Probe device, method for using probe device, and detection system

Abstract

The present invention discloses a probe device, a method for using the probe device, and a detection system, which relate to the field of vehicle detection technology. The probe device includes: two probe assemblies and an energy discharge assembly connected to the two probe assemblies. The two probe assemblies are used to connect to a detection device and a device to be detected. The two probe assemblies have two working states: when the two probe assemblies are in a first working state, the detection device, the two probe assemblies, and the device to be detected form a loop; when the two probe assemblies are in a second working state, the detection device is electrically disconnected from the device to be detected, and the two probe assemblies, the energy discharge assembly, and the device to be detected form a loop. The probe device of the present invention effectively prevents its two probe assemblies from generating an arc at the moment of plugging and unplugging, thereby extending the service life of the probe device and the detection device, and also prevents the device to be detected from being affected by the arc and causing its function to be damaged.

Description

Technical Field

[0001] The present invention relates to the technical field of vehicle detection, and in particular to a probe device, a method for using the probe device, and a detection system. Background Art

[0002] With the development of intelligent automobiles, their functions are becoming more and more powerful, and more and more electronic and electrical equipment are installed in the whole vehicle. In order to ensure that problems with various electrical components are discovered in advance during the assembly process and avoid a large amount of rework after the whole vehicle is assembled, various testing equipment will be installed on the automobile assembly line to detect the vehicle assembly status, including door testing equipment, instrument testing equipment, etc. The testing equipment needs to be repeatedly tested on each vehicle. The testing equipment is generally connected to the tested equipment through a plug-in probe (or plug connector).

[0003] However, many devices under test have inductive loads, such as door lift motors and front windshield wiper motors. After the test is completed, an arc is generated at the moment the plug-in probe is plugged in or out due to the discharge process of the inductive load, which has an impact on the plug-in probe, circuit, testing equipment and the device under test. In severe cases, the plug-in probe, circuit and the device under test may be damaged after a period of use, affecting vehicle assembly production. Summary of the Invention

[0004] The embodiments of the present invention provide a probe device, a method for using the probe device, and a detection system to solve the technical problem in the related art that after the existing plug-in probe is plugged in and out for a long time, the plug-in probe, circuit, and detection equipment may be damaged due to the action of long-term electric arc.

[0005] In a first aspect, a probe device is provided, comprising:

[0006] Two probe assemblies and an energy discharge assembly connected to the two probe assemblies, the two probe assemblies are used to connect with the detection device and the device to be detected, and the two probe assemblies have two working states:

[0007] When the two probe assemblies are in the first working state, the detection device, the two probe assemblies and the detected device form a loop;

[0008] When the two probe assemblies are in the second working state, the detection device is electrically disconnected from the detected device, and the two probe assemblies, the energy discharge assembly and the detected device form a loop.

[0009] In some embodiments, each of the probe assemblies comprises:

[0010] A probe head and a probe tail, wherein the probe head is used to connect to the device under test, and the probe tail is used to connect to the detection device, and the probe head and the probe tail are respectively provided with a head conductive contact and a tail conductive contact;

[0011] When the probe assembly is in a first working state, the head conductive contact and the tail conductive contact are in contact;

[0012] When the probe assembly is in the second working state, the head conductive contact and the tail conductive contact are disconnected.

[0013] In some embodiments, each of the probe assemblies further comprises:

[0014] an insulating spring, the insulating spring being arranged between the probe head and the probe tail;

[0015] An insulating locking mechanism is connected to the probe head and the probe tail, and is used to fix the probe head and the probe tail when the probe assembly is in a first working state or a second working state.

[0016] In some embodiments, the probe device further includes: an energy absorbing component connected to the two probe heads.

[0017] In some embodiments, the energy absorbing component is a capacitor.

[0018] In some embodiments, an indicator light is provided at the tail of the probe.

[0019] In some embodiments, the energy dissipation component is a Schottky diode.

[0020] In some embodiments, the energy dissipation component is a TVS transient suppression diode.

[0021] In a second aspect, a method for using a probe device is provided, comprising the following steps:

[0022] Before the test begins, the two probe assemblies are placed in the second working state, and the two probe assemblies are connected to the test device and the device to be tested;

[0023] The two probe assemblies are placed in a first working state, so that the detection device, the two probe assemblies and the device under test form a loop, and then the detection device is used to detect the device under test;

[0024] After the detection is completed, the two probe assemblies are placed in the second working state, the detection device is electrically disconnected from the device under test, and the two probe assemblies, the energy discharge assembly and the device under test form a loop. After a preset time, the two probe assemblies are disconnected from the detection device and the device under test.

