Liquid crystal module performance test system based on data analysis

Abstract

The invention discloses a liquid crystal module performance test system based on data analysis, and particularly relates to the technical field of data analysis. Comprising a liquid crystal module data division module, a liquid crystal module data acquisition module, a liquid crystal module preprocessing module, a liquid crystal module analysis module, a comprehensive analysis module, a comprehensive evaluation module, an early warning module, a database module and a liquid crystal module visualization module. The method comprises the following steps: dividing a target liquid crystal module data area into each division unit and carrying out corresponding data acquisition; a substrate material coefficient value, a liquid crystal layer performance coefficient value, a packaging layer performance coefficient value and an environment performance coefficient value are imported into a data analysis model to obtain a comprehensive module performance anomaly index value, and the comprehensive module performance anomaly index value is compared with a preset comprehensive module performance anomaly threshold value and fed back. And the accuracy and the reliability of the performance of the liquid crystal module can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of data analysis, and more specifically, to a liquid crystal module performance testing system based on data analysis. Background Art

[0002] In today's digital information age, LCD display technology has been widely penetrated into every corner of people's lives and work, from smart phones, laptops to professional medical equipment, industrial monitoring displays, etc. The quality and performance of LCD modules play a decisive role in the user experience and function realization of terminal products.

[0003] An existing liquid crystal module performance test system based on data analysis includes a data acquisition module, a data analysis module and a performance detection module. The data acquisition module collects data on the performance of the liquid crystal module based on various sensors; the data analysis module analyzes the data collected by the data acquisition module. The performance detection module helps to accurately measure the error range and deviation direction of the liquid crystal module by performing respective performance tests on various types of data, efficiently guides subsequent targeted optimization, and ensures the accuracy and reliability of the performance of the liquid crystal module.

[0004] However, in actual application, the system still shows many shortcomings, such as: in the data acquisition module, the collected LCD module information data is not comprehensive enough. In the data analysis module, the analysis of various types of data is not accurate enough, resulting in data loss and errors. The system lacks a comprehensive indicator to judge the performance of the LCD module, which greatly saves time and labor costs.

[0005] Therefore, there is an urgent need for a liquid crystal module performance testing system based on data analysis to solve the above problems. Summary of the invention

[0006] In order to overcome the above defects of the prior art, an embodiment of the present invention provides a liquid crystal module performance testing system based on data analysis, which solves the problems raised in the above background technology through the field of data analysis technology.

[0007] To achieve the above-mentioned object, the present invention provides the following technical solutions: a liquid crystal module performance test system based on data analysis, comprising a liquid crystal module data division module, a liquid crystal module data acquisition module, a liquid crystal module preprocessing module, a liquid crystal module analysis module, a comprehensive analysis module, a comprehensive evaluation module, an early warning module, a database module and a liquid crystal module visualization module; Liquid crystal module data division module: used to divide the target liquid crystal module data area into a substrate data division unit, a liquid crystal layer data division unit, a packaging layer data division unit and an environment data division unit; The substrate data division unit is used to divide the substrate data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., i, ..., n in sequence; The liquid crystal layer data division unit is used to divide the liquid crystal layer data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., j, ..., n in sequence; The encapsulation layer data division unit is used to divide the encapsulation layer data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., k, ..., n in sequence; The environmental data division unit is used to divide the environmental data area into sub-areas according to equal time, and number the sub-areas in sequence as 1, 2, ..., z, ..., n; Liquid crystal module data acquisition module: used to collect data from any division unit of the target liquid crystal module data area through various multi-source sensor devices, and transmit the collected data to the liquid crystal module preprocessing module; including substrate data acquisition unit, liquid crystal layer acquisition unit, packaging layer acquisition unit and environmental data acquisition unit; LCD module preprocessing module: receives data transmitted by the LCD module data acquisition module, performs preprocessing operations on the transmitted data, and transmits the data to the LCD module analysis module; Liquid crystal module analysis module: receives data transmitted by the liquid crystal module preprocessing module, is used to obtain a mathematical model, and transmits the data to the mathematical model to obtain a substrate material coefficient value, a liquid crystal layer performance coefficient value, a packaging layer performance coefficient value, and an environmental performance coefficient value; includes a substrate material calculation unit, a liquid crystal layer performance calculation unit, a packaging layer performance calculation unit, and an environmental performance calculation unit; Comprehensive analysis module: used to obtain a data analysis model, import the substrate material coefficient value, liquid crystal layer performance coefficient value, encapsulation layer performance coefficient value and environmental performance coefficient value into the data analysis model to obtain a comprehensive module performance abnormality index value, and transmit the data to a comprehensive evaluation module; including a data analysis unit; Comprehensive evaluation module: obtains a preset comprehensive module performance abnormality threshold, obtains a digital signal based on the comprehensive module performance abnormality index value and the preset comprehensive module performance abnormality threshold, and transmits the digital signal to the early warning module; Early warning module: used to receive the danger signals from the comprehensive judgment module and the management personnel will make corresponding adjustments and optimizations, and display them to relevant management personnel in a visual way; Database module: used to store all data information of historical LCD modules in the target LCD module data area; LCD module visualization module: used to integrate and optimize the data of the comprehensive analysis module and establish visualization methods according to the needs of managers.

