An automated chip detection device

Abstract

The present invention relates to the technical field of chip detection, and specifically discloses an automated chip detection device, which includes a shielding chamber and a conveying mechanism. The conveying mechanism is installed behind the conveying mechanism. A closing seat is rotatably installed at the rear of the shielding chamber. A rotating turntable is arranged inside the closing seat. A pushing mechanism is arranged at the rear of the conveying mechanism, and a blanking seat is arranged at the front of the conveying mechanism. The pushing mechanism and the blanking seat are respectively located on both sides of the closing seat. By transforming the traditional anechoic chamber into a small independent test house, the present invention has the characteristic of flexible switching between the closed and open states, realizes the functions of automatic feeding and blanking, significantly improves the working efficiency. The design of the pushing mechanism and the sliding shaft structure ensures the high-efficiency synchronization of the equipment during the test, reduces the labor cost, and improves the test accuracy and consistency at the same time. Generally speaking, through automated and standardized operations, this device improves the working environment and enhances the flexibility.

Description

Technical Field

[0001] The present invention relates to the technical field of chip detection, and particularly to an automated chip detection device. Background Art

[0002] Chips generally refer to integrated circuits (ICs), which are the core components of modern electronic devices. They integrate a large number of electronic components (such as transistors, resistors, capacitors, etc.) on a small semiconductor material (usually silicon) to achieve complex functions. The manufacturing process of chips involves multiple complex steps, including lithography, etching, doping, etc. Chip detection is a key process to ensure the quality and performance of integrated circuits (ICs). For example, performing EMC tests on chips used in communication devices to ensure that they are not affected by external electromagnetic interference and do not interfere with other devices. Currently, electromagnetic compatibility (EMC) tests are often carried out on several devices in a batch one by one. However, there are some problems as follows: Frequent opening and closing of the darkroom door and manual replacement of equipment will lead to an extended downtime during the test process, which reduces the overall test efficiency and affects the continuity and convenience of operation. Manual replacement of test equipment may introduce human errors. Frequent opening and closing of the darkroom door not only affects the test efficiency but also may cause changes in the electromagnetic environment inside and outside the darkroom, introducing additional interference sources, thus having a negative impact on the test results. These problems not only affect the test efficiency and accuracy but also increase the operation complexity and cost. Therefore, the present invention proposes an automated chip detection device to solve the problems mentioned in the above background art. Summary of the Invention

[0003] The purpose of the present invention is to solve the disadvantages existing in the prior art, and to propose an automated chip detection device.

[0004] To achieve the above purpose, the present invention adopts the following technical solutions:

[0005] An automated chip detection device comprises a shielding room and a conveying mechanism, wherein the conveying mechanism is installed at the rear side of the conveying mechanism, a closed seat is rotatably installed at the rear side of the shielding room, a rotating round table is arranged inside the closed seat, a pushing mechanism is arranged at the rear side of the conveying mechanism, and a material unloading seat is arranged at the front side of the conveying mechanism, the pushing mechanism and the material unloading seat are respectively located at both sides of the closed seat; the pushing mechanism comprises a pushing seat and an electric push rod, the electric push rod is fixedly installed outside the shielding room, the output end of the electric push rod is fixedly connected to the pushing seat, push racks that slide up and down are arranged on both sides of the push seat, a card seat is arranged at the front end of the push rack, and a corresponding A card seat and a support seat for a push rack; two sliding seats that slide back and forth are arranged on the lower side of the shielding room, a spring corresponding to the sliding seat is arranged in the slide groove, a sliding shaft corresponding to the closed seat is rotatably connected between the two sliding seats, a pushing rod is fixed on the outer side of the sliding seat, and the pushing rod slides left and right inside the conveying mechanism; a lifting cylinder rotatably mounted on the shielding room is arranged on the outer side of the closed seat, the output end of the lifting cylinder is rotatably connected to the outer side of the closed seat, the rotating table includes a switching part, the rotating table is rotatably connected to the switching part, a rotating motor connected to the rotating table switching part is installed on the inner side of the closed seat, and a rotating motor fixedly connected to the rotating table is installed inside the rotating table switching part.

[0006] Preferably, spring 2 is arranged on the left and right sides of the outer side of the push seat, and spring 2 is located at the lower side of the rear end of the push frame. The support seat and the surface of the rotating table are provided with a slide groove corresponding to the push frame, and a limiting block corresponding to the card seat is arranged in the support seat slide groove.

