Integrated circuit chip testing tool

Abstract

The invention relates to the technical field of integrated circuit chip testing, and specifically to an integrated circuit chip testing tool, comprising a test seat, wherein a test device for a multi-axis vibration detection board and a chip is installed on the upper end of the test seat, and a protective device for installing the chip and preventing the chip from loosening is installed on the test device; the invention is used for performing a vibration test on the chip, and the invention can ensure that the chip is fully inserted into the test board, thereby ensuring electrical contact between the chip and the test board, and increasing the accuracy of the chip vibration detection result; the invention can fix the chip inserted into the test board, thereby preventing the chip from loosening and falling off when the chip is subjected to a vibration test, and increasing the vibration detection efficiency of the chip; at the same time, the invention can also perform a multi-axis vibration detection on the chip, simulating the vibration condition of the chip in actual use, and thereby more comprehensively evaluating the performance and reliability of the chip in actual use.

Description

Technical Field

[0001] The invention relates to the technical field of integrated circuit chip testing, in particular to an integrated circuit chip testing tool. Background Art

[0002] An integrated circuit chip (hereinafter referred to as chip) is a miniature electronic device that integrates a large number of electronic components such as transistors, resistors, capacitors and the connecting lines between them on a very small piece of semiconductor material. It is widely used in computers, communication equipment, automotive electronics and other fields. The main structure of the chip is usually packaged into a square structure, and its main structure has multiple pins for connecting to external circuits.

[0003] Since chips are usually exposed to vibration when being transported, used or installed, it is usually necessary to perform power-on vibration testing on the chips to ensure their performance and reliability during use. In the current power-on performance testing of chips, the chips are usually first manually mounted on a test board, and then the test board and a monitoring instrument are connected. The test board with the chip mounted is then fixed on a vibration table, and the test table is started to perform power-on vibration testing on the chip. Finally, the electrical parameter changes of the chip on the monitoring instrument and whether there is physical damage on the chip surface are observed to determine whether the chip performance is qualified.

[0004] The following problems exist in the current power-on vibration detection of chips: 1. When the integrated circuit chip is installed on the test board, the chip may not be properly inserted, resulting in poor electrical contact between the chip and the test board, which in turn reduces the accuracy of the chip vibration detection results; 2. When the chip and the test board are vibrated, the chip may become loose or even fall off in a vibrating environment, requiring the vibration table to be shut down and the chip to be reinserted into the test board, which affects the vibration detection efficiency of the chip. Summary of the invention

[0005] In order to solve the above technical problems, the present invention adopts the following technical scheme: an integrated circuit chip testing tool, including a test seat, a test device for a multi-axis vibration detection board and a chip is installed on the upper end of the test seat, and a protective device for installing the chip and preventing the chip from loosening is installed on the test device; the test device includes a vibration plate distributed in the middle above the test seat, and two groups of vibration rods with elastic telescopic structures arranged symmetrically on the lower end of the vibration plate are installed for sliding left and right through connecting springs, each group of vibration rods includes a plurality of vibration rods evenly arranged front and back, and the lower end of the vibration rod is fixedly connected to the test seat, and a clamping mechanism for clamping the test plate and driving the test plate to rotate is installed on the upper end of the vibration plate; a clamping mechanism for clamping the test plate and driving the test plate to rotate is installed in the middle of the upper end of the test seat. A vibration unit drives the vibration plate to vibrate up and down, and two matching units arranged symmetrically on the upper end of the test seat are installed, and the matching units are used to make the vibration plate vibrate up and down and left and right at the same time; the protective device includes a top plate fixedly installed on the upper end of the clamping mechanism by a plurality of fixing rods, an electric push rod is fixedly installed on the middle part of the lower end of the top plate, a transmission plate is fixedly installed on the lower end of the electric push rod, and two downward pressure spring rods arranged symmetrically on the lower end of the transmission plate are installed for sliding up and down, and a protective plate is installed on the lower ends of the two downward pressure spring rods for sliding left and right together, a kneading unit is connected between the transmission plate and the protective plate, and the kneading unit is used to apply an elastic force for moving left and right to the protective plate, and a locking unit for locking the position of the downward pressure spring rod is installed on the front side of the lower end of the top plate.