[0008] Preferably, the substrate data acquisition unit includes: the module internal structure stress recorded as Jn, the temperature change rate recorded as Jc, the substrate flatness deviation value recorded as Jt and the substrate transmittance recorded as Jw; the liquid crystal layer acquisition unit includes: the liquid crystal layer thickness value recorded as Yh, the liquid crystal molecule pretilt angle recorded as Yo, the rotation speed of the liquid crystal sample recorded as Yv and the torque of the liquid crystal sample recorded as Yn; the encapsulation layer acquisition unit includes: the water vapor permeability recorded as Ft, the elastic modulus recorded as Fm, and the curing shrinkage volume value recorded as Fv; the environmental data acquisition unit includes: the high temperature storage rate recorded as Hc, the strong light irradiation flicker frequency recorded as Hs and the vibration resonance frequency recorded as Hg.

[0009] Preferably, the specific method of data preprocessing operation includes: The calculation formula of the thermal expansion coefficient of the substrate is: , JA represents the thermal expansion coefficient of the substrate, Jn i represents the internal structural stress of the module in the ith region, Jc i represents the temperature change rate of the ith region, and n represents the total number of sub-regions; The calculation formula for the average thickness of the liquid crystal layer is: , YH represents the average thickness of the liquid crystal layer, Yh j represents the thickness of the liquid crystal layer in the jth region, and n represents the total number of sub-regions; The calculation formula of rotational viscosity coefficient is: , Ya represents the rotational viscosity coefficient, r1 is the inner radius of the rheometer, r2 is the inner radius of the rheometer, and Yv is j represents the rotation speed of the liquid crystal sample in the jth region, Yn j represents the torque of the liquid crystal sample in the jth region, and n represents the total number of sub-regions; The calculation formula for the hardening shrinkage volume ratio is: , FV represents the hardening shrinkage volume ratio, Fv k represents the curing shrinkage volume value of the kth region, V max represents the maximum value of the hardening shrinkage volume, and n represents the total number of sub-regions.

[0010] Preferably, the substrate material calculation unit is used for the substrate material mathematical model, and the data processed by the liquid crystal module preprocessing module is imported into the substrate material mathematical model to calculate the substrate material coefficient value, which is specifically expressed as: , J represents the material coefficient of the substrate, JA represents the thermal expansion coefficient of the substrate, and Jw i represents the substrate transmittance of the ith region, Jt i represents the substrate flatness deviation value of the ith area, e represents a natural constant, and n represents the total number of sub-areas.

[0011] Preferably, the liquid crystal layer performance calculation unit is used to establish a liquid crystal layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the liquid crystal layer performance mathematical model, and calculate the energy storage liquid crystal layer performance coefficient value, which is specifically expressed as: , Y represents the performance coefficient of the liquid crystal layer, YH represents the average thickness of the liquid crystal layer, and Yh j represents the thickness of the liquid crystal layer in the jth region, Yo j represents the pretilt angle of the liquid crystal molecules in the jth region, Ya represents the rotational viscosity coefficient, π represents a natural constant, e represents a natural constant, and n represents the total number of sub-regions.

[0012] Preferably, the encapsulation layer performance calculation unit is used to establish an encapsulation layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the encapsulation layer performance mathematical model, and calculate the liquid crystal layer performance coefficient value, which is specifically expressed as: , F represents the performance coefficient of the liquid crystal layer, FV represents the hardening shrinkage volume ratio, and Fv k represents the curing shrinkage volume value of the kth region, Fm k represents the elastic modulus of the kth region, Ft k represents the water vapor transmission rate of the kth region, and n represents the total number of sub-regions.

