Emittance measuring method and device based on multi-source correction

Abstract

The invention provides an emissivity measurement method and device based on multi-source correction. The method comprises the following steps: establishing an emissivity measurement model; the emissivity measurement model at least comprises one of radiation source correction, atmospheric environment correction, device radiation energy correction and detection element piecewise nonlinear fitting correction; radiation source correction is used for removing the influence of non-target radiation source and target illegal radiation energy through a micro-cavity collimation structure mounted at the front end of the detection element; the atmospheric environment correction is used for removing the influence of atmospheric environment attenuation errors; the radiation energy correction of the device is used for removing the influence of the radiation energy of the micro-cavity collimation structure; the piecewise nonlinear fitting of the detection element is used for reducing the influence of a temperature-voltage fitting error of the detection element; and determining the emissivity of the target sample by using the emissivity measurement model. According to the invention, through error correction of the radiation source, the radiation propagation path, the device radiation and the radiation receiving end, a high-precision emissivity measurement model is constructed.

Description

Technical Field

[0001] The present disclosure relates to the field of radiation measurement technology, and more specifically to an emissivity measurement method and device based on multi-source correction. Background Art

[0002] Any object with a temperature above absolute zero is constantly radiating energy outwards. Emissivity is a parameter that characterizes the ability of an object to radiate energy outwards. The measurement of emissivity is crucial in the fields of radiation temperature measurement, infrared guidance, satellite remote sensing, etc.

[0003] Existing emissivity measurement methods mainly include reflectivity method and energy method. The reflectivity method radiates a known amount of energy to the target, and uses devices such as thermal cavity reflectometers and integrating sphere reflectometers to measure the amount of energy reflected from the target surface to calculate the target surface emissivity. The energy method is based on the definition of emissivity. By measuring the target radiation energy value, the target surface emissivity is directly calculated based on the black body radiation energy value at the same temperature.

[0004] The reflectivity method requires complex equipment and operations, is difficult to measure, has high costs, and its measurement accuracy is affected by the surface state of the target. The energy method is affected by factors such as ambient temperature and radiation background. Its measurement accuracy depends on the accuracy of the radiation measurement model, and it is necessary to fully consider radiation factors other than the target. Summary of the invention

[0005] In view of the above problems, the present disclosure constructs a high-precision emissivity measurement model by correcting the errors of the target radiation source, radiation propagation path, device radiation, and radiation receiving end, and provides an emissivity measurement method and device based on multi-source correction.

[0006] The present disclosure provides an emissivity measurement method based on multi-source correction, comprising: establishing an emissivity measurement model; the emissivity measurement model at least includes one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and non-target radiation energy in a non-normal direction through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error; and the emissivity of the target sample is determined using the emissivity measurement model.

[0007] According to an embodiment of the present disclosure, an emissivity measurement model is established, including: utilizing a microcavity collimation structure to transmit the normal radiation energy emitted by the target sample to a detection element for completing radiation source correction; obtaining a radiation energy expression formula based on atmospheric environmental parameters and the radiation energy of the device for completing atmospheric environmental correction and device radiation energy correction; determining an emissivity measurement formula for the target sample through the radiation energy expression formula; wherein the atmospheric environmental parameters include at least the current ambient temperature;.

[0008] According to an embodiment of the present disclosure, a microcavity collimation structure is used to transmit the normal radiation energy emitted by the target sample to a detection element for completing radiation source correction, including: adjusting the diameter and radius of the microcavity collimation structure according to preset parameters; the preset parameters include at least one of the temperature of the target sample, the effective width of the detection element, and the detection distance of the microcavity collimation structure; and installing the microcavity collimation structure at the front end of the detection element for processing the radiation energy emitted by the target sample and transmitting it to the detection element.

[0009] According to an embodiment of the present disclosure, the diameter and radius of the microcavity collimation structure are adjusted according to preset parameters, including: determining the diameter of the microcavity collimation tube according to the preset diameter of the area to be detected of the target sample and the target sample measurement temperature range; calculating the length of the microcavity collimation structure using the diameter of the area to be detected, the effective width of the detection element, the detection distance of the microcavity collimation structure and the diameter of the microcavity collimation structure; wherein the formula for calculating the length of the microcavity collimation structure is as follows:

[0010]

[0011] Wherein, L2 is the length of the microcavity collimation structure; L1 is the detection distance of the microcavity collimation structure; D is the diameter of the microcavity collimation structure; S is the effective width of the detection element; and L is the diameter of the target sample's detection area.