[0006] Preferably, the kneading unit includes a toggle plate slidably installed on the left and right ends of the transmission plate, and the two toggle plates are both arranged as an arc structure on the back side, a return spring is connected between the toggle plate and the transmission plate, a connecting plate with a telescopic structure is fixedly installed at the lower end of the toggle plate, and the lower end of the connecting plate is slidably connected to the protective plate left and right, and a buffer spring is connected between the left and right ends of the connecting plate and the protective plate.

[0007] Preferably, two square plates arranged symmetrically on the left and right are fixedly installed at the lower end of the top plate, the lower ends of the opposite sides of the two square plates are set to a corrugated structure, and the corrugated structures of the two square plates are arranged alternately, and the back sides of the two toggle plates are set in contact with their corresponding square plates, and the corrugated structure of the square plate is used to drive the toggle plate to move left and right.

[0008] Preferably, the locking unit includes an adjustment plate distributed on the front side below the top plate, two vertical plates symmetrically arranged on the left and right are fixedly installed on the lower end of the adjustment plate, a trapezoidal plate is fixedly installed on the lower rear end of the vertical plate, and the inclined surface of the trapezoidal plate is arranged on the rear side of the upper end.

[0009] Preferably, the upper end of the adjustment plate is slidably connected to the top plate via two guide rods symmetrically arranged left and right, an adjustment screw is rotatably installed in the middle of the upper end of the adjustment plate, and the upper end of the adjustment screw passes through the top plate and is connected to the top plate by threaded fitting.

[0010] Preferably, a plurality of locking holes evenly arranged up and down are opened on the front side of the downward pressure spring rod, and a locking spring rod is slidably installed at the front end of the transmission plate corresponding to the position of the downward pressure spring rod, and the locking hole is used to cooperate with the locking spring rod to lock the downward pressure spring rod, and the front end of the locking spring rod slides back and forth through the transmission plate and is set to a spherical structure, and the front end of the locking spring rod is in contact with the rear side of the vertical plate.

[0011] Preferably, two clamping plates arranged on opposite sides are slidably mounted on the lower end of the protective plate, and a top extension spring is connected between the clamping plate and the protective plate. The lower ends of the opposite sides of the two clamping plates are both set as inclined surfaces.

[0012] Preferably, the clamping mechanism includes a rotating column rotatably installed in the middle of the upper end of the vibration plate, the lower end of the rotating column is connected to the output shaft of the No. 1 motor fixedly installed in the vibration plate, the upper end of the rotating column is fixedly installed with a rotating plate, the upper end of the rotating plate is fixedly connected to the fixed rod, and the upper end of the rotating plate is slidably installed with two left and right symmetrically arranged clamping plates, both clamping plates are jointly installed with a synchronous screw by threaded cooperation, and the synchronous screw and the rotating plate are rotatably connected, and the right end of the synchronous screw is fixedly connected to the output shaft of the No. 2 motor fixedly installed in the rotating plate.

[0013] Preferably, the vibration unit includes a corrugated plate slidably installed in the middle of the upper end of the test seat, a reciprocating screw is installed on the corrugated plate by threaded fitting, and the reciprocating screw and the test seat are rotatably connected, the front end of the reciprocating screw is fixedly connected to the output shaft of the No. 3 motor fixedly installed in the test seat, and a matching plate is fixedly installed in the middle of the lower end of the vibration plate, the lower end of the matching plate is set to an arc structure and is in contact with the corrugated plate, and the corrugated plate is used to cooperate with the matching plate to drive the vibration plate to vibrate up and down.

[0014] Preferably, the mating unit includes two fixed plates fixedly mounted on the upper end of the test seat and arranged symmetrically on the left and right, a plurality of mating blocks evenly arranged up and down are fixedly mounted on the upper ends of the opposite sides of the two fixed plates, and the mating blocks corresponding to the two fixed plates are staggered left and right, and the upper and lower ends of the mating blocks away from the fixed plates are both set as inclined surfaces, and the left and right ends of the vibration plate are both installed with driven plates for cooperating with the inclined surfaces of the mating blocks to drive the vibration plate to move left and right.

[0015] The beneficial effects of the present invention are: 1. The present invention inserts the chip downward into the test board by setting a protective plate, and at the same time, the present invention applies an elastic force to move left and right to the protective plate by setting a kneading unit, so that after the protective plate inserts the chip into the test board, the protective plate can slightly knead the chip left and right to ensure that the chip can be fully inserted into the test board, thereby ensuring the accuracy of the chip vibration detection result.