[0013] Preferably, the environmental performance calculation unit is used to establish an environmental performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the environmental performance mathematical model, and calculate the environmental performance coefficient value, which is specifically expressed as: , H represents the environmental performance coefficient value, Hc z represents the high temperature storage rate of the zth region, Hc max Indicates the maximum value of high temperature storage rate in each sub-region, Hs z Indicates the flashing frequency of strong light in the zth area, Hg z represents the vibration resonance frequency of the z-th region, e represents a natural constant, and n represents the total number of sub-regions.

[0014] Preferably, the data analysis unit is used to establish a data analysis model, import the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value into the data analysis model, and calculate the comprehensive module performance abnormality index value, which is specifically expressed as: , Wherein, P represents the comprehensive module performance abnormality index value, J represents the substrate material coefficient value, Y represents the liquid crystal layer performance coefficient value, F represents the liquid crystal layer performance coefficient value, H represents the environmental performance coefficient value, α1, α2, α3, α4 represent weight coefficients and are all greater than zero and less than one, and the sum of α1, α2, α3, α4 is equal to one, where μ represents other influencing factors of the comprehensive module performance abnormality index value.

[0015] Preferably, the preset comprehensive module performance abnormality threshold is an average value obtained by evaluating the historical data in the database module; the specific determination is as follows: The digital signal includes: an abnormal signal and a good signal; B1: If the comprehensive module performance abnormality index value is greater than the preset comprehensive module performance abnormality threshold, an abnormality signal is issued and transmitted to the early warning module; B2: If the comprehensive module performance abnormality index value is less than the preset comprehensive module performance abnormality threshold, a good signal is issued and the data is stored in the database module.

[0016] Technical effects and advantages of the present invention: The present invention uses a liquid crystal module data division module to clearly divide the target liquid crystal module data area into substrate, liquid crystal layer, encapsulation layer and environmental data division units, so that the source and ownership of the data are clear, which is convenient for subsequent special processing and analysis of data of different parts, and helps to improve the accuracy and efficiency of data processing; the present invention can comprehensively collect various data related to the liquid crystal module through various multi-source sensor devices, covering information on the substrate, liquid crystal layer, encapsulation layer and environment, thereby providing a rich data basis for comprehensively evaluating the performance and status of the liquid crystal module and improving the comprehensiveness of the data; the present invention imports the performance coefficient value of each part into the data analysis model to obtain the comprehensive module performance abnormality index value, thereby realizing a comprehensive quantitative evaluation of the overall performance of the liquid crystal module, which can intuitively reflect the overall health status of the module and the degree of deviation from normal performance, and is convenient for management personnel to quickly understand the product quality level; comparative judgment is made based on a preset comprehensive module performance abnormality threshold, reducing the subjectivity and uncertainty of human judgment, ensuring the reliability of liquid crystal module quality control, and greatly improving the accuracy and reliability of the performance of the liquid crystal module. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 It is a schematic diagram of the system structure of the present invention.

[0017] Figure 2 It is a structural schematic diagram of the liquid crystal module analysis module of the present invention. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] As attached Figure 1 Shown is a structural schematic diagram of a liquid crystal module performance test system based on data analysis, including a liquid crystal module data division module, a liquid crystal module data acquisition module, a liquid crystal module preprocessing module, a liquid crystal module analysis module, a comprehensive analysis module, a comprehensive evaluation module, an early warning module, a database module and a liquid crystal module visualization module.

[0020] Liquid crystal module data division module: used to divide the target liquid crystal module data area into a substrate data division unit, a liquid crystal layer data division unit, a packaging layer data division unit and an environment data division unit; In the present embodiment, it is specifically necessary to explain that the target liquid crystal module data area includes a substrate data area, a liquid crystal layer data area, an encapsulation layer data area and an environment data area; the substrate data division unit is used to divide the substrate data area into sub-areas according to equal time, and the sub-areas are numbered 1, 2, ..., i, ..., n in sequence; the liquid crystal layer data division unit is used to divide the liquid crystal layer data area into sub-areas according to equal time, and the sub-areas are numbered 1, 2, ..., j, ..., n in sequence; the encapsulation layer data division unit is used to divide the encapsulation layer data area into sub-areas according to equal time, and the sub-areas are numbered 1, 2, ..., k, ..., n in sequence; the environment data division unit is used to divide the environment data area into sub-areas according to equal time, and the sub-areas are numbered 1, 2, ..., z, ..., n in sequence.

