yes, determine the test item of the current test phase as the target test item;

[0108] If not, based on the test records, the test items that have not passed the test in the current test phase are determined as target test items.

[0109] In actual applications, after the test site of the device under test is changed, the device under test can be divided into three categories based on the actual situation of the device under test: initial test, that is, the test has not been performed yet; retest, that is, the device under test is directly sent to the current test site for testing after being tested at a test site; maintenance and retest, that is, after the device under test is tested at a test site, the test device is repaired and then the repaired device under test is sent to the current test site for testing.

[0110] When determining the target test items of the device under test, it is necessary to distinguish between the three categories of devices under test mentioned above. Among them, for the device under test for the initial test, all test items need to be tested. Referring to the solution in the aforementioned embodiment in which the test site queries the main server for the test phase and test status of the device under test, the situation in which the test status is untested covers this type of device under test. For the device under test that is directly retested, it is necessary to test the test items that have not passed the test in the current test phase. For equipment that is undergoing maintenance and retesting, it should be noted that the repair may affect other test items of the device under test. Taking the mixer board as an example, when any test item in the insertion loss test phase or the index test phase fails to pass the test, when the mixer board is repaired for these untested test items, the performance of the mixer board in other working frequency bands may also be affected, so all test items in the current test phase need to be retested.

[0111] In an embodiment of the present invention, in order to distinguish between direct retesting and maintenance retesting of the device under test, when the test site determines that the test status of the device under test in the current test phase is specifically a test failure, it can obtain the maintenance status confirmation information pre-recorded for the device under test, thereby determining whether the device under test has been repaired.

[0112] If the maintenance status confirmation information indicates that the device under test has been repaired, then the device under test is for maintenance retesting, and all test items in the current test phase can be determined as target test items based on the test records; if the maintenance status confirmation information indicates that the device under test has not been repaired, then the device under test is for direct retesting, and all test items in the current test phase can be determined as target test items.

[0113] In the embodiment of the present invention, the specific method of obtaining the maintenance status confirmation information is not limited. As an example, the maintenance status confirmation information can be entered into the main server after the device under test is repaired, and the test site can query the main server whether the device under test has been repaired. As another example, after the device under test is repaired, an additional mark indicating that the device under test has been repaired can be added to the device identification of the device under test, and the test site can determine whether the device under test has been repaired based on whether the mark is included in the device identification.

[0114] In an embodiment of the present invention, the test site obtains maintenance status information to distinguish whether the equipment under test is directly retested or repaired and retested. Taking into account the impact that maintenance may have on the performance of the equipment under test, different strategies are adopted to select target test items for direct retesting and repair and retesting, and the determined target test items have higher rationality.

[0115] In one embodiment of the present invention, the step of obtaining maintenance status confirmation information pre-recorded for the device under test includes:

[0116] Query the historical test site for the test time of the device under test at the historical test site, and determine the maintenance status confirmation information based on the time difference between the test time and the current time;

[0117] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0118] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0119] In an embodiment of the present invention, the test site can also store the time when the device under test is tested at the current test site, so that after the current test site queries the main server for the historical test site of the device under test, it can query the historical test site for the time when the device under test was tested at the historical test site, and determine the time difference between the test time of the device under test at the historical test site and the current time.

[0120] When the time difference is not less than the preset time difference, that is, a long period of time has passed since the test time of the device under test at the historical test site and the current time, it can be considered that the device under test has been repaired within this period of time, so that all test items in the current test phase can be determined as target test items.

[0121] When the time difference is less than the preset time difference, that is, the test time of the device under test at the historical test site is only a short period of time away from the current time, it can be considered that it is insufficient to repair the device under test within this time period, so that the test items that have not passed the test in the current test phase can be determined as target test items.

[0122] The preset time difference may be limited according to actual conditions. As an example, the preset time difference may be set to 6 hours.

[0123] In an embodiment of the present invention, whether the device under test has been repaired is judged based on the time difference between the test time of the device under test at a historical test site and the current time. Compared with directly obtaining data related to the actual maintenance condition of the device under test, the operation complexity is low and easier to implement, which can improve the efficiency of determining the target test items.

[0124] In one embodiment of the present invention, the testing method further comprises:

[0125] After executing the test of the target test item on the device under test, the test phase, test status and / or test record of the device under test are updated according to the test result and reported to the main server.

[0126] Specifically, after the test site performs a test on the device under test, the test record stored locally for the device under test can be updated based on the test result. In the case where the main server needs to record the test phase and test status of the device under test, the test site can also determine the test phase and test status of the device under test based on the test result, report the test phase and test status of the device under test to the main server, and update the test phase and test status stored by the main server for the device under test.

