Defect detection method and system for special-shaped intelligent card

Abstract

The invention relates to the technical field of intelligent card defect monitoring, and particularly discloses a special-shaped intelligent card defect detection method and system, and the method comprises the steps: S1, collecting a standard number of special-shaped intelligent cards, measuring the resistance value of an internal coil of each special-shaped intelligent card and the weight of each card, and calculating a resistance difference value and a card weight difference value; s2, calculating an oxidation value coefficient of an internal coil of the special-shaped smart card; s3, obtaining the preset specification length of the internal coil and the cross sectional area of the internal coil when the special-shaped intelligent card is produced, calculating the resistivity of the internal coil of the special-shaped intelligent card, and calculating a resistivity fluctuation value; and S4, recording the time required for the accumulated charge in the internal coil of the special-shaped intelligent card to reach a specified value, calculating an average resistance value, calculating an aging degree coefficient of the special-shaped intelligent card, and screening out an aged card. The invention provides a rapid and accurate method for detecting the aging problem of the internal coil of the special-shaped intelligent card.

Description

Technical Field

[0001] The present invention relates to the technical field of smart card defect monitoring, and in particular to a method and system for detecting defects in special-shaped smart cards. Background Art

[0002] A special-shaped smart card is a smart card with a non-standard shape. A smart card is also called an IC card. IC cards are divided into contact and contactless types. Special-shaped smart cards belong to contactless IC cards. The working principle of a contactless IC card is that the radio frequency reader sends a set of electromagnetic waves of fixed frequency to the contactless IC card. There is an LC series resonant circuit in the card, and its frequency is the same as the frequency emitted by the reader. In this way, under the excitation of electromagnetic waves, the LC resonant circuit resonates, so that there is a charge in the capacitor; at the other end of this capacitor, there is a unidirectional electronic pump connected to send the charge in the capacitor to another capacitor for storage. When the accumulated charge reaches 2V, this capacitor can be used as a power supply to provide working voltage for other circuits, transmit the data in the card or receive data from the reader.

[0003] In the prior art, since there is no power supply in the special-shaped smart card, it is necessary to rely on the radio waves emitted by the contactless card reader to complete the reading and writing operations. However, when the reading and writing distance is too far or the internal coil of the special-shaped smart card is damaged, normal reading and writing cannot be performed. As the number of reading and writing times of the special-shaped smart card increases, the internal coil of the special-shaped smart card will age, and the resistance of the internal coil will increase, thereby slowing down the accumulation of charge, reducing the reading and writing speed of the special-shaped smart card, and prolonging the user's waiting time, thereby affecting the user's experience. Therefore, there is an urgent need for a fast and accurate method to detect the aging problem of the internal coil of the special-shaped smart card. Summary of the invention

[0004] The purpose of the present invention is to provide a method and system for detecting defects in special-shaped smart cards to solve the above technical problems: The purpose of the present invention can be achieved through the following technical solutions: A method for detecting defects in special-shaped smart cards comprises the following steps: S1: Get N special-shaped smart cards, where N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card. i and the weight of the card W i , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; S2: Calculate the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card by formula i , the formula is specifically: ; Wherein, γ represents the preset oxidation degree coefficient; S3: Obtain the preset specification length L of the internal coil and the cross-sectional area A of the internal coil when producing the special-shaped smart card, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρ sta , where ρ sta Represents the resistivity of the special-shaped smart card coil material; S4: Record the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculate the aging coefficient AG of the i-th special-shaped smart card i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

[0005] As a further solution of the present invention: in the step S1, the resistance value of the internal coil of the special-shaped smart card is measured while keeping the temperature constant.

[0006] As a further solution of the present invention: in the step S1, if the resistance difference RC of the internal coil of the i-th special-shaped smart card i >0 and card weight difference WC i <0, mark the i-th special-shaped smart card as a damaged card and stop subsequent operations on the damaged card.

[0007] As a further solution of the present invention: in step S3, if the resistivity fluctuation value s i It is within the resistivity fluctuation range [1, 1+q], and the resistance difference RC i <p, stop subsequent operations on the special-shaped smart card and mark the special-shaped smart card as a non-aging card, wherein q represents a preset first resistivity fluctuation value, and p represents a preset first resistance difference value.