[0007] Preferably, a slot is provided on the surface of the holder, and a push plate corresponding to the slot is fixed to the upper end of the push rod.

[0008] Preferably, the material discharge seat is rotatably connected to the outside of the shielding room, a curved surface is provided on one side of the lower portion of the material discharge seat, and a slope corresponding to the curved surface of the lower portion of the material discharge seat is provided on the front end of the push frame.

[0009] Preferably, a toothed plate is fixed on the outer side of the other slide seat, a plurality of ratchet blocks are connected to the upper side of the toothed plate, a ratchet wheel connected to the outside of the shielding chamber is arranged on the upper side of the toothed plate, and the ratchet wheel is engaged with a plurality of ratchet blocks on the lower side.

[0010] Preferably, a bevel gear 1 is fixed to the outside of the ratchet, and a corresponding meshing bevel gear 2 is provided on one side of the bevel gear 1.

[0011] Preferably, the conveying mechanism includes a conveying frame, a plurality of conveying rollers and a conveying belt, the conveying rollers are installed inside the conveying frame, the conveying belt is sleeved outside the plurality of conveying rollers, and one end of the front conveying roller inside the conveying frame is fixedly connected to the second bevel gear.

[0012] Preferably, a switch door is installed on the front side of the shielding room, and the shielding room also includes a signal generator and a receiver.

[0013] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0014] 1. The present invention transforms a traditional anechoic chamber into a relatively independent small test house, and a closable and openable closed seat structure is arranged at the rear side thereof. In the closed state, the test house is a completely enclosed electromagnetic test chamber. In the open and closed state, the test house is in a relatively open state for loading and unloading. Cooperating with a pushing mechanism on one side and a blanking seat on the other side, the automatic loading and unloading actions of the sampled chips can be completed;

[0015] 2. The pushing mechanism provided by the present invention, in the open and closed state of the closed seat, conveys the sampled chips conveyed by the conveying mechanism to the surface of the rotating turntable, and pushes the previously tested sampled chips to the blanking seat on the other side. When the push frame of the pushing mechanism is pushed to the front end, while squeezing the blanking seat to rotate and tilt for blanking onto the conveying mechanism, the push frame falls deep into the sliding groove of the rotating turntable, avoiding bringing back the chips to be tested on the upper side during the reset process of the pushing mechanism;

[0016] 3. The sliding shaft structure provided by the present invention, during the opening and closing process of the closed seat, squeezes the sliding shaft, so that the push rod connected to one side sliding seat moves the connected push plate, and pushes the chips on the conveying mechanism into the card slot on the surface of the push rack seat. During the closing process of the closed seat, the sliding shaft resets, and the toothed plate connected to the other side sliding seat drives the upper ratchet through a number of ratchet blocks, so that the ratchet drives one side of the conveying mechanism intermittently through two bevel gears, realizing the automatic driving of the conveying mechanism.

[0017] In summary, by transforming the traditional anechoic chamber into a small independent test house, the present invention has the characteristics of flexible switching between the closed and open states, realizes the functions of automatic loading and unloading, significantly improves the work efficiency. The design of the pushing mechanism and the sliding shaft structure ensures the high-efficiency synchronization of the chips during the testing process, reduces the labor cost, avoids the frequent opening and closing of the shielding room, and improves the testing accuracy and consistency at the same time. Generally speaking, the device improves the working environment, enhances the flexibility through automated and standardized operations, and is applicable to various electronic testing requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 is a schematic structural diagram of an automated chip detection device proposed by the present invention Figure 1 ;

[0019] Figure 2 is a schematic cross-sectional structural diagram of an automated chip detection device proposed by the present invention Figure 1 ;

[0020] Figure 3 is a schematic side cross-sectional structural diagram of an automated chip detection device proposed by the present invention Figure 1 ;

[0021] Figure 4 Structural schematic diagram of an automated chip detection device proposed by the present invention Figure 2 ;

[0022] Figure 5 Cross-sectional structural schematic diagram of an automated chip detection device proposed by the present invention Figure 2 ;

[0023] Figure 6 Side cross-sectional structural schematic diagram of an automated chip detection device proposed by the present invention Figure 2 ;

[0024] Figure 7 Schematic diagram of the connection structure of the sliding seat in an automated chip detection device proposed by the present invention;

[0025] Figure 8 Schematic diagram of the connection structure of the pushing mechanism in an automated chip detection device proposed by the present invention.

