System, method and device for testing antistatic ability of solid state drive monomer

Abstract

The present application discloses a system, method and equipment for testing the antistatic ability of a solid-state hard disk unit; it relates to the technical field of antistatic ability testing. The system includes: an electrostatic shielding plate arranged in sequence along the long side direction of the test platform, an electrostatic generating device that can move along the guide rail, at least one SSD external device, a connection module, and a host computer; each SSD external device includes: a shell, a cover plate detachably connected to the shell, an adapter plate, and an electrostatic discharge simulation port arranged on the shell and the cover plate; the adapter plate is arranged in the accommodation space formed by the shell, and is used to insert a single solid-state hard disk to be tested; the host computer is electrically connected to the electrostatic generating device, and is electrically connected to the SSD external device through a connection module provided with a switch module; the host computer is used to execute a method for testing the antistatic ability of a solid-state hard disk unit. The present application can test the antistatic ability of a solid-state hard disk unit individually.

Description

Technical Field

[0001] The present application relates to the technical field of anti-static capability testing, and in particular to a system, method and device for testing the anti-static capability of a solid-state hard disk unit. Background Art

[0002] Solid State Drive (SSD) is a data storage device that uses flash memory technology to store data. Currently, the verification method of SSD anti-static ability relies more on evaluating the comprehensive anti-static ability of downstream products using SSD to measure the anti-static ability of the overall system. Specifically, the SSD is installed on desktop computers, laptops and other products, and then the anti-static test is carried out. This anti-static test solution also tests the anti-static ability of the motherboard, power supply and other components of the customer platform. It is a PC system-level test; it tests the system-level anti-static ability of components including SSD, motherboard, power supply, etc., and cannot evaluate the anti-static ability of SSD monomers. When there is a problem with the electrostatic test, it is impossible to determine whether it is caused by the SSD, the motherboard, or the power supply. In this case, when the electrostatic test of the entire system has a problem, it is particularly important for SSD module manufacturers to verify that there is no problem with their SSD products, otherwise the customer complaint cannot be resolved. Therefore, how to verify the anti-static ability of solid-state drives alone is an urgent problem to be solved. Summary of the invention

[0003] The present application aims to solve at least one of the technical problems existing in the prior art. To this end, the present application proposes a system, method and device for testing the antistatic ability of a solid-state drive monomer, which can test the antistatic ability of a solid-state drive monomer separately and provide reliable data evidence for verifying the antistatic ability of a solid-state drive monomer.

[0004] In a first aspect, an embodiment of the present application provides a system for testing the anti-static ability of a solid-state hard disk unit, comprising: an electrostatic shielding plate arranged in sequence along the long side direction of a test platform, an electrostatic generating device capable of moving along a guide rail, at least one SSD external device, a connection module, and a host computer; each of the SSD external devices comprises: a shell, a cover plate detachably connected to the shell, an adapter plate, and an electrostatic discharge simulation port arranged on the shell and the cover plate; the adapter plate is arranged in a housing space formed by the shell, and is used to insert a single solid-state hard disk to be tested; the host computer is electrically connected to the electrostatic generating device, and is also electrically connected to the SSD external device through the connection module provided with a switch module;

[0005] The host computer is used to: determine a first device identification number of a first target device to be tested and a first test task to be executed from candidate SSD external devices according to a test configuration file; control the switch module connected to the first target device to be turned on according to the first device identification number, control the switch module not connected to the first target device to be turned off, and control the electrostatic generating device to move and align with the first target device; control the electrostatic generating device to release static electricity to the first target device according to a first electrostatic release mode and a first test voltage level determined by the first test task; perform a preset number of electrostatic tests on a single solid-state hard disk to be tested in the first target device according to a preset number of times determined by the first test task, obtain a single anti-static ability test result of the solid-state hard disk, and complete the first test task.

[0006] According to some embodiments of the present application, the connection module includes: a signal interface extension unit, a power interface extension unit, a high-speed signal extension cable, and an SSD power extension cable;

[0007] The signal interface extension unit comprises a first connection end and a plurality of signal extension interfaces, wherein the first connection end is connected to the host computer signal interface of the host computer, and the signal extension interface is connected to the SSD signal interface of the SSD external device through the high-speed signal extension line;

[0008] The power interface extension unit comprises a second connection end and a plurality of power extension interfaces, wherein the second connection end is connected to the host computer power interface, and the power extension interface is connected to the SSD power interface of the SSD external device through the SSD power extension cable;

[0009] The switch module includes: a power control switch arranged on the SSD power extension line, and a signal control switch arranged on the high-speed signal extension line.

[0010] According to some embodiments of the present application, the electrostatic discharge simulation port includes: a power simulation switch, a matrix simulation keyboard, a USB simulation interface, and an HDMI simulation interface; the power simulation switch and the matrix simulation keyboard are arranged on the cover plate, and the USB simulation interface and the HDMI simulation interface are arranged on the side of the shell; the electrostatic discharge simulation port is used to: connect the accommodating space with the space where the electrostatic field generated by the electrostatic generating device is located.

[0011] According to some embodiments of the present application, the adapter board includes a plug-in module, and the plug-in module includes: an M.2 interface, an mSATA interface, and a 2.5-inch SATA3 interface.

[0012] According to some embodiments of the present application, the electrostatic generating device includes: an electrostatic generator and an electrostatic gun electrically connected to the electrostatic generator; the electrostatic generator is used to generate static electricity according to a first test voltage level determined by the first test task, and the electrostatic gun is used to release the generated static electricity.