[0021] Liquid crystal module data acquisition module: used to collect data from any division unit of the target liquid crystal module data area through various multi-source sensor devices, and transmit the collected data to the liquid crystal module preprocessing module; including substrate data acquisition unit, liquid crystal layer acquisition unit, packaging layer acquisition unit and environmental data acquisition unit.

[0022] In this embodiment, it is specifically necessary to explain that the substrate data acquisition unit includes: the module internal structure stress is recorded as Jn, the temperature change rate is recorded as Jc, the substrate flatness deviation value is recorded as Jt and the substrate transmittance is recorded as Jw; the liquid crystal layer acquisition unit includes: the liquid crystal layer thickness value is recorded as Yh, the liquid crystal molecule pretilt angle is recorded as Yo, the rotation speed of the liquid crystal sample is recorded as Yv and the torque of the liquid crystal sample is recorded as Yn; the encapsulation layer acquisition unit includes: the water vapor permeability is recorded as Ft, the elastic modulus is recorded as Fm, and the curing shrinkage volume value is recorded as Fv; the environmental data acquisition unit includes: the high temperature storage rate is recorded as Hc, the strong light irradiation flicker frequency is recorded as Hs and the vibration resonance frequency is recorded as Hg.

[0023] Specifically, the method for collecting the internal structural stress of the module is as follows: a strain gauge is pasted on the key part of the module. The resistance of the strain gauge changes with the structural deformation, which is converted into a voltage signal through a Wheatstone bridge. The stress is calculated based on the sensitivity coefficient of the strain gauge. The method for collecting the thickness of the liquid crystal layer is as follows: the ellipsometry method is used. After the ellipsoidal polarization light interacts with the liquid crystal layer, the polarization state of the reflected light changes. Based on this, the thickness of the liquid crystal layer is calculated in combination with optical theory. The method for collecting the flatness deviation of the substrate is as follows: a laser interferometer is used. The laser irradiates the surface of the substrate to form interference fringes. The height difference of each point on the surface relative to the ideal plane, that is, the flatness deviation value, is calculated based on the change of the fringes and the laser wavelength. The method for collecting the light transmittance of the substrate is as follows: Method: Place the substrate in the sample cell of the spectrophotometer, measure the light intensity before and after passing through the substrate, calculate at different wavelengths according to the transmittance formula, and obtain the transmittance curve with wavelength; Collection method of liquid crystal layer thickness value: Use ellipsometry spectrometry, the polarization state of the reflected light changes after the elliptically polarized light interacts with the liquid crystal layer, and the thickness of the liquid crystal layer is calculated based on this combined with optical theory; Collection method of liquid crystal molecule pretilt angle: With the help of conoscopic interferometer, observe the interference fringe characteristics generated by the liquid crystal layer under conoscopic irradiation, and calculate the pretilt angle based on liquid crystal optical theory; Collection method of liquid crystal sample rotation speed: Install an optical encoder on the drive shaft, and its code disk rotates to generate a light pulse signal, and according to the pulse frequency The torque collection method of the liquid crystal sample is: the strain gauge is pasted on the rotating shaft. The shaft is strained by torque, causing the strain gauge resistance to change. The voltage signal is converted through the Wheatstone bridge. The torque is calculated according to the shaft parameters and the strain gauge sensitivity coefficient; the water vapor transmission rate collection method: the weight method is adopted, and the desiccant is used to absorb the water vapor that passes through the packaging layer. The weight change of the test chamber containing the desiccant is measured regularly, and the water vapor transmission rate is calculated according to the formula; the elastic modulus collection method: a tensile test is carried out, and the axial tension is applied to the standard sample of the packaging layer material and the strain is measured. The elastic modulus is calculated according to the tension-strain curve and related formulas; the curing shrinkage volume value collection method: the mold is used to collect the volume value of the shrinkage volume. Method: Place the packaging material in a mold of known volume, observe the volume change before and after curing, and calculate the curing shrinkage volume value according to the formula; Collection method of high temperature storage rate: Place it in an aging test box, set the high temperature storage temperature, take it out regularly and use professional equipment to measure the performance indicators of the module, and calculate the indicator change rate under different storage times; Collection method of flicker frequency under strong light irradiation: Under strong light irradiation environment, use a professional flicker measuring instrument to aim at the LCD module. The instrument counts the number of flickers per unit time by detecting the rapid fluctuation of light intensity, so as to obtain the flicker frequency under strong light irradiation. Collection method of vibration resonance frequency: Fix the LCD module on a vibration table and connect the acceleration sensor. The vibration table vibrates at different frequencies. When the vibration frequency is close to the module resonance frequency, the vibration amplitude detected by the acceleration sensor increases significantly, thereby determining the vibration resonance frequency.