[0008] As a further solution of the present invention: in the step S4, the method for determining the aged card specifically includes: The aging coefficient AG of the i-th special-shaped smart card is calculated by the formula i , the formula is specifically: ; Wherein, D represents the preset aging base and the aging base D>1, λ represents the preset aging coefficient, when the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta When , the i-th special-shaped smart card is marked as an aged card.

[0009] As a further solution of the present invention: in the step S4, the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V is recorded. i The methods include: Place the special-shaped smart card in parallel at a preset measurement height of H meters above the contactless card reader, and make the special-shaped smart card within the range of the electromagnetic wave emitted by the contactless card reader; Make the contactless card reader start working, emit electromagnetic waves, and record the time T i_start When the contactless card reader receives the data from the special-shaped smart card, the time T is recorded. i_end , calculation time t i_now =T i_start -T i_end ; Record the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j ,make , where J represents the total number of records.

[0010] As a further solution of the present invention: in the step S4, if the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j >t max , then the jth accumulation time t is not recorded i_now_j , and marked as failed, and repeated the operation, where t max represents the preset accumulation time threshold; If the number of failures is greater than the preset failure threshold, the i-th special-shaped smart card is marked as an aged card.

[0011] A special-shaped smart card defect detection system, comprising: Card data acquisition module: Get N special-shaped smart cards, N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card i and the weight of the card Wi , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; Oxidation coefficient calculation module: calculates the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card through the formula i , the formula is specifically: ; Among them, γ represents the preset aging degree coefficient; Data processing module: obtain the preset specification length L and cross-sectional area A of the internal coil when producing special-shaped smart cards, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρ sta , where ρ sta Represents the resistivity of the material of the special-shaped smart card coil; Aging screening module: records the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculation of aging coefficient AG i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

[0012] Beneficial effects of the present invention: In the present invention, firstly, a preset standard number of special-shaped smart cards are obtained, and the resistance value of the internal coil of the special-shaped smart card and the weight of the card are measured, because in actual situations it is impossible to completely isolate the contact between oxygen and the coil. In most cases, metal reacts with oxygen to form oxides, which will lead to an increase in mass. This is because metal atoms combine with oxygen atoms to form heavier compounds, and the conductivity of oxides is worse than that of metals. Therefore, by measuring the weight of the special-shaped smart card and the resistance value of the internal coil, the degree of oxidation of the internal coil can be determined. The greater the mass of the card, the greater the resistance value, indicating that the degree of oxidation of the special-shaped smart card is higher and the degree of aging of the coil is higher. The degree of oxidation is an important indicator for measuring the degree of aging of the coil.

[0013] The oxidation coefficient of the internal coil is calculated by the weight difference and the resistance difference. The oxidation coefficient of the internal coil of the special-shaped smart card is proportional to the card weight difference and the resistance difference, and the influence of the resistance difference on the oxidation coefficient is greater than the influence of the weight difference on the oxidation coefficient. The aging degree of the internal coil can be judged by the size of the oxidation coefficient. The aging degree of the internal coil can be judged by using the specific oxidation coefficient, which is convenient for subsequent operations.

[0014] The internal coil of the special-shaped smart card will have a preset specification length and cross-sectional area during production. The length and cross-sectional area of ​​the internal coil basically do not change, and the resistivity corresponding to different coil materials is different. If the coil undergoes an oxidation reaction and generates oxides, the material composition of the coil changes and the resistivity of the corresponding coil will also change. Therefore, the resistivity of the internal coil can also be used to reflect the degree of oxidation of the coil and calculate the resistivity fluctuation value. The higher the degree of oxidation of the coil, the greater the resistivity fluctuation value.

[0015] The greater the coil resistance, the longer it takes for the internal coil to accumulate charge to reach 2V. Therefore, in actual usage, if the internal coil of the special-shaped card reader accumulates charge for a long time, it is considered that the coil is seriously aged. Therefore, the aging degree of the internal coil of the special-shaped smart card can be roughly inferred through time. The longer it takes for the internal coil to accumulate charge to reach 2V, the greater the value of the aging degree calculated by the formula.

[0016] In summary, the present invention provides a fast and accurate method for detecting the aging problem of the internal coil of a special-shaped smart card. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described below in conjunction with the accompanying drawings.