[0016] 2. The present invention applies a downward elastic force to the protective plate by setting a downward spring rod, thereby further ensuring that the protective plate can insert the chip into the test board. At the same time, the present invention locks the position of the downward spring rod by setting a locking unit, so that the protective plate can rigidly fit on the upper end of the chip, thereby fixing the chip and preventing the chip from loosening and falling off during vibration detection, thereby improving the vibration detection efficiency of the chip.

[0017] 3. The present invention drives the vibration plate to vibrate up and down by setting a vibration unit. At the same time, the present invention sets a matching unit to enable the vibration plate to vibrate up and down and left and right at the same time. Then, the vibration plate drives the test plate and the chip to vibrate up and down and left and right at the same time through the rotating plate. The rotating plate is driven to rotate by controlling motor No. 1, so that the rotating plate drives the test plate and the chip to rotate, thereby realizing multi-axis vibration detection of the chip, and thus being able to more comprehensively evaluate the performance and reliability of the chip in actual use. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The present invention is further described below in conjunction with the accompanying drawings and embodiments.

[0019] Figure 1 It is a three-dimensional structural schematic diagram of the present invention.

[0020] Figure 2 It is a schematic diagram of the three-dimensional structure of the test device after a part of the test seat is cut away.

[0021] Figure 3 It is a front view of the test socket and the test device of the present invention.

[0022] Figure 4 It is a three-dimensional structural schematic diagram of a partial structure of the testing device after a portion of the vibration plate is cut away in the present invention.

[0023] Figure 5 It is a three-dimensional structural schematic diagram of the protective device of the present invention.

[0024] Figure 6 It is a front view of the partial structure of the protection device after the transmission plate and the protection plate are partially cut away.

[0025] Figure 7 It is a cross-sectional view of the protection device of the present invention.

[0026] Figure numerals: 1. test seat; 11. matching unit; 111. fixed plate; 112. matching block; 12. vibration unit; 121. corrugated plate; 122. reciprocating screw; 123. No. 3 motor; 2. test device; 21. vibration plate; 211. matching plate; 212. driven plate; 22. connecting spring; 23. vibration rod; 24. clamping mechanism; 241. rotating column; 242. No. 1 motor; 243. rotating plate; 244. clamping plate; 245. synchronous screw; 246. No. 2 motor; 3. protective device 31. top plate; 311. square plate; 32. electric push rod; 33. transmission plate; 331. locking spring rod; 34. pressing spring rod; 341. locking hole; 35. protective plate; 351. clamping plate; 352. extension spring; 36. kneading unit; 361. toggle plate; 362. return spring; 363. connecting plate; 364. buffer spring; 37. locking unit; 371. adjusting plate; 372. vertical plate; 373. trapezoidal plate; 374. guide rod; 375. adjusting screw; 38. fixing rod. DETAILED DESCRIPTION

[0027] The embodiments described below are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention. If no specific techniques or conditions are specified in the embodiments, the techniques or conditions described in the literature in the art or the product instructions shall be followed.

[0028] See also Figure 1 An integrated circuit chip testing tool comprises a test seat 1, a test device 2 for a multi-axis vibration detection plate and a chip is installed on the upper end of the test seat 1, and a protective device 3 for installing the chip and preventing the chip from loosening is installed on the test device 2.

[0029] The present invention is used to perform vibration test on a chip. The present invention can ensure that the chip is fully inserted into a test board, thereby increasing the accuracy of the vibration detection result of the chip. The present invention can fix the chip inserted into the test board, thereby preventing the chip from loosening and falling off when the chip is subjected to vibration test, thereby increasing the vibration detection efficiency of the chip. At the same time, the present invention can also perform multi-axis vibration detection on the chip, thereby more comprehensively evaluating the performance and reliability of the chip in actual use.