[0024] LCD module preprocessing module: receives data transmitted by the LCD module data acquisition module, performs preprocessing operations on the transmitted data, and transmits the data to the LCD module analysis module.

[0025] In this example, it should be specifically noted that the specific methods of data preprocessing operations include: The calculation formula of the thermal expansion coefficient of the substrate is: , JA represents the thermal expansion coefficient of the substrate, Jn i represents the internal structural stress of the module in the ith region, Jc i represents the temperature change rate of the ith region, and n represents the total number of sub-regions; The calculation formula for the average thickness of the liquid crystal layer is: , YH represents the average thickness of the liquid crystal layer, Yh j represents the thickness of the liquid crystal layer in the jth region, and n represents the total number of sub-regions; The calculation formula of rotational viscosity coefficient is: , Ya represents the rotational viscosity coefficient, r1 is the inner radius of the rheometer, r2 is the inner radius of the rheometer, and Yv is j represents the rotation speed of the liquid crystal sample in the jth region, Yn j represents the torque of the liquid crystal sample in the jth region, and n represents the total number of sub-regions; The calculation formula for the hardening shrinkage volume ratio is: , FV represents the hardening shrinkage volume ratio, Fv k represents the curing shrinkage volume value of the kth region, V max represents the maximum value of the hardening shrinkage volume, and n represents the total number of sub-regions.

[0026] As attached Figure 2 Shown is a schematic diagram of the structure of the LCD module analysis module.

[0027] Liquid crystal module analysis module: receives data transmitted by the liquid crystal module preprocessing module, is used to obtain a mathematical model, and transmits the data into the mathematical model to obtain the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value; includes a substrate material calculation unit, a liquid crystal layer performance calculation unit, a encapsulation layer performance calculation unit and an environmental performance calculation unit.

[0028] In this embodiment, it should be specifically explained that the mathematical model specifically includes: a substrate material mathematical model, a liquid crystal layer performance mathematical model, a packaging layer performance mathematical model and an environmental performance mathematical model.

[0029] In this embodiment, it should be specifically explained that the substrate material calculation unit is used for the substrate material mathematical model, and the data processed by the liquid crystal module preprocessing module is imported into the substrate material mathematical model to calculate the substrate material coefficient value, which is specifically expressed as: , J represents the material coefficient of the substrate, JA represents the thermal expansion coefficient of the substrate, and Jw i represents the substrate transmittance of the ith region, Jt i represents the substrate flatness deviation value of the ith area, e represents a natural constant, and n represents the total number of sub-areas.

[0030] In this embodiment, it should be specifically explained that the liquid crystal layer performance calculation unit is used to establish a liquid crystal layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the liquid crystal layer performance mathematical model, and calculate the energy storage liquid crystal layer performance coefficient value, which is specifically expressed as: , Y represents the performance coefficient of the liquid crystal layer, YH represents the average thickness of the liquid crystal layer, and Yh j represents the thickness of the liquid crystal layer in the jth region, Yo j represents the pretilt angle of the liquid crystal molecules in the jth region, Ya represents the rotational viscosity coefficient, π represents a natural constant, e represents a natural constant, and n represents the total number of sub-regions.

[0031] In this embodiment, it should be specifically explained that the encapsulation layer performance calculation unit is used to establish an encapsulation layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the encapsulation layer performance mathematical model, and calculate the liquid crystal layer performance coefficient value, which is specifically expressed as: , F represents the performance coefficient of the liquid crystal layer, FV represents the hardening shrinkage volume ratio, and Fv k represents the curing shrinkage volume value of the kth region, Fm k represents the elastic modulus of the kth region, Ft k represents the water vapor transmission rate of the kth region, and n represents the total number of sub-regions.