[0025] In a third aspect, a detection system is provided, comprising the aforementioned probe device.

[0026] The beneficial effects brought about by the technical solution provided by the present invention include:

[0027] An embodiment of the present invention provides a probe device, a method for using the probe device, and a detection system. The probe device is provided with two probe assemblies and an energy discharge assembly connected to the two probe assemblies. Before the two probe assemblies are unplugged from the device under test, the energy discharge assembly absorbs and releases residual energy retained by inductive loads such as the motor of the device under test, thereby effectively preventing the two probe assemblies from generating an arc at the moment of plugging and unplugging, protecting the probe device, extending the service life of the probe device and the detection equipment, and preventing the device under test from being affected by the arc and causing damage to its function. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0029] Figure 1 A block diagram of a probe device according to an embodiment of the present invention;

[0030] Figure 2 A schematic structural diagram of a probe device provided in an embodiment of the present invention;

[0031] Figure 3 A schematic flow chart of a method for using a probe device provided in an embodiment of the present invention;

[0032] In the picture:

[0033] 1. Probe assembly; 11. Probe head; 111. Head conductive contact; 12. Probe tail; 121. Tail conductive contact; 13. Insulation spring; 14. Insulation locking mechanism; 15. Indicator light;

[0034] 2. Energy discharge component;

[0035] 3. Testing equipment;

[0036] 4. Equipment under inspection;

[0037] 5. Energy absorption component. DETAILED DESCRIPTION

[0038] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0039] The embodiment of the present invention provides a probe device, which can solve the technical problem that after the existing plug-in probe is plugged in and out for a long time, the plug-in probe, the circuit and the detection equipment are damaged due to the action of long-term electric arc.

[0040] See also Figure 1 As shown, an embodiment of the present invention provides a probe device, comprising: two probe assemblies 1 and an energy discharge assembly 2 connected to the two probe assemblies 1, wherein the two probe assemblies 1 are used to connect to a detection device 3 and a detected device 4.

[0041] The two probe assemblies 1 have two working states:

[0042] When the two probe assemblies 1 are in the first working state, the detection device 3, the two probe assemblies 1 and the detected device 4 form a loop;

[0043] When the two probe assemblies 1 are in the second working state, the detection device 3 is disconnected from the detected device 4, and the two probe assemblies 1, the energy discharge assembly 2 and the detected device form a loop.

[0044] Specifically, before the detection begins, the two probe assemblies 1 are placed in the second working state, and the two probe assemblies 1 are connected to the detection device 3 and the detected device 4;

[0045] The two probe assemblies 1 are placed in a first working state, the detection device 3, the two probe assemblies 1 and the detected device 4 form a loop, and the detection device 3 is used to detect the detected device 4;

[0046] After the detection is completed, the two probe assemblies 1 are placed in the second working state, the detection device 3 is disconnected from the detected device 4, and the two probe assemblies 1, the energy discharge assembly 2, and the detected device 4 form a loop. After a preset time period, the two probe assemblies 1 are disconnected from the detection device 3 and the detected device 4. That is, before the two probe assemblies 1 of the embodiment of the present invention are unplugged from the detected device 4, the two probe assemblies 1 have already disconnected from the detection device 3. At the same time, the loop formed by the two probe assemblies 1, the energy discharge assembly 2, and the detected device 4 allows the energy discharge assembly 2 to absorb the residual energy retained by the inductive load such as the motor of the detected device 4 and dissipate it into the environment in the form of heat.

[0047] The probe device in an embodiment of the present invention is provided with two probe assemblies and an energy discharge assembly connected to the two probe assemblies. Before the two probe assemblies are unplugged from the device under test, the energy discharge assembly first absorbs and releases the residual energy retained by the inductive load such as the motor of the device under test, thereby effectively avoiding the two probe assemblies from generating an arc at the moment of plugging and unplugging, protecting the probe device, extending the service life of the probe device and the detection equipment, and preventing the device under test from being affected by the arc and causing damage to its function.

