Photovoltaic module aging test method and device, electronic equipment and storage medium

Abstract

The invention provides a photovoltaic module aging test method and device, electronic equipment and a storage medium. The method comprises the following steps: packaging and laminating a battery piece which is designed and adjusted in advance to obtain a first photovoltaic module simulation sample, and the front layout of the designed and adjusted battery piece is different from the back layout of the designed and adjusted battery piece; performing a photovoltaic aging test on the first photovoltaic module simulation sample according to a preset photovoltaic aging test condition to obtain a first tested sample; performing imaging processing on the sample after the first test to obtain a first imaging result, the first imaging result including a front layout and a back layout after the photovoltaic aging test; and obtaining a first aging test result according to the first imaging result. According to the method, whether the front side or the back side of the battery piece is aged on the surface of the battery piece can be quickly judged according to the difference between the front side layout and the back side layout, so that the corresponding process is adjusted, and the problems of low visualization degree and poor effect of the battery piece aging test are solved.

Description

Technical Field

[0001] The present application relates to the field of solar photovoltaic technology, and in particular to a photovoltaic component aging test method, device, electronic equipment and storage medium. Background Art

[0002] In order to ensure the benefits of photovoltaic power plants, photovoltaic modules need to have a service life of 25 to 30 years. However, the working environment of photovoltaic modules outdoors is complex, and extreme environments have a greater impact on the service life of photovoltaic modules. Therefore, it is necessary to conduct aging tests on photovoltaic modules in high temperature and high humidity environments to ensure the normal use of photovoltaic modules. However, it is not feasible to test any photovoltaic module for more than 20 years in an actual outdoor installation environment. On the one hand, it leads to a serious lag in the recovery of technology investment costs; on the other hand, the speed of technological changes is very fast, and such a long-term test plan is likely to lose its actual reference value. It takes nearly 45 days to simulate the test verification in a double 85 high temperature and high humidity experimental environment box for 1000 hours, and it is impossible to effectively detect the product performance of photovoltaic modules in a timely manner.

[0003] To address the above issues, the existing testing method uses a 48-hour to 96-hour high-voltage accelerated aging life test for testing simulation. However, in order to improve the detection efficiency of photovoltaic modules, there are differences in the front and back processes of the cells, and the pre-marking before the aging test is difficult to identify due to the high temperature and high pressure environment, and the visualization is low. Summary of the invention

[0004] The embodiments of the present application provide a photovoltaic module aging test method and system. The photovoltaic module aging test method provided by the present application distinguishes and processes the front and back layouts of the cells to be tested in the photovoltaic module. The first imaging result can quickly determine whether the cell surface is aged on the front or back of the cell according to the difference between the front and back layouts, thereby adjusting the corresponding process according to the difference between the front and back of the cell, solving the problem of low visualization and poor effect of cell aging test.

[0005] In a first aspect, the present application provides a photovoltaic module aging test method, comprising:

[0006] Performing packaging and lamination processing on the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment;

[0007] Performing a photovoltaic aging test on the first photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a first post-test sample;

[0008] Performing imaging processing on the first post-test sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test;

[0009] A first aging test result is acquired according to the first imaging result.

[0010] Optionally, the photovoltaic module aging test method also includes:

[0011] Cutting the battery cell that has been pre-designed and adjusted to obtain a plurality of battery cell segments;

[0012] Splicing the plurality of battery cell segments to obtain a spliced ​​sample, wherein the same surface of the spliced ​​sample includes both a front layout of the battery cell after the design adjustment and a back layout of the battery cell after the design adjustment;

[0013] Performing packaging and lamination processing on the spliced ​​sample to obtain a second photovoltaic module simulation sample;

[0014] Performing a photovoltaic aging test on the second photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a second post-test sample;

[0015] Performing imaging processing on the second tested sample to obtain a second imaging result;

[0016] A second aging test result is acquired according to the second imaging result.