[0012] According to an embodiment of the present disclosure, the microcavity alignment structure is also equipped with a cooling device.

[0013] According to an embodiment of the present disclosure, a radiation energy expression formula is obtained based on atmospheric environment parameters and the radiation energy of the device to complete atmospheric environment correction and device radiation energy correction, which also includes: measuring the current ambient temperature, converting the atmospheric transmittance through the current ambient temperature; using the thermistor embedded in the microcavity collimation structure to obtain the temperature of the microcavity collimation structure; measuring the actual temperature of the target sample.

[0014] According to an embodiment of the present disclosure, a radiation energy expression formula is obtained according to the atmospheric environment parameters and the radiation energy of the device to complete the atmospheric environment correction and the device radiation energy correction; the emissivity measurement formula of the target sample is determined by the radiation energy expression formula, including: expressing the radiation energy received by the detection element as the sum of the atmospheric radiation energy, the device radiation energy and the target radiation energy to obtain the radiation energy expression formula; according to Stefan Boltzmann's law, the radiation energy expression formula is converted into a radiation temperature expression formula; and the emissivity measurement formula is obtained by using the radiation temperature expression formula;

[0015] The radiation temperature expression formula is as follows:

[0016] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0017] Where T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; ε w is the emissivity of the internal coating material of the microcavity collimation material; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant;

[0018] The emissivity measurement formula is as follows:

[0019]

[0020] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the actual temperature of the target sample; ε w is the emissivity of the internal coating material of the microcavity collimating material; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant.

[0021] According to an embodiment of the present disclosure, an emissivity measurement model is used to determine the emissivity of a target sample, including: determining the target radiation temperature by querying the temperature-voltage curve of the detection element according to the response voltage of the detection element; substituting the actual temperature, target radiation temperature, atmospheric transmittance, current ambient temperature and the temperature of the microcavity collimation structure into the emissivity measurement formula to determine the emissivity of the target sample.

[0022] According to an embodiment of the present disclosure, the temperature-voltage curve of the detection element is queried based on the response voltage of the detection element to determine the target radiation temperature, including: within the temperature measurement range of the detection element, the change value of the response voltage is collected at a preset temperature interval; the temperature measurement range is divided into multiple temperature intervals, and for each temperature interval, the temperature-voltage curve of the detection element is fitted by a piecewise linear fitting method.

[0023] A second aspect of the present disclosure provides an emissivity measurement device based on multi-source correction, which can be used to implement the above method, and the device includes: an emissivity measurement model module, which is used to establish an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and non-target radiation energy in the illegal direction through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of the atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of the radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error; the emissivity calculation module is used to determine the emissivity of the target sample using the emissivity measurement model.

[0024] According to the emissivity measurement method based on multi-source correction provided by the present disclosure, the direction and effective area of ​​the sensor receiving radiation are controlled by the microcavity collimation structure to remove the non-target radiation source and the non-target illegal influence; the environmental influence is removed by atmospheric environment correction; the influence of the device radiation itself is removed by device radiation energy correction; and the influence of the detection element measurement result error is removed by detection element segmented nonlinear fitting correction. Since a high-precision emissivity measurement model is constructed by error correction of the radiation source, radiation propagation path, device radiation, and radiation receiving end, the technical problem of reduced measurement accuracy due to the influence of factors such as ambient temperature and radiation background is at least partially solved, and the technical effect of accurately measuring the emissivity is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 The flowchart of the emissivity measurement method based on multi-source correction according to an embodiment of the present disclosure is schematically shown;

[0026] Figure 2 A schematic diagram of a microcavity alignment structure according to an embodiment of the present disclosure is shown;

[0027] Figure 3 A schematic diagram of a multi-source correction temperature measurement model according to an embodiment of the present disclosure is schematically shown;

[0028] Figure 4 The structure block diagram of the emissivity measurement device based on multi-source correction according to an embodiment of the present disclosure is schematically shown. DETAILED DESCRIPTION

[0029] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present disclosure. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present disclosure. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present disclosure.

[0030] The terms used herein are only for describing specific embodiments and are not intended to limit the present disclosure. The terms "comprise", "include", etc. used herein indicate the existence of features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0031] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification, and should not be interpreted in an idealized or overly rigid manner.

[0032] When using expressions such as "at least one of A, B, and C, etc.", they should generally be interpreted according to the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0033] First, the technical terms involved in this disclosure are explained as follows:

[0034] Stefan-Boltzmann law: The Stefan-Boltzmann law states that the total energy radiated per unit area per unit time by a black body (i.e., an ideal radiating surface that absorbs all incident thermal radiation) is proportional to the fourth power of the thermodynamic temperature of the black body itself. For non-black bodies, their actual radiation power can be estimated by measuring their emissivity and multiplying it by the radiation power of the black body in the Stefan-Boltzmann law.