[0018] Figure 1 The present invention is a flowchart of a method for detecting defects in a special-shaped smart card. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] See also Figure 1 As shown, the present invention is a method for detecting defects of special-shaped smart cards, comprising the following steps: S1: Get N special-shaped smart cards, where N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card. i and the weight of the card W i , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; S2: Calculate the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card by formula i , the formula is specifically: ; Wherein, γ represents the preset oxidation degree coefficient; S3: Obtain the preset specification length L of the internal coil and the cross-sectional area A of the internal coil when producing the special-shaped smart card, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρ sta , where ρ sta Represents the resistivity of the special-shaped smart card coil material; S4: Record the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculate the aging coefficient AG of the i-th special-shaped smart card i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AGsta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

[0021] It should be noted that special-shaped smart cards are widely used, easy to use, and come in a variety of types. Library cards are one type of widely used special-shaped smart cards. The use of library cards can simplify the process of readers borrowing books, allowing readers to skip the manual registration process required for borrowing books, thereby improving the efficiency of book borrowing and saving time. However, if library cards are stored in the library for too long, they may become aged. Aged library cards will cause readers to wait for a long time when borrowing books, greatly affecting the reader experience. In addition, using aged cards to enter the library will be affected. When swiping the card through the gate, it may become insensitive and unable to pass through the gate at one time, causing congestion.

[0022] The present invention first obtains a preset standard number of special-shaped smart cards, and measures the resistance value of the internal coil of the special-shaped smart card and the weight of the card, because in actual situations it is impossible to completely isolate oxygen from contacting the coil. In most cases, metal reacts with oxygen to generate oxides, which will cause mass increase. This is because metal atoms combine with oxygen atoms to form heavier compounds, and the conductivity of oxides is worse than that of metals. Therefore, by measuring the weight of the special-shaped smart card and the resistance value of the internal coil, the oxidation degree of the internal coil can be determined. The greater the card mass, the greater the resistance value, indicating that the oxidation degree of the special-shaped smart card is higher and the coil aging degree is higher. The oxidation degree is an important indicator for measuring the aging degree of the coil.

[0023] The oxidation coefficient of the internal coil is calculated by the weight difference and the resistance difference. The oxidation coefficient of the internal coil of the special-shaped smart card is proportional to the card weight difference and the resistance difference, and the influence of the resistance difference on the oxidation coefficient is greater than the influence of the weight difference on the oxidation coefficient. The aging degree of the internal coil can be judged by the size of the oxidation coefficient. The aging degree of the internal coil can be judged by using the specific oxidation coefficient, which is convenient for subsequent operations.

[0024] The internal coil of the special-shaped smart card will have a preset specification length and cross-sectional area during production. The length and cross-sectional area of ​​the internal coil basically do not change, and the resistivity corresponding to different coil materials is different. If the coil undergoes an oxidation reaction and generates oxides, the material composition of the coil changes and the resistivity of the corresponding coil will also change. Therefore, the resistivity of the internal coil can also be used to reflect the degree of oxidation of the coil and calculate the resistivity fluctuation value. The higher the degree of oxidation of the coil, the greater the resistivity fluctuation value.

[0025] The greater the coil resistance, the longer it takes for the internal coil to accumulate charge to 2V. Therefore, in actual usage, if the internal coil of the special-shaped card reader accumulates charge for a long time, it is considered that the coil is seriously aged. Therefore, the aging degree of the internal coil of the special-shaped smart card can be roughly inferred through time. The longer it takes for the internal coil to accumulate charge to 2V, the greater the value of the aging degree coefficient calculated by the formula.

[0026] In another preferred embodiment of the present invention, the resistance value of the internal coil of the special-shaped smart card is measured while maintaining a constant temperature.

[0027] It is worth noting that in actual situations, the internal coil will generate heat when working, causing the temperature of the internal coil to rise, and the resistance of the coil will change with the temperature. If the resistance value of the coil changes, the final calculation result will be inaccurate, resulting in the inability to correctly screen out the aging cards. Therefore, in order to avoid changes in the coil resistance due to changes in the coil temperature, it is necessary to ensure that the temperature of the internal coil is constant in the present invention.

[0028] In another preferred embodiment of the present invention, if the resistance difference RC of the internal coil of the i-th special-shaped smart card is i >0 and card weight difference WC i <0, mark the i-th special-shaped smart card as a damaged card and stop subsequent operations on the damaged card.

