Test method and related device

Abstract

The embodiment of the invention provides a test method, which comprises the following steps of: when the alternating current noise of a target object is measured, firstly obtaining a circuit board file of the target object; and obtaining a typical direct current voltage value, a maximum direct current voltage value (namely the maximum voltage value received by the power supply pin) and a minimum direct current voltage value (namely the minimum voltage value received by the power supply pin) corresponding to the circuit board file, and finally determining the alternating current noise corresponding to the target object according to the first power supply parameter corresponding to the circuit board file. Therefore, the AC noise of the target object is determined by comprehensively considering the first power supply parameter of the target object, so that the range of the AC noise corresponding to the target object can be determined more accurately, the determined AC noise has more guiding significance for guiding the design of the tested equipment, and potential problems can be eliminated in a design simulation stage.

Description

Technical Field

[0001] The present specification relates to the field of testing technology, specifically, to processor testing technology under the field of testing technology, and more specifically, to a testing method and related devices. Background Art

[0002] For chips such as processors, their operating voltage range and typical DC voltage value will be marked in their chip data sheets. Currently, when testing chips, the power supply AC noise is defined as the difference between the operating voltage range and the typical DC voltage value. The accuracy of the power supply AC noise determined in this way is poor, which may cause the power supply voltage received by a pin of the chip to exceed the operating voltage range of the chip during actual operation. Summary of the invention

[0003] The embodiments of this specification provide a testing method and related devices to achieve the purpose of accurately measuring the AC noise corresponding to the device under test.

[0004] To achieve the above technical objectives, the embodiments of this specification provide the following technical solutions:

[0005] In a first aspect, an embodiment of the present specification provides a test method for determining AC noise of a target object in a device under test (DUT), wherein the DUT further includes a power supply module, wherein the power supply module is used to supply power to the target object, and the test method includes:

[0006] Acquire a circuit board file corresponding to the target object, wherein the circuit board file is used to describe a design scheme of a power supply module in the DUT, wherein the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object;

[0007] Based on the circuit board file, a first power supply parameter corresponding to the circuit board file is obtained, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object;

[0008] The AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file.

[0009] In a second aspect, an embodiment of the present specification provides a test system, including: a detection unit and a device under test (DUT), wherein the DUT includes a power supply module and a target object; the power supply module is connected to the target object, and the detection unit is connected to the target object; wherein,

[0010] The detection unit is configured to: obtain a circuit board file corresponding to the target object, the circuit board file is used to describe a design scheme of a power supply module in the DUT, and the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object;

[0011] Based on the circuit board file, a first power supply parameter corresponding to the circuit board file is obtained, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object;

[0012] The AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file.

[0013] In a third aspect, an embodiment of the present specification further provides a computing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the testing method as described above when executing the computer program.

[0014] In a fourth aspect, an embodiment of the present specification further provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the test method described above is implemented.

[0015] In a fifth aspect, an embodiment of the present specification provides a computer program product or a computer program, wherein the computer program product includes a computer program, and the computer program is stored in a computer-readable storage medium; the processor of the computer device reads the computer program from the computer-readable storage medium, and the processor implements the steps of the above-mentioned test method when executing the computer program.

[0016] It can be seen from the above technical scheme that when measuring the AC noise of the target object, the test method provided in the embodiment of this specification first obtains the circuit board file of the target object, and then obtains the first power supply parameter corresponding to the circuit board file based on the circuit board file, the first power supply parameter includes the typical DC voltage value of the target object, the maximum DC voltage value (i.e., the maximum voltage value received by the power pin of the target object) and the minimum DC voltage value (i.e., the minimum voltage value received by the power pin of the target object), and finally determines the AC noise corresponding to the target object according to the first power supply parameter corresponding to the circuit board file. In this way, comprehensively considering the first power supply parameter of the target object to determine the AC noise of the target object is conducive to more accurately determining the range of the AC noise corresponding to the target object, so that the determined AC noise is more instructive for guiding the design of the device under test, and is conducive to eliminating potential problems in the design simulation stage. On the one hand, it is conducive to shortening the product design cycle, and on the other hand, it effectively avoids the situation in which the voltage received by the power pin of the target object exceeds its working voltage range during the working process. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of this specification or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this specification. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0018] Figure 1 A flow chart of a testing method provided for an embodiment of this specification;

