Method for Determining Scattering Parameters of Transmission Lines in Circuit Test Boards and Circuit Boards

Abstract

The present application discloses a method for determining scattering parameters of transmission lines in a circuit test board and a circuit board, which relates to the field of circuit boards. At least one set of replica lines and one set of standard lines are provided in the circuit test board; each replica line includes: an extension line and a replica transmission line connected through a connection point, the replica transmission line is the same as the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector; the layout of the standard line is the same as the layout of the extension line in the replica line, and each standard line is composed of two reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; the connector is used to connect to a test device.

Description

Technical Field

[0001] This application relates to the field of circuit boards, and particularly to a circuit test board and a method for determining the scattering parameters of transmission lines in a circuit board. Background Art

[0002] In the high-speed signal consistency test of a circuit board, TX (transmission test) needs to obtain the waveform at the Pad (connection point) position in the circuit board to evaluate its quality. And RX (receive test) needs to ensure that the waveform at the Pad meets the corresponding standards and constraints to accurately evaluate the performance of RX.

[0003] However, in actual tests, the Pad needs to be extended to a coaxial connector through a board-level transmission line (Breakout Trace) to be connected to an oscilloscope for testing.

[0004] Due to the existence of this transmission line, during the consistency test of the high-speed signal of the circuit, the measured waveform is at the coaxial interface position, and there are differences between the two. Especially when the signal rate is high, it will affect the determination of the test results. Therefore, in order to ensure the accuracy of the test results, it is necessary to obtain the scattering parameters (S-parameters) of this transmission line and perform de-embedding processing on its influence to obtain the waveform at the Pad.

[0005] When designing a high-speed signal test board, usually this transmission line is replicated to obtain a replica transmission line (ReplicaTrace). By testing the replica transmission line, the S-parameters of the board-level transmission line can be obtained and de-embedded during the consistency test to eliminate its influence.

[0006] Figure 1 is a schematic diagram of an existing circuit board and a circuit test board. In the circuit board, the board-level transmission line 103 (Breakout Trace) between Pad 101 and coaxial connector 102, one end of this transmission line is a coaxial structure and the other end is a non-coaxial structure. Figure 1 In this, for TX testing, the non-coaxial structure is a TX component, and for RX testing, this non-coaxial structure is an RX component. In the circuit test board, a replica line 104 is set for this transmission line 103.

[0007] Since differential signals are mostly used in the HSIO (High-Speed Input / Output) interfaces in a circuit board. Therefore, in the design of the copy line during the testing process, DFT (Design For Test) needs to be considered. First, the transmission line needs to be copied as it is, and the non-coaxial end of the copied copy transmission line is extended to a coaxial structure to obtain the copy line. The S-parameters of the copy line are obtained through vector network testing, and the S-parameters of the copy line are used as the S-parameters of the transmission line. The Figure 1 The structure of the copy line shown in Figure 1 includes a copy transmission line 1041 and an extended part transmission line 1042.

[0008] HSIO is for differential output and input. Since the physical size of the coaxial connector is relatively large, the transmission line of the extended part cannot maintain the differential structure near the connector, introducing impedance discontinuity points, and the extended transmission line introduces additional losses. With the continuous increase in the signal rate of the HSIO interface, accurate S-parameters of the transmission line are required, and the losses and impedance discontinuities brought by the extended part added to the copy line compared to the transmission line cannot be simply ignored. Existing testing methods cannot accurately obtain the S-parameters of the transmission line in the circuit board. Summary of the Invention

[0009] A first aspect of the present application provides a circuit test board, in which at least one group of copy lines and one group of standard lines are provided;

[0010] Each copy line includes: an extended line and a copy transmission line connected through a connection point, the copy transmission line is the same as the transmission line to be tested in the circuit board, and each end of each copy line is connected to a connector;

[0011] The layout of the standard line is the same as that of the extended line in the copy line, and each standard line is composed of two reference lines, the reference line and the extended line in the copy line have the same parameters, and each end of each standard line is connected to a connector;

[0012] The connector is used to connect to a test device.

[0013] In a possible implementation, the number of standard lines included in each group of standard lines and the number of copy lines included in each group of copy lines are respectively the same as the number of transmission lines to be tested in the circuit board.

[0014] In a possible implementation, the length of the standard line is determined based on a specific multiple value of the wavelength corresponding to the highest frequency of the signal used for testing the circuit test board.

[0015] In a possible implementation, each group of standard lines includes two standard lines, and the two standard lines are arranged in mirror symmetry; each group of copy lines includes two copy lines, and the two copy lines are arranged in mirror symmetry.

[0016] In a possible implementation, the circuit test board includes at least two groups of copy lines;

[0017] The copy transmission lines in any two groups of copy lines are different;

[0018] Among them, the difference in the copy transmission lines includes at least one of the following: at least part of the signal transmission paths are different, and at least part of the devices disposed on the signal transmission paths are different.

[0019] A second aspect of the present application provides a method for determining the scattering parameters of transmission lines in a circuit board, including:

[0020] Controlling to pass a test signal through the copy lines in the circuit test board to obtain the scattering parameters of the copy lines. The copy lines include an extension line and a copy transmission line connected through a connection point. The copy transmission line is the same as the transmission line to be tested in the circuit board, and each end of each copy line is connected to a connector;

[0021] Controlling to pass the test signal through the standard lines in the circuit test board to obtain the scattering parameters of the standard lines. The layout of the standard lines in the circuit test board is the same as the layout of the extension lines in the copy lines, and each standard line is composed of two reference lines. The parameters of the reference lines are the same as those of the extension lines in the copy lines, and each end of each standard line is connected to a connector;

[0022] Based on the scattering parameters of the copy lines and the scattering parameters of the standard lines, determine the scattering parameters of the transmission line to be tested.

[0023] In a possible implementation, the determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the copy lines and the scattering parameters of the standard lines includes:

[0024] Based on the scattering parameters of the standard lines, determine the scattering parameters of the extension lines in the copy lines;

[0025] Based on the scattering parameters of the extension lines in the copy lines and the scattering parameters of the copy lines, determine the scattering parameters of the copy transmission line, and the scattering parameters of the copy transmission line are used as the scattering parameters of the transmission line to be tested.

[0026] In a possible implementation, the determining the scattering parameters of the copy transmission line based on the scattering parameters of the extension lines in the copy lines and the scattering parameters of the copy lines includes:

[0027] Convert the scattering parameters of the extension lines in the copy lines and the scattering parameters of the copy lines into transmission parameters respectively;

[0028] Determine the transmission parameters of the replica transmission line in the replica line based on the transmission parameters of the extension line in the replica line and the transmission parameters of the replica line;

[0029] Based on the transmission parameters of the replica transmission line in the replica line, convert to obtain the scattering parameters of the transmission line to be tested.

[0030] In a possible implementation, the determining the scattering parameters of the extension line in the replica line based on the scattering parameters of the standard line includes:

[0031] Interpolate the scattering parameters of the standard line for a set frequency to obtain an interpolation result;

[0032] Determine the DC point based on the interpolation result;

[0033] According to the DC point, a specific time domain threshold, and the signal flow determined by the DC point, determine the target scattering parameters of half the length of the standard line, and use the target scattering parameters as the scattering parameters of the extension line in the replica line.

