Circuit board testing device and control system

Abstract

The invention provides a circuit board testing device and a control system, and belongs to the technical field of circuit board production, the circuit board testing device comprises a testing main body and a tray, the tray is provided with a placing position for placing a circuit board, a pressing mechanism is arranged above the tray, and the pressing mechanism comprises a pressing driving device. A switch probe is arranged on the test main body, a first electrode and a second electrode are arranged on the switch probe, the first electrode is located above the second electrode, a compression structure is arranged between the first electrode and the second electrode, and the first electrode and the second electrode are both electrically connected with the pressing driving device. And when the circuit board is placed at the placement position in a preset posture, the tray moves downwards to compress the first electrode, so that the first electrode is connected with the second electrode, and the downward pressing driving device is electrified to operate. The device has a fool-proof function, can avoid the occurrence of abnormal stress and damage caused by inaccurate placement position of the circuit board in the test process, and is beneficial to improving the effectiveness of circuit board test.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit board production, and in particular to a circuit board testing device and a control system. Background Art

[0002] The controller is an essential component of various home appliances, used to control the operation of home appliances. The motherboard, as the core component of the controller, integrates a variety of electronic components such as processors, circuits, interfaces, etc., and is responsible for executing control logic, processing data, and communicating with other devices. During the manufacturing process of the controller motherboard, it is necessary to test to ensure that the motherboard can operate normally. During the test process, it is crucial to ensure the correct position and state of the motherboard in the test tooling. The traditional controller motherboard testing method usually places the motherboard in the test tray of the test tooling, and presses the motherboard to the test needle bed through the cylinder, so that the test probe is connected to the test point in the circuit of the motherboard for electrical testing. However, in the current test tooling, it is difficult to intuitively and quickly judge whether the motherboard is correctly placed on the tray and whether the motherboard fits tightly with the tray. If the position of the motherboard in the test tray is incorrect, or the fit between the motherboard and the tray is insufficient, then during the cylinder pressing process, the test probe may apply inappropriate mechanical pressure or stress to the device on the motherboard, which directly causes damage to the device or the motherboard is crushed. In order to overcome this defect, photoelectric sensing technology is currently used in test fixtures to detect the placement of the motherboard in the test tray of the fixture. Although photoelectric sensing can achieve preliminary detection of the motherboard position to a certain extent, photoelectric sensing is easily affected by the environment. Once the photoelectric sensor is contaminated, inaccurate detection is likely to occur, which still poses a risk of device damage. In addition, the control logic of the photoelectric sensor is complex, which also increases the complexity and maintenance cost of the test system, thereby limiting the promotion of photoelectric sensing technology in a wide range of industrial applications.

[0003] Therefore, it is necessary to improve the existing motherboard testing device to overcome the defects of the prior art. Summary of the invention

[0004] In order to overcome the problems existing in the related art, one of the purposes of the present invention is to provide a circuit board testing device, which, through the setting of a switch probe, enables the circuit board to be placed in a preset position, so that the pressing drive device can be powered, thereby pressing down the tray to test the circuit board. The linkage setting of the switch probe and the pressing drive device enables the device to have a fool-proof function, which can avoid the situation where the circuit board is abnormally stressed and damaged due to inaccurate placement of the circuit board during the test, which helps to reduce the damage of the device caused by human operation errors during the test and improve the test effectiveness.

[0005] A circuit board testing device comprises a testing body and a tray, wherein the tray is arranged on the testing body in a liftable manner, a placement position for placing a circuit board is arranged on the tray, a pressing mechanism is arranged above the tray, and the pressing mechanism comprises a pressing driving device;

[0006] The test body is provided with a switch probe, the switch probe is provided with a first electrode and a second electrode, the first electrode is located above the second electrode, a compression structure is provided between the first electrode and the second electrode, and the first electrode and the second electrode are both electrically connected to a downward pressure driving device;

[0007] When the circuit board is placed at the placement position in a preset posture, the tray moves downward to compress the first electrode, so that the first electrode is connected to the second electrode, thereby enabling the downward pressing drive device to be powered and operated.

