Circuit board batch automatic test system

Abstract

The invention discloses a circuit board batch automatic test system, and relates to the technical field of automatic test, in particular to a system for automatically testing circuit boards. In an existing test system, a series of test instruments such as a power supply, a signal source and a universal meter need to be manually controlled, operation is tedious, and the system integration rate is low. An upper computer is used as a main control core, modules needed by testing are connected through an Ethernet bus, sequential automatic testing of at most ten circuit boards is completed, testing data are recorded, and a testing report is generated. A circuit board batch automatic test system comprises an upper computer, a linear power supply, an analog signal generation and acquisition module and a test adapter. The upper computer comprises a test control module, a test display module, a test storage module and an Ethernet driving module; the analog signal generation and acquisition module comprises an analog signal generation unit and an analog signal acquisition unit; the test adapter comprises a test base plate and a test signal conditioning module.

Description

Technical Field

[0001] The present invention relates to the field of automatic testing technology, and in particular to a system and method for automatically testing a circuit board. Background Art

[0002] Circuit board testing projects are becoming increasingly complex. After mass production of circuit boards, it is inevitable to test the produced circuit boards to ensure the quality of circuit board production. In the existing test system, a series of test instruments such as power supply, signal source, multimeter, oscilloscope, etc. need to be manually controlled, which is cumbersome to operate and has a low system integration rate.

[0003] In the existing manual batch testing, the operation is repetitive, the efficiency is low, and the test results are inevitably wrong due to manual errors. Summary of the invention

[0004] In order to solve the above problems, a circuit board batch automatic testing system is urgently needed. The system integrates instrument functions such as power supply, signal source, multimeter, etc., completes automatic sequential testing of up to ten circuit boards, records data, and generates reports.

[0005] A batch automatic testing system for circuit boards comprises a host computer, a linear power supply, an analog signal generation and acquisition module and a test adapter.

[0006] The host computer serves as a main control core and is connected to the linear power supply, the analog signal generation and acquisition module and the test adapter through an Ethernet bus.

[0007] The host computer includes: a test control module, a test display module, a test storage module and an Ethernet driver module;

[0008] Furthermore, the test control module includes: a linear power supply control module, an analog signal output control module, an analog signal acquisition control module, and a test signal conditioning control module;

[0009] The linear power supply control module is used to control the linear power supply to supply power to the analog signal generation and acquisition module and the test adapter, and read the linear power supply output current;

[0010] The analog signal output control module is used to control the analog signal generation and acquisition module to output the test excitation signal required by the circuit board under test;

[0011] The analog signal acquisition control module is used to control the analog signal generation and acquisition module to acquire the test response signal of the circuit board under test;

[0012] The test signal conditioning control module is used to control the test adapter to connect the analog signal output end of the analog signal generation and acquisition module with the excitation signal pin required for circuit board testing, and to connect the analog signal acquisition end of the analog signal generation and acquisition module with the circuit board test response signal output pin;

[0013] The test display module is connected to the Ethernet driver module to read, judge and display the test results of each test item of each circuit board;

[0014] The test storage module is used to record test data and generate test reports;

[0015] The Ethernet driver module is used for sending, receiving and scheduling Ethernet signals of the host computer.

[0016] The linear power supply supplies power to the analog signal generation and acquisition module, the test signal conditioning module and the circuit board under test, and sends the working current of the circuit board under test to the host computer through the Ethernet bus.

[0017] The analog signal generation and acquisition module includes an analog signal generation unit and an analog signal acquisition unit;

[0018] The analog signal generating unit converts the current signal output by the DAC into a voltage signal, and finally converts it into the test excitation signal required by the circuit board under test through a primary voltage follower circuit and a tertiary voltage amplifier circuit;

[0019] The analog signal acquisition unit converts the analog response signal output by the tested circuit board into a digital signal through an ADC, a primary voltage follower circuit and a third voltage attenuation circuit, and transmits the digital signal to a host computer through an Ethernet bus.

[0020] The test adapter includes a test base plate and a test signal conditioning module;

[0021] The test baseboard is used to realize the electrical connection between the test signal conditioning module and the linear power supply module, the analog signal generation and acquisition module and the Ethernet bus;

[0022] The test signal conditioning module receives the configuration instruction of the host computer through the Ethernet bus, connects the linear power supply to the circuit board under test, and connects the analog signal generation and acquisition module to the circuit board under test;

[0023] There are ten groups of test signal conditioning modules in total, and each group is independent of each other. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0025] Figure 1 A schematic diagram of the structure of a circuit board batch automatic testing system provided in an embodiment of this specification;

[0026] The above drawings include the following reference numerals:

[0027] 10. Host computer; 20. Linear power supply; 30. Analog signal generation and acquisition module; 40. Test adapter; 110. Test control module; 120. Test display module; 130. Test storage module; 140. Ethernet driver module; 310. Analog signal generation unit; 320. Analog signal acquisition unit; 410. Test signal conditioning module; 420. Test baseboard. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solutions and advantages of this specification more clear, the technical solutions of this application will be clearly and completely described below in combination with the specific embodiments of this specification and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of this application, not all of them. Based on the embodiments in the specification, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0029] refer to Figure 1 , Figure 1 It is a structural schematic diagram of the present invention.