[0034] A third aspect of the present application provides a device for determining the scattering parameters of a transmission line in a circuit board, including:

[0035] A first control module, configured to control a test signal to pass through the replica line in the circuit test board to obtain the scattering parameters of the replica line. The replica line includes an extension line and a replica transmission line connected through a connection point. The replica transmission line is the same as the transmission line to be tested in the circuit board, and each end of each replica line is connected to a connector;

[0036] A second control module, configured to control a test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line. The layout of the standard line in the circuit test board is the same as the layout of the extension line in the replica line, and each standard line is composed of two reference lines. The reference lines and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector;

[0037] A determination module, configured to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

[0038] A fourth aspect of the present application provides a computer program product, including computer-readable instructions. When the computer-readable instructions run on an electronic device, the electronic device implements the method for determining the scattering parameters of a transmission line in a circuit board according to the first aspect or any implementation manner of the first aspect.

[0039] A fifth aspect of the present application provides an electronic device, including at least one processor and a memory connected to the processor, where:

[0040] The memory is used to store computer programs;

[0041] The processor is used to execute the computer programs, so that the electronic device can implement the method for determining the scattering parameters of the transmission line in the circuit board according to the first aspect or any implementation manner of the first aspect as described above.

[0042] A sixth aspect of the present application provides a computer storage medium, and the storage medium carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device can implement the method for determining the scattering parameters of the transmission line in the circuit board according to the first aspect or any implementation manner of the first aspect as described above. Description of the Drawings

[0043] In combination with the drawings and with reference to the following specific embodiments, the above and other features, advantages and aspects of the embodiments of the present disclosure will become more obvious. Throughout the drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and the original components and elements are not necessarily drawn to scale.

[0044] Figure 1 It is a schematic diagram of an existing circuit board and a test board;

[0045] Figure 2 It is a schematic structural diagram of a circuit test board provided by an embodiment of the present application;

[0046] Figure 3 It is another schematic structural diagram of a circuit test board provided by an embodiment of the present application;

[0047] Figure 4 It is still another schematic structural diagram of a circuit test board provided by an embodiment of the present application;

[0048] Figure 5 It is a schematic flowchart of a method for determining the scattering parameters of a transmission line in a circuit board provided by an embodiment of the present application;

[0049] Figure 6 It is a schematic flowchart of determining the scattering parameters of the to-be-tested transmission line based on the scattering parameters of the copy line and the scattering parameters of the standard line provided by an embodiment of the present application;

[0050] Figure 7 It is a schematic flowchart of determining the scattering parameters of the copy transmission line based on the scattering parameters of the extension line in the copy line and the scattering parameters of the copy line provided by an embodiment of the present application;

[0051] Figure 8 It is a schematic flowchart of determining the scattering parameters of the extension line in the copy line based on the scattering parameters of the standard line provided by an embodiment of the present application;

[0052] Figure 9 is the signal flow schematic diagram provided by the embodiments of the present application;

[0053] Figure 10 is the schematic diagram of the application scenario of the method for determining the scattering parameters of the transmission line in the circuit board provided by the embodiments of the present application;

[0054] Figure 11 is the schematic diagram of the interface in the application scenario provided by the embodiments of the present application;

[0055] Figure 12 is the structural schematic diagram of a device for determining the scattering parameters of a transmission line in a circuit board provided by the embodiments of the present application;

[0056] Figure 13 is the structural schematic diagram of the electronic device provided by the embodiments of the present application. Detailed implementation manners

[0057] The embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application. The terms used in the implementation part of the present application are only used to explain the specific embodiments of the present application, rather than to limit the present application.

[0058] The embodiments of the present application will be described below with reference to the accompanying drawings. Those of ordinary skill in the art will know that with the development of technology and the emergence of new scenarios, the technical solutions provided by the embodiments of the present application are also applicable to similar technical problems.

[0059] The terms "first", "second", etc. in the specification, claims and above-mentioned drawings of the present application are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that such terms can be interchanged under appropriate circumstances, which is only a way of distinguishing when describing objects with the same attributes in the embodiments of the present application. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion, so that a process, method, system, product or device comprising a series of units does not have to be limited to those units, but may include other units not clearly listed or inherent to these processes, methods, products or devices.

[0060] Figure 2 is a structural schematic diagram of a circuit test board provided by the embodiments of the present application. At least one set of replica lines 201 and one set of standard lines 202 are provided in the circuit test board;

[0061] Among them, the circuit test board also includes a plurality of connectors 203.

[0062] Each replica line 201 includes: an extension line 2012 and a replica transmission line 2013 connected by a connection point 2011. The replica transmission line is the same as the transmission line to be tested on the circuit board. Each end of each replica line is connected to a connector 203;

[0063] Among them, the layout of the standard line 202 is the same as that of the extension line 2012 in the replica line. Each standard line 202 consists of two reference lines 2021. The reference line 2021 has the same parameters as the extension line 2012 in the replica line. Each end of each standard line is connected to a connector 203;

[0064] Among them, the connector 203 is used to connect to the test device.

[0065] Among them, the test device is used to detect the S parameters (Scattering Parameters) of the line it is connected to.

[0066] Among them, the Figure 2 is described by taking one replica line and one standard line as an example. For the specific structural forms of a group of replica lines and a group of standard lines, please refer to the subsequent Figure 3-4 explanation.

[0067] In a possible implementation, a connector is set at one end of the replica transmission line. In order to facilitate the test device to obtain the S parameters of the replica transmission line, the non - coaxial section of the replica transmission line is extended to a coaxial structure. This extended part is named the extension line in this embodiment. Coaxial connectors are set at both ends of the replica line composed of the replica transmission line and the extension line. The test device tests the scattering parameters of the replica line through the coaxial connectors. Subsequently, by combining with the standard line to determine the scattering parameters of the extension line in the replica line, the scattering parameters of the replica transmission line can be determined based on the scattering parameters of the extension line in the replica line and the scattering parameters of the replica line.

[0068] Among them, each group of replica lines may include one or more replica lines. Correspondingly, the number of standard lines included in each group of standard lines is the same as the number of replica lines included in the replica line.

[0069] Among them, the replica transmission line (Replica Trace) is a replication of the transmission line to be tested (BreakoutTrace) on the circuit board, and the two are exactly the same.

[0070] In a possible implementation, the geometric parameters, material parameters, etc. of the replica transmission line and the transmission line to be tested on the circuit board are exactly the same.

[0071] Among them, the transmission line to be tested on the circuit board is connected to other lines through connection points (pads). Correspondingly, in this circuit test board, connection point 2011 is set in copy line 201, and this connection point connects extension line 2012 and copy transmission line 2013 to achieve approximate complete replication of the transmission line to be tested.

[0072] Among them, since the copy transmission line is exactly the same as the transmission line to be tested on the circuit board, for the scattering parameter detection of the copy transmission line, the obtained scattering parameters are also the scattering parameters of the transmission line to be tested on the circuit board.