[0013] In a second aspect, an embodiment of the present application provides a method for testing the antistatic capability of a solid-state hard disk unit, which is applied to a host computer of a system for testing the antistatic capability of a solid-state hard disk unit as described in any one of the embodiments of the first aspect; the system further includes: an electrostatic generating device, at least one SSD external device, and a connection module including a switch module; a single solid-state hard disk to be tested is inserted into the SSD external device;

[0014] The method comprises:

[0015] In response to the test start instruction, determining a first device identification number of a first target device to be tested and a first test task to be executed from candidate SSD external devices according to the test configuration file;

[0016] According to the first device identification number, controlling the switch module connected to the first target device to be turned on, controlling the switch module not connected to the first target device to be turned off, and controlling the electrostatic generating device to move and align with the first target device;

[0017] According to a first electrostatic discharge mode and a first test voltage level determined by the first test task, controlling the electrostatic generating device to discharge static electricity to the first target device;

[0018] According to the preset number of times determined by the first test task, a single solid state drive to be tested in the first target device is subjected to a preset number of electrostatic test processes to obtain a single antistatic ability test result of the solid state drive, thereby completing the first test task.

[0019] According to some embodiments of the present application, when there are multiple SSD external devices, the method further includes:

[0020] After completing the first test task, determining a test order from the test configuration file;

[0021] According to the test sequence, determining the second device identification number of the next second target device to be tested and the second test task to be executed from the candidate SSD external devices;

[0022] According to the second device identification number, controlling the switch module connected to the second target device to be turned on, controlling the switch module not connected to the second target device to be turned off, and controlling the electrostatic generating device to move and align with the second target device;

[0023] controlling the static electricity generating device to release static electricity to the second target device according to a second static electricity release mode and a second test voltage level determined by the second test task;

[0024] According to the preset number of times determined by the second test task, a single solid-state hard disk to be tested in the second target device is subjected to a preset number of electrostatic test processes to obtain a single antistatic ability test result of the solid-state hard disk, thereby completing the second test task;

[0025] When the corresponding test task is completed for the last SSD external device indicated by the test sequence, the automatic test ends.

[0026] According to some embodiments of the present application, the electrostatic test process is performed for a preset number of times to obtain the test result of the single antistatic ability of the solid state drive, including:

[0027] When performing each electrostatic test process, a write operation is performed to write the test data into a single solid-state hard disk to be tested, so that the solid-state hard disk stores the test data;

[0028] After completing the write operation, performing a read-back operation to read the test data stored in the solid state drive to obtain read-back data;

[0029] Performing data verification processing on the test data and the read-back data to determine the electrostatic test result, and completing an electrostatic test process;

[0030] Repeating the electrostatic test process for a preset number of times to obtain a plurality of electrostatic test results accordingly, and recording the plurality of electrostatic test results;

[0031] The monomer antistatic ability test result is generated according to the multiple electrostatic test results.

[0032] According to some embodiments of the present application, the step of performing data verification processing on the test data and the read-back data to determine the electrostatic test result includes:

[0033] Performing a first verification process on the test data to obtain a first verification value;

[0034] Performing a second verification process on the read-back data to obtain a second verification value; wherein the first verification process and the second verification process are performed based on the same preset verification algorithm;

[0035] When the first check value is equal to the second check value, the electrostatic test result is obtained as follows: the test is correct;

[0036] When the first verification value is not equal to the second verification value, the electrostatic test result is obtained as follows: the test is incorrect.

[0037] In a third aspect, an embodiment of the present application provides an electronic device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the method for testing the antistatic capability of a solid-state hard disk cell as described in any one of the embodiments of the second aspect is implemented.

[0038] An embodiment of the present application includes: a system for testing the anti-static ability of a solid-state hard disk unit, comprising: an electrostatic shielding plate arranged in sequence along the long side direction of a test platform, an electrostatic generating device capable of moving along a guide rail, at least one SSD external device, a connection module, and a host computer; each SSD external device includes: a shell, a cover plate detachably connected to the shell, an adapter plate, and an electrostatic discharge simulation port arranged on the shell and the cover plate; the adapter plate is arranged in a accommodating space formed by the shell, and is used to insert a single solid-state hard disk to be tested; the host computer is electrically connected to the electrostatic generating device, and is also electrically connected to the SSD external device through a connection module provided with a switch module. When it is necessary to test the single antistatic ability of the solid state drive, through the host computer, first, according to the test configuration file, determine the first device identification number of the first target device to be tested and the first test task to be executed from the candidate SSD external devices; secondly, according to the first device identification number, control the switch module connected to the first target device to be turned on, control the switch module not connected to the first target device to be turned off, and control the electrostatic generating device to move and align with the first target device; then, according to the first electrostatic release mode and the first test voltage level determined by the first test task, control the electrostatic generating device to release static electricity to the first target device; so as to test the single antistatic ability of the solid state drive separately; finally, according to the preset number of times determined by the first test task, perform a preset number of electrostatic tests on the single solid state drive to be tested in the first target device, obtain the single antistatic ability test result of the solid state drive, and complete the first test task. The single antistatic ability test result provides reliable data evidence for verifying the single antistatic ability of the solid state drive. That is to say, the embodiment of the present application can test the single antistatic ability of the solid state drive separately, and the single antistatic ability test result provides reliable data evidence for verifying the single antistatic ability of the solid state drive. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 It is a structural schematic diagram of a system for testing the antistatic ability of a solid-state hard disk unit provided by an embodiment of the present application;

[0040] Figure 2 This is a schematic diagram of the specific structure of a system for testing the antistatic capability of a solid-state hard disk unit provided by an embodiment of the present application;

[0041] Figure 3 is a schematic diagram of an electrostatic discharge simulation port on a housing provided by an embodiment of the present application;

