OLED binding offset detection and particle detection device and method

By designing OLED binding offset detection and particle detection devices, using elastic flattening mechanism and focus-chasing system, the detection accuracy problem caused by OLED flexibility is solved, high-precision binding offset and particle detection is achieved, and production is improved quality.

CN119413795APending Publication Date: 2025-02-11HEFEI SHANGJU IND EQUIP
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Patent Information

Application Number
CN202411769127.X
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-04
Publication Date
2025-02-11

AI Technical Summary

Technical Problem

During the binding process, OLED has different imaging differences due to its softness, resulting in offsets and particles that cannot be accurately detected. Existing equipment is not effective when applied to OLED inspection.

Method used

An OLED binding offset detection and particle detection device is designed, including a stage, an elastic flattening mechanism and a visual system, and a focus pursuit system and an offset light source are used to achieve high-precision detection of the OLED binding area.

Benefits of technology

Through the combination of the flattening mechanism and the focus-chasing system, the imaging difference problem caused by OLED flexibility is solved, and the accurate detection of binding offsets and particles is achieved, which improves the detection accuracy and production quality.

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Abstract

The invention provides an OLED binding offset detection and particle detection device and method, and the device comprises a carrying platform which is provided with an inspection hole, is disposed on a Y-axis linear module, and is used for carrying a to-be-detected OLED product; the elastic flattening mechanism is arranged above the carrying table and is used for stably pressing the binding area of the OLED; the particle detection camera is connected to the X-axis linear module through a hanging frame and located below the flattening mechanism, and a focus tracking system is arranged on the particle detection camera; the offset detection camera is connected with the X-axis linear module through a hanging frame and located below the flattening mechanism. According to the invention, through the design of the flattening mechanism, the problem of inaccurate offset caused by flexibility in the OLED binding process is effectively solved, and the precision and stability of binding inspection are improved.
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Description

Technical Field

[0001] The present invention relates to the technical field of binding detection equipment, and in particular to an OLED binding offset detection and particle detection device and method. Background Art

[0002] In the manufacturing process of display panels, the BONDING process plays a core role, which ensures the precise connection between the display panel and the external drive or control signal. The realization of this connection depends on the high-precision pressing between the display panel and the flexible wiring substrate or driver chip. However, factors such as mechanical errors and material deformation often introduce offsets during the BONDING process, which adversely affects the final display effect and performance of the product.

[0003] The current post-binding precision inspection equipment on the market mainly relies on CCD technology to capture the mark on the panel and the mark on the chip on the film, and implements the inspection by accurately calculating the distance between the two and the spacing of the transparent conductive oxide bumps (ITO Bump). Unfortunately, this type of equipment faces challenges when applied to OLED inspection, because the softness of the OLED material itself causes the product to float easily, making it difficult to conduct effective and accurate inspections.

[0004] Since the particle size (the diameter of the ACF glue particles used in OLED products is about 0.002-0.003mm) and the line width (usually about 0.015-0.03mm) are extremely small, it is usually necessary to use a 5-10x microscope objective for observation. However, in this case, the depth of field is limited to 0.03-0.08mm. Due to the soft nature of the product, the focal length has a large range of variation, and reflections occur (such as Figure 1 ), affecting the detection effect. Summary of the invention

[0005] To solve the above defects, the present invention provides an OLED binding offset detection and particle detection device and method, which can automatically, efficiently and accurately complete the detection of OLED binding offset, thereby improving the production quality and efficiency of OLED.

[0006] In a first aspect, the present invention provides an OLED binding offset detection and particle detection device, which includes: a carrier, which is equipped with an inspection hole and installed on a Y-axis linear module, and is used to carry an OLED product to be detected; an elastic flattening mechanism, which is arranged above the carrier, and is used to firmly press the binding area of ​​the OLED; a particle detection camera, which is connected to the X-axis linear module through a bracket and is located below the flattening mechanism, and a focus tracking system is provided on the particle detection camera; an offset detection camera, which is connected to the X-axis linear module through a bracket and is located below the flattening mechanism.