[0073] Among them, the scattering parameters (S-parameters) can include S11, S21, S12, and S22. Among them, S11 represents S-reflection, S21 represents S-transmission, S12 represents reverse transmission, and S22 represents reverse reflection.

[0074] Among them, the standard line is composed of two symmetric reference lines, and the parameters of the reference line are the same as those of the extension line in the copy line. The reference line is a copy of the extension line in the copy line, and the two reference lines form a standard line.

[0075] Among them, a connector 203 is also set in this circuit test board, and each end of each copy line 201 and standard line 202 is respectively connected to a connector 203.

[0076] Among them, the test device is connected to copy line 201 and standard line 202 through connector 203 to respectively test the scattering parameters of the copy line and the standard line. In the subsequent method embodiments, the process of determining the scattering parameters of the transmission line to be tested on the circuit board by using the scattering parameter tests of the copy line and the standard line is described in detail, and will not be elaborated in this embodiment.

[0077] In a possible implementation, the connector can adopt a coaxial connector, which is consistent with the coaxial connector on the circuit board.

[0078] In a possible implementation, the fact that the copy transmission line is the same as the transmission line to be tested on the circuit board includes that the designs of vias (including "via hole", "through-hole", "viaduct", etc.) for the transmission line to be tested are also replicated exactly as they are.

[0079] Among them, the vias of the transmission line to be tested include conductive channels used to connect different layers in a multilayer printed circuit board (PCB), such as through-holes, blind vias, buried vias, etc.

[0080] Among them, the extension lines of each copy line in the circuit test board are the same, and each standard line contains two reference lines. The parameters of the reference line and the extension line are the same. The standard line is used as the standard for each copy line in the circuit test board and is used to determine the scattering parameters of the extension line of each copy line.

[0081] Since the reference line in the standard line is the same as the extension line of each copy line, only one set of standard lines needs to be set in the circuit test board, which reduces the structural complexity of the circuit test board.

[0082] Among them, the extension line in the copy line is used to extend the non-coaxial structure (copy transmission line) into a coaxial structure, and its routing is short.

[0083] In a possible implementation, the length of the standard line is determined based on a specific multiple value of the wavelength corresponding to the highest frequency of the signal used for testing by the circuit test board.

[0084] Among them, during the process of determining the scattering parameters of the transmission line to be tested, according to the requirements, the test signal is input into the copy line through a coaxial connector. The designed minimum length of the extension line in the copy line is a set multiple of the highest test frequency. Correspondingly, the length of the standard line is twice the length of the extension line. Then the length of the standard line is a specific multiple value of the wavelength corresponding to the highest frequency of the signal used for testing, and the specific multiple value is twice the set multiple.

[0085] In a specific implementation, the length of the total extension line of the copy line can be determined first, and then the length of the extension line is multiplied by 2 to obtain the length of the standard line.

[0086] As an example, the highest frequency of the signal used for testing by the test circuit board is 50 GHz (gigahertz, one billion hertz), and the dielectric constant ( ) is 4 F / m (farad per meter). It can be estimated that the length of the extension line is approximately 9 mm (millimeter), and further determine that the length of the standard line is 18 mm.

[0087] In a possible implementation, the number of standard lines included in each group of standard lines and the number of copy lines included in each group of copy lines are respectively the same as the number of transmission lines to be tested on the circuit board.

[0088] Figure 3 FIG. 27 is another schematic structural diagram of a circuit test board provided by an embodiment of the present application. At least one group of copy lines 301 and one group of standard lines 302 are provided in the circuit test board.

[0089] Among them, the purpose of setting the circuit test board is to copy the transmission lines to be tested on the circuit board into the circuit test board, so as to determine the scattering parameters of the transmission lines to be tested on the circuit board by testing the corresponding copy transmission lines in the circuit test board.

[0090] Among them, the transmission lines to be tested on the circuit board can be divided into groups. One group of transmission lines to be tested can be one, two or even more, which is specifically set according to actual needs. In this application, the number of transmission lines to be tested in each group is not limited.

[0091] Among them, the copy transmission line is a copy of the transmission line to be tested on the circuit board, and it is exactly the same as the transmission line to be tested. Correspondingly, the scattering parameters of the copy transmission line are the same as those of the transmission line to be tested on the circuit board.

[0092] Correspondingly, the number, structure, parameters, etc. of the copy transmission line need to be the same as those of the transmission line to be tested on the circuit board, and the number of copy lines is also the same as that of the transmission line to be tested on the circuit board.

[0093] Among them, the Figure 3 Among them, each group of copy lines contains two copy lines, and each group of standard lines contains two standard lines. In specific implementation, the number of copy lines contained in each group of copy lines can be set according to actual situations, and this application does not make any restrictions.

[0094] In a possible implementation, each group of standard lines contains two standard lines, and the two standard lines are arranged in mirror symmetry; each group of copy lines contains two copy lines, and the two copy lines are arranged in mirror symmetry.

[0095] Among them, the two standard lines contained in each group of standard lines are arranged in mirror symmetry to ensure that the two standard lines are exactly the same; the two copy lines contained in each group of copy lines are arranged in mirror symmetry to ensure that the two copy lines are exactly the same.

[0096] Among them, by ensuring that the standard lines / copy lines in the same group are exactly the same, it provides an analysis basis for the subsequent use of the circuit test board to analyze the scattering parameters of the symmetrically arranged transmission lines to be tested on the circuit board, and it is possible to perform de-embedding on the extension line in the copy line, remove the extension line, and obtain the scattering parameters of the copy transmission line in the copy line.

[0097] In a possible implementation, the circuit test board includes at least two groups of copy lines; the copy transmission lines in any two groups of copy lines are different; among them, the difference in the copy transmission lines includes at least one of the following: at least part of the signal transmission paths are different, and at least part of the devices arranged on the signal transmission paths are different.

[0098] Among them, when any two transmission lines to be tested in the circuit board are the same, and this sameness means having the same signal transmission path and all components on the signal transmission path being exactly the same, then a set of duplicate lines can be set on the circuit test board, and the scattering parameters of the two transmission lines to be tested can be determined through this set of duplicate lines.

[0099] Among them, this circuit test board can be used to test each transmission line to be tested in a certain circuit board or multiple circuit boards. The transmission lines to be tested in this circuit board are different. Therefore, corresponding duplicate transmission lines are respectively set for the transmission lines to be tested with various structures in this circuit test board, so as to be able to test and determine their scattering parameters for each transmission line to be tested in the circuit board.

[0100] Among them, for each different transmission line to be tested on the circuit board, corresponding sets of duplicate lines are set on the circuit test board.

[0101] Among them, the duplicate transmission lines in this set of duplicate lines are the same as the transmission lines to be tested. Correspondingly, the signal transmission path of the transmission line to be tested and the components set on it are the same.

[0102] Among them, different duplicate transmission lines may have different signal transmission paths or different components set on the signal transmission path.

[0103] Among them, different signal transmission paths may mean that one or more of the length of the signal transmission path, the position of the via hole, the bending position, etc. are different.

