A method for fast testing of mixed analog-digital signal modules based on boundary scan

Abstract

The application relates to the technical field of aviation airborne electronic equipment maintenance test guarantee, in particular to a mixed analog-digital signal module rapid test method based on boundary scanning, which comprises the following steps: step one, forming a network table; step two, obtaining an analog boundary scanning unit control information table, a production specific test model and a test vector table; step three, connecting a test device to a tested module; step four, testing a digital circuit in the tested module; and step five, testing an analog circuit in the tested module. The application solves the problem that a mixed analog-digital signal module cannot be directly tested, realizes automatic testing of the module, greatly reduces the working strength of personnel, and improves the aviation airborne product test and maintenance capability; through the adoption of a boundary scanning controller and the combination of external resources, an automatic test program is designed by calling a boundary scanning controller interface, rapid test diagnosis of the module is realized, and the test efficiency is greatly improved.

Description

Technical Field

[0001] This invention relates to the field of maintenance, testing and support technology for airborne electronic equipment, specifically a rapid testing method for mixed-signal modules based on boundary scanning. Background Technology

[0002] Current airborne equipment is becoming increasingly complex and integrated, leading to higher maintenance costs. Since each airborne module is a fundamental component of electronic products, its functions are complex, its usage characteristics vary, and its failure modes are highly uncertain. A prominent problem is that performance-based testing and diagnostic methods struggle to quickly and accurately test module performance and diagnose module faults. Analog signals cannot yet be completely replaced by digital signals in electronic circuits, and mixed-signal technology combining digital and analog circuits is rapidly developing and being widely applied. Statistical analysis of module failures shows that analog circuits have a relatively higher failure rate.

[0003] In modules that combine digital and analog circuits based on large-scale integrated circuits, the analog circuit section is difficult to test, has a high failure rate, and requires high reliability. Furthermore, it is indirectly controlled by the digital circuits, making it difficult to conduct direct testing based on ATE (Automatic Test Equipment).

[0004] Chinese patent CN201210296485.4 (published on December 12, 2012) discloses a mixed-signal circuit boundary scan test system, including a microcomputer, a microprocessor, and an analog instrument platform. Its feature is that it is based on digital devices supporting IEEE 1149.1 and analog devices supporting IEEE 1149.4 to build a test platform and realize online testing of mixed-signal circuits.

[0005] Boundary scan testing technology has now developed into a series of IEEE 1149.X standards. Among them, IEEE 1149.1 is a digital circuit bus standard released by the IEEE organization, and IEEE 1149.4 is a mixed-signal test bus standard, which uses the boundary scan mechanism to test analog devices in mixed-signal modules.

[0006] However, there are basically no analog devices in the airborne electronic equipment modules of aircraft. The analog signals are directly or indirectly controlled by the digital part, making it impossible to conduct tests independently. In addition, the architecture of each module is different, and there are many control methods. Most digital chips are also subject to restrictions such as chip software encryption. Summary of the Invention

[0007] To address the aforementioned technical problems, this invention proposes a rapid testing method for mixed-signal modules based on boundary scan. This invention can test modules containing associated analog devices within boundary scan digital device modules supporting the IEEE 1149.1 protocol. Furthermore, based on an established analog signal platform, it enables rapid testing of mixed-signal modules and achieves fully automated testing of the modules.

[0008] The technical problem to be solved by this invention is achieved by the following technical solution:

[0009] A rapid testing method for mixed-signal modules based on boundary scan includes the following steps:

[0010] Step 1: Organize the schematics and data of the module under test, analyze the circuit composition, and create a netlist;

[0011] Step 2: Compile the circuit netlist file to obtain circuit board information, analyze and obtain the analog boundary scan unit control information table to produce specific test models and test vector tables;

[0012] Step 3: Connect the boundary scan controller to the boundary scan support device boundary scan interface on the module under test and to the industrial computer. Connect the test resource system to the module under test, the industrial computer, and the FPGA digital resource board. Connect the FPGA digital resource board to the industrial computer.