[0035] Figure 1 The flowchart of the emissivity measurement method based on multi-source correction according to an embodiment of the present disclosure is schematically shown. Figure 1As shown, an embodiment of the present disclosure provides an emissivity measurement method, including: establishing an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and target non-normal radiation energy through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error; and the emissivity measurement model is used to determine the emissivity of the target sample.

[0036] In this embodiment, the detection element may optionally be a thermal sensor.

[0037] Through the embodiments of the present disclosure, the present disclosure proposes a comprehensive emissivity measurement method, which removes the influence of non-target radiation sources and non-target energy and device radiation energy from the perspective of radiation sources; removes the influence of atmospheric radiation energy and atmospheric attenuation errors from the perspective of transmission paths; and removes the influence of detection element measurement result errors from the perspective of radiation receiving ends. Finally, through a high-precision emissivity measurement model, a more accurate measurement of the emissivity of the target sample is achieved.

[0038] On the basis of the above-mentioned embodiments, an emissivity measurement model is established, including: utilizing a microcavity collimation structure to transmit the normal radiation energy emitted by the target sample to the detection element for completing the radiation source correction; obtaining a radiation energy expression formula according to the atmospheric environment parameters and the radiation energy of the device for completing the atmospheric environment correction and the device radiation energy correction; determining the emissivity measurement formula of the target sample through the radiation energy expression formula; wherein the atmospheric environment parameters include at least the current ambient temperature;.

[0039] Through the embodiments of the present disclosure, the microcavity collimation structure is used to remove non-target radiation and non-target illegal radiation energy; the attenuation degree varies in different atmospheric environments. In order to avoid the influence of different test environments, an atmospheric compensation mode is designed to correct the attenuation error of different atmospheric environments; at the same time, since the microcavity collimation structure will rise in temperature due to the external environment during the measurement process, the radiation energy compensation of the microcavity collimation structure is proposed. In this way, a more accurate radiation energy expression is obtained, and the radiation temperature expression formula is further obtained, and the emissivity is calculated by the radiation temperature expression formula, thereby improving the accuracy of the emissivity.

[0040] On the basis of the above-mentioned embodiment, a microcavity collimation structure is used to transmit the normal radiation energy emitted by the target sample to the detection element for completing the radiation source correction, including: adjusting the diameter and radius of the microcavity collimation structure according to preset parameters; the preset parameters include at least one of the temperature of the target sample, the effective width of the detection element, and the detection distance of the microcavity collimation structure; the microcavity collimation structure is installed at the front end of the detection element for processing the radiation energy emitted by the target sample and transmitting it to the detection element.

[0041] In this embodiment, Figure 2 The schematic diagram of the microcavity alignment structure according to the embodiment of the present disclosure is shown schematically, and the microcavity alignment structure is installed at the front end of the thermal sensor. The microcavity alignment structure is cylindrical in shape, and the inner wall is composed of tightly arranged spherical cavities and coated with high-absorption material. The inner and outer walls are filled with coolant for water-cooled circulation cooling, and a thermistor is embedded for temperature monitoring. Among them, the water-cooled circulation cooling is used to reduce the radiation energy interference caused by the heating of the microcavity alignment structure and eliminate the influence of the ambient temperature; the temperature monitoring is used for accurate radiation energy compensation.

[0042] Through the embodiments of the present disclosure, according to parameters such as the temperature of the target sample, the effective width of the detection element, and the detection distance, the diameter and radius of the microcavity collimation structure are adjusted through precise design to optimize the size of the microcavity collimation structure to meet measurement requirements and ensure that it can effectively receive and preprocess radiation energy under different conditions.

[0043] On the basis of the above embodiment, according to the preset parameters, the diameter and radius of the microcavity collimation structure are adjusted, including: determining the diameter of the microcavity collimation tube according to the preset diameter of the area to be detected of the target sample and the target sample measurement temperature range; using the diameter of the area to be detected, the effective width of the detection element, the detection distance of the microcavity collimation structure and the diameter of the microcavity collimation structure, calculating the length of the microcavity collimation structure; wherein the formula for calculating the length of the microcavity collimation structure is as follows:

[0044]

[0045] Wherein, L2 is the length of the microcavity collimation structure; L1 is the detection distance of the microcavity collimation structure; D is the diameter of the microcavity collimation structure; S is the effective width of the detection element; and L is the diameter of the target sample's detection area.

