Local oscillator leakage calibration circuit, calibration method and electronic equipment

Abstract

The invention provides a local oscillator leakage calibration circuit, a calibration method and electronic equipment. The local oscillator leakage calibration circuit comprises a direct current bias unit which is used for outputting an IQ modulation signal to an IQ modulator; the first local oscillator is used for outputting a first local oscillator signal to the IQ modulator; the IQ modulator is used for outputting a vector modulation signal according to the first local oscillator signal and the IQ modulation signal; the directional coupler is used for collecting a vector modulation signal to the IQ demodulator; the second local oscillator is used for outputting a second local oscillator signal to the IQ demodulator; the IQ demodulator is used for outputting a second IQ baseband signal to the control unit according to the second local oscillator signal and the vector modulation signal; the control unit is used for acquiring a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and an IQ modulation signal output by the DC bias unit is controlled according to the local oscillator leakage signal. By means of the circuit, the problem that in the local oscillator leakage calibration process, the requirement for hardware of the local oscillator leakage calibration circuit is high is solved.

Description

Technical Field

[0001] The present invention relates to the field of communication technology, and in particular to a local oscillator leakage calibration circuit, a calibration method and electronic equipment. Background Art

[0002] Local oscillator leakage, also often referred to as LO leakage, refers to the phenomenon in which the local oscillator signal escapes or leaks from its intended path or component in a radio frequency (RF) system. In RF systems, the local oscillator signal is used as a reference signal to generate the required frequency and phase relationship to achieve key functions such as signal modulation and demodulation. However, when the local oscillator signal leaks, it may have a negative impact on system performance and reliability.

[0003] When the local oscillator leakage calibration is performed through the detector, there must be an IQ input signal, which will result in both a local oscillator leakage signal with very low power and an IQ modulation signal with relatively high power in the vector modulation signal output by the IQ modulator. Therefore, the detector needs to have good enough linearity and dynamic range, and the ADC device needs to have enough quantization bits. This makes the hardware requirements for the local oscillator leakage calibration circuit higher during the local oscillator leakage calibration process. Summary of the invention

[0004] The present invention provides a local oscillator leakage calibration circuit, a calibration method and electronic equipment, which are used to solve the problem in the prior art that the hardware requirements for the local oscillator leakage calibration circuit are relatively high during the local oscillator leakage calibration process.

[0005] The present invention provides a local oscillator leakage calibration circuit, comprising: A digital-to-analog converter, configured to output a first IQ baseband signal to a DC bias unit to obtain an IQ modulated signal; and configured to output the first IQ baseband signal to a control unit; The DC bias unit is used to output the IQ modulated signal to the IQ modulator; A first local oscillator, used for outputting a first local oscillator signal to the IQ modulator; The IQ modulator is used to output a vector modulation signal according to the first local oscillator signal and the IQ modulation signal; A directional coupler, used for collecting the vector modulation signal to an IQ demodulator; A second local oscillator, used for outputting a second local oscillator signal to the IQ demodulator; The IQ demodulator is used to output a second IQ baseband signal to the control unit according to the second local oscillator signal and the vector modulation signal; The control unit is used to obtain a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and control the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal.

[0006] According to the local oscillator leakage calibration circuit provided by the present invention, the control unit is specifically used for: Converting the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal, respectively; Obtaining the local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; The IQ modulation signal output by the DC bias unit is adjusted, and when the local oscillator leakage signal reaches a preset signal value, it is confirmed that the local oscillator leakage calibration is completed.

[0007] The local oscillator leakage calibration circuit provided by the present invention further includes an amplifier; The amplifier is used to amplify the vector modulation signal collected by the directional coupler and output it to the IQ demodulator.

[0008] According to the local oscillator leakage calibration circuit provided by the present invention, the frequency difference between the first local oscillator signal and the second local oscillator signal is the same as the frequency of the second IQ baseband signal.

[0009] According to the local oscillator leakage calibration circuit provided by the present invention, the control unit is specifically used for: The first IQ baseband signal and the second IQ baseband signal are converted from time domain signals into frequency signals through Fourier transform to obtain the first frequency signal and the second frequency signal.

[0010] According to the local oscillator leakage calibration circuit provided by the present invention, the frequency difference between the first local oscillator signal and the second local oscillator signal is positively correlated with the configuration of the local oscillator leakage calibration circuit.