[0030] Specifically, first install the test board on the test device 2, and connect the wires of the test board and the external monitoring instrument, and install the chip on the protective device 3, then control the protective device 3 to insert the chip into the test board, and the protective device 3 can slightly rub the chip left and right to ensure that the chip is completely inserted into the test board. At the same time, after the protective device 3 inserts the chip into the test board, the protective device 3 can press against the upper side of the chip and fix the position of the chip. Then control the test device 2 to perform multi-axis vibration on the test board and the chip, and observe the changes in the electrical parameters of the chip on the monitoring instrument to determine whether the chip is qualified. Finally, remove the chip from the protective device 3, remove the test board from the test device 2, and check whether there is physical damage on the surface of the chip. If there is physical damage on the surface of the chip, the test result is unqualified. Otherwise, the chip detection result is determined based on the changes in the electrical parameters of the chip on the monitoring instrument.

[0031] See also Figure 1 and Figure 2 The test device 2 includes a vibration plate 21 distributed in the middle of the upper part of the test seat 1. The lower end of the vibration plate 21 is slidably installed with two groups of vibration rods 23 with elastic telescopic structures arranged left and right through the connecting spring 22. Each group of vibration rods 23 includes a plurality of vibration rods 23 evenly arranged front and back, and the lower end of the vibration rod 23 is fixedly connected to the test seat 1. The upper end of the vibration plate 21 is installed with a clamping mechanism 24 for clamping the test plate and driving the test plate to rotate; a vibration unit 12 for driving the vibration plate 21 to vibrate up and down is installed in the middle of the upper end of the test seat 1, and two left-right symmetrically arranged matching units 11 are installed on the upper end of the test seat 1. The matching unit 11 is used to make the vibration plate 21 vibrate up and down and vibrate left and right at the same time.

[0032] The test device 2 is used for multi-axis vibration test plates and chips; specifically, the test plate is first installed on the clamping mechanism 24, and the installation position of the chip on the test plate is aligned with the front and back center of the clamping mechanism 24, and then the clamping mechanism 24 is controlled to clamp and fix the test plate. After the test plate and the wires of the external detection instrument are connected, the protection device 3 is controlled to insert the chip into the test plate, and then the vibration unit 12 is started to drive the vibration plate 21 to vibrate up and down under the action of the elastic telescopic structure of the vibration rod 23. At the same time, the matching unit 11 can drive the vibration plate 21 to vibrate left and right under the action of the connecting spring 22, and by controlling the clamping mechanism 24, the vibration plate 21 can be driven to vibrate left and right under the action of the connecting spring 22. The mechanism 24 drives the test plate and the chip to rotate, so that the vibration plate 21 drives the test plate and the chip to vibrate in multiple axes through the clamping mechanism 24, thereby being able to more comprehensively evaluate the performance and reliability of the chip in actual use, and to judge whether the chip is qualified by observing the changes in the electrical parameters of the chip on the detection instrument. Finally, the chip is removed from the protective device 3, the test plate is removed from the clamping mechanism 24, and the surface of the chip is checked for physical damage. If the surface of the chip is physically damaged, the test result is unqualified. Otherwise, the chip detection result is judged whether it is qualified in combination with the changes in the electrical parameters of the chip on the monitoring instrument.

[0033] See also Figure 2 The vibration unit 12 includes a corrugated plate 121 which is slidably installed in the middle of the upper end of the test seat 1. A reciprocating screw 122 is installed on the corrugated plate 121 by threaded cooperation, and the reciprocating screw 122 is rotatably connected to the test seat 1. The front end of the reciprocating screw 122 is fixedly connected to the output shaft of the No. 3 motor 123 fixedly installed in the test seat 1. A matching plate 211 is fixedly installed in the middle of the lower end of the vibration plate 21. The lower end of the matching plate 211 is set as an arc structure and is in contact with the corrugated plate 121. The corrugated plate 121 is used to cooperate with the matching plate 211 to drive the vibration plate 21 to vibrate up and down.

[0034] The vibration unit 12 is used to drive the vibration plate 21 to vibrate up and down; specifically, start the No. 3 motor 123 to drive the reciprocating screw 122 to rotate rapidly, so that the reciprocating screw 122 drives the corrugated plate 121 to move back and forth rapidly through the thread, and at the same time, the vibration plate 21 drives the lower end of the matching plate 211 to always fit the upper end of the corrugated plate 121 under the elastic action of the vibration rod 23, so that the corrugated structure of the corrugated plate 121 and the matching plate 211 cooperate to drive the vibration plate 21 to vibrate up and down.