[0017] Optionally, the photovoltaic module aging test method also includes:

[0018] The plurality of battery cell segments are subjected to series welding to obtain the spliced ​​sample.

[0019] Optionally, the photovoltaic module aging test method also includes:

[0020] The battery cell after the design adjustment is packaged by a packaging film to obtain a first packaging result;

[0021] Encapsulating the first packaging result with glass to obtain a second packaging result;

[0022] The second packaging result is laminated to obtain the first photovoltaic component simulation sample.

[0023] Optionally, the photovoltaic module aging test method also includes:

[0024] The first photovoltaic module simulation sample is placed in an aging environment with a temperature of 110° C. to 130° C. and a humidity of 85° for 24 h to 408 h to obtain the first post-test sample.

[0025] Optionally, the photovoltaic module aging test method also includes:

[0026] Performing electroluminescence imaging processing on the first tested sample to obtain the first imaging result.

[0027] Optionally, the photovoltaic module aging test method also includes:

[0028] An electroluminescence power-on test is performed on the first photovoltaic component simulation sample.

[0029] In a second aspect, the present application also provides a photovoltaic module aging test device, comprising:

[0030] A first encapsulation and lamination module is used to perform encapsulation and lamination processing on the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment;

[0031] A first aging test module, used for performing a photovoltaic aging test on the first photovoltaic component simulation sample according to a preset photovoltaic aging test condition to obtain a first post-test sample;

[0032] A first imaging module, used for performing imaging processing on the first tested sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test;

[0033] The first result acquisition module is used to acquire a first aging test result according to the first imaging result.

[0034] In a third aspect, the present application further provides an electronic device, including:

[0035] at least one processor; and,

[0036] a memory communicatively connected to at least one processor; wherein,

[0037] The memory stores instructions that can be executed by at least one processor, and the instructions are executed by at least one processor so that the at least one processor can implement the photovoltaic component aging test method described above.

[0038] In a fourth aspect, the present application also provides a computer-readable storage medium storing a computer program, which can implement the photovoltaic module aging test method described above when the computer program is executed by a processor.

[0039] In an embodiment of the present application, by distinguishing the front and back layouts of the battery cells to be tested in the photovoltaic module, the first imaging result can quickly determine whether the aging of the battery cell surface occurs on the front or back of the battery cell based on the difference between the front and back layouts, thereby adjusting the corresponding process according to the difference between the front and back of the battery cell, thereby solving the problem of low visualization and poor effect of battery cell aging test.

[0040] The above description is only an overview of the technical solution provided by the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0042] Figure 1 It is an example of an existing battery cell grid line provided in an embodiment of the present application;

[0043] Figure 2 This is one of the schematic diagrams of the photovoltaic module aging test method provided in the embodiment of the present application;

[0044] Figure 3 This is an example of the back side of the grid line of a cell after the design adjustment provided in the embodiment of the present application;

[0045] Figure 4 This is an example of the front side of the grid line of the battery cell after the design adjustment provided in the embodiment of the present application;

[0046] Figure 5 This is an example of the front and back sides of the grid lines of a battery cell after the design adjustment provided in the embodiment of the present application;

[0047] Figure 6 This is the second schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0048] Figure 7 This is the third schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0049] Figure 8 This is the fourth schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0050] Fig. 9 This is the fifth schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0051] Fig.10 This is the sixth schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0052] Fig.11 This is the seventh schematic diagram of the photovoltaic module aging test method provided in the embodiment of the present application;

[0053] Fig.12 This is an example of a photovoltaic module aging test process provided by this application;

[0054] Fig.13 is a schematic diagram of a photovoltaic module aging test device provided in an embodiment of the present application;

[0055] Fig.14 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0056] The exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided in order to enable a more thorough understanding of the present application and to fully convey the scope of the present application to those skilled in the art.

