System and method for improving retroreflection coefficient of micro-nano optical structure of micro-prism reflective film

Abstract

The invention relates to the technical field of optical engineering, and discloses a retroreflection coefficient improving system for a micro-nano optical structure of a micro-prism reflective film. Comprising an optical modeling and simulation module, a material characteristic analysis module, a micro-nano processing control module, an environmental parameter monitoring module, a data acquisition and processing module, an optimization algorithm module, a quality detection module and a visual display module, and the material characteristic analysis module is used for analyzing optical characteristics and physical properties of the selected reflective film material. According to the method, the optical modeling and simulation module is established, trial and error are continuously performed on the basis of the lowest retroreflection coefficient parameter until the retroreflection coefficient is increased, and the structure and material parameters of the microprism are recorded, so that material loss and cost investment caused by blind trial are effectively reduced, and the resource utilization efficiency and the economic benefit are improved; and the retroreflection coefficient of the microprism reflective film is obviously improved.

Description

Technical Field

[0001] The present invention relates to the field of optical engineering technology, and in particular to a system and method for improving the retroreflection coefficient of a micro-nano optical structure of a micro-prismatic reflective film. Background Art

[0002] Retroreflection is a kind of reflection that returns from the opposite direction of the incident light. When the direction of the incident light changes within a large range, this property can still be maintained. Retroreflection is a kind of reflection that returns from the opposite direction of the incident light. When the direction of the incident light changes within a large range, the microprismatic reflective film adopts a densely arranged triangular pyramid microprism design. It has greatly improved light utilization, reflective performance, and reflective uniformity compared to glass microbead reflective film. The theoretical reflective rate can reach 70%. Reflective film is a retroreflective material that has been made into a thin film and can be directly used. As an important optical material, microprismatic reflective film is widely used in traffic safety, personal protection and advertising signs.

[0003] At present, when the retroreflective performance of microprismatic reflective film needs to be improved, a large amount of materials need to be used, a large number of experiments need to be carried out, and the materials need to be rearranged and combined according to their characteristics, which costs too much. At the same time, due to the difference in materials, the shape, size and arrangement of the microprisms are not ideal, which affects the propagation and reflection of light and restricts the improvement of the retroreflection coefficient. Summary of the invention

[0004] In order to make up for the above shortcomings, the present invention provides a system and method for improving the retroreflection coefficient of a micro-nano optical structure of a micro-prismatic reflective film, aiming to improve the problem of excessive cost investment and the restriction of the improvement of the retroreflection coefficient due to material differences.

[0005] In the first aspect, the present invention provides the following technical solutions: a system for improving the retroreflection coefficient of a micro-prismatic reflective film micro-nano optical structure, including an optical modeling and simulation module, a material property analysis module, a micro-nano processing control module, an environmental parameter monitoring module, a data acquisition and processing module, an optimization algorithm module, a quality detection module and a visual display module;

[0006] The optical modeling and simulation module is used to model the micro-nano optical structure of the micro-prismatic reflective film;

[0007] The material property analysis module is used to analyze the optical properties and physical properties of the selected reflective film material;

[0008] The micro-nano processing control module is used to accurately control the micro-nano processing equipment;

[0009] The environmental parameter monitoring module is used to monitor the influence of temperature and humidity on the performance of the microprismatic reflective film;

[0010] The data acquisition and processing module is used to collect the retroreflection coefficient test data for processing and analysis;

[0011] The optimization algorithm module is used to apply the optimization algorithm;

[0012] The quality inspection module is used to perform quality inspection on the processed micro-prismatic reflective film;

[0013] The visual display module is used to display the operating status, test results and optimization process of the system.