[0042] Figure 4 is a schematic diagram of an electrostatic discharge simulation port on a cover provided by an embodiment of the present application;

[0043] Figure 5 is a schematic diagram of a plug-in module of an adapter board provided in one embodiment of the present application;

[0044] Figure 6 This is a schematic diagram of the steps of a method for testing the antistatic ability of a solid state drive monomer provided by an embodiment of the present application;

[0045] Figure 7 It is a schematic diagram of the hardware structure of an electronic device provided by an embodiment of the present application;

[0046] Reference numerals:

[0047] A system 100 for testing the antistatic ability of a solid state drive monomer, a test platform 110, an electrostatic shielding plate 120, a guide rail 130, an electrostatic generating device 140, an SSD external device 150, a connection module 160, and a host computer 170; a housing 151, a cover plate 152, an adapter plate 153, a plug-in module 1531, an M.2 interface A, an mSATA interface B, a 2.5-inch SATA3 interface C, an electrostatic discharge simulation port 154, a power simulation switch 1541, a matrix simulation keyboard 1542, a USB simulation interface 1543, and an HDMI simulation interface 1544; a switch module 161, a power control switch 1611, a signal control switch 1612, a high-speed signal extension cable 162, an SSD power extension cable 163, a signal interface extension unit 164, and a power interface extension unit 165. DETAILED DESCRIPTION

[0048] In order to make the objectives, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments.

[0049] It should be understood that in the description of the present application, the orientation descriptions, such as up, down, front, back, left, right, etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0050] It should be noted that although a logical order is shown in the flowchart in the description of the present application, in some cases, the steps shown or described may be performed in an order different from that in the flowchart. In the description of the present application, a number of means one or more, and a plurality of means two or more. The description of "first" and "second" is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0051] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein are only for the purpose of describing the embodiments of this application and are not intended to limit this application.

[0052] The present application discloses a system for testing the antistatic ability of a solid-state hard disk unit, a method for testing the antistatic ability of a solid-state hard disk unit, and an electronic device; and relates to the field of antistatic ability testing technology. The system includes: an electrostatic shielding plate arranged in sequence along the long side direction of the test platform, an electrostatic generating device that can move along the guide rail, at least one SSD external device, a connection module, and a host computer; each SSD external device includes: a shell, a cover plate detachably connected to the shell, an adapter plate, and an electrostatic discharge simulation port arranged on the shell and the cover plate; the adapter plate is arranged in the accommodation space formed by the shell, and is used to insert a single solid-state hard disk to be tested; the host computer is electrically connected to the electrostatic generating device, and is electrically connected to the SSD external device through a connection module provided with a switch module; the host computer is used to execute a method for testing the antistatic ability of a solid-state hard disk unit. The present application can test the antistatic ability of a solid-state hard disk unit individually, and provide reliable data evidence for verifying the antistatic ability of a solid-state hard disk unit.

[0053] The embodiments of the present application are further described below in conjunction with the accompanying drawings.

[0054] like Figure 1As shown, in the first aspect, an embodiment of the present application provides a system 100 for testing the anti-static ability of a solid-state hard disk unit, comprising: a test platform 110, an electrostatic shielding plate 120 arranged in sequence along the long side direction of the test platform 110, an electrostatic generating device 140 capable of moving along a guide rail 130, at least one SSD external device 150, a connection module 160, and a host computer 170; each SSD external device 150 comprises: a shell 151, a cover plate 152 detachably connected to the shell 151, an adapter plate 153, and an electrostatic discharge simulation port 154 arranged on the shell 151 and the cover plate 152; the adapter plate 153 is arranged in the accommodating space formed by the shell 151, and is used to insert a single solid-state hard disk to be tested; the host computer 170 is electrically connected to the electrostatic generating device 140, and is also electrically connected to the SSD external device 150 through the connection module 160 provided with a switch module 161.

[0055] Furthermore, the electrostatic shielding plate 120, the electrostatic generating device 140, the SSD external device 150, the connecting module 160, and the host computer 170 provided in the embodiment of the present application are described in sequence.

[0056] It can be understood that the electrostatic shielding plate 120 is used to: shield the external electric field, reduce the interference of external electromagnetic to the electrostatic test processing performed on the test platform 110, and improve the reliability of the test; at the same time, in an electrostatic sensitive environment, the electrostatic shielding plate 120 can reduce the risk of electrostatic discharge (ESD) causing harm to personnel and other equipment.

[0057] According to some embodiments of the present application, the electrostatic generating device 140 includes: an electrostatic generator, and an electrostatic gun electrically connected to the electrostatic generator; the electrostatic generator is used to generate static electricity according to a first test voltage level determined by a first test task, and the electrostatic gun is used to release the generated static electricity. It should be noted that the muzzle of the electrostatic gun is a discharge point.

[0058] In some embodiments, the electrostatic generating device 140 further includes: a manipulator, the movable end of which is fixedly connected to the electrostatic gun, and can move the electrostatic gun under the control of the host computer 170. Specifically, the electrostatic discharge mode includes a contact discharge mode and / or an air discharge mode; when the electrostatic discharge mode is the contact discharge mode, the manipulator is controlled to clamp the electrostatic gun and move the electrostatic gun so that the muzzle of the electrostatic gun contacts the target discharge position on the SSD external device 150 for discharge, so as to perform an electrostatic test process in the contact discharge mode; when the electrostatic mode is the air discharge mode, the manipulator is controlled not to move the electrostatic gun, and the electrostatic gun remains in place, so that the muzzle of the electrostatic gun discharges to the spatial area where the SSD external device 150 is located, so as to perform an electrostatic test process in the air discharge mode.