[0029] It can be understood that the resistance difference RC of the internal coil i >0 and card weight difference WC i For cards with a weight difference of less than 0, the calculated weight difference is negative due to the high degree of damage to the card. In this case, the card needs to be discarded and subsequent operations stopped to ensure the accuracy of the present invention.

[0030] In another preferred embodiment of the present invention, if the resistivity fluctuation value s i It is within the resistivity fluctuation range [1, 1+q], and the resistance difference RC i <p, stop subsequent operations on the special-shaped smart card and mark the special-shaped smart card as a non-aging card, wherein q represents a preset first resistivity fluctuation value, and p represents a preset first resistance difference value.

[0031] It should be noted that the judgment of coil aging is mainly based on the degree of oxidation of the internal coil. If the resistivity fluctuation value s is calculated i and the resistance difference RC i The special-shaped smart cards are all small, and the special-shaped smart cards are marked as non-aging cards, which not only reduces the workload but also speeds up the screening process of aging cards.

[0032] In another preferred embodiment of the present invention, the method for determining the aged card specifically includes: The aging coefficient AG of the i-th special-shaped smart card is calculated by the formula i , the formula is specifically: ; Wherein, D represents the preset aging base and the aging base D>1, λ represents the preset aging coefficient, when the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta When , the i-th special-shaped smart card is marked as an aged card.

[0033] It should be noted that the screening of aged cards needs to be based on the aging coefficient of the card. i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aging cards, which can more accurately screen out aging cards and reduce errors.

[0034] In another preferred embodiment of the present invention, the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V is recorded. i The methods include: Place the special-shaped smart card in parallel at a preset measurement height of H meters above the contactless card reader, and make the special-shaped smart card within the range of the electromagnetic wave emitted by the contactless card reader; Make the contactless card reader start working, emit electromagnetic waves, and record the time T i_start When the contactless card reader receives the data from the special-shaped smart card, the time T is recorded. i_end , calculation time t i_now =T i_start -T i_end ; Record the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j ,make , where J represents the total number of records.

[0035] It is understandable that in order to accurately screen out aged cards, it is necessary to avoid possible erroneous operations. Therefore, it is necessary to ensure that all special-shaped smart cards are operated according to the same steps. This can reduce the probability of uncertain factors and thus improve the accuracy of screening aged cards.

[0036] The influence of the propagation time of the electromagnetic wave between the two is not within the scope of consideration of the present invention.

[0037] During the specific measurement process, some unexpected situations may occur, causing a significant deviation in a certain measurement result, thereby obtaining an erroneous result. In order to prevent the erroneous result from affecting the accuracy of the present invention, it is necessary to discard the data obtained this time and re-measure to ensure the accuracy of the present invention.

[0038] In a preferred case of this embodiment, if the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j >t max , then the jth accumulation time t is not recorded i_now_j , and marked as failed, and repeated the operation, where t max represents the preset accumulation time threshold; If the number of failures is greater than the preset failure threshold, the i-th special-shaped smart card is marked as an aged card.

[0039] It is worth noting that if a card fails to be detected for multiple times in a row, it can be considered that the internal coil of the card has been damaged. In order to reduce the workload, the card is directly marked as an aging card to improve efficiency.

[0040] A special-shaped smart card defect detection system, comprising: Card data acquisition module: Get N special-shaped smart cards, N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card i and the weight of the card W i , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; Oxidation coefficient calculation module: calculates the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card through the formula i , the formula is specifically: ; Among them, γ represents the preset aging degree coefficient; Data processing module: obtain the preset specification length L and cross-sectional area A of the internal coil when producing special-shaped smart cards, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρsta , where ρ sta Represents the resistivity of the special-shaped smart card coil material; Aging screening module: records the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculation of aging coefficient AG i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

[0041] The above is a detailed description of an embodiment of the present invention, but the content is only a preferred embodiment of the present invention and cannot be considered to limit the scope of implementation of the present invention. All equivalent changes and improvements made within the scope of the present invention should still fall within the scope of the patent coverage of the present invention.