[0007] In one embodiment of the present invention, the elastic flattening mechanism includes: a flattening steel frame; a cylinder, which is arranged at one end of the flattening steel frame; a flattening base plate, the top of which is connected to the cylinder, and the bottom of which is provided with a first through groove, and fixing holes are evenly distributed on both sides of the first through groove; a pressure plate component, the top of which is installed in the first through groove and connected to the fixing holes through fixing bolts, and the lower part of the pressure plate component is equipped with a flexible pressure plate, and the bottom of the flexible pressure plate is provided with a first bottom plate and a second bottom plate, and a second through groove is formed between the two.

[0008] In one embodiment of the present invention, a spring installation groove is provided on the top of the pressure plate component, and a spring member is provided in the spring installation groove.

[0009] In one embodiment of the present invention, the offset detection camera is connected to the hanging bracket via a camera mounting bracket, and the camera mounting bracket includes a first slide, a micro-motion connecting plate, a second slide, a fine-tuning bracket and an offset light source bracket, the first slide is installed on the hanging bracket, the micro-motion connecting plate is slidably connected to the first slide via a slider, the bottom of the micro-motion connecting plate is set as the offset detection camera, the second slide is installed on the upper part of the micro-motion connecting plate, the fine-tuning bracket is slidably connected to the second slide via a slider, and the fine-tuning bracket is connected to the offset light source via the offset light source bracket.

[0010] In one embodiment of the present invention, a plurality of offset light source brackets are respectively arranged around the fine-tuning bracket, each of which is equipped with an offset light source, and the offset light sources are arranged around the offset detection camera.

[0011] In one embodiment of the present invention, the offset light source bracket is connected to the offset light source via an L-shaped offset light source angle plate, one end of the offset light source angle plate is fixedly connected to the offset light source, and the other end of the offset light source angle plate is provided with two centrally symmetrical arc adjustment holes, and the offset light source bracket is connected to the two arc adjustment holes via an adjusting bolt.

[0012] In one embodiment of the present invention, the focus tracking system is a coaxial laser focus tracking system.

[0013] In one embodiment of the present invention, an objective lens holder is mounted on the focus tracking system, and an objective lens is mounted on the objective lens holder.

[0014] In a second aspect, the present invention provides an OLED binding offset detection and particle detection method, which uses the OLED binding offset detection device as described above for detection, including the following steps: pressing the OLED binding area by a flattening mechanism; then, starting the focus tracking system to perform focus tracking, real-time distance measurement and compensation, so that the objective lens of the particle detection camera is always kept within the depth of field of clear imaging, the particle detection camera shoots the binding area for particle detection, and at the same time the offset detection camera shoots the binding area image through a dedicated light source for offset detection; finally, the detection system uses an image processing algorithm to analyze the image, and accurately calculates the binding offset and the number of particles after binding and the binding effect.

[0015] In summary, the present invention provides an OLED binding offset detection and particle detection device and method, and the beneficial effects of the present invention are:

[0016] The present invention effectively solves the problem of imaging difference caused by the softness of OLED during the binding process, which leads to the inability to accurately detect offset and particles through the design of the flattening mechanism, and improves the accuracy and stability of the binding inspection. At the same time, combined with the use of the tracking focus system, all-round and high-precision detection of the OLED binding area is achieved. The automated detection process reduces manual intervention, greatly improves the detection speed, and promptly detects BONDING offset and particle effect problems, preventing unqualified products from flowing into subsequent production links, and ensuring product quality stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a picture of reflections appearing during the offset detection process.

[0018] Figure 2 This is a schematic diagram of the three-dimensional structure of the OLED binding offset detection and particle detection device provided in Example 1.

[0019] Figure 3 Schematic diagram of the top view of the carrier structure.

[0020] Figure 4 It is a schematic diagram of the three-dimensional structure of the elastic flattening mechanism.

[0021] Figure 5 It is a schematic diagram of the three-dimensional structure of the pressure plate component.