[0008] Traditional circuit board testing devices may cause abnormal force due to improper operation or inaccurate placement of the circuit board, thereby damaging the circuit board or the test equipment. However, this device realizes the fool-proof function through the setting of the switch probe, that is, the test can only be carried out when the circuit board is placed correctly, thus effectively avoiding this situation. The linkage setting of the switch probe and the downward pressure drive device ensures that the downward pressure drive device will only be powered on and run when the circuit board is placed in the placement position with a preset posture. This design avoids the test error caused by inaccurate placement of the circuit board, thereby improving the accuracy of the test.

[0009] Since the device has a fool-proof function, it can ensure that the circuit board can be placed in the correct position each time the test is performed, thereby reducing the number of repeated tests caused by placement errors and reducing damage to the circuit board, thereby improving test efficiency.

[0010] In a preferred technical solution of the present invention, the axis of the switch probe is arranged along the vertical direction, and when the circuit board is placed in the placement position in a preset posture, the axis of the switch probe and the center of gravity of the circuit board are in the same straight line.

[0011] In this embodiment, the axis of the switch probe is in the same straight line as the center of gravity of the circuit board. When the circuit board is placed in the placement position with a correct posture, the center of gravity of the circuit board coincides with the axis of the switch probe, so that the tray can move downward under the action of the circuit board, compressing the first electrode of the switch probe so that the first electrode is connected to the second electrode, thereby realizing the circuit conduction of the downward driving device.

[0012] In a preferred technical solution of the present invention, a mounting groove is provided on the test body, and the switch probe is clamped in the mounting groove;

[0013] The axis of the installation slot coincides with the axis of the placement position.

[0014] In this embodiment, the position of the switch probe is limited by the installation groove, so that the probe can be ensured to have a fixed and accurate position after installation.

[0015] This helps reduce detection errors caused by probe position deviation and improves test accuracy. In addition, during installation, operators do not need to spend too much time adjusting the position of the probe, but only need to snap it into the installation slot, which improves work efficiency.

[0016] In a preferred technical solution of the present invention, a clamping piece is provided at the opening of the installation slot, a clamping opening is provided on the clamping piece, the axis of the clamping opening coincides with the axis of the installation slot, and the switch probe is clamped at the clamping piece;

[0017] A connecting piece is provided at the bottom of the mounting groove, and the connecting piece is electrically connected to the downward pressing driving device.

[0018] The design of the clamping piece and the clamping opening thereon can ensure that the switch probe is firmly clamped in the installation groove and is not easy to loosen or shift, and can also make the installation and removal process of the switch probe easier.

[0019] The operator can easily insert or remove the probe into or out of the card opening without complicated adjustment or fixing steps, which improves work efficiency. In addition, the connecting piece arranged at the bottom of the mounting groove is electrically connected to the pressing drive device, ensuring stable and reliable transmission of electrical signals between the switch probe and the drive device.

[0020] In a preferred technical solution of the present invention, the switch probe comprises a housing, one end of the housing is provided with a first electrode, and the other end opposite thereto is provided with a second electrode;

[0021] The second electrode is fixed on the shell, the first electrode is slidably arranged in the shell, the shell is also provided with the compression structure, the axis of the compression structure coincides with the axis of the shell, and the compression structure is arranged between the first electrode and the second electrode.

[0022] In a preferred technical solution of the present invention, the compression structure includes a first spring and a second spring, the first spring is arranged at one end of the second spring, the second spring is fixed in the shell, the first spring is arranged between the second spring and the first electrode, one end of the first spring is connected to the second spring, and the other end opposite to the first electrode is connected to the first electrode.

[0023] The first electrode is slidably arranged in the shell and connected to the compression structure. It can generate different compression strokes and elastic force feedback when subjected to pressure, so as to achieve connection or failure to connect with the second electrode under different pressure states, so that the device has an anti-foolproof function.

[0024] In a preferred technical solution of the present invention, an insulating member is further provided at one end of the shell, the insulating member is provided between the shell and the second electrode, and the second electrode is fixed in the shell through the insulating member.

[0025] The insulating member not only provides an installation position for the second electrode, but also avoids electrical connection between the second electrode and the housing, so that the switch probe can achieve circuit conduction of the downward driving device only when the first electrode is connected to the second electrode.