[0048] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, each probe assembly 1 includes a probe head 11 and a probe tail 12. The probe head 11 is used to connect to the device under test 4, and the probe tail 12 is used to connect to the detection device 3. The probe head 11 and the probe tail 12 are respectively provided with a head conductive contact 111 and a tail conductive contact 121. When the probe assembly 1 is in a first working state, the head conductive contact 111 and the tail conductive contact 121 are in contact. When the probe assembly 1 is in a second working state, the head conductive contact 111 and the tail conductive contact 121 are disengaged. The structure is simple and easy to implement.

[0049] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, each of the probe assemblies 1 further includes an insulating spring 13 and an insulating locking mechanism 14 .

[0050] The insulating spring 13 is arranged between the probe head 11 and the probe tail 12. The insulating locking mechanism 14 is connected to the probe head 11 and the probe tail 12. The insulating locking mechanism 14 is used to fix the probe head 11 and the probe tail 12 when the probe assembly 1 is in the first working state or the second working state. The insulating spring 13 can facilitate the relative separation of the probe head 11 and the probe tail 12, switching from the first working state to the second working state, that is, facilitating the disengagement of the head conductive contact 111 and the tail conductive contact 121 from the contact state. At the same time, in conjunction with the insulating locking mechanism 14, the probe assembly 1 can be maintained in the first working state or the second working state, which is convenient for the staff to use.

[0051] As an optional implementation, in one embodiment of the invention, see Figure 1 and Figure 2 As shown, the probe device further includes an energy absorption component 5 connected to the two probe heads 11. Optionally, the energy absorption component 5 is a capacitor. When an inductive load such as a motor of the device under test 4 is operating, the energy absorption component 5 can absorb high-frequency interference energy generated by the motor commutator, thereby eliminating arcs generated on the connection contacts and the motor commutator.

[0052] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, the probe tail 12 is provided with an indicator light 15. When the head conductive contact 111 and the tail conductive contact 121 are in contact, the detection device 3 normally detects the detected device 4, and the indicator light 15 is lit. When the head conductive contact 111 and the tail conductive contact 121 are disengaged, the detection device 3 is electrically disconnected from the detected device 4, and the indicator light 15 is not lit. That is, the indicator light 15 can indicate the connection status between the head conductive contact 111 and the tail conductive contact 121, that is, it can indicate the working status of the probe assembly 1, which is convenient for guiding staff to identify the working status of the probe assembly 1.

[0053] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, the energy dissipation component 2 is a Schottky diode or a TVS transient suppression diode.

[0054] See also Figure 2 As shown, when the energy discharge component 2 is a Schottky diode, the anode of the Schottky diode is connected to the positive probe head 11, and the cathode of the Schottky diode is connected to the negative probe head 11, wherein the positive pole and the negative pole refer to the direction of current flow when the detection device 3 detects the device under test 4.

[0055] When the two probe assemblies 1 are in the first working state, the head conductive contact 111 and the tail conductive contact 121 are in contact. At this time, the Schottky diode is equivalent to an open circuit, and the two probe heads 11 are disconnected. The detection device 3, the two probe assemblies 1 and the device under test 4 form a loop, and the detection device 3 normally detects the device under test 4.

[0056] When the probe assembly 1 is in the second working state, the head conductive contact 111 and the tail conductive contact 121 are disconnected. At this time, the detection device 3 is electrically disconnected from the detected device 4, but the inductive load such as the motor of the detected device 4 will continue to discharge. The Schottky diode is equivalent to an open circuit. The two probe heads 11 are connected. The two probe assemblies 1, the Schottky diode and the detected device 4 form a loop. The Schottky diode and the conductive circuit will consume the residual energy retained by the inductive load. After the residual energy is consumed, the two probe heads 11 are unplugged from the detected device 4. No arc will be generated at the moment of plugging and unplugging. A similar effect can be achieved by using a TVS transient suppression diode.

[0057] See also Figure 3 As shown, an embodiment of the present invention further provides a method for using a probe device, comprising the following steps:

[0058] Step S10 : before the detection starts, the two probe assemblies 1 are placed in the second working state, and the two probe assemblies 1 are connected to the detection device 3 and the device to be detected 4 .

[0059] Step S20 , placing the two probe assemblies 1 in a first working state, forming a loop with the detection device 3 , the two probe assemblies 1 and the device under test 4 , and then using the detection device 3 to detect the device under test 4 .