[0035] See also Figure 1 and Figure 3The matching unit 11 includes two fixed plates 111 fixedly installed on the upper end of the test seat 1 and arranged symmetrically on the left and right. A plurality of matching blocks 112 evenly arranged up and down are fixedly installed on the upper ends of the opposite sides of the two fixed plates 111, and the matching blocks 112 corresponding to the two fixed plates 111 are staggered left and right. The upper and lower ends of the matching blocks 112 away from the fixed plates 111 are both set to inclined surfaces. The left and right ends of the vibration plate 21 are both installed with driven plates 212 for matching with the inclined surfaces of the matching blocks 112 to drive the vibration plate 21 to move left and right.

[0036] The mating unit 11 is used to make the vibration plate 21 vibrate up and down and left and right at the same time; specifically, when the vibration plate 21 vibrates up and down, the vibration plate 21 drives the driven plate 212 to move up and down, and when the driven plate 212 moves to the corresponding position of the mating block 112, the driven plate 212 moves in the direction away from the mating block 112 under the action of the inclined surface of the mating block 112, and then the driven plate 212 drives the vibration plate 21 to move in the direction away from the mating block 112, and when the driven plate 212 and the mating block 112 are separated, the vibration plate 21 returns to its initial position under the action of the connecting spring 22, and at the same time, since there are multiple mating blocks 112, and the mating blocks 112 corresponding to the two fixed plates 111 arranged on the left and right are staggered on the left and right, the vibration plate 21 vibrates up and down and left and right at the same time.

[0037] See also Figure 1 , Figure 5 and Figure 7 The protective device 3 includes a top plate 31 fixedly mounted on the upper end of the clamping mechanism 24 through a plurality of fixing rods 38, an electric push rod 32 is fixedly mounted in the middle of the lower end of the top plate 31, a transmission plate 33 is fixedly mounted on the lower end of the electric push rod 32, and two downward pressure spring rods 34 symmetrically arranged are slidably mounted on the lower end of the transmission plate 33, and a protective plate 35 is slidably mounted on the lower ends of the two downward pressure spring rods 34, and a kneading unit 36 ​​is connected between the transmission plate 33 and the protective plate 35, and the kneading unit 36 ​​is used to apply an elastic force for the protective plate 35 to move left and right, and a locking unit 37 for locking the position of the downward pressure spring rod 34 is installed on the front side of the lower end of the top plate 31; two clamping plates 351 arranged on opposite sides are slidably mounted on the lower end of the protective plate 35, and a top extension spring 352 is connected between the clamping plate 351 and the protective plate 35, and the lower ends of the opposite sides of the two clamping plates 351 are both set as inclined surfaces.

[0038] See also Figure 4The clamping mechanism 24 includes a rotating column 241 rotatably installed in the middle of the upper end of the vibration plate 21, the lower end of the rotating column 241 is connected to the output shaft of the No. 1 motor 242 fixedly installed in the vibration plate 21, the upper end of the rotating column 241 is fixedly installed with a rotating plate 243, the upper end of the rotating plate 243 is fixedly connected to the fixed rod 38, and the upper end of the rotating plate 243 is slidably installed with two left and right symmetrically arranged clamping plates 244, both clamping plates 244 are jointly installed with a synchronous screw 245 by threaded cooperation, and the synchronous screw 245 is rotatably connected to the rotating plate 243, and the right end of the synchronous screw 245 is fixedly connected to the output shaft of the No. 2 motor 246 fixedly installed in the rotating plate 243.

[0039] The protective device 3 is used to install the chip on the test board and prevent the chip from loosening when it vibrates, and the clamping mechanism 24 is used to clamp and fix the test board; specifically, first place the test board between the two clamping plates 244, and align the installation position of the chip on the test board with the front and back center of the clamping plates 244, then control the second motor 246 to drive the synchronous screw 245 to rotate, so that the synchronous screw 245 drives the two clamping plates 244 to rotate, and then the two clamping plates 244 clamp and fix the test board, then according to the installation position of the chip on the test board, place the chip from the inclined surface of the two clamping plates 351 between the two clamping plates 351, so that the two clamping plates 351 clamp the chip front and back center under the action of the top spring 352, and then align the chip with the installation position of the chip on the test board, finally control the electric push rod 32 to finally drive the protective plate 35 to move downward through the transmission plate 33, so that the protective plate 35 drives the chip to move downward through the clamping plate 351 and insert it into the test board.

