A method and device for determining the operating range of a crystal oscillator, electronic equipment and storage medium

Abstract

The application discloses a kind of crystal oscillator operating parameter executable range determination method, device, electronic equipment and storage medium, method includes: obtaining the rated range of the operating parameter to be tested and the rated frequency range of crystal oscillator, sends first adjustment signal, other operating parameters except the operating parameter to be tested are set as preset rated value;According to preset fixed interval, sampling is carried out from the rated range of the operating parameter to be tested, generate several target operating parameter values;Second adjustment signal is sent to crystal oscillator, so that crystal oscillator is tested according to each target operating parameter value, generates the test frequency of each target operating parameter value;The target operating parameter value that meets the rated frequency range in test frequency is added to effective operating parameter set;According to effective operating parameter set, the executable range of the operating parameter to be tested of crystal oscillator is generated. By implementing the application, the executable operating range of the operating parameter of crystal oscillator can be determined.

Description

Technical Field

[0001] The present invention relates to the technical field of crystal oscillators, and in particular to a method, device, electronic device and storage medium for determining the operational range of operating parameters of a crystal oscillator. Background Art

[0002] In power systems, grid frequency is a critical parameter for stable operation. Crystal oscillators are widely used in many measurement devices and control systems to provide high-precision frequency reference signals. In applications such as power monitoring equipment, frequency meters, and synchronous regulators, crystal oscillators provide the necessary reference signal for monitoring and regulating grid frequency. The output frequency of crystal oscillators must be extremely precise to ensure accurate monitoring of grid frequency.

[0003] When using a crystal oscillator, prior art typically focuses on its initial rated operating parameters, such as load capacitance and operating voltage. These parameters are precisely tested and calibrated during manufacturing and are usually clearly stated in the crystal oscillator's specification sheet. However, most prior art uses of crystal oscillators do not fully consider the aging of the crystal oscillator during long-term use. Crystal oscillator aging refers to the gradual decline in its frequency stability and operating performance over time, typically manifested as oscillation frequency drift and increased power consumption. This aging phenomenon may cause the operating parameter range of the crystal oscillator to change, making the originally calibrated operating range no longer applicable. In traditional applications, equipment often operates for a long time based on factory parameter settings and preset operating conditions, without adjusting for crystal oscillator aging. As a result, the actual operating state of the equipment may not match the initial rated operating range, causing the crystal oscillator frequency to deviate, and the power equipment cannot maintain a stable clock signal or frequency reference, which in turn affects the stability and reliability of the power system. Summary of the Invention

[0004] Embodiments of the present invention provide a method, apparatus, electronic device, and storage medium for determining the operable range of operating parameters of a crystal oscillator. By implementing the present invention, the aging effect of the crystal oscillator can be effectively considered to determine the operable range of the operating parameters of the crystal oscillator.

[0005] An embodiment of the present invention provides a method for determining an operating range of operating parameters of a crystal oscillator, comprising:

[0006] Obtain the rated range of the operating parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0007] sending a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal;

[0008] According to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values ​​and generate a number of target working parameter values;

[0009] sending a second adjustment signal to the crystal oscillator to cause the crystal oscillator to perform a test according to each target operating parameter value and generate a test frequency for each target operating parameter value;

[0010] Add the target operating parameter value that meets the rated frequency range in the test frequency to the valid operating parameter set;

[0011] According to the valid operating parameter set, an operable range of the operating parameters of the crystal oscillator to be tested is generated.

[0012] Furthermore, according to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated, including:

[0013] The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0014] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0015] Furthermore, the preset fixed interval is determined by:

[0016] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0017] Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0018] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0019] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0020] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0021] Furthermore, sending a second adjustment signal to the crystal oscillator to make the crystal oscillator perform a test according to each target operating parameter value and generate a test frequency of each target operating parameter value includes:

[0022] Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value:

[0023] Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the operating parameter to be tested to the current target operating parameter value and generates a test frequency of the current target operating parameter value;

[0024] A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

[0025] Furthermore, generating an operational range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set includes:

[0026] Extract the minimum and maximum values ​​from the valid working parameter set, use the minimum value as the lower limit of the operating range of the working parameter to be tested, and use the maximum value as the upper limit of the operating range of the working parameter to be tested to generate the operating range of the working parameter to be tested of the crystal oscillator.

[0027] Based on the above method embodiments, the present invention provides corresponding device embodiments.