[0127] As an example, after receiving the test phase and test status reported by the test site for the device under test, the main server may also synchronously update the site identifier, test phase and test status of the test site stored for the device under test.

[0128] In an embodiment of the present invention, the test site updates the test phase, test status and / or test record of the device under test according to the test results and reports to the main server, which can ensure the real-time nature of the data stored in each test site and the main server, thereby ensuring the accuracy in determining the target test items.

[0129] For ease of understanding, the test method provided by the embodiment of the present invention is further described below by taking the device to be tested as a mixer board as an example. In this example, the test site can specifically determine the target test items based on the following steps:

[0130] Step 1: Query testing phase.

[0131] Specifically, after receiving the test request for the mixer board, the test site may query the main server for the test phase of the device to be tested based on the board number of the mixer board, that is, the device identification of the mixer board.

[0132] Step 2: Query the test status.

[0133] Specifically, the test site can query the main server for the test status of the mixing board based on the board number of the mixing board, whether it is untested, tested, or failed. If the test status of the mixing board is failed, the test site also needs to query the main server for the historical test status of the mixing board.

[0134] Step 3: Query the test item results.

[0135] When the test status of the mixer board is test failure, after querying the historical test site of the mixer board, the test site can query the historical test site for the test time of the mixer board at the historical test site and the test result of each test item.

[0136] Step 4: Determine the target test items.

[0137] When determining the target test items of the mixer board, it is necessary to select the target test items through different strategies based on the test phase and test status of the mixer board and whether the mixer board is under maintenance and repair. Therefore, step 4 may specifically include the following four different situations of steps 401 to 404:

[0138] Step 401: When the test site inquires that the mixer board is in the insertion loss test phase and the test status is untested, all test items in the insertion loss test phase need to be determined as target test items.

[0139] As an example, the testing method provided in the embodiment of the present invention can be specifically applied to automated testing software. Figure 3 is a schematic diagram of a first interface of the automated testing software provided by an embodiment of the present invention. In step 401, the following can be automatically generated: Figure 3 The test item selection interface shown. Figure 3 The test items of the mixer board in the insertion loss test phase are specifically illustrated, wherein the insertion loss tests for the working frequency bands 900M, 1800M, FA band, N78 band, E band, LO band and N41 band are specifically shown, and the tests for each working frequency band specifically include test items for multiple channels of PathNo 1-10 (channels 1-10), see Figure 3 , all test items in the insertion loss test phase are checked and selected, that is, all test items in the insertion loss test phase are determined as target test items that need to be tested.

[0140] After determining the target test items, the test site will execute all test items in the insertion loss test phase for the mixer board, and will not execute the test items in the index test phase. After executing the test, the test site can update the test status recorded in the main server for the board number of the mixer board according to the test results, and update the test status to test completion or test failure.

[0141] In practical applications, after automatically determining the target test items, the following Figure 3 After the test item selection interface is displayed, the relevant responsible personnel can also adjust the selection of test items according to actual needs and then execute the test. Figure 3The test item selection interface also includes the options of "Clear Status", "Select All" and "Unselect All". Therefore, after the target test items are automatically generated, the relevant responsible personnel can check the test items in the test item selection interface, or adjust the test items based on the options of "Clear Status", "Select All" and "Unselect All", and confirm the adjustments to the test items through the "Confirm" option.

[0142] Step 402: When the test site inquires that the mixer board is in the insertion loss test phase and the test status is test failure, it is necessary to determine the target test item according to the test time of the mixer board at the historical test site.

[0143] In step 402, if the test time of the mixer board at the historical test site is greater than the preset time difference from the current time, it is considered that the mixer board is under maintenance, that is, under repair and retesting, and all test items in the insertion loss test phase can be determined as target test items. Specifically, the following can be generated: Figure 3 If the test time of the mixer board at the historical test site does not exceed the preset time difference from the current time, that is, the retest is not repaired, the test items that did not pass the insertion loss test phase can be determined as the target test items. At this time, the following can be generated Figure 4 The test item selection interface shown, in which only the test items that have not passed the test are automatically selected.

[0144] After the target test items are determined, the test site only needs to perform the determined target test items on the mixer board. Figure 4 For example, the target test items that failed the test only include the test items for channels 2, 4, and 9 in the working frequency band 900M, the test items for channel 2 in the working frequency band FA, and the test items for channel 7 in the working frequency band N78. Therefore, when testing the mixer board, the remaining test items can be skipped. After executing the test, the test site can update the test status stored in the main server for the mixer board according to the test results.