Claims

1. A method for detecting defects in special-shaped smart cards, characterized in that: The following steps are involved: S1: Get N special-shaped smart cards, where N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card. i and the weight of the card W i , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; S2: Calculate the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card by formula i , the formula is specifically: ； Wherein, γ represents the preset oxidation degree coefficient; S3: Obtain the preset specification length L of the internal coil and the cross-sectional area A of the internal coil when producing the special-shaped smart card, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρ sta , where ρ sta Represents the resistivity of the special-shaped smart card coil material; S4: Record the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculate the aging coefficient AG of the i-th special-shaped smart card i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

2. A method for detecting defects in special-shaped smart cards according to claim 1, characterized in that: In the step S1, the resistance value of the internal coil of the special-shaped smart card is measured while keeping the temperature constant.

3. The method for detecting defects in a special-shaped smart card according to claim 1, characterized in that: In step S1, if the resistance difference RC of the internal coil of the i-th special-shaped smart card i >0 and card weight difference WC i <0, mark the i-th special-shaped smart card as a damaged card and stop subsequent operations on the damaged card.

4. The method for detecting defects of a special-shaped smart card according to claim 1, characterized in that: In step S3, if the resistivity fluctuation value s i It is within the resistivity fluctuation range [1, 1+q], and the resistance difference RC i <p, stop subsequent operations on the special-shaped smart card and mark the special-shaped smart card as a non-aging card, wherein q represents a preset first resistivity fluctuation value, and p represents a preset first resistance difference value.

5. The method for detecting defects of a special-shaped smart card according to claim 1, characterized in that: In step S4, the method for determining the aged card specifically includes: The aging coefficient AG of the i-th special-shaped smart card is calculated by the formula i , the formula is specifically: ； Wherein, D represents the preset aging base and the aging base D>1, λ represents the preset aging coefficient, when the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta When , the i-th special-shaped smart card is marked as an aged card.

6. The method for detecting defects of a special-shaped smart card according to claim 1, characterized in that: In step S4, the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V is recorded. i The methods include: Place the special-shaped smart card in parallel at a preset measurement height of H meters above the contactless card reader, and make the special-shaped smart card within the range of the electromagnetic wave emitted by the contactless card reader; Make the contactless card reader start working, emit electromagnetic waves, and record the time T i_start When the contactless card reader receives the data from the special-shaped smart card, the time T is recorded. i_end , calculation time t i_now =T i_start -T i_end ; Record the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j ,make , where J represents the total number of records.

7. A method for detecting defects in special-shaped smart cards according to claim 6, characterized in that: In step S4, if the accumulation time t required for the jth accumulated charge in the internal coil of the i-th special-shaped smart card to reach 2V i_now_j >t max , then the jth accumulation time t is not recorded i_now_j , and marked as failed, and repeated the operation, where t max represents the preset accumulation time threshold; If the number of failures is greater than the preset failure threshold, the i-th special-shaped smart card is marked as an aged card.

8. A defect detection system for special-shaped smart cards, characterized in that: include: Card data acquisition module: Get N special-shaped smart cards, N is the preset standard number, and measure the resistance value R of the internal coil of the i-th special-shaped smart card i and the weight of the card W i , and calculate the resistance difference RC i =R i -R sta Difference between weight and card weight WC i =W i -W sta , where R sta Represents the preset resistance value of the internal coil during production, W sta Represents the preset weight of the preset special-shaped smart card during production; Oxidation coefficient calculation module: calculates the oxidation coefficient OXI of the internal coil of the i-th special-shaped smart card through the formula i , the formula is specifically: ； Among them, γ represents the preset aging degree coefficient; Data processing module: obtain the preset specification length L and cross-sectional area A of the internal coil when producing special-shaped smart cards, and calculate the resistivity ρ of the internal coil of the i-th special-shaped smart card i =R i *A / L, and calculate the resistivity fluctuation value s i =ρ i / ρ sta , where ρ sta Represents the resistivity of the material of the special-shaped smart card coil; Aging screening module: records the time t when the accumulated charge in the internal coil of the i-th special-shaped smart card reaches 2V i , and calculate the average resistance value ; According to the oxidation number coefficient OXI i , resistivity fluctuation value s i and time t i Calculation of aging coefficient AG i , filter out the aging degree coefficient AG i Greater than the preset standard aging coefficient AG sta The special-shaped smart cards are marked as aged cards and the aged cards are recycled.

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