[0104] Among them, different components set on the signal transmission path may mean that one or more of the type of component set on the signal transmission path, the setting position, etc. are different.

[0105] Figure 4 It is another structural schematic diagram of a circuit test board provided by an embodiment of the present application. Three sets of duplicate lines 401 - 403 and one set of standard line 404 are set in this circuit test board.

[0106] Among them, no component is set in one set of duplicate lines 401. This set of duplicate lines is arranged in a mirror-symmetrical manner. The two ends of the duplicate lines are connected to connectors 405. The duplicate transmission lines 4011 and extension lines 4012 in the duplicate lines are connected through connection points 4013.

[0107] Among them, a device capacitor 4021 is set in one set of duplicate lines 402. This set of duplicate lines is arranged in a mirror-symmetrical manner. The two ends of the duplicate lines are connected to connectors 405. The duplicate transmission lines 4022 and extension lines 4023 in the duplicate lines are connected through connection points 4024.

[0108] Among them, a conductive channel vias4031 connecting different layers is provided in a group of replica lines 403. This group of replica lines is a group of mirror-symmetrically arranged replica lines. The two ends of the replica lines are connected to connectors 405. The replica transmission lines 4032 and the extension lines 4033 in the replica lines are connected through connection points 4034.

[0109] In a possible implementation, to reduce the structural complexity of the circuit test board, when only the parameters of the devices are different in any two transmission lines to be tested, for example, only the capacitance values of the capacitors are different, and the remaining signal transmission paths and the devices provided on the signal transmission paths are exactly the same, it is possible to realize the scattering parameter test of two transmission lines to be tested by combining a group of replica lines in the circuit test board with a standard line through the way of disassembling and modifying the devices in the circuit test board.

[0110] In a possible implementation, since during the process of disassembling and modifying the devices in the circuit test board, testers need to manually disassemble and weld the devices, and the welding effect of manually welding the devices is different from that of welding the devices on the circuit board using a welding device, which may lead to different resistances at the welding positions. Therefore, to improve the test accuracy, a group of replica lines can be respectively set for two transmission lines to be tested, and the scattering parameters can be determined using the replica lines corresponding to the transmission lines to be tested.

[0111] In this embodiment, to determine the scattering parameters of the transmission lines to be tested on the circuit board, a circuit test board is set for the transmission lines to be tested. At least one group of replica lines and one group of standard lines are provided in the circuit test board. Each replica line includes an extension line and a replica transmission line connected through a connection point. The replica transmission line is the same as the transmission line to be tested on the circuit board. Moreover, each end of each replica line is connected to a connector. The layout of the standard line is the same as that of the extension line in the replica line. Each standard line is composed of two reference lines, and each reference line has the same parameters as the extension line in the replica line. Each end of each standard line is connected to a connector, and this connector is used to connect to the test device. By copying the transmission lines to be tested on the circuit board into the circuit test board, using replica transmission lines and standard lines with the same parameters, and using a standard line composed of two reference lines with the same parameters as the replica extension line as the detection standard for the replica extension line, it is possible to determine the scattering parameters of the replica extension line. And based on the scattering parameters of the replica line itself and the scattering parameters of the replica extension line, it is possible to accurately determine the scattering parameters of the replica transmission line. Therefore, this circuit test board can provide a basis for determining the scattering parameters of the transmission lines to be tested.

[0112] Figure 5 It is a schematic flowchart of a method for determining the scattering parameters of transmission lines on a circuit board provided by an embodiment of the present application. A data processing method provided by an embodiment of the present application may include steps 501 to 503, which will be described in detail below.

[0113] 501. Control the test signal to pass through the duplicate line in the circuit test board to obtain the scattering parameters of the duplicate line. The duplicate line includes an extension line and a duplicate transmission line connected through a connection point. The duplicate transmission line is the same as the transmission line to be tested in the circuit board. Each end of each duplicate line is connected to a connector.

[0114] Among them, a duplicate line is provided in the circuit test board. The duplicate transmission line in the duplicate line is a copy of the transmission line to be tested in the circuit board into the circuit test board. The duplicate line also includes an extension line. The extension line and the duplicate transmission line are connected through a connection point. Moreover, each end of the duplicate line is connected to a connector. The non - coaxial section in the duplicate transmission line is extended through the extension line to form a coaxial structure.

[0115] For the structure of the duplicate line and the corresponding explanations, please refer to the explanations in the foregoing circuit test board embodiment and will not be elaborated here.

[0116] Among them, the test signal is passed through the duplicate line in the circuit test board. The transmission condition of the test signal in the duplicate line in the circuit test board can characterize the scattering parameters of the duplicate line. Since the duplicate line is composed of a duplicate transmission line and an extension line connected through a connection point, the obtained scattering parameters characterize the parameters of the test signal passing through the duplicate transmission line and the extension line.

[0117] In a possible implementation, the test device inputs a test signal into the duplicate line through the connector of the duplicate line. The test signal is transmitted in the duplicate line, and the test device detects the scattering parameters of the duplicate line.

[0118] 502. Control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line. The layout of the standard line in the circuit test board is the same as the layout of the extension line in the duplicate line. Each standard line is composed of two reference lines. The reference line and the extension line in the duplicate line have the same parameters. Each end of each standard line is connected to a connector.

[0119] Among them, a standard line is also provided in the circuit test board. The layout of the standard line is the same as the layout of the extension line in the duplicate line. Each standard line is composed of two reference lines. Each reference line has the same parameters as the extension line in the duplicate line. Each reference line is a copy of the extension line in the duplicate line. The standard line is a double - copy of the extension line in the duplicate line.

[0120] For the structure of the standard line and the corresponding explanations, please refer to the explanations in the foregoing circuit test board embodiment and will not be elaborated here.

[0121] Among them, the test signal is controlled and transmitted through the standard line in the circuit test board. The test signal is the same as the test signal transmitted through the copy line. The transmission condition of the test signal in the standard line of the circuit test board can characterize the scattering parameters of the standard line. Since the standard line consists of two identical reference lines, the obtained scattering parameters characterize the parameters of the test signal passing through the two identical reference lines.

[0122] In a possible implementation, the test device is connected to the connectors at both ends of the copy line to measure the scattering parameters of the copy line; the test device is connected to the connectors at both ends of the standard line to measure the scattering parameters of the standard line.

[0123] 503. Determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the copy line and the standard line.

[0124] Among them, the copy line includes a copy transmission line and an extension line. The standard line includes two reference lines. The layout of the standard line is the same as that of the extension line. The copy transmission line is the same as the transmission line to be tested on the circuit board. The parameters of the reference line and the extension line are the same. Then, based on the scattering parameters of the standard line, the scattering parameters of the extension line can be determined. Furthermore, by de-embedding the extension line from the copy line, the scattering parameters of the copy transmission line in the copy line can be determined using the scattering parameters of the copy line and the extension line, thus realizing the determination of the scattering parameters of the transmission line to be tested.