[0057] The existing high-voltage accelerated aging life test simulates the aging of the cell after packaging in a high-temperature and high-humidity environment through an aging environment chamber, and obtains aging images through electroluminescence and other detection methods. However, it is not possible to quickly determine from the electroluminescence imaging whether the degradation phenomenon is on the front or back of the cell. Specifically, Figure 1 As shown, the front and back layouts of the cell have grid lines in the same direction, and the image presented by electroluminescence also has grid lines in the same direction. After obtaining the electroluminescence imaging results, it is difficult for testers to determine the process and materials of the degraded surface, and the visibility of the test results is poor.

[0058] In the photovoltaic module aging test method provided in the present application, the cell has been redesigned in advance, and the grid lines in the front and back layouts of the cell are completely different. The tester can quickly determine whether the degradation occurs on the front or back from the direction of the grid lines in the imaging, thereby confirming that the process conditions and materials used do not meet the aging test, thereby improving the efficiency of the aging test.

[0059] The first embodiment of the present application provides a photovoltaic module aging test method, such as Figure 2 As shown, including:

[0060] Step 101, encapsulating and laminating the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment;

[0061] Step 102: Performing a photovoltaic aging test on the first photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a first post-test sample;

[0062] Step 103, performing imaging processing on the first tested sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test;

[0063] Step 104: Obtain a first aging test result according to the first imaging result.

[0064] Specifically, the technical solution provided in this application first needs to modify the front and back layouts of the battery cell, so that the front layout in the screen layout of the battery cell is different from the back layout. Figure 3-5 As shown, the grid lines of the front and back layouts of the cell are different in direction, for example, the grid lines of the front and back layouts are perpendicular to each other, the front grid lines are longitudinal, and the back grid lines are transverse. Subsequently, the cell after design adjustment is packaged and laminated to obtain the first photovoltaic module simulation sample simulating the photovoltaic module product.

[0065] in, Figure 3 This is an example of the back side of the photovoltaic module used for aging test in this application. After the photovoltaic module is divided into four pieces, the directions of two of the pieces are reversed. The solid line is the direction of the back grid lines of the photovoltaic module after the rotation. Figure 4 This is an example of the front side of the photovoltaic module aging test used in this application. Since the grid lines on the front and back sides are perpendicular, when the directions are reversed, the grid lines on the front side of the photovoltaic module will be Figure 4 As shown by the dotted line in Figure 5 The schematic diagram of the front and back grid lines is shown in the figure. Figure 5 The solid lines are the back grid lines, and the dotted lines are the front grid lines.

[0066] After preparing the first photovoltaic module simulation sample of the simulated photovoltaic module product, the first photovoltaic module simulation sample is subjected to a photovoltaic aging test using pre-set photovoltaic aging test conditions to obtain a first post-test sample by testing the simulated photovoltaic module under a high temperature and high humidity environment.

[0067] Finally, the first post-test sample is imaged by an imaging device to obtain a first imaging result. At this time, the first imaging result can judge the front and back sides of the deteriorated surface according to the direction of the grid line after the aging test corrosion, so as to obtain the photovoltaic production process and product raw materials corresponding to the deteriorated surface, so as to facilitate the subsequent process adjustment according to the degradation situation. Among them, the judgment of the degradation situation of the first imaging result of the sample includes but is not limited to judging the color change around the electroluminescence (EL) grid line or the edge of the battery cell after aging of the sample after the first test, such as the color deepening to black, whether there is delamination on the surface of the sample after the first test, whether the welding belt is black, etc.

[0068] In addition, the photovoltaic module aging test method provided in this application is not limited to EL imaging, but is also applicable to PL imaging, EQE two-dimensional scanning imaging and other test equipment, and this application does not impose any restrictions.

[0069] In an embodiment of the present application, by distinguishing the front and back layouts of the battery cells to be tested in the photovoltaic module, the first imaging result can quickly determine whether the aging of the battery cell surface occurs on the front or back of the battery cell based on the difference between the front and back layouts, thereby adjusting the corresponding process according to the difference between the front and back of the battery cell, thereby solving the problem of low visualization and poor effect of battery cell aging test.