[0013] Step 4: Test the digital circuits in the module under test.

[0014] This includes boundary scan-supported device testing and non-boundary scan-supported device testing;

[0015] Step 5: Test the analog circuits in the module under test.

[0016] This includes analog signal acquisition testing and analog signal output testing.

[0017] As a further improvement to the present invention, the boundary scan support device testing in step four is specifically as follows:

[0018] Step 1: Send control signals to the boundary scan support device through the boundary scan controller to perform relevant tests;

[0019] Step 2: Receive the test output data from the boundary scan support device, and determine whether the boundary scan support device is faulty based on the analysis results of the test output data.

[0020] As a further improvement to the present invention, the non-boundary scan support device test in step four is specifically as follows:

[0021] Step 1: Use the outer surrounding network of the boundary scan support device to control the non-boundary scan support device;

[0022] Step 2: Simultaneously receive the test output data generated by the boundary scan support device signal, form test output data, and determine whether there is a fault in the non-boundary scan support device.

[0023] As a further improvement to the present invention, the analog quantity acquisition test in step five is specifically as follows:

[0024] Step 1: First, the industrial control computer controls the test resource system to send out the analog signals required for the test through PXI, LAN, VX, and USB buses, and inputs analog signals from the ports of the module under test;

[0025] The second step is to use the boundary scan support device to provide control signals to devices with analog switches, AD conversions, opto-isolation, and axis-angle conversions by calling the boundary scan controller.

[0026] Step 3: Complete the actions according to the set timing sequence and obtain the processed data of the input analog quantity converted by the module under test;

[0027] Step 4: Call the boundary scan controller again to read the relevant data using the boundary scan support device and analyze the results to determine if there is a fault in the boundary scan support device.

[0028] As a further improvement to the present invention, the analog output test in step five is specifically as follows:

[0029] Step 1: First, the industrial control computer controls the test resource system via PXI, LAN, VX, and USB buses to set the analog parameters to be acquired and connects to the analog signal output port of the module under test.

[0030] Step 2: By calling the boundary scan controller, the boundary scan support device first provides control signals to devices with switching, DA conversion, and opto-isolation functions;

[0031] Step 3: The module under test completes the actions according to the set timing sequence and outputs an analog signal.

[0032] Step 4: Call the test resource system again to read the analog output data of the module under test and analyze the results to determine whether there is a fault in the boundary scan support device.

[0033] The beneficial effects of this invention are:

[0034] This invention provides a rapid testing method for mixed-signal modules based on boundary scan, solving the problem that mixed-signal modules cannot be directly tested, realizing automated testing of the modules, significantly reducing the workload of personnel, and improving the testing and maintenance capabilities of airborne products. By adopting a boundary scan controller-based approach combined with external resources, and designing automated test programs by calling the boundary scan controller interface, rapid testing and diagnosis of the modules are achieved, ensuring automated testing and greatly improving testing efficiency. Attached Figure Description

[0035] The present invention will be further described below with reference to the accompanying drawings and embodiments:

[0036] Figure 1 Here is a block diagram of the module being tested;

[0037] Figure 2 This is a schematic diagram of the device connections during the testing of this invention;

[0038] Figure 3 This is a flowchart of the digital circuit testing process of the present invention;

[0039] Figure 4 This is a flowchart of the analog circuit testing process of the present invention.

[0040] In the diagram: 1. Digital circuit; 2. Analog circuit; 3. Interconnect circuit; 4. Direct connection circuit; 5. Module under test; 6. Boundary scan controller; 7. Industrial computer; 8. Test resource system; 9. FPGA digital resource board. Detailed Implementation

[0041] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0042] like Figure 1 The diagram shown is a structural block diagram of the module under test, which includes the following four parts: Digital circuit 1, including a core controller supporting IEEE 1149.1 boundary scan and peripheral basic digital devices (devices that do not support IEEE 1149.1 boundary scan); Analog circuit 2, including various voltage, current, switching quantities, shaft angles, waveforms, etc.; Interconnection circuit 3, including various DA, AD converters, analog switches, bus converters, waveform converters, etc.; Direct connection circuit 4, including various optocouplers, relays, isolators, etc.