[0014] Preferably, the optical modeling and simulation module includes a geometric modeling unit, an optical parameter setting unit, a ray tracing calculation unit and a result analysis unit, wherein the geometric modeling unit is responsible for constructing the three-dimensional geometric structure of the micro-prismatic reflective film, the optical parameter setting unit is used to set the refractive index and absorptivity optical parameters of the material, the ray tracing calculation unit is used to perform propagation and reflection calculations of light in the micro-nano structure, and the result analysis unit is used to perform data processing and analysis on the simulation results;

[0015] The material property analysis module includes a material composition detection unit, an optical property testing unit, a physical property evaluation unit and a data storage and management unit. The material composition detection unit is used to analyze the chemical composition of the material, the optical property testing unit is used to measure the optical properties of the material's refractive index, reflectivity and transmittance, the physical property evaluation unit is used to evaluate the material's physical properties of hardness, flexibility and thermal stability, and the data storage and management unit is used to save the data of the material property analysis.

[0016] Preferably, the micro-nano processing control module includes an equipment interface unit, a process parameter setting unit, a real-time monitoring unit and an error correction unit. The equipment interface unit is used to communicate and connect with the micro-nano processing equipment, the process parameter setting unit is used to accurately set the parameters in the processing process, the real-time monitoring unit is used to obtain the equipment status and processing progress in real time during the processing, and the error correction unit is used to detect and correct errors occurring in the processing process.

[0017] Preferably, the environmental parameter monitoring module includes a temperature sensor unit, a humidity sensor unit, a light intensity monitoring unit and a data transmission unit, wherein the temperature sensor unit is used to measure the ambient temperature, the humidity sensor unit is used to detect the ambient humidity, the light intensity monitoring unit is used to monitor the light intensity in the environment, and the data transmission unit is used to transmit the monitored data to the system in real time;

[0018] The data acquisition and processing module includes a sensor interface unit, a data preprocessing unit, a feature extraction unit and a statistical analysis unit. The sensor interface unit is used to connect the data acquisition sensor, the data preprocessing unit is used to filter and reduce noise on the collected raw data, the feature extraction unit is used to extract useful feature information from the processed data, and the statistical analysis unit is used to perform statistical analysis on the data.

[0019] Preferably, the optimization algorithm module includes an algorithm selection unit, an objective function setting unit, a parameter adjustment unit and an optimization result output unit, wherein the algorithm selection unit is used to select a suitable optimization algorithm, the objective function setting unit is used to define the optimization goal, the parameter adjustment unit is used to adjust the parameters of the algorithm, and the optimization result output unit is used to output the optimized microprism structure and material parameters.

[0020] Preferably, the quality inspection module includes an appearance inspection unit, a performance testing unit, a defect analysis unit and a qualified judgment unit, the appearance inspection unit is used to check the appearance of the microprismatic reflective film, the performance testing unit is used to test the performance indicators of the retroreflection coefficient and uniformity, the defect analysis unit is used to analyze the types and causes of defects found during the inspection, and the qualified judgment unit is used to judge whether the product is qualified based on the inspection results.

[0021] Preferably, the visualization display module includes a graphics drawing unit, an interactive interface design unit, a data display unit and a report generation unit. The graphics drawing unit is used to draw the system data into charts and images, the interactive interface design unit is used to design a user-friendly interactive interface, the data display unit is used to display the system operating status, test data, and optimization information in an intuitive manner, and the report generation unit is used to generate detailed reports according to user needs.

[0022] In a second aspect, the present invention provides the following technical solution, a method for improving the retroreflection coefficient of a micro-nano optical structure of a micro-prismatic reflective film, the method comprising the following steps:

[0023] S1: Use the optical modeling and simulation module to model the three-dimensional geometric structure of the microprismatic reflective film and set the optical parameters of the material. Then input the required retroreflection coefficient into the model, use the model to calculate light propagation and reflection, process and analyze the simulation results, and use the material property analysis module to analyze the chemical composition, optical and physical properties of the material to provide a basis for material selection;