[0011] The present invention further provides a local oscillator leakage calibration method, which uses any one of the local oscillator leakage calibration circuits described above, comprising: Acquire the first IQ baseband signal output by the digital-to-analog converter; Acquire the second IQ baseband signal output by the IQ demodulator; A local oscillator leakage signal is acquired according to the first IQ baseband signal and the second IQ baseband signal; and an IQ modulation signal output by the DC bias unit is controlled according to the local oscillator leakage signal.

[0012] According to the local oscillator leakage calibration method provided by the present invention, the IQ modulation signal output by the DC bias unit is controlled according to the first IQ baseband signal and the second IQ baseband signal, including: Converting the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal respectively; Obtaining the local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; The IQ modulation signal output by the DC bias unit is adjusted, and when the local oscillator leakage signal reaches a preset signal value, it is confirmed that the local oscillator leakage calibration is completed.

[0013] The present invention also provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, a local oscillator leakage calibration method as described above is implemented.

[0014] The present invention also provides a non-transitory computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the local oscillator leakage calibration method as described in any one of the above is implemented.

[0015] The present invention also provides a computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the local oscillator leakage calibration method as described above is implemented.

[0016] The local oscillator leakage calibration circuit, calibration method and electronic device provided by the present invention detect the local oscillator leakage signal in the circuit in real time through the first IQ baseband signal and the second IQ baseband signal, and adjust and control the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal, so that the local oscillator leakage signal is reduced to the preset requirement. The local oscillator leakage signal is obtained through the first IQ baseband signal and the second IQ baseband signal; since the circuit hardware equipment is relatively low during the acquisition of the first IQ baseband signal and the second IQ baseband signal, direct acquisition of the local oscillator leakage signal is avoided. In the local oscillator leakage calibration process, directly acquiring the local oscillator leakage signal has higher hardware requirements for the local oscillator leakage calibration circuit, thereby reducing the hardware requirements of the local oscillator leakage calibration circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a schematic diagram of the principle of the local oscillator leakage calibration circuit in the related technology provided by the present invention.

[0019] Figure 2The present invention is a schematic diagram of the structure of a local oscillator leakage calibration circuit.

[0020] Figure 3 It is a structural schematic diagram of another local oscillator leakage calibration circuit provided by the present invention.

[0021] Figure 4 It is a flow chart of a local oscillator leakage calibration method provided by the present invention.

[0022] Figure 5 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] The terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the descriptions used in this way can be interchanged where appropriate, so that the embodiments can be implemented in a sequence other than that illustrated or described in the present application. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or modules is not necessarily limited to those steps or modules that are clearly listed, but may include other steps or modules that are not clearly listed or inherent to these processes, methods, products or devices. The naming or numbering of the steps that appear in the present application does not mean that the steps in the method flow must be executed in the time / logical sequence indicated by the naming or numbering. The process steps that have been named or numbered can change the execution order according to the technical purpose to be achieved, as long as the same or similar technical effects can be achieved. The division of modules in this application is a logical division. There may be other division methods when it is implemented in actual applications. For example, multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, and the indirect coupling or communication connection between units can be electrical or other similar forms, which are not limited in this application. In addition, the modules or submodules described as separate components may or may not be physically separated, may or may not be physical units, or may be distributed in multiple circuit units, and some or all of the units may be selected according to actual needs to achieve the purpose of the present application.

[0025] Combine the following Figure 1-Figure 5 The specific contents of the present invention are described.

[0026] Figure 1 FIG. 1 is a schematic diagram of the principle of a local oscillator leakage calibration circuit in a related technology provided by the present invention. Figure 1 As shown, when the local oscillator leakage signal is calibrated, sampling is usually performed at the output end of the RF radio frequency signal through a device such as a coupler. The output end of the RF radio frequency signal is composed of a vector modulation signal output by an IQ modulator.

[0027] The vector modulation signal mainly includes two components: the local oscillator leakage signal with very low power and the IQ modulation signal with relatively high power. This requires that if the RF signal is sampled, Figure 1 The detector in the oscillator must have good enough linearity and dynamic range, and the ADC must have enough quantization bits. This makes the hardware circuit requirements higher when performing local oscillator leakage calibration.