[0125] Among them, through the measurement of the scattering parameters of the standard line, the scattering parameters of the extension line in the copy line can be accurately determined without ignoring the influence of the extension line, and the scattering parameters of the transmission line to be tested can be accurately determined.

[0126] In a possible implementation, the scattering parameters of a reference line with half of its length can be determined using the scattering parameters of a standard component first. The scattering parameters of this reference line are used as the scattering parameters of the extension line in the copy line. Then, the scattering parameters of the copy transmission line in the copy line can be determined using the scattering parameters of the copy line and the extension line. The scattering parameters of the copy transmission line are the scattering parameters of the transmission line to be tested. The subsequent Figure 6 section details the specific process of determining the scattering parameters of the transmission line to be tested.

[0127] In this embodiment, the scattering parameters of the transmission line to be tested in the circuit board are determined through a circuit test board. The circuit test board includes a duplicate line and a standard line. The duplicate line includes an extension line and a duplicate transmission line connected through a connection point. The duplicate transmission line is the same as the transmission line to be tested in the circuit board. Each end of each duplicate line is connected to a connector. The layout of the standard line in the circuit test board is the same as that of the extension line in the duplicate line. Each standard line is composed of two reference lines, and the parameters of the reference line and the extension line in the duplicate line are the same. Each end of each standard line is connected to a connector. During the test, control is performed to pass the test signal through the duplicate line and the standard line in the circuit test board respectively, and the scattering parameters of the duplicate line and the standard line are obtained respectively. Based on the scattering parameters of the duplicate line and the standard line, the scattering parameters of the transmission line to be tested are determined. The scattering parameter of the standard line is twice the scattering parameter of the extension line, and the scattering parameter of the extension line in the duplicate line is accurately determined. Therefore, by using the scattering parameters of the duplicate line and the standard line, the scattering parameters of the transmission line to be tested can be accurately determined.

[0128] Figure 6 FIG. is a schematic flow chart for determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the duplicate line and the standard line provided by an embodiment of the present application, which may include steps 601 to 602. These steps will be described in detail below.

[0129] 601. Determine the scattering parameter of the extension line in the duplicate line based on the scattering parameter of the standard line;

[0130] Wherein, the standard line is composed of two reference lines, and the reference line is the same as the extension line in the duplicate line.

[0131] Wherein, the overall scattering parameter of the standard line is obtained through testing in the foregoing steps. In this embodiment, the scattering parameter of one reference line is determined based on the scattering parameter of the standard line. The reference line is the same as the extension line in the duplicate line, and the scattering parameter of the reference line can be used as the scattering parameter of the extension line in the duplicate line.

[0132] In a possible implementation, an interpolation algorithm can be used to determine the scattering parameter of the reference line with half the length of the standard line. The scattering parameter of the reference line can be used as the scattering parameter of the extension line in the duplicate line. The subsequent Figure 8 details of the process for determining the scattering parameter of the extension line in the duplicate line are described in detail.

[0133] 602. Determine the scattering parameter of the duplicate transmission line based on the scattering parameter of the extension line in the duplicate line and the scattering parameter of the duplicate line. The scattering parameter of the duplicate transmission line is used as the scattering parameter of the transmission line to be tested.

[0134] Wherein, the duplicate line includes an extension line and a duplicate transmission line.

[0135] Among them, the scattering parameters of the overall copy line are obtained through testing in the foregoing steps, and moreover, the scattering parameters of the extended line in the copy line are determined based on the foregoing step 602. Then, by using the scattering parameters of the extended line in the copy line and the scattering parameters of the overall copy line, the scattering parameters of the copy transmission line in the copy line can be calculated and determined.

[0136] Among them, for the copy line, de-embedding processing can be performed to remove the extended line in the copy line to obtain the scattering parameters of the copy transmission line.

[0137] In a possible implementation, the de-embedding process can be to convert the scattering parameters into T-parameters (Transmission Parameters), calculate and de-embed the extended line for the copy line through the transmission parameters to obtain the transmission parameters of the copy transmission line, and then convert the transmission parameters of the copy transmission line back into scattering parameters. Subsequently Figure 7 the process of determining the scattering parameters of the copy transmission line in the copy line is described in detail.

[0138] In this embodiment, first, the scattering parameters of the extended line in the copy line are determined based on the scattering parameters of the standard line, and then, based on the scattering parameters of the extended line and the scattering parameters of the copy line, the scattering parameters of the copy transmission line in the copy line are determined, achieving the purpose of detecting and determining the scattering parameters of the transmission line to be tested in the circuit board by using the copy line and the standard line. In this process, the influence of the part where the extended line is de-embedded in the copy line can accurately determine the scattering parameters of the transmission line to be tested.

[0139] Figure 7 It is a schematic flowchart of determining the scattering parameters of the copy transmission line based on the scattering parameters of the extended line in the copy line and the scattering parameters of the copy line provided by an embodiment of the present application, which may include steps 701 to 703. The following will describe these steps in detail.

[0140] 701. Convert the scattering parameters of the extended line in the copy line and the scattering parameters of the copy line into transmission parameters respectively;

[0141] Among them, when de-embedding the extended line in the copy line, intermediate processing is performed using transmission parameters, and it is necessary to convert the scattering parameters of the extended line in the copy line and the scattering parameters of the copy line into transmission parameters respectively.

[0142] Among them, the scattering parameters are used to describe the reflection and transmission characteristics of the signal between both ends of the line, while the transmission parameters are used for the relationship between voltage and current between both ends of the line. Converting the reflection and transmission characteristics of the signal into the relationship between voltage and current is for the purpose of analysis.

[0143] 702. Determine the transmission parameters of the replica transmission line in the replica line based on the transmission parameters of the extension line in the replica line and the transmission parameters of the replica line;

[0144] Among them, de-embed the transmission parameters of the extension line in the replica line and the transmission parameters of the replica line to obtain the transmission parameters of the replica transmission line.

[0145] Among them, the scattering parameters of the replica line are represented by S M The scattering parameters of the extension line in the replica line are represented by S F Convert the two into transmission parameters respectively, which are the transmission parameters T M of the replica line and the transmission parameters T F .

[0146] Among them, the transmission parameters T DUT of the replica transmission line can be determined using the following formula (1):

[0147] (1)

[0148] 703. Based on the transmission parameters of the replica transmission line in the replica line, convert to obtain the scattering parameters of the transmission line to be tested.

[0149] Among them, after determining the transmission parameters of the replica transmission line, convert the transmission parameters back to scattering parameters. The replica transmission line is a copy of the transmission line to be tested on the circuit board, and the scattering parameters of the replica transmission line are the scattering parameters of the transmission line to be tested.

[0150] As an example, take a 4-port replica line for illustration. The 4 ports mean that a group of replica lines includes two replica lines. Among them, ports 1 and 3 are connected to both ends of one replica line, and ports 2 and 4 are connected to both ends of the other replica line.

[0151] Among them, the scattering parameters include: s 11 , s 22 , s 33 , s 44 , s 31 , s 13 , s 24 , s 42 , s 12 , s 21 , s 43 , s 43 , s 14 , s 41 , s 23 , s 32 .