[0024] S2: In the micro-nano processing control module, connect the micro-nano processing equipment, accurately set the processing parameters, obtain the equipment status and processing progress in real time, detect and correct the processing errors, and use the environmental parameter monitoring module to monitor the temperature, humidity and light intensity, and transmit data in real time;

[0025] S3: Use the data acquisition and processing module to connect the data acquisition sensor, filter and reduce noise on the raw data, extract useful feature information and perform statistical analysis;

[0026] S4: In the optimization algorithm module, select a suitable algorithm, define the optimization target, adjust the algorithm parameters, and output the optimized microprism structure and material parameters;

[0027] S5: Rely on the quality inspection module to check the appearance of the reflective film, test the performance indicators, analyze the defect type and cause, and determine whether the product is qualified;

[0028] S6: With the help of the visualization module, draw system data charts and images, design interactive interfaces, display relevant information, and generate reports based on demand. If the quality inspection does not meet the standards, adjust the plan based on the feedback information and repeat the above steps until the ideal retroreflection coefficient is achieved.

[0029] In the third aspect, the invention provides the following technical solution: a computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor; when the processor executes the computer program, the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film is implemented.

[0030] In a fourth aspect, the present invention provides the following technical solution: a readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film is implemented.

[0031] The present invention has the following beneficial effects:

[0032] 1. In the present invention, an optical modeling and simulation module is created, and the minimum retroreflection coefficient parameters are input into the module. Then, the optical parameters of the material are also input into the model, and calculations and matching are performed in the model. Thus, trial and error are continuously performed on the basis of the minimum retroreflection coefficient parameters until the retroreflection coefficient is improved and the microprism structure and material parameters are recorded. This effectively reduces the material loss and cost investment caused by blind attempts, improves resource utilization efficiency and economic benefits, and significantly improves the retroreflection coefficient of the microprismatic reflective film.

[0033] 2. In the present invention, it is possible to conduct in-depth analysis of material properties and monitoring of environmental parameters, and to perform targeted calculations according to different market demands to obtain accurate and reliable matching of microprismatic reflective films that are suitable for different application scenarios and environmental conditions, and can quickly adapt to changes in market demand for microprismatic reflective films with high retroreflection coefficients.

[0034] 3. In the present invention, the micro-nano processing control module conducts actual experimental production according to the materials and data in the model, accurately controls the processing process, thereby reducing the defective rate of formal production, and comprehensively analyzes the material properties to select better materials and extend the service life. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 A schematic diagram of the system framework of the micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system proposed in the present invention;

[0036] Figure 2 A schematic diagram of an optical modeling and simulation module of a system for improving the retroreflection coefficient of a micro-prism reflective film micro-nano optical structure proposed in the present invention;

[0037] Figure 3 Schematic diagram of the material property analysis module of the micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system proposed in the present invention;

[0038] Figure 4 A schematic diagram of a micro-nano processing control module of a micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system proposed in the present invention;

[0039] Figure 5 A schematic diagram of an environmental parameter monitoring module of a micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system proposed in the present invention;

[0040] Figure 6 This is a schematic diagram of the data acquisition and processing module of the system for improving the retroreflection coefficient of the micro-prism reflective film micro-nano optical structure proposed by the present invention;

[0041] Figure 7 A schematic diagram of an optimization algorithm module of a system for improving the retroreflection coefficient of a micro-prism reflective film micro-nano optical structure proposed in the present invention;

[0042] Figure 8 A schematic diagram of a quality inspection module of a system for improving the retroreflection coefficient of a micro-prismatic reflective film micro-nano optical structure proposed by the present invention;

[0043] Fig. 9 A schematic diagram of a visualization display module of a system for improving the retroreflection coefficient of a micro-prism reflective film micro-nano optical structure proposed by the present invention;

[0044] Fig.10 This is a flow chart of the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film proposed by the present invention. DETAILED DESCRIPTION

