Material surface emissivity measuring device

Abstract

The invention provides a material surface emissivity measuring device. The material surface emissivity measuring device comprises a vacuum cover, an emissivity measuring assembly and refrigeration equipment. The emissivity measuring assembly is arranged in the vacuum cover and used for measuring the emissivity of the black body and the sample, and the vacuum cover is used for providing a vacuum environment for emissivity measurement. And the refrigeration equipment is hung at the bottom of the vacuum cover through a flexible connecting piece and is used for providing cooling capacity for the emissivity measuring assembly. The vacuum cover and the refrigeration equipment provide a vacuum low-temperature environment for emissivity measurement, and background noise can be effectively reduced. Compared with the prior art in which the refrigeration equipment is rigidly connected with the emissivity measuring assembly to transmit the cold energy, the refrigeration equipment is suspended at the bottom of the vacuum cover through the flexible connecting piece, so that the vibration of the refrigeration equipment can be effectively prevented from being transmitted to the emissivity measuring assembly, the emissivity measuring assembly is more stable in the measuring process, and the measurement accuracy is improved. And the measurement accuracy is effectively improved.

Description

Technical Field

[0001] The invention relates to the technical field of material radiation performance testing, and in particular to a material surface emissivity measuring device. Background Art

[0002] The data of material surface emissivity plays an important guiding role in engineering design and experimental science. Since the size of the material surface emissivity is affected by many factors such as the material's own properties, material temperature, and material surface treatment methods, it is difficult to calculate the size of the material surface emissivity, and experiments are needed to obtain data.

[0003] At present, the energy method is one of the many methods for measuring the surface emissivity of materials. The principle of the energy method for measuring the surface emissivity of materials is to use the same detector to measure the radiation power of the black body and the sample at the same temperature, and the ratio of the two is the emissivity value of the material. This method has the advantages of short test time and the ability to measure the spectral emissivity of the sample surface, and has a wide range of applications.

[0004] The energy method requires the use of refrigeration equipment to cool the inside of the measuring device. However, the vibration of the refrigerator during operation will cause the measuring device to vibrate. Since the reflecting surface of the measuring device used to reflect the electromagnetic waves emitted by the sample or black body is small, the vibration may cause the reflecting surface to be unable to align with the detector, causing the electromagnetic waves received by the detector to be intermittent, ultimately leading to errors in the test results. Summary of the invention

[0005] The present invention provides a material surface emissivity measuring device, which is used to solve the defect in the prior art that the vibration of the refrigeration equipment causes the detector to be unable to continuously receive electromagnetic waves, which ultimately leads to errors in the measurement results, and achieves the effect of weakening the transmission of the vibration of the refrigerator to the measuring device.

[0006] The present invention provides a material surface emissivity measuring device, comprising:

[0007] Vacuum hood;

[0008] An emissivity measurement component, which is disposed in the vacuum enclosure and is used to measure the emissivity of a black body and a sample;

[0009] A refrigeration device is suspended at the bottom of the vacuum cover through a flexible connector and is used to provide cold air for the emissivity measurement assembly.

[0010] According to the material surface emissivity measuring device provided by the present invention, the refrigeration equipment is thermally connected to the emissivity measuring component via a flexible heat conductive member.

[0011] According to the material surface emissivity measuring device provided by the present invention, the emissivity measuring component comprises:

[0012] A first cover body, wherein the first cover body is disposed in the vacuum cover and is thermally connected to the refrigeration device through the flexible heat conductive member;

[0013] A support plate, the support plate being disposed in the first cover;

[0014] A reflection component, wherein the reflection component is disposed on the support plate, and an incident end of the reflection component is rotatable;

[0015] At least two test piece brackets, a plurality of the test piece brackets are arranged on the support plate, and the plurality of the test piece brackets are distributed along the circumference of the incident end of the reflective assembly, one of the test piece brackets is used to fix the black body, and the remaining test piece brackets are used to fix the sample;

[0016] A detector is arranged on the supporting plate and is used for receiving the electromagnetic wave reflected by the reflection component and emitted by the black body or the sample.

[0017] The material surface emissivity measuring device provided by the present invention further includes a chopper, which is arranged between the transmitting end of the reflective component and the receiving end of the detector.