[0040] When the chip is inserted into the test board, the chip blocks the protective plate 35 from moving downward under the action of the test board, so that when the transmission plate 33 moves downward, the downward pressing spring rod 34 can be compressed, and the protective plate 35 applies a certain elastic force downward under the action of the downward pressing spring rod 34. When the chip is inserted into the test board, the kneading unit 36 ​​can apply a force to move left and right on the protective plate 35, so that the protective plate 35 can slightly knead the chip left and right, thereby ensuring that the chip can be fully inserted into the test board and increasing the accuracy of the test results. When the chip is fully inserted into the test board, the locking unit 37 can lock the position of the downward pressing spring rod 34, so that the protective plate 35 is rigidly attached to the upper end of the chip, so that the protective plate 35 can fix the chip, thereby preventing the chip from loosening when it vibrates.

[0041] When the vibration plate 21 vibrates up and down and left and right at the same time, the vibration plate 21 drives the rotating plate 243 to vibrate through the rotating column 241, so that the rotating plate 243 drives the test plate to vibrate, and at the same time, the rotating plate 243 finally drives the chip to vibrate through the fixed rod 38, so that the test plate and the chip vibrate at the same time, and the rotating column 241 is driven to rotate by controlling the No. 1 motor 242, so that the rotating column 241 drives the rotating plate 243 to rotate, and the rotating plate 243 can drive the test board to rotate, and at the same time, the rotating plate 243 finally drives the chip to rotate synchronously through the fixed rod 38, so that the rotating plate 243 drives the test board and the chip to rotate, thereby realizing multi-axis vibration of the chip. After the dynamic detection is completed, the No. 1 motor 242 is controlled to drive the rotating plate 243 to return to the initial position through the rotating column 241, and the No. 2 motor 246 is controlled to drive the two clamping plates 244 to move away from each other through the synchronous screw 245, so that the test plate can be taken out, and then the electric push rod 32 is controlled to finally return the chip upward to the initial position through the transmission plate 33, and the chip is manually taken out from the two clamping plates 351, and the chip surface is checked for physical damage. If the chip surface is physically damaged, the test result is unqualified. Otherwise, the chip detection result is judged whether it is qualified in combination with the changes in the electrical parameters of the chip on the monitoring instrument.

[0042] See also Figure 5 and Figure 6 The kneading unit 36 ​​includes a toggle plate 361 slidably installed on the left and right ends of the transmission plate 33, and the two toggle plates 361 are both set to an arc structure on the back side, a return spring 362 is connected between the toggle plate 361 and the transmission plate 33, a connecting plate 363 with a telescopic structure is fixedly installed at the lower end of the toggle plate 361, and the lower end of the connecting plate 363 is slidably connected to the protective plate 35 left and right, and a buffer spring 364 is connected between the left and right ends of the connecting plate 363 and the protective plate 35; two square plates 311 symmetrically arranged on the left and right are fixedly installed on the lower end of the top plate 31, the lower ends of the opposite sides of the two square plates 311 are set to a corrugated structure, and the corrugated structures of the two square plates 311 are staggered, and the back sides of the two toggle plates 361 are in contact with the corresponding square plates 311, and the corrugated structure of the square plate 311 is used to drive the toggle plate 361 to move left and right.

[0043] The kneading unit 36 ​​is used to drive the protective plate 35 to move left and right; specifically, when the chip is inserted into the test board and the electric push rod 32 drives the transmission plate 33 to continue to move downward, the toggle plate 361 moves to the corresponding position of the corrugated structure of the square plate 311, and then when the transmission plate 33 continues to move downward, the transmission plate 33 drives the toggle plate 361 to continue to move downward, and at the same time, the corrugated structures of the toggle plate 361 and the square plate 311 cooperate to move left and right, and the corrugated structures of the two square plates 311 are arranged in an alternating manner, so that the two toggle plates 361 can move left and right synchronously, and then the toggle plate 361 can apply an elastic force of moving left and right to the protective plate 35 through the buffer spring 364, so that the protective plate 35 can slightly knead the chip left and right, ensuring that the chip can be fully inserted into the test board, thereby increasing the accuracy of the test results.