[0070] In the implementation mode of the present application, Figure 6 As shown, in the photovoltaic module aging test method, after step 101, the method further includes:

[0071] Step 105, cutting the battery cell that has been pre-designed and adjusted to obtain a plurality of battery cell segments;

[0072] Step 106, splicing the plurality of battery cell segments to obtain a spliced ​​sample, wherein the same surface of the spliced ​​sample includes both the front layout of the battery cell after the design adjustment and the back layout of the battery cell after the design adjustment;

[0073] Step 107, performing packaging and lamination processing on the spliced ​​sample to obtain a second photovoltaic module simulation sample;

[0074] Step 108: Performing a photovoltaic aging test on the second photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a second post-test sample;

[0075] Step 109, performing imaging processing on the second tested sample to obtain a second imaging result;

[0076] Step 110: Obtain a second aging test result according to the second imaging result.

[0077] Specifically, after preparing the first photovoltaic module simulation sample that simulates the photovoltaic module product, the photovoltaic module aging test method provided in the present application can also cut the battery cell that has been pre-designed and adjusted to obtain multiple battery cell fragments, for example, cutting a battery cell into two battery cell fragments or four battery cell fragments.

[0078] Subsequently, the cell segments are spliced ​​together to obtain spliced ​​samples. Specifically, some of the cell segments are turned over to the back and spliced ​​together with the cell segments still on the front to obtain spliced ​​samples.

[0079] Afterwards, the spliced ​​samples are packaged and laminated to obtain a second photovoltaic module simulation sample simulating a photovoltaic module product. After the second photovoltaic module simulation sample simulating a photovoltaic module product is prepared, a photovoltaic aging test is performed on the second photovoltaic module simulation sample under pre-set photovoltaic aging test conditions to simulate the photovoltaic module under a high temperature and high humidity environment to obtain a second post-test sample.

[0080] Finally, the second sample after the test is imaged by an imaging device to obtain a second imaging result. At this time, the same side of the second imaging result carries the front and back sides of the battery cell at the same time. According to the difference in the grid lines, the test results of multiple sides can be obtained in one picture, thereby obtaining the photovoltaic production process and product raw materials corresponding to the degraded side, which is convenient for subsequent process adjustments according to the degradation situation.

[0081] In the implementation manner of the present application, since one image in the second imaging result of the photovoltaic module aging test method provided by the present application carries both the front and back cell fragments, only one image is needed to simultaneously confirm the degradation conditions of the front and back sides of the cell, thereby avoiding two imaging processing of the test results, reducing the processing volume, and improving the test efficiency.

[0082] In the implementation mode of the present application, Figure 7 As shown, in the photovoltaic module aging test method, step 106 includes:

[0083] Step 161: perform serial welding on the plurality of battery cell segments to obtain the spliced ​​sample.

[0084] Specifically, the splicing method of multiple cell segments in the photovoltaic module aging test method provided in the present application can be connected by, but not limited to, serial welding. For example, the cell segments can be welded by interconnecting strips to obtain a spliced ​​sample.

[0085] In the implementation manner of the present application, since the photovoltaic module aging test method provided in the present application connects multiple cell fragments through a series welding process, while ensuring that the power is turned on to meet the imaging conditions, it ensures that multiple cell fragments facing opposite directions are encapsulated in the same sample, thereby ensuring the accuracy of the aging test.

[0086] In the implementation mode of the present application, Figure 8 As shown, in the photovoltaic module aging test method, step 101 includes:

[0087] Step 111, encapsulating the battery cell after the design adjustment by using an encapsulation film to obtain a first encapsulation result;

[0088] Step 112, encapsulating the first packaging result with glass to obtain a second packaging result;

[0089] Step 113: laminating the second packaging result to obtain the first photovoltaic module simulation sample.

[0090] Specifically, for the battery cell after design adjustment, for example, a 200*200 sample is first packaged with a film to obtain a first packaging result, and then the first packaging result is coated with glass to obtain a second packaging result. In order to avoid the impact of glass bursting on the aging test results during the aging test, a corner guard can be added to the edge of the second packaging result.