[0019] Figure 2 A schematic diagram of the structure of a test system provided for an embodiment of this specification;

[0020] Figure 3 A schematic diagram of a detection point position, a power supply current flow direction, a maximum DC voltage value detection position, and a minimum DC voltage value detection position of a target object during a test provided by an embodiment of this specification;

[0021] Figure 4 A schematic diagram of the structure of a computing device provided for an embodiment of this specification. DETAILED DESCRIPTION

[0022] Unless otherwise defined, the technical terms or scientific terms used in the embodiments of this specification shall have the common meanings understood by persons with ordinary skills in the field to which this specification belongs. The words "first", "second" and similar words used in the embodiments of this specification do not indicate any order, quantity or importance, but are only used to avoid confusion of constituent elements.

[0023] Unless the context requires otherwise, throughout the specification, "plurality" means "at least two", and "including" is interpreted as an open, inclusive meaning, that is, "including, but not limited to". In the description of the specification, the terms "one embodiment", "some embodiments", "exemplary embodiments", "examples", "specific examples" or "some examples" are intended to indicate that a particular feature, structure, material or characteristic associated with the embodiment or example is included in at least one embodiment or example of the specification. The schematic representation of the above terms does not necessarily refer to the same embodiment or example.

[0024] The following will be combined with the drawings in the embodiments of this specification to clearly and completely describe the technical solutions in the embodiments of this specification. Obviously, the described embodiments are only part of the embodiments of this specification, not all of the embodiments. Based on the embodiments in this specification, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this specification.

[0025] Overview

[0026] For chips such as processors, the chip data sheet will mark its operating voltage range and typical DC voltage value. When testing the device under test (DUT) containing the chip, the tester can define the AC noise based on the operating voltage range and typical DC voltage value, so as to use the AC noise to guide the power supply design of the device under test to meet the working requirements of the chip. For example, assuming that the data sheet of a chip indicates that its operating voltage range is: 4.75V~5.25V, and the typical DC voltage value is 5.0V, when defining the AC noise based on the above method, the maximum allowable value of the AC noise = max (typical DC voltage value-minimum voltage, maximum voltage-typical DC voltage value) = max (5.0V-4.75V, 5.25V-5.0V) = 0.25V. After determining the AC noise, the power supply module of the device under test is designed based on the AC noise = 0.25V to ensure that the voltage provided by the power supply module to each pin of the chip during actual operation is within the range of 4.75V~5.25V. However, the above method for measuring AC noise cannot obtain an accurate range of AC noise, and after the AC noise is measured based on the above method, each pin of the chip will not be tested under various working conditions during testing, which may cause omissions of existing problems and reduce the overall robustness of the system. For example, assuming that the device under test is designed under the condition of AC noise of 0.25V, in actual use, the voltage value actually received by the power pin of the chip may exceed the upper voltage limit (that is, the voltage amplitude on the power pin exceeds the maximum allowable value defined by the above method). For example, assuming that the AC noise amplitude in the actual working process is 0.2V, the DC voltage drop and the position selection of the detection point (Sense point) of the VRM chip may cause the DC voltage of the chip to be higher than 5V or lower than 5V. Specifically, assuming that the valley DC voltage of the chip power pin is 4.8V, its negative noise is 0.2V, and the pin voltage at this time is actually 4.6V, which is lower than the lower limit of the working voltage range of 4.75V indicated in the data sheet of the chip. For another example, assuming that the peak DC voltage of the chip power pin is 5.1V and the forward noise is 0.2V, the pin voltage is actually 5.3V, which is higher than the upper limit of the operating voltage range of 5.25V indicated in the chip data sheet.