[0059] like Figure 1As shown, in some embodiments, the system 100 for testing the antistatic ability of a solid-state hard disk unit further includes: a guide rail 130, the guide rail 130 is parallel to the wide side of the test platform 110; the guide rail 130 is slidably connected to the electrostatic generating device 140. The guide rail 130 is used to limit the moving range of the electrostatic generating device 140, and enables the electrostatic generating device 140 to move smoothly. Specifically, through the guide rail 130, the electrostatic generating device 140 can also be moved along the guide rail 130 to the test position aligned with the SSD external device 150 to be tested under the drive control of the host computer 170, so as to release static electricity to the SSD external device 150 to be tested, and form an electrostatic field for electrostatic testing.

[0060] According to some embodiments of the present application, each SSD external device 150 includes: a shell 151, a cover 152 detachably connected to the shell 151, an adapter plate 153, and an electrostatic discharge simulation port 154 arranged on the shell 151 and the cover 152; the adapter plate 153 is arranged in the accommodating space formed by the shell 151, and is used to insert a single solid-state hard disk to be tested.

[0061] It is understandable that when the system-level electrostatic test fails and the antistatic ability test of the solid-state drive cannot be defined, the solid-state drive is separated from other modules of the laptop computer, the cover 152 of the SSD external device 150 provided in the embodiment of the present application, which is detachably connected to the housing 151, is opened, the separated solid-state drive to be tested is inserted into the adapter plate 153, and the cover 152 is fixedly connected to the housing 151 to simulate the use environment of the laptop computer, and the single-unit antistatic ability of the solid-state drive can be verified separately to be normal or abnormal. After completing the test of a solid-state drive, the cover 152 is opened, and the new solid-state drive to be tested is plugged in and replaced, and the single-unit antistatic ability test of the new solid-state drive to be tested is continued.

[0062] Specifically, the housing 151 and the cover plate 152 are detachably connected by screw connection. Specifically, in the screw connection method adopted in the embodiment of the present application, a screw connection hole is separately opened on the four corners of the cover plate 152 to achieve detachable connection.

[0063] According to some embodiments of the present application, Figure 3 and Figure 4 As shown, the electrostatic discharge simulation port 154 includes: a power simulation switch 1541, a matrix simulation keyboard 1542, a USB simulation interface 1543, and an HDMI simulation interface 1544; the power simulation switch 1541 and the matrix simulation keyboard 1542 are arranged on the cover plate 152, and the USB simulation interface 1543 and the HDMI simulation interface 1544 are arranged on the side of the shell 151; the electrostatic discharge simulation port 154 is used to: connect the accommodating space with the space where the electrostatic field generated by the electrostatic generating device 140 is located.

[0064] It should be noted that in real usage scenarios, the solid-state hard drive is installed in the host of a laptop computer, and electrostatic discharge in the laptop computer mostly comes from the keyboard, switch buttons, USB interface, and HDMI interface. Therefore, the embodiment of the present application simulates the real usage scenario of the solid-state hard drive by setting an electrostatic discharge simulation port 154 on the shell 151 and the substrate, thereby improving the reliability of testing the anti-static ability of the solid-state hard drive unit.

[0065] It is understandable that the material of the SSD external device 150 provided in the embodiment of the present application is the same as the material used in the notebook computer and has a similar appearance, so as to further improve the reliability of simulating the real usage scenario of the solid state drive.

[0066] According to some embodiments of the present application, Figure 5 As shown, the adapter board 153 includes a plug-in module 1531, and the plug-in module 1531 includes: an M.2 interface A, an mSATA interface B, and a 2.5-inch SATA3 interface C. The embodiment of the present application sets interfaces of different sizes and models on the adapter board 153, so that different models of solid-state hard disks can be plugged in and the antistatic ability test of different models of solid-state hard disks can be performed; the universality of the SSD external device 150 provided in the embodiment of the present application is effectively improved.

[0067] According to some embodiments of the present application, the SSD external device 150 further includes: an SSD power interface and an SSD signal interface. The SSD power interface and the SSD signal interface are both electrically connected to the adapter board 153. Specifically, the SSD power interface provides power to the solid state drive to be tested, and the SSD signal interface realizes communication interaction between the host computer 170 and the solid state drive to be tested, so as to complete the single antistatic ability test.

[0068] According to some embodiments of the present application, Figure 2 As shown, the connection module 160 includes: a signal interface expansion unit 164, a power interface expansion unit 165, a high-speed signal extension line 162 and an SSD power extension line 163. Specifically, the signal interface expansion unit 164 includes a first connection end and a plurality of signal expansion interfaces, the first connection end is connected to the host computer 170 signal interface of the host computer 170, and the signal expansion interface is connected to the SSD signal interface of the SSD external device 150 through the high-speed signal extension line 162; the power interface expansion unit 165 includes a second connection end and a plurality of power expansion interfaces, the second connection end is connected to the host computer 170 power interface, and the power expansion interface is connected to the SSD power interface of the SSD external device 150 through the SSD power extension line 163; the switch module 161 includes: a power control switch 1611 arranged on the SSD power extension line 163, and a signal control switch 1612 arranged on the high-speed signal extension line 162. It should be noted that, Figure 2 In the figure, the high-speed signal extension line 162 is represented by a dotted line, and the SSD power extension line 163 is represented by a solid line.

[0069] The embodiment of the present application realizes external connection of the solid-state hard disk through the connection module 160, separates it from the notebook computer mainboard, power supply and other components, and realizes the single-body antistatic ability test and verification of the solid-state hard disk.

[0070] It can be understood that the power control switch 1611 is used to control the on-off state of the power supply path provided by the SSD power extension line 163 between the SSD external device 150 and the host computer 170, and the signal control switch 1612 is used to control the on-off state of the signal path provided by the high-speed signal extension line 162 between the SSD external device 150 and the host computer 170.