[0026] In a preferred technical solution of the present invention, the pressing mechanism includes a pressing plate, a pressing drive device and a solenoid valve, the pressing drive device is fixed above the tray, the pressing plate is fixed at the output end of the pressing drive device, and the pressing drive device drives the pressing plate to rise and fall above the tray;

[0027] The solenoid valve is arranged in the control circuit of the downward pressure driving device, and the solenoid valve is electrically connected to the first electrode and the second electrode. When the first electrode is connected to the second electrode, the solenoid valve is turned on so that a path is formed in the control circuit of the downward pressure driving device.

[0028] In the pressing mechanism provided in this embodiment, when the switch probe is subjected to pressure, the first electrode is connected to the second electrode, the two electrodes are in a short-circuit state, and a signal is transmitted to the solenoid valve to open the solenoid valve.

[0029] After the solenoid valve is opened, the cylinder begins to press down, pressing the circuit board against the test needle bed for subsequent testing. If the position or state of the mainboard is incorrect, the probe will not be compressed to a sufficient stroke. At this time, the solenoid valve remains closed and the cylinder will not press down, thus avoiding testing in the wrong state. This method reduces the impact of human factors in the test process through automated detection and control, and reduces the risk of test errors or device damage caused by human errors.

[0030] In a preferred technical solution of the present invention, the test main body includes a body, and a plurality of test probes are arranged on the body, and the test probes correspond to the tray.

[0031] Multiple test probes can test different positions of the circuit board, thereby improving the test efficiency of the circuit board.

[0032] A second object of the present invention is to provide a control system, which is applied to the circuit board testing device as described above.

[0033] The beneficial effects of the present invention are:

[0034] The present invention provides a circuit board testing device, which includes a test body and a tray, the tray can be raised and lowered on the test body, a placement position for placing a circuit board is provided on the tray, a pressing mechanism is provided above the tray, and the pressing mechanism includes a pressing drive device. A switch probe is provided on the test body, a first electrode and a second electrode are provided on the switch probe, the first electrode is located above the second electrode, a compression structure is provided between the first electrode and the second electrode, and the first electrode and the second electrode are both electrically connected to the pressing drive device. When the circuit board is placed in the placement position in a preset posture, the tray compresses the first electrode downward so that the first electrode is connected to the second electrode, thereby enabling the pressing drive device to be powered on and operated. In actual applications, the device is linked to the switch probe and the pressing drive device to ensure that only when the circuit board is placed in the placement position in a preset posture, the pressing drive device will be powered on and operated, and the tray can be pressed down so that the circuit board on the tray contacts the test probe to complete the test. This design can avoid the situation that the traditional circuit board testing device may cause abnormal force due to improper operation or inaccurate placement of the circuit board, thereby damaging the circuit board or the test equipment, so that the testing device has a foolproof function. The fool-proofing function ensures that the circuit board is placed in the correct position each time it is tested, thus reducing the number of repeated tests caused by placement errors, thereby improving test efficiency and extending the service life of the device.

[0035] The present application also provides a control system for the above-mentioned testing device, which has an anti-foolproof function, making the circuit board testing process more automated and intelligent, reducing the possibility of manual intervention and misoperation, and improving production efficiency and product yield. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 is a three-dimensional diagram of a circuit board placed on the circuit board testing device provided in an embodiment of the present invention;

[0037] Figure 2 is a top view of a circuit board placed on the circuit board testing device provided in an embodiment of the present invention;

[0038] Figure 3 is a side view of a circuit board placed on the circuit board testing device provided in an embodiment of the present invention;

[0039] Figure 4 yes Figure 3 Sectional view at AA in the middle;

[0040] Figure 5 is a three-dimensional diagram of a circuit board provided in an embodiment of the present invention when it is above a circuit board testing device;

[0041] Figure 6 is a side view of a circuit board provided in an embodiment of the present invention when it is above a circuit board testing device;

[0042] Figure 7 is a schematic diagram of a switch probe provided in an embodiment of the present invention;

[0043] Figure 8 is a schematic diagram of the interior of a switch probe provided in an embodiment of the present invention;

[0044] Fig. 9 It is a schematic diagram of a pressing mechanism provided in an embodiment of the present invention and arranged on a circuit board testing device.