[0018] According to the material surface emissivity measuring device provided by the present invention, the reflection component comprises:

[0019] A second cover body, wherein the second cover body is connected to the support plate, and the second cover body is connected to the refrigeration device through the flexible heat conductive member;

[0020] A first reflector, which is rotatably disposed in the second cover and is used to selectively receive electromagnetic waves emitted by the sample or the black body;

[0021] a second reflector, the second reflector being disposed in the second cover and configured to receive the electromagnetic wave reflected by the first reflector and transmit the electromagnetic wave to the detector;

[0022] A driving device is drivingly connected to the first reflector and is used to drive the first reflector to selectively receive electromagnetic waves emitted by the black body or one of the samples.

[0023] According to the material surface emissivity measuring device provided by the present invention, the refrigeration device includes multiple, each of the refrigeration devices includes multiple cold output terminals, and the multiple cold output terminals are respectively connected to the first cover body, the second cover body, the sample, the black body and the detector one by one through the flexible heat conductive member.

[0024] According to the material surface emissivity measuring device provided by the present invention, a third cover is further provided on the outer side of the first reflector, and an incident channel is provided on a side of the third cover corresponding to the reflective surface of the first reflector.

[0025] According to the material surface emissivity measuring device provided by the present invention, the flexible connecting member includes a bellows and / or a rubber seismic isolation pad.

[0026] According to the material surface emissivity measuring device provided by the present invention, the flexible heat-conducting member is a copper braid.

[0027] According to the material surface emissivity measuring device provided by the present invention, the driving device is a first driving motor.

[0028] The material surface emissivity measuring device provided by the present invention comprises a vacuum hood, an emissivity measuring component and a refrigeration device. The emissivity measuring component is arranged inside the vacuum hood, the emissivity measuring component is used to measure the emissivity of a black body and a sample, and the vacuum hood is used to provide a vacuum environment for the emissivity measurement. The refrigeration device is suspended at the bottom of the vacuum hood through a flexible connector, and the refrigeration device is used to provide cold for the emissivity measurement component. The vacuum hood and the refrigeration device provide a vacuum low-temperature environment for the emissivity measurement, which can effectively reduce background noise. Compared with the method of rigidly connecting the refrigeration device and the emissivity measurement component to transfer cold in the related art, the refrigeration device in the present invention is suspended at the bottom of the vacuum hood through a flexible connector, which can effectively weaken the vibration of the refrigeration device and transfer it to the emissivity measurement component, so that the emissivity measurement component is more stable during the measurement process, and the accuracy of the measurement is effectively improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0030] Figure 1 It is a structural schematic diagram of a material surface reflectivity measuring device provided by the present invention;

[0031] Figure 2 is a front view of a chopping board provided by the present invention;

[0032] Reference numerals:

[0033] 100, vacuum cover; 110, air inlet; 210, black body; 220, sample; 310, first cover; 320, support plate; 330, reflection assembly; 331, second cover; 332, first reflector; 333, second reflector; 334, first drive motor; 335, third cover; 340, test piece support; 350, detector; 410, chopper plate; 420, second drive motor; 500, GM refrigerator; 610, bellows; 620, rubber isolation pad. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0035] Combine the following Figure 1 and Figure 2 The material surface emissivity measuring device of the present invention is described.

[0036] An embodiment of the present invention provides a material surface emissivity measuring device, including a vacuum cover 100, an emissivity measuring component and a refrigeration device.

[0037] The vacuum cover 100 is a closed cover body, and a suction port 110 is provided on the top of the vacuum cover 100 . A vacuuming device can be used to evacuate the interior of the vacuum cover 100 through the suction port 110 .

[0038] The emissivity measurement assembly is used to measure the emissivity of the black body 210 and the sample 220, and the emissivity measurement assembly is disposed in the vacuum cover 100, which provides a vacuum environment for the measurement process of the emissivity measurement assembly, can effectively reduce background noise, and improve measurement accuracy.

[0039] The refrigeration equipment is used to provide cooling for the emissivity measurement component, to provide a low temperature environment for the emissivity measurement process, and to control the temperature of the sample 220 and the black body 210 to be consistent.

[0040] The refrigeration device is suspended at the bottom of the vacuum cover 100 through a flexible connector. There is no rigid contact between the refrigeration device and the vacuum cover 100. When the refrigeration device is working, the vibration of the refrigeration device can be weakened by the flexible connector to prevent the vibration from being directly transmitted to the vacuum cover 100, thereby causing the emissivity measurement component inside the vacuum cover 100 to vibrate, so that the emissivity measurement component can work stably and ensure the accuracy of the measurement.