[0043] This embodiment proposes a rapid testing method for mixed-signal modules based on boundary scanning, for the aforementioned module under test, including the following steps:

[0044] Step 1: Organize the schematic diagram of the module under test, analyze the circuit composition, and form a netlist.

[0045] Step 2: Compile the circuit netlist file to obtain circuit board information, analyze and obtain the analog boundary scan unit control information table to produce specific test models and test vector tables.

[0046] Step 3, as follows Figure 2 As shown, the boundary scan controller 6 is connected to the boundary scan support device boundary scan interface on the module under test 5 and the industrial control computer 7, which can support the simultaneous connection of 1-6 devices (DSP, FPGA, ARM, etc.). The test resource system 8 is connected to the module under test 5, the industrial control computer 7, and the FPGA digital resource board 9. The test resource system 8 is used to provide corresponding excitation signals and output signal acquisition devices and other test resources. In this embodiment, it can be various types of computer boards, programmable instruments, self-developed test resources, etc. The FPGA digital resource board 9 is connected to the industrial control computer 7. The FPGA digital resource board 9 is used for other digital excitation signals required for operation.

[0047] Step 4: Test the digital circuit 1 in module 5 under test, such as... Figure 3 As shown.

[0048] This includes boundary scan support device testing and non-boundary scan support device testing.

[0049] For boundary scan support device testing, the boundary scan controller 6 sends control signals to the boundary scan support device to perform relevant tests, receives the test output data of the boundary scan support device, and determines whether the boundary scan support device has a fault based on the analysis results of the test output data.

[0050] For testing non-boundary scan support devices, the outer ring network of the boundary scan support device is used to control the non-boundary scan support device, while simultaneously receiving the test output data generated by the boundary scan support device signal to form test output data and determine whether the non-boundary scan support device has a fault.

[0051] Step 5: Test the analog circuit 2 in the module under test 5, such as... Figure 4 As shown.

[0052] This includes analog signal acquisition testing and analog signal output testing.

[0053] For analog signal acquisition testing, the industrial control computer 7 first controls the test resource system 8 via a PXI / LAN / VX / USB bus to send the required analog signal from the port of the module under test 5. Then, by calling the boundary scan controller 6, it uses the boundary scan support device to provide control signals (such as analog switch channel switching control, AD converter chip select, AD conversion start control, etc.) to devices with analog switches, AD converters, opto-isolation, and axis-angle conversion capabilities. The system completes the actions according to the set timing sequence, acquiring the processed data (such as the data after AD conversion) of the input analog signal converted by the module under test 5. The boundary scan controller 6 is then called again to use the boundary scan support device to read the relevant data and analyze the results to determine if the boundary scan support device is faulty.

[0054] For analog output testing, the industrial control computer 7 first controls the test resource system 8 via PXI / LAN / VX / USB buses to set the analog parameters to be acquired and connects to the analog signal output port of the module under test 5. Then, by calling the boundary scan controller 6, the boundary scan support device first provides control signals (such as analog switch channel switching, DA converter chip select, DA conversion start control, etc.) to devices with switching, DA conversion, and opto-isolation functions. The module under test 5 then completes the actions according to the set timing sequence and outputs analog signals (such as data after DA conversion). Finally, the test resource system 8 is called again to read the analog output data of the module under test 5 and analyze the results to determine if the boundary scan support device is faulty.

[0055] All boundary scan controls in the above tests were completed based on the boundary scan controller API interface control program. This part was used as a virtual instrument for testing, and an automated test program was designed to complete the automated and rapid diagnosis and testing of the entire module.

[0056] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely prisms of the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of this invention is defined by the appended claims and their equivalents.