[0027] In the above case, when the chip pin voltage is 5.3V, it exceeds the upper limit of the chip's operating voltage range of 5.25V, and when the chip pin voltage is 4.6V, it also exceeds the lower limit of the chip's operating voltage range of 4.75V. Therefore, in the actual operation of the chip, the voltage on one or some power pins has exceeded its specified operating voltage range, which may cause the chip to be damaged during the actual operation due to receiving a voltage beyond the operating voltage range, which has an adverse effect on the robustness of the system.

[0028] In order to avoid the above problems, the inventor has found through research that when measuring the AC noise of the target object, the circuit board file of the target object can be first obtained, and then based on the circuit board file, the first power supply parameter corresponding to the circuit board file is obtained, and the first power supply parameter includes the typical DC voltage value of the target object, the maximum DC voltage value (i.e., the maximum voltage value received by the power pin of the target object) and the minimum DC voltage value (i.e., the minimum voltage value received by the power pin of the target object), and finally the AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file. In this way, the AC noise of the target object is determined by comprehensively considering the first power supply parameter of the target object, which is conducive to more accurately determining the range of the AC noise corresponding to the target object, so that the determined AC noise is more instructive for guiding the design of the device under test, which is conducive to eliminating potential problems in the design simulation stage, which is conducive to shortening the product design cycle on the one hand, and effectively avoiding the situation in which the voltage received by the power pin of the target object exceeds its working voltage range during the working process on the other hand.

[0029] Based on the above-mentioned inventive concept, the embodiment of this specification provides a testing method, and the testing method provided in the embodiment of this specification will be exemplarily described below in conjunction with the accompanying drawings.

[0030] Exemplary Methods

[0031] like Figure 1 As shown, the embodiment of this specification provides a test method for determining the AC noise of a target object in a device under test DUT, wherein the DUT further includes a power supply module, and the power supply module is used to supply power to the target object. The test method includes:

[0032] S101: Acquire a circuit board file corresponding to the target object, where the circuit board file is used to describe a design scheme of a power supply module in the DUT, where the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object;

[0033] The target objects include but are not limited to processor chips in the DUT, PCIe (Peripheral Component Interconnect Express) modules and other objects. Taking the target object as a processor chip as an example, the operating current of the processor core of some high-power processor chips is tens or even hundreds of amperes, which means that there may be relatively large AC noise in the working environment of these processor chips. Accurately measuring the AC noise is of great significance to ensure the normal operation of these processor chips.

[0034] The circuit board file can be used to describe the layout plan of each module in the DUT, for example, it can include the design plan of the power supply module in the DUT, and the design plan can include parameters that affect the DC voltage drop from the power supply module to the target object (such as the distance from the power supply module to the target object, the decoupling design between the power supply module and the target object, and other parameters).

[0035] In some embodiments, the target object may correspond to multiple circuit board files, and different circuit board files may include different power supply module design schemes. In this way, the DC voltage drop and other conditions of the target object in the design schemes of different power supply modules can be comprehensively considered, so as to comprehensively determine the accurate AC noise corresponding to the target object.

[0036] S102: Based on the circuit board file, obtain a first power supply parameter corresponding to the circuit board file, the first power supply parameter including a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object;

[0037] After obtaining the circuit board file, the first power supply parameters corresponding to the circuit board file can be obtained based on the circuit board file through simulation or experimental measurement. Since the first power supply parameters include the maximum DC voltage value of the target object and the minimum DC voltage value of the target object, when the AC noise is subsequently measured based on the first power supply parameters, the maximum DC voltage value and the minimum DC voltage value of the target object (that is, the DC voltage drop of the target object) can be comprehensively considered, so that the AC noise of the target object can be measured more accurately.