[0152] Among them, s 11 , s 22 , s 33, s 44 respectively represent return loss (reflection coefficient), s 31 , s 13 , s 24 , s 42 respectively represent insertion loss (transmission coefficient), s 12 , s 21 , s 43 , s 43 respectively represent near - end crosstalk, s 14 , s 41 , s 23 , s 32 respectively represent far - end crosstalk.

[0153] Among them, since the copy line is often in differential form, the scattering parameters of the 4 - port are converted into transmission parameters using the following formulas (2)-(17).

[0154] (2)

[0155] (3)

[0156] (4)

[0157] (5)

[0158] (6)

[0159] (7)

[0160] (8)

[0161] (9)

[0162] (10)

[0163] (11)

[0164] (12)

[0165] (13)

[0166] (14)

[0167] (15)

[0168] (16)

[0169] (17)

[0170] Using the above formula (1), and using the transmission parameters of the replica line and the extension line in the replica line determined by the above formulas (2)-(17), determine the transmission parameter T of the replica transmission line DUT .

[0171] Among them, for each item in this transmission parameter T DUT Converting it back to scattering parameters, the following formulas (18)-(33) can be used to convert the scattering parameters of a 4-port into transmission parameters

[0172] (18)

[0173] (19)

[0174] (20)

[0175] (21)

[0176] (22)

[0177] (23)

[0178] (24)

[0179] (25)

[0180] (26)

[0181] (27)

[0182] (28)

[0183] (29)

[0184] (30)

[0185] (31)

[0186] (32)

[0187] (33)

[0188] Among them, using the above formulas (1)-(33) can realize the de-embedding process, removing the extension line from the replica line and obtaining the scattering parameters of the replica transmission line in the replica line

[0189] In this embodiment, the scattering parameters of the extension line in the copy line and the scattering parameters of the copy line are respectively converted into transmission parameters; based on the transmission parameters of the extension line in the copy line and the transmission parameters of the copy line, the transmission parameters of the copy transmission line in the copy line are determined; based on the transmission parameters of the copy transmission line in the copy line, the scattering parameters of the transmission line to be tested are converted.

[0190] When de-embedding the extension line in the copy line, intermediate processing is performed through transmission parameters, and the scattering parameters of the extension line in the copy line and the scattering parameters of the copy line are respectively converted into transmission parameters. After de-embedding processing using the transmission parameters, the transmission parameters of the copy transmission line are obtained, and then the transmission parameters of the copy transmission line are converted into scattering parameters to obtain the scattering parameters of the transmission line to be tested, realizing the process of accurately determining the scattering parameters of the transmission line to be tested.

[0191] Figure 8 It is a schematic flow chart for determining the scattering parameters of the extension line in the copy line based on the scattering parameters of the standard line provided by an embodiment of the present application, which may include steps 801 to 803. These steps will be described in detail below.

[0192] 801. Interpolate the scattering parameters of the standard line according to the set frequency to obtain an interpolation result;

[0193] Among them, in this embodiment, the interpolation method is adopted to determine the scattering parameters of the extension line by using the scattering parameters of the standard line.

[0194] Among them, the interpolation algorithm can be the In-House 2X-Thru algorithm, and the 2X-Thru represents two completely identical reference lines.

[0195] Among them, the scattering parameters of the measured standard line are interpolated according to the set frequency to obtain an interpolation result, so as to provide a basis for subsequent analysis of the scattering parameters of the standard line.

[0196] In a possible implementation, the set frequency can be 1 MHz, and interpolation is performed at 1 MHz intervals to obtain an interpolation result.

[0197] 802. Determine the DC point based on the interpolation result;

[0198] Among them, the distribution of the scattering parameters is determined by using the interpolation result, and the DC point (DCPoint) is determined based on the interpolation result to ensure that most of the signal flows are included within the DC point range.

[0199] Among them, the scattering parameters of the measured standard line are interpolated according to the set frequency, and the DC point is obtained. The purpose of performing interpolation at the set frequency and obtaining the DC point is to ensure the time-domain resolution and correctness.

[0200] 803. Based on the DC point, the specific time-domain threshold, and the signal flow determined by the DC point, determine the target scattering parameter of half the length of the standard line, and use this target scattering parameter as the scattering parameter of the extended line in the copy line.

[0201] Among them, the specific time-domain threshold is the threshold corresponding to Time Domain Gating. By using this specific time-domain threshold, the interpolation result can be processed to obtain the values within the time-domain gating range, so as to further determine the intermediate parameters using the values within this time-domain gating range, providing a basis for determining the scattering parameter of the reference line subsequently.

[0202] Among them, for the interpolation result obtained through interpolation, combined with the DC point, the specific time-domain threshold, and the signal flow determined by the DC point determined in the previous steps, determine the parameters in the signal flow. These parameters are used as intermediate parameters, providing a basis for calculating the scattering parameter subsequently.

[0203] Among them, due to the structural symmetry of the standard line, which is composed of two identical extended lines, by combining the signal flow diagram of the standard line, it can be determined that the intermediate parameters of the standard line include 5 unknowns. 2 unknowns are determined through the time-domain gating, and the remaining 3 unknowns are obtained through the signal flow diagram. Finally, based on these unknowns, the scattering parameters of the two extended lines can be obtained.

[0204] Among them, using these intermediate parameters, according to the set calculation rules, determine the target scattering parameter of each reference line in the standard line, and this target scattering parameter is also the scattering parameter of the extended line in the copy line.

[0205] Figure 9 This is the signal flow schematic diagram provided by the embodiment of the present application. There are 8 DC points in this schematic diagram, namely a1 T , b1 T , b2 A , a2 A , a1 B , b1 B , b2 T , a2 T . For each DC point, determine the parameters between any two adjacent DC points.

[0206] Among them, through the specific time-domain threshold, parameters such as s 11 T , s 12 T , s 21 T , s 22 T can be determined. Moreover, in this signal flow schematic diagram, through this specific time-domain threshold, s 11 A, s 22 B .

[0207] The following formulas (34)-(36) can be used to determine the remaining three unknowns s 11 B , s 22 A , s 12 A :

[0208] (34)

[0209] (35)

[0210] (36)

[0211] Among them, using the intermediate parameter s determined above 11 A , s 22 B , s 11 B , s 22 A , s 12 A , calculate to obtain the scattering parameters of each extension line in the standard line.

[0212] In this embodiment, interpolation is performed on the scattering parameters of the standard line based on the set frequency to obtain an interpolation result; a DC point is determined based on the interpolation result; according to the DC point and the signal flow determined by the specific time-domain threshold and the DC point, the target scattering parameter of half the length of the standard line is determined. Through interpolation and time-domain gating, the scattering parameters of the standard line are processed to obtain the target scattering parameter of the reference line of half its length, and this reference line is consistent with the extension line in the copy line, realizing the accurate determination of the scattering parameter of the extension line in the copy line.