[0026] In the figure: 1, shielding chamber; 2, conveying mechanism; 3, pushing mechanism; 301, pushing seat; 302, pushing frame; 303, clamping seat; 304, clamping groove; 305, inclined surface; 306, second spring; 307, electric push rod; 4, rotating turntable; 5, pushing rod; 6, signal generator; 7, receiver; 8, closing seat; 9, blanking seat; 10, ratchet; 11, first bevel gear; 12, second bevel gear; 13, ratchet block; 14, first spring; 15, sliding seat; 16, sliding shaft; 17, lifting cylinder; 18, supporting seat; 19, limiting block. Specific embodiments

[0027] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments.

[0028] Referring to Figures 1-8 , an automated chip detection device includes a shielding chamber 1 and a conveying mechanism 2. The conveying mechanism 2 is installed at the rear of the conveying mechanism 2. A closing seat 8 is rotatably installed at the rear of the shielding chamber 1. A rotating turntable 4 is arranged inside the closing seat 8. A switch door is installed at the front of the shielding chamber 1. The shielding chamber 1 also includes a signal generator 6 and a receiver 7 inside. The shielding chamber 1 is used to eliminate external electromagnetic interference and provide a clean test environment. The receiver 7 is used to receive and analyze the signals radiated by the chip, usually equipped with an antenna. The signal generator 6 is used to generate interference signals with specific frequencies and amplitudes to test the anti-interference ability of the chip. The shielding chamber 1 can be opened through the switch door at the front to debug the chip, or the rear closing seat 8 can be opened to quickly perform the chip electromagnetic compatibility test on the sampled chips; Further, referring to Figure 5 ,6 , a pushing mechanism 3 is provided at the rear side of the conveying mechanism 2, and a material discharge seat 9 is provided at the front side of the conveying mechanism 2, the pushing mechanism 3 and the material discharge seat 9 are respectively located on both sides of the closed seat 8, and a lifting cylinder 17 rotatably installed on the shielding room 1 is provided on the outer side of the closed seat 8, and the output end of the lifting cylinder 17 is rotatably connected to the outer side of the closed seat 8, and a rotating motor connected to the adapter of the rotating round table 4 is installed on the inner side of the closed seat 8, and a rotating motor fixed to the rotating round table 4 is installed inside the adapter of the rotating round table 4, and the opening and closing of the closed seat 8 at the rear side of the shielding room 1 is controlled by the extension and contraction of the external lifting cylinder 17. When the closed seat 8 is closed, the rotating round table 4 is located inside the shielding room 1 to perform electromagnetic compatibility testing. When the closed seat 8 is rotated out, the rotating motor of the adapter controls the rotating round table 4 inside the closed seat 8 to always keep it in a horizontal state. At this time, the rotating round table 4 in the rotated-out state corresponds to the pushing mechanism 3 on one side and the material discharge seat 9 on the other side respectively; further, referring to Figure 5 , 8, the pushing mechanism 3 includes a pushing base 301 and an electric push rod 307. The electric push rod 307 is fixedly installed outside the shielding chamber 1, and the output end of the electric push rod 307 is fixedly connected to the pushing base 301. Pushing frames 302 that slide up and down are arranged on both sides of the pushing base 301. A clamping seat 303 is arranged at the front end of the pushing frame 302. A supporting seat 18 corresponding to the clamping seat 303 and the pushing frame 302 is arranged outside the shielding chamber 1. Springs II 306 are arranged on the left and right sides of the outside of the pushing base 301. The springs II 306 are located below the rear ends of the pushing frames 302. Sliding grooves corresponding to the pushing frames 302 are formed on the surfaces of the supporting seat 18 and the rotating turntable 4. The depth of the sliding groove in the rotating turntable 4 is greater than that of the sliding groove in the supporting seat 18, and a limiting block 19 corresponding to the clamping seat 303 is arranged in the sliding groove of the supporting seat 18. The sampled chips are transported to the side of the shielding chamber 1 by the conveying mechanism 2. When the closing seat 8 is rotated out, the electric push rod 307 is started to retract. The electric push rod 307 drives the connected pushing base 301 and the pushing frames 302 on both sides to slide towards the rotating turntable 4, and transports the sampled chips on the clamping seat 303 to the rotating turntable 4. When the clamping seat 303 slides out of the position of the limiting block 19 of the sliding groove, under the gravity of the sampled chips, the pushing frames 302 on both sides of the pushing base 301 move downwards, and the sampled chips also fall on the surface of the rotating turntable 4. At this time, the clamping seat 303 