[0045] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0046] Embodiment 1

[0047] Reference Figure 1-Figure 9 , in the first embodiment of the present invention, the present invention provides a micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system, including an optical modeling and simulation module, a material property analysis module, a micro-nano processing control module, an environmental parameter monitoring module, a data acquisition and processing module, an optimization algorithm module, a quality detection module and a visual display module;

[0048] The optical modeling and simulation module is used to model the micro-nano optical structure of the micro-prismatic reflective film;

[0049] The material property analysis module is used to analyze the optical properties and physical properties of the selected reflective film material;

[0050] The micro-nano processing control module is used to precisely control micro-nano processing equipment;

[0051] The environmental parameter monitoring module is used to monitor the impact of temperature and humidity on the performance of the microprismatic reflective film;

[0052] The data acquisition and processing module is used to collect the retroreflection coefficient test data for processing and analysis;

[0053] The optimization algorithm module is used to apply the optimization algorithm;

[0054] The quality inspection module is used to inspect the quality of the processed micro-prismatic reflective film;

[0055] The visualization module is used to display the system's operating status, test results, and optimization process.

[0056] The optical modeling and simulation module includes a geometric modeling unit, an optical parameter setting unit, a ray tracing calculation unit and a result analysis unit. The geometric modeling unit is responsible for constructing the three-dimensional geometric structure of the micro-prismatic reflective film, the optical parameter setting unit is used to set the refractive index and absorptivity optical parameters of the material, the ray tracing calculation unit is used to perform the propagation and reflection calculation of light in the micro-nano structure, and the result analysis unit is used to perform data processing and analysis on the simulation results;

[0057] The material property analysis module includes a material composition detection unit, an optical property testing unit, a physical property evaluation unit and a data storage and management unit. The material composition detection unit is used to analyze the chemical composition of the material. The optical property testing unit is used to measure the optical properties of the material such as refractive index, reflectivity and transmittance. The physical property evaluation unit is used to evaluate the physical properties of the material such as hardness, flexibility and thermal stability. The data storage and management unit is used to save the data of material property analysis.

[0058] The micro-nano processing control module includes an equipment interface unit, a process parameter setting unit, a real-time monitoring unit and an error correction unit. The equipment interface unit is used to communicate and connect with the micro-nano processing equipment. The process parameter setting unit is used to accurately set the parameters in the processing process. The real-time monitoring unit is used to obtain the equipment status and processing progress in real time during the processing. The error correction unit is used to detect and correct errors that occur during the processing.

[0059] The environmental parameter monitoring module includes a temperature sensor unit, a humidity sensor unit, a light intensity monitoring unit and a data transmission unit. The temperature sensor unit is used to measure the ambient temperature, the humidity sensor unit is used to detect the ambient humidity, the light intensity monitoring unit is used to monitor the light intensity in the environment, and the data transmission unit is used to transmit the monitored data to the system in real time;

[0060] The data acquisition and processing module includes a sensor interface unit, a data preprocessing unit, a feature extraction unit and a statistical analysis unit. The sensor interface unit is used to connect the data acquisition sensor, the data preprocessing unit is used to filter and reduce noise on the collected raw data, the feature extraction unit is used to extract useful feature information from the processed data, and the statistical analysis unit is used to perform statistical analysis on the data.

[0061] The optimization algorithm module includes an algorithm selection unit, an objective function setting unit, a parameter adjustment unit and an optimization result output unit. The algorithm selection unit is used to select a suitable optimization algorithm, the objective function setting unit is used to define the optimization goal, the parameter adjustment unit is used to adjust the parameters of the algorithm, and the optimization result output unit is used to output the optimized microprism structure and material parameters.

[0062] The quality inspection module includes an appearance inspection unit, a performance testing unit, a defect analysis unit and a qualified judgment unit. The appearance inspection unit is used to check the appearance of the microprismatic reflective film, the performance testing unit is used to test the performance indicators of the retroreflection coefficient and uniformity, the defect analysis unit is used to analyze the types and causes of defects found during the inspection, and the qualified judgment unit is used to judge whether the product is qualified based on the inspection results.