[0071] It is understandable that the power interface and signal interface of the host computer 170 are limited. Without interface expansion, only one SSD external device 150 can be connected. When there is only one SSD external device 150 but multiple solid-state hard disks to be tested, when the single antistatic ability test of a solid-state hard disk is completed, the tester needs to wait aside to replace the solid-state hard disk in time, which wastes a certain amount of manpower cost. By setting the signal interface expansion unit 164 and the power interface expansion unit 165, the power interface and signal interface of the host computer 170 are expanded, so that it can be connected to multiple SSD external devices 150 based on one host computer 170. However, it should be noted that when performing the single antistatic ability test of the solid-state hard disk, it can only be performed between one host computer 170 and one SSD external device 150. After completing the anti-static ability test of a single solid-state hard disk between a host computer 170 and an SSD external device 150, the next SSD external device 150 is automatically switched to communicate with a host computer 170 to automatically perform the anti-static ability test of the single solid-state hard disk; thereby reducing labor costs and improving test efficiency to a certain extent.

[0072] Specifically, the host computer 170 is equipped with H2test test software, which can perform full disk read, write and verification operations on the solid state drive until the electrostatic test is completed. Specifically, during the entire anti-static ability test process, the H2test test software does not report an error, which proves that the single unit anti-static ability of the solid state drive to be tested is good.

[0073] The host computer 170 is used to: determine the first device identification number of a first target device to be tested and the first test task to be executed from the candidate SSD external device 150 according to the test configuration file; control the switch module 161 connected to the first target device to be turned on according to the first device identification number, control the switch module 161 not connected to the first target device to be turned off, and control the electrostatic generating device 140 to move and align with the first target device; according to the first electrostatic release mode and the first test voltage level determined by the first test task, control the electrostatic generating device 140 to release static electricity to the first target device; according to the preset number of times determined by the first test task, perform a preset number of electrostatic tests on a single solid-state hard disk to be tested in the first target device, obtain the test result of the single antistatic ability of the solid-state hard disk, and complete the first test task. The system 100 for testing the antistatic ability of a single solid-state hard disk provided in the present application can test the single antistatic ability of a solid-state hard disk separately, and provide reliable data evidence for verifying the single antistatic ability of a solid-state hard disk.

[0074] Those skilled in the art will appreciate that the system structure shown in the figure does not constitute a limitation on the embodiments of the present application, and may include more or fewer components than shown in the figure, or a combination of certain components, or a different arrangement of components.

[0075] The system embodiments described above are merely illustrative, and the units described as separate components may or may not be physically separated, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present embodiment.

[0076] Those skilled in the art will appreciate that the system architecture and application scenarios described in the embodiments of the present application are intended to more clearly illustrate the technical solutions of the embodiments of the present application, and do not constitute a limitation on the technical solutions provided in the embodiments of the present application. Those skilled in the art will appreciate that with the evolution of the system architecture and the emergence of new application scenarios, the technical solutions provided in the embodiments of the present application are equally applicable to similar technical problems.

[0077] Based on the above system structure, various embodiments of the method for testing the antistatic ability of a solid state drive monomer of the present application are proposed below.

[0078] Second, as Figure 6 As shown, the method for testing the antistatic ability of a solid state drive monomer can be applied to Figure 1In the host computer of the system for testing the anti-static ability of a solid-state hard disk unit shown, the system also includes: an electrostatic generating device, at least one SSD external device, and a connecting module including a switch module; a single solid-state hard disk to be tested is inserted into the SSD external device; the method for testing the anti-static ability of a solid-state hard disk unit may include but is not limited to steps S110 to S140.

[0079] Step S110: In response to the test start instruction, a first device identification number of a first target device to be tested and a first test task to be executed are determined from candidate SSD external devices according to the test configuration file.

[0080] Step S120: According to the first device identification number, the switch module connected to the first target device is controlled to be turned on, the switch module not connected to the first target device is controlled to be turned off, and the electrostatic generating device is controlled to move and align with the first target device.

[0081] Step S130: controlling the static electricity generating device to release static electricity to the first target device according to the first static electricity release mode and the first test voltage level determined by the first test task.

[0082] Step S140: performing an electrostatic test process for a preset number of times on a single solid state drive to be tested in the first target device according to the preset number of times determined by the first test task, obtaining a single antistatic ability test result of the solid state drive, and completing the first test task.

[0083] It is understandable that the tester operates on the configuration interface provided by the host computer to configure and generate a test configuration file, which includes at least one test task to be executed; different test tasks test different objects. The device identification number of each target device to be tested corresponds to the test task to be executed.

[0084] Specifically, the test tasks include: electrostatic discharge mode, test voltage level, preset test times; electrostatic discharge mode includes: contact discharge mode and / or air discharge mode. The test voltage level can be ±2KV or ±4KV or other voltage values. The preset test times can be determined by the actual test requirements, and this application does not impose specific restrictions on the value of the preset test times.

[0085] It is understandable that each SSD external device has a unique device identification number for distinguishing different SSD external devices.

[0086] It is understandable that when the test start control provided by the operation interface of the host computer is triggered by the tester, a test start instruction will be issued, and the host computer will perform the antistatic ability test of the solid state drive unit in response to the test start instruction.

[0087] Step S130 and step S140 are further described.