[0046] In this embodiment, the preset diameter of the area to be detected is set by the operator. By modifying the detection distance, collimator length, diameter and other parameters, the effective diameter of the target sample can be converted to make the effective diameter equal to the diameter of the area to be detected. The effective diameter refers to the area where the target sample can actually receive the radiation energy. Therefore, the value of the preset diameter of the area to be detected can be equated with the effective diameter for various calculations.

[0047] In this embodiment, obliquely incident non-target radiation and target non-normal radiation heat W are approximately completely absorbed after multiple reflections by the inner wall material with high absorption rate and the spherical cavity structure, the radiation energy emitted by the target is approximately calibrated to the horizontal direction, and the non-target radiation in the target surrounding environment is approximately eliminated.

[0048] W'=(1-ε w ) n W

[0049] Among them, ε w is the emissivity of the internal coating material of the microcavity collimating material, which is close to 1. The radiation energy W' obtained from the non-target radiation source and the non-normal direction of the target after multiple reflections is approximately 0, and W is the incident radiation energy from the non-target radiation source and the non-normal direction of the target.

[0050] At the same time, the microcavity collimation structure limits the effective area of ​​the target, reducing the measurement area to a circular area with a diameter of L. The formula for the effective area L is as follows:

[0051]

[0052] Among them, S is the effective width of the sensor detection element, D and L2 are the diameter and length of the microcavity alignment structure, and L1 is the detection distance.

[0053] Furthermore, in the design stage of the microcavity alignment structure, the diameter of the microcavity alignment structure is given priority. Therefore, in actual situations, the diameter of the microcavity alignment structure, the area L to be restricted, and the measurement distance L1 are known variables. Therefore, the length of the microcavity alignment structure can be determined based on the effective area L formula to obtain a formula for calculating the length of the microcavity alignment structure.

[0054] Through the embodiments of the present disclosure, the high-absorption inner wall material and spherical cavity structure of the microcavity collimation structure make the obliquely incident radiation heat W almost completely absorbed after multiple reflections, the non-target radiation in the target environment is almost eliminated, and the radiation emitted by the target is approximately calibrated to the horizontal direction. At the same time, the effective area of ​​the target sample is limited by the microcavity collimation structure, and the radiation outside the effective detection area of ​​the target is limited to be incident on the sensor, reducing the impact of the non-uniformity of the target surface.

[0055] In addition, the diameter of the microcavity collimation structure is closely related to the energy of the target incident to the sensor. The larger the diameter, the larger the effective radiation area and the stronger the energy, but the greater the impact of the target non-uniformity. The low-temperature target itself has low radiation energy. When the diameter is too small, the incident energy is difficult to be detected by the sensor. Therefore, according to the temperature of the target to be measured, a microcavity collimation structure of different diameters is selected. According to the preset diameter of the area to be detected of the target sample and the target sample measurement temperature interval, the diameter of the microcavity collimation tube is determined, specifically including: according to the preset diameter of the area to be detected of the target sample and the target sample measurement temperature interval, the diameter of the microcavity collimation tube is determined. That is, according to the size of the detection element, the range of the diameter of the microcavity collimation tube is determined, and the diameter of the collimation tube is set between 1 and 2 times the effective width of the detection element, that is, S≤D≤2S, and the diameter of the collimation tube is fine-tuned according to the size and radiation of the target sample. It should be noted that the purpose of setting the collimation diameter is to ensure that the effective diameter of the target sample is the same as the diameter of the area to be detected, so fine-tuning is sufficient, the diameter remains unchanged, and different effective diameters can also be obtained through different detection distances. For example, if the temperature of the target to be detected is very low and the energy radiated by it is relatively small, then the diameter of the collimator tube needs to be set larger within the range. For the same effective area, the detection distance can be closer, so that more energy can be received. For example, if the diameter of the area to be detected is very large, if the diameter of the collimator tube is set smaller, then the detection distance needs to be very far to ensure that the sample size and the effective detection area are consistent. The diameter of the collimator tube needs to be adjusted as large as possible within the range.

[0056] Based on the above embodiment, the microcavity alignment structure is further equipped with a cooling device.

[0057] In this embodiment, the cooling device may optionally be an air cooling device or a water cooling device.

[0058] Through the embodiments of the present disclosure, a cooling device is used to reduce the influence of the device radiation energy in advance through physical means, and then the device radiation energy is further removed through device radiation source correction, so that the emissivity measurement is more accurate.