[0145] Step 403: When the test site finds that the mixer board is in the insertion loss test phase and the test status is test completed, it is necessary to execute the next test phase, ie, the index test phase, and all test items in the index test phase need to be determined as target test items.

[0146] After executing the test for the mixer board, the test site may update the test phase recorded by the master server for the mixer board as the indicator test phase.

[0147] Step 404: When the test site inquires that the mixer board is in the index test stage and the test status is test failure, it is necessary to determine the target test item according to the test time of the mixer board at the historical test site.

[0148] If the time difference between the mixer board's test at the historical test site and the current time does not exceed the preset time difference, it is considered that the mixer board has not been repaired, and the test items that have not passed the test in the indicator test phase can be determined as target test items. As an example, the following can be generated at this time: Figure 5 The test item selection interface shown in the figure specifically shows the index tests for the working frequency bands 900M, 1800M, FA band, N78 band, E band, LO band and N41 band, and the tests for each working frequency band specifically include test items for multiple channels of PathNo 1-10. Figure 5 , where only the test items that failed the test in the indicator test phase are selected. It can be seen that the test items that failed the test only include the test items for channels 1 and 6 in the working frequency band 1800M, the test items for channels 2 and 9 in the working frequency band FA, the test items for channel 2 in the working frequency band N78, and the test items for channel 5 in the working frequency band E. Therefore, when testing the mixer board, the remaining test items can be skipped and only the test items for specific channels in the above working frequency bands 1800M, FA, N78 and E are executed.

[0149] If the time difference between the mixer board's test at the historical test site and the current time exceeds the preset time difference, it is considered that the mixer board is under maintenance and all test items in the indicator test phase need to be determined as target test items. Figure 5 All test items shown in are selected.

[0150] After executing the test, the test site can update the test status recorded for the mixer board in the main server according to the test results.

[0151] Based on the above process, it is possible to accurately determine the target test items during the production test of the mixing board, avoiding the problems of complex operation and easy errors when manually determining the test items.

[0152] Based on the same inventive concept, the embodiment of the present invention further provides a testing system, see Figure 1 , the test system provided by the embodiment of the present invention includes a main server and a plurality of test sites respectively connected to the main server;

[0153] The main server is used to store the correspondence between the device identification of the device under test and the site identification of the test site used to test the device under test;

[0154] A test site is used to respond to a test request for a device under test, query the main server for a historical test site of the device under test based on the device identification of the device under test, and query the historical test site for the test record of the device under test, and determine a target test item to be tested based on the test record; the test record includes the test items executed by the device under test at the historical test site and the test result of each test item, the test result indicates whether the test item is passed, and the target test item is a test item that has not passed the test.

[0155] Specifically, the test system provided by the embodiment of the present invention can also be understood as a distributed data storage system, and the main server can store the corresponding relationship between the device identification of each device under test and the site identification of the test site used to test the device under test. As an example, if the test site numbered 1 is used to test the device under test numbered 1, then the main server can store "device under test 1: test site 1".

[0156] The test site itself can also be understood as a data block storage server, which can specifically store the test records of the device under test tested at this test site.

[0157] As an example, each test site can access the main server through a router, as shown in the following example: Figure 6 shown.

[0158] In an embodiment of the present invention, after receiving a test request stored for the device under test, the test site can query the main server for historical test records of the device under test based on the device identification of the device under test, and query the historical test site for test records of the device under test, and determine the target test items to be tested based on the test records. This process can refer to the contents of any of the aforementioned method embodiments and will not be repeated here.

[0159] The test system provided by the embodiment of the present invention includes a main server and multiple test sites respectively connected to the main server. Therefore, after the test site used to test the device to be tested is changed, there is no need to manually determine the test items that need to be tested. Instead, the current test site can query the main server for the historical test sites of the device to be tested based on the device identification of the device to be tested, and query the historical test site for the test records of the device to be tested, and determine the target test items to be tested based on the test records, so that the test items that have passed the test can be automatically skipped, and the test items that have failed the test can be accurately determined, which can improve the test efficiency and avoid the problems of manual determination of test items that are prone to errors and complex operations.

[0160] In one embodiment of the present invention, the main server is further used to store the test phase of the device under test and the test status of the test phase;

[0161] The test site is also used to query the test phase of the device under test and the test status of the test phase from the main service based on the device identification of the device under test; the test status includes untested, test failed and test completed;

[0162] When the test status is untested, all test items of the current test phase of the device under test are determined as target test items;

[0163] When the test status is test completion, all test items of the next test phase of the device under test are determined as target test items;

[0164] When the test status is test failure, query the historical test site of the device under test from the main server, query the test record of the device under test from the historical test site, and determine the target test item to be tested based on the test record.