[0032] In this embodiment, it should be specifically explained that the environmental performance calculation unit is used to establish an environmental performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the environmental performance mathematical model, and calculate the environmental performance coefficient value, which is specifically expressed as: , H represents the environmental performance coefficient value, Hc z represents the high temperature storage rate of the zth region, Hc max Indicates the maximum value of high temperature storage rate in each sub-region, Hsz Indicates the flashing frequency of strong light in the zth area, Hg z represents the vibration resonance frequency of the z-th region, e represents a natural constant, and n represents the total number of sub-regions.

[0033] Comprehensive analysis module: used to obtain a data analysis model, import the substrate material coefficient value, liquid crystal layer performance coefficient value, packaging layer performance coefficient value and environmental performance coefficient value into the data analysis model to obtain a comprehensive module performance abnormality index value, and transmit the data to a comprehensive evaluation module; including a data analysis unit.

[0034] In this embodiment, it should be specifically explained that the data analysis unit is used to establish a data analysis model, import the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value into the data analysis model, and calculate the comprehensive module performance abnormality index value, which is specifically expressed as: , Wherein, P represents the comprehensive module performance abnormality index value, J represents the substrate material coefficient value, Y represents the liquid crystal layer performance coefficient value, F represents the liquid crystal layer performance coefficient value, H represents the environmental performance coefficient value, α1, α2, α3, α4 represent weight coefficients and are all greater than zero and less than one, and the sum of α1, α2, α3, α4 is equal to one, where μ represents other influencing factors of the comprehensive module performance abnormality index value.

[0035] Comprehensive evaluation module: obtains the preset comprehensive module performance abnormality threshold, obtains a digital signal based on the comparison between the comprehensive module performance abnormality index value and the preset comprehensive module performance abnormality threshold, and transmits the digital signal to the early warning module.

[0036] In this embodiment, it should be specifically noted that the preset comprehensive module performance abnormality threshold is an average value obtained by evaluating the historical data in the database module; the specific determination is as follows: The digital signal includes: an abnormal signal and a good signal; A1: If the comprehensive module performance abnormality index value is greater than the preset comprehensive module performance abnormality threshold, an abnormal signal is issued and transmitted to the early warning module; A2: If the comprehensive module performance abnormality index value is less than the preset comprehensive module performance abnormality threshold, a good signal is issued and the data is stored in the database module.

[0037] Early warning module: used to receive danger signals from the comprehensive judgment module and managers will make corresponding adjustments and optimizations.

[0038] Database module: used to store all data information of historical LCD modules in the target LCD module data area; LCD module visualization module: used to integrate and optimize the data of the comprehensive analysis module and establish visualization methods according to the needs of managers; In this embodiment, it should be specifically explained that the visualization methods used to establish the comprehensive analysis module include: images, videos and audios.

[0039] The present invention uses a liquid crystal module data division module to clearly divide the target liquid crystal module data area into substrate, liquid crystal layer, encapsulation layer and environmental data division units, so that the source and ownership of the data are clear, which is convenient for subsequent special processing and analysis of data of different parts, and helps to improve the accuracy and efficiency of data processing; the liquid crystal module data acquisition module can comprehensively collect various data related to the liquid crystal module through various multi-source sensor devices, covering various information such as substrate, liquid crystal layer, encapsulation layer and environment, thereby providing a rich data basis for comprehensively evaluating the performance and status of the liquid crystal module, avoiding one-sided analysis caused by data loss; the liquid crystal module preprocessing module: preprocessing the collected data, such as removing noise, processing outliers, standardizing data and other operations, can effectively improve the quality and availability of the data, reduce the misleading of subsequent analysis results by erroneous data or data with large deviations, and improve the reliability of data analysis. The liquid crystal module analysis module calculates the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value through a specific mathematical model, which can quantify the impact of each part on the overall performance of the liquid crystal module, provide a scientific basis for in-depth understanding of the module performance, and help to accurately locate the root cause of the problem; the comprehensive analysis module imports the performance coefficient value of each part into the data analysis model to obtain the comprehensive module performance abnormality index value, realizes the comprehensive quantitative evaluation of the overall performance of the liquid crystal module, can intuitively reflect the overall health status of the module and the degree of deviation from normal performance, and is convenient for managers to quickly understand the product quality level; the comprehensive evaluation module compares and judges based on the preset comprehensive module performance abnormality threshold, provides an objective and clear evaluation standard, reduces the subjectivity and uncertainty of human judgment, and ensures the reliability of product quality control. The present invention greatly improves the accuracy and reliability of the performance of the liquid crystal module.