[0038] S103: Determine AC noise corresponding to the target object according to the first power supply parameter corresponding to the circuit board file.

[0039] In general, the test method provided in the embodiment of this specification, when measuring the AC noise of the target object, first obtains the circuit board file of the target object, and then obtains the first power supply parameter corresponding to the circuit board file based on the circuit board file, the first power supply parameter includes the typical DC voltage value of the target object, the maximum DC voltage value (i.e., the maximum voltage value received by the power pin of the target object) and the minimum DC voltage value (i.e., the minimum voltage value received by the power pin of the target object), and finally determines the AC noise corresponding to the target object according to the first power supply parameter corresponding to the circuit board file. In this way, the AC noise of the target object is determined by comprehensively considering the first power supply parameter of the target object, which is conducive to more accurately determining the range of the AC noise corresponding to the target object, so that the determined AC noise is more instructive for guiding the design of the device under test, which is conducive to eliminating potential problems in the design simulation stage, which is conducive to shortening the product design cycle on the one hand, and effectively avoiding the situation in which the voltage received by the power pin of the target object exceeds its working voltage range during the working process on the other hand.

[0040] In one embodiment, a feasible method for determining AC noise corresponding to a target object based on a first power supply parameter is provided, specifically, the target object corresponds to a plurality of circuit board files;

[0041] The determining, according to the first power supply parameter corresponding to the circuit board file, the AC noise corresponding to the target object comprises:

[0042] Determine the bias parameters corresponding to the circuit board files according to the first power supply parameters corresponding to each circuit board file, wherein the bias parameters include a positive bias and a negative bias, the positive bias includes a difference between the maximum DC voltage value and the typical DC voltage value, and the negative bias includes a difference between the typical DC voltage value and the minimum DC voltage value;

[0043] According to the bias parameters corresponding to each of the circuit board files, a statistical bias parameter corresponding to the target object is obtained, wherein the statistical bias parameter includes a statistical positive bias and a statistical negative bias, wherein the statistical positive bias includes an average value or a root mean square value of a plurality of the positive biases, and the statistical negative bias includes an average value or a root mean square value of a plurality of the negative biases;

[0044] The AC noise corresponding to the target object is determined according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object.

[0045] In this embodiment, the AC noise is determined based on the first power supply parameters corresponding to multiple circuit board files, which weakens the influence of individual difference factors of a single circuit board design on the AC noise, and is conducive to accurately obtaining the AC noise of the target object under different design schemes of the comprehensive target object.

[0046] In an optional implementation, a feasible method for obtaining the AC noise of a target object based on a statistical bias parameter and an operating voltage range of the target object is provided. Specifically, determining the AC noise corresponding to the target object according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object includes:

[0047] Substituting the statistical bias parameter corresponding to the target object, the typical DC voltage value of the target object and the operating voltage range of the target object into a preset formula, and calculating the maximum positive noise and the maximum negative noise corresponding to the target object;

[0048] Determining the AC noise corresponding to the target object according to the maximum positive noise and the maximum negative phase noise corresponding to the target object;

[0049] The preset formula includes: Wherein, ΔV1 represents the maximum positive noise, ΔV2 represents the maximum negative phase noise, Vtype represents the typical DC voltage value, Vmax represents the maximum operating voltage acceptable to the target object, Vmin represents the minimum operating voltage acceptable to the target object, and a v represents the statistical positive bias, b v indicates that the statistics are negatively biased.

[0050] After obtaining the maximum positive noise and the maximum negative noise, the AC noise of the target object can be obtained as: (-ΔV2, +ΔV1).