[0028] Figure 2 This is a schematic diagram of the structure of a local oscillator leakage calibration circuit provided by the present invention. It includes: A digital-to-analog converter, used to output a first IQ baseband signal to a DC bias unit to obtain an IQ modulation signal; and also used to output the first IQ baseband signal to a control unit. A DC bias unit, used to output the IQ modulation signal to an IQ modulator. A first local oscillator, used to output a first local oscillator signal to an IQ modulator. An IQ modulator, used to output a vector modulation signal according to the first local oscillator signal and the IQ modulation signal. A directional coupler, used to collect the vector modulation signal to an IQ demodulator. A second local oscillator, used to output a second local oscillator signal to an IQ demodulator. An IQ demodulator, used to output a second IQ baseband signal to a control unit according to the second local oscillator signal and the vector modulation signal. A control unit, used to obtain a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and to control the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal.

[0029] Specifically, if Figure 2 As shown, in the local oscillator leakage calibration circuit, the second local oscillator signal is output through the second local oscillator, and is input into the IQ demodulator together with the vector modulation signal sampled by the directional coupler to obtain the second IQ baseband signal. In addition, in the control unit, the first IQ baseband signal and the second IQ baseband signal are processed to obtain the local oscillator leakage signal. This avoids directly obtaining the local oscillator leakage signal through the detector.

[0030] In a possible implementation manner, the second IQ baseband signal output by the IQ demodulator passes through an analog-to-digital converter and is then output to the control unit.

[0031] In a possible implementation, the control unit is specifically used to: convert the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal, respectively; obtain a local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; adjust the IQ modulation signal output by the DC bias unit, and when the local oscillator leakage signal reaches a preset signal value, confirm that the local oscillator leakage calibration is completed.

[0032] In an embodiment of the present invention, the control unit obtains a local oscillator leakage signal by filtering an IQ modulation signal with a larger power according to the difference between the first frequency signal and the second frequency signal. And further adjusts the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal obtained in real time. And after adjusting the IQ modulation signal, the local oscillator leakage signal changes. When the local oscillator leakage signal is reduced to a preset signal value, it is confirmed that the local oscillator leakage calibration in the circuit is completed.

[0033] In a possible implementation manner, the control unit is specifically configured to: convert the first IQ baseband signal and the second IQ baseband signal from time domain signals to frequency signals by Fourier transform, so as to obtain the first frequency signal and the second frequency signal.

[0034] In the embodiment of the present invention, the control unit may also process the baseband signal in other ways to convert the first IQ baseband signal and the second IQ baseband signal from time domain signals into frequency signals, including but not limited to discrete cosine transform, wavelet transform and other signal processing methods.

[0035] Figure 3 It is a structural schematic diagram of another local oscillator leakage calibration circuit provided by an embodiment of the present invention.

[0036] In a possible implementation, Figure 3 As shown, the local oscillator leakage calibration circuit also includes an amplifier; the amplifier is used to amplify the vector modulation signal collected by the directional coupler and output it to the IQ demodulator.

[0037] In a possible implementation, Figure 3 As shown, in the local oscillator leakage calibration circuit, the DC bias unit includes a first DC bias device and a second DC bias device.

[0038] The first DC bias device is used to output and adjust the Q signal (quadrature signal) in the IQ baseband signal. The second DC bias device is used to output and adjust the I signal (in-phase signal) in the IQ baseband signal. The first DC bias device and the second DC bias device are respectively coupled to the control unit and controlled by the control signal output by the control unit.

[0039] In a possible implementation manner, a frequency difference between the first local oscillator signal and the second local oscillator signal is the same as a frequency of the second IQ baseband signal.

[0040] Specifically, the present invention uses the same reference clock to pass through the first local oscillator and the second local oscillator to generate the first local oscillator signal and the second local oscillator signal with phase coherence, and the frequency deviation Δf between the two local oscillator signals is 10MHz. The feedback signal of the directional coupler is passed through the IQ demodulator again, mixed with the second local oscillator signal, and the radio frequency signal is moved to the intermediate frequency with a center frequency of 10MHz.

[0041] In the control unit, the data collected by the ADC (analog-to-digital converter) is subjected to Fourier decomposition to obtain signal spectrum A, the time domain signal is converted into a frequency signal, and the first IQ baseband signal sent by the DAC (digital-to-analog converter) is also subjected to Fourier decomposition to obtain signal spectrum B. The residual signal after subtracting signal spectrum B from signal spectrum A is the local oscillator leakage signal. The local oscillator leakage signal is minimized by adjusting the first DC bias device and the second DC bias device to complete the local oscillator leakage calibration.