[0028] An embodiment of the present invention provides a device for determining an operable range of operating parameters of a crystal oscillator, comprising: a data acquisition module, a parameter setting module, a sampling module, a testing module, and an operable range determination module.

[0029] The data acquisition module is used to obtain the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0030] The parameter setting module is configured to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal;

[0031] The sampling module is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values ​​and generate a plurality of target working parameter values;

[0032] The test module is configured to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0033] The operable range determination module is used to add the target operating parameter value that meets the rated frequency range in the test frequency to the valid operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator based on the valid operating parameter set.

[0034] Furthermore, the sampling module samples from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values, including:

[0035] The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0036] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0037] Furthermore, the preset fixed interval is determined by:

[0038] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0039] Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0040] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0041] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0042] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0043] Based on the above method embodiment, the present invention provides a corresponding electronic device embodiment.

[0044] An embodiment of the present invention provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the method for determining the operating range of the crystal oscillator operating parameters as described in any one of the above-mentioned method embodiments can be implemented.

[0045] Based on the above method embodiment, the present invention provides a corresponding storage medium embodiment.

[0046] An embodiment of the present invention provides a storage medium having a computer program stored thereon. When the computer program is executed by a processor, the method for determining the operating range of the crystal oscillator operating parameters described in any one of the above method embodiments can be implemented.

[0047] Compared with the prior art, the present invention has the following beneficial effects:

[0048] The embodiment of the present invention provides a method, device, electronic device and storage medium for determining the operable range of the operating parameters of a crystal oscillator. The method obtains the rated range of the operating parameter to be tested and the rated frequency range of the crystal oscillator, sets the other operating parameters except the operating parameter to be tested to preset rated values, ensures that only the operating parameter to be tested is tested in each test, and excludes the influence of other operating parameters on the test results. Sampling is performed at fixed intervals within the rated range of the operating parameter to be tested to generate a number of target parameter values. An adjustment signal is sent to test each target parameter value one by one, the test frequency is recorded, and the target operating parameter value whose test frequency meets the rated frequency range is added to the valid operating parameter set, thereby determining the operable range of the operating parameter to be tested. By sampling and testing the operating parameter to be tested, and adjusting the operable range of the operating parameter in combination with the frequency test results, the limitations of relying on the initial setting value of the crystal oscillator are avoided, changes caused by the aging effect are better coped with, and the reliability and stability of the crystal oscillator in long-term use are ensured, thereby ensuring the normal operation of the power system. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 The present invention is a flowchart of a method for determining an operating range of operating parameters of a crystal oscillator provided by an embodiment of the present invention.

[0050] Figure 2 The present invention is a schematic structural diagram of a device for determining an operating range of operating parameters of a crystal oscillator provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0051] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0052] like Figure 1 As shown, an embodiment of the present invention provides a method for determining the operating range of operating parameters of a crystal oscillator, which includes at least the following steps:

[0053] Step S1, obtaining the rated range of the operating parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0054] Alternatively, consult the oscillator's technical specifications or factory test report to obtain the rated range of the operating parameters to be tested in the crystal oscillator, as well as the rated frequency range of the crystal oscillator. In these documents, the manufacturer will list the rated values ​​and allowable tolerances for each operating parameter. For example, the rated value of the load capacitance is 20pF, and the allowable deviation range is ±2pF. Therefore, the rated range of the load capacitance is 18pF to 22pF. The technical specifications usually provide the rated frequency range of the crystal oscillator, such as 10MHz to 100MHz. This frequency range defines the stable frequency range that the crystal oscillator can output under normal operating conditions.

[0055] Step S2: sending a first adjustment signal to the crystal oscillator, so that after receiving the first adjustment signal, the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values;

[0056] For example, when the operating parameter to be tested is the load capacitance, it is necessary to set the other operating parameters except the load capacitance to preset rated values;

[0057] When the operating parameter to be tested is the operating voltage, other operating parameters except the operating voltage need to be set to the preset rated values;

[0058] It can be understood that by sending the first adjustment signal to the crystal oscillator, it can accurately adjust its own operating state after receiving the first adjustment signal, and set all other working parameters except the working parameters to be tested to their respective rated values, thereby ensuring that when testing the working parameters to be tested, the other working parameters of the crystal oscillator remain stable, avoiding mutual interference that may be caused by simultaneous changes in multiple working parameters, thereby providing a reliable experimental environment for accurate testing of the working parameters to be tested.