[0059] On the basis of the above-mentioned embodiment, according to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the device radiation energy correction, which also includes: measuring the current ambient temperature, converting the atmospheric transmittance through the current ambient temperature; using the thermistor embedded in the microcavity collimation structure to obtain the temperature of the microcavity collimation structure; measuring the actual temperature of the target sample.

[0060] In this embodiment, before measuring the target, the atmospheric environment is pre-measured, the sensor response is recorded, and the atmospheric radiation energy under the current test environment is compensated. The atmospheric transmittance is converted by the current ambient temperature value, thereby achieving atmospheric compensation.

[0061] In this embodiment, absorbing a large amount of ambient radiation will cause the temperature of the microcavity alignment structure to rise, affecting the measurement accuracy. The temperature value measured by the embedded thermistor is used to achieve energy correction of the microcavity alignment structure.

[0062] Through the embodiments of the present disclosure, necessary data support is provided for the correction of radiation energy by data collection before measurement and embedding thermistors in the microcavity alignment structure.

[0063] On the basis of the above embodiment, according to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the device radiation energy correction; the emissivity measurement formula of the target sample is determined by the radiation energy expression formula, including: expressing the radiation energy received by the detection element as the sum of the atmospheric radiation energy, the device radiation energy and the target radiation energy to obtain the radiation energy expression formula; according to Stefan Boltzmann's law, the radiation energy expression formula is converted into a radiation temperature expression formula; the emissivity measurement formula is obtained by using the radiation temperature expression formula;

[0064] The radiation temperature expression formula is as follows:

[0065] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0066] Where T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant;

[0067] The emissivity measurement formula is as follows:

[0068]

[0069] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant.

[0070] In this embodiment, Figure 3 The schematic diagram of the multi-source correction temperature measurement model according to the embodiment of the present disclosure is schematically shown. Figure 3 As shown, by analyzing the principle of multi-source correction of the present disclosure, the final emissivity measurement formula is obtained as follows:

[0071] (1) Before adding the microcavity collimation structure, the total radiation received by the sensor detector can be approximated as:

[0072] W tot =α·ε·W obj +α·(1-ε)·W amb +(1-α)W atm

[0073] Where ε is the emissivity of the target to be measured; α is the transmittance; ε·W obj is the radiation energy of the target, which is α·ε·W after atmospheric attenuation obj ; W amb The energy radiated from non-target radiation sources in the environment to the target surface is (1-ε)·W after being reflected by the target surface. amb , after atmospheric attenuation, it becomes α·(1-ε)·W amb ; (1-α)W atm is the radiant energy of the atmosphere.

[0074] (2) After correction by the microcavity collimation structure, the energy radiated from the non-target radiation source to the target surface is approximately eliminated. Therefore, the radiation energy W' after correction by the microcavity collimation tube is tow for:

[0075] W′ tot =α·ε·W′ obj +(1-α)W atm

[0076] Among them, ε·W' obj is the radiation energy within a limited angle in the effective area of ​​the target. Illegal radiation from the target and non-target radiation are eliminated as well; (1-α)W atm is the radiant energy of the atmosphere.

[0077] (3) Absorbing a large amount of environmental radiation will cause the temperature of the microcavity collimation structure to rise, affecting the measurement accuracy. The present disclosure fills the inner and outer walls with coolant to alleviate the temperature rise problem of the microcavity collimation structure. At the same time, the temperature value measured by the embedded thermistor is further corrected. The corrected total radiation energy W″ tot (That is, the radiation energy expression formula) is:

[0078] W″ tot =α·ε·W′ obj +(1-α)W atm +ε w ·W w

[0079] Among them, ε·W' obj is the radiation energy within a limited angle in the target effective area; (1-α)W atm is the radiant energy of the atmosphere;w ·W w is the radiation energy of the microcavity collimation structure, which is related to the temperature of the microcavity collimation structure and the emissivity of the surface coating ε w Closely related.

[0080] (4) According to Stefan Boltzmann's law, it is converted to:

[0081] T0' n =αεT0 n +α(1-ε)T u n +ε w T w n

[0082] Where T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant.

[0083] (5) The final emissivity measurement formula is obtained by conversion:

[0084]

[0085] Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant.

[0086] Through the embodiments of the present disclosure, the radiation energy is expressed as the sum of the atmospheric radiation energy, the structural radiation energy and the target radiation energy, and is converted into a radiation temperature expression formula according to the Stefan-Boltzmann law. The target, atmosphere, ambient temperature and sensor are corrected respectively, and a radiation measurement model is constructed based on the correction results, ultimately achieving accurate measurement of the target emissivity.