is located below the limiting blocks 19 on both sides of the sliding groove. At this time, the electric push rod 307 controls the connected pushing base 301 to move back. The pushing frames 302 on both sides return to the initial state from below the limiting blocks 19 on both sides of the sliding groove until the clamping seat 303 completely slides out of the restricted area of the limiting block 19. Under the elastic force of the springs II 306 on both sides of the electric push rod 307, the pushing frames 302 on both sides rise and return to the initial state, and the electric push rod 307 controls the connected pushing base 301 and the pushing frames 302 on both sides to move forward a certain distance, so that the clamping seat 303 falls on the upper side of the limiting block 19 of the sliding groove; furthermore, the blanking seat 9 is rotatably connected to the outside of the shielding chamber 1. An arc surface is arranged on one side of the lower part of the blanking seat 9, and an inclined surface 305 corresponding to the arc surface at the lower part of the blanking seat 9 is arranged at the front end of the pushing frame 302. When the electric push rod 307 controls the connected pushing base 301 and the pushing frame 302 to move forward as described above, the pushing frame 302 pushes the chips on the surface of the rotating turntable 4 that have been tested last time, so that they fall on the corresponding blanking seat 9 on one side. When the inclined surface 305 at the front end of the pushing frame 302 corresponds to the arc surface at the lower side of the blanking seat 9, the blanking seat 9 is tilted and rotated towards the outside conveying mechanism 2, so that the chips after being tested and pushed onto the blanking seat 9 fall in front of the conveying mechanism 2. A torsion spring is arranged at the transfer connection between the blanking seat 9 and the shielding chamber 1. During the process of the clamping seat 303 moving back, under the action of the torsion spring, the blanking seat 9 will rotate back to the flat state; furthermore, referring to Figure 6 , 7, two slides 15 sliding forward and backward are arranged at the lower side of the shielding chamber 1, a spring 14 corresponding to the slide 15 is arranged in the slide groove, a slide shaft 16 corresponding to the closed seat 8 is rotatably connected between the two slides 15, a push rod 5 is fixed on the outer side of one slide 15, the push rod 5 slides left and right inside the conveying mechanism 2, a card slot 304 is opened on the surface of the card seat 303, and a push plate corresponding to the card slot 304 is fixed on the upper end of the push rod 5. When the above-mentioned lifting cylinder 17 controls the closed seat 8 to rotate outward, during the external rotation process, the slides 15 on both sides are squeezed to move to one side through the slide shaft 16, and the push rod 5 connected to the slide 15 on one side moves to one side of the pushing mechanism 3, and the sample chip to be tested transported on the conveying mechanism 2 is pushed into the surface card slot 304 of the card seat 303 through the push plate at its front end; further, referring to Figure 2 , 3 7. The conveying mechanism 2 includes a conveying frame, a plurality of conveying rollers and a conveying belt. The conveying rollers are installed inside the conveying frame, and the conveying belts are sleeved outside the plurality of conveying rollers. One end of the conveying roller on the front side of the conveying frame is fixedly connected to the bevel gear 2 12. A toothed plate is fixed on the outside of the other slide 15. A plurality of ratchet blocks 13 are transferred to the upper side of the toothed plate. A ratchet 10 transferred to the outside of the shielding room 1 is arranged on the upper side of the toothed plate, and the ratchet 10 is engaged with a plurality of ratchet blocks 13 on the lower side. A bevel gear 11 is fixed on the outer side of the ratchet 10, and a corresponding meshing bevel gear 2 12 is arranged on one side of the bevel gear 11. In the process of the sliding shaft 16 being squeezed and sliding, the other slide 15 drives the connected toothed plate And several ratchet blocks 13 on its upper side move inward. During this process, several ratchet blocks 13 are not engaged with the ratchet wheel 10 for transmission. The pushed chip is rotated on the closed seat 8. When testing, the sliding shaft 16 is also released from pressure, and the springs 14 on both sides make the sliding seat 15 return to its initial position. At this time, the returning toothed plate drives several ratchet blocks 13 to move back, and the ratchet block 13 drives the engaged ratchet wheel 10 to rotate. The ratchet wheel 10 also drives the front bevel gear 11 to rotate, and the bevel gear 2 12 engaged on one side of the transmission makes the front conveying roller of the conveying mechanism 2 rotate, thereby completing an intermittent activity of the conveying mechanism 2, realizing the progressive pushing of the chip to be tested, and the pushing and collection of the tested chips.