[0059] Step S3: sampling from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values ​​and generate a plurality of target working parameter values;

[0060] Specifically, in a preferred embodiment, sampling is performed from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values, and generate a plurality of target working parameter values, including:

[0061] The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0062] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0063] It can be understood that through this sampling method, it can be ensured that the generated target operating parameter values ​​accurately cover the entire rated range of the operating parameters to be tested, avoiding the omission of any key values ​​that may affect the performance of the crystal oscillator, and can effectively provide sufficient and representative operating parameters for subsequent tests.

[0064] In an optional embodiment, the preset fixed interval is determined by:

[0065] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0066] Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0067] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0068] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0069] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0070] For example, when the working parameter to be measured is the load capacitance, the allowable deviation value of the load capacitance of the crystal oscillator is 2pF, then the mantissa of the allowable deviation value is determined to be 2 and the order of magnitude is 0. If the order of magnitude of the allowable deviation value is reduced by 1 bit, the order of magnitude of the fixed interval is -1 and the mantissa of the fixed interval is 2. Therefore, the fixed interval can be determined to be 0.2pF.

[0071] When the working parameter to be measured is the working voltage, the allowable deviation value of the working voltage of the crystal oscillator is 0.04V, then the mantissa of the allowable deviation value is determined to be 4, and the order of magnitude is -2. If the order of magnitude of the allowable deviation value is reduced by 2 digits, the order of magnitude of the fixed interval is -4, and the mantissa of the fixed interval is 4, so it can be determined that the fixed interval is 0.0004V.

[0072] Understandably, when manufacturers set the tolerance range for crystal oscillators at the factory, they take the sensitivity of the operating parameters into consideration to ensure proper operation under various operating conditions. Operating parameter sensitivity refers to the degree to which a crystal oscillator's performance changes when operating parameters, such as output frequency, change. Different operating parameters have varying degrees of impact on a crystal oscillator. Some parameters, such as load capacitance, have a greater impact on the oscillator's frequency, while others, such as operating voltage, have a smaller impact. To ensure the stability and reliability of crystal oscillators in actual use, manufacturers set reasonable tolerance ranges based on the sensitivity of each operating parameter. If a parameter has a high sensitivity—meaning that even a small change in that parameter can cause significant fluctuations in oscillator performance—the manufacturer typically sets a smaller tolerance range for that parameter to ensure frequency stability. Therefore, when setting a fixed interval, for parameters with a significant impact on the crystal oscillator's frequency, a smaller sampling interval can be used to capture subtle trends in frequency changes. For parameters with less significant impact, a larger sampling interval can be selected to reduce testing workload.

[0073] Step S4: Sending a second adjustment signal to the crystal oscillator to enable the crystal oscillator to perform a test according to each target operating parameter value and generate a test frequency for each target operating parameter value;

[0074] Specifically, in a preferred embodiment, sending the second adjustment signal to the crystal oscillator so that the crystal oscillator performs a test according to each target operating parameter value and generates a test frequency for each target operating parameter value includes:

[0075] Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value:

[0076] Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the operating parameter to be tested to the current target operating parameter value and generates a test frequency of the current target operating parameter value;

[0077] A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

[0078] It can be understood that by sending a second adjustment signal to the crystal oscillator, it can adjust the current target operating parameter value one by one according to the pre-generated target operating parameter value, and perform a frequency test for each target value, record and generate corresponding test frequency data, so that the crystal oscillator can adjust and stabilize the target parameter point by point, ensuring that the actual operating conditions are consistent with the target operating parameter value, thereby obtaining accurate frequency test results.

[0079] Step S5: adding the target operating parameter values ​​that meet the rated frequency range in the test frequency to the valid operating parameter set;

[0080] During the test, the test frequency of the current operating parameters is compared with the rated frequency range of the crystal oscillator. Only those target operating parameter values ​​that meet the rated frequency range are considered valid operating parameter values ​​and added to the valid operating parameter set. This step ensures that the operating state of the crystal oscillator matches its rated frequency range, thereby ensuring the validity and accuracy of the test results.

[0081] Step S6: Generate an operational range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set.

[0082] Specifically, in a preferred embodiment, generating the operational range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set includes:

[0083] Extract the minimum and maximum values ​​from the valid working parameter set, use the minimum value as the lower limit of the operating range of the working parameter to be tested, and use the maximum value as the upper limit of the operating range of the working parameter to be tested to generate the operating range of the working parameter to be tested of the crystal oscillator.