[0044] See also Figure 1 and Figure 7 The locking unit 37 includes an adjustment plate 371 distributed on the front side below the top plate 31, two vertical plates 372 arranged symmetrically on the left and right are fixedly installed on the lower end of the adjustment plate 371, a trapezoidal plate 373 is fixedly installed on the lower end of the rear side of the vertical plate 372, and the inclined surface of the trapezoidal plate 373 is arranged on the rear side of the upper end; the upper end of the adjustment plate 371 is connected to the top plate 31 by two guide rods 374 arranged symmetrically on the left and right, and an adjustment screw 375 is rotatably installed in the middle of the upper end of the adjustment plate 371, and the upper end of the adjustment screw 375 passes through the top plate 31. The plate 31 is connected to the top plate 31 by threaded cooperation; a plurality of locking holes 341 evenly arranged up and down are opened on the front side of the downward pressure spring rod 34, and a locking spring rod 331 is installed to slide forward and backward at the position corresponding to the downward pressure spring rod 34 at the front end of the transmission plate 33, and the locking hole 341 is used to cooperate with the locking spring rod 331 to lock the downward pressure spring rod 34, and the front end of the locking spring rod 331 slides forward and backward through the transmission plate 33 and is set to a spherical structure, and the front end of the locking spring rod 331 is in contact with the rear side of the vertical plate 372.

[0045] The locking unit 37 is used to lock the position of the downward spring rod 34; specifically, first, the adjusting screw 375 is screwed according to the elastic force applied to the chip inserted into the test board as required, so that the adjusting screw 375 and the top plate 31 threadedly cooperate to drive the adjusting plate 371 to move downward, and the adjusting plate 371 moves vertically downward under the action of the guide rod 374, so that the adjusting plate 371 drives the vertical plate 372 to move downward, and when the electric push rod 32 drives the transmission plate 33 to continue to move downward and compress the downward spring rod 34 to a certain extent, at this time, the locking spring rod 331 can cooperate with the inclined surface of the trapezoidal plate 373 to move backward, and then the locking spring rod 331 moves backward and is inserted into the corresponding locking hole 341, so as to achieve the position locking of the downward spring rod 34, and then the protective plate 35 is rigidly fitted above the chip to fix the chip, thereby preventing the chip from falling off when the test board and the chip are vibrated.

[0046] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. An integrated circuit chip testing tool, comprising a test seat, a test device is installed on the upper end of the test seat, and the test device is used to perform multi-axis vibration on the test board and the chip, characterized in that: The testing device is provided with a protective device for mounting the chip and preventing the chip from loosening; The test device comprises a vibration plate distributed in the middle of the upper part of the test seat, and two groups of vibration rods with elastic telescopic structures arranged symmetrically are installed at the lower end of the vibration plate through a connecting spring for left and right sliding, each group of vibration rods comprises a plurality of vibration rods evenly arranged front and back, and the lower end of the vibration rod is fixedly connected to the test seat, and a clamping mechanism for clamping the test plate and driving the test plate to rotate is installed at the upper end of the vibration plate; A vibration unit for driving the vibration plate to vibrate up and down is installed in the middle of the upper end of the test seat, and two left-right symmetrically arranged matching units are installed on the upper end of the test seat, and the matching units are used to make the vibration plate vibrate up and down and left-right at the same time; The protective device comprises a top plate fixedly mounted on the upper end of the clamping mechanism by a plurality of fixing rods, an electric push rod fixedly mounted in the middle of the lower end of the top plate, a transmission plate fixedly mounted on the lower end of the electric push rod, two downward pressing spring rods symmetrically arranged on the lower end of the transmission plate are slidably mounted up and down, a protective plate is slidably mounted on the lower ends of the two downward pressing spring rods, a kneading unit is connected between the transmission plate and the protective plate, the kneading unit is used to apply an elastic force to the protective plate to move left and right, and a locking unit for locking the position of the downward pressing spring rod is mounted on the front side of the lower end of the top plate; The vibration unit includes a corrugated plate installed in the middle of the upper end of the test seat for sliding back and forth, a reciprocating screw is installed on the corrugated plate by threaded cooperation, and the reciprocating screw is rotatably connected to the test seat, the front end of the reciprocating screw is fixedly connected to the output shaft of the No. 3 motor fixedly installed in the test seat, a matching plate is fixedly installed in the middle of the lower end of the vibration plate, the lower end of the matching plate is set as an arc structure and is in contact with the corrugated plate, and the corrugated plate is used to cooperate with the matching plate to drive the vibration plate to vibrate up and down.