[0088] Specifically, Example 1: When the first electrostatic release mode is the contact discharge mode; the test voltage level is ±2KV; the preset number of tests is 20 times; first, the robot is controlled to clamp the electrostatic gun, and the electrostatic gun is moved so that the muzzle of the electrostatic gun contacts the target discharge position on the SSD external device, and the electrostatic gun is controlled to discharge when the test voltage level is +2KV to achieve contact discharge; then, the solid-state hard disk is subjected to 20 electrostatic tests; then, the muzzle of the electrostatic gun is maintained at the target discharge position of the SSD external device, the test voltage level is changed to -2KV, the electrostatic gun is controlled to discharge when the test voltage level is -2KV, and the solid-state hard disk is subjected to 20 electrostatic tests to complete the first test task.

[0089] Specifically, Example 2: When the first electrostatic release mode is: air discharge mode; the test voltage level is ±2KV; the preset number of tests is 20 times; first, the manipulator is controlled not to move the electrostatic gun, and the electrostatic gun remains in place to discharge; when the test voltage level is +2KV, the electrostatic gun discharges the spatial area where the SSD external device is located through the muzzle of the electrostatic gun to achieve air discharge; then, the solid-state hard disk is subjected to 20 electrostatic tests; then, the electrostatic gun is not moved and is kept in place, the test voltage level is changed to -2KV, and the electrostatic gun is controlled to discharge the spatial area where the SSD external device is located through the muzzle of the electrostatic gun when the test voltage level is -2KV, and the solid-state hard disk is subjected to 20 electrostatic tests to complete the first test task.

[0090] Specifically, when the first electrostatic discharge mode is: contact discharge mode and air discharge mode, the test voltage levels are ±4KV and ±8KV; the preset number of tests is 10 times. First, refer to Example 1, when the test voltage level is +4KV, complete 20 electrostatic test processes in the contact discharge mode, and when the test voltage level is -4KV, complete the electrostatic test process in the contact discharge mode; then, refer to Example 2, when the test voltage level is +8KV, complete 20 electrostatic test processes in the air discharge mode, and when the test voltage level is -8KV, complete 20 electrostatic test processes in the air discharge mode; at this point, the first test task is completed.

[0091] Through steps S110 to S140, when it is necessary to test the single antistatic ability of the solid state drive, the host computer firstly responds to the test start instruction and determines the first device identification number of a first target device to be tested and the first test task to be executed from the candidate SSD external devices according to the test configuration file; secondly, according to the first device identification number, the switch module connected to the first target device is controlled to be turned on, the switch module not connected to the first target device is controlled to be turned off, and the electrostatic generating device is controlled to move and align with the first target device; then, according to the first electrostatic release mode and the first test voltage level determined by the first test task, the electrostatic generating device is controlled to release static electricity to the first target device; finally, according to the preset number of times determined by the first test task, the single solid state drive to be tested in the first target device is subjected to the preset number of electrostatic test processing, and the single antistatic ability test result of the solid state drive is obtained, and the first test task is completed. Therefore, the embodiment of the present application can test the single antistatic ability of the solid state drive separately, and the single antistatic ability test result provides reliable data evidence for verifying the single antistatic ability of the solid state drive.

[0092] According to some embodiments of the present application, when there are multiple SSD external devices, after step S140, the method for testing the antistatic ability of a solid state drive unit further includes but is not limited to steps S210 to S260.

[0093] Step S210: After completing the first test task, determine the test sequence from the test configuration file.

[0094] Step S220: Determine the second device identification number of the next second target device to be tested and the second test task to be executed from the candidate SSD external devices according to the test sequence.

[0095] Step S230: According to the second device identification number, the switch module connected to the second target device is controlled to be turned on, the switch module not connected to the second target device is controlled to be turned off, and the electrostatic generating device is controlled to move and align with the second target device.

[0096] Step S240: controlling the static electricity generating device to release static electricity to the second target device according to the second static electricity release mode and the second test voltage level determined by the second test task.

[0097] Step S250: According to the preset number of times determined by the second test task, a single solid state drive to be tested in the second target device is subjected to an electrostatic test process for a preset number of times, and a single antistatic ability test result of the solid state drive is obtained, thereby completing the second test task.

[0098] Step S260: When the corresponding test task of the last SSD external device indicated by the test sequence is completed, the automatic test ends.

[0099] It is understandable that when there are multiple solid-state drives that need to be tested, the tester will insert the multiple solid-state drives into the corresponding SSD external devices and wait for testing. The test configuration file also includes the test sequence; the test sequence is also configured by the tester through the configuration interface of the host computer. Specifically, the configuration test sequence is: SSD external device 1, SSD external device 2, SSD external device n, and so on.

[0100] Specifically, when the test of the solid-state hard disk in the SSD external device 1 is completed, the SSD external device 2 is determined to be the next second target device to be tested, the switch module connected to the second target device is turned on, and the remaining switch modules not connected to the second target device are turned off, so as to establish a communication path between the second target device and the host computer, in preparation for the anti-static ability test of the solid-state hard disk unit.

[0101] Through steps S210 to S260, the present application can automatically and sequentially perform single-cell anti-static capacity tests on solid-state hard disks in multiple SSD external devices based on the test sequence of the test configuration file; thereby reducing labor costs and improving test efficiency to a certain extent.

[0102] According to some embodiments of the present application, step S150 and step S250 are further described, and a preset number of electrostatic test processes are performed to obtain a single antistatic ability test result of the solid state drive, including but not limited to steps S310 to S350.

[0103] Step S310: When performing each electrostatic test process, a write operation is performed to write the test data into a single solid state drive to be tested, so that the solid state drive stores the test data.

[0104] Step S320: After the write operation is completed, a read-back operation is performed to read the test data stored in the solid state drive to obtain read-back data.

[0105] Step S330: Perform data verification processing on the test data and the read-back data to determine the electrostatic test result, and complete an electrostatic test process.