[0051] In this embodiment, when determining the maximum positive noise and the maximum negative noise, in addition to the maximum operating voltage, the typical DC voltage value and the minimum operating voltage, the statistical positive bias (maximum positive transient current) and the statistical negative bias (maximum negative transient current) of the target object are also considered. Since the PDN impedance (Power Distribution Network Impedance) is relatively fixed, the statistical positive bias and the statistical negative bias have a greater impact on the maximum positive noise and the maximum negative noise in the AC noise, and are the main factors for determining the maximum positive noise and the maximum negative noise. Therefore, comprehensively considering the statistical positive bias and the statistical negative bias of the target object to determine the AC noise can make the determined AC noise closer to the actual situation, so that the obtained AC noise of the target object has more practical guiding significance for the design of the DUT, and reduces the probability that the voltage received by one or some power pins of the target object exceeds the operating voltage range during actual use.

[0052] In the process of determining AC noise, it is also possible to preliminarily determine whether the design of the circuit board file is reasonable based on the relationship between the bias parameter and the voltage threshold, so as to correct the relevant design in advance. Specifically, in one embodiment, before obtaining the statistical bias parameter corresponding to the target object based on the bias parameter corresponding to each circuit board file, it also includes:

[0053] Determine whether the sum of the bias parameters is greater than or equal to a voltage threshold, and if so, return to the step of obtaining a first power supply parameter corresponding to the circuit board file based on the circuit board file after correcting the circuit board file; the voltage threshold includes the difference between the maximum operating voltage acceptable to the target object and the minimum operating voltage acceptable to the target object;

[0054] If not, a step of determining the AC noise corresponding to the target object according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object is performed.

[0055] In this embodiment, if the sum of the bias parameters is greater than or equal to the voltage threshold, it indicates that the DC voltage drop of the target object has exceeded the voltage fluctuation allowed by the operating voltage range of the target object, and there is a voltage value received by at least one power pin of the target object that exceeds the operating voltage range of the target object. It is necessary to modify the circuit board file and redesign the power plane so that the voltage received by the power pin of the target object is within the operating voltage range. In this way, after determining the bias parameters, the rationality of the power design scheme can be judged based on the relationship between the sum of the bias parameters and the voltage threshold, which is conducive to avoiding the situation where the voltage received by the power pin of the target object exceeds the operating voltage range during the actual operation of the target object.

[0056] In one embodiment, a feasible process for obtaining a first power supply parameter is provided. Specifically, obtaining the first power supply parameter corresponding to the circuit board file based on the circuit board file includes:

[0057] Under the condition of the maximum working current of the target object, simulation is performed based on each of the circuit board files to obtain the voltage at the detection point position of the target object, the maximum DC voltage value of the target object, and the minimum DC voltage value;

[0058] The voltage at the detection point of the target object is used as a typical DC voltage value of the target object to obtain the first power supply parameter corresponding to each circuit board file.

[0059] In this embodiment, when the target object is at the maximum operating current, simulation is performed based on each of the circuit board files to obtain the first power supply parameters under a condition of greater noise interference. The AC noise is determined based on the first power supply parameters obtained by this method, and the AC noise of the target object under a condition of greater noise interference can be obtained, so that the designer can improve the design of the DUT based on the AC noise obtained in this case to ensure the normal operation of the target object under a condition of greater noise interference.

[0060] In a specific implementation, a feasible specific implementation process of a test method is provided, specifically, referring to Figure 2 and Figure 3 , Figure 2 A feasible system for implementing the test method is shown, which may include a detection unit and a DUT, the DUT may include a power supply module and a target object, and the power supply module may specifically include a VRM (Voltage Regulation Module) chip. The detection unit may include a test instrument such as an oscilloscope, and the detection unit is connected to the target object through a probe (or probe) to obtain relevant data of the target object during the test process.

[0061] Figure 3 A schematic diagram showing the detection point position of the target object, the supply current flow direction, the maximum DC voltage value detection position and the minimum DC voltage value detection position during the test process.

[0062] In one implementation, taking the target object as a processor and the detection object as the core voltage of the processor as an example, a feasible implementation is given:

[0063] S1. Prepare multiple circuit board files of the processor. For easy distinction, the circuit board files of the processor can be marked as PCB0, PCB1, PCB2, etc. In order to accurately perform simulation, the stacking parameters corresponding to the circuit board files can also be recorded.