[0045] Reference numerals:

[0046] 1. Test body; 11. Test probe; 2. Tray; 21. Placement position; 3. Switch probe; 31. First electrode; 32. Second electrode; 33. Shell; 34. Insulator; 4. Circuit board; 5. Compression structure; 51. First spring; 52. Second spring; 6. Pressing mechanism; 61. Pressing drive device; 62. Pressing plate; 63. Solenoid valve. DETAILED DESCRIPTION

[0047] The preferred embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although the preferred embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided to make the present invention more thorough and complete, and to fully convey the scope of the present invention to those skilled in the art.

[0048] The traditional controller motherboard testing method usually places the motherboard in the test tray of the test tooling, and presses the motherboard to the test needle bed by the cylinder, so that the test probe is connected to the test point in the circuit of the motherboard for electrical testing. However, in the current test tooling, it is difficult to intuitively and quickly judge whether the motherboard is correctly placed on the tray and whether the motherboard and the tray are tightly fitted. If the position of the motherboard in the test tray is incorrect, or the fit between the motherboard and the tray is insufficient, then during the cylinder pressing process, the test probe may apply inappropriate mechanical pressure or stress to the device on the motherboard, which directly causes damage to the device or the motherboard is crushed. In order to overcome this defect, photoelectric sensing technology is currently used on the test tooling to detect the placement position of the motherboard in the test tray of the tooling. Although photoelectric sensing can achieve preliminary detection of the motherboard position to a certain extent, photoelectric sensing is easily affected by the environment. Once the photoelectric sensor is contaminated, it is easy to have inaccurate detection, which still has the risk of device damage. In addition, the control logic of the photoelectric sensor is complex, which also increases the complexity and maintenance cost of the test system, thereby limiting the promotion of photoelectric sensing technology in a wide range of industrial applications.

[0049] Based on this, the present application provides a circuit board testing device.

[0050] Example 1

[0051] like Figure 1-Figure 9 As shown, this embodiment provides a circuit board testing device, including a test body 1 and a tray 2, the tray 2 can be raised and lowered on the test body 1, the tray 2 is provided with a placement position 21 for placing a circuit board, a pressing mechanism 6 is provided above the tray 2, and the pressing mechanism 6 includes a pressing drive device 61;

[0052] The test body 1 is provided with a switch probe 3, and the switch probe 3 is provided with a first electrode 31 and a second electrode 32, the first electrode 31 is located above the second electrode 32, a compression structure 5 is provided between the first electrode 31 and the second electrode 32, and the first electrode 31 and the second electrode 32 are both electrically connected to the downward pressure driving device 61;

[0053] When the circuit board 4 is placed in the placement position 21 in a preset posture, the tray 2 moves downward to compress the first electrode 31 so that the first electrode 31 is connected to the second electrode 32 , thereby enabling the downward pressing drive device 61 to be powered and operated.

[0054] In actual applications, the device ensures that only when the circuit board 4 is placed in the placement position 21 in a preset posture, the pressing drive device 61 will be powered on and operated, and the tray 2 can be pressed down so that the circuit board 4 on the tray 2 contacts the test probe 11 to complete the test. This design can avoid the situation where the traditional circuit board test device may cause abnormal force due to improper operation or inaccurate placement of the circuit board 4 in the placement position 21, thereby damaging the circuit board 4 or the test equipment, so that the test device has a fool-proof function. The fool-proof function can ensure that the circuit board 4 is placed in the correct position each time the test is performed, thereby reducing the number of repeated tests caused by placement errors, thereby improving the test efficiency and extending the service life of the device.

[0055] It should be noted that the preset posture of the circuit board 4 of the present application refers to the placement angle of the circuit board 4 during the test. For example, if the circuit board 4 needs to be placed on the front during the test, the preset posture of the circuit board 4 of the present application is the front placement posture of the circuit board 4. The circuit board 4 is an asymmetric structure. If the circuit board 4 is placed in the placement position 21 with different postures, the center of gravity of the circuit board 4 is different, and the gravity on the tray 2 is different, which makes the downward stroke of the tray 2 different. For example, when the front side of the circuit board 4 is placed in the placement position 21, the tray 2 is pressed down by 3mm, and when the back side of the circuit board 4 is placed in the placement position 21, the tray 2 is pressed down by 2mm. At this time, the first electrode 31 cannot be connected to the second electrode 32, and the downward drive device 61 cannot be powered on and operated.

[0056] Example 2

[0057] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiment 1.