[0042] In a possible implementation manner, the frequency difference between the first local oscillator signal and the second local oscillator signal is positively correlated with the configuration of the local oscillator leakage calibration circuit.

[0043] In the embodiment of the present invention, the higher the frequency difference between the first local oscillator signal and the second local oscillator signal, the higher the accuracy requirement of the hardware in the local oscillator leakage calibration circuit. In practical applications, it can be flexibly configured according to the circuit hardware. In the embodiment of the present invention, only an exemplary frequency difference between the first local oscillator signal and the second local oscillator signal is given, which is not a limitation of the content of the present invention.

[0044] Exemplarily, the control unit controls the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal, see the following embodiment.

[0045] The local oscillator leakage signal expression can be expressed by the following formula, where and is the IQ baseband DC offset, and is the local oscillator gain error, is the local oscillator phase error.

[0046]

[0047] When the LO gain error and LO phase error are ignored, if the LO leakage signal is to be minimized, the above parameters need to meet the following conditions:

[0048] At this time, since the carrier frequency in the circuit is known, the angular frequency is a constant value, and the IQ baseband offset ratio can be calculated by this formula:

[0049] The local oscillator signal power P and , Satisfy the formula

[0050] According to the above two formulas, the size of the local oscillator leakage can be calculated and reversely applied to the DC bias unit of the transmission channel.

[0051] The present invention can achieve the following beneficial effects by adopting the above-mentioned local oscillator leakage calibration circuit: 1. The local oscillator leakage signal in the circuit is detected in real time through the first IQ baseband signal and the second IQ baseband signal, and the IQ modulation signal output by the DC bias unit is adjusted and controlled according to the local oscillator leakage signal, so that the local oscillator leakage signal is reduced to the preset requirement. The local oscillator leakage signal is obtained through the first IQ baseband signal and the second IQ baseband signal; since the circuit hardware equipment is relatively low during the acquisition of the first IQ baseband signal and the second IQ baseband signal, direct acquisition of the local oscillator leakage signal is avoided. In the local oscillator leakage calibration process, directly acquiring the local oscillator leakage signal has higher hardware requirements for the local oscillator leakage calibration circuit, thereby reducing the hardware requirements of the local oscillator leakage calibration circuit.

[0052] 2. It avoids the problem that the detector cannot respond in real time when the ambient temperature changes rapidly during the static calibration of the local oscillator signal.

[0053] The local oscillator leakage calibration method provided by the present invention corresponds to the content of the local oscillator leakage calibration circuit mentioned above. For the specific content, please refer to the content of the above embodiment, and no further details will be given here.

[0054] like Figure 4 As shown, an embodiment of the present invention further provides a local oscillator leakage calibration method, which is applied to any of the local oscillator leakage calibration circuits mentioned above, and includes steps S401-S402.

[0055] S401, obtaining a first IQ baseband signal output by a digital-to-analog converter; and obtaining a second IQ baseband signal output by an IQ demodulator.

[0056] S402, acquiring a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and controlling an IQ modulation signal output by a DC bias unit according to the local oscillator leakage signal.

[0057] In a possible implementation, a local oscillator leakage signal is obtained according to a first IQ baseband signal and a second IQ baseband signal; and an IQ modulation signal output by a DC bias unit is controlled according to the local oscillator leakage signal, including: converting the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal respectively; obtaining a local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; and adjusting the IQ modulation signal output by the DC bias unit, and when the local oscillator leakage signal reaches a preset signal value, confirming that the local oscillator leakage calibration is completed.

[0058] Figure 5 An example of a physical structure diagram of an electronic device is shown in FIG. Figure 5As shown, the electronic device may include: a processor 510, a communication interface 520, a memory 530 and a communication bus 540, wherein the processor 510, the communication interface 520 and the memory 530 communicate with each other through the communication bus 540. The processor 510 may call the logic instructions in the memory 530 to execute a local oscillator leakage calibration method, which includes: obtaining a first IQ baseband signal output by a digital-to-analog converter; obtaining a second IQ baseband signal output by an IQ demodulator; obtaining a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and controlling the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal.