[0087] On the basis of the above embodiment, the emissivity measurement model is used to determine the emissivity of the target sample, including: querying the temperature-voltage curve of the detection element according to the response voltage of the detection element to determine the target radiation temperature; substituting the actual temperature, target radiation temperature, atmospheric transmittance, current ambient temperature and the temperature of the microcavity collimation structure into the emissivity measurement formula to determine the emissivity of the target sample.

[0088] In this embodiment, the target radiation temperature is converted according to the temperature-voltage curve of the detection element; the target real temperature is measured by a thermocouple; the atmospheric transmittance is converted when the environmental compensation is constructed as described above; and the temperature of the microcavity collimation structure is obtained by a sensor.

[0089] According to the embodiments of the present disclosure, the target radiation temperature-response voltage curve is queried based on the response voltage of the detection element, and relevant parameters are substituted into the radiation temperature expression formula to calculate the emissivity of the target sample, so as to realize fast and accurate measurement of the emissivity.

[0090] Based on the above embodiments, according to the response voltage of the detection element, the detection element temperature-voltage curve is queried to determine the target radiation temperature, including: within the temperature measurement range of the detection element, the change value of the response voltage is collected at a preset temperature interval; the temperature measurement range is divided into multiple temperature intervals, and for each temperature interval, the detection element temperature-voltage curve is fitted by means of piecewise linear fitting.

[0091] In this embodiment, during the measurement process, according to the current response U of the thermosensor, the T-U curve database is queried to obtain the target radiation temperature T0'.

[0092] Among them, the nonlinear thermosensor T-U curve is calibrated by using the method of piecewise linearization. The specific method is as follows:

[0093] First, within the temperature measurement range, the change value of the output response U of the thermosensor is collected at intervals of ΔT, and the temperature measurement range is divided into multiple temperature intervals t. Within the interval t, the T-U curve is fitted by means of piecewise linear fitting. The linear expression before fitting is:

[0094] U t =β 0t +β 1t T t

[0095] It is assumed that a turning point of the T-U curve appears at the moment t0 within the temperature interval t. An auxiliary variable A is constructed, where A = 0 when t < t0, and vice versa A = 1. The T-U curve within this temperature segment can be approximately expressed as:

[0096] U t =β 0t +β 1t T t +β 2t (T t -T t0 )A

[0097] The T-U curve after piecewise fitting can be approximately:

[0098] When t < t0, U t =β 0t +β 1t T t ;

[0099] When t > t0, U t =β 0t -β2t T t +β 1t T t +β 2t T t ;

[0100] When t = t0, U t =β 0t +β 1t T t =β 0t -β 2t T t +β 1t T t +β 2t T t ;

[0101] Among them, β 0t , β 1t , β 2t are the parameter values ​​of the fitting curve, and different subscripts represent the fitting coefficients of different segments; A is an auxiliary variable; U t is the voltage at time t; T t is the temperature at time t.

[0102] Through the embodiments of the present disclosure, within the temperature measurement range of the sensor, the change value of the response voltage is collected at preset temperature intervals, and the target radiation temperature-response voltage curve is fitted by a piecewise linear fitting method, and the sensor is nonlinearly corrected to improve the accuracy of the target radiation temperature-response voltage curve. Finally, a radiation measurement model after multi-source correction is constructed to achieve accurate measurement of emissivity.

[0103] Therefore, the present invention realizes the measurement of emissivity based on the energy method, proposes a microcavity collimation structure, an atmospheric compensation mode and a sensor segmented nonlinear correction method, and constructs a multi-source corrected emissivity measurement model from three aspects: the target to be measured, the transmission path and the sensor, thereby improving the accuracy of the emissivity measurement. The device has a simple structure, high measurement accuracy and a wide range of applications.

[0104] Based on the above emissivity measurement method, the present disclosure also provides an emissivity measurement device based on multi-source correction, which can be used to implement any of the above emissivity measurement methods based on multi-source correction. Figure 4 The device is described in detail.

[0105] Figure 4 The structure block diagram of the emissivity measurement device based on multi-source correction according to an embodiment of the present disclosure is schematically shown.

[0106] like Figure 4 As shown, the emissivity measurement device 400 of this embodiment includes an emissivity measurement model module 401 and an emissivity calculation module 402 .

[0107] The emissivity measurement model module is used to establish an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and target non-normal radiation energy through the microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of the radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error. In one embodiment, the emissivity measurement model module 401 can be used to perform the operation S1 described above, which will not be repeated here.