[0058] In this embodiment, the axis of the switch probe 3 is arranged along the vertical direction. When the circuit board 4 is placed in the placement position 21 in a preset posture, the axis of the switch probe 3 and the center of gravity of the circuit board 4 are on the same straight line.

[0059] In this embodiment, the axis of the switch probe 3 is in the same straight line as the center of gravity of the circuit board 4. When the circuit board 4 is placed in the placement position 21 in a correct posture, the center of gravity of the circuit board 4 coincides with the axis of the switch probe 3, so that the tray 2 can move downward under the action of the circuit board 4, compressing the first electrode 31 of the switch probe 3, so that the first electrode 31 is connected to the second electrode 32, thereby realizing the circuit conduction of the downward driving device 61.

[0060] Example 3

[0061] Different from the second embodiment, this embodiment provides a specific installation method of the switch probe 3 .

[0062] like Figure 1-Figure 9 As shown, specifically:

[0063] In this embodiment, a mounting groove is provided on the test body 1, and the switch probe 3 is clamped in the mounting groove;

[0064] The axis of the installation groove coincides with the axis of the placement position 21 .

[0065] The present embodiment can strictly limit the position of the switch probe 3 by designing the mounting groove. This ensures that the probe has a fixed and accurate position after installation, reducing position deviation. This helps to reduce the detection error caused by the probe position deviation and improves the accuracy of the test. In addition, the design of the mounting groove simplifies the installation process of the switch probe 3. The operator only needs to insert the probe into the mounting groove without complicated position adjustment. This saves installation time and improves overall work efficiency.

[0066] In practical applications, the shape of the cross section of the mounting groove can be adjusted as needed, for example, the cross section of the mounting groove can be circular, rectangular or square. A circular mounting groove can be used to install components with a circular cross section.

[0067] Example 4

[0068] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiment 3.

[0069] In this embodiment, a clamping piece is provided at the opening of the installation slot, a clamping opening is provided on the clamping piece, the axis of the clamping opening coincides with the axis of the installation slot, and the switch probe 3 is clamped at the clamping piece;

[0070] A connecting piece is provided at the bottom of the mounting groove, and the connecting piece is electrically connected to the pressing driving device 61 .

[0071] The design of the clamping piece and the clamping opening on the clamping piece can ensure that the switch probe 3 is firmly clamped in the installation groove and is not easy to loosen or shift, and can also make the installation and removal process of the switch probe 3 easier.

[0072] The operator can easily insert or remove the probe into or out of the clamping opening without complicated adjustment or fixing steps, thereby improving work efficiency. In addition, the connecting piece arranged at the bottom of the mounting groove is electrically connected to the pressing drive device 61, ensuring stable and reliable transmission of electrical signals between the switch probe 3 and the drive device.

[0073] In a specific embodiment, the clamping member can be made of an elastic material, and the clamping opening is elastically deformed when the switch probe 3 is inserted, so as to limit and fix the switch probe 3. The shape of the clamping opening can be designed according to the outer wall of the switch probe 3. It should be noted that the switch probe 3 and the clamping opening are interference fit.

[0074] Example 5

[0075] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiments 1-4.

[0076] In this embodiment, a specific implementation of the switch probe 3 is provided, which is as follows:

[0077] The switch probe 3 comprises a housing 33, one end of the housing 33 is provided with a first electrode 31, and the other end opposite thereto is provided with a second electrode 32;

[0078] The second electrode 32 is fixed on the shell 33, and the first electrode 31 is slidably arranged in the shell 33. The shell 33 is also provided with the compression structure 5, and the axis of the compression structure 5 coincides with the axis of the shell 33. The compression structure 5 is arranged between the first electrode 31 and the second electrode 32.

[0079] In this embodiment, the compression structure 5 includes a first spring 51 and a second spring 52, the first spring 51 is arranged at one end of the second spring 52, the second spring 52 is fixed in the shell 33, the first spring 51 is arranged between the second spring 52 and the first electrode 31, one end of the first spring 51 is connected to the second spring 52, and the other end opposite to it is connected to the first electrode 31.

[0080] The first electrode 31 is slidably disposed in the shell 33 and connected to the compression structure 5. It can generate different compression strokes and elastic force feedback when subjected to pressure, thereby achieving connection or non-connection with the second electrode 32 under different pressure states, so that the device has an anti-foolproof function.