[0059] In addition, the logic instructions in the above-mentioned memory 530 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0060] On the other hand, the present invention also provides a computer program product, which includes a computer program. The computer program can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute a local oscillator leakage calibration method provided by the above methods, the method including: obtaining a first IQ baseband signal output by a digital-to-analog converter; obtaining a second IQ baseband signal output by an IQ demodulator; obtaining a local oscillator leakage signal based on the first IQ baseband signal and the second IQ baseband signal; and controlling the IQ modulation signal output by a DC bias unit based on the local oscillator leakage signal.

[0061] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, it is implemented to execute a local oscillator leakage calibration method provided by the above-mentioned methods, the method comprising: obtaining a first IQ baseband signal output by a digital-to-analog converter; obtaining a second IQ baseband signal output by an IQ demodulator; obtaining a local oscillator leakage signal based on the first IQ baseband signal and the second IQ baseband signal; and controlling the IQ modulation signal output by a DC bias unit based on the local oscillator leakage signal.

[0062] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0063] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0064] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A local oscillator leakage calibration circuit, characterized in that: include: A digital-to-analog converter, used for outputting a first IQ baseband signal to a DC bias unit to obtain an IQ modulated signal; Also used for outputting the first IQ baseband signal to a control unit; The DC bias unit is used to output the IQ modulated signal to the IQ modulator; A first local oscillator, used for outputting a first local oscillator signal to the IQ modulator; The IQ modulator is used to output a vector modulation signal according to the first local oscillator signal and the IQ modulation signal; A directional coupler, used for collecting the vector modulation signal to an IQ demodulator; A second local oscillator, used for outputting a second local oscillator signal to the IQ demodulator; The IQ demodulator is used to output a second IQ baseband signal to the control unit according to the second local oscillator signal and the vector modulation signal; The control unit is configured to obtain a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; And the IQ modulation signal output by the DC bias unit is controlled according to the local oscillator leakage signal.

2. The local oscillator leakage calibration circuit according to claim 1, characterized in that: The control unit is specifically used for: Converting the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal, respectively; Obtaining the local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; The IQ modulation signal output by the DC bias unit is adjusted, and when the local oscillator leakage signal reaches a preset signal value, it is confirmed that the local oscillator leakage calibration is completed.

3. The local oscillator leakage calibration circuit according to claim 1, characterized in that: Also included is an amplifier; The amplifier is used to amplify the vector modulation signal collected by the directional coupler and output it to the IQ demodulator.

4. The local oscillator leakage calibration circuit according to claim 1, characterized in that: A frequency difference between the first local oscillator signal and the second local oscillator signal is the same as a frequency of the second IQ baseband signal.

5. The local oscillator leakage calibration circuit according to claim 2, characterized in that: The control unit is specifically used for: The first IQ baseband signal and the second IQ baseband signal are converted from time domain signals into frequency signals through Fourier transform to obtain the first frequency signal and the second frequency signal.

6. The local oscillator leakage calibration circuit according to claim 4, characterized in that: The frequency difference between the first local oscillator signal and the second local oscillator signal is positively correlated with the configuration of the local oscillator leakage calibration circuit.

7. A local oscillator leakage calibration method, characterized in that: The local oscillator leakage calibration circuit used in any one of claims 1 to 6 comprises: Acquire the first IQ baseband signal output by the digital-to-analog converter; Acquire the second IQ baseband signal output by the IQ demodulator; A local oscillator leakage signal is acquired according to the first IQ baseband signal and the second IQ baseband signal; and an IQ modulation signal output by the DC bias unit is controlled according to the local oscillator leakage signal.

8. The local oscillator leakage calibration method according to claim 7, characterized in that: acquiring a local oscillator leakage signal according to the first IQ baseband signal and the second IQ baseband signal; and controlling the IQ modulation signal output by the DC bias unit according to the local oscillator leakage signal, including: Converting the first IQ baseband signal and the second IQ baseband signal into a first frequency signal and a second frequency signal respectively; Obtaining the local oscillator leakage signal according to a difference between the first frequency signal and the second frequency signal; The IQ modulation signal output by the DC bias unit is adjusted, and when the local oscillator leakage signal reaches a preset signal value, it is confirmed that the local oscillator leakage calibration is completed.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the local oscillator leakage calibration method according to any one of claims 7 to 8 is implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the local oscillator leakage calibration method according to any one of claims 7 to 8 is implemented.

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