[0091] Subsequently, the first packaging result is laminated to obtain the first photovoltaic module simulation sample. Specifically, the air in the second packaging sample is extracted by vacuuming, and then the adhesive film is fused by heating. At this time, the cell and the glass back plate are bonded together to achieve sealing protection for the cell.

[0092] In addition, the packaging link in the aging test method provided in the present application simulates the actual packaging situation of the battery cell. Therefore, the same battery cell can be packaged by different adhesive film packaging materials, and the sealing of different adhesive film packaging materials can be tested while the aging test is being performed. Among them, the material of the adhesive film is not limited, and a variety of adhesive films used for packaging can be tested, such as polyolefin elastomer (Polyolefin elastomer, POE), epoxy resin (Epoxy, EP), expandable polyethylene (Expandable Polyethylene, EPE), ethylene-vinyl acetate copolymer (Ethylene Vinyl Acetate Copolymer, EVA), white EVA, white ethylene / ethyl acrylate copolymer (EEA Ethylene / ethyl acrylate, EE), white EP and other adhesive film materials.

[0093] Specifically, the photovoltaic module aging test method provided in the present application can encapsulate the same solar cell with different adhesive film encapsulation materials, test the sealing properties of different adhesive film encapsulation materials while performing the photovoltaic module aging test, and can also perform encapsulation testing on different structural materials. For example:

[0094] POE is better at blocking water than EVA. When different packaging materials are tested using the photovoltaic module aging test method provided in this application, the degree of aging of the cell encapsulated with POE is lower than that of the cell encapsulated with EVA. Therefore, the degree of corrosion of the cell encapsulated with POE in EL detection is better than that of the cell encapsulated with EVA. Subsequent packaging of cell pieces can be more inclined to use POE materials for packaging to extend the service life of the photovoltaic module.

[0095] In addition, the photovoltaic module aging test method provided in this application can also detect the protective effect of backplane packaging with different water vapor permeability on the cell. For example, the backplane is compared with glass. Glass is a completely water-blocking packaging material, while the water vapor permeability of the backplane is often 0.8. After the photovoltaic module aging test provided in this application, the cell of the glass packaging sample did not corrode after aging, while the cell with the backplane packaging was severely corroded after aging, which provides a reference for the subsequent design and production of photovoltaic module products.

[0096] It should be emphasized that the photovoltaic module aging test method provided in the present application is achieved by shortening the aging simulation time, for example, observing the corrosion path of the photovoltaic module after being placed for 4 hours, and confirming the step-by-step corrosion process of the photovoltaic module or battery cell through continuous tracking, and judging the aging resistance of the photovoltaic module based on the corrosion path.

[0097] In the implementation mode of the present application, Fig. 9 As shown, in the photovoltaic module aging test method, step 102 includes:

[0098] Step 121 , placing the first photovoltaic module simulation sample in an aging environment with a temperature of 110° C.-130° C. and a humidity of 85° for 24 h-408 h to obtain the first post-test sample.

[0099] Specifically, the aging test method provided in the present application is performed in an aging environment box device that simulates an aging environment. The aging environment box maintains simulated high temperature and high humidity environmental conditions, such as a temperature of 120°C and a humidity of 85°C, and the first photovoltaic module simulation sample is placed for a certain period of time, such as 48 hours, 96 hours, and 192 hours, to obtain a first post-test sample.

[0100] Specifically, the test conditions for the photovoltaic module aging test provided in this application are range pressure conditions: 29.7 / 20.5kPa, and the humidity is consistent with the IEC standard high temperature and high humidity environment temperature of 85° (0-5°). Among them, when the temperature is 110°C, the placement time can be 96 hours, 192 hours and 408 hours respectively; when the temperature is 120°C, the placement time can be 48 hours, 96 hours and 192 hours respectively; when the temperature is 130°C, the placement time can be 24 hours, 48 ​​hours and 96 hours respectively.