[0081] In this embodiment, an insulating member 34 is further disposed at one end of the shell 33 . The insulating member 34 is disposed between the shell 33 and the second electrode 32 . The second electrode 32 is fixed in the shell 33 through the insulating member 34 .

[0082] The insulating member 34 not only provides an installation position for the second electrode 32 , but also avoids electrical connection between the second electrode 32 and the housing 33 , so that the switch probe 3 can achieve circuit conduction of the pressing drive device 61 only when the first electrode 31 is connected to the second electrode 32 .

[0083] In actual applications, a limit block is provided in the shell 33 to limit the spring. The limit block is used to limit the rotation of the spring without affecting the expansion and contraction of the spring. This enables the first electrode 31 to be pressed down when under pressure and squeeze the spring, thereby achieving connection with the second electrode 32.

[0084] In actual application, the switch probe 3 is divided into three compression strokes under the action of the first spring 51 and the second spring 52: the first stroke is about 2mm, the compression force of the two springs is ≥30g, and the main function in this stroke is the switch, and the detection unit is in an unloaded state; the second stroke is 2mm to 5.6mm, the compression force of the two springs is ≥30g, and the main function is the load state; the third compression stroke is 5.6mm to 7.1mm, the compression force of the two springs is ≥350g, and the main function is compression buffering and increasing compression size redundancy. The two-pole welding wires of the switch probe 3 are introduced into the downward driving device 61, and the switch probe 3 changes the overall size and thus the overall conduction state by the pressure received. When not compressed or compressed to the first stroke, the two poles of the switch probe 3 are in an open circuit; when compressed to the second and third strokes, the two poles of the switch probe 3 are in a short circuit, and at this time, the circuit of the downward driving device 61 is connected, and the downward driving device 61 is powered on, so that the tray 2 can be pressed down to complete the test of the circuit board 4.

[0085] Example 6

[0086] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiments 1-5.

[0087] In this embodiment, a specific implementation of the pressing mechanism 6 is provided, which is as follows:

[0088] The pressing mechanism 6 includes a pressing plate 62, a pressing driving device 61 and a solenoid valve 63. The pressing driving device 61 is fixed above the tray 2. The pressing plate 62 is fixed at the output end of the pressing driving device 61. The pressing driving device 61 drives the pressing plate 62 to rise and fall above the tray 2.

[0089] The solenoid valve 63 is arranged in the control circuit of the downward pressure driving device 61. The solenoid valve 63 is electrically connected to the first electrode 31 and the second electrode 32. When the first electrode 31 is connected to the second electrode 32, the solenoid valve 63 is turned on so that the control circuit of the downward pressure driving device 61 forms a passage.

[0090] In the pressing mechanism 6 provided in this embodiment, when the switch probe 3 is subjected to pressure, the first electrode 31 and the second electrode 32 are connected, the two electrodes are in a short-circuit state, and a signal is transmitted to the solenoid valve 63 to open the solenoid valve 63 .

[0091] After the solenoid valve 63 is opened, the cylinder starts to press down, pressing the circuit board 4 against the test needle bed for subsequent testing. If the position or state of the mainboard is incorrect, the probe will not be compressed to a sufficient stroke. At this time, the solenoid valve 63 remains closed and the cylinder will not press down, thereby avoiding testing in an incorrect state. This method reduces the impact of human factors in the test process through automated detection and control, and reduces the risk of test errors or device damage caused by human errors.

[0092] Example 7

[0093] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiment 6.

[0094] In this embodiment, a specific implementation of the test subject 1 is provided, which is as follows:

[0095] The test body 1 includes a body, and a plurality of test probes 11 are disposed on the body. The test probes 11 correspond to the tray 2 .

[0096] The multiple test probes 11 can test different positions of the circuit board 4, thereby improving the test efficiency of the circuit board 4. When a circuit board 4 of a different model is replaced for testing, the wiring position of the test probes 11 may need to be readjusted.

[0097] Example 8

[0098] like Figure 1-Figure 9 As shown, this embodiment is improved on the basis of embodiment 1.

[0099] This embodiment provides a control system, which is applied to the circuit board test device as described above. Specifically, the control system includes a processor, an actuator, and a switch probe 3, and the actuator includes a downward pressure drive device 61, and may also include a three-way valve. After the two poles of the switch probe 3 are connected to form a short circuit, the processor controls the downward pressure drive device 61 to operate, so that the downward pressure drive device 61 can press down the tray 2, so that the circuit board 4 on the tray 2 is connected to the test probe 11, and the test process is completed.