[0165] In one embodiment of the present invention, when the test site performs the step of determining the target test item to be tested based on the test record, it is specifically used to:

[0166] Obtaining maintenance status confirmation information pre-recorded for the device under test, the maintenance status confirmation information indicating whether the device under test has been repaired;

[0167] If yes, all test items in the current test phase are determined as target test items;

[0168] If not, based on the test records, the test items that have not passed the test in the current test phase are determined as target test items.

[0169] In one embodiment of the present invention, the test site is further used to store the test time of the device under test;

[0170] When the test site performs the steps of obtaining pre-recorded maintenance status confirmation information for the equipment under test, specifically for:

[0171] Query the historical test site for the test time of the device under test at the historical test site, and determine the maintenance status confirmation information based on the time difference between the test time and the current time;

[0172] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0173] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0174] In one embodiment of the present invention, the test site is further used to, after executing the test of the target test item on the device under test, update the test phase, test status and / or test record of the device under test according to the test result, and report to the main server.

[0175] In one embodiment of the present invention, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0176] Based on the same inventive concept, an embodiment of the present invention further provides a test device, which is applied to a test site in a test system. The test system includes a main server and a plurality of test sites respectively connected to the main server. Figure 7 , the device comprises:

[0177] A query module 701 is used to query the historical test sites of the device under test from the main server based on the device identification of the device under test in response to a test request for the device under test;

[0178] Determination module 702 is used to query the test records of the device to be tested from the historical test site, and determine the target test items to be tested based on the test records; the test records include the test items executed by the device to be tested at the historical test site and the test results of each test item, the test results represent whether the test items are passed, and the target test items are the test items that have not passed the test.

[0179] The test device provided by the embodiment of the present invention is specifically applied to a test system, which includes a main server and multiple test sites respectively connected to the main server. Therefore, after the test site used to test the device to be tested is changed, there is no need to manually determine the test items that need to be tested. Instead, the current test site can query the main server for the historical test sites of the device to be tested based on the device identification of the device to be tested, and query the historical test site for the test records of the device to be tested, and determine the target test items to be tested based on the test records, so that the test items that have passed the test can be automatically skipped, and the test items that have failed the test can be accurately determined, which can improve the test efficiency and avoid the problems of manual determination of test items that are prone to errors and complex operations.

[0180] In one embodiment of the present invention, the device further comprises:

[0181] A test status query module is used to query the test phase of the device under test and the test status of the test phase from the main service based on the device identification of the device under test; the test status includes untested, test failed and test completed;

[0182] Determination module 702 is also used to determine all test items of the current test phase of the device under test as target test items when the test status is untested; when the test status is test completed, determine all test items of the next test phase of the device under test as target test items; when the test status is test failure, query the historical test site of the device under test from the main server, query the test record of the device under test from the historical test site, and determine the target test item to be tested based on the test record.

[0183] In one embodiment of the present invention, the determination module 702 is specifically used to obtain maintenance status confirmation information pre-recorded for the device under test, where the maintenance status confirmation information indicates whether the device under test has been repaired;

[0184] If yes, all test items in the current test phase are determined as target test items;

[0185] If not, based on the test records, the test items that have not passed the test in the current test phase are determined as target test items.

[0186] In one embodiment of the present invention, the determination module 702 includes:

[0187] A maintenance status confirmation unit, used to query the historical test site for the test time of the device under test at the historical test site, and determine the maintenance status confirmation information based on the time difference between the test time and the current time;

[0188] When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired;

[0189] When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

[0190] In one embodiment of the present invention, the device further comprises:

[0191] The reporting module is used to update the test phase, test status and / or test record of the device under test according to the test result after executing the test of the target test item on the device under test, and report it to the main server.

[0192] In one embodiment of the present invention, the device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test results of each test item.

[0193] The embodiment of the present invention further provides an electronic device, such as Figure 8 As shown, it includes a processor 801, a communication interface 802, a memory 803 and a communication bus 804, wherein the processor 801, the communication interface 802, and the memory 803 communicate with each other through the communication bus 804.

[0194] Memory 803, used for storing computer programs;

[0195] The processor 801 is used to execute the program stored in the memory 803, and implements the following steps:

[0196] In response to a test request for the device under test, querying a historical test site of the device under test from a main server based on a device identifier of the device under test;

[0197] The test records of the device under test are queried from the historical test site, and the target test items to be tested are determined based on the test records; the test records include the test items executed by the device under test at the historical test site and the test results of each test item, the test results indicate whether the test items have passed the test, and the target test items are the test items that have not passed the test.