[0101] In the implementation manner of the present application, by setting the environmental conditions of temperature at 120°C and humidity at 85°C, the working environment of the photovoltaic components in high temperature and high pressure is simulated, and the aging test results are more accurate.

[0102] In the implementation mode of the present application, Fig.10 As shown, in the photovoltaic module aging test method, step 103 includes:

[0103] Step 131: Perform electroluminescence imaging processing on the first tested sample to obtain the first imaging result.

[0104] Specifically, after obtaining the first tested sample, a high-resolution infrared camera is used to capture a near-infrared image of the first tested sample using the electroluminescence principle of crystalline silicon, and the near-infrared image is used to determine whether the cell has been corroded in a harsh environment. In addition, in order to ensure the accuracy of the aging test, the sample can also be placed in the aging environment chamber for a longer period of time, such as 1,000 hours before obtaining an image using a high-resolution infrared camera to determine the appearance of the test result.

[0105] In the implementation mode of the present application, by using the thermal infrared imaging images before and after the test of the EL thermal infrared imager test component, the surface morphology of the sample can be obtained without removing the sample from the aging test environment. While obtaining the results, it is convenient to test the sample for a longer time, obtain more test data, and improve the accuracy of the aging test.

[0106] In the implementation mode of the present application, Fig.11 As shown, in the photovoltaic module aging test method, after step 101 and before step 102, the following steps are further included:

[0107] Step 114: Perform an electroluminescence power-on test on the first photovoltaic component simulation sample.

[0108] Specifically, in order to meet the EL imaging conditions in the photovoltaic module aging test method provided by the present application, it is necessary to conduct a power-on test on the first photovoltaic module simulation sample before conducting the aging test to ensure that the cell can generate the first imaging result after the aging test. In addition, in the photovoltaic module aging test method provided by the present application, before conducting the aging test on the second photovoltaic module simulation sample, the power-on condition of the spliced ​​sample can be ensured by serial welding of interconnecting bars. In addition, the bus bars can be welded on the edge of the spliced ​​sample to collect the current and lead it out a certain distance, such as 40mm, to facilitate the EL clamping test.

[0109] In the implementation manner of the present application, a power-on test action is added to prepare for EL imaging, ensuring that only those that pass the power-on test can perform EL imaging and obtain the first imaging result.

[0110] Based on the implementation methods of listing, Fig.12 As shown, this application also provides an example of photovoltaic module aging test:

[0111] First, the battery cell that has been designed and adjusted in advance is cut and diced to obtain four quarter pieces or two half pieces. These four pieces or half pieces are then welded through mutual welding rods. At this time, the welding result obtained carries different sides of the four pieces or half pieces at the same time, and the front and back grid lines of the battery cell that has been designed and adjusted in advance are different. The front and back sides of the unused fragments in the welding result after welding can be judged according to the direction of the grid lines. Then it is encapsulated by adhesive film and glass. Among them, in order to avoid the glass from bursting, it can be protected by the corner guards on the edges. The encapsulated result is laminated to achieve the sealing of the battery cell. After lamination, the first photovoltaic module simulation sample is tested for power-on. After the test, the busbars of the first photovoltaic module simulation sample are welded to form a loop to facilitate the subsequent EL imaging results. Subsequently, a high-voltage accelerated aging life test (pressure cooker test, PCT) is carried out. EL imaging is performed after 24 hours, and the aging of the battery cell is judged based on the EL imaging results. When the EL imaging results and appearance meet the pre-defined product standards, the battery cell is placed in the aging environment box for 48 hours before the next appearance judgment. When the EL imaging results and appearance do not meet the pre-defined product standards, the battery cell is judged to be unqualified and is taken out of the aging environment box, ending the photovoltaic module aging test experiment.