[0022] Figure 6 Schematic diagram of the three-dimensional structure of the focus tracking system.

[0023] Figure 7 Schematic diagram of the three-dimensional structure of the offset detection camera and the offset light source.

[0024] Figure 8 Schematic diagram of the structure of a particle detection camera.

[0025] Main element symbol description: 1. Carrier; 11. Y-axis linear module; 12. DD motor; 13. AOI carrier; 14. Inspection hole; 15. Vacuum adsorption hole; 2. Elastic flattening mechanism; 21. Flattening steel frame; 22. Cylinder; 23. Flattening substrate; 231. Fixing hole; 232. Limit support; 233. Limit support rod; 24. Pressing plate component; 241. Flexible pressing plate; 242. First bottom plate; 243. Second bottom plate; 244. Second through slot; 245. Spring mounting slot; 25. Fixing screw Bolt; 26, limit steel structure; 261, limit connecting plate; 262, limit bolt 3, detection system; 31, X-axis linear module; 32, bracket; 33, offset detection camera; 331, first slide; 332, micro-connecting plate; 333, second slide; 334, fine-tuning bracket; 335, offset light source bracket; 336, offset light source angle plate; 3361, arc adjustment hole; 34, particle detection camera; 341, focus tracking system; 342, objective lens bracket; 343, objective lens; 35, offset light source. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the invention claimed for protection, but merely represents the selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0027] Example 1

[0028] like Figure 2 As shown, an OLED binding offset detection and particle detection device includes: a carrier 1, an elastic flattening mechanism 2 and a visual system 3.

[0029] The stage 1 is used to carry the OLED product to be tested. Figure 2 , 3 As shown, the stage 1 is arranged on the DD motor 12, and the DD motor 12 is installed on the Y-axis linear module 11 through the mounting plate, and one end of the Y-axis linear module 11 is connected to the Y-axis servo motor. An AOI stage 13 is arranged at one end of the stage 1, and the AOI stage 13 is provided with a vacuum adsorption hole 15, and an inspection hole 14 for OLED binding offset detection is arranged on one side of the vacuum adsorption hole 15.

[0030] Next, the elastic flattening mechanism 2 is disposed above the carrier 1 , and the elastic flattening mechanism 2 is used to firmly press the binding area of ​​the OLED.

[0031] like Figure 4 As shown, the elastic flattening mechanism 2 includes: a flattening steel frame 21, a cylinder 22, a flattening base plate 23, a pressing plate component 24 and a limiting mechanism.

[0032] The cylinder 22 is disposed at one end of the flattening steel frame 21 to provide a flattening driving force.

[0033] Next, the top of the flattening base plate 23 is connected to the cylinder 22, and the bottom of the flattening base plate 23 is provided with a first through slot, and both sides of the first through slot are evenly distributed with fixing holes 231. The two sides of the flattening base plate 23 are respectively provided with limited support seats 232, and the limited support seats 232 are installed with limited support rods 233.

[0034] like Figure 5 As shown, the top of the pressure plate component 24 is installed in the first through groove and connected to the fixing hole 231 through the fixing bolt 25. The lower part of the pressure plate component 24 is provided with a flexible pressure plate 241. The bottom of the flexible pressure plate 241 is provided with a first bottom plate 242 and a second bottom plate 243. A second through groove 244 is provided between the first bottom plate 242 and the second bottom plate 243 to adapt to the flexibility of the OLED and evenly distribute the pressure. The first bottom plate 242 and the second bottom plate 243 are preferably made of rubber material.

[0035] Furthermore, a spring installation groove 245 is provided at the top of the pressure plate component 24, and a spring member is provided in the spring installation groove 245 to enhance the flexibility and adaptability of flattening, to provide additional buffering and adaptability, and to ensure that the OLED is not damaged during the pressing process.