[0198] The communication bus mentioned in the above electronic device can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The communication bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is used in the figure, but it does not mean that there is only one bus or one type of bus.

[0199] The communication interface is used for communication between the above electronic device and other devices.

[0200] The memory may include a random access memory (RAM) or a non-volatile memory (NVM), such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0201] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0202] In another embodiment of the present invention, a computer-readable storage medium is provided, in which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned testing methods are implemented.

[0203] In another embodiment of the present invention, a computer program product including instructions is provided, which, when executed on a computer, enables the computer to execute any one of the test methods in the above embodiments.

[0204] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present invention is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state hard disk Solid State Disk (SSD)), etc.

[0205] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0206] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the system embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0207] The above description is only a preferred embodiment of the present invention and is not intended to limit the protection scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention are included in the protection scope of the present invention.

Claims

1. A testing method, characterized in that: Applied to a test site in a test system, the test system comprising a main server and a plurality of test sites respectively connected to the main server, the method comprising: In response to a test request for the device under test, querying a historical test site of the device under test from the main server based on a device identification of the device under test; The test record of the device under test is queried from the historical test site, and the target test items to be tested are determined based on the test records; the test records include the test items executed by the device under test at the historical test site and the test results of each of the test items, the test results indicate whether the test items have passed the test, and the target test items are the test items that have not passed the test.

2. The method according to claim 1, characterized in that Before querying the historical test sites of the device under test from the main server based on the device identification of the device under test, the method further includes: Based on the device identification of the device under test, query the test phase of the device under test and the test status of the test phase from the main service; the test status includes untested, test failed and test completed; When the test status is untested, all test items of the current test phase of the device under test are determined as the target test items; When the test status is test completion, all test items of the next test phase of the device under test are determined as the target test items; When the test status is test failure, the steps of querying the historical test site of the device under test from the main server, querying the test record of the device under test from the historical test site, and determining the target test item to be tested based on the test record are executed.

3. The method according to claim 2, characterized in that The step of determining a target test item to be tested based on the test record comprises: Acquire maintenance status confirmation information pre-recorded for the device under test, wherein the maintenance status confirmation information indicates whether the device under test has been repaired; If yes, all test items in the current test phase are determined as the target test items; If not, based on the test record, the test items that have not passed the test in the current test phase are determined as the target test items.

4. The method according to claim 3, characterized in that: The step of obtaining maintenance status confirmation information pre-recorded for the device under test includes: querying the historical test site for the test time of the device under test at the historical test site, and determining the maintenance status confirmation information based on the time difference between the test time and the current time; When the time difference is not less than the preset time difference, it indicates that the device under test has been repaired; When the time difference is less than the preset time difference, it indicates that the device under test has not been repaired.

5. The method according to claim 2, characterized in that: The method further comprises: After the test of the target test item is executed on the device under test, the test phase, test status and / or test record of the device under test is updated according to the test result, and reported to the main server.

6. The method according to any one of claims 2 to 5, characterized in that: The device under test is a mixing board, the test phase includes an insertion loss test phase and an index test phase, and the test record includes test items performed on multiple channels and multiple working frequency bands of the device under test in each test phase and the test result of each test item.

7. A testing system, characterized in that: It includes a main server and a plurality of test sites respectively connected to the main server; The main server is used to store the correspondence between the device identification of the device under test and the site identification of the test site used to test the device under test; The test site is used to respond to a test request for the device under test, query the main server for a historical test site of the device under test based on the device identification of the device under test, query the historical test site for a test record of the device under test, and determine a target test item to be tested based on the test record; The test record includes the test items executed by the device under test at the historical test site and the test result of each test item, wherein the test result indicates whether the test item passes, and the target test item is a test item that has not passed the test.

8. A test device, applied to a test site in a test system, the test system comprising a main server and a plurality of test sites respectively connected to the main server, comprising: A query module, configured to query a historical test site of the device under test from the main server based on a device identifier of the device under test in response to a test request for the device under test; A determination module, configured to query the historical test site for the test record of the device to be tested, and determine a target test item to be tested based on the test record; The test record includes the test items executed by the device under test at the historical test site and the test result of each test item, wherein the test result indicates whether the test item passes, and the target test item is a test item that has not passed the test.

9. An electronic device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; Memory, used to store computer programs; A processor, for implementing the method steps described in any one of claims 1 to 6 when executing a program stored in a memory.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method steps described in any one of claims 1 to 6 are implemented.

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