[0213] Figure 10 FIG. is a schematic diagram of an application scenario of a method for determining the scattering parameters of a transmission line in a circuit board provided by an embodiment of the present application. This application scenario includes a circuit test board 1001 and a test device 1002. Among them, the circuit test board 1001 includes a group of copy lines 10011 and a group of standard lines 10012. A group of copy lines includes two copy lines, and a group of standard lines includes two standard lines. During the test, the test device 1002 simultaneously connects the coaxial connectors at both ends of the two copy lines 10011 to realize the determination of the scattering parameters of the two copy lines, and the test device 1002 simultaneously connects the coaxial connectors at both ends of the two standard lines 10012 to realize the determination of the scattering parameters of the two standard lines.

[0214] Figure 10The connection method of the test equipment and the copy line shown is for reference only. In the specific implementation, the connection can be made according to the settings of the test equipment.

[0215] During the test process, the test equipment sequentially inputs test signals to the copy line / standard line through the four connected connectors, obtains the scattering parameters at each end, and then determines the scattering parameters of each copy line / standard line.

[0216] In the application scenario, the method for determining the scattering parameters of the transmission line in the circuit board provided by the embodiments of the present application can be implemented in an APP (application). The APP setting interface can be used to facilitate testers to detect the scattering parameters of the transmission line through this interface.

[0217] Figure 11 It is a schematic diagram of the interface in the application scenario provided by the embodiments of the present application. In this schematic diagram of the interface, two step interfaces 1101-1102 are included.

[0218] Among them, step 1 interface 1101 is a process for determining the scattering parameters of each reference line in the standard line. Figure 11 In this, "Fixture + Fixture'" is used to represent the standard line (ports 1---3, 2---4). Fixture is a reference line, and Fixture' represents another reference line. In this step 1, the scattering parameters of Fixture (ports 1---3, 2---4) and Fixture' (ports 1---3, 2---4) are determined using the scattering parameters of the standard line.

[0219] Among them, step 2 interface 1102 is a process for determining the scattering parameters of the copy transmission line in the copy line. Figure 11 In this, "DUT + Fixture" is used to represent the copy line (ports 1---3, 2---4). Fixture represents the extension line in the copy line. The scattering parameters of the extension line (ports 1---3, 2---4) are de-embedded from the scattering parameters of the copy line (ports 1---3, 2---4). Figure 11 In this, a minus sign is used to represent de-embedding, and the scattering parameters of the copy transmission line (DUT) (ports 1---3, 2---4) in the copy line are obtained.

[0220] The above introduces a method for determining the scattering parameters of the transmission line in the circuit board provided by the embodiments of the present application. The following will introduce the device for executing the above method for determining the scattering parameters of the transmission line in the circuit board.

[0221] Figure 12It is a schematic structural diagram of a device for determining scattering parameters of transmission lines in a circuit board. The device 1200 for determining scattering parameters of transmission lines in the circuit board includes: a first control module 1201, a second control module 1202, and a determination module 1203;

[0222] Among them, the first control module 1201 is configured to control a test signal to pass through a duplicate line in a circuit test board to obtain the scattering parameters of the duplicate line. The duplicate line includes an extension line and a duplicate transmission line connected through a connection point. The duplicate transmission line is the same as the transmission line to be tested in the circuit board, and each end of each duplicate line is connected to a connector;

[0223] Among them, the second control module 1202 is configured to control a test signal to pass through a standard line in the circuit test board to obtain the scattering parameters of the standard line. The layout of the standard line in the circuit test board is the same as the layout of the extension line in the duplicate line, and each standard line is composed of two reference lines. The reference line has the same parameters as the extension line in the duplicate line, and each end of each standard line is connected to a connector;

[0224] Among them, the determination module 1203 is configured to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the duplicate line and the scattering parameters of the standard line.

[0225] In a possible implementation, the determination module includes:

[0226] A first determination unit configured to determine the scattering parameters of the extension line in the duplicate line based on the scattering parameters of the standard line;

[0227] A second determination unit configured to determine the scattering parameters of the duplicate transmission line based on the scattering parameters of the extension line in the duplicate line and the scattering parameters of the duplicate line. The scattering parameters of the duplicate transmission line are used as the scattering parameters of the transmission line to be tested.

[0228] In a possible implementation, the second determination unit is specifically configured to:

[0229] Convert the scattering parameters of the extension line in the duplicate line and the scattering parameters of the duplicate line into transmission parameters respectively;

[0230] Based on the transmission parameters of the extension line in the duplicate line and the transmission parameters of the duplicate line, determine the transmission parameters of the duplicate transmission line in the duplicate line;

[0231] Based on the transmission parameters of the duplicate transmission line in the duplicate line, convert to obtain the scattering parameters of the transmission line to be tested.

[0232] In a possible implementation, the first determination unit is specifically configured to:

[0233] Interpolate the scattering parameters of the standard line according to a set frequency to obtain an interpolation result;

[0234] Determine the DC point based on the interpolation result;

[0235] Based on the DC point, the specific time-domain threshold, and the signal flow determined by the DC point, determine the target scattering parameter of half the length of the standard line, and use this target scattering parameter as the scattering parameter of the extended line in the copy line.

[0236] It should be noted that for the functional explanations of the various structures of the device for determining the scattering parameters of transmission lines in a circuit board provided in this embodiment, please refer to the explanations in the foregoing method embodiment, and will not be elaborated herein.

[0237] In this embodiment, the scattering parameters of the transmission line to be tested in the circuit board are determined through a circuit test board. The circuit test board includes a copy line and a standard line. The copy line includes an extended line and a copy transmission line connected by a connection point. The copy transmission line is the same as the transmission line to be tested in the circuit board. Each end of each copy line is connected to a connector. The layout of the standard line in the circuit test board is the same as the layout of the extended line in the copy line. Each standard line is composed of two reference lines, and the parameters of the reference line and the extended line in the copy line are the same. Each end of each standard line is connected to a connector. During the test, control the test signal to pass through the copy line and the standard line in the circuit test board respectively to obtain the scattering parameters of the copy line and the scattering parameters of the standard line. Based on the scattering parameters of the copy line and the scattering parameters of the standard line, determine the scattering parameters of the transmission line to be tested. The scattering parameters of the standard line are twice the scattering parameters of the extended line, which realizes the accurate determination of the scattering parameters of the extended line in the copy line. Therefore, by using the scattering parameters of the copy line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested can be accurately determined.

[0238] This application embodiment also provides an electronic device. Refer to Figure 13 As shown, it shows a schematic structural diagram of an electronic device suitable for implementing the device for determining the scattering parameters of transmission lines in a circuit board in this application embodiment. The electronic device in this application embodiment may include, but is not limited to, fixed terminals such as mobile phones, laptop computers, PDAs (Personal Digital Assistants), PADs (Tablet Computers), desktop computers, and the like. Figure 13 The electronic device shown is merely an example and should not impose any limitations on the functions and usage scope of this application embodiment.

[0239] As Figure 13As shown, the electronic device may include a processing device (such as a central processing unit, a graphics processing unit, etc.) 1301, which may perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 1302 or the program loaded from the storage device 1308 into the random access memory (RAM) 1303. When the electronic device is powered on, various programs and data required for the operation of the electronic device are also stored in the RAM 1303. The processing device 1301, the ROM 1302, and the RAM 1303 are connected to each other through a bus 1304. The input / output (I / O) interface 1305 is also connected to the bus 1304.