[0064] S2. According to the pin definition of the processor, the detection point position is set. Under the condition of maximum working current (for example, 90A), the power supply DC voltage drop simulation is performed on each circuit board file obtained in S1, and the voltage at the detection point position is recorded as Vtype. The voltage at the maximum power pin voltage in the processor is recorded as V+ai (i=0,1,2..., the value of i corresponds to the circuit board file), and the voltage at the minimum power pin voltage in the processor is recorded as V-bi (i=0,1,2..., the value of i corresponds to the circuit board file).

[0065] S3, according to the parameters recorded in step S2, the positive bias (a0, a1, a2...) and the negative bias (b0, b1, b2...) are obtained, and the average value or the root mean square value of each positive bias and each negative bias is taken to obtain the statistical positive bias a v and statistical negative bias b v ;

[0066] S4. Judgment (a v +b v ) is less than (Vmax-Vmin), if not, then modify the circuit board file, redesign the power plane to ensure that the pins on the chip do not exceed the operating voltage range (due to the inconsistency of the effective flow area caused by the difference in the power copper plating in the PCB, the voltage drop will be different), if so, proceed to step S5;

[0067] S5. Based on the following set of equations, a preset formula is obtained:

[0068]

[0069] S6, substituting the statistical bias parameter corresponding to the target object, the typical DC voltage value of the target object, and the operating voltage range of the target object into a preset formula to calculate the maximum positive noise and the maximum negative noise corresponding to the target object;

[0070]

[0071] Exemplary Systems

[0072] In one embodiment of the present specification, a testing system is also provided. Figure 3 As shown, it includes: a detection unit and a device under test DUT, the DUT includes a power supply module and a target object; the power supply module is connected to the target object, and the detection unit is connected to the target object; wherein,

[0073] The detection unit is configured to: obtain a circuit board file corresponding to the target object, the circuit board file is used to describe a design scheme of a power supply module in the DUT, and the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object;

[0074] Based on the circuit board file, a first power supply parameter corresponding to the circuit board file is obtained, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object;

[0075] The AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file.

[0076] Optionally, a decoupling capacitor is provided between the power supply module and the target object.

[0077] Regarding the specific limitations of the detection unit executing the test method provided in any of the above embodiments, reference may be made to the relevant limitations above, and this specification will not elaborate on them here.

[0078] Exemplary Devices

[0079] In an exemplary embodiment of the present specification, a test device is further provided for determining AC noise of a target object in a device under test (DUT), wherein the DUT further comprises a power supply module, wherein the power supply module is used to supply power to the target object, and the test device comprises:

[0080] A file acquisition module, used to acquire a circuit board file corresponding to the target object, wherein the circuit board file is used to describe a design scheme of a power supply module in the DUT, wherein the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object;

[0081] A parameter simulation module, used for obtaining a first power supply parameter corresponding to the circuit board file based on the circuit board file, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object;

[0082] The noise determination module is used to determine the AC noise corresponding to the target object according to the first power supply parameter corresponding to the circuit board file.

[0083] For the specific definition of the test device, please refer to the definition of the test method above, which will not be repeated here. Each module in the above-mentioned test device can be implemented in whole or in part by software, hardware and a combination thereof. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules.

[0084] Exemplary Computing Devices

[0085] Another embodiment of the present application further provides a computing device, see Figure 4As shown, an exemplary embodiment of the present specification also provides a computing device, including: a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the steps of the testing method according to various embodiments of the present specification described in the above embodiments of the present specification are executed.

[0086] The internal structure of the computing device can be as follows Figure 4 As shown, the computing device includes a processor, a memory, a network interface and an input device connected through a system bus. Among them, the processor of the computing device is used to provide computing and control capabilities. The memory of the computing device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computing device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, the steps of the test method according to various embodiments of the present specification described in the above embodiments of the present specification are performed.