[0041] In one embodiment of the present invention, in addition to being connected to the vacuum cover 100 through a flexible connector, the refrigeration device also needs to transfer cold energy to some units in the emissivity measurement assembly.

[0042] In the related art, the refrigeration equipment and the emissivity measurement component adopt a rigid connection heat transfer method, and the vibration of the refrigeration equipment will be directly transmitted to the emissivity measurement component, thereby affecting the measurement accuracy of the emissivity measurement component.

[0043] In this embodiment, the refrigeration device is thermally connected to the emissivity measurement component via a flexible thermal conductor. In this way, the flexible thermal conductor can weaken the vibration of the refrigeration device during operation, and can effectively improve the measurement accuracy of the emissivity measurement component.

[0044] In one embodiment of the present invention, the emissivity measurement assembly includes a first cover 310 , a support plate 320 , a reflection assembly 330 , at least two test piece brackets 340 and a detector 350 .

[0045] The first cover body 310 is arranged in the vacuum cover 100, the emissivity measurement component is arranged in the first cover body 310, and the refrigeration equipment is thermally connected to the first cover body 310 through a flexible heat conductive member. In this way, the first cover body 310 can provide a low temperature environment for the internal emissivity measurement component, effectively reduce background noise, and improve the accuracy of the measurement result.

[0046] The bottom of the first cover body 310 and the inner bottom of the vacuum cover 100 may be connected via a rubber support, which may further weaken the vibration of the vacuum cover 100 transmitted to the first cover body 310, thereby further improving the stability of the emissivity measurement assembly and thereby improving the measurement accuracy.

[0047] The support plate 320 is disposed in the first cover body 310 for supporting the emissivity measurement assembly. The support plate 320 may also be connected to the inner bottom surface of the first cover body 310 through a rubber support. The rubber support may further weaken the vibration of the first cover body 310 transmitted to the support plate 320, thereby further improving the stability of the emissivity measurement assembly and thereby improving the measurement accuracy.

[0048] The reflection component 330 is disposed on the support plate 320. The reflection component 330 includes an incident end and an emitting end. The incident end is used to receive electromagnetic waves emitted by the black body 210 or the sample 220. The electromagnetic waves are reflected by the reflection component 330 and emitted through the emitting end of the reflection component 330. The incident end of the reflection component 330 is rotatable. During the rotation process, it can selectively receive only the electromagnetic waves emitted by the black body 210 or one of the samples 220, and emit the received electromagnetic waves through the emitting end of the reflection component.

[0049] The plurality of test piece brackets 340 are all connected to the support plate 320 through brackets, and the plurality of test piece brackets 340 are arranged near the incident end of the reflection component 330, and the plurality of test piece brackets 340 are distributed along the circumference of the incident end of the reflection component 330. Therefore, when the incident end of the reflection component 330 rotates, the incident end of the reflection component 330 can selectively align with any one of the test piece brackets 340.

[0050] One of the test piece brackets 340 is used to fix the black body 210 , and the other test piece brackets 340 are used to fix the sample 220 . When the reflection component 330 rotates, the electromagnetic waves emitted by the black body 210 or the sample 220 on the test piece bracket 340 can be emitted to the incident end of the reflection component 330 .

[0051] The detector 350 is disposed on the support plate 320 through a bracket. The detector 350 is disposed near the transmitting end of the reflective component 330 , and the receiving end of the detector 350 is aligned with the transmitting end of the reflective component 330 for receiving electromagnetic waves emitted by the reflective component 330 .

[0052] For example, detector 350 may be a bolometer detector.

[0053] In one embodiment of the present invention, the reflective assembly 330 includes a second cover 331 , a first reflective mirror 332 , a second reflective mirror 333 and a driving device.

[0054] The second cover body 331 is connected to the support plate 320 through a bracket, and the second cover body 331 is thermally connected to the refrigeration device through a flexible heat conductive member. The second cover body 331 is used to provide a cold environment for the propagation of electromagnetic waves.

[0055] The first reflector 332 and the second reflector 333 each include a 45-degree reflective surface. The first reflector 332 may be disposed at the bottom of the inner side of the first cover 310 , and the second reflector 333 may be disposed at the top of the inner side of the second cover 331 .