[0240] Generally, the following devices may be connected to the I / O interface 1305: an input device 1306 including, for example, a touch screen, a touchpad, a keyboard, a mouse, a camera, a microphone, an accelerometer, a gyroscope, etc.; an output device 1307 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; a storage device 1308 including, for example, a memory card, a hard disk, etc.; and a communication device 1309. The communication device 1309 may allow the electronic device to communicate with other devices wirelessly or wiredly to exchange data. Although Figure 13 an electronic device with various devices is shown, it should be understood that it is not required to implement or have all the shown devices. Instead, more or fewer devices may be implemented or had.

[0241] In an embodiment of the present application, there is also provided a computer program product including computer-readable instructions. When the computer-readable instructions run on an electronic device, the electronic device is enabled to implement any method for determining the scattering parameters of a transmission line in a circuit board provided in the embodiments of the present application.

[0242] In an embodiment of the present application, there is also provided a computer-readable storage medium. The storage medium carries one or more computer programs. When the one or more computer programs are executed by an electronic device, the electronic device is enabled to implement any method for determining the scattering parameters of a transmission line in a circuit board provided in the embodiments of the present application.

[0243] In addition, it should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, in the drawings of the device embodiments provided in the present application, the connection relationships between the modules indicate that they have communication connections, which can be specifically implemented as one or more communication buses or signal lines.

[0244] Through the description of the above embodiments, those skilled in the art can clearly understand that the present application can be implemented by means of software plus necessary general hardware. Of course, it can also be implemented by dedicated hardware including application-specific integrated circuits, dedicated CPUs, dedicated memories, dedicated components, etc. Generally, functions accomplished by computer programs can be easily implemented by corresponding hardware, and the specific hardware structures for implementing the same function can also be diverse, such as analog circuits, digital circuits, or dedicated circuits. However, for the present application, software program implementation is a better embodiment in more cases. Based on such understanding, the technical solution of the present application, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a readable storage medium, such as a floppy disk, USB flash drive, mobile hard disk, ROM, RAM, magnetic disk, or optical disc of a computer, and includes several instructions for causing a computer device (which can be a personal computer, training device, or network device, etc.) to execute the methods described in various embodiments of the present application.

[0245] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product.

[0246] The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the processes or functions described in the embodiments of the present application are generated in whole or in part. The computer can be a general-purpose computer, a dedicated computer, a computer network, or other programmable devices. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from a website, computer, training device, or data center to another website, computer, training device, or data center by wire (such as coaxial cable, optical fiber, digital subscriber line (DSL)) or wirelessly (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that a computer can store, or a data storage device such as a training device or data center that includes one or more integrated available media. The available medium can be a magnetic medium (such as a floppy disk, hard disk, magnetic tape), an optical medium (such as a DVD), or a semiconductor medium (such as a solid state disk (SSD)).

Claims

1. A circuit testing board, wherein at least one set of replica lines and one set of standard lines are provided in the circuit testing board; Each quest line includes: An extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, each end of each replica line is connected to a connector, and the extension line of each replica line in each group of replica lines in the circuit test board is the same; The layout of the standard line is consistent with the layout of the extension line in the replica line, and each standard line is composed of two symmetrical reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; The connector is used for connecting with a testing device.

2. According to the circuit testing board of claim 1, the number of standard lines in each group of standard lines and the number of replica lines in each group of replica lines are respectively consistent with the number of transmission lines to be tested in the circuit board.

3. The circuit testing board according to claim 1, wherein the length of the standard line is determined based on a preset multiple value of a wavelength corresponding to the highest frequency of a signal used for testing by the circuit testing board.

4. According to the circuit testing board of claim 2, each group of standard lines comprises two standard lines, and the two standard lines are arranged in mirror symmetry; each group of replica lines comprises two replica lines, and the two replica lines are arranged in mirror symmetry.

5. The circuit testing board according to claim 1, comprising at least two sets of replica lines; The replica transmission lines in any two sets of replica lines are different; in, The replica transmission lines are different, which includes at least one of the following: the signal transmission paths are at least partially different, and the devices arranged on the signal transmission paths are at least partially different.

6. A method for determining scattering parameters of a transmission line in a circuit board, comprising: Controlling the test signal to pass through the replica line in the circuit test board to obtain the scattering parameters of the replica line, wherein the replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, each end of each replica line is connected to a connector, and the extension line of each replica line in each group of replica lines in the circuit test board is the same; Controlling the test signal to pass through a standard line in a circuit test board to obtain scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two symmetrical reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; Based on the scattering parameters of the replica line and the scattering parameters of the standard line, the scattering parameters of the transmission line to be tested are determined.

7. The method for determining the scattering parameters of a transmission line in a circuit board according to claim 6, wherein the step of determining the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line comprises: Based on the scattering parameters of the standard line, determining the scattering parameters of the extended line in the replica line; Based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line, the scattering parameters of the replica transmission line are determined, and the scattering parameters of the replica transmission line are used as the scattering parameters of the transmission line to be tested.

8. The method for determining scattering parameters of a transmission line in a circuit board according to claim 7, wherein determining the scattering parameters of the replica transmission line based on the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line comprises: Converting the scattering parameters of the extended line in the replica line and the scattering parameters of the replica line into transmission parameters respectively; Determining transmission parameters of a replica transmission line in the replica line based on transmission parameters of the extended line in the replica line and transmission parameters of the replica line; Based on the transmission parameters of the replica transmission line in the replica line, the scattering parameters of the transmission line to be tested are obtained by conversion.

9. The method for determining scattering parameters of a transmission line in a circuit board according to claim 7, wherein determining the scattering parameters of the extended line in the replica line based on the scattering parameters of the standard line comprises: interpolating the scattering parameters of the standard line based on the set frequency to obtain an interpolation result; Determining a DC point based on the interpolation result; According to the DC point, a preset time domain threshold, and a signal flow determined by the DC point, a target scattering parameter of half the length of the standard line is determined, and the target scattering parameter is used as a scattering parameter of an extended line in the replica line.

10. A device for determining scattering parameters of a transmission line in a circuit board, comprising: A first control module is used to control the test signal to pass through the replica line in the circuit test board to obtain the scattering parameters of the replica line, wherein the replica line includes an extension line and a replica transmission line connected by a connection point, the replica transmission line is consistent with the transmission line to be tested in the circuit board, each end of each replica line is connected to a connector, and the extension line of each replica line in each group of replica lines in the circuit test board is the same; A second control module is used to control the test signal to pass through the standard line in the circuit test board to obtain the scattering parameters of the standard line, wherein the layout of the standard line in the circuit test board is consistent with the layout of the extension line in the replica line, and each standard line is composed of two symmetrical reference lines, the reference line and the extension line in the replica line have the same parameters, and each end of each standard line is connected to a connector; The determination module is used to determine the scattering parameters of the transmission line to be tested based on the scattering parameters of the replica line and the scattering parameters of the standard line.

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