[0087] The processor may include a main processor and may also include a baseband chip, a modem, etc.

[0088] The memory stores a program for executing the technical solution of the present invention, and may also store an operating system and other key services. Specifically, the program may include a program code, and the program code includes computer operation instructions. More specifically, the memory may include a read-only memory (ROM), other types of static storage devices that can store static information and instructions, a random access memory (RAM), other types of dynamic storage devices that can store information and instructions, a disk storage, a flash, and the like.

[0089] The processor may be a general-purpose processor, such as a general-purpose central processing unit (CPU), a microprocessor, etc., or an application-specific integrated circuit (ASIC), or one or more integrated circuits for controlling the execution of the program of the scheme of the present invention. It may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic device, a discrete gate or transistor logic device, or a discrete hardware component.

[0090] The input device may include a device for receiving data and information input by a user, such as a keyboard, a mouse, a camera, a scanner, a light pen, a voice input device, a touch screen, a pedometer, or a gravity sensor.

[0091] Output devices may include means that allow information to be output to a user, such as display screens, printers, speakers, etc.

[0092] The communication interface may include using any transceiver or the like to communicate with other devices or communication networks, such as Ethernet, Radio Access Network (RAN), Wireless Local Area Network (WLAN), etc.

[0093] The processor executes the program stored in the memory and calls other devices, which can be used to implement each step of any test method provided in the above embodiments of the present application.

[0094] The computing device may also include a display component and a voice component. The display component may be a liquid crystal display or an electronic ink display. The input device of the computing device may be a touch layer covered on the display component, or a button, trackball or touchpad provided on the housing of the computing device, or an external keyboard, touchpad or mouse.

[0095] Those skilled in the art will understand that Figure 4 The structure shown in the figure is only a block diagram of a part of the structure related to the scheme of this specification, and does not constitute a limitation on the computing device to which the scheme of this specification is applied. The specific computing device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0096] Exemplary computer program products and storage media

[0097] In addition to the above-mentioned methods and devices, the testing method provided in the embodiments of this specification may also be a computer program product, which includes computer program instructions, which, when executed by a processor, enable the processor to execute the steps of the testing method according to various embodiments of this specification described in the above "Exemplary Method" section of this specification.

[0098] The computer program product may be written in any combination of one or more programming languages ​​to write program code for performing the operations of the embodiments of the present specification, including object-oriented programming languages ​​such as Java, C++, etc., and conventional procedural programming languages ​​such as "C" or similar programming languages. The program code may be executed entirely on the user computing device, partially on the user device, as a separate software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0099] In addition, an embodiment of the present specification also provides a computer-readable storage medium on which a computer program is stored, and the computer program is executed by a processor to execute the steps of the testing method according to various embodiments of the present specification described in the above "Exemplary Method" section of the present specification.

[0100] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this specification can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0101] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0102] The above-mentioned embodiments only express several implementation methods of this specification, and the descriptions are relatively specific and detailed, but they cannot be understood as limiting the scope of the solutions provided by the embodiments of this specification. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of this specification, which all belong to the protection scope of this specification. Therefore, the protection scope of the patent of this specification shall be based on the attached claims.

Claims

1. A testing method, characterized in that: The device is used to determine the AC noise of a target object in a device under test (DUT), wherein the DUT further includes a power supply module, and the power supply module is used to supply power to the target object. The test method includes: Acquire a circuit board file corresponding to the target object, wherein the circuit board file is used to describe a design scheme of a power supply module in the DUT, wherein the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object; Based on the circuit board file, a first power supply parameter corresponding to the circuit board file is obtained, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object; The AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file.