[0106] Step S340: Repeat the electrostatic test process for a preset number of times, obtain a plurality of electrostatic test results accordingly, and record the plurality of electrostatic test results.

[0107] Step S350: generating a monomer antistatic ability test result according to a plurality of electrostatic test results.

[0108] According to some embodiments of the present application, step S330 is further described, wherein data verification processing is performed on the test data and the read-back data to determine the electrostatic test result, including: performing a first verification processing on the test data to obtain a first verification value; performing a second verification processing on the read-back data to obtain a second verification value; wherein the first verification processing and the second verification processing are performed based on the same preset verification algorithm; when the first verification value is equal to the second verification value, the electrostatic test result is obtained: the test is correct; when the first verification value is not equal to the second verification value, the electrostatic test result is obtained: the test is incorrect.

[0109] Specifically, the preset verification algorithm may be a cyclic redundancy check or a secure hash algorithm. It should be noted that there are many algorithms for data verification, and CRC or SHA are only two major categories. Therefore, this application does not make specific restrictions on the type of preset verification algorithm used.

[0110] To further illustrate step S350, in some embodiments, when the electrostatic test result is: the test is incorrect, the host computer reports an error once. When the host computer reports an error once, it is judged that the single-cell antistatic ability of the solid-state hard disk is abnormal; the more times the error is reported, the worse the single-cell antistatic ability of the solid-state hard disk is. The single-cell antistatic ability test results can be judged and generated through multiple electrostatic test results; the single-cell antistatic ability test results are used to measure the single-cell antistatic ability of the solid-state hard disk. Specifically, when all of the multiple electrostatic test results are: the test is correct, it is judged that the single-cell antistatic ability of the solid-state hard disk is normal; when one of the multiple electrostatic test results is an electrostatic test result that the test is incorrect, it is judged that the single-cell antistatic ability of the solid-state hard disk is abnormal, and the more times the test is incorrect, the worse the single-cell antistatic ability of the solid-state hard disk is.

[0111] Through step S310 to step S350, the read and write operations and the verification operations are completed on the solid state drive, and multiple electrostatic test results are obtained based on multiple electrostatic test processes to generate single antistatic ability test results, thereby measuring the single antistatic ability of the solid state drive. When the system antistatic ability test fails, the single antistatic ability test result can provide data evidence for the SSD antistatic.

[0112] like Figure 7 As shown, the present invention also provides an electronic device, including:

[0113] The processor 701 may be implemented by a general-purpose central processing unit (CPU), a microprocessor, an application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of the present application;

[0114] The memory 702 can be implemented in the form of a read-only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM). The memory 702 can store an operating system and other application programs. When the technical solution provided in the embodiment of this specification is implemented by software or firmware, the relevant program code is stored in the memory 702, and the processor 701 calls and executes the method for testing the antistatic ability of a solid-state hard disk monomer in the embodiment of this application;

[0115] Input / output interface 703, used to implement information input and output;

[0116] Communication interface 704, used to realize communication interaction between the present apparatus and other devices, which can be realized by wired means (such as USB, network cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.);

[0117] A bus 705 that transmits information between various components of the device (e.g., the processor 701, the memory 702, the input / output interface 703, and the communication interface 704);

[0118] The processor 701 , the memory 702 , the input / output interface 703 and the communication interface 704 are connected to each other in communication within the device via a bus 705 .

[0119] An embodiment of the present application also provides a storage medium, which is a computer-readable storage medium. The storage medium stores a computer program, and when the computer program is executed by a processor, the method for testing the antistatic ability of a solid-state hard disk unit is implemented.

[0120] As a non-transient computer-readable storage medium, the memory can be used to store non-transient software programs and non-transient computer executable programs. In addition, the memory may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage devices. In some embodiments, the memory may optionally include a memory remotely arranged relative to the processor, and these remote memories may be connected to the processor via a network. Examples of the above-mentioned networks include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and a combination thereof. The device embodiments described above are merely schematic, wherein the units described as separate components may or may not be physically separated, and are implemented to be located in one place, or may also be distributed to multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present embodiment.

[0121] It will be appreciated by those skilled in the art that all or some of the steps and systems in the methods disclosed above may be implemented as software, firmware, hardware, and appropriate combinations thereof. Some or all physical components may be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software may be distributed on a computer-readable medium, which may include a computer storage medium (or non-transitory medium) and a communication medium (or transient medium). As known to those skilled in the art, the term computer storage medium includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data). Computer storage media include, but are not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disk (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, it is well known to those skilled in the art that communication media typically include computer readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0122] The above is a specific description of the preferred implementation of the present application, but the present application is not limited to the above-mentioned implementation mode. Technical personnel familiar with the field can also make various equivalent deformations or substitutions without violating the spirit of the present application. These equivalent deformations or substitutions are all included in the scope defined by the present application.