[0036] The two limiting mechanisms are respectively arranged on both sides of the flattening steel frame 21, and each limiting mechanism includes a limiting steel structure 26. A limiting connecting plate 261 is arranged at one end of the limiting steel structure 26, and a limiting bolt 262 is installed on the limiting connecting plate 261. The limiting bolt 262 is located directly below the limiting support rod 233, which plays a limiting role in the elastic flattening mechanism.

[0037] like Figure 6As shown, the visual system 3 includes an X-axis linear module 31, a bracket 32, an offset detection camera 33, a particle detection camera 34 and an offset light source 35. Among them, the offset detection camera 33 and the particle detection camera 34 are both arranged below the flattening mechanism, and the particle detection camera 34 realizes precise focusing. The offset detection camera 33 is used to capture images. The offset detection camera 33 and the particle detection camera 34 are connected to the X-axis linear module 31 through the bracket 32, and one end of the X-axis linear module 31 is connected to the X-axis servo motor. The offset detection camera 33 is used for offset inspection of the OLED binding area, and the particle detection camera 34 is used for particle detection in the OLED binding area.

[0038] The offset light source 35 is disposed around the offset detection camera 33 to provide a stable offset light source for the offset detection camera 33 and improve the inspection accuracy. Figure 7 As shown, the offset detection camera 33 is connected to the bracket 32 ​​through a camera mounting frame, and the camera mounting frame includes a first slide 331, a micro-motion connecting plate 332, a second slide 333, a fine-tuning bracket 334 and an offset light source bracket 335. The first slide 331 is installed on the bracket 32, the micro-motion connecting plate 332 is slidably connected to the first slide 331 through a slider, the bottom of the micro-motion connecting plate 332 is set as the offset detection camera 33, the second slide 333 is installed on the upper part of the micro-motion connecting plate 332, the fine-tuning bracket 334 is slidably connected to the second slide 333 through a slider, and the fine-tuning bracket 334 is connected to the offset light source 35 through the offset light source bracket 335.

[0039] Furthermore, offset light source brackets 335 are respectively provided around the fine-tuning bracket 334 , and an offset light source 35 is respectively provided on each offset light source bracket 335 . The offset light sources 35 are arranged around the offset detection camera 33 .

[0040] For further optimization, the offset light source bracket 335 is connected to the offset light source 35 through the offset light source angle plate 336. The offset light source angle plate 336 is L-shaped. One end of the offset light source angle plate 336 is fixedly connected to the offset light source 35. The other end of the offset light source angle plate 336 is provided with two arc-shaped adjustment holes 3361. The two arc-shaped adjustment holes 3361 are symmetrically arranged with respect to the center. The offset light source bracket 335 is connected to the two arc-shaped adjustment holes 3361 through an adjusting bolt.

[0041] like Figure 8As shown, a focus tracking system 341 is provided on the particle detection camera 34, an objective lens holder 342 is installed on the upper side of the focus tracking system 341, and an objective lens 343 is installed on the objective lens holder 342. The focus tracking system 341 is preferably a coaxial laser focus tracking system, wherein the coaxial laser focus tracking system measures light through a sensor, and the system can automatically adjust the position of the condenser to ensure that the light is always focused at the focal point. The coaxial laser focus tracking system has the advantages of good focusing effect, high tracking accuracy, and a wide range of applications.

[0042] Furthermore, a coaxial light source is provided between the particle detection camera 34 and the OLED product to be tested or on the other side of the OLED product to be tested relative to the particle detection camera 34 to provide illumination for particle detection.

[0043] Example 2

[0044] The OLED binding offset detection and particle detection method includes the following steps: the Panel and COF binding area are pressed tightly by the elastic flattening mechanism 2, then the focus tracking system is started for focus tracking, real-time distance measurement and compensation, so that the objective lens of the particle detection camera 34 is always kept within the depth of field of clear imaging, and the particle detection camera 34 shoots the binding area for particle detection. At the same time, the offset detection camera 33 shoots the binding area image for offset detection; finally, the detection system analyzes the captured image through the image processing algorithm, and accurately calculates the binding offset and the number of particles after binding and the binding effect. The flattening mechanism is raised to release the flattening, and then the Y-axis linear module 11 drives the product to be tested to move along the Y direction so that the COF and FPC binding point moves to the top of the visual system 3, and then the binding area is pressed tightly by the flattening mechanism, and the binding offset and the number of particles after binding and the binding effect are accurately calculated.