2. The method according to claim 1, characterized in that The target object corresponds to a plurality of circuit board files; The determining, according to the first power supply parameter corresponding to the circuit board file, the AC noise corresponding to the target object comprises: Determine the bias parameters corresponding to the circuit board files according to the first power supply parameters corresponding to each circuit board file, wherein the bias parameters include a positive bias and a negative bias, the positive bias includes a difference between the maximum DC voltage value and the typical DC voltage value, and the negative bias includes a difference between the typical DC voltage value and the minimum DC voltage value; According to the bias parameters corresponding to each of the circuit board files, a statistical bias parameter corresponding to the target object is obtained, wherein the statistical bias parameter includes a statistical positive bias and a statistical negative bias, wherein the statistical positive bias includes an average value or a root mean square value of a plurality of the positive biases, and the statistical negative bias includes an average value or a root mean square value of a plurality of the negative biases; The AC noise corresponding to the target object is determined according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object.

3. The method according to claim 2, characterized in that The determining, according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object, the AC noise corresponding to the target object comprises: Substituting the statistical bias parameter corresponding to the target object, the typical DC voltage value of the target object and the operating voltage range of the target object into a preset formula, and calculating the maximum positive noise and the maximum negative noise corresponding to the target object; Determining the AC noise corresponding to the target object according to the maximum positive noise and the maximum negative phase noise corresponding to the target object; The preset formula includes: Wherein, ΔV1 represents the maximum positive noise, ΔV2 represents the maximum negative phase noise, Vtype represents the typical DC voltage value, Vmax represents the maximum operating voltage acceptable to the target object, Vmin represents the minimum operating voltage acceptable to the target object, and a v represents the statistical positive bias, b v indicates that the statistics are negatively biased.

4. The method according to claim 2, characterized in that: Before obtaining the statistical bias parameters corresponding to the target object according to the bias parameters corresponding to each of the circuit board files, the method further includes: Determine whether the sum of the bias parameters is greater than or equal to a voltage threshold, and if so, return to the step of obtaining a first power supply parameter corresponding to the circuit board file based on the circuit board file after correcting the circuit board file; the voltage threshold includes the difference between the maximum operating voltage acceptable to the target object and the minimum operating voltage acceptable to the target object; If not, a step of determining the AC noise corresponding to the target object according to the statistical bias parameter corresponding to the target object and the operating voltage range of the target object is performed.

5. The method according to claim 1, characterized in that: The obtaining, based on the circuit board file, a first power supply parameter corresponding to the circuit board file comprises: Under the condition of the maximum working current of the target object, simulation is performed based on each of the circuit board files to obtain the voltage at the detection point position of the target object, the maximum DC voltage value of the target object, and the minimum DC voltage value; The voltage at the detection point of the target object is used as a typical DC voltage value of the target object to obtain the first power supply parameter corresponding to each circuit board file.

6. The method according to any one of claims 1 to 5, characterized in that: The target object includes a processor.

7. A testing system, characterized in that: include: A detection unit and a device under test (DUT), wherein the DUT includes a power supply module and a target object; the power supply module is connected to the target object, and the detection unit is connected to the target object; wherein, The detection unit is configured to: obtain a circuit board file corresponding to the target object, the circuit board file is used to describe a design scheme of a power supply module in the DUT, and the design scheme includes parameters that affect a DC voltage drop from the power supply module to the target object; Based on the circuit board file, a first power supply parameter corresponding to the circuit board file is obtained, wherein the first power supply parameter includes a typical DC voltage value, a maximum DC voltage value, and a minimum DC voltage value of the target object; the maximum DC voltage value represents a maximum voltage value received by a power pin of the target object, and the minimum DC voltage value represents a minimum voltage value received by a power pin of the target object; The AC noise corresponding to the target object is determined according to the first power supply parameter corresponding to the circuit board file.

8. The system according to claim 7, characterized in that A decoupling capacitor is arranged between the power supply module and the target object.

9. A computing device, characterized in that The invention comprises a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the test method according to any one of claims 1 to 6 when executing the computer program.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the testing method according to any one of claims 1 to 6 is implemented.

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