[0056] The driving device may include a first driving motor 334, for example, a stepping motor. The first driving motor 334 can be connected to the bottom of the vacuum cover 100 through a rubber support, and the output shaft of the first driving motor 334 extends upward, passing through the bottom of the vacuum cover 100, the bottom of the first cover body 310 and the support plate 320 in sequence. Finally, the output shaft of the first driving motor 334 is connected to the first reflector 332, and the first driving motor 334 is used to drive the first reflector 332 to rotate along the vertical axis.

[0057] The second housing 331 is provided with the first reflector 332 on its outer side surface, and the number of incident ports is the same as the number of the test piece brackets 340. The first driving motor 334 can drive the first reflector 332 to rotate, so that the reflective surface of the first reflector 332 can be selectively directed toward any incident port.

[0058] The second reflector 333 is disposed on the second cover 331 , and an emission port is disposed at a position corresponding to the reflection surface of the second reflector 333 .

[0059] For example, the first driving motor 334 can drive the first reflector 332 to rotate to a position corresponding to the incident port corresponding to the test piece bracket 340 that fixes the black body 210. At this time, the electromagnetic waves emitted by the black body 210 can be emitted to the first reflector 332 through the incident port, and the first reflector 332 reflects the electromagnetic waves to the reflection surface of the second reflector 333. The second reflector 333 emits the electromagnetic waves to the detector 350 through the emission port.

[0060] It should be noted that a rotary sealing structure is adopted between the output shaft of the first driving motor 334 and the vacuum cover 100 to prevent air leakage of the vacuum cover 100.

[0061] In one embodiment of the present invention, a chopper is further provided between the transmitting end of the reflection component 330 and the receiving end of the detector 350 .

[0062] The chopper includes a second drive motor 420 and a chopper plate 410. The chopper plate 410 may be a disc-shaped plate. The second drive motor 420 is supported on the support plate 320 through a bracket. The output shaft of the second drive motor 420 is connected to the center of the chopper plate 410. A plurality of through holes are evenly distributed on the chopper along the circumference of the chopper.

[0063] The detector 350 may be disposed below the second driving motor 420 . When the second driving motor 420 drives the chopper plate 410 to rotate, the detector 350 may regularly receive electromagnetic waves due to the presence of the through hole.

[0064] A phase-locked amplifier can be connected externally, and a chopper can be used in conjunction with the phase-locked amplifier. The chopper can be placed in front of the detector 350 in the vacuum cover 100, and the radiation signal received by the detector 350 can be modulated. The phase-locked amplifier can be used to receive the chopping frequency signal of the chopper and the modulated radiation signal of the detector 350. The effective signal can be extracted from the signal mixed with the environmental noise and the effective signal, thereby achieving noise reduction of the detection signal of the detector 350.

[0065] In one embodiment of the present invention, the above-mentioned flexible heat-conducting member may be a copper braid, which has a strong thermal conductivity.

[0066] In one embodiment of the present invention, the refrigeration device may use a GM refrigerator 500 , and two GM refrigerators 500 may be provided.

[0067] A copper braid is used to conduct the cold energy of the primary cold energy output end of the first GM refrigerator 500 to the first cover body 310. The first cover body 310 can be a copper screen. Copper has good thermal conductivity. The copper screen can provide a low temperature environment for the test and reduce background noise.

[0068] The cold energy of the secondary cold energy output end of the first GM refrigerator 500 is respectively transferred to the multiple samples 220 and the black body 210 using copper braids, so as to complete the individual cooling and temperature control of the samples 220 and the black body 210 and ensure that the temperature of the samples 220 and the black body 210 is the same.

[0069] The copper braid is used to conduct the cold energy of the primary cold energy output end of the second GM refrigerator 500 to the second cover 331, so as to provide a cold environment for the transfer of heat radiation during the test.

[0070] The secondary cooling output end of the second GM refrigerator 500 is connected to the detector 350 using a copper braid, so as to realize independent cooling of the detector 350 and place the detector 350 in the first cover 310 to reduce the influence of environmental noise on the experiment.

[0071] In one embodiment of the present invention, a third cover 335 is further disposed outside the first reflector 332, and an incident channel is disposed on a side of the third cover 335 close to the reflective surface of the first reflector 332. The third cover 335 can rotate synchronously with the first reflector 332, and the incident channel is always aligned with the reflective surface of the first reflector 332.