[0108] The emissivity calculation module is used to determine the emissivity of the target sample using the emissivity measurement model. In one embodiment, the emissivity calculation module 402 can be used to perform the operation S2 described above, which will not be described in detail here.

[0109] The present disclosure also provides an electronic device suitable for implementing an emissivity measurement method based on multi-source correction.

[0110] The electronic device according to the embodiment of the present disclosure includes a processor, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) or a program loaded from a storage portion into a random access memory (RAM). The processor may include, for example, a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or a related chipset and / or a special-purpose microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor may also include an onboard memory for caching purposes. The processor may include a single processing unit or multiple processing units for performing different actions of the method flow according to the embodiment of the present disclosure.

[0111] In RAM, various programs and data required for the operation of the electronic device are stored. The processor, ROM and RAM are connected to each other through a bus. The processor performs various operations of the method flow according to the embodiment of the present disclosure by executing the program in ROM and / or RAM. It should be noted that the program can also be stored in one or more memories other than ROM and RAM. The processor can also perform various operations of the method flow according to the embodiment of the present disclosure by executing the program stored in one or more memories.

[0112] According to an embodiment of the present disclosure, the electronic device may further include an input / output (I / O) interface, which is also connected to the bus. The electronic device may also include one or more of the following components connected to the I / O interface: an input part including a keyboard, a mouse, etc.; an output part including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker; a storage part including a hard disk, etc.; and a communication part including a network interface card such as a LAN card, a modem, etc. The communication part performs communication processing via a network such as the Internet. The drive is also connected to the I / O interface as needed. Removable media, such as disks, optical disks, magneto-optical disks, semiconductor memories, etc., are installed on the drive as needed so that the computer program read therefrom is installed into the storage part as needed.

[0113] The present disclosure also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments; or may exist independently without being assembled into the device / apparatus / system. The above computer-readable storage medium carries one or more programs, and when the above one or more programs are executed, the method according to the embodiment of the present disclosure is implemented.

[0114] The embodiment of the present disclosure also includes a computer program product, which includes a computer program, and the computer program contains program code for executing the method shown in the flowchart. When the computer program product is run in a computer system, the program code is used to enable the computer system to implement the method provided by the embodiment of the present disclosure.

[0115] According to an embodiment of the present disclosure, the program code for executing the computer program provided by the embodiment of the present disclosure can be written in any combination of one or more programming languages. Specifically, these computing programs can be implemented using high-level process and / or object-oriented programming languages, and / or assembly / machine languages. Programming languages ​​include, but are not limited to, Java, C++, python, "C" language or similar programming languages. The program code can be executed entirely on the user computing device, partially on the user device, partially on the remote computing device, or entirely on the remote computing device or server. In the case of a remote computing device, the remote computing device can be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or can be connected to an external computing device (for example, using an Internet service provider to connect through the Internet).

[0116] The flow charts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each box in the flow chart or block diagram can represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flow chart, and the combination of the boxes in the block diagram or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0117] It will be appreciated by those skilled in the art that the features described in the various embodiments and / or claims of the present disclosure may be combined and / or combined in a variety of ways, even if such combinations and / or combinations are not explicitly described in the present disclosure. In particular, the features described in the various embodiments and / or claims of the present disclosure may be combined and / or combined in a variety of ways without departing from the spirit and teachings of the present disclosure. All of these combinations and / or combinations fall within the scope of the present disclosure.

[0118] The embodiments of the present disclosure are described above. However, these embodiments are only for illustrative purposes and are not intended to limit the scope of the present disclosure. Although the embodiments are described above separately, this does not mean that the measures in the various embodiments cannot be used in combination to advantage. The scope of the present disclosure is defined by the attached claims and their equivalents. Without departing from the scope of the present disclosure, those skilled in the art may make a variety of substitutions and modifications, which should all fall within the scope of the present disclosure.

Claims

1. A method for measuring emissivity based on multi-source correction, characterized in that: include: Establish an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and non-target radiation energy in the illegal direction through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error; Using the emissivity measurement model, the emissivity of the target sample is determined.

2. The method according to claim 1, wherein: Build an emissivity measurement model, including: Using a microcavity collimation structure, the normal radiation energy emitted by the target sample is transmitted to the detection element to complete the radiation source correction; According to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the radiation energy correction of the device; through the radiation energy expression formula, an emissivity measurement formula of the target sample is determined; Wherein, the atmospheric environment parameters at least include the current ambient temperature.