[0030] like Figure 1 As shown, the circuit board batch automatic test system of the present invention includes four parts: a host computer 10, a linear power supply 20, an analog signal generation and acquisition module 30, and a test baseboard 40. The host computer 10 includes a test control module 110, a test display module 120, a test storage module 130, and an Ethernet driver module 140. The analog signal generation and acquisition module 30 includes an analog signal generation unit 310 and an analog signal acquisition unit 320. The test adapter 40 includes a test signal conditioning module 410 and a test baseboard 420, wherein the number of the test signal conditioning modules is ten. For the sake of simplicity, the numbers of modules and components are omitted in some of the following embodiments.

[0031] The test control module is used to control the linear power supply to supply power to the analog signal generation and acquisition module and the test adapter according to the test requirements of the circuit under test; control the analog signal generation unit to output the analog signal required by the circuit board under test; control the analog signal acquisition unit to acquire the test response output by the circuit board under test; and control the test signal conditioning module to switch the circuit board under test.

[0032] The test display module is used to display the working current of the tested circuit board and the test response result.

[0033] The test storage module is used to store the test data of the tested circuit board and generate a test report.

[0034] The Ethernet driver module is used for sending, receiving and scheduling Ethernet signals of the host computer.

[0035] The linear power supply receives the configuration instruction of the test control module, is used to supply power to the analog signal generation and acquisition module and the test adapter, and sends the working current of the circuit board under test to the host computer through the Ethernet bus.

[0036] The analog signal generating unit converts the current signal output by the DAC into a voltage signal, which is then converted into the excitation signal required by the circuit under test through a primary voltage follower circuit and a tertiary voltage amplifier circuit.

[0037] The peak-to-peak value range of the output signal of the above analog signal generating unit is ±10V, the frequency range is 0-1MHz, and the output waveform includes sine wave, square wave and triangle wave.

[0038] The analog signal acquisition unit converts the analog response signal output by the tested circuit board into a digital signal through ADC, a first-level voltage follower circuit and a third-level voltage attenuation circuit, and transmits the digital signal to the host computer.

[0039] The peak-to-peak range of the input signal of the above analog signal acquisition unit is ±10V, and the maximum sampling rate is 1Mhz.

[0040] The test adapter comprises a test base plate and a test signal conditioning module.

[0041] The test baseboard is used for the electrical connection between the test signal conditioning module, the linear power supply module, the analog signal generation and acquisition module and the Ethernet bus.

[0042] The above-mentioned test signal conditioning module is used to receive the configuration instructions of the above-mentioned host computer, connect the above-mentioned linear power supply to the circuit board under test, connect the above-mentioned analog signal generation and acquisition module to the circuit board under test, complete the switching of the circuit board under test by switching the relay, and complete the batch test of ten circuit boards under test in sequence.

[0043] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A circuit board batch automatic testing system, characterized by: The system comprises a host computer, a linear power supply, an analog signal generation and acquisition module and a test adapter. The host computer is connected with other modules via an Ethernet bus.

2. A circuit board batch automatic testing system according to claim 1, characterized in that: The host computer includes a test control module, a test display module, a test storage module and an Ethernet driver module.

3. A circuit board batch automatic testing system according to claim 2, characterized in that: The test control module includes: a linear power supply control module, an analog signal output control module, an analog signal acquisition control module, and a test signal conditioning control module; The linear power supply control module is used to control the linear power supply to supply power to the analog signal generation and acquisition module and the test adapter, and read the working current; The analog signal output control module is used to control the analog signal generation and acquisition module to output the analog excitation signal required by the circuit board under test; The analog signal acquisition control module is used to control the analog signal generation and acquisition module to acquire the analog response signal output by the tested circuit board; The test signal conditioning control module is used to control the test adapter to switch the circuit board under test.

4. A circuit board batch automatic testing system according to claim 2, characterized in that: The test display module is used to display the working current of the tested circuit board and the test response result.

5. A circuit board batch automatic testing system according to claim 2, characterized in that: The test storage module is used to store the test data of the tested circuit board and generate a test report.

6. A circuit board batch automatic testing system according to claim 2, characterized in that: The Ethernet driver module is used for sending, receiving and scheduling Ethernet bus signals of the host computer.

7. A circuit board batch automatic testing system according to claim 1, characterized in that: The linear power supply is used to power the analog signal generation and acquisition module and the test adapter, and returns the working current of the circuit board under test.

8. A circuit board batch automatic testing system according to claim 1, characterized in that: The analog signal generation and acquisition module includes an analog signal generation unit and an analog signal acquisition unit.

9. A circuit board batch automatic testing system according to claim 8, characterized in that: The analog signal generating unit converts the current signal output by the DAC into a voltage signal, and finally converts it into the excitation signal required by the circuit under test through a primary voltage follower circuit and a tertiary voltage amplifier circuit; The analog signal acquisition unit converts the response analog signal output by the tested circuit board into a digital signal through ADC, a primary voltage follower circuit and a third voltage attenuation circuit, and transmits the digital signal to the host computer through an Ethernet bus.

10. A circuit board batch automatic testing system according to claim 1, characterized in that: The test adapter includes a test base plate and a test signal conditioning module; The test baseboard is used for the electrical connection between the test signal conditioning module and the linear power supply module, the analog signal generation and acquisition module and the Ethernet bus; The test signal conditioning module is used to receive the configuration instruction of the host computer, connect the linear power supply to the circuit board under test, and connect the analog signal generation and acquisition module to the circuit board under test; There are ten groups of test signal conditioning modules in total, and each group is independent of each other.

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