[0112] The second embodiment of the present application also provides a photovoltaic module aging test device, such as Fig.13 As shown, including:

[0113] A first encapsulation and lamination module 201 is used to perform encapsulation and lamination processing on the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment;

[0114] A first aging test module 202, configured to perform a photovoltaic aging test on the first photovoltaic component simulation sample according to preset photovoltaic aging test conditions to obtain a first post-test sample;

[0115] A first imaging module 203, configured to perform imaging processing on the first tested sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test;

[0116] The first result acquisition module 204 is configured to acquire a first aging test result according to the first imaging result.

[0117] In an embodiment of the present application, the photovoltaic module aging test device further includes:

[0118] A cutting processing module 205 is used to cut the battery cell that has been pre-designed and adjusted to obtain a plurality of battery cell segments;

[0119] A splicing processing module 206, configured to splice the plurality of cell segments to obtain a spliced ​​sample, wherein the same surface of the spliced ​​sample includes both a front layout of the cell after the design adjustment and a back layout of the cell after the design adjustment;

[0120] A second encapsulation and lamination module 207 is used to perform encapsulation and lamination processing on the spliced ​​sample to obtain a second photovoltaic module simulation sample;

[0121] A second aging test module 208, configured to perform a photovoltaic aging test on the second photovoltaic component simulation sample according to a preset photovoltaic aging test condition to obtain a second post-test sample;

[0122] A second imaging module 209, used to perform imaging processing on the second tested sample to obtain a second imaging result;

[0123] The second result acquisition module 210 is used to acquire a second aging test result according to the second imaging result.

[0124] In the implementation of the present application, the splicing processing module 206 includes:

[0125] The serial welding and splicing unit 261 is used to perform serial welding on the multiple battery cell segments to obtain the splicing sample.

[0126] In an embodiment of the present application, the first encapsulation lamination module 201 includes:

[0127] A packaging unit 211 is used to package the battery cell after the design adjustment by using a packaging film to obtain a first packaging result;

[0128] A coating unit 212, configured to coat the first packaging result with glass to obtain a second packaging result;

[0129] The laminating unit 213 is used to perform lamination processing on the second packaging result to obtain the first photovoltaic component simulation sample.

[0130] In an embodiment of the present application, the first aging test module 202 includes:

[0131] The aging treatment unit 221 is used to place the first photovoltaic module simulation sample in an aging environment with a temperature of 120° C. and a humidity of 85° for 48 hours to 96 hours to obtain the first post-test sample.

[0132] In an embodiment of the present application, the first imaging module 203 includes:

[0133] The electroluminescence imaging unit 231 is used to perform electroluminescence imaging processing on the first tested sample to obtain the first imaging result.

[0134] In an embodiment of the present application, the photovoltaic module aging test device further includes:

[0135] The power-on test module 214 is used to perform an electroluminescence power-on test on the first photovoltaic component simulation sample.

[0136] A third embodiment of the present application relates to an electronic device, such as Fig.14 As shown, including:

[0137] at least one processor 301; and,

[0138] A memory 302 is communicatively connected to the at least one processor 301; wherein,

[0139] The memory 302 stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor 301 so that the at least one processor 301 can implement the photovoltaic module aging test method described in the first embodiment of the present application.

[0140] Among them, the memory and the processor are connected in a bus manner, and the bus may include any number of interconnected buses and bridges, and the bus connects various circuits of one or more processors and memories together. The bus can also connect various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. The bus interface provides an interface between the bus and the transceiver. The transceiver can be one element or multiple elements, such as multiple receivers and transmitters, providing a unit for communicating with various other devices on a transmission medium. The data processed by the processor is transmitted on a wireless medium via an antenna, and further, the antenna also receives data and transmits the data to the processor.

[0141] The processor is responsible for managing the bus and general processing, and can also provide various functions, including timing, peripheral interfaces, voltage regulation, power management, and other control functions. Memory can be used to store data used by the processor when performing operations.

[0142] The fourth embodiment of the present application relates to a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the photovoltaic module aging test method described in the first embodiment of the present application is implemented.

[0143] That is, those skilled in the art can understand that all or part of the steps in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a program, and the program is stored in a storage medium, including several instructions to enable a device (which can be a single-chip microcomputer, chip, etc.) or a processor to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.