[0084] In a specific implementation, by extracting the minimum and maximum values ​​from the valid operating parameter set, it is possible to ensure that the operating state of the crystal oscillator will not deviate too much from the rated value, and to avoid frequency instability or performance degradation due to excessive fluctuations, thereby determining a reasonable operating range for the operating parameters to be tested.

[0085] Based on the above method embodiments, the present invention provides corresponding device embodiments.

[0086] like Figure 2 As shown, an embodiment of the present invention provides a device for determining the operating range of a crystal oscillator operating parameter, comprising: a data acquisition module 101, a parameter setting module 102, a sampling module 103, a testing module 104 and an operating range determination module 105;

[0087] The data acquisition module 101 is used to obtain the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator;

[0088] The parameter setting module 102 is configured to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal;

[0089] The sampling module 103 is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values ​​and generate a plurality of target working parameter values;

[0090] The test module 104 is configured to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value;

[0091] The operable range determination module 105 is configured to add the target operating parameter value in the test frequency that meets the rated frequency range to the valid operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator according to the valid operating parameter set.

[0092] Specifically, in a preferred embodiment, the sampling module samples from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values ​​and generate a plurality of target working parameter values, including:

[0093] The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set;

[0094] Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

[0095] In an optional embodiment, the preset fixed interval is determined by:

[0096] Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator;

[0097] Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value;

[0098] The mantissa of the allowable deviation value is used as the mantissa of the fixed interval;

[0099] The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval;

[0100] The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

[0101] It should be noted that the embodiments of the device described above correspond to the above-mentioned embodiments of the present invention, and can implement any of the methods described above in the present invention. In addition, the embodiments of the above-mentioned device are merely schematic, wherein the modules described as separate components may or may not be physically separated, and the components displayed as modules may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of the scheme of this embodiment. In addition, in the drawings of the embodiment of the device provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, which can be specifically implemented as one or more communication buses or signal lines. A person of ordinary skill in the art can understand and implement it without paying any creative work.

[0102] Based on the above method embodiment of the present invention, a corresponding electronic device embodiment is provided.

[0103] An embodiment of the present invention provides an electronic device, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, the method for determining the operating range of the operating parameters of the crystal oscillator described in any one of the present invention is implemented, or when the processor executes the computer program, the functions of the modules in the above-mentioned device embodiments are implemented.

[0104] Exemplarily, the computer program may be divided into one or more modules, which are stored in the memory and executed by the processor to implement the present invention. The one or more modules may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0105] The terminal device may be a computing device such as a desktop computer, a notebook computer, a PDA, a cloud server, etc. The terminal device may include, but is not limited to, a processor and a memory.

[0106] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, connecting various parts of the entire terminal device using various interfaces and lines.

[0107] The memory can be used to store the computer programs and / or modules, and the processor implements various functions of the terminal device by running or executing the computer programs and / or modules stored in the memory, and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; the data storage area can store data created based on the use of the mobile phone, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage device.

[0108] Based on the above method embodiment, the present invention provides a corresponding storage medium embodiment;

[0109] Another embodiment of the present invention provides a storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the storage medium is located is controlled to execute the method for determining the operating range of any crystal oscillator operating parameter described above in the present invention.

[0110] The above-mentioned storage medium is a computer-readable storage medium, and the computer program includes computer program code, which may be in source code form, object code form, executable file, or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal, and software distribution medium, etc. It should be noted that the content contained in the computer-readable medium may be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0111] In the description of this specification, the reference terms "one embodiment," "some embodiments," "example," "specific example," or "some examples" mean that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. Moreover, the specific features, structures, materials, or characteristics described may be combined in any appropriate manner in any one or more embodiments or examples. In addition, those skilled in the art may combine and integrate different embodiments or examples described in this specification, as well as features of different embodiments or examples, unless they are mutually inconsistent.

[0112] The above is a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A method for determining the operating range of a crystal oscillator operating parameter, characterized in that: include: Obtain the rated range of the operating parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator; sending a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal; According to a preset fixed interval, sampling is performed from the rated range of the working parameter to be tested to obtain a number of working parameter values ​​and generate a number of target working parameter values; sending a second adjustment signal to the crystal oscillator to cause the crystal oscillator to perform a test according to each target operating parameter value and generate a test frequency for each target operating parameter value; Add the target operating parameter value that meets the rated frequency range in the test frequency to the valid operating parameter set; According to the valid operating parameter set, an operable range of the operating parameters of the crystal oscillator to be tested is generated.