Claims

1. A system for testing the antistatic ability of a solid state drive monomer, characterized in that: include: An electrostatic shielding plate, an electrostatic generating device capable of moving along a guide rail, at least one SSD external device, a connection module, and a host computer are sequentially arranged along the long side direction of the test platform; Each of the SSD external devices comprises: a shell, a cover plate detachably connected to the shell, an adapter plate, and an electrostatic discharge simulation port arranged on the shell and the cover plate; the adapter plate is arranged in the accommodating space formed by the shell, and is used to insert a single solid-state hard disk to be tested; the host computer is electrically connected to the electrostatic generating device, and is also electrically connected to the SSD external device through the connecting module provided with a switch module; the electrostatic discharge simulation port comprises: a power simulation switch, a matrix simulation keyboard, a USB simulation interface, and an HDMI simulation interface; the power simulation switch and the matrix simulation keyboard are arranged on the cover plate, and the USB simulation interface and the HDMI simulation interface are arranged on the side of the shell; the electrostatic discharge simulation port is used to: connect the accommodating space with the space where the electrostatic field generated by the electrostatic generating device is located; The host computer is used to: determine a first device identification number of a first target device to be tested and a first test task to be executed from candidate SSD external devices according to a test configuration file; control the switch module connected to the first target device to be turned on according to the first device identification number, control the switch module not connected to the first target device to be turned off, and control the electrostatic generating device to move and align with the first target device; control the electrostatic generating device to release static electricity to the first target device according to a first electrostatic release mode and a first test voltage level determined by the first test task; perform a preset number of electrostatic tests on a single solid-state hard disk to be tested in the first target device according to a preset number of times determined by the first test task, obtain a single anti-static ability test result of the solid-state hard disk, and complete the first test task.

2. The system for testing the antistatic ability of a solid state drive monomer according to claim 1, characterized in that: The connection module includes: a signal interface extension unit, a power interface extension unit, a high-speed signal extension line and an SSD power extension line; The signal interface extension unit comprises a first connection end and a plurality of signal extension interfaces, wherein the first connection end is connected to the host computer signal interface of the host computer, and the signal extension interface is connected to the SSD signal interface of the SSD external device through the high-speed signal extension line; The power interface extension unit comprises a second connection end and a plurality of power extension interfaces, wherein the second connection end is connected to the host computer power interface, and the power extension interface is connected to the SSD power interface of the SSD external device through the SSD power extension cable; The switch module includes: a power control switch arranged on the SSD power extension line, and a signal control switch arranged on the high-speed signal extension line.

3. The system for testing the antistatic ability of a solid state drive monomer according to claim 1, characterized in that: The adapter board includes a plug-in module, and the plug-in module includes: an M.2 interface, an mSATA interface, and a 2.5-inch SATA3 interface.

4. The system for testing the antistatic ability of a solid state drive monomer according to claim 1, characterized in that: The static electricity generating device includes: a static electricity generator and a static electricity gun electrically connected to the static electricity generator; the static electricity generator is used to generate static electricity according to a first test voltage level determined by the first test task, and the static electricity gun is used to release the generated static electricity.

5. A method for testing the antistatic ability of a solid state hard disk unit, characterized in that: A system for testing the antistatic ability of a solid state drive monomer as claimed in any one of claims 1 to 4; the system further comprising: an electrostatic generating device, at least one SSD external device, and a connecting module including a switch module; a single solid state drive to be tested is inserted into the SSD external device; The method comprises: In response to the test start instruction, determining a first device identification number of a first target device to be tested and a first test task to be executed from candidate SSD external devices according to the test configuration file; According to the first device identification number, controlling the switch module connected to the first target device to be turned on, controlling the switch module not connected to the first target device to be turned off, and controlling the electrostatic generating device to move and align with the first target device; According to a first electrostatic discharge mode and a first test voltage level determined by the first test task, controlling the electrostatic generating device to discharge static electricity to the first target device; According to the preset number of times determined by the first test task, a single solid state drive to be tested in the first target device is subjected to a preset number of electrostatic test processes to obtain a single antistatic ability test result of the solid state drive, thereby completing the first test task.

6. The method for testing the antistatic ability of a solid state drive monomer according to claim 5, characterized in that: When there are multiple SSD external devices, the method further includes: After completing the first test task, determining a test order from the test configuration file; According to the test sequence, determining the second device identification number of the next second target device to be tested and the second test task to be executed from the candidate SSD external devices; According to the second device identification number, controlling the switch module connected to the second target device to be turned on, controlling the switch module not connected to the second target device to be turned off, and controlling the electrostatic generating device to move and align with the second target device; controlling the static electricity generating device to release static electricity to the second target device according to a second static electricity release mode and a second test voltage level determined by the second test task; According to the preset number of times determined by the second test task, a single solid-state hard disk to be tested in the second target device is subjected to a preset number of electrostatic test processes to obtain a single antistatic ability test result of the solid-state hard disk, thereby completing the second test task; When the corresponding test task is completed for the last SSD external device indicated by the test sequence, the automatic test ends.

7. The method for testing the antistatic ability of a solid state drive monomer according to claim 5 or 6, characterized in that: The electrostatic test process is performed for a preset number of times to obtain the test result of the single antistatic ability of the solid state drive, including: When performing each electrostatic test process, a write operation is performed to write the test data into a single solid-state hard disk to be tested, so that the solid-state hard disk stores the test data; After completing the write operation, performing a read-back operation to read the test data stored in the solid state drive to obtain read-back data; Performing data verification processing on the test data and the read-back data to determine the electrostatic test result, and completing an electrostatic test process; Repeating the electrostatic test process for a preset number of times to obtain a plurality of electrostatic test results accordingly, and recording the plurality of electrostatic test results; The monomer antistatic ability test result is generated according to the multiple electrostatic test results.

8. The method for testing the antistatic ability of a solid state drive monomer according to claim 7, characterized in that: The performing data verification processing on the test data and the read-back data to determine the electrostatic test result includes: Performing a first verification process on the test data to obtain a first verification value; Performing a second verification process on the read-back data to obtain a second verification value; wherein the first verification process and the second verification process are performed based on the same preset verification algorithm; When the first check value is equal to the second check value, the electrostatic test result is obtained as follows: the test is correct; When the first verification value is not equal to the second verification value, the electrostatic test result is obtained as follows: the test is incorrect.

9. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method for testing the antistatic capability of a solid state drive monomer as described in any one of claims 5 to 8 when executing the computer program.

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