[0063] The visualization display module includes a graphics drawing unit, an interactive interface design unit, a data display unit and a report generation unit. The graphics drawing unit is used to draw system data into charts and images. The interactive interface design unit is used to design a user-friendly interactive interface. The data display unit is used to display the system operation status, test data, and optimization information in an intuitive way. The report generation unit is used to generate detailed reports according to user needs.

[0064] The optical modeling and simulation module is used to model the three-dimensional geometric structure of the microprismatic reflective film, set the material's refractive index and absorptivity optical parameters, perform calculations on the propagation and reflection of light in the micro-nano structure, and perform data processing and analysis on the simulation results to preliminarily determine the optimization direction.

[0065] Through the material property analysis module, the chemical composition of the material is analyzed, the optical properties of the material such as refractive index, reflectivity and transmittance are measured, and the physical properties such as hardness, flexibility and thermal stability of the material are evaluated to provide a basis for material selection.

[0066] In the micro-nano processing control module, the device interface unit is used to communicate with the micro-nano processing equipment, the process parameter setting unit is used to accurately set the parameters in the processing process, the real-time monitoring unit is used to obtain the equipment status and processing progress in real time, and the error correction unit is used to timely detect and correct the errors that occur in the processing process to ensure the precision and accuracy of micro-nano processing.

[0067] The temperature sensor unit, humidity sensor unit and light intensity monitoring unit in the environmental parameter monitoring module are used to measure the ambient temperature, humidity and light intensity respectively. The monitoring data are transmitted to the system in real time through the data transmission unit so that the influence of environmental factors can be considered during the processing.

[0068] The sensor interface unit of the data acquisition and processing module is used to connect the data acquisition sensor, the data preprocessing unit is used to filter and reduce noise on the collected raw data, the feature extraction unit is used to extract useful feature information, and the statistical analysis unit is used to perform statistical analysis on the data to obtain valuable data information.

[0069] In the optimization algorithm module, the particle swarm optimization algorithm is selected through the algorithm selection unit, the optimization to maximize the retroreflection coefficient is defined using the objective function setting unit, the algorithm parameters are adjusted using the parameter adjustment unit to improve the optimization effect, and finally the optimized microprism structure and material parameters are output by the optimization result output unit.

[0070] The appearance inspection unit of the quality inspection module is used to check the surface flatness and defect appearance of the microprismatic reflective film. The performance testing unit is used to test the retroreflection coefficient and uniformity performance index. The defect analysis unit analyzes the types and causes of defects found in the inspection. The qualified judgment unit determines whether the product is qualified based on the inspection results.

[0071] With the help of the graphic drawing unit of the visualization module, the system data is drawn into intuitive forms such as charts and images. A user-friendly interactive interface is designed through the interactive interface design unit. The data display unit is used to display the system operation status, test data and optimization process information. The report generation unit is used to generate detailed reports according to user needs.

[0072] Finally, if the quality inspection results do not meet expectations, the feedback information from the above modules is integrated, the optimization plan is readjusted, and the above steps are repeated until the retroreflection coefficient of the microprismatic reflective film reaches the ideal level.

[0073] Embodiment 2:

[0074] Reference Fig.10 In a second embodiment of the present invention, the present invention provides a method for improving the retroreflection coefficient of a micro-nano optical structure of a micro-prismatic reflective film, the method comprising the following steps:

[0075] S1: Use the optical modeling and simulation module to model the three-dimensional geometric structure of the microprismatic reflective film and set the optical parameters of the material. Then input the required retroreflection coefficient into the model, use the model to calculate light propagation and reflection, process and analyze the simulation results, and use the material property analysis module to analyze the chemical composition, optical and physical properties of the material to provide a basis for material selection;