[0060] Step S30: After the detection is completed, the two probe assemblies 1 are placed in the second working state, the detection device 3 is electrically disconnected from the detected device 4, and the two probe assemblies 1, the energy discharge assembly 2 and the detected device 4 form a loop. After the preset time, the two probe assemblies 1 are disconnected from the detection device 3 and the detected device 4.

[0061] The method of using the probe device in an embodiment of the present invention is that before the two probe assemblies are unplugged from the device under test, the residual energy retained by the inductive load such as the motor of the device under test is first absorbed and released through the energy discharge assembly, thereby effectively avoiding the two probe assemblies from generating an arc at the moment of plugging and unplugging, protecting the probe device, extending the service life of the probe device and the detection equipment, and also preventing the device under test from being affected by the arc and causing damage to its function.

[0062] As an optional implementation, in one embodiment of the invention, see Figure 2As shown, each probe assembly 1 includes a probe head 11 and a probe tail 12. The probe head 11 is used to connect to the device under test 4, and the probe tail 12 is used to connect to the detection device 3. The probe head 11 and the probe tail 12 are respectively provided with a head conductive contact 111 and a tail conductive contact 121. When the probe assembly 1 is in a first working state, the head conductive contact 111 and the tail conductive contact 121 are in contact. When the probe assembly 1 is in a second working state, the head conductive contact 111 and the tail conductive contact 121 are disengaged. The structure is simple and easy to implement.

[0063] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, each of the probe assemblies 1 further includes an insulating spring 13 and an insulating locking mechanism 14 .

[0064] The insulating spring 13 is arranged between the probe head 11 and the probe tail 12. The insulating locking mechanism 14 is connected to the probe head 11 and the probe tail 12. The insulating locking mechanism 14 is used to fix the probe head 11 and the probe tail 12 when the probe assembly 1 is in the first working state or the second working state. The insulating spring 13 can facilitate the relative separation of the probe head 11 and the probe tail 12, switching from the first working state to the second working state, that is, facilitating the disengagement of the head conductive contact 111 and the tail conductive contact 121 from the contact state. At the same time, in conjunction with the insulating locking mechanism 14, the probe assembly 1 can be maintained in the first working state or the second working state, which is convenient for the staff to use.

[0065] As an optional implementation, in one embodiment of the invention, see Figure 1 and Figure 2 As shown, the probe device further includes an energy absorption component 5 connected to the two probe heads 11. Optionally, the energy absorption component 5 is a capacitor. When an inductive load such as a motor of the device under test 4 is operating, the energy absorption component 5 can absorb high-frequency interference energy generated by the motor commutator, thereby eliminating arcs generated on the connection contacts and the motor commutator.

[0066] As an optional implementation, in one embodiment of the invention, see Figure 2As shown, the probe tail 12 is provided with an indicator light 15. When the head conductive contact 111 and the tail conductive contact 121 are in contact, the detection device 3 normally detects the detected device 4, and the indicator light 15 is lit. When the head conductive contact 111 and the tail conductive contact 121 are disengaged, the detection device 3 is electrically disconnected from the detected device 4, and the indicator light 15 is not lit. That is, the indicator light 15 can indicate the connection status between the head conductive contact 111 and the tail conductive contact 121, that is, it can indicate the working status of the probe assembly 1, which is convenient for guiding staff to identify the working status of the probe assembly 1.

[0067] As an optional implementation, in one embodiment of the invention, see Figure 2 As shown, the energy dissipation component 2 is a Schottky diode or a TVS transient suppression diode.

[0068] See also Figure 2 As shown, when the energy discharge component 2 is a Schottky diode, the anode of the Schottky diode is connected to the positive probe head 11, and the cathode of the Schottky diode is connected to the negative probe head 11, wherein the positive pole and the negative pole refer to the direction of current flow when the detection device 3 detects the device under test 4.

[0069] When the two probe assemblies 1 are in the first working state, the head conductive contact 111 and the tail conductive contact 121 are in contact. At this time, the Schottky diode is equivalent to an open circuit, and the two probe heads 11 are disconnected. The detection device 3, the two probe assemblies 1 and the device under test 4 form a loop, and the detection device 3 normally detects the device under test 4.