[0029] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An automated chip detection device, comprising a shielding chamber (1) and a conveying mechanism (2), characterized in that: The conveying mechanism (2) is installed on the rear side of the shielding room (1); a closed seat (8) is rotatably installed on the rear side of the shielding room (1); a rotating round table (4) is arranged inside the closed seat (8); a pushing mechanism (3) is arranged on the rear side of the conveying mechanism (2); and a material discharge seat (9) is arranged on the front side of the conveying mechanism (2); the pushing mechanism (3) and the material discharge seat (9) are respectively located on both sides of the closed seat (8); the pushing mechanism (3) comprises a pushing seat (301) and an electric push rod (307); the electric push rod (307) is fixedly installed outside the shielding room (1); the output end of the electric push rod (307) is fixedly connected to the pushing seat (301); both sides of the pushing seat (301) are provided with pushing frames (302) that slide up and down; a clamping seat (303) is arranged at the front end of the pushing frame (302); the outside of the shielding room (1) A support seat (18) corresponding to the card seat (303) and the push frame (302) is provided; two slide seats (15) sliding forward and backward are provided at the lower side of the shielding chamber (1); a spring (14) corresponding to the slide seat (15) is provided in the slide groove; a slide shaft (16) corresponding to the closed seat (8) is rotatably connected between the two slide seats (15); a push rod (5) is fixed on the outer side of the slide seat (15); the push rod (5) slides left and right inside the conveying mechanism (2); a lifting cylinder (17) rotatably mounted on the shielding chamber (1) is provided on the outer side of the closed seat (8); the output end of the lifting cylinder (17) is rotatably connected to the outer side of the closed seat (8); a rotating motor connected to the adapter part of the rotating table (4) is installed on the inner side of the closed seat (8); and a rotating motor fixedly connected to the rotating table (4) is installed inside the adapter part of the rotating table (4).

2. The automated chip detection device according to claim 1, characterized in that: The outer sides of the push seat (301) are both provided with springs 2 (306), and the springs 2 (306) are located at the lower side of the rear end of the push frame (302). The surfaces of the support seat (18) and the rotating truncated table (4) are both provided with sliding grooves corresponding to the push frame (302). The depth of the sliding groove in the rotating truncated table (4) is greater than the depth of the sliding groove in the support seat (18), and a limiting block (19) corresponding to the clamping seat (303) is provided in the sliding groove of the support seat (18).

3. The automated chip detection device according to claim 1, characterized in that: A slot (304) is provided on the surface of the holder (303), and a push plate corresponding to the slot (304) is fixed to the upper end of the push rod (5).

4. The automated chip detection device according to claim 1, characterized in that: The material discharge seat (9) is rotatably connected to the outside of the shielding room (1), a curved surface is provided on one side of the lower part of the material discharge seat (9), and a slope (305) corresponding to the curved surface of the lower part of the material discharge seat (9) is provided at the front end of the push frame (302).

5. The automated chip detection device according to claim 1, characterized in that: A toothed plate is fixed on the outside of the other slide seat (15), a plurality of ratchet blocks (13) are connected to the upper side of the toothed plate, a ratchet wheel (10) connected to the outside of the shielding room (1) is arranged on the upper side of the toothed plate, and the ratchet wheel (10) is engaged with a plurality of ratchet blocks (13) on the lower side.

6. The automated chip detection device according to claim 5, characterized in that: A bevel gear 1 (11) is fixed to the outside of the ratchet (10), and a corresponding meshing bevel gear 2 (12) is provided on one side of the bevel gear 1 (11).

7. The automated chip detection device according to claim 1, characterized in that: The conveying mechanism (2) comprises a conveying frame, a plurality of conveying rollers and a conveying belt, wherein the conveying rollers are installed inside the conveying frame, the conveying belt is sleeved outside the plurality of conveying rollers, and one end of the conveying roller on the front side of the conveying frame is fixedly connected to a second bevel gear (12).

8. The automated chip detection device according to claim 1, characterized in that: A switch door is installed on the front side of the shielding room (1), and a signal generator (6) and a receiver (7) are also included in the shielding room (1).

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