[0076] S2: In the micro-nano processing control module, connect the micro-nano processing equipment, accurately set the processing parameters, obtain the equipment status and processing progress in real time, detect and correct the processing errors, and use the environmental parameter monitoring module to monitor the temperature, humidity and light intensity, and transmit data in real time;

[0077] S3: Use the data acquisition and processing module to connect the data acquisition sensor, filter and reduce noise on the raw data, extract useful feature information and perform statistical analysis;

[0078] S4: In the optimization algorithm module, select a suitable algorithm, define the optimization target, adjust the algorithm parameters, and output the optimized microprism structure and material parameters;

[0079] S5: Rely on the quality inspection module to check the appearance of the reflective film, test the performance indicators, analyze the defect type and cause, and determine whether the product is qualified;

[0080] S6: With the help of the visualization module, draw system data charts and images, design interactive interfaces, display relevant information, and generate reports based on demand. If the quality inspection does not meet the standards, adjust the plan based on the feedback information and repeat the above steps until the ideal retroreflection coefficient is achieved.

[0081] Embodiment 3

[0082] The third embodiment of the present invention is based on the same inventive concept and proposes a computer-readable storage medium. The computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the method for improving the retroreflection coefficient of the micro-prismatic reflective film micro-nano optical structure of the above embodiment are implemented.

[0083] Embodiment 4

[0084] The fourth embodiment of the present invention is based on the same inventive concept. The present invention proposes a computer device, the terminal includes: a processor, a memory; the processor and the memory communicate with each other; the memory is used to store instructions; the processor is used to execute the instructions in the memory, and execute the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film of the above embodiment.

[0085] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0086] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, it is still possible for those skilled in the art to modify the technical solutions described in the aforementioned embodiments or to make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. Micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system, characterized in that: It includes optical modeling and simulation module, material property analysis module, micro-nano processing control module, environmental parameter monitoring module, data acquisition and processing module, optimization algorithm module, quality inspection module and visualization display module; The optical modeling and simulation module is used to model the micro-nano optical structure of the micro-prismatic reflective film; The material property analysis module is used to analyze the optical properties and physical properties of the selected reflective film material; The micro-nano processing control module is used to accurately control the micro-nano processing equipment; The environmental parameter monitoring module is used to monitor the influence of temperature and humidity on the performance of the microprismatic reflective film; The data acquisition and processing module is used to collect the retroreflection coefficient test data for processing and analysis; The optimization algorithm module is used to apply the optimization algorithm; The quality inspection module is used to perform quality inspection on the processed micro-prismatic reflective film; The visual display module is used to display the operating status, test results and optimization process of the system.

2. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The optical modeling and simulation module includes a geometric modeling unit, an optical parameter setting unit, a ray tracing calculation unit and a result analysis unit. The geometric modeling unit is responsible for constructing a three-dimensional geometric structure of the micro-prismatic reflective film. The optical parameter setting unit is used to set the refractive index and absorptivity optical parameters of the material. The ray tracing calculation unit is used to perform propagation and reflection calculations of light in the micro-nano structure. The result analysis unit is used to perform data processing and analysis on the simulation results. The material property analysis module includes a material composition detection unit, an optical property testing unit, a physical property evaluation unit and a data storage and management unit. The material composition detection unit is used to analyze the chemical composition of the material, the optical property testing unit is used to measure the optical properties of the material's refractive index, reflectivity and transmittance, the physical property evaluation unit is used to evaluate the material's physical properties of hardness, flexibility and thermal stability, and the data storage and management unit is used to save the data of the material property analysis.

3. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The micro-nano processing control module includes an equipment interface unit, a process parameter setting unit, a real-time monitoring unit and an error correction unit. The equipment interface unit is used to communicate and connect with the micro-nano processing equipment, the process parameter setting unit is used to accurately set the parameters in the processing process, the real-time monitoring unit is used to obtain the equipment status and processing progress in real time during the processing, and the error correction unit is used to detect and correct errors occurring in the processing process.

4. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The environmental parameter monitoring module includes a temperature sensor unit, a humidity sensor unit, a light intensity monitoring unit and a data transmission unit. The temperature sensor unit is used to measure the ambient temperature, the humidity sensor unit is used to detect the ambient humidity, the light intensity monitoring unit is used to monitor the light intensity in the environment, and the data transmission unit is used to transmit the monitored data to the system in real time; The data acquisition and processing module includes a sensor interface unit, a data preprocessing unit, a feature extraction unit and a statistical analysis unit. The sensor interface unit is used to connect the data acquisition sensor, the data preprocessing unit is used to filter and reduce noise on the collected raw data, the feature extraction unit is used to extract useful feature information from the processed data, and the statistical analysis unit is used to perform statistical analysis on the data.

5. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The optimization algorithm module includes an algorithm selection unit, an objective function setting unit, a parameter adjustment unit and an optimization result output unit. The algorithm selection unit is used to select a suitable optimization algorithm, the objective function setting unit is used to define the optimization goal, the parameter adjustment unit is used to adjust the parameters of the algorithm, and the optimization result output unit is used to output the optimized microprism structure and material parameters.

6. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The quality inspection module includes an appearance inspection unit, a performance testing unit, a defect analysis unit and a qualified judgment unit. The appearance inspection unit is used to check the appearance of the microprismatic reflective film, the performance testing unit is used to test the performance indicators of the retroreflection coefficient and uniformity, the defect analysis unit is used to analyze the types and causes of defects found in the inspection, and the qualified judgment unit is used to judge whether the product is qualified according to the inspection results.

7. The micro-prismatic reflective film micro-nano optical structure retroreflection coefficient enhancement system according to claim 1, characterized in that: The visualization display module includes a graphics drawing unit, an interactive interface design unit, a data display unit and a report generation unit. The graphics drawing unit is used to draw system data into charts and images, the interactive interface design unit is used to design a user-friendly interactive interface, the data display unit is used to display the system operation status, test data, and optimization information in an intuitive manner, and the report generation unit is used to generate detailed reports according to user needs.

8. A method for improving the retroreflection coefficient of a micro-nano optical structure of a micro-prismatic reflective film, characterized in that: The system for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film according to any one of claims 1 to 7 comprises the following steps: S1: Use the optical modeling and simulation module to model the three-dimensional geometric structure of the microprismatic reflective film and set the optical parameters of the material. Then input the required retroreflection coefficient into the model, use the model to calculate light propagation and reflection, process and analyze the simulation results, and use the material property analysis module to analyze the chemical composition, optical and physical properties of the material to provide a basis for material selection; S2: In the micro-nano processing control module, connect the micro-nano processing equipment, accurately set the processing parameters, obtain the equipment status and processing progress in real time, detect and correct the processing errors, and use the environmental parameter monitoring module to monitor the temperature, humidity and light intensity, and transmit data in real time; S3: Use the data acquisition and processing module to connect the data acquisition sensor, filter and reduce noise on the raw data, extract useful feature information and perform statistical analysis; S4: In the optimization algorithm module, select a suitable algorithm, define the optimization target, adjust the algorithm parameters, and output the optimized microprism structure and material parameters; S5: Rely on the quality inspection module to check the appearance of the reflective film, test the performance indicators, analyze the defect type and cause, and determine whether the product is qualified; S6: With the help of the visualization module, draw system data charts and images, design interactive interfaces, display relevant information, and generate reports based on demand. If the quality inspection does not meet the standards, adjust the plan based on the feedback information and repeat the above steps until the ideal retroreflection coefficient is achieved.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film as described in claim 8 is implemented.

10. A readable storage medium, characterized in that: The readable storage medium stores a computer program, and when the computer program is executed by the processor, the method for improving the retroreflection coefficient of the micro-nano optical structure of the micro-prismatic reflective film as claimed in claim 8 is implemented.

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