Claims

1. A rapid testing method for mixed-signal modules based on boundary scan, used to test mixed-signal modules without IEEE 1149.4 standard analog boundary scan devices, characterized in that: Includes the following steps: Step 1: Organize the drawings and data of the module under test (5), analyze the circuit composition, and form a netlist; Step 2: Compile the circuit netlist file to obtain circuit board information, and analyze and obtain the analog boundary scan unit control information table. The analog boundary scan unit control information table records the control information required to indirectly control the analog functional devices through the boundary scan support device, including the boundary scan control pin mapping relationship and control timing of each analog functional device; thereby generating a specific test model and test vector table. Step 3: Connect the boundary scan controller (6) to the boundary scan support device boundary scan interface on the module under test (5) and to the industrial control computer (7). Connect the test resource system (8) to the module under test (5), the industrial control computer (7), and the FPGA digital resource board (9). Connect the FPGA digital resource board (9) to the industrial control computer (7). The FPGA digital resource board (9) is used to provide the digital excitation signals required for the operation of the module under test (5) to ensure that the analog functional device is in a normal working state that can be indirectly controlled during the test. Step 4: Test the digital circuit (1) in the module under test (5): including boundary scan support device testing and non-boundary scan support device testing; Step 5: Test the analog circuit (2) in the module under test (5): indirectly control the device with analog function by calling the boundary scan controller (6) and utilizing the boundary scan support device; This includes analog signal acquisition testing and analog signal output testing.

2. The rapid testing method for analog-to-digital mixed-signal modules based on boundary scan according to claim 1, characterized in that: Step four, boundary scan support for device testing, is detailed as follows: Step 1: Send control signals to the boundary scan support device through the boundary scan controller (6) to perform relevant tests; Step 2: Receive the test output data from the boundary scan support device, and determine whether the boundary scan support device is faulty based on the analysis results of the test output data.

3. The rapid testing method for analog-to-digital mixed-signal modules based on boundary scan according to claim 1, characterized in that: The non-boundary scan support device testing in step four is as follows: Step 1: Use the outer surrounding network of the boundary scan support device to control the non-boundary scan support device; Step 2: Simultaneously receive the test output data generated by the boundary scan support device signal, form test output data, and determine whether there is a fault in the non-boundary scan support device.

4. The rapid testing method for analog-to-digital mixed-signal modules based on boundary scan according to claim 1, characterized in that: The analog signal acquisition test in step five is as follows: Step 1: The industrial control computer (7) controls the test resource system (8) to send out the analog quantities required for the test through the PXI, LAN, VX, and USB buses, and inputs analog signals from the port of the module under test (5); Step 2: By calling the boundary scan controller (6), the boundary scan support device provides control signals to devices with analog switches, AD conversion, opto-isolation, and shaft angle conversion, including analog switch channel switching control, AD converter chip selection and AD conversion start control; Step 3: Complete the action according to the set timing sequence and obtain the processed data of the input analog quantity converted by the module under test (5); Step 4: Call the boundary scan controller (6) again to read the relevant data and analyze the results using the boundary scan support device to determine whether the module under test (5) has a fault.

5. The rapid testing method for analog-to-digital mixed-signal modules based on boundary scan according to claim 1, characterized in that: The analog output test in step five is as follows: Step 1: The industrial control computer (7) controls the test resource system (8) through PXI, LAN, VX, and USB buses to set the analog parameters to be collected and connect to the analog signal output port of the module under test (5); Step 2: By calling the boundary scan controller (6), the boundary scan support device provides control signals to devices with switching, DA conversion, and opto-isolation functions, including analog switch channel switching, DA converter chip selection, and DA conversion start control; Step 3: Complete the action according to the set timing, and the module under test (5) responds by outputting an analog quantity; Step 4: Call the test resource system (8) to read the analog output data of the module under test (5) and analyze the results to determine whether the module under test (5) has a fault.

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