2. The method for determining the operating range of a crystal oscillator operating parameter according to claim 1, wherein: According to a preset fixed interval, samples are taken from the rated range of the working parameter to be tested to obtain a number of working parameter values, and a number of target working parameter values ​​are generated, including: The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set; Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

3. The method for determining the operating range of a crystal oscillator operating parameter according to claim 2, wherein: The preset fixed intervals are determined by: Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator; Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value; The mantissa of the allowable deviation value is used as the mantissa of the fixed interval; The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval; The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

4. The method for determining the operating range of a crystal oscillator operating parameter according to claim 1, wherein: Sending a second adjustment signal to the crystal oscillator to cause the crystal oscillator to perform a test according to each target operating parameter value and generate a test frequency for each target operating parameter value, including: Repeat the following test operations until all target operating parameter values ​​have been tested, generating the test frequency for each target operating parameter value: Sending a second adjustment signal to the crystal oscillator, so that after receiving the second adjustment signal, the crystal oscillator adjusts the operating parameter to be tested to the current target operating parameter value and generates a test frequency of the current target operating parameter value; A target operating parameter value that has not been tested is reselected to update the current target operating parameter value.

5. The method for determining the operating range of a crystal oscillator operating parameter according to claim 1, wherein: The step of generating an operational range of the operating parameters of the crystal oscillator to be tested according to the valid operating parameter set includes: Extract the minimum and maximum values ​​from the valid working parameter set, use the minimum value as the lower limit of the operating range of the working parameter to be tested, and use the maximum value as the upper limit of the operating range of the working parameter to be tested to generate the operating range of the working parameter to be tested of the crystal oscillator.

6. A device for determining the operating range of a crystal oscillator operating parameter, characterized in that: include: Data acquisition module, parameter setting module, sampling module, testing module and operational range determination module; The data acquisition module is used to obtain the rated range of the working parameters to be tested in the crystal oscillator and the rated frequency range of the crystal oscillator; The parameter setting module is configured to send a first adjustment signal to the crystal oscillator, so that the crystal oscillator sets other operating parameters of the crystal oscillator except the operating parameter to be tested to preset rated values ​​after receiving the first adjustment signal; The sampling module is used to sample from the rated range of the working parameter to be tested according to a preset fixed interval to obtain a plurality of working parameter values ​​and generate a plurality of target working parameter values; The test module is configured to send a second adjustment signal to the crystal oscillator so that the crystal oscillator is tested according to each target operating parameter value and generates a test frequency for each target operating parameter value; The operable range determination module is used to add the target operating parameter value that meets the rated frequency range in the test frequency to the valid operating parameter set; and generate the operable range of the operating parameter to be tested of the crystal oscillator based on the valid operating parameter set.

7. The device for determining the operating range of a crystal oscillator operating parameter according to claim 6, wherein: The sampling module samples the working parameter to be tested within the rated range at a preset fixed interval to obtain a number of working parameter values ​​and generate a number of target working parameter values, including: The sampling start value is set to the lower limit of the rated range of the working parameter to be tested, and sampling is performed from the rated range of the working parameter to be tested at a preset fixed interval to obtain a sampling set; Determine whether the sampling set contains the upper limit of the rated range of the working parameter to be tested. If so, use each data item in the sampling set as the target working parameter value; if not, add the upper limit of the rated range of the working parameter to be tested to the sampling set to obtain an updated sampling set, and use each data item in the updated sampling set as the target working parameter value.

8. The device for determining the operating range of a crystal oscillator operating parameter according to claim 7, wherein: The preset fixed intervals are determined by: Obtain the allowable deviation value of the working parameter to be tested in the crystal oscillator; Expressing the allowable deviation value in scientific notation, and determining the mantissa of the allowable deviation value and the order of magnitude of the allowable deviation value; The mantissa of the allowable deviation value is used as the mantissa of the fixed interval; The order of magnitude of the allowable deviation value is reduced by a preset number of orders of magnitude as the order of magnitude of the fixed interval; The preset fixed interval is determined according to the tail number of the fixed interval and the order of magnitude of the fixed interval.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, it can implement the method for determining the operational range of the crystal oscillator operating parameters as described in any one of claims 1 to 5.

10. A storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it can implement the method for determining the operable range of the operating parameters of the crystal oscillator as described in any one of claims 1 to 5.

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