[0100] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0101] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of this application.

[0102] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A circuit board testing device, comprising a testing body (1) and a tray (2), wherein the tray (2) is arranged on the testing body (1) in a liftable manner, wherein a placement position (21) for placing a circuit board is arranged on the tray (2), and a pressing mechanism (6) is arranged above the tray (2), wherein the pressing mechanism (6) comprises a pressing driving device (61), wherein: The test body (1) is provided with a switch probe (3), the switch probe (3) is provided with a first electrode (31) and a second electrode (32), the first electrode (31) is located above the second electrode (32), a compression structure (5) is provided between the first electrode (31) and the second electrode (32), and the first electrode (31) and the second electrode (32) are both electrically connected to a downward pressure driving device (61); When the circuit board (4) is placed in the placement position (21) in a preset posture, the tray (2) moves downward to compress the first electrode (31), so that the first electrode (31) is connected to the second electrode (32), thereby enabling the downward pressing drive device (61) to be powered and operated.

2. The circuit board testing device according to claim 1, characterized in that: The axis of the switch probe (3) is arranged in a vertical direction, and when the circuit board (4) is placed in the placement position (21) in a preset posture, the axis of the switch probe (3) and the center of gravity of the circuit board (4) are on the same straight line.

3. The circuit board testing device according to claim 1, characterized in that: The test body (1) is provided with a mounting groove, and the switch probe (3) is clamped in the mounting groove; The axis of the installation groove coincides with the axis of the placement position (21).

4. The circuit board testing device according to claim 3, characterized in that: A clamping piece is provided at the opening of the installation slot, a clamping opening is provided on the clamping piece, the axis of the clamping opening coincides with the axis of the installation slot, and the switch probe (3) is clamped at the clamping piece; A connecting piece is provided at the bottom of the installation groove, and the connecting piece is electrically connected to the downward pressing driving device (61).

5. The circuit board testing device according to any one of claims 1 to 4, characterized in that: The switch probe (3) comprises a housing (33), one end of the housing (33) being provided with a first electrode (31), and the other opposite end being provided with a second electrode (32); The second electrode (32) is fixed on the shell (33), the first electrode (31) is slidably arranged in the shell (33), the shell (33) is also provided with the compression structure (5), the axis of the compression structure (5) coincides with the axis of the shell (33), and the compression structure (5) is arranged between the first electrode (31) and the second electrode (32).

6. The circuit board testing device according to claim 5, characterized in that: The compression structure (5) comprises a first spring (51) and a second spring (52), wherein the first spring (51) is arranged at one end of the second spring (52), the second spring (52) is fixed in the housing (33), the first spring (51) is arranged between the second spring (52) and the first electrode (31), one end of the first spring (51) is connected to the second spring (52), and the other end opposite thereto is connected to the first electrode (31).

7. The circuit board testing device according to claim 5, characterized in that: An insulating member (34) is also provided at one end of the shell (33); the insulating member (34) is provided between the shell (33) and the second electrode (32); the second electrode (32) is fixed in the shell (33) via the insulating member (34).

8. The circuit board testing device according to any one of claims 1 to 4, characterized in that: The pressing mechanism (6) comprises a pressing plate (62), a pressing drive device (61) and a solenoid valve (63); the pressing drive device (61) is fixed above the tray (2); the pressing plate (62) is fixed at the output end of the pressing drive device (61); and the pressing drive device (61) drives the pressing plate (62) to rise and fall above the tray (2); The solenoid valve (63) is arranged in the control circuit of the downward pressure driving device (61), and the solenoid valve (63) is electrically connected to the first electrode (31) and the second electrode (32). When the first electrode (31) and the second electrode (32) are connected, the solenoid valve (63) is turned on so that a path is formed in the control circuit of the downward pressure driving device (61).

9. The circuit board testing device according to any one of claims 1 to 4, characterized in that: The test body (1) comprises a body, and a plurality of test probes (11) are arranged on the body, and the test probes (11) correspond to the tray (2).

10. A control system, characterized in that: The control system is applied to the circuit board testing device as described in any one of claims 1-9.

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