[0040] Secondly, in the drawings of the embodiments disclosed in the present invention, only the structures related to the embodiments disclosed in the present invention are involved, and other structures can refer to the general design. In the absence of conflict, the same embodiment and different embodiments of the present invention can be combined with each other; The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A liquid crystal module performance testing system based on data analysis, characterized in that: include: Liquid crystal module data division module: used to divide the target liquid crystal module data area into a substrate data division unit, a liquid crystal layer data division unit, a packaging layer data division unit and an environment data division unit; The substrate data division unit is used to divide the substrate data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., i, ..., n in sequence; The liquid crystal layer data division unit is used to divide the liquid crystal layer data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., j, ..., n in sequence; The encapsulation layer data division unit is used to divide the encapsulation layer data area into sub-areas at equal time, and number the sub-areas 1, 2, ..., k, ..., n in sequence; The environmental data division unit is used to divide the environmental data area into sub-areas according to equal time, and number the sub-areas in sequence as 1, 2, ..., z, ..., n; Liquid crystal module data acquisition module: used to collect data from any division unit of the target liquid crystal module data area through various multi-source sensor devices, and transmit the collected data to the liquid crystal module preprocessing module; It includes a substrate data acquisition unit, a liquid crystal layer acquisition unit, a packaging layer acquisition unit and an environmental data acquisition unit; LCD module preprocessing module: receives data transmitted by the LCD module data acquisition module, performs preprocessing operations on the transmitted data, and transmits the data to the LCD module analysis module; Liquid crystal module analysis module: receiving data transmitted by the liquid crystal module preprocessing module, used to obtain a mathematical model, and passing the data into the mathematical model to obtain the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value; It includes a substrate material calculation unit, a liquid crystal layer performance calculation unit, a packaging layer performance calculation unit and an environmental performance calculation unit; Comprehensive analysis module: used to obtain a data analysis model, import the substrate material coefficient value, liquid crystal layer performance coefficient value, encapsulation layer performance coefficient value and environmental performance coefficient value into the data analysis model to obtain a comprehensive module performance abnormality index value, and transmit the data to a comprehensive evaluation module; Includes data analysis unit; Comprehensive evaluation module: obtains a preset comprehensive module performance abnormality threshold, obtains a digital signal based on the comprehensive module performance abnormality index value and the preset comprehensive module performance abnormality threshold, and transmits the digital signal to the early warning module; Early warning module: used to receive the danger signals from the comprehensive judgment module and the management personnel will make corresponding adjustments and optimizations, and display them to relevant management personnel in a visual way; Database module: used to store all data information of historical LCD modules in the target LCD module data area; LCD module visualization module: used to integrate and optimize the data of the comprehensive analysis module and establish visualization methods according to the needs of managers.

2. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The substrate data acquisition unit includes: the module internal structure stress is recorded as Jn, the temperature change rate is recorded as Jc, the substrate flatness deviation value is recorded as Jt and the substrate transmittance is recorded as Jw; the liquid crystal layer acquisition unit includes: the liquid crystal layer thickness value is recorded as Yh, the liquid crystal molecule pretilt angle is recorded as Yo, the rotation speed of the liquid crystal sample is recorded as Yv and the torque of the liquid crystal sample is recorded as Yn; the encapsulation layer acquisition unit includes: the water vapor permeability is recorded as Ft, the elastic modulus is recorded as Fm, and the curing shrinkage volume value is recorded as Fv; the environmental data acquisition unit includes: the high temperature storage rate is recorded as Hc, the strong light irradiation flicker frequency is recorded as Hs and the vibration resonance frequency is recorded as Hg.

3. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The specific method of the pre-processing operation includes: The calculation formula of the thermal expansion coefficient of the substrate is: ， JA represents the thermal expansion coefficient of the substrate, Jn i represents the internal structural stress of the module in the ith region, Jc i represents the temperature change rate of the ith region, and n represents the total number of sub-regions; The calculation formula for the average thickness of the liquid crystal layer is: ， YH represents the average thickness of the liquid crystal layer, Yh j represents the thickness of the liquid crystal layer in the jth region, and n represents the total number of sub-regions; The calculation formula of rotational viscosity coefficient is: ， Ya represents the rotational viscosity coefficient, r1 is the inner radius of the rheometer, r2 is the inner radius of the rheometer, and Yv is j represents the rotation speed of the liquid crystal sample in the jth region, Yn j represents the torque of the liquid crystal sample in the jth region, and n represents the total number of sub-regions; The calculation formula for the hardening shrinkage volume ratio is: ， FV represents the hardening shrinkage volume ratio, Fv k represents the curing shrinkage volume value of the kth region, V max represents the maximum value of the hardening shrinkage volume, and n represents the total number of sub-regions.

4. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The substrate material calculation unit is used for the substrate material mathematical model, and the data processed by the liquid crystal module preprocessing module is imported into the substrate material mathematical model to calculate the substrate material coefficient value, which is specifically expressed as: ， J represents the material coefficient of the substrate, JA represents the thermal expansion coefficient of the substrate, and Jw i represents the substrate transmittance of the ith region, Jt i represents the substrate flatness deviation value of the ith area, e represents a natural constant, and n represents the total number of sub-areas.

5. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The liquid crystal layer performance calculation unit is used to establish a liquid crystal layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the liquid crystal layer performance mathematical model, and calculate the energy storage liquid crystal layer performance coefficient value, which is specifically expressed as: ， Y represents the performance coefficient of the liquid crystal layer, YH represents the average thickness of the liquid crystal layer, and Yh j represents the thickness of the liquid crystal layer in the jth region, Yo j represents the pretilt angle of the liquid crystal molecules in the jth region, Ya represents the rotational viscosity coefficient, π represents a natural constant, e represents a natural constant, and n represents the total number of sub-regions.

6. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The encapsulation layer performance calculation unit is used to establish an encapsulation layer performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the encapsulation layer performance mathematical model, and calculate the liquid crystal layer performance coefficient value, which is specifically expressed as: ， F represents the performance coefficient of the liquid crystal layer, FV represents the hardening shrinkage volume ratio, and Fv k represents the curing shrinkage volume value of the kth region, Fm k represents the elastic modulus of the kth region, Ft k represents the water vapor transmission rate of the kth region, and n represents the total number of sub-regions.

7. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The environmental performance calculation unit is used to establish an environmental performance mathematical model, import the data processed by the liquid crystal module preprocessing module into the environmental performance mathematical model, and calculate the environmental performance coefficient value, which is specifically expressed as: ， H represents the environmental performance coefficient value, Hc z represents the high temperature storage rate of the zth region, Hc max Indicates the maximum value of high temperature storage rate in each sub-region, Hs z Indicates the flashing frequency of strong light in the zth area, Hg z represents the vibration resonance frequency of the z-th region, e represents a natural constant, and n represents the total number of sub-regions.

8. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The data analysis unit is used to establish a data analysis model, import the substrate material coefficient value, the liquid crystal layer performance coefficient value, the encapsulation layer performance coefficient value and the environmental performance coefficient value into the data analysis model, and calculate the comprehensive module performance abnormality index value, which is specifically expressed as: ， Wherein, P represents the comprehensive module performance abnormality index value, J represents the substrate material coefficient value, Y represents the liquid crystal layer performance coefficient value, F represents the liquid crystal layer performance coefficient value, H represents the environmental performance coefficient value, α1, α2, α3, α4 represent weight coefficients and are all greater than zero and less than one, and the sum of α1, α2, α3, α4 is equal to one, where μ represents other influencing factors of the comprehensive module performance abnormality index value.

9. The liquid crystal module performance testing system based on data analysis according to claim 1, characterized in that: The preset comprehensive module performance abnormality threshold is an average value obtained by evaluating the historical data in the database module; the specific judgment is as follows: The digital signal includes: an abnormal signal and a good signal; A1: If the comprehensive module performance abnormality index value is greater than the preset comprehensive module performance abnormality threshold, an abnormal signal is issued and transmitted to the early warning module; A2: If the comprehensive module performance abnormality index value is less than the preset comprehensive module performance abnormality threshold, a good signal is issued and the data is stored in the database module.

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