3. The method according to claim 2, wherein: The microcavity collimation structure is used to transmit the normal radiation energy emitted by the target sample to the detection element to complete the radiation source correction, including: According to preset parameters, the diameter and radius of the microcavity collimation structure are adjusted; the preset parameters include at least one of the temperature of the target sample, the effective width of the detection element, and the detection distance of the microcavity collimation structure; The microcavity alignment structure is installed at the front end of the detection element to process the radiation energy emitted by the target sample and transmit it to the detection element.

4. The method according to claim 3, wherein: According to the preset parameters, the diameter and radius of the microcavity alignment structure are adjusted, including: Determine the diameter of the microcavity collimator according to the preset diameter of the area to be detected of the target sample and the measurement temperature range of the target sample; The length of the microcavity collimation structure is calculated using the diameter of the area to be detected, the effective width of the detection element, the detection distance of the microcavity collimation structure and the diameter of the microcavity collimation structure; The formula for calculating the length of the microcavity alignment structure is as follows: Wherein, L2 is the length of the microcavity collimation structure; L1 is the detection distance of the microcavity collimation structure; D is the diameter of the microcavity collimation structure; S is the effective width of the detection element; and L is the diameter of the area to be detected.

5. The method according to claim 3, wherein: The microcavity alignment structure is also equipped with a cooling device.

6. The method according to claim 2, wherein: According to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the radiation energy correction of the device, which also includes: Measure the current ambient temperature and convert the atmospheric transmittance based on the current ambient temperature; Using the thermistor embedded in the microcavity alignment structure, the temperature of the microcavity alignment structure is obtained; Measure the true temperature of the target sample.

7. The method according to claim 2, wherein: According to the atmospheric environment parameters and the radiation energy of the device, a radiation energy expression formula is obtained to complete the atmospheric environment correction and the radiation energy correction of the device; The emissivity measurement formula of the target sample is determined by the radiation energy expression formula, including: The radiation energy received by the detection element is expressed as the sum of the atmospheric radiation energy, the device radiation energy and the target radiation energy, and the radiation energy expression formula is obtained; According to Stefan Boltzmann's law, the radiation energy expression formula is converted into a radiation temperature expression formula; The emissivity measurement formula is obtained by using the radiation temperature expression formula; The radiation temperature expression formula is as follows: T0' n =αεT0 n +α(1-ε)T u n +e w T w n Where T0' is the target radiation temperature; α is the atmospheric transmittance; ε is the emissivity of the target sample; ε w is the emissivity of the internal coating material of the microcavity collimation material; T0 is the actual temperature of the target sample; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant; Wherein, the emissivity measurement formula is as follows: Where T0' is the target radiation temperature; α is the atmospheric transmittance; T0 is the actual temperature of the target sample; ε w is the emissivity of the internal coating material of the microcavity collimating material; T u is the current ambient temperature; T w is the temperature of the microcavity alignment structure; n is a constant.

8. The method according to claim 7, wherein Determining the emissivity of a target sample using the emissivity measurement model includes: According to the response voltage of the detection element, query the temperature-voltage curve of the detection element to determine the target radiation temperature; The real temperature, the target radiation temperature, the atmospheric transmittance, the current ambient temperature and the temperature of the microcavity collimating structure are substituted into the emissivity measurement formula to determine the emissivity of the target sample.

9. The method according to claim 8, wherein: According to the response voltage of the detection element, querying the temperature-voltage curve of the detection element to determine the target radiation temperature includes: Within the temperature measurement range of the detection element, the change value of the response voltage is collected at preset temperature intervals; The temperature measurement range is divided into multiple temperature intervals. For each temperature interval, the temperature-voltage curve of the detection element is fitted by piecewise linear fitting.

10. An emissivity measurement device based on multi-source correction, characterized in that: The device can be used to implement any method as claimed in claims 1 to 9, and the device comprises: An emissivity measurement model module is used to establish an emissivity measurement model; the emissivity measurement model includes at least one of radiation source correction, atmospheric environment correction, device radiation energy correction, and detection element segmented nonlinear fitting correction; the radiation source correction is used to remove the influence of non-target radiation sources and non-target radiation energy in the illegal direction through a microcavity collimation structure installed at the front end of the detection element; the atmospheric environment correction is used to remove the influence of atmospheric environment attenuation error; the device radiation energy correction is used to remove the influence of radiation energy of the microcavity collimation structure; the detection element segmented nonlinear fitting correction is used to reduce the influence of the detection element temperature-voltage fitting error; The emissivity calculation module is used to determine the emissivity of the target sample using the emissivity measurement model.

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