[0072] In a specific embodiment, eight test piece brackets 340 are evenly distributed along the circumference of the second cover body 331, and the eight test piece brackets 340 are located on the same plane, and the plane is perpendicular to the rotation axis of the first reflector 332. One of the test piece brackets 340 is used to fix the black body 210, and the remaining seven test piece brackets 340 are used to fix the sample 220. The first reflector is driven to rotate by the first driving motor 334, so that the incident channel is selectively aligned with the black body 210 or the sample 220, so as to achieve the measurement of different samples 220 and the black body 210, and obtain the emissivity of the surface of the sample 220 through energy comparison.

[0073] After the third cover 335 is provided, when the first driving motor 334 drives the first reflector 332 and the third cover 335 to rotate, only the sample 220 or the black body 210 to be tested can be detected, and radiation interference from other samples 220 can be isolated.

[0074] In one embodiment of the present invention, the flexible connector may include a bellows 610 or a rubber isolation pad 620 , or both the bellows 610 and the rubber isolation pad 620 may be provided, which can effectively reduce the vibration of the refrigeration equipment from being transmitted to the vacuum cover 100 .

[0075] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A material surface emissivity measuring device, characterized in that: include: Vacuum cover (100); an emissivity measurement component, the emissivity measurement component being arranged in the vacuum cover (100) and used for measuring the emissivity of the black body (210) and the sample (220); A refrigeration device is suspended at the bottom of the vacuum cover (100) through a flexible connection piece, and the refrigeration device is used to provide cold energy for the emissivity measurement component.

2. The material surface emissivity measuring device according to claim 1, characterized in that: The refrigeration device is thermally connected to the emissivity measurement component via a flexible thermal conductor.

3. The material surface emissivity measuring device according to claim 2, characterized in that: The emissivity measurement assembly comprises: A first cover body (310), wherein the first cover body (310) is arranged in the vacuum cover (100), and the first cover body (310) is thermally connected to the refrigeration device via the flexible heat conductive member; a support plate (320), wherein the support plate (320) is disposed inside the first cover body (310); A reflection component (330), wherein the reflection component (330) is arranged on the support plate (320), and the incident end of the reflection component (330) is rotatable; at least two test piece supports (340), a plurality of the test piece supports (340) are arranged on the support plate (320), and the plurality of the test piece supports (340) are distributed along the circumference of the incident end of the reflective component (330), one of the test piece supports (340) is used to fix the black body (210), and the remaining test piece supports (340) are used to fix the sample (220); A detector (350), wherein the detector (350) is disposed on the support plate (320), and the detector (350) is used to receive electromagnetic waves reflected by the reflection component (330) and emitted by the black body (210) or the sample (220).

4. The material surface emissivity measuring device according to claim 3, characterized in that: It also includes a chopper, which is arranged between the transmitting end of the reflection component (330) and the receiving end of the detector (350).

5. The material surface emissivity measuring device according to claim 3, characterized in that: The reflective component (330) comprises: A second cover body (331), the second cover body (331) being connected to the support plate (320), and the second cover body (331) being connected to the refrigeration device via the flexible heat conductive member; a first reflector (332), the first reflector (332) being rotatably disposed in the second cover (331) and being used for selectively receiving electromagnetic waves emitted by the sample (220) or the black body (210); a second reflector (333), the second reflector (333) being disposed in the second cover (331) and being used for receiving the electromagnetic wave reflected by the first reflector (332) and transmitting the electromagnetic wave to the detector (350); A driving device is drivingly connected to the first reflector (332) and is used to drive the first reflector (332) to selectively receive electromagnetic waves emitted by the black body (210) or one of the samples (220).

6. The material surface emissivity measuring device according to claim 5, characterized in that: The refrigeration device comprises a plurality of refrigeration devices, each of which comprises a plurality of cold output terminals, and the plurality of cold output terminals are respectively connected to the first cover body (310), the second cover body (331), the sample (220), the black body (210) and the detector (350) in a one-to-one correspondence through the flexible heat conductive member.

7. The material surface emissivity measuring device according to claim 5, characterized in that: A third cover body (335) is also provided on the outer side of the first reflector (332), and an incident channel is provided on a side of the third cover body (335) corresponding to the reflective surface of the first reflector (332).

8. The material surface emissivity measuring device according to claim 1, characterized in that: The flexible connection element includes a bellows (610) and / or a rubber vibration isolation pad (620).

9. The material surface emissivity measuring device according to claim 2 or 6, characterized in that: The flexible heat-conducting member is a copper braid.

10. The material surface emissivity measuring device according to claim 5, characterized in that: The driving device is a first driving motor (334).

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