[0045] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. OLED binding offset detection and particle detection device, characterized in that, It includes: The carrier, which is equipped with inspection holes and mounted on the Y-axis linear module, is used to carry the OLED product to be inspected; An elastic flattening mechanism is disposed above the carrier to firmly press the binding area of ​​the OLED; The particle detection camera is connected to the X-axis linear module through a bracket and is located below the flattening mechanism. The particle detection camera is equipped with a Z-axis compensation tracking system; The offset detection camera is connected to the X-axis linear module through a bracket and is located below the flattening mechanism.

2. The OLED binding offset detection and particle detection device according to claim 1, characterized in that: The elastic flattening mechanism comprises: Flatten the steel frame; A cylinder, which is arranged at one end of the flattened steel frame; A flattening base plate, the top of which is connected to the cylinder, the bottom of which is provided with a first through groove, and both sides of which are evenly distributed with fixing holes; The top of the pressure plate component is installed in the first through slot and connected to the fixing hole through fixing bolts. The lower part of the pressure plate component is equipped with a flexible pressure plate. The bottom of the flexible pressure plate is provided with a first bottom plate and a second bottom plate, forming a second through slot therebetween.

3. The OLED binding offset detection and particle detection device according to claim 2, characterized in that: A spring installation groove is arranged on the top of the pressure plate component, and a spring member is arranged in the spring installation groove.

4. The OLED binding offset detection and particle detection device according to claim 1, characterized in that: The offset detection camera is connected to the hanging bracket through a camera mounting bracket, and the camera mounting bracket includes a first slide, a micro-motion connecting plate, a second slide, a fine-tuning bracket and an offset light source bracket. The first slide is installed on the hanging bracket, the micro-motion connecting plate is slidably connected to the first slide through a slider, the bottom of the micro-motion connecting plate is set as the offset detection camera, the second slide is installed on the upper part of the micro-motion connecting plate, the fine-tuning bracket is slidably connected to the second slide through the slider, and the fine-tuning bracket is connected to the offset light source through the offset light source bracket.

5. The OLED binding offset detection and particle detection device according to claim 4, characterized in that: A plurality of offset light source brackets are respectively arranged around the fine-tuning bracket, each of which is equipped with an offset light source, and the offset light sources are arranged around the offset detection camera.

6. The OLED binding offset detection and particle detection device according to claim 5, characterized in that: The offset light source bracket is connected to the offset light source through an L-shaped offset light source angle plate, one end of the offset light source angle plate is fixedly connected to the offset light source, and the other end of the offset light source angle plate is provided with two centrally symmetrical arc adjustment holes, and the offset light source bracket is connected to the two arc adjustment holes through an adjusting bolt.

7. The OLED binding offset detection and particle detection device according to claim 1, characterized in that: The tracking focus system is a coaxial laser tracking focus system.

8. The OLED binding offset detection and particle detection device according to claim 7, characterized in that: An objective lens holder is installed on the focus tracking system, and an objective lens is installed on the objective lens holder.

9. An OLED binding offset detection and particle detection method, using the OLED binding offset detection and particle detection device as claimed in any one of claims 1 to 8 for detection, characterized in that: The following steps are involved: The OLED binding area is compressed by a flattening mechanism. Then, the focus tracking system is started to perform focus tracking, real-time distance measurement and compensation, so that the objective lens of the particle detection camera is always kept within the depth of field of clear imaging. The particle detection camera photographs the binding area for particle detection. At the same time, the offset detection camera uses a dedicated light source to photograph the binding area image for offset detection. Finally, the detection system uses an image processing algorithm to analyze the image and accurately calculate the binding offset, the number of particles after binding, and the binding effect.