[0070] When the probe assembly 1 is in the second working state, the head conductive contact 111 and the tail conductive contact 121 are disconnected. At this time, the detection device 3 is electrically disconnected from the detected device 4, but the inductive load such as the motor of the detected device 4 will continue to discharge. The Schottky diode is equivalent to an open circuit. The two probe heads 11 are connected. The two probe assemblies 1, the Schottky diode and the detected device 4 form a loop. The Schottky diode and the conductive circuit will consume the residual energy retained by the inductive load. After the residual energy is consumed, the two probe heads 11 are unplugged from the detected device 4. No arc will be generated at the moment of plugging and unplugging. A similar effect can be achieved by using a TVS transient suppression diode.

[0071] An embodiment of the present invention further provides a detection system, including the aforementioned probe device.

[0072] In the description of the present invention, it should be noted that the orientation or positional relationship indicated by the terms "upper" and "lower" is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. Unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be internal communication between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0073] It should be noted that, in the present invention, relational terms such as "first" and "second" are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element.

[0074] The foregoing description is intended only to provide specific embodiments of the present invention, which will enable those skilled in the art to understand and implement the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not intended to be limited to the embodiments shown herein, but is to be construed in the widest possible manner consistent with the principles and novel features of the present invention.

Claims

1. A probe device, characterized in that: include: Two probe assemblies (1) and an energy discharge assembly (2) connected to the two probe assemblies (1), the two probe assemblies (1) are used to connect with a detection device (3) and a detected device (4), and the two probe assemblies (1) have two working states: When the two probe assemblies (1) are in the first working state, the detection device (3), the two probe assemblies (1) and the device to be detected (4) form a loop, and the detection device (3) is used to detect the device to be detected (4). After the detection is completed, the two probe assemblies (1) are placed in the second working state; When the two probe assemblies (1) are in the second working state, the detection device (3) is electrically disconnected from the detected device (4), and the two probe assemblies (1), the energy discharge assembly (2) and the detected device (4) form a loop. After a preset time period, the two probe assemblies (1) are disconnected from the detection device (3) and the detected device (4).

2. The probe device according to claim 1, characterized in that Each of the probe assemblies (1) comprises: A probe head (11) and a probe tail (12), wherein the probe head (11) is used to connect to the device to be tested (4), and the probe tail (12) is used to connect to the detection device (3), and the probe head (11) and the probe tail (12) are respectively provided with a head conductive contact (111) and a tail conductive contact (121); When the probe assembly (1) is in a first working state, the head conductive contact (111) and the tail conductive contact (121) are in contact; When the probe assembly (1) is in the second working state, the head conductive contact (111) and the tail conductive contact (121) are disconnected.

3. The probe device according to claim 2, characterized in that Each of the probe assemblies (1) further comprises: an insulating spring (13), the insulating spring (13) being arranged between the probe head (11) and the probe tail (12); An insulating locking mechanism (14) is connected to the probe head (11) and the probe tail (12), and the insulating locking mechanism (14) is used to fix the probe head (11) and the probe tail (12) when the probe assembly (1) is in a first working state or a second working state.

4. The probe device according to claim 2, characterized in that Also includes: An energy absorbing component (5), the energy absorbing component (5) being connected to the two probe heads (11).

5. The probe device according to claim 4, characterized in that: The energy absorption component (5) is a capacitor.

6. The probe device according to claim 2, wherein: The probe tail (12) is provided with an indicator light (15).

7. The probe device according to claim 1, wherein: The energy discharge component (2) is a Schottky diode.

8. The probe device according to claim 1, wherein: The energy discharge component (2) is a TVS transient suppression diode.

9. A method for using the probe device according to claim 1, characterized in that: The following steps are involved: Before the detection begins, the two probe assemblies (1) are placed in a second working state, and the two probe assemblies (1) are connected to the detection device (3) and the device to be detected (4); The two probe assemblies (1) are placed in a first working state, the detection device (3), the two probe assemblies (1) and the device to be detected (4) form a loop, and the detection device (3) is then used to detect the device to be detected (4); After the detection is completed, the two probe assemblies (1) are placed in a second working state, the detection device (3) is electrically disconnected from the detected device (4), and the two probe assemblies (1), the energy discharge assembly (2) and the detected device (4) form a loop. After the loop lasts for a preset time, the two probe assemblies (1) are disconnected from the detection device (3) and the detected device (4).

10. A detection system, characterized in that: The probe device comprises the probe device according to any one of claims 1 to 8.

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