[0144] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the application disclosed herein. The present application is intended to cover any modification, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present application are indicated by the following claims.

[0145] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A photovoltaic module aging test method, characterized in that: include: Performing packaging and lamination processing on the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment; Performing a photovoltaic aging test on the first photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a first post-test sample; Performing imaging processing on the first post-test sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test; A first aging test result is acquired according to the first imaging result.

2. The method according to claim 1, characterized in that After the solar cells that have been pre-designed and adjusted are packaged and laminated to obtain the first photovoltaic module simulation sample, the method further includes: Cutting the battery cell that has been pre-designed and adjusted to obtain a plurality of battery cell segments; Splicing the plurality of battery cell segments to obtain a spliced ​​sample, wherein the same surface of the spliced ​​sample includes both a front layout of the battery cell after the design adjustment and a back layout of the battery cell after the design adjustment; Performing packaging and lamination processing on the spliced ​​sample to obtain a second photovoltaic module simulation sample; Performing a photovoltaic aging test on the second photovoltaic module simulation sample according to preset photovoltaic aging test conditions to obtain a second post-test sample; Performing imaging processing on the second tested sample to obtain a second imaging result; A second aging test result is acquired according to the second imaging result.

3. The method according to claim 2, characterized in that The splicing process is performed on the plurality of battery cell segments to obtain a spliced ​​sample, wherein the same surface of the spliced ​​sample includes both the front layout of the battery cell after the design adjustment and the back layout of the battery cell after the design adjustment, including: The plurality of battery cell segments are subjected to series welding to obtain the spliced ​​sample.

4. The method according to claim 1, characterized in that: The step of performing packaging and lamination processing on the solar cells that have been pre-designed and adjusted to obtain the first photovoltaic module simulation sample comprises: The battery cell after the design adjustment is packaged by a packaging film to obtain a first packaging result; Encapsulating the first packaging result with glass to obtain a second packaging result; The second packaging result is laminated to obtain the first photovoltaic component simulation sample.

5. The method according to claim 1, characterized in that The step of performing a photovoltaic aging test on the first photovoltaic component simulation sample according to the preset photovoltaic aging test conditions to obtain a first post-test sample comprises: The first photovoltaic module simulation sample is placed in an aging environment with a temperature of 110° C. to 130° C. and a humidity of 85° for 24 h to 408 h to obtain the first post-test sample.

6. The method according to claim 1, characterized in that The performing imaging processing on the first tested sample to obtain a first imaging result comprises: Performing electroluminescence imaging processing on the first tested sample to obtain the first imaging result.

7. The method according to claim 6, characterized in that After the solar cells that have been pre-designed and adjusted are packaged and laminated to obtain a first photovoltaic module simulation sample, and before the photovoltaic aging test is performed on the first photovoltaic module simulation sample according to pre-set photovoltaic aging test conditions to obtain a first post-test sample, the method further includes: An electroluminescence power-on test is performed on the first photovoltaic component simulation sample.

8. A photovoltaic module aging test device, characterized in that: include: A first encapsulation and lamination module is used to perform encapsulation and lamination processing on the solar cell that has been pre-designed and adjusted to obtain a first photovoltaic module simulation sample, wherein the front layout of the solar cell after the design adjustment is different from the back layout of the solar cell after the design adjustment; A first aging test module, used for performing a photovoltaic aging test on the first photovoltaic component simulation sample according to a preset photovoltaic aging test condition to obtain a first post-test sample; A first imaging module, used for performing imaging processing on the first tested sample to obtain a first imaging result, wherein the first imaging result includes the front surface image and the back surface image after the photovoltaic aging test; The first result acquisition module is used to acquire a first aging test result according to the first imaging result.

9. An electronic device, characterized in that: include: at least one processor; as well as, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can implement the photovoltaic component aging test method described in any one of claims 1-7.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the photovoltaic module aging test method described in any one of claims 1 to 7 is implemented.

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