2. The integrated circuit chip testing tool according to claim 1, characterized in that: The kneading unit includes a toggle plate slidably installed at the left and right ends of the transmission plate, and the two toggle plates are both arranged in an arc structure on the back side, a return spring is connected between the toggle plate and the transmission plate, a connecting plate with a telescopic structure is fixedly installed at the lower end of the toggle plate, and the lower end of the connecting plate is slidably connected to the protective plate left and right, and a buffer spring is connected between the left and right ends of the connecting plate and the protective plate.

3. The integrated circuit chip testing tool according to claim 2, characterized in that: Two square plates arranged symmetrically on the left and right are fixedly installed at the lower end of the top plate, the lower ends of the opposite sides of the two square plates are set to a corrugated structure, and the corrugated structures of the two square plates are arranged alternately, and the back sides of the two toggle plates are contacted with their corresponding square plates, and the corrugated structure of the square plate is used to drive the toggle plate to move left and right.

4. The integrated circuit chip testing tool according to claim 1, characterized in that: The locking unit includes an adjustment plate distributed on the front side below the top plate, two vertical plates arranged symmetrically on the left and right are fixedly installed on the lower end of the adjustment plate, a trapezoidal plate is fixedly installed on the lower rear end of the vertical plate, and the inclined surface of the trapezoidal plate is arranged on the rear side of the upper end.

5. The integrated circuit chip testing tool according to claim 4, characterized in that: The upper end of the adjusting plate is connected to the top plate by sliding up and down through two guide rods arranged symmetrically on the left and right, an adjusting screw is rotatably installed in the middle of the upper end of the adjusting plate, and the upper end of the adjusting screw penetrates the top plate and is connected to the top plate by threaded engagement.

6. The integrated circuit chip testing tool according to claim 4, characterized in that: The front side of the downward pressure spring rod is provided with a plurality of locking holes evenly arranged up and down, and the front end of the transmission plate is provided with a locking spring rod that is slidably installed forward and backward at the position corresponding to the downward pressure spring rod, and the locking hole is used to cooperate with the locking spring rod to lock the downward pressure spring rod, and the front end of the locking spring rod slides forward and backward through the transmission plate and is arranged to be a spherical structure, and the front end of the locking spring rod is arranged in contact with the rear side of the vertical plate.

7. The integrated circuit chip testing tool according to claim 1, characterized in that: The lower end of the protective plate is slidably mounted with two clamping plates arranged on opposite sides. A top extension spring is connected between the clamping plate and the protective plate. The lower ends of the opposite sides of the two clamping plates are both arranged as inclined surfaces.

8. The integrated circuit chip testing tool according to claim 1, characterized in that: The clamping mechanism includes a rotating column rotatably installed in the middle of the upper end of the vibration plate, the lower end of the rotating column is connected to the output shaft of the No. 1 motor fixedly installed in the vibration plate, the upper end of the rotating column is fixedly installed with a rotating plate, the upper end of the rotating plate is fixedly connected to the fixed rod, and the upper end of the rotating plate is slidably installed with two left and right symmetrically arranged clamping plates, both clamping plates are jointly installed with a synchronous screw by means of threaded cooperation, and the synchronous screw and the rotating plate are rotatably connected, and the right end of the synchronous screw is fixedly connected to the output shaft of the No. 2 motor fixedly installed in the rotating plate.

9. The integrated circuit chip testing tool according to claim 1, characterized in that: The matching unit includes two fixed plates fixedly installed on the upper end of the test seat and arranged symmetrically on the left and right. A plurality of matching blocks evenly arranged up and down are fixedly installed on the upper ends of the opposite sides of the two fixed plates, and the matching blocks corresponding to the two fixed plates are staggered on the left and right. The upper and lower ends of the matching blocks away from the fixed plates are set to inclined surfaces. The left and right ends of the vibration plate are installed with driven plates for cooperating with the inclined surfaces of the matching blocks to drive the vibration plate to move left and right.

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